WO2021240852A1 - Dispositif de mesure de qualité de grain de riz - Google Patents

Dispositif de mesure de qualité de grain de riz Download PDF

Info

Publication number
WO2021240852A1
WO2021240852A1 PCT/JP2020/046708 JP2020046708W WO2021240852A1 WO 2021240852 A1 WO2021240852 A1 WO 2021240852A1 JP 2020046708 W JP2020046708 W JP 2020046708W WO 2021240852 A1 WO2021240852 A1 WO 2021240852A1
Authority
WO
WIPO (PCT)
Prior art keywords
whiteness
light
sample dish
rice
measuring device
Prior art date
Application number
PCT/JP2020/046708
Other languages
English (en)
Japanese (ja)
Inventor
尚志 坂本
剛志郎 梶山
Original Assignee
株式会社サタケ
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社サタケ filed Critical 株式会社サタケ
Priority to CN202080099701.9A priority Critical patent/CN115380202A/zh
Publication of WO2021240852A1 publication Critical patent/WO2021240852A1/fr

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss

Definitions

  • the present invention relates to a device capable of measuring the whiteness and gloss of rice grains.
  • the quality evaluation of rice milling in the Japanese domestic market is generally performed by the whiteness, but in the long grain rice milling in the overseas market, the whiteness and gloss are the quality evaluation items.
  • Patent Document 1 discloses a whiteness measuring device.
  • the gloss measuring device the grain gloss measuring device of Patent Document 2 and Patent Document 3 is known. Both the device for measuring the whiteness and the device for measuring the gloss have a structure in which the polished rice is irradiated with light and the reflected light is measured.
  • An object of the present invention is to provide a compact measuring device capable of measuring whiteness and gloss value in a short time.
  • the rice grain quality measuring apparatus of the present invention is for measuring the gloss of the surface of the rice grain of the sample dish on which the rice grain is placed and the surface of the rice grain of the sample dish placed on the table.
  • a gloss measuring device that measures the gloss of rice grains by irradiating light and receiving the reflected light, and the rice grains of the sample dish placed on the table are irradiated with light for whiteness measurement, and the sample dish is said. It is characterized by having a whiteness measuring device for measuring the whiteness of rice grains by receiving the reflected light from the rice grains.
  • the gloss measuring instrument is arranged above the table, and the whiteness measuring instrument is arranged below the table.
  • the whiteness measuring device irradiates light for whiteness measurement from the lower surface of the sample dish placed on the table through the sample dish, and receives the reflected light from the rice grains of the sample dish through the sample dish.
  • the sample dish As the sample dish, a sample dish having a glossy sample area in which one layer of rice grains is arranged for measuring gloss and a whiteness sample area in which rice grains are packed in multiple layers for measuring whiteness can be used.
  • the whiteness sample region is made of a material that allows the sample dish to transmit light for whiteness measurement.
  • a turntable can be used as the above table.
  • the turntable is provided with an opening for placing the whiteness area of the sample dish or a window for transmitting light for whiteness measurement, and one or more reference plates are arranged on the lower surface of the table.
  • the turntable rotates, the sample dish and one or more reference plates are sequentially arranged at positions where light for whiteness measurement is irradiated.
  • the sample area for measuring the gloss of the sample dish is placed at the center of rotation of the turntable.
  • the gloss measuring instrument irradiates the rice grains of the sample dish placed on the table with the light of the first wavelength from diagonally above and the rice grains of the sample dish with the light of the second wavelength from above.
  • the configuration may include a second light source, a camera that captures the sample dish with the light of the first wavelength and the light of the second wavelength from the sample dish, and a gloss calculation unit.
  • the gloss calculation unit generates an image of rice grains in the sample dish of light of the first wavelength and an image of rice grains in the sample dish of light of the second wavelength from the image captured by the camera, and is based on both images. Calculate the gloss value of the rice grains in the sample dish.
  • the whiteness measuring device is, for example, placed at the bottom of the table, a third light source for irradiating the rice grains of the sample dish with a third light for whiteness measurement, and placed at the bottom of the table, from the rice grains of the sample dish.
  • the configuration includes a light receiving unit that receives the reflected light of the third light for measuring the whiteness, and a whiteness calculation unit that calculates the whiteness from the light receiving intensity of the light receiving unit.
