WO2024067742A1 - 测试机、测试控制装置及方法 - Google Patents

测试机、测试控制装置及方法 Download PDF

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Publication number
WO2024067742A1
WO2024067742A1 PCT/CN2023/122211 CN2023122211W WO2024067742A1 WO 2024067742 A1 WO2024067742 A1 WO 2024067742A1 CN 2023122211 W CN2023122211 W CN 2023122211W WO 2024067742 A1 WO2024067742 A1 WO 2024067742A1
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test
device under
control unit
target
sequence
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PCT/CN2023/122211
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English (en)
French (fr)
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居宁
张晓彤
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北京华峰测控技术股份有限公司
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Publication of WO2024067742A1 publication Critical patent/WO2024067742A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Definitions

  • the present invention relates to the field of testing technology, and in particular to a testing machine, a testing control device and a testing method.
  • ATE Automatic Test Equipment
  • ATE includes a host, a tester, and a device under test (DUT).
  • the host sends a test sequence to the tester.
  • the tester generates an excitation signal based on the test sequence and sends it to the DUT.
  • the DUT feeds back a response signal to the tester based on the excitation signal.
  • the tester obtains test data based on the response signal and sends it to the host.
  • the host processes the test data and obtains the test results to instruct the handler to classify the DUT.
  • the present application provides a test control device.
  • the device includes a parallel control unit and a plurality of station control units, wherein one of the station control units is used to correspond to at least one device under test;
  • the parallel control unit is connected to the plurality of station control units respectively and is used to connect to the host, receive the test items sent by the host, and send each test sequence in the test items to the station control unit corresponding to the device under test corresponding to the test sequence;
  • Each of the workstation control units is used to connect to multiple test boards respectively, and each of the test boards implements different business functions; each of the workstation control units is used to send the test sequence to the corresponding test board according to the business function that needs to be implemented by the received test sequence, so as to test the device under test corresponding to the test sequence; when the test of the target device under test fails, the multiple test boards are controlled to stop testing the target device under test, and the target device under test is the device under test corresponding to the workstation control unit.
  • the station control unit is used to:
  • the target number is the number of the channel between the target device under test and each of the test boards;
  • a shutdown instruction carrying the target number is sent to at least one of the test boards to control each of the test boards to disconnect a channel corresponding to the target number.
  • the test failure information is test data obtained by the test board testing the target device under test, or a test result obtained by a co-processing module processing the test data.
  • the workstation control unit is used to send the shutdown instruction to each of the test boards respectively, or to send the shutdown instruction to the target test board, so that the target test board forwards the shutdown instruction to other test boards, and the target test board is any one of the multiple test boards.
  • the workstation control unit is further used to send an opening instruction to each of the test boards after the test corresponding to the test item is completed, so as to control each of the test boards to restore the channel corresponding to the target number.
  • the parallel control unit is used to receive a test configuration sent by the host, the test configuration including channel numbers corresponding to each of the test sequences, and the channel to which the channel number belongs is located between the test board and the device under test; distribute each test sequence in the test item and the channel number corresponding to the test sequence in the test configuration to the station control unit corresponding to the channel number;
  • Each of the workstation control units is used to send each received test sequence and the channel number corresponding to the test sequence to the test board corresponding to the channel number.
  • the device further comprises:
  • the packaging unit is connected in series between the station control unit and the test board, and is used to package the test sequences sent by at least two station control units to the same test board and the channel numbers corresponding to the test sequences and send them to the test board.
  • the device further comprises:
  • a synchronization unit is respectively connected to the packaging unit, the parallel control unit and the plurality of workstation control units, and is used to obtain a synchronization signal from the parallel control unit and send it to the plurality of workstation control units and the packaging unit.
  • the station control unit is further configured to stop sending the test sequence of the target device under test to the multiple test boards when the target device under test fails in the test.
  • the present application provides a test machine, which includes a test control device and a plurality of test boards as provided in the first aspect.
  • the test board includes a controller and a functional circuit
  • the controller is used to receive a shutdown instruction carrying a target label, where the target label is the label of the channel between the target device under test and the test board; and control the functional circuit to stop sending an excitation signal to the channel corresponding to the target label.
  • the present application provides a test control method, which is applied to the test control device provided in the first aspect.
  • the method comprises:
  • the parallel control unit receives the test items sent by the host, and sends each test sequence in the test items to the station control unit corresponding to the device under test corresponding to the test sequence;
  • Each of the workstation control units sends the received test sequence to a corresponding test board according to the service function to be implemented by the test sequence, so as to test the device under test corresponding to the test sequence;
  • the station control unit controls the multiple test boards to stop testing the target device under test, and the target device under test is the device under test corresponding to the station control unit.
  • the test control device includes a parallel control unit and a plurality of station control units, and one station control unit corresponds to at least one device under test.
  • the parallel control unit is respectively connected to the host and the plurality of station control units, receives the test items sent by the host, and sends each test sequence in the test item to the station control unit corresponding to the device under test corresponding to the test sequence.
  • Each station control unit is respectively connected to a plurality of test boards, and sends the test sequence to the corresponding test board according to the business function that needs to be realized by the received test sequence, and the business functions realized by each test board are different, so as to test the device under test corresponding to the test sequence.
  • the plurality of test boards are controlled to stop testing the device under test corresponding to the station control unit.
  • the test of the corresponding device under test can be independently controlled.
  • the test machine includes a test control device, and the test control method is applied to the test control device, so the test machine and the test control method can also stop a device under test from continuing to test separately, thereby avoiding the waste of test resources.
  • FIG1 is an application scenario diagram of a test control device in one embodiment
  • FIG2 is a schematic diagram of the structure of a test control device in one embodiment
  • FIG3 is a schematic diagram of information interaction between a test control device and a test board in one embodiment
  • FIG4 is a schematic diagram of internal interactive information of a test control device in one embodiment
  • FIG5 is a schematic diagram of information interaction between a test control device and a test board in one embodiment
  • FIG6 is a schematic diagram of shutting down multiple test board channels in one embodiment
  • FIG. 7 is a flow chart of a test control method in one embodiment.
  • first, second, etc. used in this application may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish a first element from another element.
