WO2022118618A1 - パターン付き基板の製造方法 - Google Patents
パターン付き基板の製造方法 Download PDFInfo
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- WO2022118618A1 WO2022118618A1 PCT/JP2021/041278 JP2021041278W WO2022118618A1 WO 2022118618 A1 WO2022118618 A1 WO 2022118618A1 JP 2021041278 W JP2021041278 W JP 2021041278W WO 2022118618 A1 WO2022118618 A1 WO 2022118618A1
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- WIPO (PCT)
- Prior art keywords
- group
- polyimide resin
- resin composition
- film
- patterned substrate
- Prior art date
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- 239000000758 substrate Substances 0.000 title claims abstract description 60
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 42
- 229920001721 polyimide Polymers 0.000 claims abstract description 204
- 239000009719 polyimide resin Substances 0.000 claims abstract description 143
- 239000000203 mixture Substances 0.000 claims abstract description 67
- 238000000034 method Methods 0.000 claims abstract description 48
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- 125000004122 cyclic group Chemical group 0.000 claims description 15
- 125000004432 carbon atom Chemical group C* 0.000 claims description 14
- 239000003795 chemical substances by application Substances 0.000 claims description 12
- 239000003999 initiator Substances 0.000 claims description 12
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 11
- 125000002723 alicyclic group Chemical group 0.000 claims description 9
- 125000002029 aromatic hydrocarbon group Chemical group 0.000 claims description 8
- 125000003647 acryloyl group Chemical group O=C([*])C([H])=C([H])[H] 0.000 claims description 6
- 125000001931 aliphatic group Chemical group 0.000 claims description 6
- 238000010438 heat treatment Methods 0.000 claims description 6
- 239000000178 monomer Substances 0.000 claims description 5
- 238000002834 transmittance Methods 0.000 claims description 5
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims description 4
- 125000005375 organosiloxane group Chemical group 0.000 claims description 4
- 229910052727 yttrium Inorganic materials 0.000 claims description 4
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- 230000000052 comparative effect Effects 0.000 description 11
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- PAPBSGBWRJIAAV-UHFFFAOYSA-N ε-Caprolactone Chemical compound O=C1CCCCCO1 PAPBSGBWRJIAAV-UHFFFAOYSA-N 0.000 description 6
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- 125000001153 fluoro group Chemical group F* 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- DMEGYFMYUHOHGS-UHFFFAOYSA-N heptamethylene Natural products C1CCCCCC1 DMEGYFMYUHOHGS-UHFFFAOYSA-N 0.000 description 1
- GNOIPBMMFNIUFM-UHFFFAOYSA-N hexamethylphosphoric triamide Chemical compound CN(C)P(=O)(N(C)C)N(C)C GNOIPBMMFNIUFM-UHFFFAOYSA-N 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000013067 intermediate product Substances 0.000 description 1
- ZFSLODLOARCGLH-UHFFFAOYSA-N isocyanuric acid Chemical compound OC1=NC(O)=NC(O)=N1 ZFSLODLOARCGLH-UHFFFAOYSA-N 0.000 description 1
- 229940018564 m-phenylenediamine Drugs 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- UZKWTJUDCOPSNM-UHFFFAOYSA-N methoxybenzene Substances CCCCOC=C UZKWTJUDCOPSNM-UHFFFAOYSA-N 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- PHQOGHDTIVQXHL-UHFFFAOYSA-N n'-(3-trimethoxysilylpropyl)ethane-1,2-diamine Chemical compound CO[Si](OC)(OC)CCCNCCN PHQOGHDTIVQXHL-UHFFFAOYSA-N 0.000 description 1
- HOSQZKZVJBFALN-UHFFFAOYSA-N n'-benzyl-n-(3-trimethoxysilylpropyl)ethane-1,2-diamine;hydron;chloride Chemical compound Cl.CO[Si](OC)(OC)CCCNCCNCC1=CC=CC=C1 HOSQZKZVJBFALN-UHFFFAOYSA-N 0.000 description 1
- SAQPQTKYCWAAMJ-UHFFFAOYSA-N n,n-diethyl-4-pyridin-2-ylaniline Chemical compound C1=CC(N(CC)CC)=CC=C1C1=CC=CC=N1 SAQPQTKYCWAAMJ-UHFFFAOYSA-N 0.000 description 1
- MLNHFFKCCKXSAW-UHFFFAOYSA-N n,n-diethyl-4-pyrimidin-2-ylaniline Chemical compound C1=CC(N(CC)CC)=CC=C1C1=NC=CC=N1 MLNHFFKCCKXSAW-UHFFFAOYSA-N 0.000 description 1
- KVEFSERWIAYNPO-UHFFFAOYSA-N n,n-diethyl-4-quinolin-2-ylaniline Chemical compound C1=CC(N(CC)CC)=CC=C1C1=CC=C(C=CC=C2)C2=N1 KVEFSERWIAYNPO-UHFFFAOYSA-N 0.000 description 1
- QTBGSBRUWVUWCS-UHFFFAOYSA-N n,n-dimethyl-4-pyridin-2-ylaniline Chemical compound C1=CC(N(C)C)=CC=C1C1=CC=CC=N1 QTBGSBRUWVUWCS-UHFFFAOYSA-N 0.000 description 1
- RJJJWZAJSLSBKC-UHFFFAOYSA-N n,n-dimethyl-4-pyrimidin-2-ylaniline Chemical compound C1=CC(N(C)C)=CC=C1C1=NC=CC=N1 RJJJWZAJSLSBKC-UHFFFAOYSA-N 0.000 description 1
- KLNWLOCDPWWNDS-UHFFFAOYSA-N n,n-dimethyl-4-quinolin-2-ylaniline Chemical compound C1=CC(N(C)C)=CC=C1C1=CC=C(C=CC=C2)C2=N1 KLNWLOCDPWWNDS-UHFFFAOYSA-N 0.000 description 1
- KBJFYLLAMSZSOG-UHFFFAOYSA-N n-(3-trimethoxysilylpropyl)aniline Chemical compound CO[Si](OC)(OC)CCCNC1=CC=CC=C1 KBJFYLLAMSZSOG-UHFFFAOYSA-N 0.000 description 1
- KQSABULTKYLFEV-UHFFFAOYSA-N naphthalene-1,5-diamine Chemical compound C1=CC=C2C(N)=CC=CC2=C1N KQSABULTKYLFEV-UHFFFAOYSA-N 0.000 description 1
- OTLDLKLSNZMTTA-UHFFFAOYSA-N octahydro-1h-4,7-methanoindene-1,5-diyldimethanol Chemical compound C1C2C3C(CO)CCC3C1C(CO)C2 OTLDLKLSNZMTTA-UHFFFAOYSA-N 0.000 description 1
- 125000000962 organic group Chemical group 0.000 description 1
- 150000002903 organophosphorus compounds Chemical class 0.000 description 1
- RPQRDASANLAFCM-UHFFFAOYSA-N oxiran-2-ylmethyl prop-2-enoate Chemical compound C=CC(=O)OCC1CO1 RPQRDASANLAFCM-UHFFFAOYSA-N 0.000 description 1
- XNLICIUVMPYHGG-UHFFFAOYSA-N pentan-2-one Chemical compound CCCC(C)=O XNLICIUVMPYHGG-UHFFFAOYSA-N 0.000 description 1
- MIVZUXGHPJSKRI-UHFFFAOYSA-N pentane-1,1,1,2-tetracarboxylic acid Chemical compound CCCC(C(O)=O)C(C(O)=O)(C(O)=O)C(O)=O MIVZUXGHPJSKRI-UHFFFAOYSA-N 0.000 description 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 239000002985 plastic film Substances 0.000 description 1
- 229920006255 plastic film Polymers 0.000 description 1
- 239000003495 polar organic solvent Substances 0.000 description 1
- 239000002798 polar solvent Substances 0.000 description 1
- 229920000058 polyacrylate Polymers 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920001223 polyethylene glycol Polymers 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 125000002572 propoxy group Chemical group [*]OC([H])([H])C(C([H])([H])[H])([H])[H] 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 239000012487 rinsing solution Substances 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 238000007086 side reaction Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 150000003457 sulfones Chemical class 0.000 description 1
- 125000003396 thiol group Chemical group [H]S* 0.000 description 1
- IMFACGCPASFAPR-UHFFFAOYSA-N tributylamine Chemical compound CCCCN(CCCC)CCCC IMFACGCPASFAPR-UHFFFAOYSA-N 0.000 description 1
- DQZNLOXENNXVAD-UHFFFAOYSA-N trimethoxy-[2-(7-oxabicyclo[4.1.0]heptan-4-yl)ethyl]silane Chemical compound C1C(CC[Si](OC)(OC)OC)CCC2OC21 DQZNLOXENNXVAD-UHFFFAOYSA-N 0.000 description 1
- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 description 1
- YFTHZRPMJXBUME-UHFFFAOYSA-N tripropylamine Chemical compound CCCN(CCC)CCC YFTHZRPMJXBUME-UHFFFAOYSA-N 0.000 description 1
- 150000003672 ureas Chemical class 0.000 description 1
Classifications
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- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
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- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F290/00—Macromolecular compounds obtained by polymerising monomers on to polymers modified by introduction of aliphatic unsaturated end or side groups
- C08F290/02—Macromolecular compounds obtained by polymerising monomers on to polymers modified by introduction of aliphatic unsaturated end or side groups on to polymers modified by introduction of unsaturated end groups
- C08F290/06—Polymers provided for in subclass C08G
- C08F290/065—Polyamides; Polyesteramides; Polyimides
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- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G18/00—Polymeric products of isocyanates or isothiocyanates
- C08G18/06—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
- C08G18/70—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the isocyanates or isothiocyanates used
- C08G18/81—Unsaturated isocyanates or isothiocyanates
- C08G18/8108—Unsaturated isocyanates or isothiocyanates having only one isocyanate or isothiocyanate group
- C08G18/8116—Unsaturated isocyanates or isothiocyanates having only one isocyanate or isothiocyanate group esters of acrylic or alkylacrylic acid having only one isocyanate or isothiocyanate group
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- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
- C08G73/1003—Preparatory processes
- C08G73/1007—Preparatory processes from tetracarboxylic acids or derivatives and diamines
- C08G73/101—Preparatory processes from tetracarboxylic acids or derivatives and diamines containing chain terminating or branching agents
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- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
- C08G73/1046—Polyimides containing oxygen in the form of ether bonds in the main chain
- C08G73/105—Polyimides containing oxygen in the form of ether bonds in the main chain with oxygen only in the diamino moiety
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
- C08G73/1075—Partially aromatic polyimides
- C08G73/1078—Partially aromatic polyimides wholly aromatic in the diamino moiety
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D151/00—Coating compositions based on graft polymers in which the grafted component is obtained by reactions only involving carbon-to-carbon unsaturated bonds; Coating compositions based on derivatives of such polymers
- C09D151/08—Coating compositions based on graft polymers in which the grafted component is obtained by reactions only involving carbon-to-carbon unsaturated bonds; Coating compositions based on derivatives of such polymers grafted on to macromolecular compounds obtained otherwise than by reactions only involving carbon-to-carbon unsaturated bonds
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D179/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen, with or without oxygen, or carbon only, not provided for in groups C09D161/00 - C09D177/00
- C09D179/04—Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
- C09D179/08—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/032—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
- G03F7/037—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polyamides or polyimides
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
- G03F7/0387—Polyamides or polyimides
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- G—PHYSICS
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- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
- G03F7/2004—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image characterised by the use of a particular light source, e.g. fluorescent lamps or deep UV light
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- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
- G03F7/325—Non-aqueous compositions
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/40—Treatment after imagewise removal, e.g. baking
Definitions
- the present invention relates to a method for manufacturing a patterned substrate.
- a photosensitive polyimide resin composition having excellent heat resistance and insulating properties is used as a surface protective film, an interlayer insulating film, a wiring protective insulating film of a circuit board, and the like for semiconductor elements of electronic devices.
- Examples of the technique relating to pattern formation using the photosensitive polyimide resin composition include those described in Patent Documents 1 to 5.
- Patent Documents 1 to 4 describe a developing solution for photosensitive polyimide in which water is mixed with an organic solvent.
- Patent Document 5 describes that a developer containing an organic solvent having a LogP of -1 to 5 is used as the developer of the photosensitive polyimide resin composition.
- Japanese Unexamined Patent Publication No. 2008-292799 Japanese Patent Application Laid-Open No. 2002-214801 Japanese Unexamined Patent Publication No. 10-123725 Japanese Unexamined Patent Publication No. 2002-014476 International Publication No. 2018/221457
- the present invention has been made in view of the above circumstances, and a method for manufacturing a patterned substrate capable of suppressing the generation of cracks in the exposed portion while suppressing the formation of residues in the unexposed portion after development is provided. It is to provide.
- the present inventors have made extensive studies to solve the above problems. As a result, when a developer whose relative energy difference (RED) from the film made of the photosensitive polyimide resin composition is in a specific range is used, the residue of the unexposed portion is generated and the crack of the exposed portion is generated after the development.
- the present invention has been completed by finding that it is possible to suppress the problem and improve the developability.
- the following method for manufacturing a patterned substrate is provided.
- the step (a) of forming a film made of a photosensitive polyimide resin composition on a substrate, and The step (b) of exposing the film and A step (c) of forming a pattern composed of the film on the substrate by developing the exposed film with a developing solution is included.
- the relative energy difference (RED) between the step (c1) for measuring the Hansen solubility parameter of the film before exposure and the film before exposure using the obtained Hansen solubility parameter is The method for manufacturing a patterned substrate according to the above [1], which comprises a step (c2) of selecting a developer having a developer size of 0.50 or more and 1.4 or less.
