WO2022196392A1 - Resin composition for dicing film substrate, dicing film substrate, and dicing film - Google Patents
Resin composition for dicing film substrate, dicing film substrate, and dicing film Download PDFInfo
- Publication number
- WO2022196392A1 WO2022196392A1 PCT/JP2022/009398 JP2022009398W WO2022196392A1 WO 2022196392 A1 WO2022196392 A1 WO 2022196392A1 JP 2022009398 W JP2022009398 W JP 2022009398W WO 2022196392 A1 WO2022196392 A1 WO 2022196392A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- dicing film
- resin composition
- film substrate
- styrene
- unsaturated carboxylic
- Prior art date
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- 239000011342 resin composition Substances 0.000 title claims abstract description 107
- 239000000758 substrate Substances 0.000 title claims abstract description 97
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 claims abstract description 138
- 229920005989 resin Polymers 0.000 claims abstract description 61
- 239000011347 resin Substances 0.000 claims abstract description 61
- 229920001577 copolymer Polymers 0.000 claims abstract description 59
- 229920000554 ionomer Polymers 0.000 claims abstract description 59
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 claims abstract description 58
- 239000005977 Ethylene Substances 0.000 claims abstract description 58
- 239000004952 Polyamide Substances 0.000 claims abstract description 41
- 229920002647 polyamide Polymers 0.000 claims abstract description 41
- 150000001732 carboxylic acid derivatives Chemical class 0.000 claims abstract description 32
- 239000010410 layer Substances 0.000 claims description 53
- 229920001971 elastomer Polymers 0.000 claims description 27
- 239000000806 elastomer Substances 0.000 claims description 23
- 239000012790 adhesive layer Substances 0.000 claims description 17
- 238000006386 neutralization reaction Methods 0.000 claims description 10
- 239000000155 melt Substances 0.000 claims description 7
- 239000000470 constituent Substances 0.000 claims description 4
- -1 primary amine compounds Chemical class 0.000 description 29
- 239000000463 material Substances 0.000 description 26
- 239000002585 base Substances 0.000 description 21
- 238000000034 method Methods 0.000 description 21
- 229920005604 random copolymer Polymers 0.000 description 20
- 239000000853 adhesive Substances 0.000 description 19
- 230000001070 adhesive effect Effects 0.000 description 19
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 18
- 229920000642 polymer Polymers 0.000 description 17
- 238000012360 testing method Methods 0.000 description 17
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 16
- 239000000178 monomer Substances 0.000 description 14
- 239000002253 acid Substances 0.000 description 12
- 229920001400 block copolymer Polymers 0.000 description 12
- 229920006132 styrene block copolymer Polymers 0.000 description 11
- 125000002947 alkylene group Chemical group 0.000 description 8
- 239000002216 antistatic agent Substances 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 7
- 239000000203 mixture Substances 0.000 description 7
- 239000004065 semiconductor Substances 0.000 description 7
- 150000003440 styrenes Chemical class 0.000 description 7
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 6
- 239000000654 additive Substances 0.000 description 6
- 230000000052 comparative effect Effects 0.000 description 6
- 238000005259 measurement Methods 0.000 description 6
- 238000002844 melting Methods 0.000 description 6
- 230000008018 melting Effects 0.000 description 6
- 238000000465 moulding Methods 0.000 description 6
- 229920000346 polystyrene-polyisoprene block-polystyrene Polymers 0.000 description 6
- 229920003048 styrene butadiene rubber Polymers 0.000 description 6
- 239000004793 Polystyrene Substances 0.000 description 5
- OFOBLEOULBTSOW-UHFFFAOYSA-N Propanedioic acid Natural products OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 5
- 150000001733 carboxylic acid esters Chemical class 0.000 description 5
- 229910021645 metal ion Inorganic materials 0.000 description 5
- 229920002223 polystyrene Polymers 0.000 description 5
- VZCYOOQTPOCHFL-UHFFFAOYSA-N trans-butenedioic acid Natural products OC(=O)C=CC(O)=O VZCYOOQTPOCHFL-UHFFFAOYSA-N 0.000 description 5
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 description 4
- NLHHRLWOUZZQLW-UHFFFAOYSA-N Acrylonitrile Chemical compound C=CC#N NLHHRLWOUZZQLW-UHFFFAOYSA-N 0.000 description 4
- VZCYOOQTPOCHFL-OWOJBTEDSA-N Fumaric acid Chemical compound OC(=O)\C=C\C(O)=O VZCYOOQTPOCHFL-OWOJBTEDSA-N 0.000 description 4
- 229920001890 Novodur Polymers 0.000 description 4
- 229920002292 Nylon 6 Polymers 0.000 description 4
- PTFCDOFLOPIGGS-UHFFFAOYSA-N Zinc dication Chemical compound [Zn+2] PTFCDOFLOPIGGS-UHFFFAOYSA-N 0.000 description 4
- 229920000122 acrylonitrile butadiene styrene Polymers 0.000 description 4
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 4
- 150000001875 compounds Chemical class 0.000 description 4
- 239000000945 filler Substances 0.000 description 4
- 239000003999 initiator Substances 0.000 description 4
- FPYJFEHAWHCUMM-UHFFFAOYSA-N maleic anhydride Chemical compound O=C1OC(=O)C=C1 FPYJFEHAWHCUMM-UHFFFAOYSA-N 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 239000005060 rubber Substances 0.000 description 4
- 229920000468 styrene butadiene styrene block copolymer Polymers 0.000 description 4
- 238000011282 treatment Methods 0.000 description 4
- JAHNSTQSQJOJLO-UHFFFAOYSA-N 2-(3-fluorophenyl)-1h-imidazole Chemical compound FC1=CC=CC(C=2NC=CN=2)=C1 JAHNSTQSQJOJLO-UHFFFAOYSA-N 0.000 description 3
- 229920000305 Nylon 6,10 Polymers 0.000 description 3
- 229920000572 Nylon 6/12 Polymers 0.000 description 3
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 3
- FKNQFGJONOIPTF-UHFFFAOYSA-N Sodium cation Chemical compound [Na+] FKNQFGJONOIPTF-UHFFFAOYSA-N 0.000 description 3
- 239000006096 absorbing agent Substances 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 3
- 150000001336 alkenes Chemical class 0.000 description 3
- 125000000217 alkyl group Chemical group 0.000 description 3
- MTAZNLWOLGHBHU-UHFFFAOYSA-N butadiene-styrene rubber Chemical compound C=CC=C.C=CC1=CC=CC=C1 MTAZNLWOLGHBHU-UHFFFAOYSA-N 0.000 description 3
- 125000004432 carbon atom Chemical group C* 0.000 description 3
- 150000001735 carboxylic acids Chemical class 0.000 description 3
- 239000003795 chemical substances by application Substances 0.000 description 3
- 150000004985 diamines Chemical class 0.000 description 3
- 150000002148 esters Chemical group 0.000 description 3
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 3
- 229920001038 ethylene copolymer Polymers 0.000 description 3
- 229920000578 graft copolymer Polymers 0.000 description 3
- VZCYOOQTPOCHFL-UPHRSURJSA-N maleic acid Chemical compound OC(=O)\C=C/C(O)=O VZCYOOQTPOCHFL-UPHRSURJSA-N 0.000 description 3
- 239000011976 maleic acid Substances 0.000 description 3
- 229920003145 methacrylic acid copolymer Polymers 0.000 description 3
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 3
- LVHBHZANLOWSRM-UHFFFAOYSA-N methylenebutanedioic acid Natural products OC(=O)CC(=C)C(O)=O LVHBHZANLOWSRM-UHFFFAOYSA-N 0.000 description 3
- 230000000704 physical effect Effects 0.000 description 3
- 230000009257 reactivity Effects 0.000 description 3
- 229910001415 sodium ion Inorganic materials 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 3
- LIKMAJRDDDTEIG-UHFFFAOYSA-N 1-hexene Chemical compound CCCCC=C LIKMAJRDDDTEIG-UHFFFAOYSA-N 0.000 description 2
- PBLZLIFKVPJDCO-UHFFFAOYSA-N 12-aminododecanoic acid Chemical compound NCCCCCCCCCCCC(O)=O PBLZLIFKVPJDCO-UHFFFAOYSA-N 0.000 description 2
- WROUWQQRXUBECT-UHFFFAOYSA-N 2-ethylacrylic acid Chemical compound CCC(=C)C(O)=O WROUWQQRXUBECT-UHFFFAOYSA-N 0.000 description 2
- OFNISBHGPNMTMS-UHFFFAOYSA-N 3-methylideneoxolane-2,5-dione Chemical compound C=C1CC(=O)OC1=O OFNISBHGPNMTMS-UHFFFAOYSA-N 0.000 description 2