  • a first resistor may be referred to as a second resistor, and similarly, a second resistor may be referred to as a first resistor. Both the first resistor and the second resistor are resistors, but they are not the same resistor.
  • connection in the following embodiments should be understood as “electrical connection”, “communication connection”, etc. if the connected circuits, modules, units, etc. have electrical signals or data transmission between each other.
  • the test of a device under test cannot be stopped individually.
  • the inventor has found that the reason for this problem is that, as shown in FIG1 , the test of a device under test 100 is jointly implemented by multiple test boards 200, and one test board 200 tests multiple devices under test 100 at the same time, and the connection relationship between the test board 200 and the device under test 100 is intricate. As the number of devices under test increases, it is difficult to achieve individual control of the test of a device under test. Therefore, when a single device under test fails in the test, the test cannot be stopped in time.
  • the present invention provides a test machine, a test control device and a method, which are specially provided with a station control unit corresponding to the device under test, and each test sequence in the test items sent by the host to the parallel control unit passes through the station control unit corresponding to the device under test corresponding to the test sequence, and can be sent to the test board corresponding to the business function required to be implemented by the test sequence, so as to test the device under test corresponding to the test sequence.
  • the test of each device under test can be controlled separately by the corresponding station control unit, and when a device under test fails in the test, the station control unit corresponding to the device under test can control the test board to stop testing the device under test, thereby avoiding the waste of test resources.
  • a test control device including a parallel control unit 10 and a plurality of station control units 20.
  • One station control unit 20 is used to correspond to at least one device under test 100.
  • the parallel control unit 10 is respectively connected to the plurality of station control units 20 and is used to connect to a host, receive test items sent by the host, and send each test sequence in the test item to the station control unit 20 corresponding to the device under test 100 corresponding to the test sequence.
  • Each station control unit 20 is used to connect to multiple test boards 200, each of which implements different business functions. Each station control unit 20 is used to send a test sequence to a corresponding test board 200 according to the business function that the received test sequence needs to implement, so as to test the device under test 100 corresponding to the test sequence; when the target device under test fails to be tested, control multiple test boards 200 to stop testing the target device under test, and the target device under test is the device under test 100 corresponding to the station control unit 20.
  • the parallel control unit 10 and the station control unit 20 are both processors. In practical applications, the parallel control unit 10 and the station control unit 20 can be implemented by the same processor or by different processors. The number of processors implementing the parallel control unit 10 and the station control unit 20 can be one or more.
  • the host sends a test item to the parallel control unit 10.
  • the parallel control unit 10 sends each test sequence in the test item to the station control unit 20 corresponding to the device under test 100 corresponding to the test sequence.
  • the station control unit 20 sends the test sequence to the corresponding test board 200 according to the service function that the received test sequence needs to implement.
  • the test board 200 sends an excitation signal to the device under test 100 corresponding to the test sequence according to the received test sequence.
  • the device under test 100 feeds back a response signal based on the received excitation signal.
  • the test board 200 obtains test data according to the received response signal. If the test data needs to be processed, the test board 200 sends the test data to the coprocessing module 300.
  • the coprocessing module 300 processes the test data to obtain a test result.
  • the station control unit 20 corresponding to the device under test 100 controls multiple test boards 200 to stop testing the device under test 100. At this time, the test of the devices under test 100 other than this device under test 100 is continued.
  • the test control device includes a parallel control unit and a plurality of station control units, and one station control unit corresponds to at least one device under test.
  • the parallel control unit is connected to the host and the plurality of station control units respectively, receives the test items sent by the host, and sends each test sequence in the test item to the station control unit corresponding to the device under test corresponding to the test sequence.
  • Each station control unit is connected to a plurality of test boards respectively, and sends the test sequence to the corresponding test board according to the business function to be realized by the received test sequence, and each test board realizes different business functions, so as to test the device under test corresponding to the test sequence.
  • the plurality of test boards are controlled to stop testing the device under test corresponding to the station control unit.
  • the test of the corresponding device under test can be independently controlled. In this way, when a device under test fails in the test, the station control unit corresponding to the device under test can control the test board to stop testing the device under test, thereby avoiding the waste of test resources.
  • test boards are different, which can be understood as including the following situations: the business functions implemented by the test boards are all different, and are different from each other; or, the business functions implemented by a part of the test boards are different, while the business functions implemented by another part of the test boards are the same; or, each of the test boards implements multiple business functions, and there are some identical business functions among the multiple business functions of each test board.
  • the workstation control unit 20 is used to receive test failure information of a target device under test; determine a target label based on the test failure information, where the target label is the label of a channel between the target device under test and each test board 200; and send a shutdown instruction carrying the target label to at least one test board 200 to control each test board 200 to disconnect the channel corresponding to the target label.
  • Fig. 3 is a schematic diagram of information exchange between the test control device and the test board.
  • the test performed by the third test board 200 sending an excitation signal to the first device under test 100 fails, and the test failure information is first sent from the first device under test 100 to the third test board 200, and then sent from the third test board 200 to the third station control unit 20 corresponding to the first device under test 100 (indicated by dotted lines in the figure).
  • the third station control unit 20 sends a shutdown instruction (indicated by solid lines in the figure) to multiple test boards 200 to control the disconnection of the channels of each test board 200 connected to the first device under test 100.
  • the test board by receiving the test failure information of the target device under test, it can be determined that the target device under test has failed the test, and the test failure information originates from the target device under test, and the number of the channel between the target device under test and each test board, that is, the target number, can be determined based on the test failure information.
  • the test board By sending a shutdown instruction carrying the target number to the test board, the test board can disconnect the channel between it and the target device under test based on the number of the channel between it and the target device under test, thereby controlling the test board to stop testing the target device under test.
  • the test failure information is test data obtained by the test board 200 testing the target device under test.
  • the test in which the third test board 200 sends an excitation signal to the first device under test 100 fails.
  • the test failure information is first sent from the first device under test 100 to the third test board 200, and then from the third test board 200 to the third station control unit 20 corresponding to the first device under test 100 (indicated by a dotted line in the figure).
  • the test failure information is a test result obtained by the co-processing module 300 processing the test data.
  • FIG4 is a schematic diagram of the internal interactive information of the test control device.
