WO2023286471A1 - センサユニット - Google Patents

センサユニット Download PDF

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Publication number
WO2023286471A1
WO2023286471A1 PCT/JP2022/021709 JP2022021709W WO2023286471A1 WO 2023286471 A1 WO2023286471 A1 WO 2023286471A1 JP 2022021709 W JP2022021709 W JP 2022021709W WO 2023286471 A1 WO2023286471 A1 WO 2023286471A1
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WO
WIPO (PCT)
Prior art keywords
feature amount
output signal
measured
generation circuit
sensor unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2022/021709
Other languages
English (en)
French (fr)
Japanese (ja)
Inventor
純 牧野
浩嗣 川野
伸幸 能澤
知重 古樋
貴志 渡部
雄彦 飯塚
健太 吾郷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Priority to JP2023535169A priority Critical patent/JP7448096B2/ja
Publication of WO2023286471A1 publication Critical patent/WO2023286471A1/ja
Priority to US18/409,176 priority patent/US20240142216A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
    • A—HUMAN NECESSITIES
    • A63—SPORTS; GAMES; AMUSEMENTS
    • A63F—CARD, BOARD, OR ROULETTE GAMES; INDOOR GAMES USING SMALL MOVING PLAYING BODIES; VIDEO GAMES; GAMES NOT OTHERWISE PROVIDED FOR
    • A63F13/00—Video games, i.e. games using an electronically generated display having two or more dimensions
    • A63F13/90—Constructional details or arrangements of video game devices not provided for in groups A63F13/20 or A63F13/25, e.g. housing, wiring, connections or cabinets
    • A63F13/98—Accessories, i.e. detachable arrangements optional for the use of the video game device, e.g. grip supports of game controllers
    • A—HUMAN NECESSITIES
    • A63—SPORTS; GAMES; AMUSEMENTS
    • A63B—APPARATUS FOR PHYSICAL TRAINING, GYMNASTICS, SWIMMING, CLIMBING, OR FENCING; BALL GAMES; TRAINING EQUIPMENT
    • A63B60/00—Details or accessories of golf clubs, bats, rackets or the like
    • A63B60/46—Measurement devices associated with golf clubs, bats, rackets or the like for measuring physical parameters relating to sporting activity, e.g. baseball bats with impact indicators or bracelets for measuring the golf swing
    • A—HUMAN NECESSITIES
    • A63—SPORTS; GAMES; AMUSEMENTS
    • A63B—APPARATUS FOR PHYSICAL TRAINING, GYMNASTICS, SWIMMING, CLIMBING, OR FENCING; BALL GAMES; TRAINING EQUIPMENT
    • A63B69/00—Training appliances or apparatus for special sports
    • A63B69/36—Training appliances or apparatus for special sports for golf
    • A—HUMAN NECESSITIES
    • A63—SPORTS; GAMES; AMUSEMENTS
    • A63B—APPARATUS FOR PHYSICAL TRAINING, GYMNASTICS, SWIMMING, CLIMBING, OR FENCING; BALL GAMES; TRAINING EQUIPMENT
    • A63B69/00—Training appliances or apparatus for special sports
    • A63B69/38—Training appliances or apparatus for special sports for tennis
    • A—HUMAN NECESSITIES
    • A63—SPORTS; GAMES; AMUSEMENTS
    • A63F—CARD, BOARD, OR ROULETTE GAMES; INDOOR GAMES USING SMALL MOVING PLAYING BODIES; VIDEO GAMES; GAMES NOT OTHERWISE PROVIDED FOR
    • A63F13/00—Video games, i.e. games using an electronically generated display having two or more dimensions
    • A63F13/20—Input arrangements for video game devices
    • A63F13/21—Input arrangements for video game devices characterised by their sensors, purposes or types
    • A63F13/211—Input arrangements for video game devices characterised by their sensors, purposes or types using inertial sensors, e.g. accelerometers or gyroscopes
    • A—HUMAN NECESSITIES
    • A63—SPORTS; GAMES; AMUSEMENTS
    • A63F—CARD, BOARD, OR ROULETTE GAMES; INDOOR GAMES USING SMALL MOVING PLAYING BODIES; VIDEO GAMES; GAMES NOT OTHERWISE PROVIDED FOR
    • A63F13/00—Video games, i.e. games using an electronically generated display having two or more dimensions
    • A63F13/80—Special adaptations for executing a specific game genre or game mode
    • A63F13/812—Ball games, e.g. soccer or baseball
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/16—Measuring force or stress, in general using properties of piezoelectric devices
    • G—PHYSICS
    • G08—SIGNALLING
    • G08C—TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
    • G08C13/00—Arrangements for influencing the relationship between signals at input and output, e.g. differentiating, delaying
    • G08C13/02—Arrangements for influencing the relationship between signals at input and output, e.g. differentiating, delaying to yield a signal which is a function of two or more signals, e.g. sum or product
    • A—HUMAN NECESSITIES
    • A63—SPORTS; GAMES; AMUSEMENTS
    • A63B—APPARATUS FOR PHYSICAL TRAINING, GYMNASTICS, SWIMMING, CLIMBING, OR FENCING; BALL GAMES; TRAINING EQUIPMENT
    • A63B2220/00—Measuring of physical parameters relating to sporting activity
    • A63B2220/30—Speed
    • A63B2220/34—Angular speed
    • A—HUMAN NECESSITIES
    • A63—SPORTS; GAMES; AMUSEMENTS
    • A63B—APPARATUS FOR PHYSICAL TRAINING, GYMNASTICS, SWIMMING, CLIMBING, OR FENCING; BALL GAMES; TRAINING EQUIPMENT
    • A63B2220/00—Measuring of physical parameters relating to sporting activity
    • A63B2220/40—Acceleration
    • A63B2220/44—Angular acceleration
    • A—HUMAN NECESSITIES
    • A63—SPORTS; GAMES; AMUSEMENTS
    • A63B—APPARATUS FOR PHYSICAL TRAINING, GYMNASTICS, SWIMMING, CLIMBING, OR FENCING; BALL GAMES; TRAINING EQUIPMENT
    • A63B2220/00—Measuring of physical parameters relating to sporting activity
    • A63B2220/50—Force related parameters
    • A63B2220/51—Force
    • A—HUMAN NECESSITIES
    • A63—SPORTS; GAMES; AMUSEMENTS
    • A63B—APPARATUS FOR PHYSICAL TRAINING, GYMNASTICS, SWIMMING, CLIMBING, OR FENCING; BALL GAMES; TRAINING EQUIPMENT
    • A63B2220/00—Measuring of physical parameters relating to sporting activity
    • A63B2220/62—Time or time measurement used for time reference, time stamp, master time or clock signal
    • A—HUMAN NECESSITIES
    • A63—SPORTS; GAMES; AMUSEMENTS
    • A63B—APPARATUS FOR PHYSICAL TRAINING, GYMNASTICS, SWIMMING, CLIMBING, OR FENCING; BALL GAMES; TRAINING EQUIPMENT
    • A63B2220/00—Measuring of physical parameters relating to sporting activity
    • A63B2220/80—Special sensors, transducers or devices therefor
    • A63B2220/83—Special sensors, transducers or devices therefor characterised by the position of the sensor
    • A63B2220/833—Sensors arranged on the exercise apparatus or sports implement
    • A—HUMAN NECESSITIES
    • A63—SPORTS; GAMES; AMUSEMENTS
    • A63B—APPARATUS FOR PHYSICAL TRAINING, GYMNASTICS, SWIMMING, CLIMBING, OR FENCING; BALL GAMES; TRAINING EQUIPMENT
    • A63B2225/00—Miscellaneous features of sport apparatus, devices or equipment
    • A63B2225/50—Wireless data transmission, e.g. by radio transmitters or telemetry

Definitions

  • the present invention relates to a sensor attached to an object to be measured that is deformed by being swung, and to a sensor unit that detects deformation of the object to be measured and generates an output signal.
  • the swing analysis device, the swing analysis method, and the swing analysis system described in Patent Document 1 are known as inventions related to conventional sensor units.
  • the swing analysis device described in Patent Literature 1 includes an information input section, a posture calculation section, a correction section, and a display control section.
  • the information input unit receives input of acceleration information, angular velocity information, and shaft strain information detected by a sensor device attached to the shaft of the golf club.
  • the posture calculation unit calculates posture information of the golf club during the swing based on the acceleration information and the angular velocity information.
  • the correction unit corrects the posture information of the golf club at the time of impact based on the distortion information of the shaft.