- KAKZBPTYRLMSJV-UHFFFAOYSA-N Butadiene Chemical compound C=CC=C KAKZBPTYRLMSJV-UHFFFAOYSA-N 0.000 description 2
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 description 2
- 239000004971 Cross linker Substances 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- JHWNWJKBPDFINM-UHFFFAOYSA-N Laurolactam Chemical compound O=C1CCCCCCCCCCCN1 JHWNWJKBPDFINM-UHFFFAOYSA-N 0.000 description 2
- JLVVSXFLKOJNIY-UHFFFAOYSA-N Magnesium ion Chemical compound [Mg+2] JLVVSXFLKOJNIY-UHFFFAOYSA-N 0.000 description 2
- 229920000299 Nylon 12 Polymers 0.000 description 2
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- 229920002302 Nylon 6,6 Polymers 0.000 description 2
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- RAHZWNYVWXNFOC-UHFFFAOYSA-N Sulphur dioxide Chemical compound O=S=O RAHZWNYVWXNFOC-UHFFFAOYSA-N 0.000 description 2
- KKEYFWRCBNTPAC-UHFFFAOYSA-N Terephthalic acid Chemical compound OC(=O)C1=CC=C(C(O)=O)C=C1 KKEYFWRCBNTPAC-UHFFFAOYSA-N 0.000 description 2
- 239000004433 Thermoplastic polyurethane Substances 0.000 description 2
- XTXRWKRVRITETP-UHFFFAOYSA-N Vinyl acetate Chemical compound CC(=O)OC=C XTXRWKRVRITETP-UHFFFAOYSA-N 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 2
- 238000000862 absorption spectrum Methods 0.000 description 2
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- WNLRTRBMVRJNCN-UHFFFAOYSA-N adipic acid Chemical compound OC(=O)CCCCC(O)=O WNLRTRBMVRJNCN-UHFFFAOYSA-N 0.000 description 2
- TZYHIGCKINZLPD-UHFFFAOYSA-N azepan-2-one;hexane-1,6-diamine;hexanedioic acid Chemical compound NCCCCCCN.O=C1CCCCCN1.OC(=O)CCCCC(O)=O TZYHIGCKINZLPD-UHFFFAOYSA-N 0.000 description 2
- TZCXTZWJZNENPQ-UHFFFAOYSA-L barium sulfate Chemical compound [Ba+2].[O-]S([O-])(=O)=O TZCXTZWJZNENPQ-UHFFFAOYSA-L 0.000 description 2
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- VHRGRCVQAFMJIZ-UHFFFAOYSA-N cadaverine Chemical compound NCCCCCN VHRGRCVQAFMJIZ-UHFFFAOYSA-N 0.000 description 2
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- ZMUCVNSKULGPQG-UHFFFAOYSA-N dodecanedioic acid;hexane-1,6-diamine Chemical compound NCCCCCCN.OC(=O)CCCCCCCCCCC(O)=O ZMUCVNSKULGPQG-UHFFFAOYSA-N 0.000 description 2
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- NAQMVNRVTILPCV-UHFFFAOYSA-N hexane-1,6-diamine Chemical compound NCCCCCCN NAQMVNRVTILPCV-UHFFFAOYSA-N 0.000 description 2
- 229920001519 homopolymer Polymers 0.000 description 2
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 2
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- UYEDESPZQLZMCL-UHFFFAOYSA-N 1,2-dimethylthioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=C(C)C(C)=CC=C3SC2=C1 UYEDESPZQLZMCL-UHFFFAOYSA-N 0.000 description 1
- MSAHTMIQULFMRG-UHFFFAOYSA-N 1,2-diphenyl-2-propan-2-yloxyethanone Chemical compound C=1C=CC=CC=1C(OC(C)C)C(=O)C1=CC=CC=C1 MSAHTMIQULFMRG-UHFFFAOYSA-N 0.000 description 1
- PXGZQGDTEZPERC-UHFFFAOYSA-N 1,4-cyclohexanedicarboxylic acid Chemical compound OC(=O)C1CCC(C(O)=O)CC1 PXGZQGDTEZPERC-UHFFFAOYSA-N 0.000 description 1
- DKEGCUDAFWNSSO-UHFFFAOYSA-N 1,8-dibromooctane Chemical compound BrCCCCCCCCBr DKEGCUDAFWNSSO-UHFFFAOYSA-N 0.000 description 1
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- 239000007983 Tris buffer Substances 0.000 description 1
- 229920001807 Urea-formaldehyde Polymers 0.000 description 1
- BZHJMEDXRYGGRV-UHFFFAOYSA-N Vinyl chloride Chemical compound ClC=C BZHJMEDXRYGGRV-UHFFFAOYSA-N 0.000 description 1
- FDLQZKYLHJJBHD-UHFFFAOYSA-N [3-(aminomethyl)phenyl]methanamine Chemical compound NCC1=CC=CC(CN)=C1 FDLQZKYLHJJBHD-UHFFFAOYSA-N 0.000 description 1
- 150000008065 acid anhydrides Chemical class 0.000 description 1
- 150000001252 acrylic acid derivatives Chemical class 0.000 description 1
- 239000001361 adipic acid Substances 0.000 description 1
- 235000011037 adipic acid Nutrition 0.000 description 1
- 229910052783 alkali metal Inorganic materials 0.000 description 1
- 150000001340 alkali metals Chemical class 0.000 description 1
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 1
- 150000001342 alkaline earth metals Chemical class 0.000 description 1
- 125000005907 alkyl ester group Chemical group 0.000 description 1
- 229940045714 alkyl sulfonate alkylating agent Drugs 0.000 description 1
- 150000008052 alkyl sulfonates Chemical class 0.000 description 1
- XYLMUPLGERFSHI-UHFFFAOYSA-N alpha-Methylstyrene Chemical compound CC(=C)C1=CC=CC=C1 XYLMUPLGERFSHI-UHFFFAOYSA-N 0.000 description 1
- 125000003368 amide group Chemical group 0.000 description 1
- 150000001408 amides Chemical class 0.000 description 1
- 150000001412 amines Chemical class 0.000 description 1
- 229960002684 aminocaproic acid Drugs 0.000 description 1
- 150000003863 ammonium salts Chemical class 0.000 description 1
- 239000003242 anti bacterial agent Substances 0.000 description 1
- 230000003712 anti-aging effect Effects 0.000 description 1
- 239000003429 antifungal agent Substances 0.000 description 1
- 229940121375 antifungal agent Drugs 0.000 description 1
- 239000003963 antioxidant agent Substances 0.000 description 1
- 150000008365 aromatic ketones Chemical class 0.000 description 1
- 125000003118 aryl group Chemical group 0.000 description 1
- 239000011324 bead Substances 0.000 description 1
- WPYMKLBDIGXBTP-UHFFFAOYSA-N benzoic acid Chemical compound OC(=O)C1=CC=CC=C1 WPYMKLBDIGXBTP-UHFFFAOYSA-N 0.000 description 1
- 229960002130 benzoin Drugs 0.000 description 1
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 1
- 239000012965 benzophenone Substances 0.000 description 1
- QRUDEWIWKLJBPS-UHFFFAOYSA-N benzotriazole Chemical compound C1=CC=C2N[N][N]C2=C1 QRUDEWIWKLJBPS-UHFFFAOYSA-N 0.000 description 1
- 239000012964 benzotriazole Substances 0.000 description 1
- 229960003237 betaine Drugs 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- FACXGONDLDSNOE-UHFFFAOYSA-N buta-1,3-diene;styrene Chemical compound C=CC=C.C=CC1=CC=CC=C1.C=CC1=CC=CC=C1 FACXGONDLDSNOE-UHFFFAOYSA-N 0.000 description 1
- IAQRGUVFOMOMEM-UHFFFAOYSA-N butene Natural products CC=CC IAQRGUVFOMOMEM-UHFFFAOYSA-N 0.000 description 1
- JHIWVOJDXOSYLW-UHFFFAOYSA-N butyl 2,2-difluorocyclopropane-1-carboxylate Chemical compound CCCCOC(=O)C1CC1(F)F JHIWVOJDXOSYLW-UHFFFAOYSA-N 0.000 description 1
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 229910052792 caesium Inorganic materials 0.000 description 1
- 229910000019 calcium carbonate Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000004927 clay Substances 0.000 description 1
- 229910052570 clay Inorganic materials 0.000 description 1
- 238000004581 coalescence Methods 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 238000003851 corona treatment Methods 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- YQLZOAVZWJBZSY-UHFFFAOYSA-N decane-1,10-diamine Chemical compound NCCCCCCCCCCN YQLZOAVZWJBZSY-UHFFFAOYSA-N 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- ISAOCJYIOMOJEB-UHFFFAOYSA-N desyl alcohol Natural products C=1C=CC=CC=1C(O)C(=O)C1=CC=CC=C1 ISAOCJYIOMOJEB-UHFFFAOYSA-N 0.000 description 1
- 150000001991 dicarboxylic acids Chemical class 0.000 description 1
- 238000004512 die casting Methods 0.000 description 1
- LDCRTTXIJACKKU-ARJAWSKDSA-N dimethyl maleate Chemical compound COC(=O)\C=C/C(=O)OC LDCRTTXIJACKKU-ARJAWSKDSA-N 0.000 description 1
- 239000000975 dye Substances 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- HSOOVEKLGOIEFF-UHFFFAOYSA-N ethenyl nitrate Chemical compound [O-][N+](=O)OC=C HSOOVEKLGOIEFF-UHFFFAOYSA-N 0.000 description 1
- UIWXSTHGICQLQT-UHFFFAOYSA-N ethenyl propanoate Chemical compound CCC(=O)OC=C UIWXSTHGICQLQT-UHFFFAOYSA-N 0.000 description 1
- VEWLDLAARDMXSB-UHFFFAOYSA-N ethenyl sulfate;hydron Chemical compound OS(=O)(=O)OC=C VEWLDLAARDMXSB-UHFFFAOYSA-N 0.000 description 1
- 229920005648 ethylene methacrylic acid copolymer Polymers 0.000 description 1
- 229920005674 ethylene-propylene random copolymer Polymers 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000007765 extrusion coating Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- XUCNUKMRBVNAPB-UHFFFAOYSA-N fluoroethene Chemical class FC=C XUCNUKMRBVNAPB-UHFFFAOYSA-N 0.000 description 1