  • the test performed by the third test board 200 sending an excitation signal to the first device under test 100 fails, the first device under test 100 generates a response signal based on the excitation signal and sends it to the third test board 200, the third test board 200 generates test data according to the response signal and sends it to the co-processing module 300, and the co-processing module 300 processes the test data to obtain the test result, i.e., the test failure information.
  • This test failure information is sent from the co-processing module 300 to the third station control unit 20 corresponding to the first device under test 100 (indicated by a dotted line in the figure).
  • the station control unit 20 is used to send a shutdown instruction to each test board 200 respectively.
  • the test performed by the third test board 200 sending an excitation signal to the first device under test 100 fails, and the test failure information is sent to the third station control unit 20 (indicated by a dotted line in the figure) corresponding to the first device under test 100.
  • the third station control unit 20 sends a shutdown instruction (indicated by a solid line in the figure) to each test board 200 to control the channel of each test board 200 connected to the first device under test 100 to be disconnected.
  • the station control unit 20 is used to send a shutdown instruction to a target test board so that the target test board forwards the shutdown instruction to other test boards.
  • the target test board is any one of the multiple test boards 200 .
  • Fig. 5 is a schematic diagram of information exchange between the test control device and the test board. As shown in Fig. 5, from left to right, the test performed by the third test board 200 sending an excitation signal to the first device under test 100 fails, and the test failure information is sent to the third station control unit 20 corresponding to the first device under test 100.
  • the third station control unit 20 first sends a shutdown command to the third test board 200, and the third test board 200 then sends a shutdown command to the fourth test board 200, the fifth test board 200, and the sixth test board 200 (indicated by solid lines in the figure) to control the channels of each test board 200 connected to the first device under test 100 to be disconnected.
  • the station control unit 20 is further used to send an opening instruction to each test board 200 after the test corresponding to the test item is completed, so as to control each test board 200 to restore the channel corresponding to the target number.
  • the workstation control unit sends an open instruction to each test board to control each test board to restore the previously disconnected channel, which is facilitating the subsequent testing.
  • the parallel control unit 10 is used to receive the test configuration sent by the host, the test configuration includes the channel number corresponding to each test sequence, and the channel to which the channel number belongs is located between the test board 200 and the device under test 100; distribute each test sequence in the test item and the channel number corresponding to the test sequence in the test configuration to the station control unit 20 corresponding to the channel number.
  • Each station control unit 20 is used to send the received test sequence and the channel number corresponding to the test sequence to the test board 20 corresponding to the channel number.
  • the test sequence can be sent from the parallel control unit to the station control unit corresponding to the corresponding device under test, and from the station control unit to the corresponding test board, etc. according to the channel number.
  • the station control unit 20 is further configured to stop sending the test sequence of the target device under test to the multiple test boards 200 when the target device under test fails in the test.
  • Fig. 6 is a schematic diagram of multiple test board channel shutoffs.
  • the host 500 internal storage has multiple test items, test configurations and test judgment criteria, and the test judgment criteria are used to determine whether the test is successful or failed.
  • Multiple test items include test item A, test item B, test item C, test item D, etc., and each test item includes multiple test sequences.
  • the host sends the test sequence in each test item to the corresponding station control unit 20, and each station control unit 20 forms a respective test item.
  • the first station control unit 20 forms test item A1, test item B1, test item C1, etc.
  • the second station control unit 20 forms test item A2, test item B2, test item C2, etc.
  • the third station control unit 20 forms test item A3, test item B3, test item C3, etc.
  • Test item A1 includes test sequence N, test sequence N+1, test sequence N+2, etc., and tests the first device under test 100 corresponding to the first station control unit 20.
  • the test sequence N fails to test the first device under test 100.
  • the service functions to be implemented by the test sequence N+1 correspond to the first test board 200 (power board), the second test board 200 (digital circuit board), and the third test board 200 (signal source board), and the first device under test 100 is tested. Therefore, the first station control unit 20 stops sending the test sequence N+1 to the first test board 200, the second test board 200, and the third test board 200.
  • the test of the corresponding device under test can be independently controlled. In this way, when a device under test fails, the station control unit corresponding to the device under test can stop sending the test sequence of the device under test to each test board, thereby avoiding the waste of test resources.
  • the device further includes a packaging unit 30.
  • the packaging unit 30 is connected in series between the station control unit 20 and the test board 200, and is used to package the test sequences and the channel labels corresponding to the test sequences sent by at least two station control units 20 to the same test board 200 and send them to the test board 200.
  • the packaging unit 30 is a processor. In practical applications, the parallel control unit 10, the station control unit 20 and the packaging unit 30 can be implemented by the same processor or by different processors.
  • the plurality of station control units 20 send the test sequences and the corresponding channel numbers to the packaging unit 30.
  • the packaging unit 30 packages the test sequences sent to the same test board 200 together and sends them to the test board 200.
  • test sequences sent to the same test board by different station control units are packaged together and sent to the test board, which is beneficial to improving the efficiency of data transmission.
  • the device further includes a synchronization unit 40 , which is respectively connected to the packaging unit 30 , the parallel control unit 10 and multiple workstation control units 20 , and is used to obtain a synchronization signal from the parallel control unit 10 and send it to multiple workstation control units 20 and the packaging unit 30 .
  • a synchronization unit 40 which is respectively connected to the packaging unit 30 , the parallel control unit 10 and multiple workstation control units 20 , and is used to obtain a synchronization signal from the parallel control unit 10 and send it to multiple workstation control units 20 and the packaging unit 30 .
  • the synchronization unit 40 is a processor.
  • the parallel control unit 10, the station control unit 20, the packaging unit 30 and the synchronization unit 40 can be implemented by the same processor or by different processors.
  • the host sends the test items and the test configuration together to the parallel control unit 10.
  • the parallel control unit 10 can determine the order in which each test sequence in the test items is sent, and send a synchronization signal indicating that the test sequence information is sent at the same time to the station control unit 20 and the packaging unit 30.
  • the station control unit 20 and the packaging unit 30 send the test sequences sent at the same time together according to the synchronization signal.
  • a synchronization module is added in the main control module to maintain the order in which the test sequences are sent.
  • test machine includes a test control device 400 and a plurality of test boards 200 provided in any of the above embodiments.
  • the test board 200 is a circuit board for testing.
