ZA200102043B - X-ray flourescence elemental analyzer. - Google Patents
X-ray flourescence elemental analyzer. Download PDFInfo
- Publication number
- ZA200102043B ZA200102043B ZA200102043A ZA200102043A ZA200102043B ZA 200102043 B ZA200102043 B ZA 200102043B ZA 200102043 A ZA200102043 A ZA 200102043A ZA 200102043 A ZA200102043 A ZA 200102043A ZA 200102043 B ZA200102043 B ZA 200102043B
- Authority
- ZA
- South Africa
- Prior art keywords
- sample
- ray
- detector
- ray fluorescence
- analyzer
- Prior art date
Links
- 239000003245 coal Substances 0.000 claims abstract description 38
- 239000000463 material Substances 0.000 claims abstract description 10
- 238000000921 elemental analysis Methods 0.000 claims abstract description 8
- 238000004876 x-ray fluorescence Methods 0.000 claims description 32
- 230000005540 biological transmission Effects 0.000 claims description 21
- 238000001514 detection method Methods 0.000 claims description 20
- 238000000034 method Methods 0.000 claims description 17
- JGFZNNIVVJXRND-UHFFFAOYSA-N N,N-Diisopropylethylamine (DIPEA) Chemical compound CCN(C(C)C)C(C)C JGFZNNIVVJXRND-UHFFFAOYSA-N 0.000 claims description 4
- 238000004458 analytical method Methods 0.000 claims description 4
- 239000000523 sample Substances 0.000 claims 30
- 230000035945 sensitivity Effects 0.000 claims 1
- 238000005070 sampling Methods 0.000 abstract description 11
- 229910052500 inorganic mineral Inorganic materials 0.000 abstract description 7
- 239000011707 mineral Substances 0.000 abstract description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 abstract description 4
- 229910052782 aluminium Inorganic materials 0.000 abstract description 4
- 229910052710 silicon Inorganic materials 0.000 abstract description 4
- 239000010703 silicon Substances 0.000 abstract description 4
- 230000000737 periodic effect Effects 0.000 abstract description 3
- 238000001228 spectrum Methods 0.000 abstract description 3
- 229910052709 silver Inorganic materials 0.000 abstract description 2
- 239000004332 silver Substances 0.000 abstract description 2
- 238000011088 calibration curve Methods 0.000 abstract 1
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 25
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 15
- 239000011593 sulfur Substances 0.000 description 15
- 229910052717 sulfur Inorganic materials 0.000 description 15
- 229910052742 iron Inorganic materials 0.000 description 11
- 238000005259 measurement Methods 0.000 description 9
- 230000005855 radiation Effects 0.000 description 9
- 239000002002 slurry Substances 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- 230000005284 excitation Effects 0.000 description 4
- -1 i.e. Substances 0.000 description 3
- 238000002360 preparation method Methods 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 239000000377 silicon dioxide Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- 239000004743 Polypropylene Substances 0.000 description 1
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 238000000441 X-ray spectroscopy Methods 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 238000005276 aerator Methods 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 230000033558 biomineral tissue development Effects 0.000 description 1
- 239000011575 calcium Substances 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000000460 chlorine Substances 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002149 energy-dispersive X-ray emission spectroscopy Methods 0.000 description 1
- 230000005281 excited state Effects 0.000 description 1
- 239000000446 fuel Substances 0.000 description 1
- 230000005251 gamma ray Effects 0.000 description 1
- 238000012417 linear regression Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910052754 neon Inorganic materials 0.000 description 1
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 1
- 238000003947 neutron activation analysis Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000008520 organization Effects 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000005464 sample preparation method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 230000011664 signaling Effects 0.000 description 1
