WO2022209720A1 - Circuit de compensation de sortie de capteur - Google Patents

Circuit de compensation de sortie de capteur Download PDF

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Publication number
WO2022209720A1
WO2022209720A1 PCT/JP2022/010726 JP2022010726W WO2022209720A1 WO 2022209720 A1 WO2022209720 A1 WO 2022209720A1 JP 2022010726 W JP2022010726 W JP 2022010726W WO 2022209720 A1 WO2022209720 A1 WO 2022209720A1
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Prior art keywords
temperature
circuit
compensation
sensitivity
sensor
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PCT/JP2022/010726
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English (en)
Japanese (ja)
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有継 矢島
哲也 成田
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株式会社村田製作所
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Application filed by 株式会社村田製作所 filed Critical 株式会社村田製作所
Priority to JP2023510805A priority Critical patent/JPWO2022209720A1/ja
Priority to DE112022000965.9T priority patent/DE112022000965T5/de
Priority to CN202280015905.9A priority patent/CN116897296A/zh
Publication of WO2022209720A1 publication Critical patent/WO2022209720A1/fr
Priority to US18/368,175 priority patent/US20240003992A1/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/02Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09Magnetoresistive devices
    • G01R33/098Magnetoresistive devices comprising tunnel junctions, e.g. tunnel magnetoresistance sensors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/0023Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G01R33/0029Treating the measured signals, e.g. removing offset or noise
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/007Environmental aspects, e.g. temperature variations, radiation, stray fields
    • G01R33/0082Compensation, e.g. compensating for temperature changes

Definitions

  • the present invention relates to a sensor output compensation circuit that compensates for the output sensitivity of a sensor whose sensor elements are bridge-connected.
  • This magnetoresistive element amplifier circuit includes a magnetoresistive element in which four ferromagnetic magnetoresistive element patterns are bridge-connected, and by connecting a differential amplifier circuit to a pair of output terminals of the magnetoresistive element, The output voltage of the resistance element is differentially amplified.
  • the differential amplifier circuit is provided with an offset adjustment circuit that varies the midpoint potential of the output voltage after amplification by a variable resistor and sets it to a predetermined potential.
  • a temperature compensation circuit is provided as a sensor output compensation circuit to compensate for variations.
  • the present invention was made to solve such problems, a differential amplifier circuit that amplifies, as a sensor output, a differential voltage between detected voltages appearing at a pair of detection signal output terminals of a sensor in which sensor elements whose resistance value changes according to a detected physical quantity are bridge-connected; a temperature sensor circuit for detecting ambient temperature; a sensitivity temperature characteristic compensating circuit for applying a bias voltage to a pair of power supply terminals of the sensor based on the ambient temperature detected by the temperature sensor circuit to cancel variations in sensitivity of the sensor output with respect to changes in the ambient temperature. , constructed a sensor output compensation circuit.
  • a sensor output compensation circuit capable of uniformly performing high-accuracy sensitivity temperature compensation of sensor output over the entire temperature range, and capable of reducing the size and cost of the circuit. can do
  • FIG. 1 is a circuit diagram showing an overall schematic configuration of a sensor output compensation circuit according to one embodiment of the present invention
  • FIG. 2 is a circuit diagram for explaining the function of a linearity compensation circuit in the sensor output compensation circuit shown in FIG. 1
  • FIG. (a) is a graph showing changes in sensor output with respect to a magnetic field
  • (b) is a graph showing distortion of the sensor output that appears non-linearly.
  • (a) is a graph showing a control signal output from the linearity compensating circuit to change the resistance value of the variable resistor R4, and
  • (b) is a graph showing the distortion of the sensor output after being compensated by the linearity compensating circuit.
  • 2 is a circuit diagram for explaining the function of a sensitivity temperature characteristic compensation circuit in the sensor output compensation circuit shown in FIG.
  • FIG. (a) is a graph showing the temperature characteristic of the sensitivity of the sensor output
  • (b) is a graph showing the temperature characteristic of the sensitivity of the sensor output after the sensitivity temperature compensation is performed by the sensitivity temperature characteristic compensation circuit.
  • 4 is a graph showing changes in voltage-converted temperature output from a temperature sensor circuit with respect to ambient temperature
  • 2 is a circuit diagram for explaining the function of an offset temperature characteristic compensation circuit in the sensor output compensation circuit shown in FIG. 1
  • FIG. (a) is a graph showing the temperature characteristics of the variation rate of the offset voltage
  • (b) is a graph showing the temperature characteristics of the variation rate of the offset voltage after being compensated by the offset temperature characteristic compensation circuit.
  • FIG. 1 is a circuit diagram showing an overall schematic configuration of a sensor output compensation circuit according to one embodiment of the present invention.
  • the sensor output compensation circuit is a circuit that inputs the output of the TMR (Tunneling Magneto-Resistive) sensor 2 and performs various compensations for the sensor output.
  • the TMR sensor 2 is configured by bridge-connecting TMR elements whose resistance value changes according to a magnetic field, which is a physical quantity to be detected, and operates when a predetermined voltage is applied to a pair of power supply terminals 2a and 2b. .
  • the magnetic field detected by the TMR sensor 2 appears as a voltage difference between the pair of detection signal output terminals 2c and 2d, and is given to the signal input terminals 1a and 1b of the sensor output compensation IC 1 as sensor outputs.
  • Such a TMR sensor 2 is used, for example, to monitor the current supplied to the motor of a hybrid vehicle.