  • the whiteness calculation unit is based on the light receiving intensity when the rice grains of the sample dish are irradiated with light for measuring whiteness and the light receiving intensity when the reference plate is arranged instead of the rice grains of the sample dish. Therefore, the whiteness can be calculated.
  • the gloss calculation unit may calculate the area of the milky white rice grains contained in the rice grains of the sample dish on the image by performing a predetermined process on the image of the rice grains of the sample dish of the light of the second wavelength. good.
  • the whiteness calculation unit includes a correction unit that corrects the whiteness based on the area of milky white rice grains calculated by the gloss calculation unit.
  • the sample dish is provided with a whiteness sample area in the center, and a glossy sample area shallower than the whiteness sample area is provided so as to surround the outer periphery of the whiteness sample area.
  • the configuration as shown in FIG. 9 may be used.
  • the sample dish may be integrated with the table.
  • FIG. (A) is a cross-sectional view of a sample dish 110a provided with a reference plate of the second embodiment, (b) a cross-sectional view of a sample dish 110b for measuring whiteness, and (c) a cross-sectional view of a sample dish 110c for measuring gloss.
  • (A) is a cross-sectional view of a sample dish 111a for measuring gloss provided with a reference plate of Embodiment 2
  • (b) is a cross-sectional view of a sample dish 110b for measuring whiteness.
  • FIG. 1 It is a block diagram of the rice milling apparatus of Embodiment 5.
  • Embodiment 1 the rice grain quality measuring device of the first embodiment will be described.
  • the rice grain quality measuring device of the present embodiment includes a table 20 on which a sample dish 10 on which rice grains are placed is placed, a gloss measuring device 30, and a whiteness measuring device 40. NS.
  • the device by configuring the device to include both the gloss measuring device 30 and the whiteness measuring device 40 in one device, compact rice grains that can measure both gloss and whiteness in a short time with one device are provided.
  • a quality measuring device can be provided.
  • the gloss measuring device 30 measures the gloss of the rice grains by irradiating the surface of the rice grains of the sample dish 10 with light for measuring the gloss and receiving the reflected light.
  • the gloss measuring instrument 30 uses a first light source 31 that emits light of the first wavelength, a second light source 32 that emits light of the second wavelength, and a sample dish with light of the first and second wavelengths. It is configured to include a camera 33 for capturing an image.
  • the first light source 31 is arranged at a position where the rice grain of the sample dish 10 placed on the table is irradiated with the light of the first wavelength from diagonally above.
  • the camera 33 is arranged at a position where the reflected light of the first wavelength light by the rice grain of the sample dish 10 is received.
  • the second light source 32 irradiates the second wavelength light from above the rice grains of the sample dish 10.
  • the position of the second light source 32 may be arranged at any position as long as the reflected light of the second wavelength light by the rice grains is received by the camera 33.
  • the second light source 32 may be arranged at a position facing the first light source 31 with the sample dish 10 interposed therebetween as shown in FIG. 1, or may be arranged directly above the sample dish 10 as shown in FIG.
  • the sample dish 10 may be arranged and the sample dish 10 may be irradiated with the second wavelength light along the normal direction of the main plane of the sample dish 10.
  • the camera 33 receives the reflected light of the first wavelength light by the rice grain of the sample dish 10 and the reflected light of the second wavelength light, and images the rice grain.
  • An optical element for example, a polarizing plate
  • the gloss calculation unit 34 separates the image captured by the camera 33 by wavelength to generate an image of rice grains in the sample dish 10 by the first wavelength light and an image of the rice grains in the sample dish 10 by the second wavelength light. , Both images are processed to calculate the gloss value of the rice grain of the sample dish 10.
  • the first wavelength light and the second wavelength light have different wavelengths.
  • red light can be used as the first wavelength light
  • blue light can be used as the second wavelength light.
  • the whiteness measuring device 40 measures the whiteness of the rice grains by irradiating the rice grains of the sample dish 10 with a third light for measuring the whiteness and receiving the reflected light from the rice grains of the sample dish 10 through the sample dish 10. do.
  • the whiteness measuring device 40 includes third light sources 41a and 41b for irradiating the rice grains of the sample dish 10 with the third light for whiteness measurement, and the whiteness measuring device 40 for measuring the whiteness from the rice grains of the sample dish 10.