- the step (a) includes a step (a1) of applying a varnish-like photosensitive polyimide resin composition onto the substrate, and a step of removing an organic solvent from the applied photosensitive polyimide resin composition (a2).
- the method for manufacturing a patterned substrate according to the above [1] or [2] which comprises.
- the polyimide resin contained in the photosensitive polyimide resin composition includes the modified polyimide resin (A) having a repeating structure represented by the following general formula (1), and is classified into any one of the above [1] to [5].
- R is a tetravalent group having a cyclic structure, a non-cyclic structure, or a cyclic structure and a non-cyclic structure and having 4 to 25 carbon atoms.
- A has at least one group selected from the group consisting of an aliphatic hydrocarbon group, an alicyclic hydrocarbon group, an aromatic hydrocarbon group, and an organosiloxane group, and has a divalent group having 2 to 39 carbon atoms. Is the basis of.
- the main chain of A is selected from the group consisting of -O-, -SO 2- , -CO-, -CH 2- , -C (CH 3 ) 2- , -C 2 H 4 O-, and -S-.
- n indicates the number of repeating units.
- the end of the general formula (1) is either the following general formula (2) or the group represented by the general formula (3), or a hydrogen atom, and at least one of the ends is the following general formula (2) or the following. It is a group represented by the general formula (3).
- X and X2 are independently groups having 2 to 15 carbon atoms, and at least one group selected from the group consisting of an ester bond and a double bond is used. You may have.
- Y and Y 2 are independently hydrogen atoms or methyl groups, respectively.
- the photosensitive polyimide resin composition further contains at least one selected from the group consisting of a photopolymerization initiator, an organic solvent and a photopolymerizable compound. How to manufacture a patterned substrate.
- the photopolymerizable compound contains a polyfunctional radically polymerizable monomer.
- the photopolymerizable compound contains a polyfunctional (meth) acrylate having four or more (meth) acryloyl groups in the molecule.
- the photosensitive polyimide resin composition further contains at least one selected from the group consisting of a sensitizer, a leveling agent and an adhesion improver. How to manufacture the substrate with.
- the present embodiment The embodiment for carrying out the present invention (hereinafter, simply referred to as "the present embodiment") will be described in detail.
- the following embodiments are examples for explaining the present invention, and do not limit the contents of the present invention.
- the present invention can be appropriately modified and carried out within the scope of the gist thereof.
- the preferable provisions can be arbitrarily adopted, and it can be said that the combination of preferable ones is more preferable.
- the description of "XX to YY" means "XX or more and YY or less”.
- (meth) acrylate in the present embodiment means both “acrylate” and “methacrylate”. The same applies to other similar terms (“(meth) acrylic acid”, “(meth) acryloyl group”, etc.).
- the method for manufacturing a patterned substrate includes the following steps (a), (b) and (c).
- a step of forming a pattern made of the film on the substrate, and the relative energy difference (RED) between the developing solution and the film before exposure suppresses the occurrence of cracks in the exposed portion after development.
- 0.50 or more preferably 0.52 or more, more preferably 0.55 or more, still more preferably 0.60 or more, and suppressing the formation of residues in the unexposed portion after development. Therefore, it is 1.4 or less, preferably 1.3 or less, more preferably 1.2 or less, and further preferably 1.1 or less.
- the relative energy difference (RED) can be calculated by the following equation (1).
- RED Ra / R 0 (1)
- Ra is the Hansen solubility parameter (hereinafter, also referred to as “HSP”) of the solute (that is, the film before exposure in the present embodiment) and the solvent (that is, in the present embodiment).
- HSP Hansen solubility parameter
- the distance of the developer) to the HSP, that is, the HSP distance, and R 0 is the interaction radius of the solute.
- Ra (HSP distance) can be calculated by the following equation (2).
- R a ⁇ 4 ( ⁇ dS- ⁇ dL) 2 + ( ⁇ pS- ⁇ pL) 2 + ( ⁇ hS- ⁇ hL) 2 ⁇ 0.5 (2)
- ⁇ dS is the energy due to the London dispersion force of the solute
- ⁇ pS is the energy due to the bipolar interaction of the solute
- ⁇ hS is the energy due to the hydrogen bond of the solute
- ⁇ dL is the London dispersion force of the solvent.
- ⁇ pL is the energy due to the bipolar interaction of the solvent
- ⁇ hL is the energy due to the hydrogen bond of the solvent.
- R 0 radius of solute interaction
- R 0 radius of solute interaction
- a solute for which R0 is to be obtained and several solvents known by HSP are prepared, and the solubility test of the target solute in each solvent is performed.
- the HSP of the solvent showing solubility and the HSP of the solvent showing no solubility are plotted on the Hansen space, respectively.
- a virtual sphere (Hansen sphere) that includes the HSP of the solvent that showed solubility and does not include the HSP of the solvent that did not show solubility is created on the Hansen space. do.
- the radius of the Hansen sphere is R 0 .
- HSP is an index showing the solubility of a substance in another substance.
- the HSP is composed of three parameters: energy due to London dispersion ( ⁇ d), energy due to bipolar interaction ( ⁇ p), and energy due to hydrogen bonding ( ⁇ h), and is expressed as ( ⁇ d, ⁇ p, ⁇ h). It is a vector quantity and is represented by plotting it on a three-dimensional space (Hansen space) having three parameters of HSP as coordinate axes. And it can be judged that those having similar vectors have high solubility.
- the unit of each parameter is usually expressed in MPa 1/2 .
- HSP refer to the Internet ⁇ URL: http://hansen-solubility.com/>, for example.
- HSPiP Hansen Solubility Parameter in Practice
- the solubility of the material of interest in multiple solvents known for HSP is confirmed by dissolution experiments.
- the software version used is (version 5.3.02).
- Step (a) First, a film made of a photosensitive polyimide resin composition is formed on the substrate.
- the step (a) includes, for example, a step (a1) of applying a varnish-like photosensitive polyimide resin composition (hereinafter, also simply referred to as “polyimide varnish”) onto a substrate, and the applied photosensitive polyimide resin composition. It is preferable to include a step (a2) of removing the organic solvent from the varnish.
- a varnish-like photosensitive polyimide resin composition hereinafter, also simply referred to as “polyimide varnish”
- the method of applying the polyimide varnish on the substrate is not particularly limited, and for example, an inkjet method, a spin coat method, a casting method, a micro gravure method, a gravure coat method, a bar coat method, a roll coat method, a wire bar coat method, and a dip coat method.
- the method, the spray coating method, the screen printing method, the flexographic printing method, the die coating method and the like can be mentioned.
- the solid content concentration of the polyimide varnish according to the present embodiment so as to be in the range of 5 to 50% by mass.
- the organic solvent is removed from the applied polyimide varnish by drying the polyimide varnish applied on the substrate.
- the polyimide varnish is dried by, for example, heat-treating it with a hot plate, hot air, an oven or the like.
- the heating temperature is, for example, 80 to 140 ° C, preferably 90 to 120 ° C.
- the heating time is, for example, about 30 to 600 seconds, preferably about 30 to 300 seconds.
- the thickness of the film made of the photosensitive polyimide resin composition is not particularly limited, and may be appropriately adjusted according to the pattern to be finally obtained.
- the thickness of the film is, for example, 5 ⁇ m or more and 85 ⁇ m or less.
- the thickness of the film can be adjusted by changing the content of the organic solvent in the polyimide varnish, the coating method, the coating conditions, and the like.
- the substrate examples include glass, silicon wafers, metal foils, plastic films and the like.
- silicon wafers and copper foils are particularly preferably used.
- the photosensitive polyimide resin composition according to the present embodiment preferably contains a polyimide resin and further contains at least one selected from the group consisting of a photopolymerization initiator, an organic solvent and a photopolymerizable compound. Further, the photosensitive polyimide resin composition according to the present embodiment may further contain at least one selected from the group consisting of, for example, a sensitizer, a leveling agent and an adhesion improver.
- the content of the polyimide resin in the photosensitive polyimide resin composition according to the present embodiment is preferably 30% by mass or more, more preferably 40% by mass, when the total solid content of the photosensitive polyimide resin composition is 100% by mass.
- the total solid content of the photosensitive polyimide resin composition is a component that remains as a solid content when the photosensitive polyimide resin composition is cured, and is volatilized by heating, for example, an organic solvent. Ingredients are excluded. On the other hand, even in the case of liquid components, the components incorporated into the resin film when heat-cured are included in the total solid content.
- Polyimide resin examples include a polyimide resin containing a structural unit A derived from tetracarboxylic acid dianhydride and a structural unit B derived from a diamine compound.
- Any tetracarboxylic acid contained in the structural unit A can be used, for example, cyclohexanetetracarboxylic acid, cyclohexanetetracarboxylic acid esters, cyclohexanetetracarboxylic acid dianhydride, cyclobutanetetracarboxylic acid, and the like.
- Cyclobutanetetracarboxylic acid esters cyclobutanetetracarboxylic acid dianhydride, cyclopentanetetracarboxylic acid, cyclopentanetetracarboxylic acid esters, cyclopentanetetracarboxylic acid dianhydride, bicyclopentanetetracarboxylic acid dianhydride and the like can be mentioned. ..
- cyclohexanetetracarboxylic acid dianhydride cyclobutanetetracarboxylic acid dianhydride and cyclopentanetetracarboxylic acid dianhydride are more preferable, and cyclohexanetetracarboxylic acid dianhydride is even more preferable.
- the various tetracarboxylic acid components described above contain positional isomers.
- 1,2,4,5-cyclohexanetetracarboxylic acid 1,2,4,5-cyclohexanetetracarboxylic acid dianhydride, 1,2,4,5-cyclohexane Tetracarboxylic acid methyl ester, 1,2,3,4-butanetetracarboxylic acid, 1,2,3,4-butanetetracarboxylic acid dianhydride, 1,2,3,4-butanetetracarboxylic acid methyl ester, 1,2,3,4-Cyclobutanetetracarboxylic acid, 1,2,3,4-cyclobutanetetracarboxylic acid dianhydride, 1,2,3,4-cyclobutanetetracarboxylic acid methyl ester, 1,2,4 5-Cyclopentanetetracarboxylic acid, 1,2,4,5-cyclopentanetetracarboxylic acid dianhydride, 1,2,4,5-cyclopentanetetracarboxylic acid dianhydride, 1,2,4,5-cyclopentanetetracarbox
- 1,2,4,5-cyclohexanetetracarboxylic acid 1,2,4,5-cyclohexanetetracarboxylic acid dianhydride, 1,2,3,4-cyclobutanetetracarboxylic acid dianhydride, 1 , 2,4,5-Cyclohexanetetracarboxylic acid methyl ester is particularly preferable because it is easy to increase the molecular weight when producing a polyimide resin and it is advantageous in that a flexible film can be easily obtained.
- the structural unit B is derived from a diamine compound, and for example, at least one selected from the group consisting of compounds represented by the following formulas can be mentioned.
- the structural unit B1 derived from at least one selected from the group consisting of the compounds represented by the following formulas.
- the structural unit B contains the structural unit B2 derived from at least one selected from the group consisting of the compounds represented by the following formulas.
- the structural unit B2 contains a structural unit derived from the compound represented by the following formula (4), the obtained polyimide resin is more preferable because of its excellent solubility in an organic solvent.
- the polyimide resin according to the present embodiment preferably contains the above-mentioned structural unit B1 or the structural unit B2 in a ratio of 60 mol% or more as the structural unit B derived from diamine.
- the ratio of the structural unit B1 or the structural unit B2 in the structural unit B is 60 mol% or more, a polyimide resin having excellent solubility in an organic solvent can be obtained.
- the ratio of the structural unit B1 or the structural unit B2 in the structural unit B is more preferably 70 mol% or more, further preferably 80 mol% or more, still more preferably 95 mol% or more, and particularly preferably 100 mol%. .. Above all, it is preferable that the constituent unit B includes the constituent unit B2, and the constituent unit B2 contains the constituent unit derived from the diamine represented by the formula (4) in the above ratio.
- the weight average molecular weight of the polyimide resin is preferably 70,000 or less. When the weight average molecular weight is 70,000 or less, it has better solubility in an organic solvent and is therefore suitable for forming a cured film.
- the weight average molecular weight is preferably 60,000 or less, more preferably 50,000 or less, still more preferably 45,000 or less, still more preferably 40,000 or less. Since a cured film having desired mechanical properties can be obtained, the weight average molecular weight of the polyimide resin is preferably 5,000 or more.
- the weight average molecular weight of the polyimide resin is more preferably 10,000 or more, still more preferably 13,000 or more, and even more preferably 15,000 or more.
- the weight average molecular weight of the polyimide resin is in the above range, it has solubility in an organic solvent and, for example, a photosensitive polyimide resin composition having a low residual film ratio in an unexposed portion and excellent developability.
- a resin composition can be obtained.
- the weight average molecular weight is a polystyrene-equivalent weight average molecular weight.
- the polyimide resin according to the present embodiment contains a structural unit A derived from a tetracarboxylic acid dianhydride and a structural unit B derived from a diamine compound, and the raw material tetracarboxylic acid dianhydride and the diamine compound are described above. It's a street.
- the polyimide resin according to this embodiment can be obtained by reacting the above tetracarboxylic acid with a diamine component.
- the polyimide resin according to this embodiment has an amino group at the terminal.
- the organic solvent used for reacting the tetracarboxylic acid component and the diamine component is not particularly limited, but is an organic solvent containing at least one selected from the group consisting of, for example, cyclic ethers, cyclic ketones, cyclic esters, amides and ureas. Is preferable.
- Specific examples of the suitable solvent are not particularly limited, but ⁇ -butyrolactone, N, N-dimethylacetamide, N, N-dimethylformamide, N-methyl-2-pyrrolidone, dimethyl sulfoxide, hexamethylphosphoramide, cyclo.
