WO2022014285A1 - 導体接続構造および該導体接続構造を備えるプローブ - Google Patents

導体接続構造および該導体接続構造を備えるプローブ Download PDF

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Publication number
WO2022014285A1
WO2022014285A1 PCT/JP2021/023800 JP2021023800W WO2022014285A1 WO 2022014285 A1 WO2022014285 A1 WO 2022014285A1 JP 2021023800 W JP2021023800 W JP 2021023800W WO 2022014285 A1 WO2022014285 A1 WO 2022014285A1
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WO
WIPO (PCT)
Prior art keywords
conductor
probe
central
external
connection structure
Prior art date
Application number
PCT/JP2021/023800
Other languages
English (en)
French (fr)
Japanese (ja)
Inventor
聖人 荒木
真一 剱崎
幸裕 北市
Original Assignee
株式会社村田製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社村田製作所 filed Critical 株式会社村田製作所
Priority to JP2022536212A priority Critical patent/JP7243925B2/ja
Priority to CN202180047100.8A priority patent/CN115803969A/zh
Publication of WO2022014285A1 publication Critical patent/WO2022014285A1/ja

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/62—Means for facilitating engagement or disengagement of coupling parts or for holding them in engagement
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
    • H01R24/38—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R4/00—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
    • H01R4/02—Soldered or welded connections

Definitions

  • the present invention relates to a conductor connection structure and a probe provided with the conductor connection structure.
  • Patent Document 1 discloses an inspection coaxial connector connected to the tip of a coaxial cable.
  • the central conductor and the outer conductor of the coaxial cable are electrically connected to the socket for the coaxial connector and connected to the inspection coaxial connector via the socket for the coaxial connector, respectively. Has been done.
  • Patent Document 1 describes that a coaxial cable is electrically connected to a socket for a coaxial connector, it does not specifically disclose what kind of structure the electrical connection has.
  • the current density is concentrated on the conductor surface due to the skin effect.
  • the current path has a return path. Complicates the current path. When the current path becomes complicated, unnecessary resonance occurs, which hinders accurate measurement of the electrical characteristics of the object to be measured.
  • the technical problem to be solved by the present invention is to provide a conductor connection structure for accurately measuring the electrical characteristics of the object to be measured and a probe having the conductor connection structure.
  • the conductor connection structure according to the present invention is A probe extending from the proximal end side to the distal end side having a measuring pin to which a coaxial cable in which a central conductor, a dielectric and an outer conductor are arranged coaxially is connected and electrically connected to the central conductor of the coaxial cable.
  • It is a conductor connection structure in A conductive outer cover member that covers the outer conductor with a gap, It is provided with a conductive external connection portion for fixing and electrically connecting the external conductor to the external cover member.
  • the external connection end, which is the distal end of the probe in the external connection is either flush with the external conductor end, which is the distal end of the probe in the external conductor, or the probe. It is characterized by being located on the tip side of.
  • the current path does not have a return path, unnecessary resonance is suppressed, so that the electrical characteristics of the object to be measured can be measured with high accuracy.
  • FIG. 3 is a cross-sectional view taken along the line III-III of the probe shown in FIG. It is an exploded perspective view of the probe shown in FIG. FIG. 3 is an enlarged cross-sectional view of a main part of the probe shown in FIG. It is an enlarged sectional view of the main part of the probe which concerns on 2nd Embodiment of this invention. It is an enlarged sectional view of the main part of the probe which concerns on 3rd Embodiment of this invention. It is an enlarged sectional view of the main part of the probe which concerns on 4th Embodiment of this invention.
  • FIG. 1 is a perspective view of the probe 1 according to the first embodiment of the present invention.
  • FIG. 2 is a top view of the probe 1 shown in FIG.
  • FIG. 3 is a cross-sectional view taken along the line III-III of probe 1 shown in FIG.
  • FIG. 4 is an exploded perspective view of the probe 1 shown in FIG.
  • FIG. 5 is an enlarged cross-sectional view of a main part of the probe 1 shown in FIG.
  • the probe 1 includes a barrel 10, a measuring pin 20, a first bushing 30, a second bushing 40, a socket 50, and a coaxial cable 70.
  • the probe 1 extends from the proximal end side A (that is, the one end side A) to the distal end side B (that is, the other end side B) in the extending direction of the probe 1 (in the X-axis direction in FIGS. 2 and 3).
  • the probe 1 measures the electrical characteristics of the connector (measured object) 2 by elastically contacting the connector terminal (measured terminal) 3 of the connector (measured object) 2, for example.
  • the barrel 10 has a barrel body 12 having a cylindrical shape extending in the X-axis direction, and a first accommodating portion 14 formed inside the barrel body 12.
  • the tip end side B of the barrel body 12 is opened by the tip through hole 15, and the measurement end portion 22 of the measurement pin 20 is inserted through the tip through hole 15.