- 239000004088 foaming agent Substances 0.000 description 1
- XLYMOEINVGRTEX-UHFFFAOYSA-N fumaric acid monoethyl ester Natural products CCOC(=O)C=CC(O)=O XLYMOEINVGRTEX-UHFFFAOYSA-N 0.000 description 1
- NKHAVTQWNUWKEO-UHFFFAOYSA-N fumaric acid monomethyl ester Natural products COC(=O)C=CC(O)=O NKHAVTQWNUWKEO-UHFFFAOYSA-N 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000010559 graft polymerization reaction Methods 0.000 description 1
- 235000019382 gum benzoic Nutrition 0.000 description 1
- 150000004820 halides Chemical class 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 239000012760 heat stabilizer Substances 0.000 description 1
- XXMIOPMDWAUFGU-UHFFFAOYSA-N hexane-1,6-diol Chemical compound OCCCCCCO XXMIOPMDWAUFGU-UHFFFAOYSA-N 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 238000004898 kneading Methods 0.000 description 1
- 239000004611 light stabiliser Substances 0.000 description 1
- 229910001416 lithium ion Inorganic materials 0.000 description 1
- 239000000314 lubricant Substances 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 229910001437 manganese ion Inorganic materials 0.000 description 1
- XMYQHJDBLRZMLW-UHFFFAOYSA-N methanolamine Chemical compound NCO XMYQHJDBLRZMLW-UHFFFAOYSA-N 0.000 description 1
- NKHAVTQWNUWKEO-IHWYPQMZSA-N methyl hydrogen fumarate Chemical compound COC(=O)\C=C/C(O)=O NKHAVTQWNUWKEO-IHWYPQMZSA-N 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- SLCVBVWXLSEKPL-UHFFFAOYSA-N neopentyl glycol Chemical compound OCC(C)(C)CO SLCVBVWXLSEKPL-UHFFFAOYSA-N 0.000 description 1
- 230000003472 neutralizing effect Effects 0.000 description 1
- 125000002347 octyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 235000006408 oxalic acid Nutrition 0.000 description 1
- WXZMFSXDPGVJKK-UHFFFAOYSA-N pentaerythritol Chemical compound OCC(CO)(CO)CO WXZMFSXDPGVJKK-UHFFFAOYSA-N 0.000 description 1
- YWAKXRMUMFPDSH-UHFFFAOYSA-N pentene Chemical compound CCCC=C YWAKXRMUMFPDSH-UHFFFAOYSA-N 0.000 description 1
- 239000000049 pigment Substances 0.000 description 1
- PMJHHCWVYXUKFD-UHFFFAOYSA-N piperylene Natural products CC=CC=C PMJHHCWVYXUKFD-UHFFFAOYSA-N 0.000 description 1
- 229920006111 poly(hexamethylene terephthalamide) Polymers 0.000 description 1
- 229920000768 polyamine Polymers 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920006146 polyetheresteramide block copolymer Polymers 0.000 description 1
- 229920001223 polyethylene glycol Polymers 0.000 description 1
- 229920000139 polyethylene terephthalate Polymers 0.000 description 1
- 239000005020 polyethylene terephthalate Substances 0.000 description 1
- 229920001228 polyisocyanate Polymers 0.000 description 1
- 239000005056 polyisocyanate Substances 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 229920005996 polystyrene-poly(ethylene-butylene)-polystyrene Polymers 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 229920001289 polyvinyl ether Polymers 0.000 description 1
- 229910001414 potassium ion Inorganic materials 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- QQONPFPTGQHPMA-UHFFFAOYSA-N propylene Natural products CC=C QQONPFPTGQHPMA-UHFFFAOYSA-N 0.000 description 1
- 125000004805 propylene group Chemical group [H]C([H])([H])C([H])([*:1])C([H])([H])[*:2] 0.000 description 1
- 230000002787 reinforcement Effects 0.000 description 1
- 238000007142 ring opening reaction Methods 0.000 description 1
- 229910001419 rubidium ion Inorganic materials 0.000 description 1
- 125000002914 sec-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 239000011115 styrene butadiene Substances 0.000 description 1
- 150000005846 sugar alcohols Polymers 0.000 description 1
- 150000003871 sulfonates Chemical class 0.000 description 1
- 238000010557 suspension polymerization reaction Methods 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
- 239000000454 talc Substances 0.000 description 1
- 229910052623 talc Inorganic materials 0.000 description 1
- UWHCKJMYHZGTIT-UHFFFAOYSA-N tetraethylene glycol Chemical compound OCCOCCOCCOCCO UWHCKJMYHZGTIT-UHFFFAOYSA-N 0.000 description 1
- 229920006163 vinyl copolymer Polymers 0.000 description 1
- 239000004711 α-olefin Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L23/00—Compositions of homopolymers or copolymers of unsaturated aliphatic hydrocarbons having only one carbon-to-carbon double bond; Compositions of derivatives of such polymers
- C08L23/02—Compositions of homopolymers or copolymers of unsaturated aliphatic hydrocarbons having only one carbon-to-carbon double bond; Compositions of derivatives of such polymers not modified by chemical after-treatment
- C08L23/04—Homopolymers or copolymers of ethene
- C08L23/08—Copolymers of ethene
- C08L23/0846—Copolymers of ethene with unsaturated hydrocarbons containing other atoms than carbon or hydrogen atoms
- C08L23/0869—Acids or derivatives thereof
- C08L23/0876—Neutralised polymers, i.e. ionomers
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L23/00—Compositions of homopolymers or copolymers of unsaturated aliphatic hydrocarbons having only one carbon-to-carbon double bond; Compositions of derivatives of such polymers
- C08L23/02—Compositions of homopolymers or copolymers of unsaturated aliphatic hydrocarbons having only one carbon-to-carbon double bond; Compositions of derivatives of such polymers not modified by chemical after-treatment
- C08L23/04—Homopolymers or copolymers of ethene
- C08L23/08—Copolymers of ethene
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L25/00—Compositions of, homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an aromatic carbocyclic ring; Compositions of derivatives of such polymers
- C08L25/02—Homopolymers or copolymers of hydrocarbons
- C08L25/04—Homopolymers or copolymers of styrene
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L53/00—Compositions of block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bonds; Compositions of derivatives of such polymers
- C08L53/02—Compositions of block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bonds; Compositions of derivatives of such polymers of vinyl-aromatic monomers and conjugated dienes
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L77/00—Compositions of polyamides obtained by reactions forming a carboxylic amide link in the main chain; Compositions of derivatives of such polymers
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J123/00—Adhesives based on homopolymers or copolymers of unsaturated aliphatic hydrocarbons having only one carbon-to-carbon double bond; Adhesives based on derivatives of such polymers
- C09J123/02—Adhesives based on homopolymers or copolymers of unsaturated aliphatic hydrocarbons having only one carbon-to-carbon double bond; Adhesives based on derivatives of such polymers not modified by chemical after-treatment
- C09J123/04—Homopolymers or copolymers of ethene
- C09J123/08—Copolymers of ethene
- C09J123/0846—Copolymers of ethene with unsaturated hydrocarbons containing other atoms than carbon or hydrogen atoms
- C09J123/0869—Acids or derivatives thereof
- C09J123/0876—Neutralised polymers, i.e. ionomers
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/30—Adhesives in the form of films or foils characterised by the adhesive composition
- C09J7/38—Pressure-sensitive adhesives [PSA]
- C09J7/381—Pressure-sensitive adhesives [PSA] based on macromolecular compounds obtained by reactions involving only carbon-to-carbon unsaturated bonds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
Definitions
- the present invention relates to a resin composition for a dicing film substrate, a dicing film substrate, and a dicing film.
- Patent Literature 1 describes a radiation-curable adhesive tape for wafer processing containing an antistatic resin containing a polyether component and the ionomer.
- Patent Document 2 describes a resin composition for a dicing film substrate containing the ionomer, ethylene, (meth)acrylic acid, and a copolymer of (meth)acrylic acid alkyl ester.
