ZA811935B - Process and device for the contact free measurement of a dimension - Google Patents

Process and device for the contact free measurement of a dimension

Info

Publication number
ZA811935B
ZA811935B ZA00811935A ZA811935A ZA811935B ZA 811935 B ZA811935 B ZA 811935B ZA 00811935 A ZA00811935 A ZA 00811935A ZA 811935 A ZA811935 A ZA 811935A ZA 811935 B ZA811935 B ZA 811935B
Authority
ZA
South Africa
Prior art keywords
dimension
free measurement
contact free
measurement
contact
Prior art date
Application number
ZA00811935A
Other languages
English (en)
Inventor
Urs Peter Studer
Original Assignee
Zumbach Electronic Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zumbach Electronic Ag filed Critical Zumbach Electronic Ag
Publication of ZA811935B publication Critical patent/ZA811935B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
ZA00811935A 1980-03-25 1981-03-23 Process and device for the contact free measurement of a dimension ZA811935B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH231480A CH645462A5 (de) 1980-03-25 1980-03-25 Verfahren und vorrichtung zur beruehrungslosen messung einer dimension mindestens eines objekts.

Publications (1)

Publication Number Publication Date
ZA811935B true ZA811935B (en) 1982-04-28

Family

ID=4230897

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA00811935A ZA811935B (en) 1980-03-25 1981-03-23 Process and device for the contact free measurement of a dimension

Country Status (11)

Country Link
JP (1) JPS56150302A (xx)
AU (1) AU538202B2 (xx)
BE (1) BE888013A (xx)
CA (1) CA1168437A (xx)
CH (1) CH645462A5 (xx)
DE (1) DE3111356A1 (xx)
ES (1) ES500695A0 (xx)
FR (1) FR2479447B1 (xx)
GB (1) GB2072840B (xx)
IT (1) IT1135714B (xx)
ZA (1) ZA811935B (xx)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5937405A (ja) * 1982-08-26 1984-02-29 Mitsutoyo Mfg Co Ltd 光電式測定装置
JPS6134410A (ja) * 1984-07-26 1986-02-18 Mitsutoyo Mfg Co Ltd 光学測定装置
US4730116A (en) * 1985-08-06 1988-03-08 Mitsubishi Denki Kabushiki Kaisha Sheet thickness measuring apparatus by optical scanning
JPS6249202A (ja) * 1985-08-28 1987-03-03 Mitsutoyo Mfg Corp 光学式測定装置
CH672184A5 (xx) * 1985-12-17 1989-10-31 Manfred Meyer
CH674774A5 (xx) * 1986-04-03 1990-07-13 Zumbach Electronic Ag
DE3713109A1 (de) * 1987-04-16 1988-11-03 Limess Licht Messtechnik Gmbh Vorrichtung zum vermessen von werkstuecken
KR920004750B1 (ko) * 1988-01-19 1992-06-15 미쓰비시전기 주식회사 막(膜)두께 측정방법
DE3815011A1 (de) * 1988-04-30 1989-11-16 Leybold Ag Einrichtung zum zerstoerungsfreien messen des ohmschen widerstands duenner schichten
DE3816322A1 (de) * 1988-05-13 1989-11-23 Udo Dr Ing Tutschke Verfahren und vorrichtung zur beruehrungslosen messung der aussenabmessungen von koerpern
GB8816346D0 (en) * 1988-07-08 1988-08-10 Kyriakis J Apparatus for monitoring product in hostile environment
DE3824820A1 (de) * 1988-07-21 1990-01-25 Gebhard Birkle Geraet zum beruehrungslosen optischen bestimmen von geometrischen abmessungen eines objektes
DE4024849A1 (de) * 1990-08-06 1992-02-13 Horn Hannes Dr Schulze Digitales verfahren zur ermittlung von abmessungen von gegenstaenden
DE9013559U1 (de) * 1990-09-27 1990-12-06 Mesacon Gesellschaft für Meßtechnik mbH, 4600 Dortmund Optisches Gerät zur Messung der Geschwindigkeit oder Länge einer bewegten Oberfläche
FR2678727A1 (fr) * 1991-07-04 1993-01-08 Tabacs & Allumettes Ind Procede et dispositif de calibrage, en particulier de cigarettes, mettant en óoeuvre la determination du temps d'interception d'un faisceau laser.
DE4201385A1 (de) * 1992-01-21 1993-07-22 Peter Dipl Ing Renner Optisches messsystem
DE19516154A1 (de) * 1995-05-03 1996-11-14 Hell Ag Linotype Vorrichtung zur Positionserfassung von rotierenden Objekten
US9797710B2 (en) 2013-09-16 2017-10-24 Steinfurth Mess-Systeme GmbH Method and device for establishing a geometry of a container for packaging a flowable medium

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1191591B (de) * 1958-01-17 1965-04-22 Licentia Gmbh Verfahren zum fotoelektrischen Bestimmen der relativen Lage wenigstens einer Kante eines Objektes
JPS5335569A (en) * 1976-09-14 1978-04-03 Asahi Glass Co Ltd Method of measuring outer diameter of transparent substance
US4097849A (en) * 1976-09-27 1978-06-27 Systems Research Laboratories, Inc. Electronic comparator for process control
US4082463A (en) * 1977-01-06 1978-04-04 Systems Research Laboratories, Inc. Calibrated optical micrometer
JPS53119079A (en) * 1977-03-26 1978-10-18 Tatsu Akutsu Measuring method of diameter of running filamentous articles
US4168126A (en) * 1977-07-05 1979-09-18 Altman Associates, Inc. Electro-optical measuring system using precision light translator

Also Published As

Publication number Publication date
FR2479447B1 (fr) 1986-06-27
ES8203150A1 (es) 1982-03-01
FR2479447A1 (fr) 1981-10-02
BE888013A (fr) 1981-07-16
CA1168437A (en) 1984-06-05
CH645462A5 (de) 1984-09-28
IT8120686A0 (it) 1981-03-24
ES500695A0 (es) 1982-03-01
AU6858581A (en) 1981-10-01
GB2072840B (en) 1983-11-09
DE3111356A1 (de) 1982-03-25
AU538202B2 (en) 1984-08-02
JPS56150302A (en) 1981-11-20
GB2072840A (en) 1981-10-07
IT1135714B (it) 1986-08-27
DE3111356C2 (xx) 1988-05-11

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