  • Various types of compensation performed by the sensor output compensation IC1 include sensor output linearity compensation, sensitivity compensation, sensitivity temperature characteristic compensation (TCS (Temperature Coefficient Sensitivity): hereinafter referred to as temperature sensitivity compensation), offset compensation, and offset temperature compensation.
  • TCS Tempo Coefficient Sensitivity
  • offset compensation offset compensation
  • TCO Tempoistic Compensation
  • compensation for individual variations of the TMR sensor 2 is also included for each of these compensations.
  • Linearity compensation is compensation that removes nonlinear components from the sensor output to ensure the linearity of the sensor output.
  • Offset compensation is compensation for canceling offset voltages appearing at the pair of detection signal output terminals 2c and 2d when the TMR sensor 2 does not detect a magnetic field.
  • the offset temperature characteristic compensation is compensation for offsetting the temperature variation of the offset voltage.
  • Sensitivity compensation is compensation for offsetting variations in the sensitivity of the TMR sensor 2 due to individual TMR sensors 2 .
  • the sensitivity of the TMR sensor 2 is a value obtained by dividing the output span voltage obtained by subtracting the offset voltage from the rated output voltage of the sensor output compensation IC1 by the rated magnetic field, and means the change in output voltage per unit magnetic field.
  • Sensitivity temperature characteristic compensation is compensation for canceling out temperature fluctuations in sensitivity temperature characteristics that indicate how much the maximum output span voltage changes at the compensation temperature.
  • the sensor output compensation IC 1 includes a differential amplifier circuit 3 composed of an instrumentation amplifier, and a compensation amplifier circuit 4 for compensating the output of the differential amplifier circuit 3 .
  • the differential amplifier circuit 3 includes operational amplifiers 31 and 32 for amplifying respective detection voltages appearing at the pair of detection signal output terminals 2c and 2d of the TMR sensor 2, and an operational amplifier 33 for differentially amplifying the respective amplified detection voltages. Prepare. A differential voltage between the detection voltages appearing at the pair of detection signal output terminals 2c and 2d is treated as a substantial sensor output.
  • the sensitivity of the sensor output is adjusted by varying the variable resistor R0 to compensate for individual variations in the TMR sensor 2.
  • a variable voltage source VREF1 is connected to the non-inverting input terminal of the operational amplifier 33 via a resistor R3'.
  • the offset voltage of the sensor output is adjusted by varying the output voltage of this variable voltage source VREF1 so that the output voltage VOUT appearing at the output terminal OUT of the sensor output compensation IC1 becomes zero when no magnetic field is detected by the TMR sensor 2. adjusted to
  • the amplification factor (R5/R4) of the compensation amplifier circuit 4 changes by changing the resistance value of the connected variable resistor R4 or R5.
  • the resistance values of the variable resistors R4 and R5 are changed by switching the connection between the resistors (not shown) by a plurality of switches (not shown) to change the combined resistance value of the resistors. variable.
  • the sensor output compensation IC 1 of this embodiment includes a linearity compensation circuit 5 that compensates for the linearity of the sensor output, a sensitivity temperature compensation circuit that compensates for the sensitivity temperature characteristic of the sensor output, and a temperature characteristic of the offset voltage of the sensor output.
  • An offset temperature characteristic compensation circuit 7 is provided.
  • the sensitivity temperature characteristic compensation circuit is composed of a sensitivity temperature characteristic coarse adjustment circuit 6a and a sensitivity temperature characteristic fine adjustment circuit 6b.
  • These differential amplifier circuit 3, compensation amplifier circuit 4, linearity compensation circuit 5, sensitivity temperature coarse adjustment compensation circuit 6a, sensitivity temperature fine adjustment compensation circuit 6b, and offset temperature compensation circuit 7 compensate for the sensor output compensation IC 1.
  • Construct block 8 .
  • the sensor output compensation IC 1 also includes a regulator circuit (VREG) 9, a reference voltage circuit (VREF) 10, and a temperature sensor circuit 11.
  • the regulator circuit 9 generates a reference voltage from the voltage input to the power supply terminal VDD.
  • the reference voltage circuit 10 uses the reference voltage generated by the regulator circuit 9 as a reference for each value used in the coarse sensitivity temperature characteristic compensation circuit 6a, the fine sensitivity temperature characteristic compensation circuit 6b, the offset temperature characteristic compensation circuit 7, and the like. generate voltage.
  • the temperature sensor circuit 11 detects the ambient temperature as a voltage using a diode, and outputs the detected voltage-converted temperature to the sensitivity temperature characteristic and coarse adjustment compensation circuit 6 a and the offset temperature characteristic compensation circuit 7 . Since the TMR sensor 2 and the sensor output compensation IC 1 are arranged close to each other, the ambient temperature detected by the temperature sensor circuit 11 is detected as the ambient temperature of the TMR sensor 2 .
  • the sensor output compensation IC 1 is equipped with an EEPROM 12 whose memory contents can be rewritten by the user. Setting data is written into the EEPROM 12 from the data terminal DATA by the user. In accordance with this setting data, setting adjustment of compensation operations by various compensation circuits in the compensation block 8 is performed, and setting adjustment of temperature detection in the temperature sensor circuit 11 is performed.
  • the linearity compensation performed by the linearity compensation circuit 5 is performed by varying the amplification factor (R5/R4) of the compensation amplifier circuit 4 as described later. ) is varied by switching the connection state between the resistors forming the variable resistor R4 by a plurality of switches in accordance with the setting data written in the EEPROM 12 .