- the dicing film around the chips stretches sufficiently (hereinafter also referred to as "normal temperature elongation"). If the dicing film is not stretched sufficiently and a plurality of chips are pushed up by the fine pins, a phenomenon may occur in which chips that are not to be picked up are separated from the dicing film. In addition, if the dicing film has low elongation at room temperature, stress may be applied to the chip during the pick-up process, which may cause breakage within the chip. When these problems occur, the product yield decreases and product defects increase.
- a resin composition containing an ionomer (A), a polyamide (B), and a styrenic resin (C) has good compatibility, and the characteristics of each material can be improved without reducing the homogeneity. It is possible to maintain Each component contained in the resin composition will be described below, and then the physical properties of the resin composition will be described.
- the ionomer (A) of the ethylene/unsaturated carboxylic acid copolymer (hereinafter also simply referred to as "ionomer (A)" is an ethylene/unsaturated carboxylic acid copolymer in which part or all of the acid is a metal ion and has a structure in which a plurality of ethylene-unsaturated carboxylic acid copolymers are crosslinked.
- the resin composition may contain only one ionomer (A), or may contain two or more kinds of ionomers (A). You can stay.
- the ethylene/unsaturated carboxylic acid-based copolymer may be a block copolymer or a random copolymer.
- the ethylene/unsaturated carboxylic acid-based copolymer may also be a graft copolymer obtained by graft-polymerizing a known compound to a random polymer or block polymer.
- unsaturated carboxylic acid esters include unsaturated carboxylic acid alkyl esters having an alkyl group having 1 to 12 carbon atoms in the ester moiety. The number of carbon atoms in the alkyl group is more preferably 1-8, more preferably 1-4.
- alkyl groups include methyl, ethyl, n-propyl, isopropyl, n-butyl, isobutyl, sec-butyl, 2-ethylhexyl, isooctyl groups and the like.
- ethylene/unsaturated carboxylic acid copolymer examples include binary copolymers such as ethylene/acrylic acid copolymer and ethylene/methacrylic acid copolymer; ethylene/methacrylic acid/acrylic acid Terpolymers such as n-butyl copolymers and ethylene/methacrylic acid/isobutyl acrylate copolymers;
- the ionomer (A) of the present invention is obtained by cross-linking (neutralizing) the carboxyl groups contained in the ethylene/unsaturated carboxylic acid copolymer with metal ions at an arbitrary ratio.
- the amount of structural units derived from other monomers is preferably 1% by mass or more and 20% by mass or less, more preferably 5% by mass or more and 15% by mass or less, relative to all the structural units of the unsaturated carboxylic acid-based copolymer.
- the amount of structural units derived from other monomers is 1% by mass or more, elongation when the resin composition is used as a base material for a dicing film tends to be good.
- the amount of structural units derived from other monomers is 20% by mass or less
- the base material is difficult to block, and fusion and the like are also likely to occur. Hard to come by.
- the content of the ionomer (A) in the resin composition is 30 parts by mass with respect to a total of 100 parts by mass of the ionomer (A), the polyamide (B) described later, and the styrene resin (C) described later.
- 95 mass parts or less is preferable, 40 mass parts or more and 90 mass parts or less are preferable, and 45 mass parts or more and 90 mass parts or less are more preferable.
- the amount of the ionomer (A) is 30 parts by mass or more, the elongation at room temperature and the elongation at low temperature of the substrate obtained from the resin composition are improved.
- the amount of the ionomer (A) is 95 parts by mass or less, the amounts of the polyamide (B) and the styrene resin (C) are relatively large enough, and the substrate obtained from the resin composition And the modulus strength at low temperature and the elongation at normal temperature and low temperature are improved.
- Polyamide (B) may be a resin containing two or more amide groups.
- the ionomer (A) described above tends to have a low melting point and low heat resistance. The heat resistance of the substrate for the dicing film becomes very good. Further, when the ionomer (A) and the polyamide (B) are combined, good modulus strength and severability can be obtained when the resin composition is used as a base material for a dicing film.
- the melting point of the polyamide (B) is preferably 160°C or higher and 250°C or lower, more preferably 170°C or higher and 240°C or lower, and even more preferably 180°C or higher and 235°C or lower.
- the melting point of the polyamide (B) is measured, for example, by a differential scanning calorimeter (DSC) or the like.
- styrene-based elastomers examples include block copolymers containing a hard segment composed of a styrene block (styrene polymer) and a soft segment composed of an alkylene block, or hydrogenated products thereof; random copolymers of styrene and alkylene; A polymer or a hydrogenated product thereof; or an acid-modified styrene-based elastomer obtained by acid-modifying the styrene-based elastomer.
- styrene-based elastomers include block copolymers containing a hard segment composed of a styrene block (styrene polymer) and a soft segment composed of an alkylene block, or hydrogenated products thereof; random copolymers of styrene and alkylene; A polymer or a hydrogenated product thereof; or an acid-modified styrene-based elastomer obtained by acid-modifying the st
- examples of styrene-based elastomers include random copolymers of styrene and alkylene. Examples include styrene-butadiene random copolymers, styrene-isoprene random copolymers, styrene-ethylene-butylene random copolymers, styrene-ethylene-propylene random copolymers, styrene-isobutylene random copolymers, styrene - including ethylene-isoprene random copolymers.
- the acid-modified styrene-based elastomer can be obtained by graft-polymerizing the block copolymer, random copolymer, or the like with an unsaturated carboxylic acid or a derivative thereof in the presence of a radical initiator.
- a radical initiator Any known radical initiator can be used as long as it is used for the graft reaction of polyolefins.
- UV absorbers examples include benzophenone-based, benzoate-based, benzotriazole-based, cyanoacrylate-based, hindered amine-based, and the like.
- additives are appropriately selected according to their type.
- the melt flow rate of the resin composition measured at 230°C and a load of 2160 g is 0.1 g/10 min or more and 30 g/10 min or less. is preferred, 0.2 g/10 min or more and 15 g/10 min or less is more preferred, 0.5 g/10 min or more and 10 g/10 min or less is even more preferred, and 1.0 g/10 min or more and 7 g/10 min or less is even more preferred.
- the melt flow rate of the resin composition is within this range, the modulus strength at room temperature and low temperature and the elongation at room temperature and low temperature of the substrate obtained from the resin composition tend to be good.
- the average value of the 25% modulus in the MD direction (machine direction) and the 25% modulus in the TD direction (transverse direction) measured at 23°C of the layer containing the resin composition is preferably 7 MPa or more and 13 MPa or less, and 8 MPa or more and 12 MPa. The following are more preferred.
- the dicing film substrate tends to have good elongation at room temperature.
- the above 25% modulus is obtained by preparing a film having a thickness of 100 ⁇ m, a length in the TD direction of 10 mm, and a length in the MD direction of 180 mm, which has the same composition as the layer containing the resin composition. -3: Equivalent to 1995), and is a value measured by a Shimadzu desk-top precision universal testing machine AG-X, which is a measuring device.
- the test speed shall be 300 mm/min.
- ethylene/unsaturated carboxylic acid/unsaturated carboxylic acid alkyl ester terpolymer or its ionomer ethylene/unsaturated carboxylic acid alkyl ester copolymer, ethylene/vinyl ester copolymer, ethylene/unsaturated carboxylic acid alkyl ester Layers containing ester-carbon monoxide copolymers, unsaturated carboxylic acid grafts thereof, polyvinyl chloride and the like are included.
- the other resin layer may contain only one type of the above resin, or may contain two or more types thereof.
- the thickness of the other resin layer is not particularly limited, it is preferably 10 ⁇ m or more and 100 ⁇ m or less, more preferably 15 ⁇ m or more and 80 ⁇ m or less, from the viewpoint of not impairing the modulus strength and elongation of the layer containing the resin composition.
- the thickness of the entire dicing film substrate is preferably 50 ⁇ m or more from the viewpoint of frame retention during dicing, and 200 ⁇ m or less from the viewpoint of extensibility (expandability), considering that it is used as a constituent member of the dicing film.
- the dicing film substrate is a laminate of a layer containing the above resin composition and another resin layer
- either one of the layer containing the above resin composition and the other resin layer is Alternatively, one layer may be formed first, and the other layer may be formed on the one layer by using a T-die film forming machine, an extrusion coating forming machine, or the like, and laminated.
- the dicing film of the present invention only needs to comprise the above-described dicing film substrate and an adhesive layer laminated on at least one surface thereof, and may contain other configurations as necessary. .
- the dicing film substrate is composed of multiple layers, it is preferable that the layer containing the resin composition in the dicing film substrate and the adhesive layer are laminated.
- the adhesive that constitutes the adhesive layer can be the adhesive for the adhesive layer of a general dicing film.
- adhesives include rubber-based, acrylic-based, silicone-based, and polyvinyl ether-based adhesives; radiation-curable adhesives; heat-foaming adhesives, and the like.
- the adhesive layer preferably contains a radiation-curable adhesive, and more preferably contains an ultraviolet-curable adhesive.
- UV-curable adhesives usually contain a radically polymerizable compound (which may be a monomer, an oligomer, or a polymer) and a photopolymerization initiator, and optionally a crosslinking agent, a tackifier, and a filler. agents, anti-aging agents, and additives such as coloring agents.