  • the configuration includes a light receiving unit 42 that receives the reflected light of the third light, and a whiteness calculation unit 43 that calculates the whiteness from the light receiving intensity of the light receiving unit 42.
  • a whiteness calculation unit 43 that calculates the whiteness from the light receiving intensity of the light receiving unit 42.
  • the whiteness measuring instrument 40 is arranged at the lower part of the table 20, but may be arranged at the upper part of the table 20.
  • the light receiving portion 42 is arranged in the normal direction of the lower surface of the sample dish 10.
  • the whiteness calculation method of the whiteness calculation unit 43 may be any calculation method. For example, when the rice grains of the sample dish 10 are irradiated with the third light for whiteness measurement from the third light sources 41a and 41b. The whiteness can be calculated by comparing the light receiving intensity of the light receiving unit 42 with the light receiving intensity when the reference plate is arranged instead of the rice grains of the sample dish 10.
  • the gloss measurement and the whiteness measurement can be performed by one measuring device, but the gloss measurement and the whiteness measurement have different desirable sample forms.
  • one layer of rice grains 15 (one layer of rice in the thickness direction) is arranged on the sample plate 10, and the rice grains 15 are uniformly laid sideways (the long axis is on the table 20). It is desirable to irradiate the ventral portions of the rice grains 15 arranged in the sample dish 10 with the first and second wavelength lights so as to be substantially parallel to the main plane) and receive the reflected light.
  • the whiteness measurement it is desirable to fill the sample dish 10 in multiple layers and irradiate with a third light in order to arrange the rice grains densely and eliminate gaps for stable measurement.
  • the sample dish 10 has a glossy sample region 11 in which a single layer of rice grains 15 is arranged for measuring gloss, and a multilayer of rice grains for measuring whiteness.
  • a configuration having a whiteness sample area 12 to be filled can be used.
  • the whiteness sample region 12 receives the irradiation of the third light for whiteness measurement from the bottom surface 10a of the sample dish 11, the bottom surface 10a is made of a material that transmits the third light. ..
  • the turntable 20 is provided with an opening 20a for placing the whiteness region 12 of the sample dish 10 or a window for transmitting a third light for measuring the whiteness.
  • One or more reference plates 21 and 22 may be arranged on the lower surface of the turntable 20.
  • the opening 20a for placing the whiteness region 12 and the reference plates 21 and 22 are arranged concentrically around the rotation axis 24 of the turntable 20.
  • the white reference plate 21 for measuring the whiteness and the brown reference plate 22 for measuring the brownness can be fixed to the lower surface of the turntable 20.
  • a resin plate whose whiteness has been determined in advance is used.
  • a reference plate 21 of another color such as gray can be used. It is also possible to further improve the calibration accuracy by using three or more types of reference plates.
  • the sample dish and one or more reference plates 21 and 22 are sequentially arranged at positions where the blue light of the third light sources 41a and 41b is irradiated, and the reflected light intensity of each is arranged. Is detected by the light receiving unit 42. This makes it possible to accurately measure the whiteness of the sample.
  • the gloss measurement sample region 11 of the sample dish 10 is placed on the rotation center (rotation axis 24) of the turntable 20.
  • the gloss value can be measured by irradiating light of the first and second wavelengths from the entire circumferential direction.
  • Step 101 First, one layer of rice grains 15 is arranged in a state where the rice grains 15 are laid down in the gloss measurement area 11 of the sample dish 10 of FIGS. 3 (a) and 3 (b), while the whiteness measurement area 12 is filled with rice grains in multiple layers, and FIG. Like, it is mounted on the turntable 20.
  • Step 102 The turntable 20 is continuously rotated at a predetermined rotation speed by the motor 23.
  • Step 103 the rice grains 15 in the gloss measurement region 11 at the center of the sample dish 10 mounted on the rotating turntable 20 are irradiated with the first wavelength light and the second wavelength light from the first light source 31 and the second light source 32.
  • the camera 33 captures images of the first wavelength light and the second wavelength light.
  • the gloss calculation unit 34 measures the gloss value by processing the image of the camera 33.