  • the sensitivity temperature characteristic compensation performed by the sensitivity temperature characteristic coarse adjustment compensation circuit 6a and the sensitivity temperature characteristic fine adjustment compensation circuit 6b are controlled by the resistance values of variable resistors R11 to R14 and reference voltages VREF3 and VREF4 (see FIG. 5). is performed by switching according to the setting data written in the EEPROM 12 .
  • the offset temperature compensation performed by the offset temperature compensation circuit 7 is also performed by switching the connection state of switches 75 and 76 (see FIG. 8) described later according to setting data written in the EEPROM 12 . Also, the temperature sensor circuit 11 is adjusted according to the setting data written in the EEPROM 12 so as to output a voltage of 1[V] as the voltage conversion temperature when the ambient temperature is 25.degree.
  • FIG. 2 is a circuit diagram for explaining the function of the linearity compensation circuit 5 in the sensor output compensation IC 1 shown in FIG.
  • the same reference numerals are given to the same or corresponding parts as in FIG. 1, and the description thereof will be omitted.
  • the linearity compensation circuit 5 is composed of a plurality of comparators 51, 52, 53, . . . , 5n.
  • the output voltage of the differential amplifier circuit 3 is commonly input to one input terminal of each of the comparators 51, 52, 53, . . .
  • Reference voltages VREF_L1, VREF_L2, VREF_L3, . . . , VREF_Ln are input. These reference voltages VREF_L1, VREF_L2, VREF_L3, . It is preset.
  • the linearity compensation circuit 5 changes the resistance value of the variable resistor R4 by switching a plurality of switches forming the variable resistor R4 according to the result of comparison between the plurality of reference voltages and the output voltage of the differential amplifier circuit 3. As a result, the amplification factor (R5/R4) of the compensation amplifier circuit 4 is varied to cancel the distortion.
  • the amplification factor (R5/R4) of the compensation amplifier circuit 4 is varied by switching a plurality of switches constituting the variable resistor R4 to vary the resistance value of the variable resistor R4.
  • the amplification factor (R5/R4) of the compensation amplifier circuit 4 may be varied by switching a plurality of switches forming the variable resistor R5 to vary the resistance value of the variable resistor R5.
  • FIG. 3(a) is a graph showing an example of the relationship between the magnetic field applied to the TMR sensor 2 and the sensor output appearing as a differential voltage between the detection signal output terminals 2c and 2d when each magnetic field is applied to the TMR sensor 2.
  • the horizontal axis of the graph is the magnetic field [mT] applied to the TMR sensor 2, and the vertical axis is the sensor output [mV].
  • a characteristic line y represents the change of the sensor output with respect to each magnetic field when the ambient temperature of the sensor output compensation IC1 is 25° C., and indicates the linearity characteristic of the sensor output.
  • This characteristic line y is represented by the following polynomial expression (3) with the magnetic field x as a variable.
  • y -6.469 e -0.7 x 3 -1.512 e -0.6 x 2 +2.175 e -0.2 x + 4.306 e -0.3 (3)
  • the characteristic line y looks straight at first glance, but it contains the non-linear components shown in the first and second terms on the right side of equation (3).
  • the graph shown in FIG. 3(b) shows the relationship between the magnetic field and the sensor output.
  • the horizontal axis of the graph represents the magnetic field [mT] applied to the TMR sensor 2, while the vertical axis represents the sensor output [mV] excluding linear components.
  • a characteristic line y' represents the distortion of the sensor output that appears non-linearly. Since this distortion affects the magnetic field detection accuracy of the TMR sensor 2, the linearity compensation circuit 5 compensates for this distortion.
  • the distortion exists in the magnetic field regions of about +8 [mT] or more and about -8 [mT] or less.
  • the distortion is canceled by varying the amplification factor of the compensation amplifier circuit 4 by .
  • FIG. 4(a) is a graph showing an example of the control signal v given from the linearity compensation circuit 5 to each switch of the variable resistor R4.
  • the horizontal axis of the graph represents the magnetic field [mT] applied to the TMR sensor 2, and the vertical axis represents the voltage [V] of the control signal v.
  • Characteristic line a is the magnetic field change of the input voltage input to the input terminals 1a and 1b of the sensor output compensation IC1
  • characteristic line b is the magnetic field change of the output voltage VOUT output to the output terminal out of the sensor output compensation IC1.
  • Characteristic lines c, d, e, and f represent control signals v1, v2, v3, and v4 for correcting the distortion of the sensor output of about +8 [mT] or more in the positive magnetic field shown in FIG.
  • Characteristic lines g, h, i, and j represent control signals v5, v6, v7, and v8 for correcting distortion of the sensor output of approximately -8 [mT] or less in the negative magnetic field.
  • Each of the control signals v1 to v8 changes between a high level of +5 [V] and a low level of 0 [V]. For example, when changed to low level, each switch sw1 to sw8 is closed.
  • the distortion of the sensor output in the magnetic field region of about +8 [mT] or more is that when the magnetic field is about +7 [mT], the switch sw1 is closed by the low level of the control signal v1 represented by the characteristic line c.
  • the resistance value of the variable resistor R4 is varied, and the amplification factor of the compensation amplifier circuit 4 is changed to an amplification factor that cancels out the distortion in the magnetic field at that time.