  • multiple test boards 200 can be integrated into one, that is, multiple test boards 200 implement circuits for different business functions distributed on the same board.
  • Multiple test boards 200 can also be independent of each other, that is, multiple test boards 200 implement circuits for different business functions distributed on different boards, such as a circuit for implementing one business function distributed on one board to form a circuit board, and a circuit for implementing another business function distributed on another board to form another circuit board.
  • the test board 200 includes a controller 210 and a functional circuit 220.
  • the controller 210 is used to receive a shutdown instruction carrying a target label, where the target label is the label of the channel between the target device under test and the test board; and control the functional circuit 220 to stop sending an excitation signal to the channel corresponding to the target label.
  • the controller 210 implements information interaction between the test board 200 and the outside (including with other test boards 200), and the functional circuit 220 implements the service functions of the test board 200.
  • the controller 210 may include a processor and a communication interface.
  • test control device 400 sends the test sequence and the channel number together to the controller 210.
  • the controller 210 controls the functional circuit 220 to generate a corresponding excitation signal according to the test sequence, and sends the excitation signal to the device under test 100 corresponding to the channel number.
  • a controller is provided in the main control module, which can realize information interaction between the test board and the outside.
  • test control method is also provided, which is applied to the test control device provided in any of the above embodiments. As shown in FIG7 , the method comprises the following steps:
  • the parallel control unit receives a test item sent by a host, and sends each test sequence in the test item to a station control unit corresponding to the device under test corresponding to the test sequence.
  • each station control unit sends the test sequence to the corresponding test board according to the service function to be realized by the received test sequence, so as to test the device under test corresponding to the test sequence.
  • the station control unit controls the multiple test boards to stop testing the target device under test, where the target device under test is the device under test corresponding to the station control unit.

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Abstract

本发明涉及一种测试机、测试控制装置及方法。装置包括平行控制单元和多个工位控制单元，一个工位控制单元对应至少一个被测器件；平行控制单元分别连接多个工位控制单元并连接主机，接收主机发送的测试项，并将测试项中的各个测试序列发送给测试序列对应的被测器件对应的工位控制单元；每个工位控制单元分别连接多个测试板卡，各个测试板卡实现的业务功能不同；每个工位控制单元，根据接收到的测试序列需要实现的业务功能，将测试序列发送给对应的测试板卡，以对测试序列对应的被测器件进行测试；当目标被测器件测试失败时，控制多个测试板卡停止对目标被测器件进行测试，目标被测器件为工位控制单元对应的被测器件。本发明能够停止某个器件测试。