  • the base end side of the barrel body 12 has a base end opening that is larger than the tip through hole 15, and the coaxial cable 70 is inserted through the base end opening.
  • the barrel 10 is a conductive material, such as a metallic material, such as phosphor bronze.
  • a first accommodating portion 14 is formed inside the barrel 10.
  • the first accommodating portion 14 accommodates a measuring pin 20, a first bushing 30, a second bushing 40, a socket 50, and a coaxial cable 70. Since the barrel 10 covers the outer conductor 76 while having an outer gap 16 with respect to the outer conductor 76 of the coaxial cable 70 described later, it acts as a conductive outer cover member.
  • the barrel 10 is formed with an external through hole 18 extending in the thickness direction of the barrel body 12.
  • the two external through holes 18 are arranged to face each other at an angle of 180 degrees. The arrangement and number of the external through holes 18 are not limited to this.
  • the external through hole 18 has an opening tip portion 19 on the tip end side B of the probe 1.
  • the measuring pin 20 is a rod-shaped (needle-shaped) electrode having a built-in spring and can be expanded and contracted, and is also called a contact probe, a spring pin, or a pogo pin.
  • the measuring pin 20 has a measuring end 22 on its tip side B and a connecting end 24 on its base end side.
  • the measuring pin 20 is a conductive material, for example, a metal material.
  • the first bushing 30 is arranged on the tip end side B of the barrel 10.
  • the first bushing 30 has a cylindrical shape and is locked to the tip through hole 15 of the barrel 10.
  • the first bushing 30 is an electrically insulating material, for example, a resin material.
  • the measurement end 22 of the measurement pin 20 is inserted into the first insertion hole of the first bushing 30. Through the first bushing 30, the measuring pin 20 is set in the barrel 10 in an electrically isolated state.
  • the second bushing 40 is arranged on the center side of the barrel 10.
  • the second bushing 40 is locked by a step portion formed in the central portion of the first accommodating portion 14 of the barrel 10.
  • the second bushing 40 has a cylindrical shape.
  • the second bushing 40 is an electrically insulating material, for example, a resin material.
  • the connection end 24 of the measuring pin 20 is inserted into the small diameter hole of the second insertion hole of the second bushing 40.
  • a socket 50 is inserted into the large-diameter hole of the second insertion hole of the second bushing 40.
  • the connection end 24 of the measuring pin 20 is in contact with the socket 50.
  • the measuring pin 20 is electrically connected to the socket 50 while being supported by the second bushing 40.
  • the socket 50 is arranged in the large diameter hole of the second insertion hole of the second bushing 40.
  • the socket 50 has a bottomed cylindrical shape.
  • the socket 50 is a conductive material, such as a metallic material, such as phosphor bronze. Since the socket 50 covers the central conductor 72 while having a central gap 56 with respect to the central conductor 72 of the coaxial cable 70 described later, it acts as a conductive center cover member.
  • a second accommodating portion 54 is formed inside the socket 50.
  • the socket 50 has a socket end 57 on the base end side A.
  • the socket end 57 serves as a center cover end.
  • the socket 50 is formed with a central through hole 58 extending in the thickness direction of the socket 50.
  • the two central through holes 58 are arranged to face each other at an angle of 180 degrees. The arrangement and number of the central through holes 58 are not limited to this.
  • the coaxial cable 70 has a conductive center conductor 72, a dielectric 74 covering the center conductor 72, an outer conductor 76 covering the dielectric 74, and an electrically insulating outer skin 78 covering the outer conductor 76.
  • the tip of the center conductor 72 is exposed from the dielectric 74.
  • the dielectric 74 has a dielectric end 75 at the distal end side B of the probe 1.
  • the outer conductor 76 has an outer conductor end 77 at the tip end side B of the probe 1.
  • the tip of the dielectric 74 including the dielectric end 75 projects from the outer conductor end 77 to the tip side B and is exposed from the outer conductor 76.
  • the tip of the outer conductor 76 including the outer conductor end 77 is exposed from the outer skin 78.
  • the dielectric end 75 of the dielectric 74 is locked by the base end portion of the second bushing 40.
  • the outer conductor end 77 is separated from the tip end side B of the center conductor 72 by the proximal end side A. Thereby, the short circuit prevention effect in the central conductor 72 and the outer conductor 76 can be enhanced.
  • the corner portion of the dielectric end 75 of the dielectric 74 is in contact with the edge portion of the second bushing 40 which is the end portion of the proximal end side A and has a tapered shape defining the socket insertion portion 44.
  • the loading area of the solder 61 and the loading area of the solder 64 can be partitioned, so that it is possible to prevent the solder 61 and the solder 64 from coming into contact with each other and short-circuiting.
