WO2021240852A1 - Rice grain quality measurement device - Google Patents

Rice grain quality measurement device Download PDF

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Publication number
WO2021240852A1
WO2021240852A1 PCT/JP2020/046708 JP2020046708W WO2021240852A1 WO 2021240852 A1 WO2021240852 A1 WO 2021240852A1 JP 2020046708 W JP2020046708 W JP 2020046708W WO 2021240852 A1 WO2021240852 A1 WO 2021240852A1
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WO
WIPO (PCT)
Prior art keywords
whiteness
light
sample dish
rice
measuring device
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PCT/JP2020/046708
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French (fr)
Japanese (ja)
Inventor
尚志 坂本
剛志郎 梶山
Original Assignee
株式会社サタケ
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Publication date
Application filed by 株式会社サタケ filed Critical 株式会社サタケ
Priority to CN202080099701.9A priority Critical patent/CN115380202A/en
Publication of WO2021240852A1 publication Critical patent/WO2021240852A1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss

Definitions

  • the present invention relates to a device capable of measuring the whiteness and gloss of rice grains.
  • the quality evaluation of rice milling in the Japanese domestic market is generally performed by the whiteness, but in the long grain rice milling in the overseas market, the whiteness and gloss are the quality evaluation items.
  • Patent Document 1 discloses a whiteness measuring device.
  • the gloss measuring device the grain gloss measuring device of Patent Document 2 and Patent Document 3 is known. Both the device for measuring the whiteness and the device for measuring the gloss have a structure in which the polished rice is irradiated with light and the reflected light is measured.
  • An object of the present invention is to provide a compact measuring device capable of measuring whiteness and gloss value in a short time.
  • the rice grain quality measuring apparatus of the present invention is for measuring the gloss of the surface of the rice grain of the sample dish on which the rice grain is placed and the surface of the rice grain of the sample dish placed on the table.
  • a gloss measuring device that measures the gloss of rice grains by irradiating light and receiving the reflected light, and the rice grains of the sample dish placed on the table are irradiated with light for whiteness measurement, and the sample dish is said. It is characterized by having a whiteness measuring device for measuring the whiteness of rice grains by receiving the reflected light from the rice grains.
  • the gloss measuring instrument is arranged above the table, and the whiteness measuring instrument is arranged below the table.
  • the whiteness measuring device irradiates light for whiteness measurement from the lower surface of the sample dish placed on the table through the sample dish, and receives the reflected light from the rice grains of the sample dish through the sample dish.
  • the sample dish As the sample dish, a sample dish having a glossy sample area in which one layer of rice grains is arranged for measuring gloss and a whiteness sample area in which rice grains are packed in multiple layers for measuring whiteness can be used.
  • the whiteness sample region is made of a material that allows the sample dish to transmit light for whiteness measurement.
  • a turntable can be used as the above table.
  • the turntable is provided with an opening for placing the whiteness area of the sample dish or a window for transmitting light for whiteness measurement, and one or more reference plates are arranged on the lower surface of the table.
  • the turntable rotates, the sample dish and one or more reference plates are sequentially arranged at positions where light for whiteness measurement is irradiated.
  • the sample area for measuring the gloss of the sample dish is placed at the center of rotation of the turntable.
  • the gloss measuring instrument irradiates the rice grains of the sample dish placed on the table with the light of the first wavelength from diagonally above and the rice grains of the sample dish with the light of the second wavelength from above.
  • the configuration may include a second light source, a camera that captures the sample dish with the light of the first wavelength and the light of the second wavelength from the sample dish, and a gloss calculation unit.
  • the gloss calculation unit generates an image of rice grains in the sample dish of light of the first wavelength and an image of rice grains in the sample dish of light of the second wavelength from the image captured by the camera, and is based on both images. Calculate the gloss value of the rice grains in the sample dish.
  • the whiteness measuring device is, for example, placed at the bottom of the table, a third light source for irradiating the rice grains of the sample dish with a third light for whiteness measurement, and placed at the bottom of the table, from the rice grains of the sample dish.
  • the configuration includes a light receiving unit that receives the reflected light of the third light for measuring the whiteness, and a whiteness calculation unit that calculates the whiteness from the light receiving intensity of the light receiving unit.
  • the whiteness calculation unit is based on the light receiving intensity when the rice grains of the sample dish are irradiated with light for measuring whiteness and the light receiving intensity when the reference plate is arranged instead of the rice grains of the sample dish. Therefore, the whiteness can be calculated.
  • the gloss calculation unit may calculate the area of the milky white rice grains contained in the rice grains of the sample dish on the image by performing a predetermined process on the image of the rice grains of the sample dish of the light of the second wavelength. good.
  • the whiteness calculation unit includes a correction unit that corrects the whiteness based on the area of milky white rice grains calculated by the gloss calculation unit.
  • the sample dish is provided with a whiteness sample area in the center, and a glossy sample area shallower than the whiteness sample area is provided so as to surround the outer periphery of the whiteness sample area.
  • the configuration as shown in FIG. 9 may be used.
  • the sample dish may be integrated with the table.
  • FIG. (A) is a cross-sectional view of a sample dish 110a provided with a reference plate of the second embodiment, (b) a cross-sectional view of a sample dish 110b for measuring whiteness, and (c) a cross-sectional view of a sample dish 110c for measuring gloss.
  • (A) is a cross-sectional view of a sample dish 111a for measuring gloss provided with a reference plate of Embodiment 2
  • (b) is a cross-sectional view of a sample dish 110b for measuring whiteness.
  • FIG. 1 It is a block diagram of the rice milling apparatus of Embodiment 5.
  • Embodiment 1 the rice grain quality measuring device of the first embodiment will be described.
  • the rice grain quality measuring device of the present embodiment includes a table 20 on which a sample dish 10 on which rice grains are placed is placed, a gloss measuring device 30, and a whiteness measuring device 40. NS.
  • the device by configuring the device to include both the gloss measuring device 30 and the whiteness measuring device 40 in one device, compact rice grains that can measure both gloss and whiteness in a short time with one device are provided.
  • a quality measuring device can be provided.