  • the display control unit causes the display to display the posture information of the golf club corrected by the correction unit. According to such a swing analysis device, the swing of a golf club can be analyzed.
  • an object of the present invention is to provide a sensor unit that can reduce the amount of data to be transmitted.
  • a sensor unit includes: a sensor attached to an object to be measured that is deformed by being swung, the sensor generating an output signal indicating the relationship between a physical quantity related to the amount of deformation of the object to be measured and time; a feature amount generation circuit that generates a feature amount, which is a parameter indicating the characteristics of the swing, based on the output signal obtained by the sensor; a communication unit that is attached to the object to be measured and transmits the feature amount to the outside by wireless communication or wired communication.
  • the amount of data to be transmitted can be reduced.
  • FIG. 1 is a block diagram of a sensor unit 100 according to the first embodiment.
  • FIG. 2 is a diagram showing an example of the device under test 1 to which the sensor unit 100 according to the first embodiment is attached.
  • FIG. 3 is a top view and cross-sectional view of the sensor 10 according to the first embodiment.
  • FIG. 4 is a diagram showing an example of the output signal SigO that the AD converter 102 according to the first embodiment outputs to the feature generation circuit 11.
  • FIG. 5 is a flow chart showing processing executed by the feature generation circuit 11 according to the first embodiment.
  • FIG. 6 is a diagram showing an example of the output signal SigO that the AD converter 102 according to the second embodiment outputs to the feature generation circuit 11. As shown in FIG. FIG. FIG.
  • FIG. 7 is a flow chart showing the processing executed by the feature generation circuit 11 according to the second embodiment.
  • FIG. 8 is a diagram showing an example of the output signal SigO that the AD converter 102 according to the third embodiment outputs to the feature generation circuit 11.
  • FIG. 9 is a flow chart showing processing executed by the feature generation circuit 11 according to the third embodiment.
  • FIG. 10 is a block diagram of a sensor unit 100c according to the fourth embodiment.
  • FIG. 11 is a diagram showing an example of the output signal SigO that the AD converter 102 according to the fourth embodiment outputs to the feature generation circuit 11.
  • FIG. 12 is a flow chart showing the processing executed by the feature generation circuit 11 according to the fourth embodiment.
  • FIG. 13A and 13B are a top view and a cross-sectional view of the sensor 10 according to the fifth embodiment.
  • FIG. 14 is a flow chart showing processing executed by the feature generation circuit 11 according to the fifth embodiment.
  • FIG. 15 is a plan view showing an example of the head 3 of the object to be measured 1 and the object to be hit 4 at the hitting time InT according to the sixth embodiment.
  • FIG. 16 is a plan view showing an example of the head 3 of the object to be measured 1 and the object to be hit 4 at the hitting time InT according to the sixth embodiment.
  • FIG. 17 is a plan view showing an example of the head 3 of the object to be measured 1 and the object to be hit 4 at the hitting time InT according to the sixth embodiment.
  • FIG. 15 is a plan view showing an example of the head 3 of the object to be measured 1 and the object to be hit 4 at the hitting time InT according to the sixth embodiment.
  • FIG. 16 is a plan view showing an example of the head 3 of the object to be measured 1 and the object
  • FIG. 18 is a flow chart showing processing executed by the feature generation circuit 11 according to the sixth embodiment.
  • FIG. 19 is a flow chart showing the processing executed by the feature generation circuit 11 according to the seventh embodiment.
  • FIG. 20 is a flow chart showing processing executed by the feature generation circuit 11 according to the eighth embodiment.
  • FIG. 21 is a flow chart showing the processing executed by the feature generation circuit 11 according to the ninth embodiment.
  • FIG. 22 is a flow chart showing the processing executed by the feature generation circuit 11 according to the tenth embodiment.
  • FIG. 1 is a block diagram of a sensor unit 100 according to the first embodiment.
  • FIG. 2 is a diagram showing an example of the device under test 1 to which the sensor unit 100 according to the first embodiment is attached.
  • FIG. 3 is a top view and cross-sectional view of the sensor 10 according to the first embodiment.
  • FIG. 4 is a diagram showing an example of the output signal SigO that the AD converter 102 according to the first embodiment outputs to the feature generation circuit 11.
  • FIG. 5 is a flow chart showing processing executed by the feature generation circuit 11 according to the first embodiment.
  • shafts and members extending in the vertical direction (first direction) do not necessarily indicate shafts and members parallel to the vertical direction (first direction).
  • the shafts and members that extend in the vertical direction (first direction) are shafts and members that are inclined within a range of ⁇ 45 degrees with respect to the vertical direction (first direction).
  • a shaft or member extending in the front-rear direction is a shaft or member that is inclined within a range of ⁇ 45 degrees with respect to the front-rear direction.
  • An axis or member extending in the horizontal direction is an axis or member that is inclined within a range of ⁇ 45 degrees with respect to the horizontal direction.
  • the up-down direction, the left-right direction, and the front-rear direction are defined. More specifically, the direction in which the shaft 2 of the object 1 extends is defined as the vertical direction (first direction). The direction in which the face of the head 3 of the object 1 faces is defined as the left direction. The right direction is the opposite direction to the left direction. A direction orthogonal to the up-down direction and the left-right direction is defined as the front-rear direction. It should be noted that the vertical direction, horizontal direction, and front-back direction of the device under test 1 during actual use need not coincide with the vertical direction, left-right direction, and front-back direction shown in FIG.
  • the object 1 to be measured is a member for hitting the object 4 to be hit.
  • the object 1 to be measured is a golf club.
  • the hit object 4 is a golf ball.
  • the object to be measured 1 is deformed by being swung. More specifically, the device under test 1 is deformed by swinging by the user. When the user swings the object to be measured 1, the object to be measured 1 is deformed by inertial force and external force.
  • the object 1 to be measured deforms in the left-right direction, for example, when the user swings.
  • the shape of the object to be measured 1 includes a shape extending in the vertical direction (first direction).
  • the sensor unit 100 as shown in FIG.
  • the sensor 10 , the feature generation circuit 11 and the communication section 12 are attached to the device under test 1 .
  • a sensor 10 , a feature generation circuit 11 and a communication section 12 are fixed to the shaft 2 of the object 1 .
  • the sensor 10 detects deformation of the object 1 to be measured. Further, the sensor 10 generates an output signal indicating the relationship between the differential value of the deformation amount of the object 1 and time. More specifically, sensor 10 includes sensor section 101 and AD converter 102 .
  • the sensor section 101 has a piezoelectric film 103, a first electrode 103F, a second electrode 103B, a charge amplifier 104 and a voltage amplifier circuit 105, as shown in FIG.
  • the piezoelectric film 103 generates an electric charge corresponding to the differential value of the deformation amount of the object 1 to be measured.
  • the piezoelectric film 103 is an example of a piezoelectric body.
  • the piezoelectric film 103 has a film shape. Therefore, the piezoelectric film 103 has a first principal surface S1 and a second principal surface S2, as shown in FIG.
  • the first main surface S1 and the second main surface S2 have a rectangular shape when viewed in the direction normal to the first main surface S1 in a state in which the piezoelectric film 103 is laid out on a plane.
  • the longitudinal direction of the piezoelectric film 103 is the vertical direction.
  • the width direction of the piezoelectric film 103 is the left-right direction.
  • the piezoelectric film 103 is a PLA film.
  • the piezoelectric film 103 generates an electric charge according to the differential value of the deformation amount of the piezoelectric film 103 .
  • the polarity of the charge generated when the piezoelectric film 103 is stretched in the vertical direction is opposite to the polarity of the charge generated when the piezoelectric film 103 is stretched in the horizontal direction.
  • the piezoelectric film 103 is a film formed from a chiral polymer.
  • a chiral polymer is, for example, polylactic acid (PLA), particularly L-type polylactic acid (PLLA).
  • a PLLA composed of a chiral polymer has a helical structure in its main chain. PLLA is uniaxially stretched and has piezoelectricity in which the molecules are oriented.
  • the piezoelectric film 103 has a piezoelectric constant of d14.
  • the uniaxial stretching axis OD of the piezoelectric film 103 forms an angle of 45 degrees counterclockwise with respect to the vertical direction and forms an angle of 45 degrees clockwise with respect to the horizontal direction. That is, the piezoelectric film 103 is stretched at least uniaxially.
  • This 45 degrees includes angles including, for example, about 45 degrees ⁇ 10 degrees.