  • an external gap 16 is formed between the outer peripheral surface of the conductor of the outer conductor 76 and the inner peripheral surface 13 of the barrel of the barrel body 12.
  • the tip of the center conductor 72 is inserted into and accommodated in the second accommodating portion 54 of the socket 50.
  • a central gap 56 is formed between the outer peripheral surface of the central conductor 72 of the central conductor 72 and the inner peripheral surface of the socket of the socket 50.
  • a central conductor connecting structure (conductor connecting structure) 7 is provided for the central conductor 72 of the coaxial cable 70, and an external conductor connecting structure (conductor connecting structure) 8 is provided for the outer conductor 76. Is provided.
  • the socket 50 that acts as a center cover member is configured to cover the center conductor 72 while having a center gap 56 with respect to the center conductor 72 in order to insert the tip end portion of the center conductor 72 into the socket insertion portion 44. ..
  • Solder 64 is arranged to fix and electrically connect the tip of the center conductor 72 to the socket 50. This facilitates fixing and electrical connection of the tip of the center conductor 72 to the socket 50.
  • the solder 64 acts as a central connecting portion and also as a central connecting member. The solder 64 is supplied from the central through hole 58 to fill the central gap 56. This makes it easy to supply the solder 64 to the central gap 56.
  • the central through hole 58 serves as a solder supply unit.
  • the central through hole 58 is, for example, a round through hole when viewed from the Z-axis direction.
  • the central through hole 58 is arranged on the base end side A, that is, on the side of the socket end 57.
  • the solder 64 supplied from the central through hole 58 fills at least the proximal end side A of the central gap 56.
  • the solder 64 disposed in the central gap 56 has a central connection end 65 on the base end side A.
  • the center connection end 65 of the solder 64 is located from the socket end 57 of the socket 50 to the proximal end side A, and is located between the socket end 57 and the dielectric end 75.
  • the center connection end 65 is flush with, for example, the socket end 57.
  • the center connection end 65 of the solder 64 is configured to be flush with the socket end 57 of the socket 50.
  • the current path from the center conductor 72 to the socket 50 is the center conductor outer peripheral surface 82 of the center conductor 72, the center connection end 65 of the solder 64, the socket end 57 of the socket 50, and the socket. It becomes the socket outer peripheral surface 51 of 50. Therefore, in the above-mentioned central conductor connection structure 7, since the current path does not have a return path, unnecessary resonance is suppressed, and the electrical characteristics of the object 2 to be measured can be measured accurately.
  • the barrel 10 that acts as an outer cover member is configured to cover the outer conductor 76 while having an outer gap 16 with respect to the outer conductor 76 in order to insert the coaxial cable 70 into the first accommodating portion 14.
  • Solder 61 is arranged to fix and electrically connect the barrel 10 to the outer conductor 76. This facilitates the fixation and electrical connection of the outer conductor 76 to the barrel 10.
  • the solder 61 works as an external connecting portion and also as an external connecting member.
  • the solder 61 is supplied from the external through hole 18 to fill the external gap 16. This makes it easy to supply the solder 61 to the external gap 16. Therefore, the external through hole 18 functions as a solder supply unit.
  • the external through hole 18 is, for example, a round through hole when viewed from the Z-axis direction.
  • the external through hole 18 is arranged on the tip end side B in the barrel main body 12.
  • the solder 61 supplied from the external through hole 18 fills at least the tip side B of the external gap 16.
  • the solder 61 disposed in the external gap 16 has an external connection end 62 on the tip end side B.
  • the outer connection end 62 of the solder 61 is located on the tip end side B from the outer conductor end 77 of the outer conductor 76, and is located between the outer conductor end 77 and the dielectric end 75. ..
  • the external connection end 62 is displaced toward the tip end side B with respect to the external conductor end 77, for example.
  • the outer conductor end 77 is located on the base end side A of the outer through hole 18 with respect to the opening tip portion 19 formed on the tip side B, and is at a position facing the outer through hole 18. As a result, the outer conductor end 77 is covered with the solder 61, and the external connection end 62 is displaced toward the tip side B from the outer conductor end 77, so that the formation of a return path can be prevented.
  • the outer connection end 62 of the solder 61 is configured to be located on the tip side B with respect to the outer conductor end 77 of the outer conductor 76.
  • the current path from the outer conductor 76 to the barrel 10 is the outer conductor inner peripheral surface 86 of the outer conductor 76, the outer connection end 62 of the solder 61, and the barrel inner peripheral surface of the barrel 10. It becomes 13. Therefore, in the above-mentioned external conductor connection structure 8, since the current path does not have a return path, unnecessary resonance is suppressed, and the electrical characteristics of the object 2 to be measured can be measured accurately.