- At least one selected from the group consisting of aprotonic polar organic solvents such as pentanone, cyclohexanone, 1,3-dioxolane, 1,4-dioxane, tetramethylurea and tetrahydrofuran can be mentioned.
- aprotonic polar organic solvents such as pentanone, cyclohexanone, 1,3-dioxolane, 1,4-dioxane, tetramethylurea and tetrahydrofuran
- ⁇ -butyrolactone N, N-dimethylacetamide, N, N-dimethylformamide and N-methyl-2-pyrrolidone is more preferable.
- An imidization catalyst can be used when reacting the tetracarboxylic acid component with the diamine component.
- a tertiary amine compound is preferable, and specifically, trimethylamine, triethylamine (TEA), tripropylamine, tributylamine, triethanolamine, N, N-dimethylethanolamine, N, N-diethylethanolamine.
- TAA triethylamine
- Triethylenediamine N-methylpyrrolidine, N-ethylpyrrolidine, N-methylpiperidine, N-ethylpiperidine, imidazole, pyridine, quinoline and isoquinoline.
- the reaction temperature is, for example, in the range of 160 to 200 ° C, preferably in the range of 170 to 190 ° C, and more preferably in the range of 180 to 190 ° C. If it is at least the above lower limit, imidization and molecular weight increase sufficiently proceed. When the value is not more than the above upper limit, the viscosity of the solution can be appropriately maintained, and problems such as the resin being burnt on the wall surface of the reaction vessel can be avoided. In some cases, an azeotropic dehydrating agent such as toluene or xylene may be used.
- the reaction pressure is usually normal pressure, but if necessary, the reaction can be carried out under pressure.
- the holding time of the reaction temperature is preferably at least 1 hour or more, and more preferably 3 hours or more. If it is 1 hour or more, imidization and high molecular weight can be sufficiently promoted. There is no particular upper limit to the reaction time, but the reaction time is, for example, in the range of 3 to 10 hours.
- the polyimide resin it is preferable to react the tetracarboxylic acid component "A mol" and the diamine component "B mol" in the range of 0.80 ⁇ A / B ⁇ 0.99, preferably 0. It is more preferable to react in the range of .85 ⁇ A / B ⁇ 0.95.
- a / B ⁇ 0.99 it is possible to make the terminal of the polyimide an excess of diamine, a polyimide resin having an amino group at the terminal can be obtained, and sufficient solubility in an organic solvent can be obtained.
- a polyimide resin having a molecular weight can be obtained.
- a polyimide resin having a molecular weight that exhibits sufficient flexibility can be obtained.
- a / B approaches 1.0, a polyimide resin having a high molecular weight can be obtained. Therefore, by appropriately adjusting the A / B, a polyimide resin having a desired molecular weight can be obtained.
- Modified polyimide resin (A) It is preferable that the polyimide resin according to the present embodiment contains a modified polyimide resin having a repeating structure represented by the following general formula (1).
- R is a tetravalent group having a cyclic structure, an acyclic structure, or a cyclic structure and a non-cyclic structure and having 4 to 25 carbon atoms, preferably 4 to 10 carbon atoms.
- A has at least one group selected from the group consisting of an aliphatic hydrocarbon group, an alicyclic hydrocarbon group, an aromatic hydrocarbon group, and an organosiloxane group, and has a divalent group having 2 to 39 carbon atoms. Is the basis of.
- the main chain of A is selected from the group consisting of -O-, -SO 2- , -CO-, -CH 2- , -C (CH 3 ) 2- , -C 2 H 4 O-, and -S-. At least one group may be intervened. n indicates the number of repeating units.
- the end of the general formula (1) is either the group represented by the following general formula (2) or the general formula (3), or a hydrogen atom, and at least one of the ends is the general formula (2) or the general formula ( It is a group shown in 3). ]
- X and X 2 are each independently a group having 2 to 15 carbon atoms and have at least one group selected from the group consisting of an ester bond and a double bond. You may. Y and Y 2 are independently hydrogen atoms or methyl groups, respectively.
- R in the general formula (1) has at least a cyclic structure, and the cyclic structure is formed by removing four hydrogen atoms from, for example, cyclohexane, cyclopentane, cyclobutane, bicyclopentane and their stereoisomers.
- the tetravalent group to be used is mentioned.
- R in the general formula (1) as described above for the polyimide resin, a structural unit derived from any tetracarboxylic acid can be included. Preferred examples are as described above, and examples of the structural unit include the following structures.
- a tetravalent group formed by removing four hydrogen atoms from cyclohexane is more preferable.
- a in the general formula (1) has at least one group selected from the group consisting of an aliphatic hydrocarbon group, an alicyclic hydrocarbon group, an aromatic hydrocarbon group, and an organosiloxane group, and has 2 carbon atoms. It is a divalent group of ⁇ 39.
- the main chain of A is selected from the group consisting of -O-, -SO 2- , -CO-, -CH 2- , -C (CH 3 ) 2- , -C 2 H 4 O-, and -S-. At least one group may be intervened.
- A is cyclohexane, dicyclohexylmethane, dimethylcyclohexane, isophorone, norbornan and their alkyl substituents, and halogen substituents; benzene, naphthalene, biphenyl, diphenylmethane, diphenyl ether, diphenyl sulfone, benzophenone and alkyl of these.
- A preferably has a cyclic structure, and preferably has at least one selected from the group consisting of an alicyclic hydrocarbon group and an aromatic hydrocarbon group.
- A preferably has an aromatic ring as an aromatic hydrocarbon group. More specifically, a divalent group having 6 to 27 carbon atoms represented by the following structural formula is preferably mentioned.
- At least one group (IA) selected from the group consisting of the structures shown below is preferably mentioned.
- a in the general formula (1) has a group represented by the following formula (Ic).
- the modified polyimide resin (A) according to the present embodiment is at least one structural unit selected from the above (Ia), (Ib) or (Ic) as A in the general formula (1). It is preferable that the ratio of the above is 60 mol% or more from the viewpoint of solubility in an organic solvent.
- the ratio of at least one structural unit selected from the above (Ia), (Ib) or (Ic) in A in the general formula (1) is more preferably 70 mol% or more, still more preferably 70 mol% or more. It is 80 mol% or more, more preferably 95 mol% or more, and particularly preferably 100 mol%. Above all, it is preferable to include the structural unit derived from the diamine represented by the formula (Ic) in the above ratio.
- N indicating the number of repeating units of the structural unit represented by the general formula (1) is preferably 5 to 250, more preferably 10 to 200, and further preferably 15 to 150.
- n is 5 or more, a cured film having desired mechanical characteristics can be obtained.
- n is 250 or less, sufficient solubility in an organic solvent can be ensured.
- the modified polyimide resin (A) has either a group represented by the above general formula (2) or the general formula (3) or a hydrogen atom at the end, and at least one of the ends is a general formula ( 2) or a group represented by the general formula (3).
- the modified polyimide resin (A) may have a structure in which one end is represented by the general formula (2) or the general formula (3), or both ends are in the general formula (2) or the general formula (3). It may have the structure shown.
- the group represented by X or X 2 in the general formula (2) or the general formula (3) is a group having 2 to 15 carbon atoms, and is at least one selected from the group consisting of an ester bond and a double bond. It may have a group.
- the group represented by Y or Y 2 is a hydrogen atom or a methyl group.
- the structure represented by the general formula (2) or the general formula (3) more specifically corresponds to a structure obtained by reacting a terminal amine of a polyimide resin with a functional group-containing compound.
- a functional group-containing compound include compounds having an isocyanate group or an epoxy group and a (meth) acrylic group.
- the compound include 2-isocyanatoethyl methacrylate, 2-isocyanatoethyl acrylate, 1,1-bis (acryloyloxymethyl) ethyl isocyanate, glycidyl methacrylate, glycidyl acrylate, allyl glycidyl ether and the like.
- the structure represented by the general formula (2) or the general formula (3) may have a structure in which the compound and the amine terminal are reacted.
- the weight average molecular weight of the modified polyimide resin (A) is preferably 70,000 or less. When the weight average molecular weight is 70,000 or less, it has better solubility in an organic solvent and is therefore suitable for forming a cured film.
- the weight average molecular weight is preferably 60,000 or less, more preferably 50,000 or less, still more preferably 45,000 or less, still more preferably 40,000 or less. Since a cured film having desired mechanical properties can be obtained, the weight average molecular weight of the modified polyimide resin (A) is preferably 5,000 or more.
- the weight average molecular weight of the modified polyimide resin (A) is more preferably 10,000 or more, still more preferably 13,000 or more, and even more preferably 15,000 or more.
- the weight average molecular weight of the modified polyimide resin (A) is in the above range, a resin composition having a low residual film ratio in the unexposed portion and having excellent developability can be obtained.
- the weight average molecular weight is a polystyrene-equivalent weight average molecular weight.
- the modified polyimide resin (A) can be obtained by reacting the diamine component described in detail below with the tetracarboxylic acid component.
- diamine component examples include diamines, diisocyanates and diaminodisilanes, and diamines are preferable.
- the diamine content in the diamine component used as a raw material is preferably 50 mol% or more, and may be 100 mol%.
- the diamine may be either an aliphatic diamine or an aromatic diamine, or a mixture thereof.
- the "aromatic diamine” represents a diamine in which an amino group is directly bonded to an aromatic ring, and a part of its structure contains an aliphatic group, an alicyclic group, and other substituents. May be good.
- the "aliphatic diamine” represents a diamine in which an amino group is directly bonded to an aliphatic group or an alicyclic group, and an aromatic group or other substituent may be contained as a part of the structure thereof.
- any of the above aliphatic diamines can be used.
- the aliphatic diamine include 4,4'-diaminodicyclohexylmethane, ethylenediamine, hexamethylenediamine, polyethylene glycol bis (3-aminopropyl) ether, polypropylene glycol bis (3-aminopropyl) ether, and 1,3-bis.
- examples thereof include (aminomethyl) cyclohexane, 1,4-bis (aminomethyl) cyclohexane, m-xylylene diamine, p-xylylene diamine, isophorone diamine, norbornan diamine and siloxane diamines.
- aromatic diamine examples include 4,4'-diaminodiphenyl ether, 4,4'-diaminodiphenylmethane, 4,4'-diaminodiphenylsulfone, m-phenylenediamine, p-phenylenediamine, diaminobenzophenone, 2,6.
- the diamine is 4,4'-diamino-2,2'-bis (trifluoromethyl) biphenyl, 4,4'-oxybis [3- (trifluoromethyl) benzeneamine] or 1- (4-aminophenyl). It preferably contains at least -2,3-dihydro-1,3,3-trimethyl-1H-inden-5-amine.
- the photosensitive resin composition containing the modified polyimide resin (A) obtained by containing at least one of them as a diamine component has high light transmittance at a specific wavelength and high solubility in an organic solvent. Therefore, the curability of the exposed portion is excellent, the residual film ratio of the unexposed portion is low, and the developability is excellent.
- the modified polyimide resin (A) according to the present embodiment is the above-mentioned 4,4'-diamino-2,2'-bis (trifluoromethyl) biphenyl, 1- (4-aminophenyl) -2,3-dihydro-1. , 3,3-trimethyl-1H-inden-5-amine or 4,4'-oxybis [3- (trifluoromethyl) benzeneamine] is preferably contained.
- tetracarboxylic acid component any one can be used as the tetracarboxylic acid component.
- the tetracarboxylic acid component include cyclohexanetetracarboxylic acid, cyclohexanetetracarboxylic acid esters, cyclohexanetetracarboxylic acid dianhydride, cyclobutanetetracarboxylic acid, cyclobutanetetracarboxylic acid esters, cyclobutanetetracarboxylic acid dianhydride, and cyclo.
- Examples thereof include pentanetetracarboxylic acid, cyclopentanetetracarboxylic acid esters, cyclopentanetetracarboxylic acid dianhydride, and bicyclopentanetetracarboxylic acid dianhydride.
- cyclohexanetetracarboxylic acid dianhydride, cyclobutanetetracarboxylic acid dianhydride and cyclopentanetetracarboxylic acid dianhydride can be more preferably mentioned.
- cyclohexanetetracarboxylic acid dianhydride is more preferable.
- the various tetracarboxylic acid components described above contain positional isomers.
- 1,2,4,5-cyclohexanetetracarboxylic acid 1,2,4,5-cyclohexanetetracarboxylic acid dianhydride, 1,2,4,5-cyclohexane Tetracarboxylic acid methyl ester, 1,2,3,4-butanetetracarboxylic acid, 1,2,3,4-butanetetracarboxylic acid dianhydride, 1,2,3,4-butanetetracarboxylic acid methyl ester, 1,2,3,4-Cyclobutanetetracarboxylic acid, 1,2,3,4-cyclobutanetetracarboxylic acid dianhydride, 1,2,3,4-cyclobutanetetracarboxylic acid methyl ester, 1,2,4 5-Cyclopentanetetracarboxylic acid, 1,2,4,5-cyclopentanetetracarboxylic acid dianhydride, 1,2,4,5-cyclopentanetetracarboxylic acid dianhydride, 1,2,4,5-cyclopentanetetracarbox
- 1,2,4,5-cyclohexanetetracarboxylic acid 1,2,4,5-cyclohexanetetracarboxylic acid dianhydride, 1,2,3,4-cyclobutanetetracarboxylic acid dianhydride, 1 , 2,4,5-Cyclohexanetetracarboxylic acid methyl ester is particularly preferable because it is easy to increase the molecular weight when producing a polyimide resin and it is advantageous in that a flexible film can be easily obtained.