- 238000005549 size reduction Methods 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 239000013077 target material Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 238000009834 vaporization Methods 0.000 description 1
- 230000008016 vaporization Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000004846 x-ray emission Methods 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
- G01N22/04—Investigating moisture content
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/156,078 US6130931A (en) | 1998-09-17 | 1998-09-17 | X-ray fluorescence elemental analyzer |
Publications (1)
Publication Number | Publication Date |
---|---|
ZA200102043B true ZA200102043B (en) | 2003-08-19 |
Family
ID=22558011
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ZA200102043A ZA200102043B (en) | 1998-09-17 | 2001-03-12 | X-ray flourescence elemental analyzer. |
Country Status (9)
Country | Link |
---|---|
US (1) | US6130931A (fr) |
EP (1) | EP1114310B2 (fr) |
CN (1) | CN1190662C (fr) |
AT (1) | ATE552493T1 (fr) |
AU (1) | AU759426B2 (fr) |
DK (1) | DK1114310T3 (fr) |
ES (1) | ES2385210T3 (fr) |
WO (1) | WO2000016078A1 (fr) |
ZA (1) | ZA200102043B (fr) |
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JP3062685B2 (ja) * | 1998-07-23 | 2000-07-12 | セイコーインスツルメンツ株式会社 | 蛍光x線分析計 |
US6421415B1 (en) * | 1999-05-21 | 2002-07-16 | Metso Paper Automation Oy | On-line system for quantitative analysis of multi-component additives and coatings in sheet material |
US6477227B1 (en) | 2000-11-20 | 2002-11-05 | Keymaster Technologies, Inc. | Methods for identification and verification |
US6501825B2 (en) | 2001-01-19 | 2002-12-31 | Keymaster Technologies, Inc. | Methods for identification and verification |
US6629879B1 (en) * | 2001-05-08 | 2003-10-07 | Advanced Micro Devices, Inc. | Method of controlling barrier metal polishing processes based upon X-ray fluorescence measurements |
US20020191746A1 (en) * | 2001-06-19 | 2002-12-19 | Mark Dinsmore | X-ray source for materials analysis systems |
FI20011362A (fi) * | 2001-06-26 | 2002-12-27 | Bs Instr Technology Oy | Röntgenfluoresenssianalysaattori ja menetelmä röntgenfluoresenssianalysaattorin käyttämiseksi |
US7200200B2 (en) * | 2001-09-04 | 2007-04-03 | Quality Control, Inc. | X-ray fluorescence measuring system and methods for trace elements |
CA2459320C (fr) | 2001-09-06 | 2016-07-05 | Genomic Profiling Systems, Inc. | Detection rapide de cellules de replication |
US6657189B2 (en) * | 2001-11-07 | 2003-12-02 | Analyser Systems Ag | Maintaining measurement accuracy in prompt gamma neutron activation analyzers with variable material flow rates or material bed depth |
US6909770B2 (en) * | 2001-12-05 | 2005-06-21 | The United States Of America As Represented By The United States National Aeronautics And Space Administration | Methods for identification and verification using vacuum XRF system |
US20040022355A1 (en) * | 2001-12-05 | 2004-02-05 | Bruce Kaiser | Methods for identification and verification of materials containing elemental constituents |
US6850592B2 (en) * | 2002-04-12 | 2005-02-01 | Keymaster Technologies, Inc. | Methods for identification and verification using digital equivalent data system |
US20030194052A1 (en) * | 2002-04-12 | 2003-10-16 | Price L. Stephen | Methods for identification and verification |
DE10230990A1 (de) | 2002-07-10 | 2004-02-05 | Elisabeth Katz | Vorrichtung zur Durchführung einer Online-Elementanalyse |
WO2004089056A2 (fr) * | 2003-04-01 | 2004-10-21 | Keymaster Technologies, Inc. | Source hors prescriptions en matiere de radioactivite pour dispositif a rayons x par fluorescence |
DE102004012704B4 (de) * | 2004-03-16 | 2008-01-03 | Katz, Elisabeth | Vorrichtung zur online-Analyse und Verwendung einer solchen Vorrichtung |
ES2338899T3 (es) * | 2004-04-09 | 2010-05-13 | AMERICAN SCIENCE & ENGINEERING, INC. | Eliminacion de cruces en un portico de inspeccion por retrodispersion que comprenda multiples generadores asegurando que solo un generador emita radiacion al mismo tiempo. |
JP4928938B2 (ja) * | 2004-04-28 | 2012-05-09 | パナソニック株式会社 | 蛍光x線分析方法および蛍光x線分析装置 |
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JP3965191B2 (ja) * | 2005-04-06 | 2007-08-29 | 理学電機工業株式会社 | 蛍光x線分析装置およびそれに用いるプログラム |