  • the piezoelectric film 103 generates an electric charge by being deformed such that the piezoelectric film 103 is elongated in the vertical direction or deformed so as to be compressed in the vertical direction.
  • the piezoelectric film 103 for example, generates a positive charge when deformed so as to be stretched in the vertical direction.
  • the piezoelectric film 103 for example, generates a negative charge when deformed so as to be compressed vertically.
  • the magnitude of the charge depends on the differential value of the amount of deformation of the piezoelectric film 103 due to extension or compression.
  • the first electrode 103F is a ground electrode.
  • the first electrode 103F is connected to ground potential.
  • the first electrode 103F is provided on the first main surface S1, as shown in FIG.
  • the first electrode 103F covers the first main surface S1.
  • the first electrode 103F is, for example, an organic electrode such as ITO (indium tin oxide) or ZnO (zinc oxide), a metal film by vapor deposition or plating, or a printed electrode film by silver paste.
  • the second electrode 103B is a signal electrode.
  • the second electrode 103B is provided on the second main surface S2, as shown in FIG.
  • the second electrode 103B covers the second main surface S2.
  • the second electrode 103B is, for example, an organic electrode such as ITO (indium tin oxide) or ZnO (zinc oxide), a metal film by vapor deposition or plating, or a printed electrode film by silver paste. With these, the piezoelectric film 103 is positioned between the first electrode 103F and the second electrode 103B.
  • the charge amplifier 104 converts the charge generated by the piezoelectric film 103 into a detection signal SigD, which is a voltage signal. For example, charge amplifier 104 converts the charge to a voltage value in the range of 0.0V to 3.0V. After the conversion, charge amplifier 104 outputs detection signal SigD to voltage amplifier circuit 105 . Voltage amplifier circuit 105 amplifies detection signal SigD and outputs it to AD converter 102 .
  • the AD converter 102 AD-converts the detection signal SigD. Thereby, the AD converter 102 converts the detection signal SigD into a digital signal. Specifically, the AD converter 102 converts the detection signal SigD according to the resolution of the AD converter 102 . For example, when the resolution of the AD converter 102 is 12 bits, the AD converter 102 converts the detection signal SigD into 4096 levels of binary values as shown in FIG. The detection signal SigD converted into a digital signal is hereinafter referred to as an output signal SigO. Also, the AD converter 102 acquires a reference voltage. The AD converter 102 sets the reference value SiV of the output signal SigO based on the reference voltage. For example, as shown in FIG.
  • Such a sensor 10 is fixed to the object 1 to be measured via an adhesive layer (not shown).
  • the adhesive layer has insulating properties and fixes the object to be measured 1 and the first electrode 103F.
  • the feature generation circuit 11 includes an extraction circuit 111 and an arithmetic circuit 112, as shown in FIG.
  • the feature quantity generation circuit 11 generates a feature quantity F, which is a parameter indicating the characteristics of the swing, based on the output signal SigO acquired by the sensor 10 .
  • the feature amount generation circuit 11 generates the feature amount F by performing extraction processing based on the output signal SigO.
  • the predetermined time is, for example, the hitting time InT when the object to be measured 1 hits the object to be measured 4 or the swing start time when the user starts swinging the object to be measured 1, as shown in FIG. SwT et al.
  • the predetermined time extracted by the feature amount generation circuit 11 based on the output signal SigO is the impact time InT.
  • the feature amount F includes the impact time InT.
  • the amount of lateral deformation of the object 1 to be measured is proportional to the force FRL1 in the lateral direction applied to the object 1 to be measured when the user swings the object 1 to be measured. That is, the value obtained by integrating the value DV of the output signal SigO ⁇ reference value SiV over time is proportional to the lateral force FRL1 applied to the device under test 1 when the user swings the device under test 1.
  • the output signal SigO indirectly indicates the lateral force FRL1 applied to the device under test 1 when the user swings the device under test 1.
  • the amount of deformation of the object to be measured 1 increases abruptly.
  • the feature quantity generation circuit 11 can obtain the impact time InT by detecting the maximum value of the maximum value or the minimum value of the minimum value in the predetermined period of the output signal SigO. In this way, the feature amount generation circuit 11 can extract the impact time InT based on the output signal SigO.
  • the output signal SigO is a value corresponding to the differential value of the lateral deformation amount of the object 1 to be measured.
  • the piezoelectric film 103 expands and contracts in the vertical direction.
  • the piezoelectric film 103 generates an electric charge.
  • the piezoelectric film 103 generates a positive charge when the bending of the object 1 to the right increases.
  • the piezoelectric film 103 generates a negative charge.
  • the object 1 to be measured is elastically deformed. In other words, the device under test 1 bends.
  • the value obtained by integrating the differential value of the deformation amount in the lateral direction of the object 1 to be measured with respect to time is the bending amount B in the lateral direction of the object 1 to be measured at a predetermined time. That is, the output signal SigO indirectly indicates the bending amount B of the device under test 1 in the horizontal direction at a predetermined time. More specifically, when the value DV of the output signal SigO ⁇ reference value SiV is positive, it indicates that the rightward bending amount B of the device under test 1 increases (the leftward bending amount B decreases). When the value DV of the output signal SigO-reference value SiV is negative, it indicates that the rightward bending amount B of the device under test 1 is decreasing (the leftward bending amount B is increasing).
  • the feature amount generation circuit 11 can calculate the bending amount B in the horizontal direction of the device under test 1 at a predetermined time by integrating the value DV of the output signal SigO ⁇ the reference value SiV over time. Thereby, the feature amount generation circuit 11 can calculate the bending amount B of the device under test 1 at a predetermined time based on the output signal SigO.
  • the feature amount generation circuit 11 generates the feature amount F by performing arithmetic processing based on the output signal SigO. Further, the feature amount generation circuit 11 calculates the bending amount B of the object 1 at the impact time InT based on the output signal SigO. Further, the feature amount F includes the bending amount B of the object 1 at the impact time InT.
  • the extraction circuit 111 stores a program for processing to extract the impact time InT based on the output signal SigO.
  • the extraction circuit 111 includes, for example, ROM (Read Only Memory) and RAM (Random Access Memory).
  • the extraction circuit 111 reads the program stored in the ROM to the RAM. Accordingly, the extraction circuit 111 performs processing for extracting the impact time InT based on the output signal SigO.
  • Such an extraction circuit 111 is, for example, a CPU (Central Processing Unit).
  • the arithmetic circuit 112 stores a program for processing for calculating the bending amount B of the object 1 at the impact time InT based on the output signal SigO.
  • the arithmetic circuit 112 includes, for example, ROM (Read Only Memory) and RAM (Random Access Memory).
  • the arithmetic circuit 112 reads the program stored in the ROM to the RAM. Thereby, the arithmetic circuit 112 performs processing for calculating the bending amount B of the object 1 at the impact time InT based on the output signal SigO.
  • Such an arithmetic circuit 112 is, for example, a CPU (Central Processing Unit).
  • the extraction circuit 111 and the arithmetic circuit 112 may be the same CPU or different CPUs.
  • This process is started when the feature amount generation circuit 11 acquires the output signal SigO from the sensor 10 .
  • the extraction circuit 111 and the arithmetic circuit 112 acquire the output signal SigO from the sensor 10 (FIG. 5: step S11).
  • the extraction circuit 111 extracts the impact time InT (FIG. 5: step S12).
  • the feature amount generation circuit 11 determines, for example, the time at which the absolute value of the value DV of the output signal SigO ⁇ reference value SiV becomes maximum as the impact time InT.
  • the arithmetic circuit 112 calculates the bending amount B of the object 1 at the impact time InT (FIG. 5: step S13). More specifically, the arithmetic circuit 112 integrates the value DV (output signal SigO ⁇ reference value SiV) over a period from the time when the sensor 10 starts detecting to the impact time InT, so that the measured object 1 at the impact time InT Bending amount B is calculated.
  • DV output signal SigO ⁇ reference value SiV
  • the feature amount generation circuit 11 generates a feature amount F based on the bending amount B of the object 1 at the impact time InT extracted by the extraction circuit 111 and the impact time InT calculated by the arithmetic circuit 112 (FIG. 5: step S14).
  • the feature amount generation circuit 11 outputs the feature amount F to the communication unit 12 (FIG. 5: step S15).
  • the data amount of the impact time InT and the bending amount B of the object 1 at the impact time InT is smaller than the data amount of the output signal SigO.
  • the data amount of the feature amount F is smaller than the data amount of the output signal SigO.