  • the probe 1 shown in FIG. 6 has the same central conductor connection structure 7 as in the first embodiment, and the external connection end 62 of the solder 61 supplied from the external through hole 18 is connected to the external conductor end 77 of the external conductor 76. On the other hand, it has a central conductor connection structure 7 that is flush with each other.
  • an external through hole 18 is arranged on the tip side B.
  • the outer through hole 18 is arranged so that the opening tip portion 19 on the tip end side B is aligned with the outer conductor end 77 of the outer conductor 76.
  • the solder 61 supplied from the external through hole 18 fills at least the tip side B of the external gap 16.
  • the solder 61 disposed in the external gap 16 has an external connection end 62 on the tip end side B.
  • the external connection end 62 of the solder 61 is located from the outer conductor end 77 of the outer conductor 76 to the tip end side B, and is located between the outer conductor end 77 and the dielectric end 75. ..
  • the external connection end 62 is, for example, flush with respect to the external conductor end 77.
  • the current path from the outer conductor 76 to the barrel 10 is the outer conductor inner peripheral surface 86 of the outer conductor 76, the outer conductor end 77 of the outer conductor 76, and the outer connection end 62 of the solder 61. , And the barrel inner peripheral surface 13 of the barrel 10. Therefore, in the above-mentioned external conductor connection structure 8, since the current path does not have a return path, unnecessary resonance is suppressed, and the electrical characteristics of the object 2 to be measured can be measured accurately.
  • the probe 1 shown in FIG. 7 has an outer conductor connection structure 8 similar to that of the first embodiment, and the center connection end 65 of the solder 64 supplied from the center notch 59 is closer to the base end side A than the socket end 57. It has a misaligned center conductor connection structure 7.
  • the center notch 59 is arranged so as to be aligned with the socket end 57.
  • Solder 64 is arranged to fix and electrically connect the tip of the center conductor 72 to the socket 50.
  • the solder 64 acts as a central connecting portion and also as a central connecting member.
  • the central notch 59 has a shape such as a semicircle or an ellipse when viewed from the Z-axis direction, and extends in the thickness direction of the socket 50.
  • the central notch 59 serves as a solder supply unit.
  • the solder 64 supplied from the central notch 59 fills at least the proximal end side A of the central gap 56. This facilitates fixing and electrical connection of the tip of the center conductor 72 to the socket 50.
  • the solder 64 disposed in the central gap 56 has a central connection end 65 on the base end side A.
  • the center connection end 65 of the solder 64 is located from the socket end 57 of the socket 50 to the proximal end side A, and is located between the socket end 57 and the dielectric end 75.
  • the center connection end 65 is displaced from the socket end 57 to the base end side A, for example.
  • the current path from the center conductor 72 to the socket 50 is the center conductor outer peripheral surface 82 of the center conductor 72, the center connection end 65 of the solder 64, the socket end 57 of the socket 50, and It becomes the socket outer peripheral surface 51 of the socket 50. Therefore, in the above-mentioned central conductor connection structure 7, since the current path does not have a return path, unnecessary resonance is suppressed, and the electrical characteristics of the object 2 to be measured can be measured accurately.
  • the probe 1 shown in FIG. 8 has an outer conductor connection structure 8 similar to that of the second embodiment, and the center connection end 65 of the solder 64 supplied from the center notch 59 is flush with the socket end 57. It has a central conductor connection structure 7.
  • the central notch 59 is arranged so as to be aligned with the socket end 57.
  • the central notch 59 has a shape such as a semicircle or an ellipse when viewed from the Z-axis direction, and extends in the thickness direction of the socket 50.
  • the solder 64 supplied from the central notch 59 fills at least the proximal end side A of the central gap 56.
  • the solder 64 disposed in the central gap 56 has a central connection end 65 on the base end side A.
  • the central connection end 65 of the solder 64 is located from the socket end 57 of the socket 50 to the proximal end side A, and is located between the socket end 57 and the dielectric end 75.
  • the center connection end 65 is flush with, for example, the socket end 57.
  • the current path from the center conductor 72 to the socket 50 is the center conductor outer peripheral surface 82 of the center conductor 72, the center connection end 65 of the solder 64, the socket end 57 of the socket 50, and It becomes the socket outer peripheral surface 51 of the socket 50. Therefore, in the above-mentioned central conductor connection structure 7, since the current path does not have a return path, unnecessary resonance is suppressed, and the electrical characteristics of the object 2 to be measured can be measured accurately.
  • the probe 1 shown in FIG. 9 has an outer conductor connection structure 8 similar to that of the first embodiment, and also has a center conductor connection structure 7 in which the solder 64 fills the center gap 56.
  • the socket 50 is arranged so as to fill the central gap 56 without having the central through hole 58 or the central notch 59.
  • the solder 64 disposed in the central gap 56 has a central connection end 65 on the base end side A.