- radically polymerizable compounds include methyl (meth)acrylate, ethyl (meth)acrylate, butyl (meth)acrylate, 2-ethylhexyl (meth)acrylate, octyl (meth)acrylate, (meth)acrylic Monomers or oligomers of (meth)acrylic acid alkyl esters such as isononyl acid; (meth)acrylate hydroxyalkyl esters such as hydroxyethyl (meth)acrylate, hydroxybutyl (meth)acrylate, and hydroxyhexyl (meth)acrylate Monomers or oligomers; the above (meth)acrylic acid alkyl esters and/or (meth)acrylic acid hydroxyalkyl esters and other monomers such as (meth)acrylic acid, itaconic acid, maleic anhydride, (meth)acrylic acid amide, (meth)acrylic acid N-hydroxymethylamide, (meth)acrylic acid alkyl
- cross-linking agents examples include polyisocyanate compounds, melamine resins, urea resins, polyamines, and carboxyl group-containing polymers.
- the thickness of the adhesive layer is appropriately selected according to the type of adhesive, preferably 3 to 100 ⁇ m, more preferably 3 to 50 ⁇ m.
- the adhesive layer of the dicing film may be protected by a separator.
- the surface of the adhesive layer can be kept smooth.
- the dicing film can be easily handled and transported, and a label can be processed on the separator. The separator is peeled off when using the dicing film.
- the method for producing the dicing film is not particularly limited, and for example, it may be produced by applying an adhesive to the above-mentioned dicing base material by a known method.
- the adhesive can be applied by a gravure roll coater, a reverse roll coater, a kiss roll coater, a dip roll coater, a bar coater, a knife coater, a spray coater, or the like.
- an adhesive layer may be formed by applying an adhesive onto a release sheet, and the adhesive layer may be transferred to the dicing film substrate to laminate the dicing film substrate and the adhesive layer.
- the dicing film base material and the adhesive layer may be formed at the same time by co-extrusion or the like.
- Styrene resin 1 SEBS (styrene-ethylene-butylene-styrene block copolymer (manufactured by Asahi Kasei Chemicals, SOE S1611 (trade name), JIS K 7210: 1999 (equivalent to ISO 1133: 1997) , MFR measured at 230 ° C., 2160 g load: 12.0 g / 10 minutes, Tan ⁇ peak temperature: 9 ° C.)
- Styrene resin 2 HSBR (hydrogenated styrene-butadiene random copolymer (manufactured by JSR, DYNARON 1320P (trade name), JIS K 7210: 1999 (equivalent to ISO 1133: 1997), 230 ° C.
- Styrene resin 3 SEBS (styrene-ethylene-butylene-styrene block copolymer (manufactured by Asahi Kasei Chemicals, Tuftec H1041 (trade name), JIS K 7210: 1999 (equivalent to ISO 1133: 1997), 230 ° C., MFR measured at 2160 g load: 5.0 g/10 min, Tan ⁇ peak temperature: -45 ° C.)
- Styrene resin 4 acid-modified SEBS (maleic anhydride-modified styrene-ethylene-butylene-styrene block copolymer (manufactured by Asahi Kasei Chemicals, Tuftec M1913 (trade name), acid value: 10 mg CH 3 ONa/g, JIS K 7210 : 1999 (equivalent to ISO 1133:1997), MFR
- EMAA ethylene/methacrylic acid copolymer (content of structural units derived from ethylene: 91% by mass, content of structural units derived from methacrylic acid: 9% by mass, JIS K 7210: 1999 (ISO 1133: 1997), MFR measured at 190 ° C., 2160 g load: 3 g / 10 minutes)
- TPU Thermoplastic polyurethane elastomer (manufactured by Tosoh Corporation, Miractran P485RSUI (trade name))
- Example 1 An ethylene/unsaturated carboxylic acid copolymer ionomer (A), a polyamide (B), and a styrene resin (C) were dry-blended at the ratios (mass ratios) shown in Table 1.
- the dry-blended mixture was put into the resin inlet of a 30 mm ⁇ twin-screw extruder and melt-kneaded at a die temperature of 230° C. to obtain a resin composition for a dicing film substrate.
- the obtained resin composition for a dicing film substrate was measured for MFR at 230° C. (190° C. only in Comparative Example 1) under a load of 2160 g in accordance with JIS K 7210:1999 (corresponding to ISO 1133:1997). Table 1 shows the results.
- the obtained resin composition for a dicing film substrate was molded at a processing temperature of 230° C. using a 40 mm ⁇ T die film molding machine to prepare a T die film having a thickness of 100 ⁇ m.
- the resulting T-die film was used as a dicing film substrate and evaluated by the following methods. Table 1 shows the results.
- the 25% modulus in the MD direction and the 25% modulus in the TD direction obtained by the above tests were averaged, and the room temperature modulus strength of the dicing film substrate was evaluated according to the following criteria.
- the dicing film substrate was cut into strips of 10 mm width ⁇ 180 mm length.
- JIS K 7127: 1999 (equivalent to ISO 527-3: 1995)
- the 10% modulus was measured at -15°C.
- the chuck-to-chuck distance was 100 mm, and the test speed was 500 mm/min.
- the 10% modulus in the MD direction and the 10% modulus in the TD direction obtained by the above tests were averaged, and the low-temperature modulus strength of the dicing film substrate was evaluated according to the following criteria.
- the room-temperature elongation of the dicing film substrate was evaluated according to the following criteria.
- the low-temperature elongation of the dicing film substrate was evaluated according to the following criteria.
- the dicing film substrate using the resin composition for material was excellent in room-temperature modulus strength, low-temperature modulus strength, room-temperature elongation, and low-temperature elongation.
- Comparative Example 1 which does not contain polyamide (B) and styrene-based resin (C)
- Comparative Example 2 which did not contain polyamide (B)
- the low-temperature modulus strength was low.
- Comparative Example 3 which does not contain the styrene-based resin (C)
- both room-temperature elongation and low-temperature elongation were low.
- Comparative Examples 4 to 7 which did not contain the ionomer (A) of the ethylene/unsaturated carboxylic acid copolymer, both the normal temperature elongation and the low temperature elongation were low.
- the resin composition for a dicing film substrate of the present invention can realize a dicing film substrate excellent in room-temperature modulus strength, low-temperature modulus strength, room-temperature elongation, and low-temperature elongation. .
- a dicing film substrate having excellent elongation at room temperature and low temperature and also excellent modulus strength at room temperature and low temperature is realized. Therefore, it is very useful in the field of manufacturing semiconductor devices.
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Abstract
Description
[1]エチレン・不飽和カルボン酸系共重合体のアイオノマー(A)と、ポリアミド(B)と、スチレン系樹脂(C)と、を含むダイシングフィルム基材用樹脂組成物。 That is, the present invention provides the following resin composition for dicing film substrates.
[1] A resin composition for a dicing film substrate comprising an ethylene/unsaturated carboxylic acid-based copolymer ionomer (A), a polyamide (B), and a styrene-based resin (C).
[5]前記スチレン系樹脂(C)がスチレン系エラストマーである、[1]~[4]のいずれかに記載のダイシングフィルム基材用樹脂組成物。 [4] The dicing film base according to any one of [1] to [3], wherein the ionomer (A) of the ethylene/unsaturated carboxylic acid copolymer has a degree of neutralization of 10% or more and 90% or less. Resin composition for lumber.
[5] The resin composition for a dicing film substrate according to any one of [1] to [4], wherein the styrene resin (C) is a styrene elastomer.
[7]前記エチレン・不飽和カルボン酸系共重合体のアイオノマー(A)の含有量が、前記ポリアミド(B)の含有量および前記スチレン系樹脂(C)の含有量の合計量以上である、[1]~[6]のいずれかに記載のダイシングフィルム基材用樹脂組成物。
[8]JIS K 7210:1999に準拠して、230℃、荷重2160gにて測定されるメルトフローレートが、0.1g/10分以上30g/10分以下である、[1]~[7]のいずれかに記載のダイシングフィルム基材用樹脂組成物。 [6] The resin composition for a dicing film substrate according to any one of [1] to [5], wherein the content of the styrene resin (C) is 1% by mass or more and 40% by mass or less.
[7] The content of the ionomer (A) in the ethylene/unsaturated carboxylic acid copolymer is equal to or greater than the total content of the polyamide (B) and the styrene resin (C). The resin composition for a dicing film substrate according to any one of [1] to [6].
[8] According to JIS K 7210: 1999, the melt flow rate measured at 230 ° C. and a load of 2160 g is 0.1 g / 10 minutes or more and 30 g / 10 minutes or less, [1] to [7] The resin composition for a dicing film substrate according to any one of .