  • the switch sw2 When the magnetic field is about +10 [mT], the switch sw2 is controlled to be closed by turning the control signal v2 represented by the characteristic line d to a low level, and when the magnetic field is about +13 [mT], , the switch sw3 is controlled to be closed by the low level of the control signal v3 represented by the characteristic line e, and the control signal v4 represented by the characteristic line f is When the switch sw4 is controlled to be closed by the low level, the resistance value of the variable resistor R4 is varied, and the amplification factor of the compensation amplifier circuit 4 is changed to an amplification factor that cancels out the distortion in each magnetic field.
  • the switches sw5 to sw8 are controlled to close by the control signals v5 to v8 represented by the characteristic lines g to j.
  • the resistance values of the variable resistors R4 are varied, and the amplification factor of the compensating amplifier circuit 4 is changed to an amplification factor that cancels out the distortion in each magnetic field.
  • FIG. 4(b) is a graph showing the distortion of the sensor output after the non-linearity of the sensor output is compensated by such resistance control of the variable resistor R4 by the linearity compensation circuit 5.
  • the horizontal axis of the graph represents the magnetic field [mT] applied to the TMR sensor 2, and the vertical axis represents the ratio [%] of the distortion component included in the output voltage VOUT output to the output terminal out of the sensor output compensation IC1.
  • a characteristic line k represents the variation characteristic of the distortion component included in the output voltage VOUT with respect to the change in the magnetic field.
  • the amplification factor of the compensation amplifier circuit 4 is increased. It can be understood that the ratio of the distortion component increases upwardly to the right, thereby canceling out the decrease in distortion shown in FIG. 3(b).
  • the distortion of the sensor output in the magnetic field region of about ⁇ 8 [mT] or less increases to the left with the decrease in the magnetic field as shown in FIG.
  • the amplification factor of the compensating amplifier circuit 4 is lowered, so that the ratio of the distortion component decreases downward to the left, and the ratio of the distortion component decreases, as shown in FIG. 3(b). It is understood that there is an effect of canceling out the increase in strain shown in .
  • the characteristic line k fluctuates up and down in a zigzag manner as shown in FIG. .
  • the amplification factor of the compensation amplifier circuit 4 is such that the connection between a plurality of resistors connected to the compensation amplifier circuit 4 as the variable resistor R4 is the linearity compensation circuit 5 is switched by controlling the plurality of switches in the , and is varied by changing the combined resistance value of the plurality of resistors.
  • the switching of the switches is performed by comparing the output voltage of the differential amplifier circuit 3 with a plurality of preset reference voltages VREF_L1, VREF_L2, VREF_L3, . It is done when the voltage corresponding to each sensor output is reached.
  • the amplification factor of the compensation amplifier circuit 4 becomes an amplification factor that cancels each predetermined distortion from the output of the differential amplifier circuit 3 according to the output voltage of the differential amplifier circuit 3, and the sensor output is improved. Linearity is guaranteed.
  • the distortion appearing in the sensor output with nonlinearity with respect to changes in the magnetic field is corrected by the amplification of the compensating amplifier circuit 4 that compensates the output of the differential amplifier circuit 3.
  • the gain is compensated by being varied by the linearity compensating circuit 5 to an amplification factor that cancels out the distortion. Therefore, the response speed of the circuit is faster than the conventional nonlinearity compensation circuit (see Japanese Patent Application Laid-Open No. 2003-248017) that feeds back the sensor output and performs linearity compensation, and the nonlinearity compensation of the sensor output is faster. It will be done in Moreover, unlike the conventional sensor output compensating circuit, an adder circuit is not required, so the circuit scale of the sensor output compensating IC1 can be suppressed.
  • FIG. 5 is a circuit diagram for explaining each function of the sensitivity temperature characteristic coarse adjustment compensation circuit 6a and the sensitivity temperature characteristic fine adjustment compensation circuit 6b in the sensor output compensation IC 1 shown in FIG.
  • the sensitivity temperature characteristic coarse adjustment compensation circuit 6a and the sensitivity temperature characteristic coarse adjustment compensation circuit 6b are bias voltages based on the ambient temperature detected by the temperature sensor circuit 11 to cancel variations in the sensitivity of the sensor output with respect to changes in the ambient temperature. is applied to a pair of power supply terminals 2a and 2b of the TMR sensor 2 to form a sensitivity temperature characteristic compensation circuit. Since the TMR sensor 2 can vary the sensor sensitivity by adjusting the bias voltage, the temperature characteristic of the sensitivity can be compensated for by varying the bias voltage with respect to the ambient temperature.
  • the sensitivity temperature characteristic coarse adjustment compensation circuit 6a includes an inverting amplifier circuit composed of an operational amplifier 61, a coarse adjustment variable resistor R11, and a coarse adjustment variable resistor R12.
  • a reference voltage VREF3 generated by the reference voltage circuit 10 is input to the non-inverting input terminal of the operational amplifier 61 .
  • the sensitivity temperature characteristic and coarse adjustment compensation circuit 6a receives the voltage-converted temperature output from the temperature sensor circuit 11 according to the ambient temperature. Then, with an amplification factor (R12/R11) corresponding to the change rate of the sensitivity of the sensor output with respect to the ambient temperature, the voltage conversion temperature is inverted and amplified to generate the bias voltage Va, which is applied to one of the pair of power supply terminals 2a and 2b. to the power supply terminal 2a.
  • FIG. 6A is a graph showing an example of temperature characteristics of sensor output sensitivity.
  • the horizontal axis represents the ambient temperature [°C] of the TMR sensor 2
  • the vertical axis represents the variation rate [%] of sensitivity at each ambient temperature when a magnetic field of 20 [mT] is applied to the TMR sensor 2.