  • the center connection end 65 of the solder 64 is located from the socket end 57 of the socket 50 to the proximal end side A, and is located between the socket end 57 and the dielectric end 75.
  • the center connection end 65 is flush with, for example, the socket end 57.
  • the center connection end 65 of the solder 64 may be displaced from the socket end 57 of the socket 50 to the base end side A.
  • the current path from the center conductor 72 to the socket 50 is the center conductor outer peripheral surface 82 of the center conductor 72, the center connection end 65 of the solder 64, the socket end 57 of the socket 50, and It becomes the socket outer peripheral surface 51 of the socket 50. Therefore, in the above-mentioned central conductor connection structure 7, since the current path does not have a return path, unnecessary resonance is suppressed, and the electrical characteristics of the object 2 to be measured can be measured accurately.
  • the probe 1 shown in FIG. 10 has an outer conductor connection structure 8 similar to that of the second embodiment, and also has a center conductor connection structure 7 in which the solder 64 fills the center gap 56.
  • the socket 50 is arranged so as to fill the central gap 56 without having the central through hole 58 or the central notch 59.
  • the solder 64 disposed in the central gap 56 has a central connection end 65 on the base end side A.
  • the center connection end 65 of the solder 64 is located from the socket end 57 of the socket 50 to the proximal end side A, and is located between the socket end 57 and the dielectric end 75.
  • the center connection end 65 is displaced from the socket end 57 to the base end side A, for example.
  • the center connection end 65 of the solder 64 may be flush with the socket end 57 of the socket 50.
  • the probe 1 shown in FIG. 11 has the same central conductor connection structure 7 as in the first embodiment, and the outer conductor 76 of the coaxial cable 70 is fixed to the barrel 10 by the conductive fitting member 67 and is electrically operated. It has an outer conductor connection structure 8 to be connected.
  • a conductive fitting member 67 that works as an external connection portion and also works as an external connection member is fitted in the external gap 16.
  • the outer gap 16 is formed between the outer conductor inner peripheral surface 86 of the outer conductor 76 and the barrel inner peripheral surface 13 of the barrel body 12.
  • the conductive fitting member 67 is arranged so as to abut on the outer conductor end 77 of the outer conductor 76 and the barrel inner peripheral surface 13 of the barrel 10, respectively. This facilitates the fixation and electrical connection of the outer conductor 76 to the barrel 10.
  • the fitting member 67 is a conductive material, for example, a metallic material, for example, phosphor bronze.
  • the fitting member 67 has, for example, an annular shape, and has a contact end surface 68, a contact peripheral surface 69, a fitting inner peripheral surface 87, and an external connection end 88.
  • the contact end surface 68 is formed on the proximal end side A
  • the external connection end 88 is formed on the distal end side B.
  • the fitting member 67 is fitted between the outer conductor 76 of the coaxial cable 70 and the second bushing 40, and is press-fitted into the first accommodating portion 14. As a result, the contact end surface 68 abuts on the outer conductor end 77, and the contact peripheral surface 69 abuts on the barrel inner peripheral surface 13.
  • the outer conductor 76 of the coaxial cable 70 is fixed and electrically connected to the barrel 10 by the conductive fitting member 67.
  • the external connection end 88 of the fitting member 67 is located on the tip end side B from the outer conductor end 77 of the outer conductor 76, and is located between the outer conductor end 77 and the dielectric end 75.
  • the external connection end 88 is displaced toward the tip end side B with respect to the outer conductor end 77, for example.
  • the current path from the outer conductor 76 to the barrel 10 is the outer conductor inner peripheral surface 86 of the outer conductor 76, the fitting inner peripheral surface 87 of the fitting member 67, the outer connecting end 88, and the outer connecting end 88. , It becomes the barrel inner peripheral surface 13 of the barrel 10. Therefore, in the above-mentioned external conductor connection structure 8, since the current path does not have a return path, unnecessary resonance is suppressed, and the electrical characteristics of the object 2 to be measured can be measured accurately.
  • the contact end surface 68 is located on the proximal end side A of the external through hole 18 with respect to the opening tip portion 19 formed on the distal end side B, and is at a position facing the external through hole 18.
  • the position of the fitting member 67 can be visually recognized through the external through hole 18.
  • the solder 61 can be supplied from the external through hole 18 to electrically connect the external conductor 76 and the fitting member 67. This can reinforce the electrical connection.
  • the fitting member 67 may be configured to be integrated with the barrel 10.
  • the central through hole 58 is arranged on the proximal end side A.
  • the solder 64 supplied from the central through hole 58 fills at least the proximal end side A of the central gap 56.
  • the solder 64 disposed in the central gap 56 has a central connection end 65 on the base end side A.
  • the center connection end 65 of the solder 64 is located from the socket end 57 of the socket 50 to the proximal end side A, and is located between the socket end 57 and the dielectric end 75.