[9]上記[1]~[8]のいずれかに記載のダイシングフィルム基材用樹脂組成物を含む層を、少なくとも一層含む、ダイシングフィルム基材。
[10]前記ダイシングフィルム基材用樹脂組成物を含む層の、JIS K 7127:1999に準拠して23℃で測定したMD方向の25%モジュラスおよびTD方向の25%モジュラスの平均値が、7MPa以上13MPa以下である、[9]に記載のダイシングフィルム基材。
[11]前記ダイシングフィルム基材用樹脂組成物を含む層の、JIS K 7127:1999に準拠して-15℃で測定したMD方向の10%モジュラスおよびTD方向の10%モジュラスの平均値が、15MPa以上30MPa以下である、[9]または[10]に記載のダイシングフィルム基材。
[12]上記[11]に記載のダイシングフィルム基材と、前記ダイシングフィルム基材の少なくとも一方の面に積層された粘着層と、を有する、ダイシングフィルム。 The present invention provides the following dicing film substrate and dicing film.
[9] A dicing film substrate comprising at least one layer containing the resin composition for a dicing film substrate according to any one of [1] to [8] above.
[10] The average value of the 25% modulus in the MD direction and the 25% modulus in the TD direction measured at 23°C in accordance with JIS K 7127: 1999 of the layer containing the resin composition for a dicing film substrate is 7 MPa. The dicing film base material according to [9], which is 13 MPa or less.
[11] The average value of the 10% modulus in the MD direction and the 10% modulus in the TD direction measured at −15° C. in accordance with JIS K 7127:1999 of the layer containing the resin composition for a dicing film substrate is The dicing film substrate according to [9] or [10], which is 15 MPa or more and 30 MPa or less.
[12] A dicing film comprising the dicing film substrate of [11] above and an adhesive layer laminated on at least one surface of the dicing film substrate.
本発明のダイシングフィルム基材用樹脂組成物(以下、単に「樹脂組成物」とも称する)は、主にダイシングフィルムの基材に使用されるが、当該樹脂組成物の用途は、ダイシングフィルムの基材に限定されない。 1. Dicing film substrate resin composition The resin composition for a dicing film substrate of the present invention (hereinafter also simply referred to as "resin composition") is mainly used as a substrate for a dicing film. The use of the product is not limited to the substrate of the dicing film.
エチレン・不飽和カルボン酸系共重合体のアイオノマー(A)(以下、単に「アイオノマー(A)とも称する」は、エチレン・不飽和カルボン酸共重合体が有する酸の一部、または全てが金属イオンで中和されたものであり、複数のエチレン・不飽和カルボン酸共重合体が架橋した構造を有する。樹脂組成物は、当該アイオノマー(A)を一種のみ含んでいてもよく、二種以上含んでいてもよい。 <Ionomer (A) of ethylene/unsaturated carboxylic acid copolymer>
The ionomer (A) of the ethylene/unsaturated carboxylic acid copolymer (hereinafter also simply referred to as "ionomer (A)" is an ethylene/unsaturated carboxylic acid copolymer in which part or all of the acid is a metal ion and has a structure in which a plurality of ethylene-unsaturated carboxylic acid copolymers are crosslinked.The resin composition may contain only one ionomer (A), or may contain two or more kinds of ionomers (A). You can stay.
中和度(%)=(1-P1/P2)×100
P1:エチレン共重合体樹脂のC=O伸縮吸収ピーク高さ
P2:塩酸処理したエチレン共重合体樹脂のC=O伸縮吸収ピーク高さ The degree of neutralization of the ethylene/unsaturated carboxylic acid copolymer in the ionomer (A) is preferably 10% or more and 90% or less, more preferably 10% or more and 85% or less, and even more preferably 15% or more and 82% or less. When the degree of neutralization of the ethylene/unsaturated carboxylic acid-based copolymer is 10% or more, when the resin composition is used as a base material for a dicing film, the surface hardness of the base material increases. On the other hand, when the degree of neutralization is 90% or less, the processability and moldability of the resin composition are improved. The degree of neutralization is the ratio of the number of moles of metal ions to the number of moles of acid groups (for example, carboxyl groups) possessed by the ethylene/unsaturated carboxylic acid copolymer. The degree of neutralization can be measured by infrared absorption spectrum (IR). By measuring the C=O stretching absorption peak of the resin using the infrared absorption spectrum, the non-ionized carboxy groups can be quantified. groups can be quantified. By measuring both, the degree of neutralization can be obtained, and specifically, it can be calculated by the following formula.
Neutralization degree (%) = (1-P1/P2) x 100
P1: C=O stretching absorption peak height of ethylene copolymer resin P2: C=O stretching absorption peak height of hydrochloric acid-treated ethylene copolymer resin
ポリアミド(B)は、アミド基を2つ以上含む樹脂であればよい。一般的に、上述のアイオノマー(A)は、融点が低く、耐熱性が低い傾向にあるが、このようなアイオノマー(A)と、ポリアミド(B)と、を組み合わせることで、樹脂組成物、ひいてはダイシングフィルム用の基材の耐熱性が非常に良好になる。また、上述のアイオノマー(A)とポリアミド(B)とを組み合わせると、樹脂組成物をダイシングフィルムの基材としたときに、良好なモジュラス強度や分断性が得られる。 <Polyamide (B)>
Polyamide (B) may be a resin containing two or more amide groups. In general, the ionomer (A) described above tends to have a low melting point and low heat resistance. The heat resistance of the substrate for the dicing film becomes very good. Further, when the ionomer (A) and the polyamide (B) are combined, good modulus strength and severability can be obtained when the resin composition is used as a base material for a dicing film.
スチレン系樹脂(C)は、少なくともスチレンを構成単位として有する樹脂であればよく、スチレンの単独重合体であってもよく、スチレンと他の単量体との重合体であってもよい。スチレン系樹脂(C)の例には、スチレン系エラストマー、アクリロニトリルとスチレンとの共重合体であるABS系樹脂、ポリスチレン等が含まれる。これらの中でも、スチレン系エラストマーが好ましい。スチレン系エラストマーとは、室温でゴム弾性体であるスチレン系重合体をいう。 <Styrene resin (C)>
The styrene-based resin (C) may be a resin having at least styrene as a constituent unit, and may be a homopolymer of styrene or a polymer of styrene and other monomers. Examples of the styrene-based resin (C) include styrene-based elastomers, ABS-based resins that are copolymers of acrylonitrile and styrene, and polystyrene. Among these, styrene-based elastomers are preferred. A styrene-based elastomer refers to a styrene-based polymer that is a rubber elastic body at room temperature.
樹脂組成物は、本発明の効果を損なわない範囲で、必要に応じてその他の重合体や各種添加剤、帯電防止剤、紫外線吸収剤、充填材等を含んでいてもよい。 <Other polymers and additives>
If necessary, the resin composition may contain other polymers, various additives, antistatic agents, ultraviolet absorbers, fillers, etc., as long as the effects of the present invention are not impaired.
本発明の樹脂組成物の製造方法は特に制限されず、アイオノマー(A)、ポリアミド(B)、およびスチレン系樹脂(C)、さらに必要に応じてその他の重合体や添加剤等を混合可能な方法であれば特に制限されない。例えば、全ての成分をドライブレンドした後に溶融混練してもよく、一部の成分を先に混練してから、後の成分を加えてもよい。 <Method for producing resin composition and physical properties of resin composition>
The method for producing the resin composition of the present invention is not particularly limited, and ionomer (A), polyamide (B), and styrenic resin (C), and if necessary, other polymers, additives, etc. can be mixed. There is no particular limitation as long as it is a method. For example, all the components may be dry-blended and then melt-kneaded, or some components may be kneaded first and then the components added later.
ダイシング基材は、上述の樹脂組成物を含む層を少なくとも一層有する基材であればよい。当該ダイシングフィルム基材は、上述の樹脂組成物を含む層を有するため、常温および低温において、優れたモジュラス強度や伸び性を発揮する。当該ダイシングフィルム基材は、ダイシングフィルムの基材として好適に用いられるが、当該用途に限定されない。 2. Dicing Film Substrate The dicing substrate may be a substrate having at least one layer containing the resin composition described above. Since the dicing film base material has a layer containing the above resin composition, it exhibits excellent modulus strength and elongation at room temperature and low temperature. The dicing film substrate is suitably used as a dicing film substrate, but is not limited to this application.
本発明のダイシングフィルムは、上述のダイシングフィルム基材と、その少なくとも一方の面に積層された粘着層と、を備えていればよく、必要に応じて他の構成を含んでいてもよい。なお、上述のダイシングフィルム基材が多層からなる場合、ダイシングフィルム基材中の樹脂組成物を含む層と、粘着層とが積層されていることが好ましい。 3. Dicing film The dicing film of the present invention only needs to comprise the above-described dicing film substrate and an adhesive layer laminated on at least one surface thereof, and may contain other configurations as necessary. . In addition, when the dicing film substrate is composed of multiple layers, it is preferable that the layer containing the resin composition in the dicing film substrate and the adhesive layer are laminated.
各成分は、以下のものを用いた。
<エチレン・不飽和カルボン酸系共重合体のアイオノマー(A)>
IO:エチレン・メタクリル酸・アクリル酸ブチルエステル共重合体のアイオノマー(エチレンに由来する構成単位の含有量:80質量%、メタクリル酸に由来する構成単位の含有量:10質量%、アクリル酸ブチルエステルに由来する構成単位の含有量:10質量%、中和度:70%亜鉛、JIS K 7210:1999(ISO 1133:1997に相当)に準拠し、190℃、2160g荷重で測定されるMFR:1g/10分) [Preparation of materials]
The following components were used for each component.
