YU73904A - Difraktometar i postupak za difrakcionu analizu - Google Patents

Difraktometar i postupak za difrakcionu analizu

Info

Publication number
YU73904A
YU73904A YU73904A YUP73904A YU73904A YU 73904 A YU73904 A YU 73904A YU 73904 A YU73904 A YU 73904A YU P73904 A YUP73904 A YU P73904A YU 73904 A YU73904 A YU 73904A
Authority
YU
Yugoslavia
Prior art keywords
primary
diffractometer
euler
cradle
euler cradle
Prior art date
Application number
YU73904A
Other languages
English (en)
Inventor
Giovanni Berti
Original Assignee
Xrd-Tools S.R.L.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Xrd-Tools S.R.L. filed Critical Xrd-Tools S.R.L.
Publication of YU73904A publication Critical patent/YU73904A/sh
Publication of RS50427B publication Critical patent/RS50427B/sr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

Difraktometar i postupak za difrakcionu analizu koji koriste dva Ojlerova nosača, primarni i sekundarni Ojlerov nosač. Na primarni je Ojlerov nosač postavljen izvor jednog snopa zračenja, koji ima jednu osu kolimacije i detektor snopa zračenja koji ima jednu prijemnu osu, pri čemu pomenuta osa kolimacije i prijemna osa konvergiraju ka središtu difraktometra, koji je fiksiran u odnosu na primarni Ojlerov nosač. Izvor i detektor su prilagođeni da se pomeraju duž Ojlerovog primarnog nosača. Sekundarni Ojlerov nosač podupire primarni Ojlerov nosač i pripremljen je da ga obrće.[Diffractometer and method for diffraction analysis making use of two Euler cradles, a primary and a secondary Euler cradle. The primary Euler cradle supports a source of a radiation beam, having a collimation axis, and a radiation beam detector, having a reception axis, said collimation and reception axis, conveying in a centre of the diffractometer which is fixed with respect to the primary Euler cradle. The source and detector are adapted to move along the primary Euler cradle. The secondary Euler cradle supports the primary Euler cradle and is arranged to rotate the latter.
YUP-739/04A 2002-01-21 2004-08-20 Difraktometar i postupak za difrakcionu analizu RS50427B (sr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT2002MI000097A ITMI20020097A1 (it) 2002-01-21 2002-01-21 Diffrattometro e metodo per svolgere analisi diffrattrometriche

Publications (2)

Publication Number Publication Date
YU73904A true YU73904A (sh) 2006-08-17
RS50427B RS50427B (sr) 2009-12-31

Family

ID=11448930

Country Status (20)

Country Link
US (1) US7260178B2 (sh)
EP (1) EP1470413B1 (sh)
JP (1) JP2005515435A (sh)
KR (1) KR100990592B1 (sh)
CN (1) CN1620602B (sh)
AT (1) ATE463737T1 (sh)
AU (1) AU2003205636B2 (sh)
BG (1) BG108850A (sh)
CA (1) CA2473782A1 (sh)
DE (1) DE60332002D1 (sh)
ES (1) ES2345542T3 (sh)
HK (1) HK1070133A1 (sh)
IL (1) IL163082A (sh)
IT (1) ITMI20020097A1 (sh)
PT (1) PT1470413E (sh)
RS (1) RS50427B (sh)
RU (1) RU2314517C2 (sh)
SI (1) SI1470413T1 (sh)
WO (1) WO2003060498A1 (sh)
ZA (1) ZA200406268B (sh)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005010512A1 (en) * 2003-07-22 2005-02-03 X-Ray Optical Systems, Inc. Method and system for x-ray diffraction measurements using an aligned source and detector rotating around a sample surface
FI20041538A (fi) * 2004-11-29 2006-05-30 Stresstech Oy Goniometri
ITFI20050016A1 (it) 2005-02-02 2006-08-03 Giovanni Berti Diffrattometro a centro variabile
ITFI20050137A1 (it) 2005-06-20 2006-12-21 Giovanni Berti Apparecchiatura mobile per irragiamento e rilevazione di radiazioni
CN102221516B (zh) * 2011-03-17 2013-09-04 中国科学院化学研究所 中子反射谱仪单色器的调节装置和用其调整单色器的方法
DE102011117713B4 (de) 2011-07-28 2014-02-27 Alfred-Wegener-Institut Helmholtz-Zentrum für Polar- und Meeresforschung Transportables Goniospektrometer mit konstantem Observationszentrum
JP6685078B2 (ja) * 2013-03-15 2020-04-22 プロト マニュファクチャリング リミテッド Ｘ線回折装置およびｘ線回折装置駆動方法
CN104914121A (zh) * 2015-06-12 2015-09-16 朱彦婷 工程化单晶体取向的测量方法及装置
JP6394513B2 (ja) 2015-06-18 2018-09-26 新東工業株式会社 残留応力測定装置及び残留応力測定方法
CN105223216B (zh) * 2015-09-23 2018-03-30 北京科技大学 一种基于x射线衍射的材料微结构在线检测系统
CN107153075B (zh) * 2016-03-03 2019-12-20 核工业北京地质研究院 一种用于微区物相鉴定的x射线粉晶衍射方法
CN108414553B (zh) * 2017-12-15 2021-03-23 苏州新材料研究所有限公司 一种动态测量片状材料晶体织构的系统、设备及方法
CN108801184A (zh) * 2018-07-23 2018-11-13 安徽创谱仪器科技有限公司 用于薄片晶体的二维定向误差精密测量系统
RU2734684C1 (ru) * 2020-04-28 2020-10-21 Евгений Николаевич Болгов Устройство для рентгенографического контроля сварных швов стенки резервуара
CN111474198A (zh) * 2020-04-29 2020-07-31 西安交通大学 基于x光的电缆结晶检测装置
JP7485872B2 (ja) 2021-03-22 2024-05-17 株式会社リガク 放射線測定装置