  • the center connection end 65 is flush with, for example, the socket end 57.
  • the current path from the center conductor 72 to the socket 50 is the center conductor outer peripheral surface 82 of the center conductor 72, the center connection end 65 of the solder 64, the socket end 57 of the socket 50, and It becomes the socket outer peripheral surface 51 of the socket 50. Therefore, in the above-mentioned central conductor connection structure 7, since the current path does not have a return path, unnecessary resonance is suppressed, and the electrical characteristics of the object 2 to be measured can be measured accurately.
  • the probe 1 shown in FIG. 12 has an outer conductor connection structure 8 similar to that of the seventh embodiment, and the solder 64 supplied from the center notch 59 fills the base end side A of the center gap 56 with the center conductor connection structure 7. Has.
  • the center notch 59 is arranged so as to be aligned with the socket end 57.
  • the central notch 59 has a shape such as a semicircle or an ellipse when viewed from the Z-axis direction, and extends in the thickness direction of the socket 50.
  • the socket end 57 is in contact with the dielectric end 75.
  • the solder 64 supplied from the central notch 59 fills at least the proximal end side A of the central gap 56.
  • the solder 64 disposed in the central gap 56 has a central connection end 65 on the base end side A.
  • the central connection end 65 of the solder 64 is located from the socket end 57 of the socket 50 to the proximal end side A, and is located between the socket end 57 and the dielectric end 75.
  • the center connection end 65 is flush with, for example, the socket end 57.
  • the current path from the center conductor 72 to the socket 50 is the center conductor outer peripheral surface 82 of the center conductor 72, the center connection end 65 of the solder 64, the socket end 57 of the socket 50, and It becomes the socket outer peripheral surface 51 of the socket 50. Therefore, in the above-mentioned central conductor connection structure 7, since the current path does not have a return path, unnecessary resonance is suppressed, and the electrical characteristics of the object 2 to be measured can be measured accurately.
  • the probe 1 shown in FIG. 13 has an outer conductor connection structure 8 similar to that of the seventh embodiment, and also has a center conductor connection structure 7 in which the solder 64 fills the center gap 56.
  • the socket 50 is arranged so as to fill the central gap 56 without the central through hole 58 or the central notch 59.
  • the socket end 57 is in contact with the dielectric end 75.
  • the solder 64 disposed in the central gap 56 has a central connection end 65 on the base end side A.
  • the center connection end 65 of the solder 64 is located from the socket end 57 of the socket 50 to the proximal end side A, and is located between the socket end 57 and the dielectric end 75.
  • the center connection end 65 is flush with, for example, the socket end 57.
  • the current path from the center conductor 72 to the socket 50 is the center conductor outer peripheral surface 82 of the center conductor 72, the center connection end 65 of the solder 64, the socket end 57 of the socket 50, and It becomes the socket outer peripheral surface 51 of the socket 50. Therefore, in the above-mentioned central conductor connection structure 7, since the current path does not have a return path, unnecessary resonance is suppressed, and the electrical characteristics of the object 2 to be measured can be measured accurately.
  • the probe 1 includes both the central conductor connection structure 7 and the outer conductor connection structure 8, but can include at least one of the center conductor connection structure 7 and the outer conductor connection structure 8.
  • the above embodiment is an example, and the central conductor connection structure 7 and the outer conductor connection structure 8 in the above embodiment can be appropriately combined.
  • the external connection portions 61 and 67 are separate members from the external cover member 10. As a result, the external connection ends 62 and 88 can be positioned with high accuracy. However, the external connection portion can be a part of the external cover member 10.
  • the outer cover member 10 has, as an external connecting portion,, for example, an external protruding portion that projects toward the external conductor 76 and presses against the external conductor 76 at a location corresponding to the external through hole 18. Such an external protrusion is formed by caulking. As a result, the external protrusion is joined to the external conductor 76 and is electrically connected to the external conductor 76.
  • the external protrusion has, for example, a circular or rectangular shape when viewed from the Z-axis direction, and has a rectangular cross section.
  • the external protrusion has an external connection end on the other end side (tip side) B.
  • the external connection end of the external protrusion is located on the other end side (tip side) B from the external conductor end 77.
  • the external connection end of the external protrusion is displaced toward the other end side (tip side) B from the external conductor end 77, or is a surface with respect to the external conductor end 77, similarly to the external connection ends 62 and 88 described above. It is one.
  • the central connection portion 64 is a member separate from the central cover member 50.
  • the center connection end 65 can be positioned with high accuracy.
  • the central connection portion 64 can be a part of the central cover member 50.
  • the central cover member 50 has, for example, a central protruding portion that projects toward the central conductor 72 and presses against the central conductor 72 at a position corresponding to the central through hole 58 or the central notch 59.
  • Such a central protrusion is formed by caulking.