<Ionomer (A) of ethylene/unsaturated carboxylic acid copolymer>
IO: ionomer of ethylene/methacrylic acid/butyl acrylate copolymer (content of structural units derived from ethylene: 80% by mass, content of structural units derived from methacrylic acid: 10% by mass, butyl acrylate Content of structural units derived from: 10% by mass, degree of neutralization: 70% zinc, MFR measured at 190 ° C. and 2160 g load in accordance with JIS K 7210: 1999 (equivalent to ISO 1133: 1997): 1 g /10 minutes)
PA:ナイロン6(宇部興産社製、1022B(商品名)、融点:215℃~225℃、密度:1140kg/m3) <Polyamide (B)>
PA: Nylon 6 (manufactured by Ube Industries, Ltd., 1022B (trade name), melting point: 215° C. to 225° C., density: 1140 kg/m 3 )
・スチレン系樹脂1:SEBS(スチレン-エチレン・ブチレン-スチレンブロック共重合体(旭化成ケミカルズ社製、S.O.E.S1611(商品名)、JIS K 7210:1999(ISO 1133:1997に相当)に準拠し、230℃、2160g荷重で測定されるMFR:12.0g/10分、Tanδピーク温度:9℃)
・スチレン系樹脂2:HSBR(スチレン・ブタジエンランダム共重合体の水素添加物(JSR社製、ダイナロン1320P(商品名)、JIS K 7210:1999(ISO 1133:1997に相当)に準拠し、230℃、2160g荷重で測定されるMFR:3.5g/10分、Tanδピーク温度:-15℃)
・スチレン系樹脂3:SEBS(スチレン-エチレン・ブチレン-スチレンブロック共重合体(旭化成ケミカルズ社製、タフテックH1041(商品名)、JIS K 7210:1999(ISO 1133:1997に相当)に準拠し、230℃、2160g荷重で測定されるMFR:5.0g/10分、Tanδピーク温度:-45℃)
・スチレン系樹脂4:酸変性SEBS(無水マレイン酸変性スチレン-エチレン・ブチレン-スチレンブロック共重合体(旭化成ケミカルズ社製、タフテックM1913(商品名)、酸価:10mgCH3ONa/g、JIS K 7210:1999(ISO 1133:1997に相当)に準拠し、230℃、2160g荷重で測定されるMFR:5.0g/10分、Tanδピーク温度:-40℃)
・スチレン系樹脂5:SEPS(スチレン-エチレン・プロピレン-スチレンブロック共重合体(クラレ社製、セプトン2002、JIS K 7210:1999(ISO 1133:1997に相当)に準拠し、230℃、2160g荷重で測定されるMFR:70.0g/10分) <Styrene resin (C)>
Styrene resin 1: SEBS (styrene-ethylene-butylene-styrene block copolymer (manufactured by Asahi Kasei Chemicals, SOE S1611 (trade name), JIS K 7210: 1999 (equivalent to ISO 1133: 1997) , MFR measured at 230 ° C., 2160 g load: 12.0 g / 10 minutes, Tan δ peak temperature: 9 ° C.)
・ Styrene resin 2: HSBR (hydrogenated styrene-butadiene random copolymer (manufactured by JSR, DYNARON 1320P (trade name), JIS K 7210: 1999 (equivalent to ISO 1133: 1997), 230 ° C. , MFR measured at 2160 g load: 3.5 g / 10 minutes, Tan δ peak temperature: -15 ° C.)
Styrene resin 3: SEBS (styrene-ethylene-butylene-styrene block copolymer (manufactured by Asahi Kasei Chemicals, Tuftec H1041 (trade name), JIS K 7210: 1999 (equivalent to ISO 1133: 1997), 230 ° C., MFR measured at 2160 g load: 5.0 g/10 min, Tan δ peak temperature: -45 ° C.)
Styrene resin 4: acid-modified SEBS (maleic anhydride-modified styrene-ethylene-butylene-styrene block copolymer (manufactured by Asahi Kasei Chemicals, Tuftec M1913 (trade name), acid value: 10 mg CH 3 ONa/g, JIS K 7210 : 1999 (equivalent to ISO 1133:1997), MFR measured at 230 ° C., 2160 g load: 5.0 g / 10 minutes, Tan δ peak temperature: -40 ° C.)
・ Styrene resin 5: SEPS (styrene-ethylene/propylene-styrene block copolymer (manufactured by Kuraray Co., Ltd., Septon 2002, JIS K 7210: 1999 (equivalent to ISO 1133: 1997)), 230 ° C., 2160 g load Measured MFR: 70.0 g/10 min)
・EMAA:エチレン・メタクリル酸系共重合体(エチレンに由来する構成単位の含有量:91質量%、メタクリル酸に由来する構成単位の含有量:9質量%、JIS K 7210:1999(ISO 1133:1997に相当)に準拠し、190℃、2160g荷重で測定されるMFR:3g/10分)
・TPU:熱可塑性ポリウレタンエラストマー(東ソー社製、ミラクトランP485RSUI(商品名)) <Others>
EMAA: ethylene/methacrylic acid copolymer (content of structural units derived from ethylene: 91% by mass, content of structural units derived from methacrylic acid: 9% by mass, JIS K 7210: 1999 (ISO 1133: 1997), MFR measured at 190 ° C., 2160 g load: 3 g / 10 minutes)
・ TPU: Thermoplastic polyurethane elastomer (manufactured by Tosoh Corporation, Miractran P485RSUI (trade name))
表1に示す割合(質量比)で、エチレン・不飽和カルボン酸系共重合体のアイオノマー(A)、ポリアミド(B)、およびスチレン系樹脂(C)をドライブレンドした。次に、30mmφ二軸押出機の樹脂投入口にドライブレンドした混合物を投入して、ダイス温度230℃で溶融混練し、ダイシングフィルム基材用樹脂組成物を得た。得られたダイシングフィルム基材用樹脂組成物について、JIS K 7210:1999(ISO 1133:1997に相当)に準拠して、230℃(比較例1のみ190℃)、2160g荷重でMFRを測定した。結果を表1に示す。 [Examples 1 to 13 and Comparative Examples 1 to 7]
An ethylene/unsaturated carboxylic acid copolymer ionomer (A), a polyamide (B), and a styrene resin (C) were dry-blended at the ratios (mass ratios) shown in Table 1. Next, the dry-blended mixture was put into the resin inlet of a 30 mmφ twin-screw extruder and melt-kneaded at a die temperature of 230° C. to obtain a resin composition for a dicing film substrate. The obtained resin composition for a dicing film substrate was measured for MFR at 230° C. (190° C. only in Comparative Example 1) under a load of 2160 g in accordance with JIS K 7210:1999 (corresponding to ISO 1133:1997). Table 1 shows the results.
得られたダイシングフィルム基材用樹脂組成物を、40mmφTダイフィルム成形機を用いて、加工温度230℃で成形し、100μm厚のTダイフィルムを作製した。得られたTダイフィルムをダイシングフィルム基材とし、下記の方法で評価した。結果を表1に示す。 [evaluation]
The obtained resin composition for a dicing film substrate was molded at a processing temperature of 230° C. using a 40 mmφ T die film molding machine to prepare a T die film having a thickness of 100 μm. The resulting T-die film was used as a dicing film substrate and evaluated by the following methods. Table 1 shows the results.
上記ダイシングフィルム基材を10mm幅×180mm長の短冊状に裁断した。JIS K 7127:1999(ISO 527-3:1995に相当)に準拠し、測定装置として島津卓上型精密万能試験機AG-Xを使用して、試料(ダイシングフィルム基材)のMD方向(Machine Direction)およびTD方向(Transverse Direction)のそれぞれについて、23℃にて、25%モジュラスを測定した。チャック間距離は100mm、試験速度は300mm/分とした。 (1) Modulus Strength at Room Temperature The dicing film substrate was cut into strips of 10 mm width×180 mm length. In accordance with JIS K 7127: 1999 (equivalent to ISO 527-3: 1995), using Shimadzu desktop precision universal testing machine AG-X as a measuring device, the MD direction (machine direction) of the sample (dicing film substrate) ) and TD (Transverse Direction), the 25% modulus was measured at 23°C. The chuck-to-chuck distance was 100 mm, and the test speed was 300 mm/min.
A(良好) :8MPa以上12MPa以下
B(やや良好):7MPa以上8MPa未満、または、12MPa超13MPa以下
C(不良) :7MPa未満または13MPa超 The 25% modulus in the MD direction and the 25% modulus in the TD direction obtained by the above tests were averaged, and the room temperature modulus strength of the dicing film substrate was evaluated according to the following criteria.