  • the output signal SigO is data including a plurality of times and signals at a plurality of times. Since the turn amount B is data including at least one of the signal at one time and at one time, the data amount of the feature amount F is smaller than the data amount of the output signal SigO.
  • the communication unit 12 transmits the impact time InT and the bending amount B of the object 1 at the impact time InT to the outside by wireless communication.
  • the communication unit 12 transmits the feature amount F to the outside by wireless communication.
  • the outside is, for example, a mobile wireless communication terminal such as a smart phone.
  • Wireless communication is, for example, communication using Bluetooth (registered trademark).
  • the amount of data to be transmitted can be reduced. More specifically, the sensor 10 generates an output signal SigO that indicates the relationship between the physical quantity related to the amount of deformation of the object 1 and time.
  • the output signal SigO is input to the feature generation circuit 11 .
  • the feature amount generation circuit 11 generates a feature amount F, which is a parameter indicating the characteristics of the swing, based on the output signal SigO.
  • the output signal SigO is data including signals at a plurality of times and at a plurality of times, while the feature quantity F is data including at least one of a single time or a signal at a single time. Therefore, the data amount of the feature amount F is smaller than the data amount of the output signal SigO.
  • the sensor unit 100 can reduce the amount of data to be transmitted.
  • the feature amount generation circuit 11 generates the feature amount F by performing extraction processing based on the output signal SigO. As a result, the sensor unit 100 can reduce the amount of data to be transmitted.
  • the feature generation circuit 11 extracts the impact time InT at which the object 1 impacts the object 4 based on the output signal SigO. Also, the feature amount F includes the impact time InT. As a result, according to the sensor unit 100, the amount of data to be transmitted can be reduced, and the impact time InT can be transmitted to the outside.
  • the feature amount generation circuit 11 generates the feature amount F by performing arithmetic processing based on the output signal SigO. As a result, the sensor unit 100 can reduce the amount of data to be transmitted.
  • the feature amount generation circuit 11 calculates the bending amount B of the device under test 1 at a predetermined time based on the output signal SigO. Further, the feature amount F includes the bending amount B of the object 1 to be measured at a predetermined time. As a result, according to the sensor unit 100, the amount of data to be transmitted can be reduced, and the bending amount B of the device under test 1 at a predetermined time can be transmitted to the outside.
  • FIG. 6 is a diagram showing an example of the output signal SigO that the AD converter 102 according to the second embodiment outputs to the feature generation circuit 11.
  • FIG. 7 is a flow chart showing the processing executed by the feature generation circuit 11 according to the second embodiment.
  • the sensor unit 100a according to the second embodiment only the parts different from the sensor unit 100 according to the first embodiment will be described, and the rest will be omitted.
  • the feature amount generation circuit 11 calculates the swing start time SwT based on the output signal SigO.
  • the feature amount F includes the swing start time SwT.
  • the output signal SigO indirectly indicates the lateral force FRL1 applied to the device under test 1 when the user swings the device under test 1 .
  • the impact time InT can be extracted based on the output signal SigO, and the swing start time SwT, which is the time when the user starts swinging the object 1, can be calculated. For example, it can be estimated that the swing start time SwT is earlier than the impact time InT.
  • the extraction circuit 111 and the arithmetic circuit 112 store a program of processing for calculating the swing start time SwT based on the output signal SigO. Details of the processing related to the calculation of the swing start time SwT in the feature amount generation circuit 11 will be described below.
  • This process is started when the feature amount generation circuit 11 acquires the output signal SigO from the sensor 10 . Specifically, first, the extraction circuit 111 and the arithmetic circuit 112 acquire the output signal SigO from the sensor 10 (FIG. 7: step S21).
  • the arithmetic circuit 112 calculates the swing start time SwT based on the output signal SigO (FIG. 7: step S22). More specifically, as shown in FIG. 6, the swing start time SwT is, for example, the time PT that is the reference time RE past the impact time InT.
  • the reference time RE is set in advance to 0.2 seconds, 0.3 seconds, or the like, for example.
  • the feature amount generation circuit 11 generates a feature amount F based on the swing start time SwT calculated by the arithmetic circuit 112 (FIG. 7: step S23).
  • the feature quantity generation circuit 11 outputs the feature quantity F to the communication unit 12 (FIG. 7: step S24).
  • the feature amount generation circuit 11 calculates the swing start time SwT based on the output signal SigO. Further, the feature amount F includes the swing start time SwT. As a result, the sensor unit 100a can transmit the swing start time SwT to the outside.
  • FIG. 8 is a diagram showing an example of the output signal SigO that the AD converter 102 according to the third embodiment outputs to the feature generation circuit 11.
  • FIG. 9 is a flow chart showing processing executed by the feature generation circuit 11 according to the third embodiment.
  • the sensor unit 100b according to the third embodiment only different parts from the sensor unit 100 according to the first embodiment will be described, and the rest will be omitted.
  • the feature amount generation circuit 11 calculates the swing speed SwV at a predetermined time based on the output signal SigO. Also, the feature amount F includes the swing speed SwV at a predetermined time.
  • the value obtained by second-order integration of the differential value of the lateral deformation amount of the object 1 to be measured is proportional to the velocity in the lateral direction of the object 1 to be measured at a predetermined time. That is, the output signal SigO indirectly indicates the swing speed SwV of the device under test 1 at a predetermined time. More specifically, for example, as shown in FIG. 8, the value DV of the output signal SigO ⁇ reference value SiV is substantially zero in the first period T1 from the time when the sensor 10 starts detection to the swing start time SwT. , and the value obtained by second-order integration of the value DV of the output signal SigO-reference value SiV is also approximately zero.
  • the swing speed SwV is also substantially zero in the first period T1 from the time when the sensor 10 starts detection to the swing start time SwT.
  • the output signal SigO gradually increases from the reference value SiV immediately after the swing start time SwT and then gradually decreases.
  • the value obtained by second-order integration of the value DV of the output signal SigO-reference value SiV is approximately zero, and the swing speed SwV is also approximately zero.
  • the output signal SigO sharply increases from the reference value SiV immediately after the downswing start time DSwT and then sharply decreases.
  • the output signal SigO becomes a minimum value.
  • the feature amount generation circuit 11 can calculate the swing speed SwV at a predetermined time based on the output signal SigO.
  • the feature amount generation circuit 11 calculates the swing speed SwV at the impact time InT based on the output signal SigO.
  • the extraction circuit 111 and the arithmetic circuit 112 store a program for processing to calculate the swing speed SwV at the impact time InT based on the output signal SigO. Details of the processing related to the calculation of the swing speed SwV at the impact time InT in the feature value generation circuit 11 will be described below.
  • This process is started when the feature amount generation circuit 11 acquires the output signal SigO from the sensor 10 . Specifically, first, the extraction circuit 111 and the arithmetic circuit 112 acquire the output signal SigO from the sensor 10 (FIG. 9: step S31).
  • the extraction circuit 111 extracts the impact time InT (FIG. 9: step S32).
  • the arithmetic circuit 112 calculates the swing speed SwV at the impact time InT based on the output signal SigO ( FIG. 9 : step S33). More specifically, the arithmetic circuit 112 double-integrates the value DV (output signal SigO ⁇ reference value SiV) over the period from the time the sensor 10 starts detecting to the impact time InT, thereby obtaining the swing velocity at the impact time InT. Calculate SwV.
  • DV output signal SigO ⁇ reference value SiV
  • the feature amount generation circuit 11 generates a feature amount F based on the swing speed SwV at the impact time InT calculated by the arithmetic circuit 112 ( FIG. 9 : step S34).
  • the feature amount generation circuit 11 outputs the feature amount F to the communication unit 12 (FIG. 9: step S35).
  • the sensor unit 100b as described above also has the same effects as the sensor unit 100a. Further, according to the sensor unit 100b, the feature amount generation circuit 11 calculates the swing speed SwV at a predetermined time based on the output signal SigO. Also, the feature amount F includes the swing speed SwV at a predetermined time. As a result, the sensor unit 100a can transmit the swing speed SwV at the predetermined time to the outside.
  • FIG. 10 is a block diagram of a sensor unit 100c according to the fourth embodiment.
  • FIG. 11 is a diagram showing an example of the output signal SigO that the AD converter 102 according to the fourth embodiment outputs to the feature generation circuit 11.
  • FIG. 12 is a flow chart showing the processing executed by the feature generation circuit 11 according to the fourth embodiment.
  • the sensor unit 100c according to the fourth embodiment only the parts different from the sensor unit 100a according to the second embodiment will be described, and the rest will be omitted.