  • the central protrusion is joined to the central conductor 72 and is electrically connected to the central conductor 72.
  • the central protrusion has, for example, a circular or rectangular shape when viewed from the Z-axis direction, and has a rectangular cross section.
  • the central protrusion has a central connection end on the proximal end side A.
  • the central connection end of the central protrusion is located on the base end side A from the central cover end 57.
  • the central connection end of the central protrusion is displaced toward the proximal end side A from the central cover end 57 or is flush with the central cover end 57, similarly to the central connection end 65 described above.
  • the shapes of the central through hole 58, the central notch 59, and the external through hole 18 that act as solder feeders are exemplary and, when viewed from the Z-axis direction, are, for example, square, rectangular, trapezoidal, parallelogram, oval, egg. It can have various shapes such as shape, semi-oval, and semi-oval.
  • the solder 64 may be present in the central through hole 58 and the central notch 59, and the solder 61 may be present in the external through hole 18.
  • the tip of the central conductor 72 protrudes from the dielectric 74
  • the tip of the dielectric 74 protrudes from the outer conductor 76
  • the tip of the outer conductor 76 protrudes from the outer skin 78. ing.
  • the short circuit prevention effect in the central conductor 72 and the outer conductor 76 can be enhanced.
  • the conductor connection structure 8 is Base end side A having a measuring pin 20 to which a coaxial cable 70 in which a central conductor 72, a dielectric 74 and an outer conductor 76 are coaxially arranged is connected, and which is electrically connected to the central conductor 72 of the coaxial cable 70.
  • the conductor connection structure 8 in the probe 1 extending from the tip side B to the tip side B.
  • a conductive outer cover member 10 that covers the outer conductor 76 while having a gap 16.
  • a conductive external connecting portion 61, 67 for fixing and electrically connecting the external conductor 76 to the external cover member 10 is provided.
  • the external connection ends 62, 88 which are the ends of the tip side B of the probe 1 in the external connection portions 61, 67, are relative to the outer conductor end 77, which is the end of the tip side B of the probe 1 in the outer conductor 76. , It is located flush with each other, or is located on the distal end side B of the probe 1.
  • the external connection ends 62, 88 are located on the other end side (tip side) B from the outer conductor end 77, which means that the external connection ends 62, 88 are on the other end side (tip side) of the outer conductor end 77. ) It means that it is located offset from B or is flush with respect to the outer conductor end 77.
  • the external connection ends 62, 88 are located between the dielectric end 75, which is the end of the tip end side B of the probe 1 in the dielectric 74, and the external conductor end 77.
  • the short circuit prevention effect of the central conductor 72 and the outer conductor 76 can be enhanced.
  • the outer cover member 10 has an outer through hole 18 extending in the thickness direction thereof.
  • the outer conductor end 77 is located on the proximal end side A of the probe 1 with respect to the opening tip 19 formed on the distal end side B of the probe 1 in the external through hole 18, and faces the outer through hole 18. Is in a position to do.
  • the position of the external conductor end 77 can be confirmed through the external through hole 18, and it can be confirmed whether or not the external conductor 76 and the external connecting portions 61 and 67 are electrically connected.
  • the external connection portion is solder 61, and is The external through hole 18 serves as a solder supply unit for supplying the solder 61.
  • the external connection portion 61 is a fitting member 67 that is fitted into the gap 16.
  • the outer conductor end 77 is separated from the distal end side B of the probe 1 in the central conductor 72 to the proximal end side A of the probe 1.
  • the short circuit prevention effect of the central conductor 72 and the outer conductor 76 can be enhanced.
  • the object 2 to be measured measured by the probe 1 is the connector 2.
  • the electrical characteristics of the connector 2 can be measured with high accuracy.
  • the probe 1 according to another aspect of the present invention is It is characterized by including the conductor connection structure 8 described above.
  • the conductor connection structure 7 is Base end side A having a measuring pin 20 to which a coaxial cable 70 in which a central conductor 72, a dielectric 74 and an outer conductor 76 are coaxially arranged is connected, and which is electrically connected to the central conductor 72 of the coaxial cable 70.
  • the conductor connection structure 7 in the probe 1 extending from the tip side B to the tip side B.
  • a conductive center cover member 50 that covers the center conductor 72 while having a gap 56,
  • a conductive center connecting portion 64 for fixing and electrically connecting the center conductor 72 to the center cover member 50 is provided.
  • the central connection end 65 which is the end of the proximal end side A of the probe 1 in the central connection portion 64, is relative to the central cover end 57, which is the end of the proximal end side A of the probe 1 in the central cover member 50. It is located flush with each other or on the proximal end side A of the probe 1.
  • the center connection end 65 is located on the base end side A from the center cover end 57 means that the center connection end 65 is displaced from the center cover end 57 to the base end side A, or the center cover end. It means that it is flush with 57.