- the tetracarboxylic acid component may contain another tetracarboxylic acid or a derivative thereof as long as the finally obtained cured film, for example, the flexibility and thermocompression bonding property of the film is not impaired.
- these other tetracarboxylic acids or derivatives thereof include pyromellitic acid, 3,3', 4,4'-biphenyltetracarboxylic acid, 2,3,3', 4'-biphenyltetracarboxylic acid, 2, 2-Bis (3,4-dicarboxyphenyl) propane, 2,2-bis (2,3-dicarboxyphenyl) propane, 2,2-bis (3,4-dicarboxyphenyl) -1,1,1 , 3,3,3-hexafluoropropane, 2,2-bis (2,3-dicarboxyphenyl) -1,1,1,3,3,3-hexafluoropropane, bis (3,4-dicarboxyphenyl) Phenyl) sulf
- the modified polyimide resin (A) according to the present embodiment can be obtained by the following steps (1) and (2): Step (1): The tetracarboxylic acid component and the diamine component are reacted to obtain a polyimide resin having an amino group at the terminal. Step (2): The polyimide resin having an amino group at the terminal obtained in the above step (1) is reacted with the above functional group-containing compound (a compound having an isocyanate group or an epoxy group and a (meth) acrylic group). Let me. In the step (1), the above-mentioned tetracarboxylic acid is reacted with the diamine component to obtain a polyimide resin having an amino group at the terminal.
- the above step (1) is the same as the above-mentioned method for producing a polyimide resin. The same applies to those used as raw materials, preferable ones, and reaction conditions.
- Step (2) is a step of modifying the end of the polyimide resin obtained in the above step (1). Specifically, as described above, the polyimide is reacted with the functional group-containing compound (a compound having an isocyanate group or an epoxy group and a (meth) acrylic group) to have a (meth) acrylic group at the terminal. A modified polyimide resin (A) is obtained.
- the functional group-containing compound a compound having an isocyanate group or an epoxy group and a (meth) acrylic group
- the functional group-containing compound that modifies the terminal of the polyimide resin is a compound having an isocyanate group or an epoxy group and a (meth) acrylic group, and specifically, 2-isocyanatoethyl methacrylate and 2-isocyanatoethyl. Examples thereof include acrylate, 1,1-bis (acryloyloxymethyl) ethyl isocyanate, glycidyl methacrylate, and allyl glycidyl ether. These functional group-containing compounds may be used alone or in combination of two or more.
- the functional group-containing compound is preferably used at a ratio of 0.1 to 30 mol times that of the polyimide resin having an amino group at the terminal.
- the reaction temperature in the step (2) is preferably in the range of 30 to 100 ° C., and the reaction time is preferably 1 to 10 hours.
- the reaction may be carried out as it is, or may be reacted in the presence of a catalyst if necessary.
- the catalyst include amine compounds such as triethylamine and organophosphorus compounds such as triphenylphosphine, which may be used alone or in combination of two or more.
- a polymerization inhibitor may be used to suppress side reactions during the reaction. Examples of the polymerization inhibitor include hydroquinone, hydroquinone monomethyl ether, and methylhydroquinone, which may be used alone or in combination of two or more.
- the polyimide resin according to the present embodiment has a light transmittance of preferably 50% or more, more preferably 55% or more, still more preferably 60% or more, still more preferably 70% or more at a wavelength of 200 to 400 nm.
- the modified polyimide resin (A) according to the present embodiment has a high light transmittance at the above wavelength and has excellent solubility in an organic solvent. Therefore, since the photopolymerization initiator that can be contained in the composition acts effectively, a cured film can be efficiently obtained.
- the modified polyimide resin (A) when a cured film is formed from the composition, the residual film ratio of the unexposed portion is low, the developability is excellent, and the generation of cracks and the like is effective. Can be suppressed.
- organic solvent an aprotic polar solvent is desirable from the viewpoint of solubility.
- Examples thereof include amide, N-acetyl- ⁇ -caprolactam, dimethylimidazolidonene, diethylene glycol dimethyl ether, triethylene glycol dimethyl ether and ⁇ -butyrolactone.
- These organic solvents may be used alone or in combination of two or more.
- solvents such as toluene, xylene, diethyl ketone, methoxybenzene and cyclopentanone may be mixed as long as they do not adversely affect the solubility of the polymer.
- the photosensitive polyimide resin composition according to the present embodiment can be used in a solution (varnish) state, which is convenient for forming a film.
- a polyfunctional radically polymerizable monomer for example, a bifunctional or higher functional (meth) acrylic monomer
- examples of the (meth) acrylic monomer include tricyclodecanedimethanol di (meth) acrylate, polypropylene glycol di (meth) acrylate, trimethylol propanetri (meth) acrylate, ethoxylated trimethylol propanetri (meth) acrylate, and propoxy.
- the polyglycerin-based (meth) acrylate refers to a compound having a polyglycerin skeleton and a (meth) acryloyl group.
- examples of the polyglycerin-based (meth) acrylate include SA-TE6 and SA-TE60 manufactured by Sakamoto Yakuhin Kagaku.
- the ethoxylated trimethylolpropane tri (meth) acrylate examples include ethoxylated (3) trimethylolpropane triacrylate and ethoxylated (6) trimethylolpropane triacrylate and ethoxylated (15) trimethylolpropane manufactured by Arkema Co., Ltd. Triacrylate or the like can be used.
- the dendrimer (meth) acrylate refers to a polyfunctional (meth) acrylate having a dendrimer structure (including a hyperbranched structure). Examples of the dendrimer (meth) acrylate include Viscoat 1000, Viscoat 1020, and STAR-501 manufactured by Osaka Organic Chemical Industry Co., Ltd.
- the biscoat 1000 and the biscoat 1020 are mainly composed of a dendrimer type polyester acrylate having an acrylate group at the terminal.
- the molecular weight of the biscoat 1000 is about 1000 to 2000, and the molecular weight of the viscoat 1020 is about 1000 to 3000.
- STAR-501 contains a core derived from dipentaerythritol and contains a dipentaerythritol hexaacrylate-linked multi-branched polyacrylate having an acrylate group at the terminal as a main component.
- the molecular weight of STAR501 is about 16000 to 24000.
- a polyfunctional (meth) acrylate having four or more (meth) acryloyl groups in the molecule is preferable from the viewpoint of suppressing the generation of cracks in the exposed portion after development, and the molecule is preferable. More preferably, a polyfunctional (meth) acrylate having 4 or more and 10 or less (meth) acryloyl groups.
- the flexibility of the photosensitive polyimide resin composition can be controlled by the structure of the photopolymerizable compound to be mixed.
- These photopolymerizable compounds are preferably mixed at a ratio of 5 to 500 parts by mass with respect to 100 parts by mass of the polyimide resin contained in the photosensitive polyimide resin composition.
- the photopolymerization initiator is not particularly limited, and known photopolymerization initiators can be used.
- photopolymerization initiators may be used alone or in combination of two or more.
- the photopolymerization initiator is preferably mixed at a ratio of 0.1 to 10 parts by mass with respect to 100 parts by mass of the polyimide resin contained in the photosensitive polyimide resin composition.
- the sensitizer is not particularly limited, and known ones can be used.
- an amino group-containing sensitizer can be mentioned, and a compound having an amino group and a phenyl group in the same molecule can be preferably exemplified.
- the leveling agent is not particularly limited, and known ones can be used.
- a silicon-based surface conditioner an acrylic surface conditioner, a fluorine-based surface conditioner, a nonionic surface conditioner, a cationic surface conditioner, and an anionic surface conditioner can be used.
- Various surface conditioners such as adjusters can be used. These may be used alone or in combination of two or more.
- the leveling agent is preferably mixed at a ratio of 0.001 to 20 parts by mass with respect to 100 parts by mass of the polyimide resin contained in the photosensitive polyimide resin composition.
- the adhesion improver is not particularly limited, and known ones can be used, and an amino group-containing silane coupling agent, an epoxy group-containing silane coupling agent, a mercapto group-containing silane coupling agent, and a (meth) acrylic group-containing silane coupling agent can be used.
- Known coupling agents such as silane coupling agents such as agents, titanate coupling agents, and aluminate coupling agents can be used.
- the coupling agent include KP-390, KA-1003, KBM-1003, KBE-1003, KBM-303, KBM-403, KBE-402, KBE-403, KBM-1403, KBM-502, KBM-.
- the adhesion improver is preferably mixed at a ratio of 0.0005 to 20 parts by mass with respect to 100 parts by mass of the polyimide resin contained in the photosensitive polyimide resin composition.
- the photosensitive polyimide resin composition according to the present embodiment is not particularly limited, but can be prepared as follows.
- a photosensitive polyimide composition can be obtained by mixing a polyimide resin with at least one selected from the group consisting of an organic solvent, a photopolymerization initiator and a photopolymerizable compound. If necessary, as described above, at least one selected from the group consisting of a sensitizer, a leveling agent and an adhesion improver may be further mixed.
- the polyimide varnish according to the present embodiment contains a polyimide resin and an organic solvent, and may further contain at least one selected from the group consisting of a photopolymerization initiator and a photopolymerizable compound. Further, if necessary, at least one selected from the group consisting of a sensitizer, a leveling agent and an adhesion improver may be further mixed as described above. Specific examples of each component are as described above.
- the polyimide varnish according to the present embodiment may be the polyimide solution itself in which the polyimide resin obtained by the polymerization method is dissolved in a reaction solvent, or the polyimide solution is further diluted with an organic solvent. There may be.
- the polyimide varnish according to the present embodiment preferably contains 5 to 40% by mass of the polyimide resin described in detail, and more preferably 10 to 30% by mass.
- the viscosity of the polyimide varnish is preferably 1 to 200 Pa ⁇ s, more preferably 1 to 100 Pa ⁇ s.
- the viscosity of the polyimide varnish is a value measured at 25 ° C. using an E-type viscometer.
- the method for producing the polyimide varnish is not particularly limited, and a known method can be applied.
- Step (b) Next, the film obtained in step (a) is exposed.
- the exposure of the film may be performed, for example, by irradiating a film made of a photosensitive polyimide resin composition formed on a substrate with light (usually using ultraviolet rays) through a photomask having a predetermined pattern. can.
- the exposed film has a portion where light is blocked by a photomask and a portion irradiated with light, that is, an exposed portion and an unexposed portion.
- the polyimide resin in the photosensitive polyimide resin composition is crosslinked to form a crosslinked polyimide film, and a pattern is formed by the next developing step (step (c)).
- the ultraviolet irradiation amount is preferably 100 to 8,000 mJ / cm 2 and more preferably 200 to 6,000 mJ / cm 2 as the integrated irradiation amount.
- Step (c) the exposed film is developed with a developing solution to form a pattern composed of the film on the substrate.
- a developing solution for example, after irradiating a film made of a photosensitive polyimide resin composition formed on a substrate with light, the unexposed portion can be dissolved and removed with a developing solution to obtain a desired relief pattern.
- the step (c) is a step of measuring the Hansen solubility parameter of the film before exposure (c1), and the relative energy difference (RED) from the film before exposure is 0.50 or more 1 using the obtained Hansen solubility parameter. It is preferable to include a step (c2) of selecting a developer having a solubility of .4 or less.
- the RED is 0.50 or more, preferably 0.52 or more, more preferably 0.55 or more, still more preferably 0.60 or more, and more preferably 0.60 or more, from the viewpoint of suppressing the occurrence of cracks in the exposed portion after development. From the viewpoint of suppressing the formation of the residue of the unexposed portion after development, it is 1.4 or less, preferably 1.3 or less, more preferably 1.2 or less, and further preferably 1.1 or less.
- the method for manufacturing a patterned substrate according to the present embodiment it is preferable to use an organic solvent as a developer.
- the developing solution dissolves the photosensitive polyimide resin composition according to the present embodiment, and is not particularly limited as long as the relative energy difference (RED) from the film before exposure is within the above range.
- RED relative energy difference
- the relief pattern formed by development is then washed with a rinse solution to remove the development solvent.
- a rinse solution Preferable examples of the rinsing solution include methanol, ethanol, isopropyl alcohol, water and the like, which are miscible with the developing solution.
- Step (d) In the method for manufacturing a patterned substrate according to the present embodiment, the step (d) of heat-treating the pattern may be further included after the step (c). Thereby, a cured film (pattern) formed by curing the photosensitive polyimide resin composition of the present embodiment can be obtained.
- the relief pattern obtained by the above-mentioned treatment is heat-treated at a temperature selected from the range of 80 to 400 ° C. to remove the organic solvent, and the photosensitive polyimide resin composition of the present embodiment is cured.
- a film (pattern) can be obtained.
- the unexposed portion has excellent developability, that is, the exposed portion is sufficiently cured, and the unexposed portion is due to the high solubility of the modified polyimide resin contained in the photosensitive polyimide resin composition in a high organic solvent. Since the resin composition that is sufficiently removed is used, the obtained relief pattern can be obtained with high resolution.
- the thickness of the pattern after heat treatment that is, the thickness of the cured film obtained by curing the photosensitive polyimide resin composition of the present embodiment is preferably 5 ⁇ m or more and 85 ⁇ m or less.
- the film thickness is in the above range, it can be used as an excellent insulating film.
- the thicker the film that is, the larger the amount of the photosensitive polyimide resin composition applied to the substrate), the more often problems occur in the solubility of the polyimide resin in the organic solvent.
- the modified polyimide resin (A) it is possible to achieve both excellent solubility in an organic solvent and transparency even in such a situation.
- the cured film of the present embodiment can be suitably used, for example, in an insulating film application where a high voltage is expected to be applied.
- the cured film obtained from the photosensitive polyimide resin composition of the present embodiment containing the modified polyimide resin (A) can effectively suppress the occurrence of cracks and the like, and is excellent in physical properties.