  • the gloss measuring device 30 measures the gloss of the rice grains by irradiating the surface of the rice grains of the sample dish 10 with light for measuring the gloss and receiving the reflected light.
  • the gloss measuring instrument 30 uses a first light source 31 that emits light of the first wavelength, a second light source 32 that emits light of the second wavelength, and a sample dish with light of the first and second wavelengths. It is configured to include a camera 33 for capturing an image.
  • the first light source 31 is arranged at a position where the rice grain of the sample dish 10 placed on the table is irradiated with the light of the first wavelength from diagonally above.
  • the camera 33 is arranged at a position where the reflected light of the first wavelength light by the rice grain of the sample dish 10 is received.
  • the second light source 32 irradiates the second wavelength light from above the rice grains of the sample dish 10.
  • the position of the second light source 32 may be arranged at any position as long as the reflected light of the second wavelength light by the rice grains is received by the camera 33.
  • the second light source 32 may be arranged at a position facing the first light source 31 with the sample dish 10 interposed therebetween as shown in FIG. 1, or may be arranged directly above the sample dish 10 as shown in FIG.
  • the sample dish 10 may be arranged and the sample dish 10 may be irradiated with the second wavelength light along the normal direction of the main plane of the sample dish 10.
  • the camera 33 receives the reflected light of the first wavelength light by the rice grain of the sample dish 10 and the reflected light of the second wavelength light, and images the rice grain.
  • An optical element for example, a polarizing plate
  • the gloss calculation unit 34 separates the image captured by the camera 33 by wavelength to generate an image of rice grains in the sample dish 10 by the first wavelength light and an image of the rice grains in the sample dish 10 by the second wavelength light. , Both images are processed to calculate the gloss value of the rice grain of the sample dish 10.
  • the first wavelength light and the second wavelength light have different wavelengths.
  • red light can be used as the first wavelength light
  • blue light can be used as the second wavelength light.
  • the whiteness measuring device 40 measures the whiteness of the rice grains by irradiating the rice grains of the sample dish 10 with a third light for measuring the whiteness and receiving the reflected light from the rice grains of the sample dish 10 through the sample dish 10. do.
  • the whiteness measuring device 40 includes third light sources 41a and 41b for irradiating the rice grains of the sample dish 10 with the third light for whiteness measurement, and the whiteness measuring device 40 for measuring the whiteness from the rice grains of the sample dish 10.
  • the configuration includes a light receiving unit 42 that receives the reflected light of the third light, and a whiteness calculation unit 43 that calculates the whiteness from the light receiving intensity of the light receiving unit 42.
  • a whiteness calculation unit 43 that calculates the whiteness from the light receiving intensity of the light receiving unit 42.
  • the whiteness measuring instrument 40 is arranged at the lower part of the table 20, but may be arranged at the upper part of the table 20.
  • the light receiving portion 42 is arranged in the normal direction of the lower surface of the sample dish 10.
  • the whiteness calculation method of the whiteness calculation unit 43 may be any calculation method. For example, when the rice grains of the sample dish 10 are irradiated with the third light for whiteness measurement from the third light sources 41a and 41b. The whiteness can be calculated by comparing the light receiving intensity of the light receiving unit 42 with the light receiving intensity when the reference plate is arranged instead of the rice grains of the sample dish 10.
  • the gloss measurement and the whiteness measurement can be performed by one measuring device, but the gloss measurement and the whiteness measurement have different desirable sample forms.
  • one layer of rice grains 15 (one layer of rice in the thickness direction) is arranged on the sample plate 10, and the rice grains 15 are uniformly laid sideways (the long axis is on the table 20). It is desirable to irradiate the ventral portions of the rice grains 15 arranged in the sample dish 10 with the first and second wavelength lights so as to be substantially parallel to the main plane) and receive the reflected light.
  • the whiteness measurement it is desirable to fill the sample dish 10 in multiple layers and irradiate with a third light in order to arrange the rice grains densely and eliminate gaps for stable measurement.
  • the sample dish 10 has a glossy sample region 11 in which a single layer of rice grains 15 is arranged for measuring gloss, and a multilayer of rice grains for measuring whiteness.
  • a configuration having a whiteness sample area 12 to be filled can be used.
  • the whiteness sample region 12 receives the irradiation of the third light for whiteness measurement from the bottom surface 10a of the sample dish 11, the bottom surface 10a is made of a material that transmits the third light. ..
  • the turntable 20 is provided with an opening 20a for placing the whiteness region 12 of the sample dish 10 or a window for transmitting a third light for measuring the whiteness.
  • One or more reference plates 21 and 22 may be arranged on the lower surface of the turntable 20.
  • the opening 20a for placing the whiteness region 12 and the reference plates 21 and 22 are arranged concentrically around the rotation axis 24 of the turntable 20.
  • the white reference plate 21 for measuring the whiteness and the brown reference plate 22 for measuring the brownness can be fixed to the lower surface of the turntable 20.
  • a resin plate whose whiteness has been determined in advance is used.
  • a reference plate 21 of another color such as gray can be used. It is also possible to further improve the calibration accuracy by using three or more types of reference plates.
  • the sample dish and one or more reference plates 21 and 22 are sequentially arranged at positions where the blue light of the third light sources 41a and 41b is irradiated, and the reflected light intensity of each is arranged. Is detected by the light receiving unit 42. This makes it possible to accurately measure the whiteness of the sample.
  • the gloss measurement sample region 11 of the sample dish 10 is placed on the rotation center (rotation axis 24) of the turntable 20.
  • the gloss value can be measured by irradiating light of the first and second wavelengths from the entire circumferential direction.
  • Step 101 First, one layer of rice grains 15 is arranged in a state where the rice grains 15 are laid down in the gloss measurement area 11 of the sample dish 10 of FIGS. 3 (a) and 3 (b), while the whiteness measurement area 12 is filled with rice grains in multiple layers, and FIG. Like, it is mounted on the turntable 20.
  • Step 102 The turntable 20 is continuously rotated at a predetermined rotation speed by the motor 23.