A (good): 8 MPa or more and 12 MPa or less B (slightly good): 7 MPa or more and less than 8 MPa, or more than 12 MPa and 13 MPa or less C (poor): less than 7 MPa or more than 13 MPa
上記ダイシングフィルム基材を10mm幅×180mm長の短冊状に裁断した。JIS K 7127:1999(ISO 527-3:1995に相当)に準拠し、測定装置として島津卓上型精密万能試験機AG-Xを使用して、試料(ダイシングフィルム基材)のMD方向およびTD方向のそれぞれについて、-15℃にて、10%モジュラスを測定した。チャック間距離は100mm、試験速度は500mm/分とした。 (2) Low Temperature Modulus Strength The dicing film substrate was cut into strips of 10 mm width×180 mm length. In accordance with JIS K 7127: 1999 (equivalent to ISO 527-3: 1995), using a Shimadzu desktop precision universal testing machine AG-X as a measuring device, the MD direction and TD direction of the sample (dicing film substrate) , the 10% modulus was measured at -15°C. The chuck-to-chuck distance was 100 mm, and the test speed was 500 mm/min.
A(良好) :17MPa以上28MPa以下
B(やや良好):15MPa以上17MPa未満、または28MPa超30MPa以下
C(不良) :15MPa未満、または30MPa超 The 10% modulus in the MD direction and the 10% modulus in the TD direction obtained by the above tests were averaged, and the low-temperature modulus strength of the dicing film substrate was evaluated according to the following criteria.
A (good): 17 MPa or more and 28 MPa or less B (slightly good): 15 MPa or more and less than 17 MPa, or more than 28 MPa and 30 MPa or less C (poor): less than 15 MPa or more than 30 MPa
上記ダイシングフィルム基材を10mm幅×180mm長の短冊状に裁断した。JIS K 7127:1999(ISO 527-3:1995に相当)に準拠し、測定装置として島津卓上型精密万能試験機AG-Xを使用して、測定対象のMD方向およびTD方向のそれぞれについて、23℃で300%モジュラスを測定した。 (3) Elongation at Room Temperature The dicing film substrate was cut into strips of 10 mm width×180 mm length. In accordance with JIS K 7127: 1999 (equivalent to ISO 527-3: 1995), using Shimadzu desktop precision universal testing machine AG-X as a measuring device, 23 in each of the MD and TD directions of the object to be measured 300% modulus was measured at °C.
A(良好):23℃で300%モジュラスを測定可能
C(不良):測定中にダイシングフィルム基材が破断してしまい、23℃で300%モジュラスを測定不可 Regarding the obtained measurement results, the room-temperature elongation of the dicing film substrate was evaluated according to the following criteria.
A (Good): 300% modulus can be measured at 23 ° C. C (Poor): The dicing film substrate was broken during measurement, and 300% modulus could not be measured at 23 ° C.
ダイシングフィルム基材を10mm幅×180mm長の短冊状に裁断した。JIS K 7127:1999(ISO 527-3:1995に相当)に準拠し、測定装置として島津卓上型精密万能試験機AG-Xを使用して、測定対象のMD方向、TD方向のそれぞれについて、-15℃で200%モジュラスを測定した。 (4) Elongation at Low Temperature A dicing film base material was cut into strips having a width of 10 mm and a length of 180 mm. In accordance with JIS K 7127: 1999 (equivalent to ISO 527-3: 1995), using Shimadzu desktop precision universal testing machine AG-X as a measuring device, for each of the MD direction and TD direction of the measurement object, - 200% modulus was measured at 15°C.
A(良好):-15℃で200%モジュラスを測定可能
C(不良):測定中にダイシングフィルム基材が破断してしまい、-15℃で200%モジュラスを測定不可 Regarding the obtained measurement results, the low-temperature elongation of the dicing film substrate was evaluated according to the following criteria.
A (Good): 200% modulus can be measured at -15°C C (Poor): The dicing film substrate was broken during measurement, and 200% modulus could not be measured at -15°C
Claims (12)
- エチレン・不飽和カルボン酸系共重合体のアイオノマー(A)と、
ポリアミド(B)と、
スチレン系樹脂(C)と、
を含むダイシングフィルム基材用樹脂組成物。 an ethylene/unsaturated carboxylic acid-based copolymer ionomer (A);
Polyamide (B);
a styrene-based resin (C);
A resin composition for a dicing film substrate comprising: - 前記エチレン・不飽和カルボン酸系共重合体のアイオノマー(A)がエチレン・不飽和カルボン酸・不飽和カルボン酸エステル共重合体のアイオノマーである、
請求項1に記載のダイシングフィルム基材用樹脂組成物。 The ethylene/unsaturated carboxylic acid-based copolymer ionomer (A) is an ethylene/unsaturated carboxylic acid/unsaturated carboxylic acid ester copolymer ionomer,
The resin composition for a dicing film substrate according to claim 1. - 前記エチレン・不飽和カルボン酸系共重合体のアイオノマー(A)の不飽和カルボン酸由来の構成単位の量が、前記エチレン・不飽和カルボン酸系共重合体のアイオノマー(A)の全構成単位の量に対して、1質量%以上30質量%以下である、
請求項1または2に記載のダイシングフィルム基材用樹脂組成物。 The amount of the constituent units derived from the unsaturated carboxylic acid in the ionomer (A) of the ethylene/unsaturated carboxylic acid copolymer is the total amount of the constituent units of the ionomer (A) of the ethylene/unsaturated carboxylic acid copolymer. 1% by mass or more and 30% by mass or less with respect to the amount,
The resin composition for a dicing film substrate according to claim 1 or 2. - 前記エチレン・不飽和カルボン酸系共重合体のアイオノマー(A)の中和度が、10%以上90%以下である、
請求項1~3のいずれか一項に記載のダイシングフィルム基材用樹脂組成物。 The degree of neutralization of the ionomer (A) of the ethylene/unsaturated carboxylic acid copolymer is 10% or more and 90% or less.
The resin composition for a dicing film substrate according to any one of claims 1 to 3. - 前記スチレン系樹脂(C)がスチレン系エラストマーである、
請求項1~4のいずれか一項に記載のダイシングフィルム基材用樹脂組成物。 The styrene-based resin (C) is a styrene-based elastomer,
The resin composition for a dicing film substrate according to any one of claims 1 to 4. - 前記スチレン系樹脂(C)の含有量が、1質量%以上40質量%以下である、
請求項1~5のいずれか一項に記載のダイシングフィルム基材用樹脂組成物。 The content of the styrene resin (C) is 1% by mass or more and 40% by mass or less,
The resin composition for a dicing film substrate according to any one of claims 1 to 5. - 前記エチレン・不飽和カルボン酸系共重合体のアイオノマー(A)の含有量が、前記ポリアミド(B)の含有量および前記スチレン系樹脂(C)の含有量の合計量以上である、
請求項1~6のいずれか一項に記載のダイシングフィルム基材用樹脂組成物。 The content of the ionomer (A) in the ethylene/unsaturated carboxylic acid copolymer is equal to or greater than the total amount of the content of the polyamide (B) and the content of the styrene resin (C).
The resin composition for a dicing film substrate according to any one of claims 1 to 6. - JIS K 7210:1999に準拠して、230℃、荷重2160gにて測定されるメルトフローレートが、0.1g/10分以上30g/10分以下である、
請求項1~7のいずれか一項に記載のダイシングフィルム基材用樹脂組成物。 According to JIS K 7210: 1999, the melt flow rate measured at 230 ° C. and a load of 2160 g is 0.1 g / 10 minutes or more and 30 g / 10 minutes or less.
The resin composition for a dicing film substrate according to any one of claims 1 to 7. - 請求項1~8のいずれか一項に記載のダイシングフィルム基材用樹脂組成物を含む層を、少なくとも一層有する、
ダイシングフィルム基材。 Having at least one layer containing the resin composition for a dicing film substrate according to any one of claims 1 to 8,
Dicing film substrate. - 前記ダイシングフィルム基材用樹脂組成物を含む層の、JIS K 7127:1999に準拠して23℃で測定したMD方向の25%モジュラスおよびTD方向の25%モジュラスの平均値が、7MPa以上13MPa以下である、
請求項9に記載のダイシングフィルム基材。 The average value of the 25% modulus in the MD direction and the 25% modulus in the TD direction measured at 23° C. in accordance with JIS K 7127:1999 of the layer containing the resin composition for a dicing film substrate is 7 MPa or more and 13 MPa or less. is
The dicing film substrate according to claim 9. - 前記ダイシングフィルム基材用樹脂組成物を含む層の、JIS K 7127:1999に準拠して-15℃で測定したMD方向の10%モジュラスおよびTD方向の10%モジュラスの平均値が、15MPa以上30MPa以下である、
請求項9または10に記載のダイシングフィルム基材。 The average value of the 10% modulus in the MD direction and the 10% modulus in the TD direction measured at −15° C. in accordance with JIS K 7127:1999 of the layer containing the resin composition for a dicing film substrate is 15 MPa or more and 30 MPa. is the following
The dicing film substrate according to claim 9 or 10. - 請求項11に記載のダイシングフィルム基材と、
前記ダイシングフィルム基材の少なくとも一方の面に積層された粘着層と、
を有する、
ダイシングフィルム。 A dicing film substrate according to claim 11;
an adhesive layer laminated on at least one surface of the dicing film substrate;
having
dicing film.
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