- the patterned substrate according to this embodiment can be used for various purposes. For example, it can be suitably used for a surface protective film for a semiconductor element of an electronic device, an interlayer insulating film, a wiring protective insulating film for a circuit board, and particularly for the above-mentioned applications having high density and high integration.
- the pattern of the patterned substrate becomes the surface protective film of the semiconductor element of the electronic device, the interlayer insulating film, and the wiring protective insulating film of the circuit board.
- TEA triethylamine
- Weight average molecular weight (Mw) Mw was determined by GPC analysis.
- the equipment and analysis conditions used for the analysis are as follows.
- Flow velocity 0.6 ml / min
- HSP Hansen solubility parameter
- This film is cut to an appropriate size, and acetone, N, N-dimethylacetamide (hereinafter, DMAc), and methyl ethyl ketone (hereinafter, MEK), which are solvents for which HSP is known (HSP is registered in the HSPiP database), respectively, are cut into appropriate sizes.
- DMAc N, N-dimethylacetamide
- MEK methyl ethyl ketone
- Diacetone alcohol N-methyl-2-pyrrolidone (hereinafter NMP), N, N-dimethylformamide (hereinafter DMF), dichloromethane, cyclopentanone, ⁇ -caprolactone, ethyl lactate (hereinafter EL), propylene glycol Monomethyl ether acetate (hereinafter PGMEA), propylene glycol monomethyl ether (hereinafter PGME), cyclohexanone, ethyl acetate, tetrahydrofuran, acetonitrile, GBL, methyl isobutyl ketone (hereinafter MIBK), dimethyl sulfoxide, butyl acetate, butyl benzoate, benzyl For alcohol, 2-phenoxyethanol, 1-butanol, 1,1,2,2-tetrachloroethane, dipropylene glycol, cyclohexanol, chloroform, ethanol, toluene, methanol,
- the film is visually determined to be soluble or insoluble in each solvent, and R0 : interaction with HSP ( ⁇ d: dispersion term, ⁇ p: polar term, ⁇ h: hydrogen bond term) using the Hansen sphere method described above.
- HSP dispersion term
- ⁇ p polar term
- ⁇ h hydrogen bond term
- the Fit value which is the ratio of the good solvent to the Hansen sphere, was 0.882.
- HSP Hansen solubility parameter
- This film is cut to an appropriate size, and acetone, N, N-dimethylacetamide (hereinafter, DMAc), and methyl ethyl ketone (hereinafter, MEK), which are solvents for which HSP is known (HSP is registered in the HSPiP database), respectively, are cut into appropriate sizes.
- DMAc N, N-dimethylacetamide
- MEK methyl ethyl ketone
- Diacetone alcohol N-methyl-2-pyrrolidone (hereinafter NMP), N, N-dimethylformamide (hereinafter DMF), dichloromethane, cyclopentanone, ⁇ -caprolactone, ethyl lactate (hereinafter EL), propylene glycol Monomethyl ether acetate (hereinafter PGMEA), propylene glycol monomethyl ether (hereinafter PGME), cyclohexanone, ethyl acetate, tetrahydrofuran, acetonitrile, GBL, methyl isobutyl ketone (hereinafter MIBK), dimethyl sulfoxide, butyl acetate, butyl benzoate, benzyl For alcohol, 2-phenoxyethanol, 1-butanol, 1,1,2,2-tetrachloroethane, dipropylene glycol, cyclohexanol, chloroform, ethanol, toluene, methanol,
- the film is visually determined to be soluble or insoluble in each solvent, and R0 : interaction with HSP ( ⁇ d: dispersion term, ⁇ p: polar term, ⁇ h: hydrogen bond term) using the Hansen sphere method described above.
- HSP dispersion term
- ⁇ p polar term
- ⁇ h hydrogen bond term
- Example 1 As shown in Table 1, a polyimide varnish was prepared with the same compounding ratio as in Calculation 1 of HSP described above. This polyimide varnish is applied onto a silicon wafer using a spin coater (MS-B150) manufactured by Mikasa Co., Ltd. under the condition that the film thickness of the polyimide film after drying is 25 to 30 ⁇ m, and 100 on a hot plate. The temperature was dried for 5 minutes. After cooling to room temperature, a mask aligner (MA-10) manufactured by Mikasa Co., Ltd.
- MS-B150 spin coater
- MA-10 mask aligner
- a high-pressure mercury lamp is used as a light source, and under the condition of an exposure amount of 5,000 mJ / cm 2 at an exposure wavelength of 365 nm, the temperature is 30 ⁇ m / 50 ⁇ m.
- the photomask on which the L / S (line & space) pattern was drawn was exposed and allowed to stand at room temperature for 15 minutes. Then, the developer was immersed in ethyl lactate (EL) for 90 seconds, rinsed with methanol, and the residual solvent was removed under air flow to form a 30 ⁇ m / 50 ⁇ m resin pattern on the silicon wafer. Next, a digital microscope was used to observe and evaluate the developability of the pattern and the presence or absence of cracks in the exposed area.
- EL ethyl lactate
- Example 2 A polyimide varnish was prepared in the same manner as in Example 1 except that propylene glycol monomethyl ether acetate (PGMEA) was used as a developing solution, and evaluated in the same manner as in Example 1.
- PGMEA propylene glycol monomethyl ether acetate
- Example 3 A polyimide varnish was prepared in the same manner as in Example 1 except that propylene glycol monomethyl ether (PGME) was used as a developing solution, and evaluated in the same manner as in Example 1.
- PGME propylene glycol monomethyl ether
- Example 4 A polyimide varnish was prepared in the same manner as in Example 1 except that cyclohexanone was used as a developing solution, and evaluated in the same manner as in Example 1.
- Example 5 A polyimide varnish was prepared in the same manner as in Example 1 except that acetonitrile was used as a developing solution, and evaluated in the same manner as in Example 1.
- Example 6 A polyimide varnish was prepared in the same manner as in Example 1 except that methyl isobutyl ketone (MIBK) was used as a developing solution, and evaluated in the same manner as in Example 1.
- MIBK methyl isobutyl ketone
- Example 9 A polyimide varnish was prepared in the same manner as in Example 1 except that butyl acetate was used as a developing solution, and evaluated in the same manner as in Example 1.
- Example 10 A polyimide varnish was prepared in the same manner as in Example 1 except that 1,4-dioxane was used as a developing solution, and evaluated in the same manner as in Example 1.
- Example 1 A polyimide varnish was prepared in the same manner as in Example 1 except that acetone was used as a developing solution, and evaluated in the same manner as in Example 1.
- Example 2 A polyimide varnish was prepared in the same manner as in Example 1 except that N, N-dimethylacetamide (DMAc) was used as a developing solution, and evaluated in the same manner as in Example 1.
- DMAc N, N-dimethylacetamide
- Example 3 A polyimide varnish was prepared in the same manner as in Example 1 except that methyl ethyl ketone (MEK) was used as a developing solution, and evaluated in the same manner as in Example 1.
- MEK methyl ethyl ketone
- Example 4 A polyimide varnish was prepared in the same manner as in Example 1 except that cyclohexane was used as a developing solution, and evaluated in the same manner as in Example 1.
- Table 2 shows the results obtained in Examples 1 to 10 and Comparative Examples 1 to 4.
- Example 11 As shown in Table 3, a polyimide varnish was prepared with the same compounding ratio as in Calculation 2 of HSP described above. This polyimide varnish is applied onto a silicon wafer using a spin coater (MS-B150) manufactured by Mikasa Co., Ltd. under the condition that the film thickness of the polyimide film after drying is 25 to 30 ⁇ m, and 100 on a hot plate. The temperature was dried for 5 minutes. After cooling to room temperature, a mask aligner (MA-10) manufactured by Mikasa Co., Ltd.
- MS-B150 spin coater
- MA-10 mask aligner manufactured by Mikasa Co., Ltd.
- a high-pressure mercury lamp is used as a light source, and under the condition of an exposure amount of 5,000 mJ / cm 2 at an exposure wavelength of 365 nm, the temperature is 30 ⁇ m / 50 ⁇ m.
- the photomask on which the L / S (line & space) pattern was drawn was exposed and allowed to stand at room temperature for 15 minutes.
- a resin pattern of 30 ⁇ m / 50 ⁇ m was developed on a silicon wafer by dipping and developing with N-methyl-2-pyrrolidone (NMP) as a developer for 90 seconds, rinsing with methanol, and removing the residual solvent under air flow. Formed.
- NMP N-methyl-2-pyrrolidone
- Example 12 A polyimide varnish was prepared in the same manner as in Example 11 except that cyclopentanone was used as a developing solution, and evaluated in the same manner as in Example 11.
- Example 13 A polyimide varnish was prepared in the same manner as in Example 11 except that EL was used as a developing solution, and evaluated in the same manner as in Example 11.
- Example 14 A polyimide varnish was prepared in the same manner as in Example 11 except that PGMEA was used as a developing solution, and evaluated in the same manner as in Example 11.
- Example 15 A polyimide varnish was prepared in the same manner as in Example 11 except that cyclohexanone was used as a developing solution, and evaluated in the same manner as in Example 11.
- Example 18 A polyimide varnish was prepared in the same manner as in Example 11 except that butyl acetate was used as a developing solution, and evaluated in the same manner as in Example 11.
- Example 19 A polyimide varnish was prepared in the same manner as in Example 11 except that 1,4-dioxane was used as a developing solution, and evaluated in the same manner as in Example 11.
- Example 5 A polyimide varnish was prepared in the same manner as in Example 11 except that acetone was used as a developing solution, and evaluated in the same manner as in Example 11.
- Example 6 A polyimide varnish was prepared in the same manner as in Example 11 except that DMAc was used as a developing solution, and evaluated in the same manner as in Example 11.
- Example 7 A polyimide varnish was prepared in the same manner as in Example 11 except that cyclohexane was used as a developing solution, and evaluated in the same manner as in Example 11.
- Table 4 shows the results obtained in Examples 11 to 19 and Comparative Examples 5 to 7.