  • the sensor unit 100c differs from the sensor unit 100a in that it includes a storage section 113 as shown in FIG.
  • the sensor unit 100c includes a storage section 113.
  • the feature quantity generation circuit 11 calculates the force applied to the object 1 by the user at a predetermined time based on the output signal SigO, the first mass m1 of the object 1, and the elastic modulus k of the object 1 to be measured. (First force) FO1 is calculated. Further, the feature quantity F includes the force (first force) FO1 applied to the object 1 by the user at a predetermined time.
  • the first mass m1 of the object to be measured 1 and the elastic modulus k of the object to be measured 1 are input to the storage unit 113 in advance.
  • the storage unit 113 stores the first mass m1 of the object 1 to be measured and the elastic modulus k of the object 1 to be measured.
  • the value obtained by integrating the differential value of the deformation amount in the horizontal direction of the object 1 to be measured over time is proportional to the acceleration in the horizontal direction of the object 1 to be measured at a predetermined time. That is, the output signal SigO indirectly indicates the swing acceleration SwA of the device under test 1 at a predetermined time. Further, by multiplying the first mass m1 of the object to be measured 1 by the swing acceleration SwA of the object to be measured 1 at the prescribed time, the force F1 applied to the object to be measured 1 at the prescribed time can be calculated. On the other hand, as described above, the object to be measured 1 is elastically deformed.
  • the object to be measured 1 When the object to be measured 1 elastically deforms, the object to be measured 1 receives a repulsive force in the opposite direction to the direction in which the object to be measured 1 elastically deforms.
  • the repulsive force F2 due to the bending of the object to be measured 1 at the predetermined time By multiplying the deformation amount of the object to be measured 1 at a predetermined time by the elastic coefficient k of the object to be measured 1, the repulsive force F2 due to the bending of the object to be measured 1 at the predetermined time can be calculated.
  • the sum of the force F1 applied to the object to be measured 1 at a predetermined time and the repulsive force F2 due to the bending of the object to be measured 1 at a predetermined time is the force F01 applied to the object to be measured 1 by the user at a predetermined time. Therefore, the feature value generation circuit 11 calculates the force ( First force) FO1 can be calculated.
  • the extraction circuit 111 and the arithmetic circuit 112 store a processing program for calculating the force FO1 applied to the object 1 by the user at the swing start time SwT based on the output signal SigO.
  • This process is started when the feature amount generation circuit 11 acquires the output signal SigO from the sensor 10 .
  • the extraction circuit 111 and the arithmetic circuit 112 acquire the output signal SigO from the sensor 10 (FIG. 12: step S41).
  • the extraction circuit 111 extracts the impact time InT (FIG. 12: step S42).
  • the arithmetic circuit 112 calculates the swing start time SwT based on the output signal SigO (FIG. 12: step S43).
  • the arithmetic circuit 112 calculates the force F1 applied to the object 1 at the swing start time SwT based on the output signal SigO and the first mass m1 of the object 1 (FIG. 12: step S44). More specifically, the arithmetic circuit 112 integrates the value DV (output signal SigO ⁇ reference value SiV) over a period from the time the sensor 10 starts detecting to the swing start time SwT, thereby obtaining the swing acceleration at the swing start time SwT. Calculate SwA. Arithmetic circuit 112 multiplies swing acceleration SwA by first mass m1 of measured object 1 to calculate force F1 applied to measured object 1 at swing start time SwT.
  • the arithmetic circuit 112 calculates the lateral bending amount B of the object 1 at the swing start time SwT based on the output signal SigO ( FIG. 12 : step S45). More specifically, the arithmetic circuit 112 integrates the value DV of the output signal SigO ⁇ reference value SiV in the period from the time when the sensor 10 starts detecting the swing start time SwT to the swing start time SwT, thereby determining the swing start time. A bending amount B in the horizontal direction of the object to be measured 1 at time SwT is calculated.
  • the arithmetic circuit 112 calculates the repulsive force F2 due to the bending of the object 1 at the swing start time SwT based on the bending amount B of the object 1 in the horizontal direction at the swing start time SwT (FIG. 12). : step S46). More specifically, the arithmetic circuit 112 multiplies the bending amount B in the lateral direction of the object 1 at the swing start time SwT by the elastic coefficient k of the object 1 to obtain the measured value at the swing start time SwT. A repulsive force F2 due to the bending of the object 1 is calculated.
  • the arithmetic circuit 112 calculates the force F1 applied to the object 1 at the swing start time SwT and the repulsive force F2 due to the bending of the object 1 at the swing start time SwT.
  • a force F01 applied to the object 1 is calculated (FIG. 12: step S47). More specifically, the arithmetic circuit 112 calculates the sum of the force F1 applied to the object 1 at the swing start time SwT and the repulsive force F2 due to the bending of the object 1 at the swing start time SwT to the user at the swing start time SwT. is the force FO1 applied to the object 1 to be measured.
  • the feature quantity generation circuit 11 generates a feature quantity F based on the force FO1 applied to the object 1 by the user at the swing start time SwT calculated by the arithmetic circuit 112 (FIG. 12: step S48).
  • the feature amount generation circuit 11 outputs the feature amount F to the communication unit 12 (FIG. 12: step S49).
  • the sensor unit 100c as described above also has the same effects as the sensor unit 100a. Further, according to the sensor unit 100c, the feature amount generating circuit 11 generates the object 1 at a predetermined time based on the output signal SigO, the first mass m1 of the object 1, and the elastic modulus k of the object 1. Calculate the force F01 applied to . Moreover, the feature amount F includes the force F01 applied to the object 1 by the user at a predetermined time. As a result, according to the sensor unit 100c, the force FO1 applied to the object 1 by the user at a predetermined time can be transmitted to the outside.
  • FIG. 14 is a flow chart showing processing executed by the feature generation circuit 11 according to the fifth embodiment.
  • the sensor unit 100d according to the fifth embodiment only different parts from the sensor unit 100 according to the first embodiment will be described, and the rest will be omitted.
  • the uniaxial stretching axis OD of the piezoelectric film 103 does not form an angle of 45 degrees counterclockwise with respect to the vertical direction, but 45 degrees clockwise with respect to the horizontal direction. It differs from the sensor unit 100 in that it does not form an angle of degree.
  • the uniaxial stretching axis OD of the piezoelectric film 103 forms an angle of 0 degrees counterclockwise with respect to the vertical direction and forms an angle of 90 degrees clockwise with respect to the horizontal direction.
  • This 0 degree or 90 degrees includes, for example, an angle including about 0 degrees ⁇ 10 degrees or an angle including about 90 degrees ⁇ 10 degrees.
  • the sensor unit 101 can match the direction of the highest piezoelectricity of the piezoelectric film 103 with the direction of twist in the vertical direction.
  • the sensor 10 detects twist of the object 1 in the vertical direction (first direction). As a result, the output signal SigO becomes a value corresponding to the differential value of the twist amount T of the object 1 to be measured in the vertical direction.
  • the feature amount generation circuit 11 calculates the time RWT at which the user turns his/her wrist based on the output signal SigO. Moreover, the feature amount F includes the time RWT at which the user turned his/her wrist.
  • the output signal SigO indirectly indicates the vertical force applied to the device under test 1 when the user swings the device under test 1 .
  • the time RWT at which the user turned his/her wrist can be calculated based on the output signal SigO. For example, during a period in which the user does not turn his/her wrist, the object 1 to be measured does not twist in the vertical direction, and the twist amount T in the vertical direction of the object 1 to be measured is small. On the other hand, when the user turns his/her wrist, the object 1 to be measured is twisted in the vertical direction, and the twist amount T in the vertical direction of the object to be measured 1 increases.
  • the feature amount generation circuit 11 can estimate that the time RWT at which the user turned his/her wrist is included in the period in which the absolute value of the value obtained by integrating the value DV of the output signal SigO ⁇ reference value SiV over time is large. .
  • the extraction circuit 111 and the arithmetic circuit 112 store a program for processing to calculate the time RWT at which the user turns his/her wrist based on the output signal SigO. Details of the processing related to the calculation of the time RWT at which the user turned his/her wrist in the feature amount generation circuit 11 will be described below.
  • This process is started when the feature amount generation circuit 11 acquires the output signal SigO from the sensor 10 . Specifically, first, the extraction circuit 111 and the arithmetic circuit 112 acquire the output signal SigO from the sensor 10 (FIG. 14: step S51).