  • Step 103 the rice grains 15 in the gloss measurement region 11 at the center of the sample dish 10 mounted on the rotating turntable 20 are irradiated with the first wavelength light and the second wavelength light from the first light source 31 and the second light source 32.
  • the camera 33 captures images of the first wavelength light and the second wavelength light.
  • the gloss calculation unit 34 measures the gloss value by processing the image of the camera 33.
  • the following method is used. Since the first light source 31 is arranged at a position facing the camera 33 with the sample dish 10 interposed therebetween, the camera 33 captures the reflected light of the rice grains placed on the sample dish 10 irradiated with the first wavelength light. do. At this time, the camera 33 also receives the reflected light of the first wavelength light irradiated to the peripheral region of the rice grain of the sample dish 10 (the edge of the sample dish 10, the table, etc.). On the other hand, since the second light source 32 is arranged above the sample dish 10, the light reflected by the rice grains among the irradiated second wavelength light reaches the camera 33.
  • the gloss calculation unit 34 extracts the image of the reflected light of the first wavelength light by binarizing the image of the first wavelength light captured by the camera 33 according to an appropriate predetermined threshold value.
  • the reflected light of the first wavelength light is the light reflected by the smooth surface of the belly of the rice grain, but since the reflected light from the peripheral members is also taken by the camera 33, the image of the reflected light is the rice grain. It is an image which combined the glossy region and the smooth surface region of the peripheral region (edge of sample dish 10, table, etc.) of rice grains.
  • the gloss calculation unit 34 removes reflected light and the like from regions other than rice grains by binarizing the image of the second wavelength light captured by the camera 33 according to an appropriate predetermined threshold value, and the rice grains. Extract the image of the reflected light from. Since the second light source 32 is arranged above the sample dish 10, the reflected light of the second wavelength light captured by the camera 33 is the light reflected by the surface or the inside of the rice grain, and after the binarization process.
  • the image of the second wavelength light of is an image of a region (grain region) in which rice grains are present.
  • the gloss calculation unit 34 calculates the area (S0) of the image (grain region) after the binarization process of the second wavelength light. Further, the gloss calculation unit 34 extracts the gloss region in the grain region by calculating the area of the overlapping region of the binarized image of the first wavelength light and the binarized image of the second wavelength light. , Calculate its area (S2). The gloss value is calculated by obtaining the ratio (S2 / S0) of the area of the gloss region (S2) and the area of the grain region (S0).
  • the rice grains in the gloss measurement region 11 of the sample dish 10 are irradiated with light from the first and second light sources 31, 32, and the rotation angle is 360 degrees.
  • the average value is calculated.
  • Step 105 When the turntable 20 is stopped, the motor 23 starts the rotation of the turntable 20 again. As a result, it is continuously rotated at a predetermined rotation speed.
  • Step 106 If the white reference plate 21 placed on the turntable 20 reaches the irradiation region of the third light sources 41a and 41b of the whiteness measuring device 40 as the turntable 20 rotates, the whiteness measuring device 40 The amount of light is detected by starting the acquisition of the output data from the light receiving unit 42 that receives the reflected light of the white reference plate 21 irradiated with blue light from the third light sources 41a and 41b. The light receiving unit 42 continues to acquire output data until the white reference plate 21 deviates from the irradiation region of the third light sources 41a and 41b.
  • the whiteness measuring instrument 40 detects that the rotation angle of the turntable 20 has reached a predetermined angle range, it determines that the third light sources 41a and 41b have reached the irradiation region, and receives light. Acquisition of output data from unit 42 can be started.
  • Step 107 When the brown reference plate 22 reached the irradiation region of the third light sources 41a and 41b with the rotation of the turntable 20, the whiteness measuring instrument 40 was irradiated with blue light from the third light sources 41a and 41b. The amount of light is detected by starting the acquisition of the output data from the light receiving unit 42 that receives the reflected light of the brown reference plate 22. The light receiving unit 42 continues to acquire output data until the brown reference plate 22 deviates from the irradiation regions of the third light sources 41a and 41b.
  • Step 108 If the bottom surface of the whiteness measuring region 12 of the sample dish 10 reaches the irradiation region of the third light sources 41a and 41b with the rotation of the turntable 20, the whiteness measuring instrument 40 will use the third light sources 41a and 41b.
  • the amount of light is detected by starting the acquisition of the output data from the light receiving unit 42 that receives the reflected light from the rice grains in the whiteness measuring region 12 irradiated with blue light.
  • the light receiving unit 42 continues to acquire output data until the bottom surface of the whiteness measurement region 12 deviates from the irradiation regions of the third light sources 41a and 41b.
  • the whiteness calculation unit 43 calculates the whiteness from the average (time average) of the amount of reflected light received in steps 106, 107, and 108.
  • the whiteness may be calculated by any method. For example, using a predetermined relationship between the reflected light amount and the whiteness, white is white based on the reflected light amount from the rice grain of the sample received in step 108.
  • a method can be used in which the degree is obtained and the obtained whiteness is corrected by the amount of reflected light from the reference plate obtained in steps 104 and 106. Further, the amount of light reflected from the reference plate obtained in steps 104 and 106 may be used to control the amount of light emitted from the third light sources 41a and 41b to the sample in step 108.
  • Step 110 The gloss value and whiteness obtained in steps 104 and 109 are displayed on the display unit 51.
  • the whiteness and gloss value of rice grains can be measured by one compact measuring device.
  • the gloss value and the whiteness can be measured while rotating the turntable 20, the influence of the uneven arrangement of the rice grains in the sample dish 10 is eliminated, and the calibration by the reference plate is measured every time. Since it can be performed automatically, the gloss value and whiteness can be measured accurately.
  • the whiteness is measured after the gloss value is measured.
  • the gloss value and the whiteness are measured at the same time by irradiating light from the upper and lower measuring instruments 30 and 40 at the same time. Is also possible.
  • the sample dish 10 may be integrated with the turntable 20.
  • the reflected light is measured while rotating the turntable 20 at the time of whiteness measurement, but the whiteness measurement region 12 of the reference plate 21, the reference plate 22, and the sample dish 10 is the third.
  • the turntable 20 may be stopped once and the reflected light may be measured.