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2843749A (en) * 1955-08-18 1958-07-15 United States Steel Corp System for measuring x-radiation
JPS5116984A (en) * 1974-08-02 1976-02-10 Hitachi Ltd X senoryokusokuteisochi
NL7803026A (nl) * 1978-03-21 1979-09-25 Philips Nv Instelmechanisme.
US4199678A (en) * 1979-01-31 1980-04-22 U.S. Philips Corporation Asymmetric texture sensitive X-ray powder diffractometer
JPS5588148U (sh) * 1979-12-06 1980-06-18
FR2589347B1 (fr) * 1985-11-05 1987-12-18 Philips Massiot Mat Medic Statif d'exploration isocentrique
GB2198920B (en) 1986-12-18 1990-11-14 Univ Moskovsk Apparatus for x-ray studies of crystalline matter
FR2632177A1 (fr) * 1988-06-03 1989-12-08 Gen Electric Cgr Statif de radiologie isocentrique a quatre axes de rotation
US5014293A (en) * 1989-10-04 1991-05-07 Imatron, Inc. Computerized tomographic x-ray scanner system and gantry assembly
JPH05107203A (ja) * 1991-10-15 1993-04-27 Jeol Ltd Ｘ線試料表面状態評価装置
US5359640A (en) * 1993-08-10 1994-10-25 Siemens Industrial Automation, Inc. X-ray micro diffractometer sample positioner
CN2236652Y (zh) * 1996-02-17 1996-10-02 中国航天工业总公司 一种x射线衍射仪
JPH10160688A (ja) * 1996-12-04 1998-06-19 Rigaku Corp 単結晶インゴットのｘ線トポグラフィー方法および装置
US6064717A (en) 1997-11-21 2000-05-16 Rigaku/Usa, Inc. Unrestricted motion apparatus and method for x-ray diffraction analysis
US7016457B1 (en) * 1998-12-31 2006-03-21 General Electric Company Multimode imaging system for generating high quality images

Also Published As

Publication number Publication date
IL163082A (en) 2009-11-18
ITMI20020097A0 (it) 2002-01-21
RS50427B (sr) 2009-12-31
WO2003060498A1 (en) 2003-07-24
BG108850A (en) 2005-04-30
EP1470413A1 (en) 2004-10-27
KR20040089115A (ko) 2004-10-20
RU2004125649A (ru) 2005-05-10
ES2345542T3 (es) 2010-09-27
AU2003205636B2 (en) 2008-06-26
CN1620602A (zh) 2005-05-25
ZA200406268B (en) 2006-06-28
DE60332002D1 (de) 2010-05-20
CA2473782A1 (en) 2003-07-24
EP1470413B1 (en) 2010-04-07
US20050141667A1 (en) 2005-06-30
PT1470413E (pt) 2010-10-08
ITMI20020097A1 (it) 2003-07-21
JP2005515435A (ja) 2005-05-26
ATE463737T1 (de) 2010-04-15
US7260178B2 (en) 2007-08-21
RU2314517C2 (ru) 2008-01-10
HK1070133A1 (en) 2005-06-10
CN1620602B (zh) 2010-11-03
SI1470413T1 (sl) 2011-05-31
KR100990592B1 (ko) 2010-10-29
AU2003205636A1 (en) 2003-07-30

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