Description

测试机、测试控制装置及方法
本申请要求于2022年9月29日提交中国国家知识产权局、申请号202211198404.7、申请名称为“测试机、测试控制装置及方法”的中国专利申请的优先权，其全部内容通过引用结合在本申请中。
技术领域
本发明涉及测试技术领域，特别是涉及一种测试机、测试控制装置及方法。
背景技术
自动测试设备(Automatic Test Equipment，简称ATE)是半导体产业中检测集成电路(Integrated Circuit，简称IC)功能完整性的设备，应用于集成电路生产制造的最后流程，以确保集成电路生产制造的品质。
ATE包括主机(Host)、测试机(Tester)和被测器件(Device Under Test，简称DUT)。主机将测试序列(test sequence)发送给测试机。测试机根据测试序列生成激励信号，并发送给被测器件。被测器件根据激励信号反馈响应信号给测试机。测试机根据响应信号得到测试数据，并发送给主机。主机对测试数据进行处理，得到测试结果，以指示机械手(Handler)对被测器件进行分类。
然而，随着被测器件的数量增加，单个被测器件出现测试失败时，却无法及时停止测试。
发明内容
基于此，有必要提供一种能够单独停止对某个被测器件继续测试的测试机、测试控制装置及方法。
第一方面，本申请提供了一种测试控制装置。所述装置包括平行控制单元和多个工位控制单元，一个所述工位控制单元用于对应至少一个被测器件；
所述平行控制单元，分别连接所述多个工位控制单元并用于连接主机，接收所述主机发送的测试项，并将所述测试项中的各个测试序列发送给所述测试序列对应的被测器件对应的工位控制单元；
每个所述工位控制单元，用于分别连接多个测试板卡，各个所述测试板卡实现的业务功能不同；每个所述工位控制单元用于，根据接收到的测试序列需要实现的业务功能，将所述测试序列发送给对应的测试板卡，以对所述测试序列对应的被测器件进行测试；当目标被测器件测试失败时，控制所述多个测试板卡停止对所述目标被测器件进行测试，所述目标被测器件为所述工位控制单元对应的被测器件。
在其中一个实施例中，所述工位控制单元用于，
接收所述目标被测器件的测试失败信息；
根据所述测试失败信息确定目标标号，所述目标标号为所述目标被测器件与各个所述测试板卡之间的通道的标号；
向至少一个所述测试板卡发送携带所述目标标号的关断指令，以控制各个所述测试板卡断开所述目标标号对应的通道。
在其中一个实施例中，所述测试失败信息为所述测试板卡对所述目标被测器件进行测试得到的测试数据，或协处理模块对所述测试数据处理得到的测试结果。
在其中一个实施例中，所述工位控制单元用于，分别向各个所述测试板卡发送所述关断指令，或向目标测试板卡发送所述关断指令，以使所述目标测试板卡向其它测试板卡转发所述关断指令，所述目标测试板卡为所述多个测试板卡中的任意一个测试板卡。
在其中一个实施例中，所述工位控制单元还用于，在所述测试项对应的测试完成后，向各个所述测试板卡发送开启指令，以控制各个所述测试板卡恢复所述目标标号对应的通道。
在其中一个实施例中，所述平行控制单元用于，接收所述主机发送的测试配置，所述测试配置包括各个所述测试序列对应的通道标号，所述通道标号所属的通道位于所述测试板卡和所述被测器件之间；将所述测试项中的各个测试序列和所述测试配置中与所述测试序列对应的通道标号分发给所述通道标号对应的工位控制单元；
每个所述工位控制单元用于，将接收到的各个测试序列和所述测试序列对应的通道标号发送给所述通道标号对应的测试板卡。
在其中一个实施例中，所述装置还包括：
打包单元，串联在所述工位控制单元和所述测试板卡之间，用于将至少两个所述工位控制单元发送给同一个所述测试板卡的测试序列和所述测试序列对应的通道标号打包发送给所述测试板卡。
在其中一个实施例中，所述装置还包括：
同步单元，分别连接所述打包单元、所述平行控制单元和所述多个工位控制单元，用于从所述平行控制单元获取同步信号，并发送给所述多个工位控制单元和所述打包单元。
在其中一个实施例中，所述工位控制单元还用于，当目标被测器件测试失败时，停止向所述多个测试板卡发送所述目标被测器件的测试序列。
第二方面，本申请提供了一种测试机。所述测试机包括如第一方面提供的测试个控制装置和多个测试板卡。
在其中一个实施例中，所述测试板卡包括控制器和功能电路；
所述控制器，用于接收携带目标标号的关断指令，所述目标标号为所述目标被测器件与所述测试板卡之间的通道的标号；控制所述功能电路停止向所述目标标号对应的通道发送激励信号。
第三方面，本申请提供了一种测试控制方法，应用于第一方面提供的测试控制装置。所述方法包括：
所述平行控制单元接收所述主机发送的测试项，并将所述测试项中的各个测试序列发送给所述测试序列对应的被测器件对应的工位控制单元；
每个所述工位控制单元根据接收到的测试序列需要实现的业务功能，将所述测试序列发送给对应的测试板卡，以对所述测试序列对应的被测器件进行测试；
当目标被测器件测试失败时，所述工位控制单元控制所述多个测试板卡停止对所述目标被测器件进行测试，所述目标被测器件为所述工位控制单元对应的被测器件。
上述测试机、测试控制装置及方法，测试控制装置包括平行控制单元和多个工位控制单元，一个工位控制单元对应至少一个被测器件。平行控制单元分别连接主机和多个工位控制单元，接收主机发送的测试项，并将测试项中的各个测试序列发送给测试序列对应的被测器件对应的工位控制单元。每个工位控制单元分别连接多个测试板卡，根据接收到的测试序列需要实现的业务功能，将测试序列发送给对应的测试板卡，各个测试板卡实现的业务功能不同，以对测试序列对应的被测器件进行测试。当工位控制单元对应的被测器件测试失败时，控制多个测试板卡停止对工位控制单元对应的被测器件进行测试。通过专门设置与被测器件对应的工位控制单元，可以独立控制对应被测器件的测试。这样当某个被测器件测试失败时，这个被测器件对应的工位控制单元可以控制测试板卡停止对这个被测器件的测试，避免测试资源的浪费。另外，测试机包括测试控制装置，测试控制方法应用于测试控制装置，因此测试机和测试控制方法也可以单独停止某个被测器件继续测试，避免测试资源的浪费。
附图说明
为了更清楚地说明本申请实施例或传统技术中的技术方案，下面将对实施例或传统技术描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图仅仅是本申请的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
图1为一个实施例中测试控制装置的应用场景图；
图2为一个实施例中测试控制装置的结构示意图；
图3为一个实施例中测试控制装置与测试板卡之间交互信息的示意图；
图4为一个实施例中测试控制装置内部交互信息的示意图；
图5为一个实施例中测试控制装置与测试板卡之间交互信息的示意图；
图6为一个实施例中多个测试板卡通道关断的示意图；
图7为一个实施例中测试控制方法的流程图。