  • Embodiment 2 As the second embodiment, an example of the shape of the sample dish different from the first embodiment will be described.
  • the sample dish 10 of the first embodiment was an integrated sample dish provided with both a gloss measurement area 11 and a whiteness measurement area 12, but there are two as shown in FIGS. 7 (b) and 7 (c). It may be separated like the sample dishes 110b and 110c. Further, as shown in FIG. 7A, the reflected light amount of the reference plate 21 may be measured by arranging the reference plate 21 on the bottom surface of the reference sample plate 110a and arranging the reference plate 21 in place of the sample plate 110b.
  • the reference plate 21 may be arranged on the bottom surface of the sample dish 110a for gloss measurement.
  • the sample dish 110b for measuring the whiteness has the same configuration as in FIG. 7B.
  • the sample dish for gloss measurement and the reference plate 21 can be shared with the sample dish 110a, so that the number of sample dishes is shown in FIG. 7. It can be reduced more than in the case of.
  • the sample dish 112b is provided with the whiteness sample area 12 in the center, and the whiteness sample area 12 is provided. It is also possible to use a configuration in which a glossy sample region 11 having a depth shallower than that of the whiteness sample region 12 is provided so as to surround the outer periphery.
  • a reference plate 21 arranged on the bottom surface of the sample dish 110a can be used as in FIG. 7A.
  • a table 20 is used in which both the region irradiated with the light for gloss measurement and the region irradiated with the light for whiteness measurement are arranged on the central axis. That is, an opening or a window is provided in the center of the table 20, and the sample dish and the reference plate 21 are arranged.
  • the sample dish 112b having this configuration can simultaneously irradiate light from the upper and lower measuring instruments 30 and 40 to measure the gloss value and the whiteness at the same time.
  • Embodiment 3 the correction unit 43a (see FIG. 1) for correcting the whiteness measured by the whiteness measuring device 40 obtained in the first embodiment by using the value obtained from the gloss measuring device 30 will be described.
  • the whiteness calculated in step 109 is larger than the accurate whiteness.
  • the tendency for the whiteness to increase depends on the area occupied in the area of the sample (rice grain) of the sample dish 10 of the milky white rice grain.
  • the whiteness calculation unit 43 is provided with a correction unit 43a for correcting the calculated whiteness by the area of milky white rice grains.
  • the area of the milky white rice grains is calculated by subjecting an image of the rice grains of the sample dish 10 to the light of the second wavelength imaged by the camera 33 of the gloss calculation unit 34 to a predetermined process.
  • the device configuration of the rice grain quality measuring device of the third embodiment is the same as that of the device of the first embodiment.
  • steps 101 to 109 in FIG. 6 are performed in the same manner as in the first embodiment to obtain the whiteness W.
  • the gloss calculation unit 34 binarizes the image of the rice grain of the sample dish 10 of the light of the second wavelength imaged in the embodiment 102 according to a predetermined threshold value.
  • This threshold value is larger than the threshold value obtained by removing the reflected light and the like from the region other than the rice grain in step 103. Since the milky white rice grain has a higher light reflectance than the normal rice grain, it becomes a rice grain image having high brightness in the image of the rice grain of the sample dish 10 of the light of the second wavelength. Therefore, the gloss calculation unit 34 binarizes the image according to a predetermined threshold value so that the milky white portion can be clearly detected.
  • the gloss calculation unit 34 calculates the area (S1) of the milky white rice grain image of the binarized image.
  • Step 903 The gloss calculation unit uses the ratio X obtained in step 902 to correct the whiteness W calculated in step 109 using a predetermined mathematical formula, and obtains the corrected whiteness W'.
  • the device of the present embodiment is a device that measures both the gloss value and the whiteness, the whiteness is corrected from the value of the image in the process of calculating the gloss value, and the whiteness is accurately obtained. Can be calculated.
  • Embodiment 4 In the above-described first to third embodiments, the example in which the gloss measuring device 30 is arranged above the table 20 and the whiteness measuring device 40 is arranged below the table 20 has been described, but the gloss measuring device 30 and the whiteness measurement have been described. Both of the vessels 40 may be arranged above the table 20 or both may be arranged below the table 20. For example, as shown in FIG. 11, when both the gloss measuring device 30 and the whiteness measuring device 40 are arranged above the table 20, the whiteness measuring device 40 irradiates light from above the rice grains of the sample dish 10. Then, the reflected light is received by the light receiving unit 42 arranged above the sample dish 10. At this time, it is desirable to mount a transparent plate on the rice grains in the whiteness measuring region 12 of the sample dish 10 and keep the upper surface of the rice grains flat.
  • the third light emitted from the third light source of the whiteness measuring instrument 40 hits the bottom surface of the sample dish 10. It is not irradiated through, but is irradiated from the surface of the rice grain sample, and the reflected light can be directly received by the light receiving unit 42. Therefore, there is an advantage that the reflected light can be received without being affected by the bottom surface of the sample dish 10.
  • one or both of the first and second light sources 31 and 32 of the gloss measuring instrument 30 can be used in combination with the third light sources 41a and 41b of the whiteness measuring instrument 40.
  • Embodiment 5 the rice milling apparatus using the rice grain quality measuring apparatus according to any one of the first to fourth embodiments will be described with reference to FIG.
  • the rice milling apparatus of FIG. 12 includes a rice milling machine 201 and a rice milling machine 202, and a rice grain quality measuring device 1 connected to the rice milling machine 201 and the rice milling machine 202, respectively.
  • a part of the rice grains after being milled by the rice milling machine 201 for a predetermined time is carried into the rice grain quality measuring device 1 as a sample, and the whiteness and gloss are measured.
  • the measured value is output from the rice grain quality measuring device 1 to the rice milling control unit of the rice milling machine 201.
  • the rice milling control unit controls each unit to further mill rice.
  • the rice milling control unit finishes the milling and carries out the milled rice grains to the rice mill 202.
  • the rice polishing machine 202 a part of the rice grains after being polished for a predetermined time is carried into the rice grain quality measuring device 1 as a sample, and the whiteness and gloss are measured.