  • the following method is used. Since the first light source 31 is arranged at a position facing the camera 33 with the sample dish 10 interposed therebetween, the camera 33 captures the reflected light of the rice grains placed on the sample dish 10 irradiated with the first wavelength light. do. At this time, the camera 33 also receives the reflected light of the first wavelength light irradiated to the peripheral region of the rice grain of the sample dish 10 (the edge of the sample dish 10, the table, etc.). On the other hand, since the second light source 32 is arranged above the sample dish 10, the light reflected by the rice grains among the irradiated second wavelength light reaches the camera 33.
  • the gloss calculation unit 34 extracts the image of the reflected light of the first wavelength light by binarizing the image of the first wavelength light captured by the camera 33 according to an appropriate predetermined threshold value.
  • the reflected light of the first wavelength light is the light reflected by the smooth surface of the belly of the rice grain, but since the reflected light from the peripheral members is also taken by the camera 33, the image of the reflected light is the rice grain. It is an image which combined the glossy region and the smooth surface region of the peripheral region (edge of sample dish 10, table, etc.) of rice grains.
  • the gloss calculation unit 34 removes reflected light and the like from regions other than rice grains by binarizing the image of the second wavelength light captured by the camera 33 according to an appropriate predetermined threshold value, and the rice grains. Extract the image of the reflected light from. Since the second light source 32 is arranged above the sample dish 10, the reflected light of the second wavelength light captured by the camera 33 is the light reflected by the surface or the inside of the rice grain, and after the binarization process.
  • the image of the second wavelength light of is an image of a region (grain region) in which rice grains are present.
  • the gloss calculation unit 34 calculates the area (S0) of the image (grain region) after the binarization process of the second wavelength light. Further, the gloss calculation unit 34 extracts the gloss region in the grain region by calculating the area of the overlapping region of the binarized image of the first wavelength light and the binarized image of the second wavelength light. , Calculate its area (S2). The gloss value is calculated by obtaining the ratio (S2 / S0) of the area of the gloss region (S2) and the area of the grain region (S0).
  • the rice grains in the gloss measurement region 11 of the sample dish 10 are irradiated with light from the first and second light sources 31, 32, and the rotation angle is 360 degrees.
  • the average value is calculated.
  • Step 105 When the turntable 20 is stopped, the motor 23 starts the rotation of the turntable 20 again. As a result, it is continuously rotated at a predetermined rotation speed.
  • Step 106 If the white reference plate 21 placed on the turntable 20 reaches the irradiation region of the third light sources 41a and 41b of the whiteness measuring device 40 as the turntable 20 rotates, the whiteness measuring device 40 The amount of light is detected by starting the acquisition of the output data from the light receiving unit 42 that receives the reflected light of the white reference plate 21 irradiated with blue light from the third light sources 41a and 41b. The light receiving unit 42 continues to acquire output data until the white reference plate 21 deviates from the irradiation region of the third light sources 41a and 41b.
  • the whiteness measuring instrument 40 detects that the rotation angle of the turntable 20 has reached a predetermined angle range, it determines that the third light sources 41a and 41b have reached the irradiation region, and receives light. Acquisition of output data from unit 42 can be started.
  • Step 107 When the brown reference plate 22 reached the irradiation region of the third light sources 41a and 41b with the rotation of the turntable 20, the whiteness measuring instrument 40 was irradiated with blue light from the third light sources 41a and 41b. The amount of light is detected by starting the acquisition of the output data from the light receiving unit 42 that receives the reflected light of the brown reference plate 22. The light receiving unit 42 continues to acquire output data until the brown reference plate 22 deviates from the irradiation regions of the third light sources 41a and 41b.
  • Step 108 If the bottom surface of the whiteness measuring region 12 of the sample dish 10 reaches the irradiation region of the third light sources 41a and 41b with the rotation of the turntable 20, the whiteness measuring instrument 40 will use the third light sources 41a and 41b.
  • the amount of light is detected by starting the acquisition of the output data from the light receiving unit 42 that receives the reflected light from the rice grains in the whiteness measuring region 12 irradiated with blue light.
  • the light receiving unit 42 continues to acquire output data until the bottom surface of the whiteness measurement region 12 deviates from the irradiation regions of the third light sources 41a and 41b.