  • the variation rate of sensitivity exhibits a temperature characteristic with a first-order slope (-0.0952x) that decreases linearly as the temperature increases. Therefore, in order to prevent the sensitivity from being affected by changes in the ambient temperature, in this embodiment, a bias voltage Va having a first-order slope (+0.0952x) opposite to the characteristic line m is used as a temperature compensation voltage for the TMR sensor. 2, and the sensitivity is compensated so that the characteristic line m has a flat characteristic with respect to changes in the ambient temperature.
  • the temperature sensor circuit 11 outputs the voltage-converted temperature exhibiting the slope of the same polarity as that of the characteristic line m, which is input to the sensitivity temperature characteristic/coarse adjustment compensation circuit 6a.
  • the polarity of the slope of the voltage conversion temperature is inverted by the inverting amplifier circuit 6a.
  • the magnitude of the slope of the voltage conversion temperature is the same as the slope of the characteristic line m.
  • the voltage conversion temperature is amplified by the amplification factor to generate a temperature compensated voltage that becomes the bias voltage Va.
  • FIG. 7 is a graph showing changes in the voltage conversion temperature output from the temperature sensor circuit 11 with respect to the ambient temperature.
  • the horizontal axis of the graph represents the ambient temperature [° C.] of the sensor output compensation IC 1
  • the vertical axis represents the output voltage [V] of the temperature sensor circuit 11 at each ambient temperature.
  • a characteristic line o indicates the temperature characteristic of the voltage conversion temperature, which is the output voltage of the temperature sensor circuit 11 .
  • both the characteristic line o of the voltage conversion temperature and the characteristic line m of the sensitivity fluctuation rate have negative slopes that decrease linearly with increasing temperature.
  • the inverting amplifier circuit of the sensitivity temperature characteristic coarse adjustment compensation circuit 6a changes the amplification factor (R12/R11) by changing the resistance value of the coarse adjustment variable resistor R11 or coarse adjustment variable resistor R12 connected thereto.
  • Each resistance value of the coarse adjustment variable resistor R11 and the coarse adjustment variable resistor R12 is varied by switching the connection between the plurality of coarse adjustment resistors by a plurality of switches to change the combined resistance value of the plurality of coarse adjustment resistors. be done.
  • the amplification factor (R12/R11) of the inverting amplifier circuit becomes an amplification factor that cancels out the variation in sensitivity caused by the ambient temperature, and the magnitude of the slope of the characteristic line o of the voltage conversion temperature indicates the variation in sensitivity.
  • one power supply terminal 2a of the pair of power supply terminals 2a and 2b of the TMR sensor 2 receives the voltage conversion temperature output from the temperature sensor circuit 11 with an amplification factor ( A bias voltage Va inverted and amplified by R12/R11) is given as a sensitivity temperature compensation voltage. Therefore, the sensitivity fluctuation component contained in the sensor output appearing at the pair of detection signal output terminals 2c and 2d of the TMR sensor 2 is the bias voltage Va which changes at the same rate as the sensitivity with respect to the ambient temperature but with the opposite polarity. It is canceled by being applied to one power supply terminal 2a of the sensor. Moreover, the temperature sensor circuit 11 is used to cancel out the fluctuation component of the sensitivity without providing a dedicated circuit for compensating the sensitivity temperature characteristic.
  • FIG. 6(b) is a graph showing the ambient temperature characteristics of the rate of change in sensitivity that has been temperature-compensated in this way. Similar to the graph of FIG. 6(a), the horizontal axis of the graph shown in FIG. , represents the variation rate [%] of sensitivity at each ambient temperature. A characteristic line n represents the change in the rate of change of sensitivity with respect to the ambient temperature. As shown in the graph, the fluctuation rate of the sensitivity of the sensor output compensating IC1 after compensation is within a small fluctuation range of ⁇ 0.03[%] or less.
  • the sensitivity temperature characteristic fine adjustment compensating circuit 6b constituting the sensitivity temperature characteristic compensation circuit is canceled by the action of the sensitivity temperature characteristic coarse adjustment compensating circuit 6a.
  • a small compensation bias voltage is generated to further cancel the remaining small variations in sensitivity of the sensor output.
  • the generated minute compensation bias voltage is applied as the bias voltage Vb to the other power terminal 2b of the pair of power terminals 2a.
  • the sensitivity temperature characteristic/fine adjustment compensation circuit 6b includes an operational amplifier 62, an inverting amplifier circuit composed of a fine adjustment variable resistor R13 and a fine adjustment variable resistor R14, and a sensitivity compensation voltage circuit 63.
  • a reference voltage VREF4 generated by the reference voltage circuit 10 is input to the non-inverting input terminal of the operational amplifier 62 .
  • a sensitivity compensation voltage circuit 63 generates a sensitivity compensation voltage that is the basis of a minute compensation bias voltage that cancels out minute variations in sensitivity remaining in the sensor output.
  • An inverting amplifier circuit composed of an operational amplifier 62 inverts and amplifies the sensitivity compensation voltage generated by the sensitivity compensation voltage circuit 63 with an amplification factor (R14/R13) to generate a minute compensation bias voltage, which is applied to the other power supply terminal 2b. output to
  • the amplification factor (R14/R13) changes when the resistance value of the fine adjustment variable resistor R13 or fine adjustment variable resistor R14 connected to the operational amplifier 62 is changed.