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Abstract
Description
感光性ポリイミド樹脂組成物を用いたパターン形成に関する技術としては、例えば、特許文献1~5に記載のものが挙げられる。
特許文献1~4には、有機溶媒に水を配合させた感光性ポリイミド用現像液が記載されている。特許文献5には、感光性ポリイミド樹脂組成物の現像液として、ClogPが-1~5の有機溶媒を含む現像液を使用することが記載されている。
基板上に、感光性ポリイミド樹脂組成物からなる膜を形成する工程(a)と、
上記膜を露光する工程(b)と、
露光された上記膜を現像液を用いて現像することにより、上記基板上に上記膜からなるパターンを形成する工程(c)と、を含み、
上記現像液と露光前の上記膜との相対的エネルギー差(RED)が0.50以上1.4以下であるパターン付き基板の製造方法。
[2]
上記工程(c)が、露光前の上記膜のハンセン溶解度パラメータを測定する工程(c1)と、得られた上記ハンセン溶解度パラメータを用いて露光前の上記膜との相対的エネルギー差(RED)が0.50以上1.4以下である現像液を選定する工程(c2)とを含む、上記[1]に記載のパターン付き基板の製造方法。
[3]
上記工程(a)が、ワニス状の感光性ポリイミド樹脂組成物を上記基板上に塗布する工程(a1)と、塗布された上記感光性ポリイミド樹脂組成物から有機溶媒を除去する工程と(a2)と、を含む、上記[1]または[2]に記載のパターン付き基板の製造方法。
[4]
上記工程(c)の後に、上記パターンを熱処理する工程(d)をさらに含む、上記[1]~[3]のいずれか一つに記載のパターン付き基板の製造方法。
[5]
熱処理後の上記パターンの厚みが5μm以上85μm以下である、上記[4]に記載のパターン付き基板の製造方法。
[6]
上記感光性ポリイミド樹脂組成物に含まれるポリイミド樹脂が、下記一般式(1)で示される繰り返し構造を有する変性ポリイミド樹脂(A)を含む、上記[1]~[5]のいずれか一つに記載のパターン付き基板の製造方法。
[上記一般式(1)中、Rは、環状構造、非環状構造、または環状構造と非環状構造とを有する炭素数4~25の4価の基である。Aは、脂肪族炭化水素基、脂環式炭化水素基、芳香族炭化水素基、およびオルガノシロキサン基からなる群から選択される少なくとも1種の基を有し、炭素数2~39の2価の基である。Aの主鎖には-O-、-SO2-、-CO-、-CH2-、-C(CH3)2-、-C2H4O-、および-S-からなる群から選択される少なくとも1種の基が介在していてもよい。nは繰り返し単位数を示す。上記一般式(1)の末端は、下記一般式(2)若しくは一般式(3)で示される基、または水素原子のいずれかであって、末端の少なくとも一方は下記一般式(2)若しくは下記一般式(3)で示される基である。]
[上記一般式(2)および(3)中、XおよびX2はそれぞれ独立に、炭素数2~15の基であり、エステル結合および二重結合からなる群から選択される少なくとも1つの基を有してもよい。YおよびY2はそれぞれ独立に、水素原子またはメチル基である。]
[7]
上記一般式(1)中のAが、脂環式炭化水素基および芳香族炭化水素基からなる群から選択される少なくとも1種を含む、上記[6]に記載のパターン付き基板の製造方法。
[8]
上記感光性ポリイミド樹脂組成物に含まれるポリイミド樹脂の重量平均分子量が5,000以上70,000以下である、上記[1]~[7]のいずれか一つに記載のパターン付き基板の製造方法。
[9]
上記感光性ポリイミド樹脂組成物に含まれるポリイミド樹脂の波長200~400nmにおける光線透過率が50%以上である、上記[1]~[8]のいずれか一つに記載のパターン付き基板の製造方法。
[10]
上記感光性ポリイミド樹脂組成物が、光重合開始剤、有機溶媒および光重合性化合物からなる群から選択される少なくとも1種をさらに含む、上記[1]~[9]のいずれか一つに記載のパターン付き基板の製造方法。
[11]
上記光重合性化合物が多官能ラジカル重合性モノマーを含む、上記[10]に記載のパターン付き基板の製造方法。
[12]
上記光重合性化合物が、分子中に4個以上の(メタ)アクリロイル基を有する多官能(メタ)アクリレートを含む、上記[10]または[11]に記載のパターン付き基板の製造方法。
[13]
上記感光性ポリイミド樹脂組成物が増感剤、レベリング剤および密着性向上剤からなる群から選択される少なくとも1種をさらに含む、上記[1]~[12]のいずれか一つに記載のパターン付き基板の製造方法。
工程(a):基板上に、感光性ポリイミド樹脂組成物からなる膜を形成する工程
工程(b):上記膜を露光する工程
工程(c):露光された上記膜を現像液を用いて現像することにより、上記基板上に上記膜からなるパターンを形成する工程
そして、上記現像液と露光前の上記膜との相対的エネルギー差(RED)が、現像後における露光部のクラックの発生を抑制する観点から、0.50以上、好ましくは0.52以上、より好ましくは0.55以上、さらに好ましくは0.60以上であり、そして、現像後における未露光部の残渣の生成を抑制する観点から、1.4以下、好ましくは1.3以下、より好ましくは1.2以下、さらに好ましくは1.1以下である。
RED=Ra/R0 (1)
上記式(1)中、Raは、溶質(すなわち、本実施形態においては露光前の上記膜)のハンセン溶解度パラメータ(以下、「HSP」とも呼ぶ。)と溶媒(すなわち、本実施形態においては現像液)のHSPとの距離、すなわちHSP距離であり、R0は、溶質の相互作用半径である。
Ra(HSP距離)は、下記式(2)により算出することができる。
Ra={4(δdS-δdL)2+(δpS-δpL)2+(δhS-δhL)2}0.5 (2)
上記式(2)中、δdSは溶質のロンドン分散力によるエネルギーであり、δpSは溶質の双極子相互作用によるエネルギーであり、δhSは溶質の水素結合によるエネルギーであり、δdLは溶媒のロンドン分散力によるエネルギーであり、δpLは溶媒の双極子相互作用によるエネルギーであり、δhLは溶媒の水素結合によるエネルギーである。
はじめに、基板上に、感光性ポリイミド樹脂組成物からなる膜を形成する。
工程(a)は、例えば、ワニス状の感光性ポリイミド樹脂組成物(以下、単に「ポリイミドワニス」とも呼ぶ。)を基板上に塗布する工程(a1)と、塗布された感光性ポリイミド樹脂組成物から有機溶媒を除去する工程(a2)と、を含むことが好ましい。
ポリイミドワニスの乾燥は、例えば、ホットプレート、熱風、オーブン等で加熱処理することで行われる。加熱温度は、例えば80~140℃、好ましくは90~120℃である。また、加熱の時間は、例えば30~600秒、好ましくは30~300秒程度である。
本実施形態に係る感光性ポリイミド樹脂組成物はポリイミド樹脂を含み、光重合開始剤、有機溶媒および光重合性化合物からなる群から選択される少なくとも1種をさらに含むことが好ましい。また、本実施形態に係る感光性ポリイミド樹脂組成物は、例えば、増感剤、レベリング剤および密着性向上剤からなる群から選択される少なくとも1種をさらに含んでもよい。
本実施形態に係る感光性ポリイミド樹脂組成物中のポリイミド樹脂の含有量は、感光性ポリイミド樹脂組成物の全固形分を100質量%としたとき、好ましくは30質量%以上、より好ましくは40質量%以上、更に好ましくは50質量%以上、更に好ましくは60質量%以上であり、そして好ましくは90質量%以下、より好ましくは80質量%以下、更に好ましくは70質量%以下である。
ここで、本実施形態において、感光性ポリイミド樹脂組成物の全固形分とは、当該感光性ポリイミド樹脂組成物を硬化した際に固形分として残る成分であり、例えば、有機溶媒等の加熱により揮発する成分は除かれる。一方で、液状成分でも、加熱硬化した際に樹脂膜に取り込まれる成分は全固形分に含まれる。
本実施形態に係るポリイミド樹脂としては、例えば、テトラカルボン酸二無水物に由来する構成単位Aと、ジアミン化合物に由来する構成単位Bとを含むポリイミド樹脂を挙げることができる。
これらの中でも、シクロヘキサンテトラカルボン酸二無水物、シクロブタンテトラカルボン酸二無水物およびシクロペンタンテトラカルボン酸二無水物がより好ましく、シクロヘキサンテトラカルボン酸二無水物がさらに好ましい。上記した各種テトラカルボン酸成分は位置異性体を含む。
これらの中でも、1,2,4,5-シクロヘキサンテトラカルボン酸、1,2,4,5-シクロヘキサンテトラカルボン酸二無水物、1,2,3,4-シクロブタンテトラカルボン酸二無水物、1,2,4,5-シクロヘキサンテトラカルボン酸メチルエステルは、ポリイミド樹脂を製造する際に高分子量化が容易で、フレキシブルなフィルムが得られ易い面で有利であるため、特に好ましい。
本実施形態に係るポリイミド樹脂は、テトラカルボン酸二無水物に由来する構成単位Aと、ジアミン化合物に由来する構成単位Bとを含み、原料であるテトラカルボン酸二無水物およびジアミン化合物は上記した通りである。本実施形態に係るポリイミド樹脂は、上記テトラカルボン酸とジアミン成分とを反応させて得ることができる。本実施形態に係るポリイミド樹脂は、末端にアミノ基を有する。
A/Bが1.0に近づくほど高分子量のポリイミド樹脂が得られるため、A/Bを適宜調整することで、目的の分子量のポリイミド樹脂を得ることができる。
本実施形態に係るポリイミド樹脂が下記一般式(1)で示される繰り返し構造を有する変性ポリイミド樹脂を含むことが好ましい。
[一般式(1)中、Rは、環状構造、非環状構造、または環状構造と非環状構造とを有する炭素数4~25、好ましくは4~10の4価の基である。Aは、脂肪族炭化水素基、脂環式炭化水素基、芳香族炭化水素基、およびオルガノシロキサン基からなる群から選択される少なくとも1種の基を有し、炭素数2~39の2価の基である。Aの主鎖には-O-、-SO2-、-CO-、-CH2-、-C(CH3)2-、-C2H4O-、および-S-からなる群から選択される少なくとも1種の基が介在していてもよい。nは繰り返し単位数を示す。一般式(1)の末端は、下記一般式(2)若しくは一般式(3)で示される基、または水素原子のいずれかであって、末端の少なくとも一方は一般式(2)若しくは一般式(3)で示される基である。]
[一般式(2)および(3)中、XおよびX2はそれぞれ独立に、炭素数2~15の基であり、エステル結合および二重結合からなる群から選択される少なくとも1つの基を有してもよい。YおよびY2はそれぞれ独立に、水素原子またはメチル基である。]
また、上記一般式(1)中のRとしては、ポリイミド樹脂に関して上述した通り、任意のテトラカルボン酸から誘導される構成単位を含むことができる。好ましい例は上述した通りであり、例えば構成単位としては以下の構造を挙げることができる。
一般式(2)または一般式(3)中のXまたはX2で表される基は、炭素数2~15の基であり、エステル結合および二重結合からなる群から選択される少なくとも1つの基を有してもよい。YまたはY2で示される基は、水素原子またはメチル基である。
これらの中でも、1,2,4,5-シクロヘキサンテトラカルボン酸、1,2,4,5-シクロヘキサンテトラカルボン酸二無水物、1,2,3,4-シクロブタンテトラカルボン酸二無水物、1,2,4,5-シクロヘキサンテトラカルボン酸メチルエステルは、ポリイミド樹脂を製造する際に高分子量化が容易で、フレキシブルなフィルムが得られ易い面で有利であるため、特に好ましい。
本実施形態に係る変性ポリイミド樹脂(A)は、以下の工程(1)および(2)により得ることができる:
工程(1):テトラカルボン酸成分とジアミン成分を反応させ、末端にアミノ基を有するポリイミド樹脂を得る。
工程(2):上記工程(1)で得られた末端にアミノ基を有するポリイミド樹脂と、上記官能基含有化合物(イソシアネート基またはエポキシ基と、(メタ)アクリル基とを有する化合物)とを反応させる。
工程(1)では、上記したテトラカルボン酸とジアミン成分とを反応させて、末端にアミノ基を有するポリイミド樹脂を得る。
上記工程(1)は、上述したポリイミド樹脂の製造方法と同一である。原料として用いるもの、好ましいもの、反応条件も同様である。
ポリイミド樹脂のアミノ基末端と、官能基含有化合物のイソシアネート基またはエポキシ基とを反応させる際には、そのまま反応させてもよいし、必要に応じて触媒の存在下で反応させてもよい。該触媒としては、トリエチルアミン等のアミン化合物、トリフェニルホスフィン等の有機リン系化合物等が挙げられ、これらを単独で用いてもよいし、2種類以上を組み合わせて用いてもよい。反応時の副反応を抑制させるために重合禁止剤を使用してもよい。重合禁止剤としては、ハイドロキノン、ハイドロキノンモノメチルエーテル、およびメチルハイドロキノン等が挙げられ、これらを単独で用いてもよいし、2種類以上を組み合わせて用いてもよい。
有機溶媒としては、溶解性の観点から非プロトン性極性溶媒が望ましい。具体的には、N-メチル-2-ピロリドン、N-アセチル-2-ピロリドン、N-ベンジル-2-ピロリドン、N,N-ジメチルホルムアミド、N,N-ジメチルアセトアミド、ジメチルスルホキシド、ヘキサメチルホスホルトリアミド、N-アセチル-ε-カプロラクタム、ジメチルイミダゾリジノン、ジエチレングリコールジメチルエーテル、トリエチレングリコールジメチルエーテルおよびγ-ブチロラクトン等を挙げることができる。これらの有機溶媒は単独で用いてもよいし、2種以上を組み合わせて用いてもよい。塗布性をより改善するために、トルエン、キシレン、ジエチルケトン、メトキシベンゼン、シクロペンタノン等の溶媒をポリマーの溶解性に悪影響を及ぼさない範囲で混合してもよい。
適切な有機溶媒を用いることで、本実施形態に係る感光性ポリイミド樹脂組成物を溶液(ワニス)状態で使用することができ、成膜する際に便利である。
光重合性化合物としては、多官能ラジカル重合性モノマー、例えば2官能以上の(メタ)アクリルモノマーを用いることができる。
(メタ)アクリルモノマーとしては、例えば、トリシクロデカンジメタノールジ(メタ)アクリレート、ポリプロピレングリコールジ(メタ)アクリレート、トリメチロールプロパントリ(メタ)アクリレート、エトキシ化トリメチロールプロパントリ(メタ)アクリレート、プロポキシ化トリメチロールプロパントリ(メタ)アクリレート、ペンタエリスリトールテトラ(メタ)アクリレート、ペンタエリスリトールトリ(メタ)アクリレート、トリス-(2-(メタ)アクリロキシエチル)イソシアヌレート、ジトリメチロールプロパンテトラ(メタ)アクリレート、ジペンタエリスリトールペンタ(メタ)アクリレート、ジペンタエリスリトールヘキサ(メタ)アクリレート、トリペンタエリスリトール(メタ)アクリレート、モノおよびジペンタエリスリトール(メタ)アクリレート、ポリペンタエリスリトール(メタ)アクリレート、ポリグリセリン系(メタ)アクリレート、デンドリマー(メタ)アクリレート等が挙げられる。これらの光重合性化合物は単独で用いてもよいし、2種以上を組み合わせて用いてもよい。