附图标记说明：
10、平行控制单元，20、工位控制单元，30，打包单元，40，同步单元；
100、被测器件；
200、测试板卡，210、控制器，220、功能电路；
300、协处理模块；
400、测试控制装置；
500、主机。
具体实施方式
为了便于理解本申请，下面将参照相关附图对本申请进行更全面的描述。附图中给出了本申请的实施例。但是，本申请可以以许多不同的形式来实现，并不限于本文所描述的实施例。相反地，提供这些实施例的目的是使本申请的公开内容更加透彻全面。
除非另有定义，本文所使用的所有的技术和科学术语与属于本申请的技术领域的技术人员通常理解的含义相同。本文中在本申请的说明书中所使用的术语只是为了描述具体的实施例的目的，不是旨在于限制本申请。
可以理解，本申请所使用的术语“第一”、“第二”等可在本文中用于描述各种元件，但这些元件不受这些术语限制。这些术语仅用于将第一个元件与另一个元件区分。举例来说，在不脱离本申请的范围的情况下，可以将第一电阻称为第二电阻，且类似地，可将第二电阻称为第一电阻。第一电阻和第二电阻两者都是电阻，但其不是同一电阻。
可以理解，以下实施例中的“连接”，如果被连接的电路、模块、单元等相互之间具有电信号或数据的传递，则应理解为“电连接”、“通信连接”等。
在此使用时，单数形式的“一”、“一个”和“所述/该”也可以包括复数形式，除非上下文清楚指出另外的方式。还应当理解的是，术语“包括/包含”或“具有”等指定所陈述的特征、整体、步骤、操作、组件、部分或它们的组合的存在，但是不排除存在或添加一个或更多个其他特征、整体、步骤、操作、组件、部分或它们的组合的可能性。同时，在本说明书中使用的术语“和/或”包括相关所列项目的任何及所有组合。
正如背景技术所述，现有技术中存在一个被测器件的测试不能单独停止的问题，经发明人研究发现，出现这种问题的原因在于，如图1所示，一个被测器件100的测试由多个测试板卡200共同实现，一个测试板卡200同时对多个被测器件100进行测试，测试板卡200与被测器件100之间的连接关系错综复杂。随着被测器件的数量增加，很难实现对一个被测器件的测试进行单独控制。因此，单个被测器件出现测试失败时，无法及时停止测试。
基于以上原因，本发明提供了一种测试机、测试控制装置及方法，专门设置与被测器件对应的工位控制单元，主机发送给平行控制单元的测试项中的各个测试序列经过测试序列对应的被测器件对应的工位控制单元，才能发送给测试序列需要实现的业务功能对应的测试板卡，对测试序列对应的被测器件进行测试。这样各个被测器件的测试可以由对应的工位控制单元进行单独控制，当一个被测器件测试失败时，这个被测器件对应的工位控制单元可以控制测试板卡停止对这个被测器件的测试，避免测试资源的浪费。
在一个实施例中，如图2所示，提供了一种测试控制装置，包括平行控制单元10和多个工位控制单元20。一个工位控制单元20用于对应至少一个被测器件100。平行控制单元10分别连接多个工位控制单元20并用于连接主机，接收主机发送的测试项，并将测试项中的各个测试序列发送给测试序列对应的被测器件100对应的工位控制单元20。
每个工位控制单元20用于分别连接多个测试板卡200，各个测试板卡200实现的业务功能不同。每个工位控制单元20用于，根据接收到的测试序列需要实现的业务功能，将测试序列发送给对应的测试板卡200，以对测试序列对应的被测器件100进行测试；当目标被测器件测试失败时，控制多个测试板卡200停止对目标被测器件进行测试，目标被测器件为工位控制单元20对应的被测器件100。
其中，平行控制单元10和工位控制单元20均为处理器。在实际应用中，平行控制单元10和工位控制单元20可以采用同一个处理器实现，也可以采用不同的处理器实现。实现平行控制单元10和工位控制单元20的处理器的数量可以为一个，也可以为多个。
具体地，主机向平行控制单元10发送测试项。平行控制单元10将测试项中的各个测试序列发送给测试序列对应的被测器件100对应的工位控制单元20。工位控制单元20根据接收到的测试序列需要实现的业务功能，将测试序列发送给对应的测试板卡200。测试板卡200根据接收到的测试序列向测试序列对应的被测器件100发送激励信号。被测器件100基于接收到激励信号反馈响应信号。测试板卡200根据接收到的响应信号得到测试数据。如果测试数据需要处理，则测试板卡200将测试数据发送给协处理模块300。协处理模块300对测试数据进行处理，得到测试结果。如果测试板卡200得到的测试数据或者协处理模块300得到的测试结果表明某个被测器件100的测试失败，则这个被测器件100对应的工位控制单元20控制多个测试板卡200停止对这个被测器件100进行测试。此时，除这个被测器件100之外的被测器件100的测试继续进行。
上述测试控制装置中，包括平行控制单元和多个工位控制单元，一个工位控制单元对应至少一个被测器件。平行控制单元分别连接主机和多个工位控制单元，接收主机发送的测试项，并将测试项中的各个测试序列发送给测试序列对应的被测器件对应的工位控制单元。每个工位控制单元分别连接多个测试板卡，根据接收到的测试序列需要实现的业务功能，将测试序列发送给对应的测试板卡，各个测试板卡实现的业务功能不同，以对测试序列对应的被测器件进行测试。当工位控制单元对应的被测器件测试失败时，控制多个测试板卡停止对工位控制单元对应的被测器件进行测试。通过专门设置与被测器件对应的工位控制单元，可以独立控制对应被测器件的测试。这样当某个被测器件测试失败时，这个被测器件对应的工位控制单元可以控制测试板卡停止对这个被测器件的测试，避免测试资源的浪费。
上述的各个测试板卡实现的业务功能不同，可以理解为，包括如下几种情况：各个测试板卡实现的业务功能均不相同，两两之间都不同；或者，各个测试板卡中有部分数量的测试板卡实现的业务功能不相同，而另一部分数量的测试板卡实现的业务功能相同；又或者，各个测试板卡中每个测试板卡均实现有多个业务功能，而各个测试板卡的多个业务功能之间，存在部分相同的业务功能。
在一个实施例中，工位控制单元20用于，接收目标被测器件的测试失败信息；根据测试失败信息确定目标标号，目标标号为目标被测器件与各个测试板卡200之间的通道的标号；向至少一个测试板卡200发送携带目标标号的关断指令，以控制各个测试板卡200断开目标标号对应的通道。
图3为测试控制装置与测试板卡之间交互信息的示意图。如图3所示，按照从左到右的方向，第三个测试板卡200向第一个被测器件100发送激励信号进行的测试失败，测试失败信息先从第一个被测器件100发送到第三个测试板卡200，再从第三个测试板卡200发送到第一个被测器件100对应的第三个工位控制单元20(图中用虚线表示)。第三个工位控制单元20向多个测试板卡200发送关断指令(图中用实线表示)，以控制各个测试板卡200连接第一个被测器件100的通道断开。