  • the whiteness calculation unit 43 calculates the whiteness from the average (time average) of the amount of reflected light received in steps 106, 107, and 108.
  • the whiteness may be calculated by any method. For example, using a predetermined relationship between the reflected light amount and the whiteness, white is white based on the reflected light amount from the rice grain of the sample received in step 108.
  • a method can be used in which the degree is obtained and the obtained whiteness is corrected by the amount of reflected light from the reference plate obtained in steps 104 and 106. Further, the amount of light reflected from the reference plate obtained in steps 104 and 106 may be used to control the amount of light emitted from the third light sources 41a and 41b to the sample in step 108.
  • Step 110 The gloss value and whiteness obtained in steps 104 and 109 are displayed on the display unit 51.
  • the whiteness and gloss value of rice grains can be measured by one compact measuring device.
  • the gloss value and the whiteness can be measured while rotating the turntable 20, the influence of the uneven arrangement of the rice grains in the sample dish 10 is eliminated, and the calibration by the reference plate is measured every time. Since it can be performed automatically, the gloss value and whiteness can be measured accurately.
  • the whiteness is measured after the gloss value is measured.
  • the gloss value and the whiteness are measured at the same time by irradiating light from the upper and lower measuring instruments 30 and 40 at the same time. Is also possible.
  • the sample dish 10 may be integrated with the turntable 20.
  • the reflected light is measured while rotating the turntable 20 at the time of whiteness measurement, but the whiteness measurement region 12 of the reference plate 21, the reference plate 22, and the sample dish 10 is the third.
  • the turntable 20 may be stopped once and the reflected light may be measured.
  • Embodiment 2 As the second embodiment, an example of the shape of the sample dish different from the first embodiment will be described.
  • the sample dish 10 of the first embodiment was an integrated sample dish provided with both a gloss measurement area 11 and a whiteness measurement area 12, but there are two as shown in FIGS. 7 (b) and 7 (c). It may be separated like the sample dishes 110b and 110c. Further, as shown in FIG. 7A, the reflected light amount of the reference plate 21 may be measured by arranging the reference plate 21 on the bottom surface of the reference sample plate 110a and arranging the reference plate 21 in place of the sample plate 110b.
  • the reference plate 21 may be arranged on the bottom surface of the sample dish 110a for gloss measurement.
  • the sample dish 110b for measuring the whiteness has the same configuration as in FIG. 7B.
  • the sample dish for gloss measurement and the reference plate 21 can be shared with the sample dish 110a, so that the number of sample dishes is shown in FIG. 7. It can be reduced more than in the case of.
  • the sample dish 112b is provided with the whiteness sample area 12 in the center, and the whiteness sample area 12 is provided. It is also possible to use a configuration in which a glossy sample region 11 having a depth shallower than that of the whiteness sample region 12 is provided so as to surround the outer periphery.
  • a reference plate 21 arranged on the bottom surface of the sample dish 110a can be used as in FIG. 7A.
  • a table 20 is used in which both the region irradiated with the light for gloss measurement and the region irradiated with the light for whiteness measurement are arranged on the central axis. That is, an opening or a window is provided in the center of the table 20, and the sample dish and the reference plate 21 are arranged.
  • the sample dish 112b having this configuration can simultaneously irradiate light from the upper and lower measuring instruments 30 and 40 to measure the gloss value and the whiteness at the same time.
  • Embodiment 3 the correction unit 43a (see FIG. 1) for correcting the whiteness measured by the whiteness measuring device 40 obtained in the first embodiment by using the value obtained from the gloss measuring device 30 will be described.
  • the whiteness calculated in step 109 is larger than the accurate whiteness.
  • the tendency for the whiteness to increase depends on the area occupied in the area of the sample (rice grain) of the sample dish 10 of the milky white rice grain.
  • the whiteness calculation unit 43 is provided with a correction unit 43a for correcting the calculated whiteness by the area of milky white rice grains.
  • the area of the milky white rice grains is calculated by subjecting an image of the rice grains of the sample dish 10 to the light of the second wavelength imaged by the camera 33 of the gloss calculation unit 34 to a predetermined process.
  • the device configuration of the rice grain quality measuring device of the third embodiment is the same as that of the device of the first embodiment.
  • steps 101 to 109 in FIG. 6 are performed in the same manner as in the first embodiment to obtain the whiteness W.