  • the arithmetic circuit 112 calculates the time RWT at which the user turned his/her wrist based on the output signal SigO ( FIG. 14 : step S52). More specifically, the arithmetic circuit 112 integrates the value DV (output signal SigO ⁇ reference value SiV) in a period from the time when the sensor 10 starts detecting to a predetermined time, and the absolute value of the value is a predetermined first value. It is determined whether or not it is equal to or greater than a determination value TH1.
  • DV output signal SigO ⁇ reference value SiV
  • Arithmetic circuit 112 calculates the absolute value obtained by integrating value DV of output signal SigO ⁇ reference value SiV over a period from the time when sensor 10 starts detection to a predetermined time at one or more times out of predetermined judgment times JT. If there is a time when the value becomes equal to or greater than the first judgment value TH1, the value DV of the output signal SigO-reference value SiV in the judgment time JT is determined in the period from the time when the sensor 10 started detecting the value DV to the predetermined time. The time when the absolute value of the integrated value becomes equal to or greater than the first determination value TH1 is determined as the time RWT when the user turned his or her wrist.
  • the feature quantity generation circuit 11 generates a feature quantity F based on the time RWT at which the user turned his/her wrist, calculated by the arithmetic circuit 112 ( FIG. 14 : step S53).
  • the feature amount generation circuit 11 outputs the feature amount F to the communication unit 12 (FIG. 14: step S54).
  • the sensor unit 100d as described above also has the same effects as the sensor unit 100. Further, according to the sensor unit 100d, the sensor 10 detects the twist of the object 1 in the vertical direction. In addition, the feature amount generation circuit 11 calculates the time RWT at which the user turned his/her wrist based on the output signal SigO. Also, the feature amount F includes the time RWT at which the user turned his/her wrist. As a result, according to the sensor unit 100d, the time RWT at which the user turned his/her wrist can be transmitted to the outside.
  • FIG. 15 is a plan view showing an example of the head 3 of the object to be measured 1 and the object to be hit 4 at the hitting time InT according to the sixth embodiment.
  • FIG. 16 is a plan view showing an example of the head 3 of the object to be measured 1 and the object to be hit 4 at the hitting time InT according to the sixth embodiment.
  • FIG. 17 is a plan view showing an example of the head 3 of the object to be measured 1 and the object to be hit 4 at the hitting time InT according to the sixth embodiment.
  • FIG. 18 is a flow chart showing processing executed by the feature generation circuit 11 according to the sixth embodiment.
  • the sensor unit 100e according to the sixth embodiment only the parts different from the sensor unit 100c according to the fourth embodiment will be described, and the rest will be omitted.
  • the feature amount generation circuit 11 calculates the hitting position HP at which the object 1 hits the object 4 based on the output signal SigO and the first mass m1 of the object 1 . Also, the feature quantity F includes the hitting position HP.
  • the output signal SigO indirectly indicates the force applied to the device under test 1 when the user swings the device under test 1 .
  • the hitting position HP can be calculated based on the output signal SigO.
  • the direction of the force F1 applied to the object to be measured 1 at the impact time InT is is parallel to the left-right direction.
  • the object 1 to be measured is twisted counterclockwise with respect to the vertical direction.
  • the value DV (output signal SigO ⁇ reference value SiV) becomes negative.
  • the hitting position HP can be calculated based on the output signal SigO.
  • the feature amount generation circuit 11 can calculate the hitting position HP based on the positive or negative of the value DV of the output signal SigO-reference value SiV.
  • the extraction circuit 111 and the arithmetic circuit 112 store a program of processing for calculating the hitting position HP based on the output signal SigO. Details of the processing related to the calculation of the hitting position HP in the feature value generation circuit 11 will be described below. This process is started when the feature amount generation circuit 11 acquires the output signal SigO from the sensor 10 . Specifically, first, the extraction circuit 111 and the arithmetic circuit 112 acquire the output signal SigO from the sensor 10 ( FIG. 18 : step S61).
  • the extraction circuit 111 extracts the impact time InT (FIG. 18: step S62).
  • the arithmetic circuit 112 calculates the force F1 applied to the object 1 at the impact time InT based on the output signal SigO and the first mass m1 of the object 1 (FIG. 18: step S63).
  • the arithmetic circuit 112 calculates the impact position HP based on the output signal SigO and the first mass m1 of the object 1 ( FIG. 18 : step S64).
  • the feature amount generation circuit 11 generates a feature amount F based on the hitting position HP calculated by the arithmetic circuit 112 ( FIG. 18 : step S65).
  • the arithmetic circuit 112 outputs the feature amount F to the communication unit 12 (FIG. 18: step S66).
  • the sensor unit 100e as described above also has the same effects as the sensor unit 100c. Further, according to the sensor unit 100e, the feature amount generation circuit 11 calculates the hitting position HP at which the object 1 hits the object 4 based on the output signal SigO and the first mass m1 of the object 1. . Also, the feature amount F includes the hitting position HP. As a result, the sensor unit 100e can transmit the hitting position HP to the outside.
  • the sensor 10 may detect the twist of the object 1 to be measured in the vertical direction.
  • the deformation directions of the object 1 to be measured detected by the sensor 10 may be in a plurality of directions. In these cases, the feature amount generating circuit 11 can more accurately calculate the hitting position HP at which the object 1 hits the object 4 to be hit.
  • FIG. 19 is a flow chart showing the processing executed by the feature generation circuit 11 according to the seventh embodiment.
  • the sensor unit 100f according to the seventh embodiment only the parts different from the sensor unit 100c according to the fourth embodiment will be described, and the rest will be omitted.
  • the feature amount generation circuit 11 extracts the impact time InT based on the output signal SigO. Also, the feature amount generation circuit 11 calculates the swing speed SwV at the impact time InT based on the output signal SigO. Further, the feature amount generation circuit 11 calculates the force (second force ) Compute FO2. In addition, the feature amount F includes the force (second force) FO2 applied to the user at the impact time InT.
  • the force F1 applied to the object 1 at the impact time InT can be calculated based on the output signal SigO and the first mass m1 of the object 1 to be measured.
  • the force F3 applied to the user and the object 1 at the impact time InT can be calculated based on the swing velocity SwV, the impact position HP, and the first mass m1 of the object 1 at the impact time InT. More specifically, for example, the impulse given to the hit object 4 by the user and the object 1 during the period from the hit time InT to the time InT+ ⁇ T after the minute time ⁇ T after the hit time InT is It can be considered equal to the product of the force F3 applied to the object 1 and ⁇ T.
  • this impulse is considered to be equal to the product of the difference between the swing speed SwV at the impact time InT and the swing speed SwV2 at time InT+ ⁇ T after minute time ⁇ T after the impact time InT and the first mass m1 of the object 1 to be measured. be able to.
  • the feature amount generation circuit 11 calculates the difference between the force F3 applied to the user and the object 1 at the impact time InT and the force F1 applied to the object 1 at the impact time InT, and the force received by the user at the impact time InT. FO2.
  • the extraction circuit 111 and the arithmetic circuit 112 extract the impact time InT based on the output signal SigO, calculate the swing speed SwV at the impact time InT based on the output signal SigO, and extract the output signal SigO and the impact time InT.
  • This process is started when the feature amount generation circuit 11 acquires the output signal SigO from the sensor 10 . Specifically, first, the extraction circuit 111 and the arithmetic circuit 112 acquire the output signal SigO from the sensor 10 (FIG. 19: step S71).
  • the extraction circuit 111 extracts the impact time InT (FIG. 19: step S72).
  • the arithmetic circuit 112 calculates the swing speed SwV at the impact time InT and the swing speed SwV2 at the minute time ⁇ T after the impact time InT, based on the output signal SigO (FIG. 19: step S73).
  • the arithmetic circuit 112 calculates the impact position HP based on the output signal SigO and the first mass m1 of the object 1 ( FIG. 19 : step S74).
  • the arithmetic circuit 112 calculates the force F1 applied to the object 1 at the impact time InT based on the output signal SigO and the first mass m1 of the object 1 (FIG. 19: step S75).
  • the arithmetic circuit 112 calculates the swing speed SwV at the impact time InT, the swing speed SwV2 at the time InT+ ⁇ T after the minute time ⁇ T after the impact time InT, the first mass m1 of the object to be measured 1, the minute time ⁇ T, and the impact position HP. Based on this, the force F3 applied to the user and the object 1 at the impact time InT is calculated ( FIG. 19 : step S76).