  • the measured value is output from the rice grain quality measuring device 1 to the rice polishing control unit of the rice polishing machine 202. If the received measured value does not reach the target whiteness and / or gloss value, the rice polishing control unit controls each unit to further polish the rice. When the target value is reached, the rice polishing is completed and the polished rice grains are carried out.
  • the rice milling apparatus of the present embodiment can be controlled based on the whiteness and / or the gloss value measured by the rice grain quality measuring apparatus 1, it becomes possible to automatically control the rice milling process. .. Further, when the rice grain quality measuring device 1 of the third embodiment is used, the control can be performed by using the corrected and accurate whiteness, so that the accuracy of the rice milling control can be improved.

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Abstract

Provided is a compact measurement device capable of measuring whiteness and glossiness easily in a short period of time.　The present invention includes: a table 20 for placing thereon a sample plate 10 on which rice grains are placed; a glossiness measuring instrument 30 which radiates glossiness measuring light onto the surfaces of the rice grains on the sample plate on the table and which receives the reflected light to measure the glossiness of the rice grains; and a whiteness measuring instrument 40 which radiates whiteness measuring light also onto the sample plate on the table and which receives, through the sampling plate, the reflected light from the rice grains on the sample plate to measure the whiteness of the rice grains.

Description

米粒品質測定装置Rice grain quality measuring device
　本発明は、米粒の白度と光沢を測定可能な装置に関する。 The present invention relates to a device capable of measuring the whiteness and gloss of rice grains.
　日本国内の市場における精米の品質評価は、白度で行われるのが一般的であるが、海外市場の長粒種精米においては、白度と光沢が品質評価項目になっている。 The quality evaluation of rice milling in the Japanese domestic market is generally performed by the whiteness, but in the long grain rice milling in the overseas market, the whiteness and gloss are the quality evaluation items.
　白度を測定する装置としては、例えば非特許文献１に記載の玄米・精米白度計が市販されている。また、特許文献１には、精白度測定装置が開示されている。光沢測定装置としては、特許文献２や特許文献３の穀物の光沢測定装置が知られている。これらの白度を測定する装置および光沢を測定する装置は、いずれも精米に光を照射し、その反射光を測定する構造である。 As a device for measuring whiteness, for example, the brown rice / polished rice whiteness meter described in Non-Patent Document 1 is commercially available. Further, Patent Document 1 discloses a whiteness measuring device. As the gloss measuring device, the grain gloss measuring device of Patent Document 2 and Patent Document 3 is known. Both the device for measuring the whiteness and the device for measuring the gloss have a structure in which the polished rice is irradiated with light and the reflected light is measured.
特開平１－１４２４４１号公報Japanese Unexamined Patent Publication No. 1-142441 特開２０１９－２１１２８０号公報Japanese Unexamined Patent Publication No. 2019-211280 米国特許出願公開第２０１６／０３２０３１１号明細書U.S. Patent Application Publication No. 2016/0320311
　従来、精米の白度と光沢値を計測するためには、白度測定装置と光沢測定装置の２台が必要であるため、装置の設置スペースが２台分必要である。また、２台の装置でそれぞれ測定作業を行う必要があるため、測定に時間を要するという問題があった。 Conventionally, in order to measure the whiteness and gloss value of polished rice, two units, a whiteness measuring device and a gloss measuring device, are required, so the installation space for the devices is required for two units. Further, since it is necessary to perform the measurement work with each of the two devices, there is a problem that the measurement takes time.
　本発明の目的は、短時間で白度と光沢値を測定できるコンパクトな測定装置を提供することにある。 An object of the present invention is to provide a compact measuring device capable of measuring whiteness and gloss value in a short time.
　上記目的を達成するために、本発明の米粒品質測定装置は、米粒を載せた試料皿を載置されるテーブルと、テーブルに載置された試料皿の米粒の表面に対して光沢測定用の光を照射し、その反射光を受光することにより米粒の光沢を測定する光沢測定器と、テーブルに載置された試料皿の米粒に対して白度測定用の光を照射し、前記試料皿の米粒からの反射光を受光することにより米粒の白度を測定する白度測定器とを有することを特徴とする。 In order to achieve the above object, the rice grain quality measuring apparatus of the present invention is for measuring the gloss of the surface of the rice grain of the sample dish on which the rice grain is placed and the surface of the rice grain of the sample dish placed on the table. A gloss measuring device that measures the gloss of rice grains by irradiating light and receiving the reflected light, and the rice grains of the sample dish placed on the table are irradiated with light for whiteness measurement, and the sample dish is said. It is characterized by having a whiteness measuring device for measuring the whiteness of rice grains by receiving the reflected light from the rice grains.
　例えば、光沢測定器は、テーブルの上方に配置され、白度測定器は、テーブルの下方に配置される。この場合、白度測定器は、テーブルに載置された試料皿の下面から試料皿を通して白度測定用の光を照射し、試料皿の米粒からの反射光を前記試料皿を通して受光するように構成する。 For example, the gloss measuring instrument is arranged above the table, and the whiteness measuring instrument is arranged below the table. In this case, the whiteness measuring device irradiates light for whiteness measurement from the lower surface of the sample dish placed on the table through the sample dish, and receives the reflected light from the rice grains of the sample dish through the sample dish. Constitute.
　試料皿は、光沢を測定するために米粒を一層配置する光沢用試料領域と、白度を測定するために米粒を多層充填する白度用試料領域とを有する構成のものを用いることができる。この場合、白度用試料領域は、試料皿が白度測定用の光を透過する材質で構成されていることが望ましい。 As the sample dish, a sample dish having a glossy sample area in which one layer of rice grains is arranged for measuring gloss and a whiteness sample area in which rice grains are packed in multiple layers for measuring whiteness can be used. In this case, it is desirable that the whiteness sample region is made of a material that allows the sample dish to transmit light for whiteness measurement.