WO2006113974A1 (fr) | 2005-04-28 | 2006-11-02 | Scantech International Pty Ltd | Detecteur |
DE102005020567A1 (de) * | 2005-04-30 | 2006-11-09 | Katz, Elisabeth | Verfahren und Vorrichtung zur Online-Bestimmung des Aschegehalts einer auf einem Födermittel geförderten Substanz und Vorrichtung zur Durchführung einer Online-Analyse |
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DE102005046878A1 (de) * | 2005-09-29 | 2007-04-12 | Katz, Elisabeth | Vorrichtung und Verfahren zur Schnell- oder Online-Bestimmung der Komponenten eines Zwei- oder Mehrstoffsystems |
KR100974119B1 (ko) | 2006-02-01 | 2010-08-04 | 도시바 덴시칸 디바이스 가부시키가이샤 | X선원 및 형광 x선 분석 장치 |
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WO2010036906A1 (fr) * | 2008-09-26 | 2010-04-01 | Andrew Hession-Kunz | Spectromètre à main |
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GB1461270A (en) * | 1973-05-16 | 1977-01-13 | Nat Esearch Dev Corp | Chemical analysis of flowing materials |
US3864570A (en) * | 1973-09-24 | 1975-02-04 | William P Zingaro | Low energy x-ray detector |
US3982125A (en) * | 1975-01-09 | 1976-09-21 | The United States Of America As Represented By The Secretary Of The Army | Method and apparatus for providing height variation compensation in certain nuclear gauging applications including nuclear mine detection |
GB1494549A (en) * | 1975-03-14 | 1977-12-07 | Coal Ind | Determining the concentration of sulphur in coal |
ZA766086B (en) * | 1975-10-29 | 1977-07-27 | Atomic Energy Commission | Analysis of coal |
CA1144662A (fr) * | 1979-08-07 | 1983-04-12 | Dennis Page | Methode et dispositif de determination de la teneur en cendres des houilles |
US4566114A (en) * | 1980-06-20 | 1986-01-21 | Australian Atomic Energy Commission | X- and γ-Ray techniques for determination of the ash content of coal |
US4550768A (en) * | 1983-02-28 | 1985-11-05 | Foundry Technology, Inc. | Compactability measurement method and apparatus for sand casting |
US4582992A (en) * | 1984-08-10 | 1986-04-15 | Gamma-Metrics | Self-contained, on-line, real-time bulk material analyzer |
GB2182149B (en) * | 1985-10-25 | 1989-12-20 | Coal Ind | Improved moisture meter |
US4918315A (en) * | 1988-01-11 | 1990-04-17 | Penetron, Inc. | Neutron scatter method and apparatus for the noninvasive interrogation of objects |
US4882927A (en) * | 1988-01-19 | 1989-11-28 | Gregory Gould | Method and apparatus for auditing means used for measuring characteristics of a bulk material |
US5048761A (en) * | 1990-03-14 | 1991-09-17 | The Babcock & Wilcox Company | Pulverized coal flow monitor and control system and method |
US5261977A (en) * | 1991-08-01 | 1993-11-16 | Powell Stephen F | Method of fabrication free-standing thin films of polyimide |
US5646354A (en) * | 1995-10-06 | 1997-07-08 | Lovejoy Controls Corporation | Microwave thermal trace flowmeter |
US5750883A (en) * | 1996-11-12 | 1998-05-12 | Recot, Inc. | Method and apparatus for determining the salt content of snack foods |
-
1998
- 1998-09-17 US US09/156,078 patent/US6130931A/en not_active Expired - Lifetime
-
1999
- 1999-09-16 WO PCT/US1999/020867 patent/WO2000016078A1/fr active IP Right Grant
- 1999-09-16 ES ES99948188T patent/ES2385210T3/es not_active Expired - Lifetime
- 1999-09-16 CN CNB998120200A patent/CN1190662C/zh not_active Expired - Lifetime
- 1999-09-16 EP EP99948188.0A patent/EP1114310B2/fr not_active Expired - Lifetime
- 1999-09-16 DK DK99948188.0T patent/DK1114310T3/da active
- 1999-09-16 AT AT99948188T patent/ATE552493T1/de active
- 1999-09-16 AU AU61417/99A patent/AU759426B2/en not_active Expired
-
2001
- 2001-03-12 ZA ZA200102043A patent/ZA200102043B/en unknown
Also Published As
Publication number | Publication date |
---|---|
AU759426B2 (en) | 2003-04-17 |
US6130931A (en) | 2000-10-10 |
ATE552493T1 (de) | 2012-04-15 |
CN1328639A (zh) | 2001-12-26 |
EP1114310B2 (fr) | 2021-04-28 |
EP1114310A1 (fr) | 2001-07-11 |
ES2385210T3 (es) | 2012-07-19 |
WO2000016078A1 (fr) | 2000-03-23 |
DK1114310T3 (da) | 2012-06-25 |
AU6141799A (en) | 2000-04-03 |
CN1190662C (zh) | 2005-02-23 |
WO2000016078A9 (fr) | 2000-09-08 |
EP1114310B1 (fr) | 2012-04-04 |
EP1114310A4 (fr) | 2005-12-14 |
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