  • the arithmetic circuit 112 calculates the force FO2 applied to the user at the impact time InT (FIG. 19: step S77). More specifically, the arithmetic circuit 112 causes the user at the impact time InT to receive the difference between the force F3 applied to the user and the object 1 at the impact time InT and the force F1 applied to the object 1 at the impact time InT. and force FO2.
  • the feature quantity generation circuit 11 generates a feature quantity F based on the force FO2 received by the user at the impact time InT calculated by the arithmetic circuit 112 ( FIG. 20 : step S78).
  • the arithmetic circuit 112 outputs the feature quantity F to the communication unit 12 (FIG. 19: step S79).
  • the sensor unit 100f as described above also has the same effects as the sensor unit 100c. Further, according to the sensor unit 100f, the feature amount generation circuit 11 extracts the impact time InT based on the output signal SigO. Also, the feature amount generation circuit 11 calculates the swing speed SwV at the impact time InT based on the output signal SigO. Further, the feature amount generation circuit 11 calculates the force (second force ) Compute FO2. Further, the feature quantity F includes the force (second force) FO2 received by the user at the impact time InT. As a result, according to the sensor unit 100f, the force FO2 received by the user at the impact time InT can be transmitted to the outside.
  • FIG. 20 is a flow chart showing processing executed by the feature generation circuit 11 according to the eighth embodiment.
  • the sensor unit 100g according to the eighth embodiment only the parts different from the sensor unit 100f according to the seventh embodiment will be described, and the rest will be omitted.
  • the feature amount generation circuit 11 determines the state of the swing after the impact time InT based on the force (second force) FO2 applied to the user at the impact time InT.
  • the feature quantity F includes the result of determination of the state of the swing after the impact time InT.
  • the force FO2 received by the user at the impact time InT can be calculated based on the output signal SigO, the swing velocity SwV at the impact time InT, the impact position HP, and the first mass m1 of the object 1 to be measured. For example, if the force FO2 applied to the user at the impact time InT is large, it can be inferred that the user, not the object under test 1, received the force at the impact time InT. Thereby, the feature amount generation circuit 11 can determine that the follow-through after the impact time InT has not been shaken off, that is, the follow-through state is poor.
  • the feature amount generation circuit 11 can determine that the follow-through after the impact time InT has been shaken off, that is, the follow-through state is good.
  • the extraction circuit 111 and the arithmetic circuit 112 store a program for processing to determine the swing state after the impact time InT based on the force FO2 received by the user at the impact time InT. Details of the processing related to the determination of the state of the swing after the impact time InT in the feature amount generation circuit 11 will be described below. Note that steps S81 to S87 in FIG. 20 are the same as steps S71 to S77 in FIG. 19, respectively, so description thereof will be omitted.
  • the arithmetic circuit 112 determines the state of the swing after the impact time InT based on the force FO2 received by the user at the impact time InT (FIG. 20: step S88). More specifically, the arithmetic circuit 112 determines, for example, whether the force FO2 applied to the user at the impact time InT is greater than or equal to a preset second determination value TH2. When the force FO2 applied to the user at the impact time InT is less than TH2, the arithmetic circuit 112 determines that the swing state after the impact time InT is good. On the other hand, if the force FO2 applied to the user at the impact time InT is greater than or equal to TH2, the arithmetic circuit 112 determines that the swing state after the impact time InT is bad.
  • the feature amount generation circuit 11 generates a feature amount F based on the determination result of the swing state after the impact time InT determined by the arithmetic circuit 112 ( FIG. 20 : step S89).
  • the feature amount generation circuit 11 outputs the feature amount F to the communication unit 12 (FIG. 20: step S90).
  • the sensor unit 100g as described above also has the same effects as the sensor unit 100f. Further, according to the sensor unit 100g, the state of the swing after the impact time InT is determined based on the force FO2 received by the user at the impact time InT. In addition, the feature amount F includes the result of determination of the state of the swing after the impact time InT. As a result, according to the sensor unit 100g, the result of determination of the state of the swing after the impact time InT can be transmitted to the outside.
  • FIG. 21 is a flow chart showing the processing executed by the feature generation circuit 11 according to the ninth embodiment.
  • the sensor unit 100h according to the ninth embodiment only the parts different from the sensor unit 100e according to the sixth embodiment will be described, and the rest will be omitted.
  • the sensor unit 100h differs from the sensor unit 100e in that the storage unit 113 stores the feature amount F for each swing.
  • the feature amount F includes the hitting position HP.
  • the storage unit 113 stores the hitting position HP for each swing.
  • the feature amount generation circuit 11 calculates variations Va of a plurality of swings based on the feature amount F for each swing.
  • the feature amount generation circuit 11 calculates the variation Va of the hitting position HP based on the hitting position HP for each swing.
  • the feature amount F includes the variation Va.
  • the arithmetic circuit 112 stores a program for processing for calculating the variation Va of the hitting position HP based on the hitting position HP for each swing. The details of the processing related to the calculation of the variation Va of the hitting position HP in the feature amount generation circuit 11 will be described below. This process is started when the feature amount generating circuit 11 acquires the hitting position HP for each swing from the storage unit 113 . Specifically, first, the arithmetic circuit 112 acquires the hitting position HP for each swing from the storage unit 113 ( FIG. 21 : step S91).
  • the arithmetic circuit 112 calculates the variation Va of the hitting position HP based on the hitting position HP for each swing ( FIG. 21 : step S92). More specifically, the computation circuit 112 computes, for example, the variance or standard deviation of the hitting positions HP.
  • the feature quantity generation circuit 11 generates a feature quantity F based on the variation Va of the hitting position HP calculated by the arithmetic circuit 112 ( FIG. 21 : step S93).
  • the feature amount generation circuit 11 outputs the feature amount F to the communication unit 12 (FIG. 21: step S94).
  • the sensor unit 100h as described above also has the same effects as the sensor unit 100e. Further, according to the sensor unit 100h, the storage unit 113 stores the feature amount F for each swing. In addition, the feature amount generation circuit 11 calculates variations Va of a plurality of swings based on the feature amount F for each swing. In addition, the feature amount F includes a plurality of variations Va of swings. As a result, according to the sensor unit 100e, it is possible to transmit a plurality of swing variations Va to the outside.
  • FIG. 22 is a flow chart showing the processing executed by the feature generation circuit 11 according to the tenth embodiment.
  • the sensor unit 100i according to the tenth embodiment only the parts different from the sensor unit 100f according to the seventh embodiment will be described, and the rest will be omitted.
  • the feature amount generation circuit 11 extracts the impact time InT based on the output signal SigO. Also, the feature amount generation circuit 11 calculates the swing speed SwV at the impact time InT based on the output signal SigO. Also, the initial velocity v of the hit object 4 or the movement direction DM of the hit object 4 is calculated based on the output signal SigO, the swing speed SwV at the hitting time InT, the hit position HP, and the second mass m2 of the hit object 4 . In addition, the feature quantity F includes the initial velocity v of the hit object 4 or the movement direction DM of the hit object 4 .
  • the impulse given by the user and the object 1 to the object 4 during the period from the impact time InT to the time InT+ ⁇ T after the minute time ⁇ T of the impact time InT is can be considered equal to the product of the force F3 applied to 1 and ⁇ T.
  • this impulse can be regarded as equal to the product of the second mass m2 of the hit object 4 and the initial velocity v of the hit object 4 . Therefore, the feature amount generation circuit 11 can calculate the initial velocity v of the hit object 4 based on the output signal SigO, the swing speed SwV at the hit time InT, and the second mass m2 of the hit object 4 . Further, the feature amount generation circuit 11 can calculate the motion direction DM of the hit object 4 based on the hit position HP and the initial velocity v of the hit object 4 .
  • the second mass m2 of the object to be hit 4 is input to the storage unit 113 in advance.
  • the storage unit 113 stores the second mass m2 of the hit object 4 .
  • the extraction circuit 111 and the arithmetic circuit 112 extract the impact time InT based on the output signal SigO, calculate the swing speed SwV at the impact time InT based on the output signal SigO, and A processing program for calculating the initial velocity v of the hit object 4 or the movement direction DM of the hit object 4 based on the output signal SigO, the swing speed SwV at the hit time InT, the hitting position HP, and the second mass m2 of the hit object 4. memorize Details of the processing related to the calculation of the initial velocity v of the hit object 4 or the movement direction DM of the hit object 4 in the feature amount generation circuit 11 will be described below. This process is started when the feature amount generation circuit 11 acquires the output signal SigO from the sensor 10 . Specifically, first, the extraction circuit 111 and the arithmetic circuit 112 acquire the output signal SigO from the sensor 10 ( FIG. 22 : step S101).