  • the resistance values of the fine-tuning variable resistor R13 and the fine-tuning variable resistor R14 are respectively varied by switching the connection between the fine-tuning resistors by a plurality of switches to change the combined resistance value of the fine-tuning resistors. be. By switching this switch, the magnitude of the fine compensation bias voltage generated by the sensitivity temperature characteristic/fine adjustment compensating circuit 6b is adjusted, and the slight variation in the sensitivity of the sensor output that remains after being canceled by the action of the sensitivity temperature characteristic/coarse adjustment compensation circuit 6a. will be properly canceled.
  • the variation in the sensitivity of the sensor output with respect to changes in the ambient temperature is compensated by the sensitivity temperature characteristic compensation circuit. It is canceled and compensated by being applied to the pair of power supply terminals 2a, 2b of the sensor. Therefore, unlike the conventional temperature compensation circuit disclosed in Patent Document 1, which can perform only temperature compensation depending on the thermistor characteristics, the temperature range in which temperature compensation can be performed is not limited. In addition, the temperature compensation characteristic of the thermistor element does not vary as in the conventional case. Therefore, it is possible to uniformly perform highly accurate sensitivity temperature compensation over the entire temperature range. In addition, since the sensor output compensation circuit can be configured without using a thermistor element in the temperature compensation circuit, the sensor output compensation circuit can be implemented as an IC, and the sensor output compensation circuit can be made smaller and less expensive.
  • the slight variation in the sensitivity of the sensor output that remains after being canceled out by the action of the sensitivity temperature characteristic and coarse adjustment compensation circuit 6a is compensated for by the bias voltage Vb that further cancels out the slight variation. It is generated as a bias voltage by the sensitivity temperature characteristic fine adjustment compensation circuit 6b and is canceled by being applied to the other power terminal 2b of the pair of power terminals 2a and 2b. For this reason, more accurate temperature sensitivity compensation can be performed uniformly over the entire temperature range.
  • the sensitivity temperature characteristic compensation circuit can have a rough adjustment function and a fine adjustment function.
  • the compensating circuit 6a and the sensitivity temperature characteristic adjusting compensating circuit 6b can be optimally designed respectively. Therefore, it is possible to optimize the circuit constants of the elements forming each of these circuits, improve the adjustment resolution of each circuit, and suppress an increase in circuit area.
  • the bias voltage of the TMR sensor 2 is directly controlled, so sensor sensitivity can be compensated without impairing the detection accuracy.
  • FIG. 8 is a circuit diagram for explaining the function of the offset temperature characteristic compensation circuit 7 in the sensor output compensation IC 1 shown in FIG.
  • the same reference numerals are given to the same or corresponding parts as in FIG. 1, and the description thereof will be omitted.
  • the offset temperature characteristic compensation circuit 7 refers to the ambient temperature detected by the temperature sensor circuit 11 and applies a reference voltage VREF2 to the compensating amplifier circuit 4 to cancel variations in the offset voltage of the sensor output that appear with changes in the ambient temperature. Input to the reference voltage terminal.
  • the temperature variation of the offset voltage of the sensor output is shown in the graph shown in FIG. 9(a).
  • the horizontal axis of the graph represents the ambient temperature [°C] of the sensor output compensating IC1
  • the vertical axis represents the rate of change [%] of the offset voltage at each ambient temperature with reference to the offset voltage at the ambient temperature of 25°C.
  • Each characteristic line indicates temperature characteristics of each offset voltage for the plurality of TMR sensors 2 .
  • the temperature characteristics of each offset voltage linearly fluctuate with a first-order slope.
  • the offset temperature characteristic compensation circuit 7 inputs the reference voltage VREF2 for canceling this variation to the reference voltage terminal, which is the non-inverting input terminal of the operational amplifier 41 in the amplifier circuit 4 for compensation.
  • the offset temperature characteristic compensation circuit 7 includes a first inverting amplifier circuit 72 composed of an operational amplifier 71, a second inverting amplifier circuit 74 composed of an operational amplifier 73, a first switch 75 and a second switch 76. .
  • the first inverting amplifier circuit 72 is configured by connecting a resistor R7 and a variable resistor R8 to an operational amplifier 71, and a non-inverting input terminal of the operational amplifier 71 is supplied with a reference voltage VREF21.
  • the first inverting amplifier circuit 72 inverts and amplifies the ambient temperature detected as a voltage by the temperature sensor circuit 11 with an amplification factor (R8/R7) corresponding to the variation rate of the offset voltage.
  • the variation rate of offset voltage corresponds to the slope of each characteristic line in the graph shown in FIG. .
  • the second inverting amplifier circuit 74 is configured by connecting a resistor R9 and a variable resistor R10 to the operational amplifier 73, and the non-inverting input terminal of the operational amplifier 73 is supplied with the reference voltage VREF22.
  • the second inverting amplifier circuit 74 inverts and amplifies the output of the first inverting amplifier circuit 72 with an amplification factor (R10/R9) to invert its polarity.
  • This amplification factor (R10/R9) is basically set to 1 by adjusting the resistance value of the variable resistor R10.
  • the second switch 76 is controlled to be closed when the variation of the offset voltage with respect to the ambient temperature increases as the ambient temperature increases, and the output of the second inverting amplifier circuit 74 is used as the reference voltage VREF2. 41 is input to the reference voltage terminal.
  • the temperature characteristic of the offset voltage of the sensor output compensating IC1 is represented, for example, by a straight characteristic line p rising to the right in the graph shown in FIG. is output from the temperature sensor circuit 11 as the ambient temperature increases.