  • the gloss calculation unit 34 binarizes the image of the rice grain of the sample dish 10 of the light of the second wavelength imaged in the embodiment 102 according to a predetermined threshold value.
  • This threshold value is larger than the threshold value obtained by removing the reflected light and the like from the region other than the rice grain in step 103. Since the milky white rice grain has a higher light reflectance than the normal rice grain, it becomes a rice grain image having high brightness in the image of the rice grain of the sample dish 10 of the light of the second wavelength. Therefore, the gloss calculation unit 34 binarizes the image according to a predetermined threshold value so that the milky white portion can be clearly detected.
  • the gloss calculation unit 34 calculates the area (S1) of the milky white rice grain image of the binarized image.
  • Step 903 The gloss calculation unit uses the ratio X obtained in step 902 to correct the whiteness W calculated in step 109 using a predetermined mathematical formula, and obtains the corrected whiteness W'.
  • the device of the present embodiment is a device that measures both the gloss value and the whiteness, the whiteness is corrected from the value of the image in the process of calculating the gloss value, and the whiteness is accurately obtained. Can be calculated.
  • Embodiment 4 In the above-described first to third embodiments, the example in which the gloss measuring device 30 is arranged above the table 20 and the whiteness measuring device 40 is arranged below the table 20 has been described, but the gloss measuring device 30 and the whiteness measurement have been described. Both of the vessels 40 may be arranged above the table 20 or both may be arranged below the table 20. For example, as shown in FIG. 11, when both the gloss measuring device 30 and the whiteness measuring device 40 are arranged above the table 20, the whiteness measuring device 40 irradiates light from above the rice grains of the sample dish 10. Then, the reflected light is received by the light receiving unit 42 arranged above the sample dish 10. At this time, it is desirable to mount a transparent plate on the rice grains in the whiteness measuring region 12 of the sample dish 10 and keep the upper surface of the rice grains flat.
  • the third light emitted from the third light source of the whiteness measuring instrument 40 hits the bottom surface of the sample dish 10. It is not irradiated through, but is irradiated from the surface of the rice grain sample, and the reflected light can be directly received by the light receiving unit 42. Therefore, there is an advantage that the reflected light can be received without being affected by the bottom surface of the sample dish 10.
  • one or both of the first and second light sources 31 and 32 of the gloss measuring instrument 30 can be used in combination with the third light sources 41a and 41b of the whiteness measuring instrument 40.
  • Embodiment 5 the rice milling apparatus using the rice grain quality measuring apparatus according to any one of the first to fourth embodiments will be described with reference to FIG.
  • the rice milling apparatus of FIG. 12 includes a rice milling machine 201 and a rice milling machine 202, and a rice grain quality measuring device 1 connected to the rice milling machine 201 and the rice milling machine 202, respectively.
  • a part of the rice grains after being milled by the rice milling machine 201 for a predetermined time is carried into the rice grain quality measuring device 1 as a sample, and the whiteness and gloss are measured.
  • the measured value is output from the rice grain quality measuring device 1 to the rice milling control unit of the rice milling machine 201.
  • the rice milling control unit controls each unit to further mill rice.
  • the rice milling control unit finishes the milling and carries out the milled rice grains to the rice mill 202.
  • the rice polishing machine 202 a part of the rice grains after being polished for a predetermined time is carried into the rice grain quality measuring device 1 as a sample, and the whiteness and gloss are measured.
  • the measured value is output from the rice grain quality measuring device 1 to the rice polishing control unit of the rice polishing machine 202. If the received measured value does not reach the target whiteness and / or gloss value, the rice polishing control unit controls each unit to further polish the rice. When the target value is reached, the rice polishing is completed and the polished rice grains are carried out.
  • the rice milling apparatus of the present embodiment can be controlled based on the whiteness and / or the gloss value measured by the rice grain quality measuring apparatus 1, it becomes possible to automatically control the rice milling process. .. Further, when the rice grain quality measuring device 1 of the third embodiment is used, the control can be performed by using the corrected and accurate whiteness, so that the accuracy of the rice milling control can be improved.