　上記テーブルとしては、ターンテーブルを用いることができる。その場合ターンテーブルには、試料皿の前記白度用領域を載置するための開口または白度測定用光を透過する窓が設けられ、テーブルの下面には、１以上の基準板が配置されている構成にすることができる。このような構成では、ターンテーブルの回転に伴い、試料皿と１以上の基準板が順次、白度測定用の光が照射される位置に配置される。 A turntable can be used as the above table. In that case, the turntable is provided with an opening for placing the whiteness area of the sample dish or a window for transmitting light for whiteness measurement, and one or more reference plates are arranged on the lower surface of the table. Can be configured. In such a configuration, as the turntable rotates, the sample dish and one or more reference plates are sequentially arranged at positions where light for whiteness measurement is irradiated.
　例えば、試料皿の光沢測定用試料領域は、ターンテーブルの回転中心に載置される。 For example, the sample area for measuring the gloss of the sample dish is placed at the center of rotation of the turntable.
　光沢測定器は、テーブルに載置された試料皿の米粒に対し、斜め上方から第１波長の光を照射する第１光源と、試料皿の米粒に対し上方から第２波長の光を照射する第２光源と、試料皿からの第１波長の光および第２波長の光により試料皿を撮像するカメラと、光沢算出部とを備える構成とすることができる。この場合、光沢算出部は、カメラの撮像した画像から、第１波長の光の試料皿の米粒の画像と、第２波長の光の試料皿の米粒の画像とを生成し、両画像に基づいて試料皿の米粒の光沢値を算出する。 The gloss measuring instrument irradiates the rice grains of the sample dish placed on the table with the light of the first wavelength from diagonally above and the rice grains of the sample dish with the light of the second wavelength from above. The configuration may include a second light source, a camera that captures the sample dish with the light of the first wavelength and the light of the second wavelength from the sample dish, and a gloss calculation unit. In this case, the gloss calculation unit generates an image of rice grains in the sample dish of light of the first wavelength and an image of rice grains in the sample dish of light of the second wavelength from the image captured by the camera, and is based on both images. Calculate the gloss value of the rice grains in the sample dish.
　白度測定器は、例えば、テーブルの下部に配置され、試料皿の米粒に白度測定用の第３の光を照射する第３光源と、テーブルの下方に配置され、試料皿の米粒からの白度測定用の第３の光の反射光を受光する受光部と、受光部の受光強度から白度を算出する白度算出部とを備える構成とする。 The whiteness measuring device is, for example, placed at the bottom of the table, a third light source for irradiating the rice grains of the sample dish with a third light for whiteness measurement, and placed at the bottom of the table, from the rice grains of the sample dish. The configuration includes a light receiving unit that receives the reflected light of the third light for measuring the whiteness, and a whiteness calculation unit that calculates the whiteness from the light receiving intensity of the light receiving unit.
　この場合、白度算出部は、試料皿の米粒に白度測定用の光を照射した場合の受光強度と、前記試料皿の米粒の代わりに基準板を配置した場合の記受光強度とに基づいて、白度を算出する構成とすることができる。 In this case, the whiteness calculation unit is based on the light receiving intensity when the rice grains of the sample dish are irradiated with light for measuring whiteness and the light receiving intensity when the reference plate is arranged instead of the rice grains of the sample dish. Therefore, the whiteness can be calculated.
　また、光沢算出部は、第２波長の光の試料皿の米粒の画像に所定の処理を施すことにより、試料皿の米粒に含まれる乳白色の米粒の前記画像上での面積を算出してもよい。白度算出部は、光沢算出部が算出した乳白色の米粒の面積に基づいて、白度を補正する補正部を備える。 Further, the gloss calculation unit may calculate the area of the milky white rice grains contained in the rice grains of the sample dish on the image by performing a predetermined process on the image of the rice grains of the sample dish of the light of the second wavelength. good. The whiteness calculation unit includes a correction unit that corrects the whiteness based on the area of milky white rice grains calculated by the gloss calculation unit.
　試料皿は、一例としては、中央に白度用試料領域が設けられ、白度用試料領域の外周を取り囲むように、白度用試料領域よりも深さの浅い光沢用試料領域が設けられた図９のような構成にしてもよい。 As an example, the sample dish is provided with a whiteness sample area in the center, and a glossy sample area shallower than the whiteness sample area is provided so as to surround the outer periphery of the whiteness sample area. The configuration as shown in FIG. 9 may be used.
　試料皿は、テーブルと一体の構成としてもよい。 The sample dish may be integrated with the table.
　本発明によれば、短時間で白度と光沢値を測定できるコンパクトな測定装置を提供することができる。 According to the present invention, it is possible to provide a compact measuring device capable of measuring whiteness and gloss value in a short time.