上述实施例中，通过接收目标被测器件的测试失败信息，可以确定目标被测器件测试失败，并且测试失败信息源自目标被测器件，可以根据测试失败信息确定目标被测器件与各个测试板卡之间的通道的标号，即目标标号。通过向测试板卡发送携带目标标号的关断指令，测试板卡即可根据其与目标被测器件之间的通道的标号，将其与目标被测器件之间的通道断开，从而控制测试板卡停止对目标被测器件进行测试。
在一个实施例中，测试失败信息为测试板卡200对目标被测器件进行测试得到的测试数据。
如图3所示，按照从左到右的方向，第三个测试板卡200向第一个被测器件100发送激励信号进行的测试失败，测试失败信息先从第一个被测器件100发送到第三个测试板卡200，再从第三个测试板卡200发送到第一个被测器件100对应的第三个工位控制单元20(图中用虚线表示)。
在一个实施例中，测试失败信息为协处理模块300对测试数据处理得到的测试结果。
图4为测试控制装置内部交互信息的示意图。如图4所示，按照从左到右的方向，第三个测试板卡200向第一个被测器件100发送激励信号进行的测试失败，第一个被测器件100基于激励信号产生响应信号并发送给第三个测试板卡200，第三个测试板卡200根据响应信号产生测试数据并发送给协处理模块300，协处理模块300处理测试数据得到测试结果，即测试失败信息。这个测试失败信息从协处理模块300发送到第一个被测器件100对应的第三个工位控制单元20(图中用虚线表示)。
在一个实施例中，工位控制单元20用于，分别向各个测试板卡200发送关断指令。
如图3所示，按照从左到右的方向，第三个测试板卡200向第一个被测器件100发送激励信号进行的测试失败，测试失败信息发送到第一个被测器件100对应的第三个工位控制单元20(图中用虚线表示)。第三个工位控制单元20分别向各个测试板卡200发送关断指令(图中用实线表示)，以控制各个测试板卡200连接第一个被测器件100的通道断开。
在另一个实施例中，工位控制单元20用于，向目标测试板卡发送关断指令，以使目标测试板卡向其它测试板卡转发关断指令，目标测试板卡为多个测试板卡200中的任意一个测试板卡200。
图5为测试控制装置与测试板卡之间交互信息的示意图。如图5所示，按照从左到右的方向，第三个测试板卡200向第一个被测器件100发送激励信号进行的测试失败，测试失败信息发送到第一个被测器件100对应的第三个工位控制单元20。第三个工位控制单元20先向第三个测试板卡200发送关断指令，第三个测试板卡200再向第四个测试板卡200、第五个测试板卡200、以及第六个测试板卡200发送关断指令(图中用实线表示)，以控制各个测试板卡200连接第一个被测器件100的通道断开。
在一个实施例中，工位控制单元20还用于，在测试项对应的测试完成后，向各个测试板卡200发送开启指令，以控制各个测试板卡200恢复目标标号对应的通道。
上述实施例中，测试项对应的测试完成之后，可能会对被测器件进行其它测试，也可能会更换被测器件进行测试，此时工位控制单元向各个测试板卡发送开启指令，控制各个测试板卡恢复之前断开的通道，有利于后续测试的进行。
在一个实施例中，平行控制单元10用于，接收主机发送的测试配置，测试配置包括各个测试序列对应的通道标号，通道标号所属的通道位于测试板卡200和被测器件100之间；将测试项中的各个测试序列和测试配置中与测试序列对应的通道标号分发给通道标号对应的工位控制单元20。每个工位控制单元20用于，将接收到的各个测试序列和试序列对应的通道标号发送给通道标号对应的测试板卡200。
上述实施例中，通过将通道标号与对应的测试序列一起发送，可以根据通道标号将测试序列从平行控制单元发送给对应的被测器件对应的工位控制单元、以及从工位控制单元发送给对应的测试板卡等。
在一个实施例中，工位控制单元20还用于，当目标被测器件测试失败时，停止向多个测试板卡200发送目标被测器件的测试序列。
图6为多个测试板卡通道关断的示意图。如图6所示，主机500内部存储有多个测试项、测试配置和测试判断标准，测试判断标准用于确定测试成功还是失败。多个测试项包括测试项A、测试项B、测试项C、测试项D等，每个测试项包括多个测试序列。主机将各个测试项中的测试序列发送给对应的工位控制单元20，各个工位控制单元20形成各自的测试项。按照从左到右的顺序，第一个工位控制单元20形成测试项A1、测试项B1、测试项C1等，第二个工位控制单元20形成测试项A2、测试项B2、测试项C2等，第三个工位控制单元20形成测试项A3、测试项B3、测试项C3等。
测试项A1包括测试序列N、测试序列N+1、测试序列N+2等，对第一个工位控制单元20对应的第一个被测器件100进行测试。采用测试序列N对第一个被测器件100测试失败，测试序列N+1需要实现的业务功能对应第一个测试板卡200(电源板)、第二个测试板卡200(数字电路板)、第三个测试板卡200(信号源板)，对第一个被测器件100进行测试，因此第一个工位控制单元20停止向第一个测试板卡200、第二个测试板卡200、以及第三个测试板卡200发送测试序列N+1。
上述实施例中，通过专门设置与被测器件对应的工位控制单元，可以独立控制对应被测器件的测试。这样当某个被测器件测试失败时，这个被测器件对应的工位控制单元可以停止向各个测试板卡发送这个被测器件的测试序列，避免测试资源的浪费。
在一个实施例中，如图2所示，该装置还包括打包单元30。打包单元30串联在工位控制单元20和测试板卡200之间，用于将至少两个工位控制单元20发送给同一个测试板卡200的测试序列和测试序列对应的通道标号打包发送给测试板卡200。
其中，打包单元30为处理器。在实际应用中，平行控制单元10、工位控制单元20和打包单元30可以采用同一个处理器实现，也可以采用不同的处理器实现。
具体地，多个工位控制单元20将测试序列和对应的通道标号发送给打包单元30。打包单元30将发送给同一个测试板卡200的测试序列打包在一起，再发送给测试板卡200。
上述实施例中，不同工位控制单元发送给同一个测试板卡的测试序列打包在一起发送给测试板卡，有利于提高数据传输的效率。
在一个实施例中，如图3所示，该装置还包括同步单元40，分别连接打包单元30、平行控制单元10和多个工位控制单元20，用于从平行控制单元10获取同步信号，并发送给多个工位控制单元20和打包单元30。
其中，同步单元40为处理器。在实际应用中，平行控制单元10、工位控制单元20、打包单元30和同步单元40可以采用同一个处理器实现，也可以采用不同的处理器实现。
具体地，主机将测试项和测试配置一起发送给平行控制单元10，平行控制单元10可以确定测试项中各个测试序列发送的先后顺序，并将表示同一时刻发送测试序列信息的同步信号发送给工位控制单元20和打包单元30。工位控制单元20和打包单元30根据同步信号，将同一时刻发送的测试序列一起发送。
上述实施例中，通过在主控模块内增设同步模块，以维护测试序列发送的先后顺序。
基于同样的发明构思，还提供了一种测试机，如图2所示，测试机包括上述任一实施例提供的测试控制装置400和多个测试板卡200。