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

L'invention concerne un dispositif de mesure compact permettant de mesurer facilement une blancheur et une brillance en une courte période.　La présente invention comprend : une table (20) permettant de placer sur cette dernière une plaque d'échantillon (10) sur laquelle sont placés des grains de riz ; un instrument de mesure de brillance (30) qui expose une lumière de mesure de brillance sur les surfaces des grains de riz sur la plaque d'échantillon sur la table et qui reçoit la lumière réfléchie afin de mesurer la brillance des grains de riz ; et un instrument de mesure de blancheur (40) qui expose une lumière de mesure de blancheur également sur la plaque d'échantillon sur la table et qui reçoit, à travers la plaque d'échantillonnage, la lumière réfléchie par les grains de riz sur la plaque d'échantillon afin de mesurer la blancheur des grains de riz.
PCT/JP2020/046708 2020-05-25 2020-12-15 Dispositif de mesure de qualité de grain de riz WO2021240852A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202080099701.9A CN115380202A (zh) 2020-05-25 2020-12-15 米粒品质测定装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020090853A JP7310714B2 (ja) 2020-05-25 2020-05-25 米粒品質測定装置
JP2020-090853 2020-05-25

Publications (1)

Publication Number Publication Date
WO2021240852A1 true WO2021240852A1 (fr) 2021-12-02

Family

ID=78744175

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2020/046708 WO2021240852A1 (fr) 2020-05-25 2020-12-15 Dispositif de mesure de qualité de grain de riz

Country Status (3)