ここで、ポリグリセリン系(メタ)アクリレートとは、ポリグリセリン骨格および(メタ)アクリロイル基を有する化合物のことをいう。ポリグリセリン系(メタ)アクリレートとしては、例えば、阪本薬品化学製のSA-TE6、SA-TE60等が挙げられる。
エトキシ化トリメチロールプロパントリ(メタ)アクリレートとしては、例えば、アルケマ株式会社製のエトキシ化(3)トリメチロールプロパントリアクリレート、エトキシ化(6)トリメチロールプロパントリアクリレート、エトキシ化(15)トリメチロールプロパントリアクリレート等を使用することができる。
また、デンドリマー(メタ)アクリレートとは、デンドリマー構造(ハイパーブランチ構造を含む)を有する多官能(メタ)アクリレートをいう。デンドリマー(メタ)アクリレートとしては、例えば、大阪有機化学工業株式会社製のビスコート1000、ビスコート1020、STAR-501等が挙げられる。ビスコート1000およびビスコート1020は、末端にアクリレート基を有するデンドリマー型ポリエステルアクリレートを主成分とする。また、ビスコート1000の分子量は、1000~2000程度であり、ビスコート1020の分子量は1000~3000程度である。STAR-501は、ジペンタエリスリトールに由来するコアを含み、末端にアクリレート基を有する、ジペンタエリスリトールヘキサアクリレート連結型の多分岐ポリアクリレートを主成分とする。STAR501の分子量は、16000~24000程度である。
これらの中でも光重合性化合物としては、現像後における露光部のクラックの発生を抑制する観点から、分子中に4個以上の(メタ)アクリロイル基を有する多官能(メタ)アクリレートが好ましく、分子中に4個以上10個以下の(メタ)アクリロイル基を有する多官能(メタ)アクリレートがより好ましい。
混合する光重合性化合物の構造により、感光性ポリイミド樹脂組成物の柔軟性等を制御することができる。これらの光重合性化合物は、感光性ポリイミド樹脂組成物に含まれるポリイミド樹脂100質量部に対して、5~500質量部の割合で混合するのが好ましい。
光重合開始剤は特に限定されず公知のものを使用することができる。例えば、2,2-ジメトキシ-1,2-ジフェニルエタン-1-オン、1-ヒドロキシシクロヘキシルフェニルケトン、2-ヒドロキシ-2-メチル-1-フェニル-プロパン-1-オン、1-[4-(2-ヒドロキシエトキシ)-フェニル]-2-ヒドロキシ-2-メチル-1-プロパン-1-オン、2-ヒドロキシ-1-{4-[4-(2-ヒドロキシ-2-メチル-プロピオニル)-ベンジル]フェニル}-2-メチル-プロパン-1-オン、2-メチル-1-(4-メチルチオフェニル)-2-モルホリノプロパン-1-オン、2-ベンジル-2-ジメチルアミノ-1-(4-モルホリノフェニル)-ブタノン-1,2-(ジメチルアミノ)-2-[(4-メチルフェニル)メチル]-1-[4-(4-モルホリニル)フェニル]-1-ブタノン、2,4,6-トリメチルベンゾイル-ジフェニルホスフィンオキサイドおよびビス(2,4,6-トリメチルベンゾイル)フェニルホスフィンオキサイド等を挙げることができる。これらの光重合開始剤は単独で用いてもよいし、2種以上を組み合わせて用いてもよい。
光重合開始剤は、感光性ポリイミド樹脂組成物に含まれるポリイミド樹脂100質量部に対して、0.1~10質量部の割合で混合するのが好ましい。
増感剤は特に限定されず、公知のものを使用できる。例えば、アミノ基含有増感剤を挙げることができ、アミノ基およびフェニル基を同一分子内に有する化合物を好ましくは例示できる。より具体的には、4,4’-ジメチルアミノベンゾフェノン、4,4’-ジエチルアミノベンゾフェノン、2-アミノベンゾフェノン、4-アミノベンゾフェノン、4,4’-ジアミノベンゾフェノン、3,3’-ジアミノベンゾフェノン、3,4-ジアミノベンゾフェノン等のベンゾフェノン系化合物;2-(p-ジメチルアミノフェニル)ベンゾオキサゾール、2-(p-ジエチルアミノフェニル)ベンゾオキサゾール、2-(p-ジメチルアミノフェニル)ベンゾ[4,5]ベンゾオキサゾール、2-(p-ジメチルアミノフェニル)ベンゾ[6,7]ベンゾオキサゾール、2,5-ビス(p-ジエチルアミノフェニル)-1,3,4-オキサジアゾール、2-(p-ジメチルアミノフェニル)ベンゾチアゾール、2-(p-ジエチルアミノフェニル)ベンゾチアゾール、2-(p-ジメチルアミノフェニル)ベンズイミダゾール、2-(p-ジエチルアミノフェニル)ベンズイミダゾール、2,5-ビス(p-ジエチルアミノフェニル)-1,3,4-チアジアゾール、(p-ジメチルアミノフェニル)ピリジン、(p-ジエチルアミノフェニル)ピリジン、(p-ジメチルアミノフェニル)キノリン、(p-ジエチルアミノフェニル)キノリン、(p-ジメチルアミノフェニル)ピリミジン、(p-ジエチルアミノフェニル)ピリミジン等のp-ジアルキルアミノフェニル基含有化合物等を挙げることができる。これらの増感剤は単独で用いてもよいし、2種以上を組み合わせて用いてもよい。
増感剤は、感光性ポリイミド樹脂組成物に含まれるポリイミド樹脂100質量部に対して、0.001~10質量部の割合で混合するのが好ましい。
レベリング剤は特に限定されず、公知のものを使用でき、例えば、シリコン系表面調整剤、アクリル系表面調整剤、フッ素系表面調整剤、ノニオン性表面調整剤、カチオン性表面調整剤、アニオン性表面調整剤等の各種表面調整剤等を用いることができる。これらは1種を単独で用いてもよく2種以上を併用してもよい。
レベリング剤は、感光性ポリイミド樹脂組成物に含まれるポリイミド樹脂100質量部に対して、0.001~20質量部の割合で混合するのが好ましい。
密着性向上剤は特に限定されず、公知のものを使用でき、アミノ基含有シランカップリング剤、エポキシ基含有シランカップリング剤、メルカプト基含有シランカップリング剤、(メタ)アクリル基含有シランカップリング剤等のシランカップリング剤、チタネートカップリング剤、アルミネートカップリング剤等の公知のカップリング剤等を用いることができる。カップリング剤としては、例えば、KP-390、KA-1003、KBM-1003、KBE-1003、KBM-303、KBM-403、KBE-402、KBE-403、KBM-1403、KBM-502、KBM-503、KBE-502、KBE-503、KBM-5103、KBM-602、KBM-603、KBE-603、KBM-903、KBE-903、KBE-9103、KBM-9103、KBM-573、KBM-575、KBM-6123、KBE-585、KBM-703、KBM-802、KBM-803、KBE-846、KBE-9007(いずれも商品名;信越化学工業株式会社製)等を挙げることができる。これらは1種を単独で用いてもよく2種以上を併用してもよい。
密着性向上剤は、感光性ポリイミド樹脂組成物に含まれるポリイミド樹脂100質量部に対して、0.0005~20質量部の割合で混合するのが好ましい。
本実施形態に係る感光性ポリイミド樹脂組成物は特に限定されないが、以下の通り調製することができる。
ポリイミド樹脂に、有機溶媒、光重合開始剤および光重合性化合物からなる群から選択される少なくとも1種を混合して感光性ポリイミド組成物を得ることができる。必要に応じて、上記した通り、増感剤、レベリング剤および密着性向上剤からなる群から選択される少なくとも1種をさらに混合してもよい。
本実施形態に係るポリイミドワニスは、ポリイミド樹脂と有機溶媒とを含み、光重合開始剤および光重合性化合物からなる群から選択される少なくとも1種をさらに含んでもよい。さらに、必要に応じて、上記した通り、増感剤、レベリング剤および密着性向上剤からなる群から選択される少なくとも1種をさらに混合してもよい。各成分の具体例は上記した通りである。
本実施形態に係るポリイミドワニスは、重合法により得られるポリイミド樹脂が反応溶媒に溶解したポリイミド溶液そのものであってもよいし、または当該ポリイミド溶液に対してさらに有機溶媒を追加して希釈したものであってもよい。
本実施形態に係るポリイミドワニスは、詳述したポリイミド樹脂を5~40質量%含むことが好ましく、10~30質量%含むことがより好ましい。
次いで、工程(a)で得られた膜を露光する。
膜の露光は、例えば、基板上に形成された感光性ポリイミド樹脂組成物からなる膜に、所定のパターンのフォトマスクを介して、光(通常は紫外線を用いる)を照射することによっておこなうことができる。
露光された上記膜は、フォトマスクによって光が遮られた部分と光が照射された部分、つまり、露光部と未露光部を有する。
露光された上記膜の露光部は、感光性ポリイミド樹脂組成物中のポリイミド樹脂が架橋し、架橋ポリイミド膜となり、次の現像工程(工程(c))によってパターンを形成する。一方、未露光部は、ポリイミド樹脂は架橋していないため、現像によって溶解除去される未架橋ポリイミド膜となる。
紫外線照射量は、積算照射量として好ましくは100~8,000mJ/cm2、より好ましくは200~6,000mJ/cm2である。
次いで、露光された上記膜を現像液を用いて現像することにより、上記基板上に上記膜からなるパターンを形成する。
例えば、基板上に形成された感光性ポリイミド樹脂組成物からなる膜に光を照射後、現像液により未露光部を溶解除去して、所望のレリーフパターンを得ることができる。
REDは、現像後における露光部のクラックの発生を抑制する観点から、0.50以上、好ましくは0.52以上、より好ましくは0.55以上、さらに好ましくは0.60以上であり、そして、現像後における未露光部の残渣の生成を抑制する観点から、1.4以下、好ましくは1.3以下、より好ましくは1.2以下、さらに好ましくは1.1以下である。
本実施形態に係るパターン付き基板の製造方法において、工程(c)の後に、パターンを熱処理する工程(d)をさらに含んでもよい。
これにより、本実施形態の感光性ポリイミド樹脂組成物を硬化してなる硬化膜(パターン)を得ることができる。
例えば、上述する処理によって得られたレリーフパターンを、80~400℃の範囲から選ばれる温度で加熱処理し、有機溶媒を除去し、本実施形態の感光性ポリイミド樹脂組成物を硬化してなる硬化膜(パターン)を得ることができる。
本実施形態によれば、優れた現像性、すなわち露光部は十分に硬化すると共に、感光性ポリイミド樹脂組成物に含まれる変性ポリイミド樹脂の高い有機溶媒への溶解性に起因して未露光部は十分に除去される樹脂組成物を用いるため、得られるレリーフパターンを高解像度で得ることができる。
膜厚が上記範囲にあると、優れた絶縁性膜として用いることができる。膜厚が厚くなる(すなわち、基材に塗布する感光性ポリイミド樹脂組成物量が増える)ほど、特にポリイミド樹脂の有機溶媒への溶解性に問題を生じることが多い。しかしながら、本実施形態によれば、変性ポリイミド樹脂(A)を用いることにより、かかる場面においても、優れた有機溶媒への溶解性と透明性とを両立させることができる。
したがって、本実施形態の硬化膜は、例えば、高い電圧の印加が想定される絶縁性膜用途において好適に用いることができる。変性ポリイミド樹脂(A)を含む、本実施形態の感光性ポリイミド樹脂組成物から得られる硬化膜は、クラック等の発生を効果的に抑制することができ、物性に優れる。
本実施形態に係るパターン付き基板は、種々の用途に使用することができる。例えば、電子機器の半導体素子の表面保護膜、層間絶縁膜、回路基板の配線保護絶縁膜、特に高密度化、高集積化された上記用途に好適に用いることができる。この場合、パターン付き基板のパターンが電子機器の半導体素子の表面保護膜、層間絶縁膜、回路基板の配線保護絶縁膜となる。
窒素導入管、撹拌装置、温度計、冷却器を備えた1Lの5つ口フラスコに、窒素導入下、4,4’-オキシビス[3-(トリフルオロメチル)ベンゼンアミン](以下、6FODA)を196.1581g(0.583mоl)、1,2,4,5-シクロヘキサンテトラカルボン酸二無水物(以下、HPMDA)を124.1578g(0.554mоl)、γ-ブチロラクトン(以下、GBL)391.50gを投入し、撹拌しながら90℃まで加熱した。ここに、トリエチルアミン(以下、TEA)を2.802g(0.028mоl)を加え、190℃で5時間反応させた後、GBL308.10gで希釈し、固形分濃度30質量%のポリイミドワニス999g(留出水と留出TEAの合計23.7g)を得た。GPCでの測定の結果、本合成例で得られたポリイミドの重量平均分子量(Mw)は33,876であった。
このポリイミドワニス200.03gにGBL100.01g、2-イソシアナトエチルアクリレート(昭和電工(株)製,カレンズAOI)6.0264gを入れ、50℃で5時間反応させた。その後、反応液を水中に滴下してポリイミドを析出させ、70℃で一晩乾燥させ、変性ポリイミド樹脂(A1)を得た。
GPC分析により、Mwを求めた。分析に用いた装置および分析条件は下記の通りである。
装置:HLC-8420GPC(東ソー株式会社製)
カラム:TSKgel SuperAWM-H×2(東ソー株式会社製)
溶離液:(30mM臭化リチウムおよび100mMリン酸)添加ジメチルホルムアミド
標準ポリスチレン:PStQuick Kit-H(東ソー株式会社製)
流速:0.6ml/min
カラム温度:40℃
検出器:RI(屈折率検出器)
合成例1で得られた変性ポリイミド樹脂(A1)2.8586gをGBL3.5269gに溶解させ、光重合性化合物としてビスコート802(大阪有機化学工業株式会社製,TriPEA)を1.4596g、光重合開始剤として1-ヒドロキシシクロヘキシルフェニルケトン(BASF社製、Omnirad184)を0.0431gとビス(2,4,6-トリメチルベンゾイル)フェニルホスフィンオキサイド(BASF社製,Omnirad819)を0.1005g、レベリング剤としてGBLで100倍希釈したLE-304(共栄社化学株式会社製)を0.2876g、密着性向上剤としてGBLで100倍希釈したKP-390(信越化学工業株式会社製)を0.1496g加え、これらが十分に溶解するまで撹拌し、感光性ポリイミド樹脂組成物(ポリイミドワニス)を得た。このポリイミドワニスをガラス棒と膜厚300μmのスペーサーを用いてキャスト法によりPETフィルム上に成膜し、100℃で60分間乾燥させ、感光性ポリイミド樹脂組成物のフィルムを得た。
合成例1で得られた変性ポリイミド樹脂(A1)2.3883gをGBL2.9267gに溶解させ、光重合性化合物としてdiPE-penta/hexa-A(新中村化学工業株式会社製)を1.2033g、光重合開始剤として1-ヒドロキシシクロヘキシルフェニルケトン(BASF社製,Omnirad184)を0.0346gとビス(2,4,6-トリメチルベンゾイル)フェニルホスフィンオキサイド(BASF社製,Omnirad819)を0.0820g、レベリング剤としてGBLで100倍希釈したLE-304(共栄社化学株式会社製)を0.2550g、密着性向上剤としてGBLで100倍希釈したKP-390(信越化学工業株式会社製)を0.1211g加え、これらが十分に溶解するまで撹拌し、感光性ポリイミド樹脂組成物(ポリイミドワニス)を得た。このポリイミドワニスをガラス棒と膜厚300μmのスペーサーを用いてキャスト法によりPETフィルム上に成膜し、100℃で60分間乾燥させ、感光性ポリイミド樹脂組成物のフィルムを得た。