  • the inverting amplifier circuit 72 the voltage is converted into a voltage having an upward-sloping characteristic in which the slope is the same as the variation rate of the offset voltage of the characteristic line p and the polarity of the slope is reversed.
  • this voltage is converted by the second inverting amplifier circuit 74 into the reference voltage VREF2 having the downward-sloping characteristic in which the polarity of the slope is reversed.
  • the compensation amplifier circuit 4 amplifies the output voltage including the offset voltage represented by the upward-sloping straight characteristic line p, which is output from the differential amplifier circuit 3, based on the reference voltage VREF2. , the variation due to the temperature characteristics of the offset voltage is cancelled.
  • FIG. 9(b) is a graph showing the temperature characteristics of each offset voltage for the four TMR sensors 2 after being compensated by the offset temperature characteristics compensation circuit 7.
  • FIG. The horizontal and vertical axes of the graph are the same as in FIG. 9(a).
  • the graph shown in FIG. 9(b) shows a characteristic line p before compensation, and the temperature characteristic of the offset voltage of the TMR sensor 2 having this characteristic line p is shown by the dotted line after the above offset compensation.
  • the slope is tilted like an arrow to compensate for the temperature characteristic with a substantially flat slope.
  • the first switch 75 is controlled to be closed when the fluctuation of the offset voltage with respect to the ambient temperature decreases as the ambient temperature increases. 41 is input to the reference voltage terminal. Therefore, the temperature characteristic of the offset voltage of the TMR sensor 2 is represented, for example, by a straight characteristic line q sloping to the right in the graph shown in FIG. When the temperature sensor circuit 11 outputs a voltage that decreases with an increase in the ambient temperature and is represented by a straight characteristic line sloping to the right, the first switch 75 is controlled to be closed.
  • the first inverting amplifier circuit 72 converts the reference voltage VREF2 into a reference voltage VREF2 whose gradient is the same as the fluctuation rate of the offset voltage of the characteristic line q, and whose polarity is inverted and has an upward-sloping characteristic. be done. Therefore, the compensation amplifier circuit 4 amplifies the output voltage including the offset voltage represented by the characteristic line q, which is a straight line downward to the right, output from the differential amplifier circuit 3 with reference to the reference voltage VREF2. , the variation due to the temperature characteristics of the offset voltage is cancelled, as shown in the graph of FIG. 9(b).
  • the second inverting amplifier circuit 74 is switched by the second switch 76.
  • the output is input to the reference voltage terminal of the compensation amplifier circuit 4 . Therefore, at the reference voltage terminal of the operational amplifier 41, the ambient temperature detected as a voltage by the temperature sensor circuit 11 is inverted and amplified by the first inverting amplifier circuit 72 with an amplification factor (R8/R7) corresponding to the fluctuation rate of the offset voltage.
  • the polarity is inverted by the second inverting amplifier circuit 74, and the ambient temperature inverted signal, which decreases at the rate of change of the offset voltage as the ambient temperature increases, is input from the second inverting amplifier circuit 74 as the reference voltage VREF2. be. Therefore, the compensating amplifier circuit 4 amplifies the output of the differential amplifier circuit 3 based on the ambient temperature inversion signal. will be available.
  • the first switch 75 causes the output of the first inverting amplifier circuit 72 to be input to the reference voltage terminal of the operational amplifier 41. . Therefore, the reference voltage terminal of the operational amplifier 41 is inverted and amplified by the amplification factor (R8/R7) corresponding to the fluctuation rate of the offset voltage by the first inverting amplifier circuit 72, and the fluctuation of the offset voltage with the increase in the ambient temperature.
  • An ambient temperature inversion signal that increases at a rate is input from the first inversion amplifier circuit 72 as the reference voltage VREF2.
  • the compensation amplifier circuit 4 amplifies the output of the differential amplifier circuit 3 based on the ambient temperature inversion signal, so that the sensor output in which the fluctuation of the offset voltage that appears due to the change in the ambient temperature is canceled is obtained from the compensation amplifier circuit 4.
  • the offset voltage fluctuation of the sensor output that appears due to changes in the ambient temperature is By amplifying the output of the differential amplifier circuit 3 with reference to the reference voltage VREF2 input from the special compensation circuit 7 to the reference voltage terminal of the operational amplifier 41, it is canceled. Therefore, the offset voltage can be easily compensated for with high accuracy by a single compensating operation. Therefore, unlike the conventional offset adjustment circuit disclosed in Patent Document 1 that adjusts the offset of the sensor output only by adjusting the midpoint potential of the output of the differential amplifier circuit with a variable resistor, the offset voltage of the sensor output temperature compensation can be performed easily and accurately.
  • each circuit constituting the sensor output compensation circuit is mounted on the same IC. Therefore, variations caused by differences in wiring between circuits constituting the sensor output compensating circuit and differences in mounting of parts constituting each circuit are reduced. Therefore, each compensation of the sensor output by the sensor output compensation IC1 is performed with high accuracy. It also allows all of the compensation functions to be implemented on the IC. Further, by monitoring the sensor output of the TMR sensor 2 to be compensated, each compensation can be performed with high accuracy for each TMR sensor 2 with a relatively simple circuit configuration. Further, compensation adjustment of each compensation circuit can be easily and selectively selected by selecting setting data to be written in the EEPROM 12 .