其中，测试板卡200是进行测试的电路板。在实际应用中，多个测试板卡200可以集成一体，即多个测试板卡200实现不同业务功能的电路分布在同一个板体上。多个测试板卡200也可以相互独立，即多个测试板卡200实现不同业务功能的电路分布在不同的板体上，如实现一种业务功能的电路分布在一个板体上，形成一个电路板，实现另一种业务功能的电路分布在另一个板体上，形成另一个电路板。
在一个实施例中，如图2所示，测试板卡200包括控制器210和功能电路220。控制器210用于接收携带目标标号的关断指令，目标标号为目标被测器件与测试板卡之间的通道的标号；控制功能电路220停止向目标标号对应的通道发送激励信号。
其中，控制器210实现测试板卡200与外部(包括与其他测试板卡200之间)的信息交互，功能电路220实现测试板卡200的业务功能。在实际应用中，控制器210可以包括处理器和通信接口。
具体地，测试控制装置400将测试序列和通道标号一起发送给控制器210。控制器210根据测试序列控制功能电路220产生对应的激励信号，并将激励信号发送给通道标号对应的被测器件100。
上述实施例中，主控模块内设有控制器，可以实现测试板卡与外部的信息交互。
基于同样的发明构思，还提供了一种测试控制方法，应用于上述任一实施例提供的测试控制装置。如图7所示，该方法包括如下步骤：
S701，平行控制单元接收主机发送的测试项，并将测试项中的各个测试序列发送给测试序列对应的被测器件对应的工位控制单元。
S702，每个工位控制单元根据接收到的测试序列需要实现的业务功能，将测试序列发送给对应的测试板卡，以对测试序列对应的被测器件进行测试。
S703，当目标被测器件测试失败时，工位控制单元控制多个测试板卡停止对目标被测器件进行测试，目标被测器件为工位控制单元对应的被测器件。
在本说明书的描述中，参考术语“有些实施例”、“其他实施例”、“理想实施例”等的描述意指结合该实施例或示例描述的具体特征、结构、材料或者特征包含于本发明的至少一个实施例或示例中。在本说明书中，对上述术语的示意性描述不一定指的是相同的实施例或示例。
以上所述实施例的各技术特征可以进行任意的组合，为使描述简洁，未对上述实施例中的各个技术特征所有可能的组合都进行描述，然而，只要这些技术特征的组合不存在矛盾，都应当认为是本说明书记载的范围。
以上所述实施例仅表达了本发明的几种实施方式，其描述较为具体和详细，但并不能因此而理解为对发明专利范围的限制。应当指出的是，对于本领域的普通技术人员来说，在不脱离本发明构思的前提下，还可以做出若干变形和改进，这些都属于本发明的保护范围。因此，本发明专利的保护范围应以所附权利要求为准。

Claims (12)

  1. 一种测试控制装置，其特征在于，所述装置包括平行控制单元和多个工位控制单元，一个所述工位控制单元用于对应至少一个被测器件；
    所述平行控制单元，分别连接所述多个工位控制单元并用于连接主机，接收所述主机发送的测试项，并将所述测试项中的各个测试序列发送给所述测试序列对应的被测器件对应的工位控制单元；
    每个所述工位控制单元，用于分别连接多个测试板卡，各个所述测试板卡实现的业务功能不同；每个所述工位控制单元用于，根据接收到的测试序列需要实现的业务功能，将所述测试序列发送给对应的测试板卡，以对所述测试序列对应的被测器件进行测试；当目标被测器件测试失败时，控制所述多个测试板卡停止对所述目标被测器件进行测试，所述目标被测器件为所述工位控制单元对应的被测器件。
  2. 根据权利要求1所述的装置，其特征在于，所述工位控制单元用于，
    接收所述目标被测器件的测试失败信息；
    根据所述测试失败信息确定目标标号，所述目标标号为所述目标被测器件与各个所述测试板卡之间的通道的标号；
    向至少一个所述测试板卡发送携带所述目标标号的关断指令，以控制各个所述测试板卡断开所述目标标号对应的通道。
  3. 根据权利要求2所述的装置，其特征在于，所述测试失败信息为所述测试板卡对所述目标被测器件进行测试得到的测试数据，或协处理模块对所述测试数据处理得到的测试结果。
  4. 根据权利要求2所述的装置，其特征在于，所述工位控制单元用于，分别向各个所述测试板卡发送所述关断指令，或向目标测试板卡发送所述关断指令，以使所述目标测试板卡向其它测试板卡转发所述关断指令，所述目标测试板卡为所述多个测试板卡中的任意一个测试板卡。
  5. 根据权利要求2所述的装置，其特征在于，所述工位控制单元还用于，在所述测试项对应的测试完成后，向各个所述测试板卡发送开启指令，以控制各个所述测试板卡恢复所述目标标号对应的通道。
  6. 根据权利要求1-5任一项所述的装置，其特征在于，所述平行控制单元用于，接收所述主机发送的测试配置，所述测试配置包括各个所述测试序列对应的通道标号，所述通道标号所属的通道位于所述测试板卡和所述被测器件之间；将所述测试项中的各个测试序列和所述测试配置中与所述测试序列对应的通道标号分发给所述通道标号对应的工位控制单元；
    每个所述工位控制单元用于，将接收到的各个测试序列和所述测试序列对应的通道标号发送给所述通道标号对应的测试板卡。
  7. 根据权利要求6所述的装置，其特征在于，所述装置还包括：
    打包单元，串联在所述工位控制单元和所述测试板卡之间，用于将至少两个所述工位控制单元发送给同一个所述测试板卡的测试序列和所述测试序列对应的通道标号打包发送给所述测试板卡。
  8. 根据权利要求7所述的装置，其特征在于，所述装置还包括：
    同步单元，分别连接所述打包单元、所述平行控制单元和所述多个工位控制单元，用于从所述平行控制单元获取同步信号，并发送给所述多个工位控制单元和所述打包单元。
  9. 根据权利要求1-5任一项所述的装置，其特征在于，所述工位控制单元还用于，当目标被测器件测试失败时，停止向所述多个测试板卡发送所述目标被测器件的测试序列。
  10. 一种测试机，其特征在于，所述测试机包括如权利要求1-9任一项所述的测试控制装置和多个测试板卡。
  11. 根据权利要求10所述的测试机，其特征在于，所述测试板卡包括控制器和功能电路；
    所述控制器，用于接收携带目标标号的关断指令，所述目标标号为所述目标被测器件与所述测试板卡之间的通道的标号；控制所述功能电路停止向所述目标标号对应的通道发送激励信号。
  12. 一种测试控制方法，其特征在于，应用于如权利要求1-8任一项所述的测试控制装置，所述方法包括：
    所述平行控制单元接收所述主机发送的测试项，并将所述测试项中的各个测试序列发送给所述测试序列对应的被测器件对应的工位控制单元；
    每个所述工位控制单元根据接收到的测试序列需要实现的业务功能，将所述测试序列发送给对应的测试板卡，以对所述测试序列对应的被测器件进行测试；
    当目标被测器件测试失败时，所述工位控制单元控制所述多个测试板卡停止对所述目标被测器件进行测试，所述目标被测器件为所述工位控制单元对应的被测器件。
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