本発明の実施形態１の米粒品質測定装置の回転軸を含む面での断面図である。It is sectional drawing in the plane including the rotation axis of the rice grain quality measuring apparatus of Embodiment 1 of this invention. 本発明の実施形態１の米粒品質測定装置の第２の光源３２を試料皿１０の上方に配置した構造の回転軸を含む面での断面図である。It is sectional drawing in the plane including the rotation axis of the structure which arranged the 2nd light source 32 of the rice grain quality measuring apparatus of Embodiment 1 of this invention above the sample dish 10. （ａ）実施形態１の試料皿１０の断面図、（ｂ）上面図である。(A) is a cross-sectional view of the sample dish 10 of Embodiment 1, and (b) is a top view. 実施形態１の米粒品質測定装置の試料皿１０を載置されたテーブル２０の上面図である。It is a top view of the table 20 on which the sample dish 10 of the rice grain quality measuring apparatus of Embodiment 1 is placed. 実施形態１の米粒品質測定装置の白度測定用領域１２および光沢測定領域１１を横切る位置での断面図である。It is sectional drawing at the position which crosses the whiteness measuring area 12 and the gloss measuring area 11 of the rice grain quality measuring apparatus of Embodiment 1. FIG. 実施形態１の米粒品質測定装置の測定の動作を示すフローチャートである。It is a flowchart which shows the operation of the measurement of the rice grain quality measuring apparatus of Embodiment 1. FIG. （ａ）実施形態２の基準板を備えた試料皿１１０ａの断面図、（ｂ）白度測定用の試料皿１１０ｂの断面図、（ｃ）光沢測定用の試料皿１１０ｃの断面図である。(A) is a cross-sectional view of a sample dish 110a provided with a reference plate of the second embodiment, (b) a cross-sectional view of a sample dish 110b for measuring whiteness, and (c) a cross-sectional view of a sample dish 110c for measuring gloss. （ａ）実施形態２の基準板を備えた光沢測定用の試料皿１１１ａの断面図、（ｂ）白度測定用の試料皿１１０ｂの断面図である。(A) is a cross-sectional view of a sample dish 111a for measuring gloss provided with a reference plate of Embodiment 2, and (b) is a cross-sectional view of a sample dish 110b for measuring whiteness. （ａ）実施形態２の基準板を備えた試料皿１１０ａの断面図、（ｂ）白度測定用領域１２と光沢測定用領域１１の両方を備える試料皿１１０ｂの断面図、（ｃ）試料皿１１０ｂの斜視図である。(A) Cross-sectional view of the sample dish 110a provided with the reference plate of the second embodiment, (b) Cross-sectional view of the sample dish 110b provided with both the whiteness measurement area 12 and the gloss measurement area 11, (c) the sample dish. It is a perspective view of 110b. 実施形態３の米粒品質測定装置の測定の動作を示すフローチャートである。It is a flowchart which shows the operation of the measurement of the rice grain quality measuring apparatus of Embodiment 3. 実施形態４の米粒品質測定装置の白度測定用領域１２および光沢測定領域１１を横切る位置での断面図である。It is sectional drawing at the position which crosses the whiteness measuring area 12 and the gloss measuring area 11 of the rice grain quality measuring apparatus of Embodiment 4. FIG. 実施形態５の精米装置のブロック図である。It is a block diagram of the rice milling apparatus of Embodiment 5.
　以下、本発明の一実施の形態の米粒品質測定装置について図面を用いて説明する。 Hereinafter, the rice grain quality measuring apparatus according to the embodiment of the present invention will be described with reference to the drawings.
＜＜実施形態１＞＞
　以下、実施形態１の米粒品質測定装置について説明する。 << Embodiment 1 >>
Hereinafter, the rice grain quality measuring device of the first embodiment will be described.
　図１に示すように、本実施形態の米粒品質測定装置は、米粒を載せた試料皿１０が載置されるテーブル２０と、光沢測定器３０と、白度測定器４０とを備えて構成される。 As shown in FIG. 1, the rice grain quality measuring device of the present embodiment includes a table 20 on which a sample dish 10 on which rice grains are placed is placed, a gloss measuring device 30, and a whiteness measuring device 40. NS.
　このように、１台の装置内に光沢測定器３０と白度測定器４０の両方を備える構成にすることにより、一台の装置で光沢と白度の両方を短時間で測定できるコンパクトな米粒品質測定装置を提供することができる。 In this way, by configuring the device to include both the gloss measuring device 30 and the whiteness measuring device 40 in one device, compact rice grains that can measure both gloss and whiteness in a short time with one device are provided. A quality measuring device can be provided.
　本実施形態では、図１に示したように、テーブル２０の上方に光沢測定器３０が配置され、テーブル２０の下方に白度測定器４０が配置された構成について説明する。 In the present embodiment, as shown in FIG. 1, a configuration in which the gloss measuring instrument 30 is arranged above the table 20 and the whiteness measuring instrument 40 is arranged below the table 20 will be described.
　光沢測定器３０は、試料皿１０の米粒の表面に対して光沢測定用の光を照射し、その反射光を受光することにより米粒の光沢を測定する。具体的には、光沢測定器３０は、第１波長の光を出射する第１光源３１と、第２波長の光を出射する第２光源３２と、第１及び第２波長の光により試料皿を撮像するカメラ３３とを備えて構成される。第１光源３１は、テーブルに載置された試料皿１０の米粒に対し、斜め上方から第１波長の光を照射する位置に配置される。カメラ３３は、試料皿１０の米粒による第１波長光の反射光を受光する位置に配置される。第２光源３２は、試料皿１０の米粒の上方から第２波長光を照射する。第２光源３２の位置は、米粒による第２波長光の反射光がカメラ３３に受光される位置であればどのような場所に配置してもよい。例えば、第２光源３２は、図１のように第１光源３１と試料皿１０を挟んで対向する位置に配置されてもよいし、図２に示したように、試料皿１０の真上に配置され、試料皿１０の主平面の法線方向に沿って第２波長光を試料皿１０に照射してもよい。カメラ３３は、試料皿１０の米粒による第１波長光の反射光と、第２波長光の反射光とを受光し、米粒を撮像する。なお、カメラ３３の前には、米粒による第１波長光の散乱光が入射するのを防ぐ光学素子（例えば偏光板）を配置してもよい。 The gloss measuring device 30 measures the gloss of the rice grains by irradiating the surface of the rice grains of the sample dish 10 with light for measuring the gloss and receiving the reflected light. Specifically, the gloss measuring instrument 30 uses a first light source 31 that emits light of the first wavelength, a second light source 32 that emits light of the second wavelength, and a sample dish with light of the first and second wavelengths. It is configured to include a camera 33 for capturing an image. The first light source 31 is arranged at a position where the rice grain of the sample dish 10 placed on the table is irradiated with the light of the first wavelength from diagonally above. The camera 33 is arranged at a position where the reflected light of the first wavelength light by the rice grain of the sample dish 10 is received. The second light source 32 irradiates the second wavelength light from above the rice grains of the sample dish 10. The position of the second light source 32 may be arranged at any position as long as the reflected light of the second wavelength light by the rice grains is received by the camera 33. For example, the second light source 32 may be arranged at a position facing the first light source 31 with the sample dish 10 interposed therebetween as shown in FIG. 1, or may be arranged directly above the sample dish 10 as shown in FIG. The sample dish 10 may be arranged and the sample dish 10 may be irradiated with the second wavelength light along the normal direction of the main plane of the sample dish 10. The camera 33 receives the reflected light of the first wavelength light by the rice grain of the sample dish 10 and the reflected light of the second wavelength light, and images the rice grain. An optical element (for example, a polarizing plate) may be arranged in front of the camera 33 to prevent the scattered light of the first wavelength light from the rice grains from being incident on the camera 33.