  • the center connection end 65 is located between the dielectric end 75, which is the end of the tip end side B of the probe 1 in the dielectric 74, and the center cover end 57.
  • the short circuit prevention effect of the central conductor 72 and the outer conductor 76 can be enhanced.
  • the central cover member has a central through hole 58 or a central notch 59 extending in the thickness direction of the central cover member 50.
  • the central connection portion 64 is supplied through the central through hole 58 or the central notch 59.
  • the central connection portion 64 is a solder 64.
  • the outer conductor end 77 which is the end of the distal end side B of the probe 1 in the outer conductor 76, is separated from the distal end side B of the probe 1 in the central conductor 72 with respect to the proximal end side A of the probe 1. There is.
  • the short circuit prevention effect of the central conductor 72 and the outer conductor 76 can be enhanced.
  • the object 2 to be measured measured by the probe 1 is the connector 2.
  • the electrical characteristics of the connector 2 can be measured with high accuracy.
  • the probe 1 according to another aspect of the present invention is It is characterized by including the conductor connection structure 7 described above.
  • Probe 2 Connector (measured object) 3: Connector terminal (measured terminal) 7: Center conductor connection structure (conductor connection structure) 8: External conductor connection structure (conductor connection structure) 10: Barrel (external cover member) 12: Barrel body 13: Barrel inner peripheral surface 14: First accommodating part 15: Tip through hole 16: External gap (gap) 18: External through hole (solder supply part) 19: Opening tip 20: Measuring pin 22: Measuring end 24: Connection end 30: First bushing 40: Second bushing 44: Socket insertion part 50: Socket (center cover member) 51: Socket outer peripheral surface 54: Second accommodating part 56: Center gap (gap) 57: Socket end (center cover end) 58: Central through hole (solder supply part) 59: Central notch (solder supply section) 61: Solder (external connection part, external connection member) 62: External connection end 64: Solder (center connection part, center connection member) 65: Center connection end end

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
PCT/JP2021/023800 2020-07-16 2021-06-23 導体接続構造および該導体接続構造を備えるプローブ WO2022014285A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2022536212A JP7243925B2 (ja) 2020-07-16 2021-06-23 導体接続構造および該導体接続構造を備えるプローブ
CN202180047100.8A CN115803969A (zh) 2020-07-16 2021-06-23 导体连接构造以及具备该导体连接构造的探针

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020122355 2020-07-16
JP2020-122355 2020-07-16

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JP (1) JP7243925B2 (enrdf_load_stackoverflow)
CN (1) CN115803969A (enrdf_load_stackoverflow)
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Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61118984A (ja) * 1984-11-06 1986-06-06 エーデイーシー　テレコミユニケーシヨンズ，インコーポレイテイド プラグ
JP2014123482A (ja) * 2012-12-21 2014-07-03 Murata Mfg Co Ltd 検査用同軸コネクタ
JP2014225345A (ja) * 2013-05-15 2014-12-04 日立金属株式会社 高速伝送線の終端構造、終端方法および終端端子
JP2015225766A (ja) * 2014-05-28 2015-12-14 Smk株式会社 気密型同軸コネクタ
CN105337122A (zh) * 2014-08-13 2016-02-17 吉佳蓝科技股份有限公司 检查用同轴连接器
US20170302042A1 (en) * 2016-04-13 2017-10-19 Trisimian, Llc Dc solderless connector
JP2019153465A (ja) * 2018-03-02 2019-09-12 日本圧着端子製造株式会社 同軸コネクタ
WO2020175347A1 (ja) * 2019-02-27 2020-09-03 株式会社村田製作所 プローブ素子およびプローブユニット

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61118984A (ja) * 1984-11-06 1986-06-06 エーデイーシー　テレコミユニケーシヨンズ，インコーポレイテイド プラグ
JP2014123482A (ja) * 2012-12-21 2014-07-03 Murata Mfg Co Ltd 検査用同軸コネクタ
JP2014225345A (ja) * 2013-05-15 2014-12-04 日立金属株式会社 高速伝送線の終端構造、終端方法および終端端子
JP2015225766A (ja) * 2014-05-28 2015-12-14 Smk株式会社 気密型同軸コネクタ
CN105337122A (zh) * 2014-08-13 2016-02-17 吉佳蓝科技股份有限公司 检查用同轴连接器
US20170302042A1 (en) * 2016-04-13 2017-10-19 Trisimian, Llc Dc solderless connector
JP2019153465A (ja) * 2018-03-02 2019-09-12 日本圧着端子製造株式会社 同軸コネクタ
WO2020175347A1 (ja) * 2019-02-27 2020-09-03 株式会社村田製作所 プローブ素子およびプローブユニット

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JP7243925B2 (ja) 2023-03-22
CN115803969A (zh) 2023-03-14

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