  • the extraction circuit 111 extracts the impact time InT (FIG. 22: step S102).
  • the arithmetic circuit 112 calculates the swing speed SwV at the impact time InT and the swing speed SwV2 at the minute time ⁇ T after the impact time InT, based on the output signal SigO (FIG. 22: step S103).
  • the arithmetic circuit 112 calculates the impact position HP based on the output signal SigO and the first mass m1 of the object 1 ( FIG. 22 : step S104).
  • the arithmetic circuit 112 calculates the swing speed SwV at the impact time InT, the swing speed SwV2 at the time InT+ ⁇ T after the minute time ⁇ T after the impact time InT, the first mass m1 of the object 1 to be measured, and the second mass m1 of the object 4 to be impacted.
  • the initial velocity v of the object to be hit 4 is calculated based on m2 and the minute time ⁇ T ( FIG. 22 : step S105).
  • the arithmetic circuit 112 calculates the movement direction DM of the hit object 4 based on the hitting position HP and the initial velocity v of the hit object 4 (FIG. 22: step S106).
  • the feature quantity generation circuit 11 generates a feature quantity F based on the initial velocity v of the hit object 4 or the motion direction DM of the hit object 4 calculated by the arithmetic circuit 112 (FIG. 22: step S107).
  • the arithmetic circuit 112 outputs the feature amount F to the communication unit 12 (FIG. 22: step S108).
  • the sensor unit 100i as described above also has the same effects as the sensor unit 100f. Further, according to the sensor unit 100i, the feature amount generation circuit 11 extracts the impact time InT based on the output signal SigO. Also, the feature amount generation circuit 11 calculates the swing speed SwV at the impact time InT based on the output signal SigO. Also, the initial velocity v of the hit object 4 or the motion direction DM of the hit object 4 is calculated based on the output signal SigO, the swing speed SwV at the hitting time InT, the hitting position HP, and the second mass m2 of the hit object 4 . Also, the feature amount F includes the initial velocity v of the hit object 4 or the movement direction DM of the hit object 4 . As a result, the sensor unit 100i can transmit the initial velocity v of the hit object 4 or the movement direction DM of the hit object 4 to the outside.
  • the sensor 10 may detect the twist of the object 1 to be measured in the vertical direction.
  • the deformation directions of the object 1 to be measured detected by the sensor 10 may be in a plurality of directions.
  • the feature quantity generation circuit 11 can calculate the initial velocity v of the hit object 4 or the movement direction DM of the hit object 4 with higher accuracy.
  • the sensor units according to the present invention are not limited to the sensor units 100, 100a to 100i, and can be modified within the scope of the subject matter. Moreover, the configurations of the sensor units 100, 100a to 100i may be combined arbitrarily.
  • the object 1 to be measured does not have to be a member for hitting the object 4 to be hit.
  • the object 1 to be measured is not limited to a golf club, and may be a bat, a racket, a game controller, a fishing rod, a bamboo sword, a robot arm, or the like.
  • the object to be measured 1 may include a portion that is deformed by being swung.
  • the object 1 to be measured is not limited to an object that deforms when the user swings it.
  • the object to be measured 1 may be, for example, a robot arm that deforms when the object itself swings.
  • the hit object 4 is not limited to a golf ball, and may be a baseball, tennis ball, or the like.
  • the output signal SigO generated by the sensor 10 is not limited to the relationship between the differential value of the deformation amount of the object 1 and time.
  • the output signal SigO generated by the sensor 10 may indicate the relationship between a physical quantity related to the amount of deformation of the object 1 to be measured and time.
  • a physical quantity related to the amount of deformation is, for example, the amount of deformation or stress.
  • the sensor 10 may detect the amount of deformation or stress of the object 1 to be measured.
  • Sensor 10 may also include, for example, strain gauges.
  • the feature amount generation circuit 11 extracts the amount of bending B of the object 1 to be measured at a predetermined time based on the output signal SigO generated by the sensor 10. good.
  • the piezoelectric film 103 may have a piezoelectric constant of d31.
  • the piezoelectric film 103 having a piezoelectric constant of d31 is, for example, a PVDF (polyvinylidene fluoride) film.
  • the first main surface S1 and the second main surface S2 do not have to have a rectangular shape when viewed in the direction normal to the first main surface S1 when the piezoelectric film 103 is laid out flat.
  • the rectangular shape includes a rectangle and a slightly modified shape of the rectangle.
  • a slightly modified shape of a rectangle is, for example, a shape in which the corners of the rectangle are chamfered.
  • the first main surface S1 and the second main surface S2 have an elliptical shape or a square shape when viewed in the normal direction of the first main surface S1 in a state in which the piezoelectric film 103 is laid out on a plane. good too.
  • the deformation direction of the object 1 to be measured detected by the sensor 10 is not limited to the left-right direction, but may be the up-down direction, the front-rear direction, or any direction. Moreover, the deformation directions of the object 1 to be measured detected by the sensor 10 may be in a plurality of directions.
  • the feature quantity F generated by the feature quantity generation circuit 11 performing extraction processing based on the output signal SigO is not limited to the impact time InT, and may be any time, including a plurality of times. good too.
  • the predetermined time may be any time, or may include a plurality of times.
  • the predetermined time may be the time when the output signal SigO exhibits the maximum value or the time when the output signal SigO exhibits the minimum value.
  • the feature amount F generated by the feature amount generation circuit 11 performing extraction processing based on the output signal SigO is not limited to the predetermined time, and may be the value of the output signal SigO at the predetermined time.
  • the feature amount F may be the value of the output signal SigO at the impact time InT.
  • the external device to which the communication unit 12 transmits the feature amount F is not limited to a mobile wireless communication terminal such as a smart phone, and may be a stationary wireless communication terminal such as a server.
  • transmission of the feature quantity F to the outside by the communication unit 12 is not limited to wireless communication, and may be wired communication.
  • Wired communication is, for example, communication of electrical signals through communication lines such as electric wires and optical fibers.
  • the feature generation circuit 11 extracts the impact time InT based on artificial intelligence, machine learning, deep learning, or the like, or extracts the swing start time SwT, the swing speed SwV at a predetermined time, and the user at a predetermined time. 1, the time RWT when the user turned his wrist, the hitting position HP, the force FO2 received by the user at the hitting time InT, or the determination of the state of the swing after the hitting time InT, the variation Va of a plurality of swings, the hit The initial velocity v of the hitting object 4 or the moving direction DM of the hitting object 4 may be calculated.
  • the method of calculating the variation Va of a plurality of swings is not limited to the variance or standard deviation of the feature amount F for each swing, and other statistical methods may be used. Other statistical methods may be used, such as the coefficient of variation.
  • the feature quantity generation circuit 11 may calculate the initial velocity v of the hit object 4, and the feature quantity F may include the initial velocity v of the hit object 4. Further, in the sensor unit 100i, the feature quantity generation circuit 11 may calculate the movement direction DM of the hit object 4, and the feature quantity F may include the movement direction DM of the hit object 4.
  • the extraction circuit 111 or the arithmetic circuit 112 may not necessarily be a CPU.
  • the extraction circuit 111 or the arithmetic circuit 112 may be, for example, an MPU (Micro Processing Unit) or the like.
  • Storage unit 113 does not necessarily have to include a ROM.
  • Storage unit 113 may include, for example, flash memory instead of ROM.
  • the charge amplifier 104 does not necessarily convert the charge into a voltage value within the range of 0.0V to 3.0V.
  • the charge amplifier 104 may, for example, convert the charge to a range of 0.0V to 1.5V, a range of 0.0V to 5.0V, or the like.
  • the resolution of the AD converter 102 is not limited to 12 bits, and may be a bit value other than 12 bits.
  • the resolution of the AD converter 102 may be, for example, 10 bits, 16 bits, or the like.
  • the shape of the object 1 to be measured does not have to include a shape extending in the vertical direction.
  • the feature value generation circuit 11 does not have to be attached to the device under test 1 .

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  • Physical Education & Sports Medicine (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
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JPH11178953A (ja) * 1997-12-19 1999-07-06 Mizuno Corp スイング中のゴルフクラブシャフトのしなり挙動解析システム
JP2014193274A (ja) * 2013-02-26 2014-10-09 Mizuno Corp バット選択装置、バット選択方法、コンピュータにバットを選択させるためのプログラム
JP2016022308A (ja) * 2014-07-24 2016-02-08 株式会社Ｉ＆Ｌ スイング測定表示システム
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