Country Link
JP (1) JP7310714B2 (fr)
CN (1) CN115380202A (fr)
WO (1) WO2021240852A1 (fr)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01142441A (ja) * 1987-11-28 1989-06-05 Satake Eng Co Ltd 米粒精白度測定装置
JP2000111542A (ja) * 1998-09-30 2000-04-21 Nippon Seimai Kogyokai 米穀総合検査・評価方法
JP2004101285A (ja) * 2002-09-06 2004-04-02 Shizuoka Seiki Co Ltd 穀粒品質判定装置の精度管理方法
JP2012525575A (ja) * 2009-04-30 2012-10-22 ビューラー ソーテックス リミテッド 連続して流れている粒状生産物の品質を測定する装置及びその方法
CN109682817A (zh) * 2019-02-22 2019-04-26 哈尔滨工程大学 基于计算机视觉技术的大米白度检测装置及方法
JP2019211280A (ja) * 2018-06-01 2019-12-12 株式会社サタケ 穀物の光沢測定装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59109248A (ja) * 1982-12-13 1984-06-23 株式会社　サタケ 精米装置
JPH01203050A (ja) * 1988-02-09 1989-08-15 Satake Eng Co Ltd 精白度測定装置付精米機

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01142441A (ja) * 1987-11-28 1989-06-05 Satake Eng Co Ltd 米粒精白度測定装置
JP2000111542A (ja) * 1998-09-30 2000-04-21 Nippon Seimai Kogyokai 米穀総合検査・評価方法
JP2004101285A (ja) * 2002-09-06 2004-04-02 Shizuoka Seiki Co Ltd 穀粒品質判定装置の精度管理方法
JP2012525575A (ja) * 2009-04-30 2012-10-22 ビューラー ソーテックス リミテッド 連続して流れている粒状生産物の品質を測定する装置及びその方法
JP2019211280A (ja) * 2018-06-01 2019-12-12 株式会社サタケ 穀物の光沢測定装置
CN109682817A (zh) * 2019-02-22 2019-04-26 哈尔滨工程大学 基于计算机视觉技术的大米白度检测装置及方法

Also Published As

Publication number Publication date
JP7310714B2 (ja) 2023-07-19
JP2021188909A (ja) 2021-12-13
CN115380202A (zh) 2022-11-22

Similar Documents

Publication Publication Date Title
JP5980822B2 (ja) 表面検査を行う方法
KR101019650B1 (ko) 평면 분광기를 이용한 이종품 검출장치
US6975404B2 (en) Device and process for the determination of the properties of reflective bodies
CN103649722B (zh) 药剂检查装置和药剂检查方法
JP6486515B2 (ja) 表面特徴マッピング
US9733063B2 (en) Method and device for determining optical properties by simultaneous measurement of intensities at thin layers using light of several wavelengths
US9726597B2 (en) Apparatus and method of investigating surface properties
US9581546B2 (en) Apparatus and method of investigating coatings with effect pigments
US6509964B2 (en) Multi-beam apparatus for measuring surface quality
JP2007033099A (ja) 光沢特性評価方法および光沢特性評価装置並びにプログラム
JP2010133934A (ja) ２つの測定ユニットを有する表面測定装置
JP4111040B2 (ja) 光沢評価方法および装置
WO2021240852A1 (fr) Dispositif de mesure de qualité de grain de riz
JP2015014527A (ja) 異状検出装置及び異状検出方法
US20060065857A1 (en) Device and method for the quantified evaluation of surface characteristics
JP6096173B2 (ja) 高発光光束コリメート照明装置および均一な読取フィールドの照明の方法
JP6969500B2 (ja) ダル仕上げ材表面の良否判定方法及び良否判定装置
JP2017133953A (ja) 錠剤検査装置
JP2019211280A (ja) 穀物の光沢測定装置
KR20110016551A (ko) 멀티 채널 카메라를 이용한 농산물 부피 측정장치
JP2008020231A (ja) 光学主軸分布測定方法および光学主軸分布測定装置
JP2004177369A (ja) 偏光イメージングを用いた選果システム
JP6860090B2 (ja) 分光データ管理装置、測定装置および測定システム
KR20140087110A (ko) 시료 측정 장치
WO2023210313A1 (fr) Procédé de mesure, système de mesure et procédé de traitement d'informations

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 20938140

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 20938140

Country of ref document: EP

Kind code of ref document: A1