  • the relative position of the temperature sensor circuit 11 with respect to the other circuits is always constant. Therefore, the ambient temperature detected by the temperature sensor circuit 11 has less error from the ambient temperature of each other circuit. Further, when the temperature sensor circuit 11 is provided separately from the ICs of other circuits, the temperature sensor circuit 11 may be There is no error between the detected ambient temperature and the ambient temperature used by the IC. As a result, according to the sensor output compensation IC1 according to the present embodiment, it is possible to perform temperature compensation of sensor sensitivity and offset voltage with high accuracy.

Abstract

La présente invention concerne un circuit de compensation de sortie de capteur qui permet d'effectuer avec une grande précision une compensation de température de sensibilité pour une sortie de capteur qui est uniformément très précise dans toutes les plages de température, et qui permet de réduire la taille et le coût du circuit. Un circuit de compensation de sortie de capteur (1) s'applique, par l'intermédiaire d'un circuit de compensation de réglage brut de caractéristique de température de sensibilité (6a) et d'un circuit de compensation de réglage fin de caractéristique de température de sensibilité (6b) qui sont fournis en tant que circuits de compensation de caractéristique de température de sensibilité, des tensions de polarisation à des bornes de source d'alimentation respectives (2a, 2b) d'un capteur TMR (2) pour annuler une fluctuation se produisant en sensibilité par rapport à un changement de température ambiante. Le circuit de compensation de réglage brut de caractéristique de température de sensibilité (6a) reçoit une entrée d'une température de conversion de tension à partir d'un circuit de capteur de température (11), effectue une amplification par inversion de la température de conversion de tension à un facteur d'amplification (R12/R11) qui correspond à un taux de variation de sensibilité par rapport à la température ambiante pour générer une tension de polarisation (Va), et applique la tension de polarisation (Va) à la borne de source d'alimentation (2a). Le circuit de compensation de réglage fin de caractéristique de température de sensibilité (6b) génère une tension de polarisation de compensation fine pour annuler par la suite une fluctuation subtile de la sensibilité qui demeure après l'annulation par l'action du circuit de compensation de réglage grossier de caractéristique de température de sensibilité (6a), et applique, en tant que tension de polarisation (Vb), la tension de polarisation de compensation fine à l'autre borne de source d'alimentation (2b).
PCT/JP2022/010726 2021-03-31 2022-03-10 Circuit de compensation de sortie de capteur WO2022209720A1 (fr)

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JP2023510805A JPWO2022209720A1 (fr) 2021-03-31 2022-03-10
DE112022000965.9T DE112022000965T5 (de) 2021-03-31 2022-03-10 Sensorausgabekompensationsschaltung
CN202280015905.9A CN116897296A (zh) 2021-03-31 2022-03-10 传感器输出补偿电路
US18/368,175 US20240003992A1 (en) 2021-03-31 2023-09-14 Sensor output compensation circuit

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JP2021063118 2021-04-01

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US4611163A (en) * 1984-03-20 1986-09-09 Lucas Industries Temperature compensated resistance bridge circuit
JPS63202978A (ja) * 1987-02-18 1988-08-22 Fujitsu Ltd 磁気抵抗デバイス
JPH02210272A (ja) * 1989-02-10 1990-08-21 Nippon Soken Inc 電源回路及び前記回路を備えるブリッジ型測定器出力補償回路
JPH02236184A (ja) * 1989-03-09 1990-09-19 Daifuku Co Ltd 磁気センサー
JPH08194040A (ja) * 1995-01-18 1996-07-30 Mitsubishi Electric Corp 磁電変換装置
JPH08233867A (ja) * 1995-02-27 1996-09-13 Nec Home Electron Ltd ブリッジ検出回路
US5686826A (en) * 1996-03-15 1997-11-11 Kulite Semiconductor Products Ambient temperature compensation for semiconductor transducer structures
JP2005337861A (ja) * 2004-05-26 2005-12-08 Denso Corp 磁気検出装置
JP2017227450A (ja) * 2016-06-20 2017-12-28 旭化成エレクトロニクス株式会社 制御回路および電流センサ

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Publication number Priority date Publication date Assignee Title
JPH11194160A (ja) 1997-12-26 1999-07-21 Teikoku Tsushin Kogyo Co Ltd 磁気抵抗素子用増幅回路
JP4320992B2 (ja) 2001-12-20 2009-08-26 株式会社ジェイテクト センサ回路

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4611163A (en) * 1984-03-20 1986-09-09 Lucas Industries Temperature compensated resistance bridge circuit
JPS63202978A (ja) * 1987-02-18 1988-08-22 Fujitsu Ltd 磁気抵抗デバイス
JPH02210272A (ja) * 1989-02-10 1990-08-21 Nippon Soken Inc 電源回路及び前記回路を備えるブリッジ型測定器出力補償回路
JPH02236184A (ja) * 1989-03-09 1990-09-19 Daifuku Co Ltd 磁気センサー
JPH08194040A (ja) * 1995-01-18 1996-07-30 Mitsubishi Electric Corp 磁電変換装置
JPH08233867A (ja) * 1995-02-27 1996-09-13 Nec Home Electron Ltd ブリッジ検出回路
US5686826A (en) * 1996-03-15 1997-11-11 Kulite Semiconductor Products Ambient temperature compensation for semiconductor transducer structures
JP2005337861A (ja) * 2004-05-26 2005-12-08 Denso Corp 磁気検出装置
JP2017227450A (ja) * 2016-06-20 2017-12-28 旭化成エレクトロニクス株式会社 制御回路および電流センサ

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DE112022000965T5 (de) 2023-11-23
US20240003992A1 (en) 2024-01-04

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