表1に示すような、前述のHSPの算出1と同様の配合比でポリイミドワニスを作製した。このポリイミドワニスをミカサ株式会社製のスピンコーター(MS-B150)を用いて、乾燥後のポリイミド被膜の膜厚が25~30μmとなるような条件でシリコンウェハー上に塗布し、ホットプレート上で100℃、5分間乾燥させた。室温に冷却後、ミカサ株式会社製のマスクアライナー(MA-10)を使用し、光源には高圧水銀灯を用い、露光波長365nmにおける露光量5,000mJ/cm2の条件下で、30μm/50μmのL/S(ライン&スペース)パターンが描かれたフォトマスクの上から露光し、15分間室温で静置した。次いで、現像液として乳酸エチル(EL)を用いて90秒間浸漬現像し、メタノールでリンスし、空気流通下で残存溶媒を除去することでシリコンウェハー上に30μm/50μmの樹脂パターンを形成した。
次いで、デジタルマイクロスコープを用いてパターンの現像性と露光部におけるクラックの有無を観察・評価した。
現像液としてプロピレングリコールモノメチルエーテルアセテート(PGMEA)を用いた以外は、実施例1と同様にしてポリイミドワニスを作製し、実施例1と同様に評価した。
現像液としてプロピレングリコールモノメチルエーテル(PGME)を用いた以外は、実施例1と同様にしてポリイミドワニスを作製し、実施例1と同様に評価した。
現像液としてシクロヘキサノンを用いた以外は、実施例1と同様にしてポリイミドワニスを作製し、実施例1と同様に評価した。
現像液としてアセトニトリルを用いた以外は、実施例1と同様にしてポリイミドワニスを作製し、実施例1と同様に評価した。
現像液としてメチルイソブチルケトン(MIBK)を用いた以外は、実施例1と同様にしてポリイミドワニスを作製し、実施例1と同様に評価した。
現像液として1,4-ジオキサン:ε-カプロラクトン=53:47(体積比)の混合溶媒を用いた以外は、実施例1と同様にしてポリイミドワニスを作製し、実施例1と同様に評価した。
現像液としてε-カプロラクトン:トルエン:ベンジルアルコール=35:35:30(体積比)の混合溶媒を用いた以外は、実施例1と同様にしてポリイミドワニスを作製し、実施例1と同様に評価した。
現像液として酢酸ブチルを用いた以外は、実施例1と同様にしてポリイミドワニスを作製し、実施例1と同様に評価した。
現像液として1,4-ジオキサンを用いた以外は、実施例1と同様にしてポリイミドワニスを作製し、実施例1と同様に評価した。
現像液としてアセトンを用いた以外は、実施例1と同様にしてポリイミドワニスを作製し、実施例1と同様に評価した。
現像液としてN,N-ジメチルアセトアミド(DMAc)を用いた以外は、実施例1と同様にしてポリイミドワニスを作製し、実施例1と同様に評価した。
現像液としてメチルエチルケトン(MEK)を用いた以外は、実施例1と同様にしてポリイミドワニスを作製し、実施例1と同様に評価した。
現像液としてシクロヘキサンを用いた以外は、実施例1と同様にしてポリイミドワニスを作製し、実施例1と同様に評価した。
表3に示すような、前述のHSPの算出2と同様の配合比でポリイミドワニスを作製した。このポリイミドワニスをミカサ株式会社製のスピンコーター(MS-B150)を用いて、乾燥後のポリイミド被膜の膜厚が25~30μmとなるような条件でシリコンウェハー上に塗布し、ホットプレート上で100℃、5分間乾燥させた。室温に冷却後、ミカサ株式会社製のマスクアライナー(MA-10)を使用し、光源には高圧水銀灯を用い、露光波長365nmにおける露光量5,000mJ/cm2の条件下で、30μm/50μmのL/S(ライン&スペース)パターンが描かれたフォトマスクの上から露光し、15分間室温で静置した。次いで、現像液としてN-メチル-2-ピロリドン(NMP)を用いて90秒間浸漬現像し、メタノールでリンスし、空気流通下で残存溶媒を除去することでシリコンウェハー上に30μm/50μmの樹脂パターンを形成した。
次いで、デジタルマイクロスコープを用いてパターンの現像性と露光部におけるクラックの有無を観察・評価した。
現像液としてシクロペンタノンを用いた以外は、実施例11と同様にしてポリイミドワニスを作製し、実施例11と同様に評価した。
現像液としてELを用いた以外は、実施例11と同様にしてポリイミドワニスを作製し、実施例11と同様に評価した。
現像液としてPGMEAを用いた以外は、実施例11と同様にしてポリイミドワニスを作製し、実施例11と同様に評価した。
現像液としてシクロヘキサノンを用いた以外は、実施例11と同様にしてポリイミドワニスを作製し、実施例11と同様に評価した。
現像液として1,4-ジオキサン:ε-カプロラクトン=53:47(体積比)の混合溶媒を用いた以外は、実施例11と同様にしてポリイミドワニスを作製し、実施例11と同様に評価した。
現像液としてε-カプロラクトン:トルエン:ベンジルアルコール=35:35:30(体積比)の混合溶媒を用いた以外は、実施例11と同様にしてポリイミドワニスを作製し、実施例11と同様に評価した。
現像液として酢酸ブチルを用いた以外は、実施例11と同様にしてポリイミドワニスを作製し、実施例11と同様に評価した。
現像液として1,4-ジオキサンを用いた以外は、実施例11と同様にしてポリイミドワニスを作製し、実施例11と同様に評価した。
現像液としてアセトンを用いた以外は、実施例11と同様にしてポリイミドワニスを作製し、実施例11と同様に評価した。
現像液としてDMAcを用いた以外は、実施例11と同様にしてポリイミドワニスを作製し、実施例11と同様に評価した。
現像液としてシクロヘキサンを用いた以外は、実施例11と同様にしてポリイミドワニスを作製し、実施例11と同様に評価した。
Claims (13)
- 基板上に、感光性ポリイミド樹脂組成物からなる膜を形成する工程(a)と、
前記膜を露光する工程(b)と、
露光された前記膜を現像液を用いて現像することにより、前記基板上に前記膜からなるパターンを形成する工程(c)と、を含み、
前記現像液と露光前の前記膜との相対的エネルギー差(RED)が0.50以上1.4以下であるパターン付き基板の製造方法。 - 前記工程(c)が、露光前の前記膜のハンセン溶解度パラメータを測定する工程(c1)と、得られた前記ハンセン溶解度パラメータを用いて露光前の前記膜との相対的エネルギー差(RED)が0.50以上1.4以下である現像液を選定する工程(c2)とを含む、請求項1に記載のパターン付き基板の製造方法。
- 前記工程(a)が、ワニス状の感光性ポリイミド樹脂組成物を前記基板上に塗布する工程(a1)と、塗布された前記感光性ポリイミド樹脂組成物から有機溶媒を除去する工程と(a2)と、を含む、請求項1または2に記載のパターン付き基板の製造方法。
- 前記工程(c)の後に、前記パターンを熱処理する工程(d)をさらに含む、請求項1~3のいずれか一項に記載のパターン付き基板の製造方法。
- 熱処理後の前記パターンの厚みが5μm以上85μm以下である、請求項4に記載のパターン付き基板の製造方法。
- 前記感光性ポリイミド樹脂組成物に含まれるポリイミド樹脂が、下記一般式(1)で示される繰り返し構造を有する変性ポリイミド樹脂(A)を含む、請求項1~5のいずれか一項に記載のパターン付き基板の製造方法。
[前記一般式(1)中、Rは、環状構造、非環状構造、または環状構造と非環状構造とを有する炭素数4~25の4価の基である。Aは、脂肪族炭化水素基、脂環式炭化水素基、芳香族炭化水素基、およびオルガノシロキサン基からなる群から選択される少なくとも1種の基を有し、炭素数2~39の2価の基である。Aの主鎖には-O-、-SO2-、-CO-、-CH2-、-C(CH3)2-、-C2H4O-、および-S-からなる群から選択される少なくとも1種の基が介在していてもよい。nは繰り返し単位数を示す。前記一般式(1)の末端は、下記一般式(2)若しくは一般式(3)で示される基、または水素原子のいずれかであって、末端の少なくとも一方は下記一般式(2)若しくは下記一般式(3)で示される基である。]
[前記一般式(2)および(3)中、XおよびX2はそれぞれ独立に、炭素数2~15の基であり、エステル結合および二重結合からなる群から選択される少なくとも1つの基を有してもよい。YおよびY2はそれぞれ独立に、水素原子またはメチル基である。] - 前記一般式(1)中のAが、脂環式炭化水素基および芳香族炭化水素基からなる群から選択される少なくとも1種を含む、請求項6に記載のパターン付き基板の製造方法。
- 前記感光性ポリイミド樹脂組成物に含まれるポリイミド樹脂の重量平均分子量が5,000以上70,000以下である、請求項1~7のいずれか一項に記載のパターン付き基板の製造方法。
- 前記感光性ポリイミド樹脂組成物に含まれるポリイミド樹脂の波長200~400nmにおける光線透過率が50%以上である、請求項1~8のいずれか一項に記載のパターン付き基板の製造方法。
- 前記感光性ポリイミド樹脂組成物が、光重合開始剤、有機溶媒および光重合性化合物からなる群から選択される少なくとも1種をさらに含む、請求項1~9のいずれか一項に記載のパターン付き基板の製造方法。
- 前記光重合性化合物が多官能ラジカル重合性モノマーを含む、請求項10に記載のパターン付き基板の製造方法。
- 前記光重合性化合物が、分子中に4個以上の(メタ)アクリロイル基を有する多官能(メタ)アクリレートを含む、請求項10または11に記載のパターン付き基板の製造方法。
- 前記感光性ポリイミド樹脂組成物が増感剤、レベリング剤および密着性向上剤からなる群から選択される少なくとも1種をさらに含む、請求項1~12のいずれか一項に記載のパターン付き基板の製造方法。
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CN202180080149.3A CN116490534A (zh) | 2020-12-02 | 2021-11-10 | 带有图案的基板的制造方法 |
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US18/038,770 US20240027907A1 (en) | 2020-12-02 | 2021-11-10 | Method for producing patterned substrate |
KR1020237016943A KR20230114746A (ko) | 2020-12-02 | 2021-11-10 | 패턴부착 기판의 제조방법 |
EP21900373.8A EP4257621A4 (en) | 2020-12-02 | 2021-11-10 | METHOD FOR PRODUCING A STRUCTURED SUBSTRATE |
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JPH10123725A (ja) | 1996-10-18 | 1998-05-15 | Nippon Zeon Co Ltd | 感光性ポリイミド用現像液 |
JP2002014476A (ja) | 2000-06-30 | 2002-01-18 | Hitachi Chemical Dupont Microsystems Ltd | 感光性ポリイミド前駆体用現像液及びパターンの製造法 |
JP2002214801A (ja) | 2001-01-23 | 2002-07-31 | Toray Ind Inc | 感光性ポリイミド用現像液 |
JP2008292799A (ja) | 2007-05-25 | 2008-12-04 | Toray Ind Inc | 感光性ポリイミド用現像液およびこれを用いたパターン形成方法 |
WO2018221457A1 (ja) | 2017-05-31 | 2018-12-06 | 富士フイルム株式会社 | 感光性樹脂組成物、ポリマー前駆体、硬化膜、積層体、硬化膜の製造方法および半導体デバイス |
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WO2006064867A1 (ja) * | 2004-12-16 | 2006-06-22 | Nippon Kayaku Kabushiki Kaisha | 不飽和基含有ポリイミド樹脂、それを含有する感光性樹脂組成物及びその硬化物 |
JP6051653B2 (ja) * | 2012-07-24 | 2016-12-27 | 三菱瓦斯化学株式会社 | ポリイミド樹脂、ポリイミド樹脂硬化物およびポリイミドフィルム |
WO2016172092A1 (en) * | 2015-04-21 | 2016-10-27 | Fujifilm Electronic Materials U.S.A., Inc. | Photosensitive polyimide compositions |
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JPH10123725A (ja) | 1996-10-18 | 1998-05-15 | Nippon Zeon Co Ltd | 感光性ポリイミド用現像液 |
JP2002014476A (ja) | 2000-06-30 | 2002-01-18 | Hitachi Chemical Dupont Microsystems Ltd | 感光性ポリイミド前駆体用現像液及びパターンの製造法 |
JP2002214801A (ja) | 2001-01-23 | 2002-07-31 | Toray Ind Inc | 感光性ポリイミド用現像液 |
JP2008292799A (ja) | 2007-05-25 | 2008-12-04 | Toray Ind Inc | 感光性ポリイミド用現像液およびこれを用いたパターン形成方法 |
WO2018221457A1 (ja) | 2017-05-31 | 2018-12-06 | 富士フイルム株式会社 | 感光性樹脂組成物、ポリマー前駆体、硬化膜、積層体、硬化膜の製造方法および半導体デバイス |
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EP4257621A4 (en) | 2024-05-29 |
KR20230114746A (ko) | 2023-08-01 |
US20240027907A1 (en) | 2024-01-25 |
CN116490534A (zh) | 2023-07-25 |
TW202225273A (zh) | 2022-07-01 |
JPWO2022118618A1 (ja) | 2022-06-09 |
EP4257621A1 (en) | 2023-10-11 |
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