　光沢算出部３４は、カメラ３３の撮像した画像を波長によって分離することにより、第１波長光による試料皿１０の米粒の画像と、第２波長光による試料皿１０の米粒の画像とを生成し、両画像を処理して、試料皿１０の米粒の光沢値を算出する。 The gloss calculation unit 34 separates the image captured by the camera 33 by wavelength to generate an image of rice grains in the sample dish 10 by the first wavelength light and an image of the rice grains in the sample dish 10 by the second wavelength light. , Both images are processed to calculate the gloss value of the rice grain of the sample dish 10.
　第１波長光と第２波長光は、異なる波長であることが好ましい。例えば、第1波長光として赤色光、第２波長光として青色光を用いることができる。 It is preferable that the first wavelength light and the second wavelength light have different wavelengths. For example, red light can be used as the first wavelength light, and blue light can be used as the second wavelength light.
　白度測定器４０は、白度測定用の第３の光を試料皿１０の米粒に照射し、試料皿１０の米粒からの反射光を試料皿１０を通して受光することにより米粒の白度を測定する。具体的には、白度測定器４０は、試料皿１０の米粒に白度測定用の第３の光を照射する第３光源４１ａ，４１ｂと、試料皿１０の米粒からの白度測定用の第３の光の反射光を受光する受光部４２と、受光部４２の受光強度から白度を算出する白度算出部４３とを備える構成とする。ここでは、図１のように、白度測定器４０はテーブル２０の下部に配置しているが、テーブル２０の上部に配置してもよい。図１の例では、第３光源４１ａ，４１ｂは２つであり、それぞれ試料皿１０の下面の法線に対して約４５度の角度から第３の光（例えば青色光）を照射する。また、図１の例では、受光部４２は、試料皿１０の下面の法線方向に配置されている。 The whiteness measuring device 40 measures the whiteness of the rice grains by irradiating the rice grains of the sample dish 10 with a third light for measuring the whiteness and receiving the reflected light from the rice grains of the sample dish 10 through the sample dish 10. do. Specifically, the whiteness measuring device 40 includes third light sources 41a and 41b for irradiating the rice grains of the sample dish 10 with the third light for whiteness measurement, and the whiteness measuring device 40 for measuring the whiteness from the rice grains of the sample dish 10. The configuration includes a light receiving unit 42 that receives the reflected light of the third light, and a whiteness calculation unit 43 that calculates the whiteness from the light receiving intensity of the light receiving unit 42. Here, as shown in FIG. 1, the whiteness measuring instrument 40 is arranged at the lower part of the table 20, but may be arranged at the upper part of the table 20. In the example of FIG. 1, there are two third light sources 41a and 41b, each of which irradiates the third light (for example, blue light) from an angle of about 45 degrees with respect to the normal of the lower surface of the sample dish 10. Further, in the example of FIG. 1, the light receiving portion 42 is arranged in the normal direction of the lower surface of the sample dish 10.
　白度算出部４３の白度算出方法は、どのような算出方法でもよいが、例えば、試料皿１０の米粒に白度測定用の第３の光を第３光源４１ａ、４１ｂから照射した場合の受光部４２の受光強度を、試料皿１０の米粒の代わりに基準板を配置した場合の受光強度と比較して、白度を算出する構成とすることができる。 The whiteness calculation method of the whiteness calculation unit 43 may be any calculation method. For example, when the rice grains of the sample dish 10 are irradiated with the third light for whiteness measurement from the third light sources 41a and 41b. The whiteness can be calculated by comparing the light receiving intensity of the light receiving unit 42 with the light receiving intensity when the reference plate is arranged instead of the rice grains of the sample dish 10.
　このように、本実施形態では、光沢測定と白度測定とを１つの測定装置で行うことができるが、光沢測定と白度測定は、望ましい試料の形態が異なる。図３（ａ）に示したように、光沢測定では、米粒１５を試料皿１０に１層（厚さ方向が米一粒分）並べ、米粒１５が一様に横倒し（長軸をテーブル２０の主平面にほぼ平行）になるようにし、試料皿１０に並んだ米粒１５の腹部分に第１および第２波長光を照射してその反射光を受光することが望ましい。一方、白度測定では、米粒を密に配置し、隙間をなくして安定的に測定するために、米粒１５を試料皿１０に多層に充填し、第３の光を照射することが望ましい。 As described above, in the present embodiment, the gloss measurement and the whiteness measurement can be performed by one measuring device, but the gloss measurement and the whiteness measurement have different desirable sample forms. As shown in FIG. 3A, in the gloss measurement, one layer of rice grains 15 (one layer of rice in the thickness direction) is arranged on the sample plate 10, and the rice grains 15 are uniformly laid sideways (the long axis is on the table 20). It is desirable to irradiate the ventral portions of the rice grains 15 arranged in the sample dish 10 with the first and second wavelength lights so as to be substantially parallel to the main plane) and receive the reflected light. On the other hand, in the whiteness measurement, it is desirable to fill the sample dish 10 in multiple layers and irradiate with a third light in order to arrange the rice grains densely and eliminate gaps for stable measurement.
　そのため、試料皿１０は、図３（ａ），（ｂ）に示すように、光沢を測定するために米粒１５を一層配置する光沢用試料領域１１と、白度を測定するために米粒を多層充填する白度用試料領域１２とを有する構成のものを用いることができる。ここでは、白度用試料領域１２は、試料皿１１の底面１０ａから白度測定用の第３の光の照射を受けるため、底面１０ａが第３の光を透過する材質で構成され、ている。 Therefore, as shown in FIGS. 3A and 3B, the sample dish 10 has a glossy sample region 11 in which a single layer of rice grains 15 is arranged for measuring gloss, and a multilayer of rice grains for measuring whiteness. A configuration having a whiteness sample area 12 to be filled can be used. Here, since the whiteness sample region 12 receives the irradiation of the third light for whiteness measurement from the bottom surface 10a of the sample dish 11, the bottom surface 10a is made of a material that transmits the third light. ..
　テーブル２０としては、図４および図５に示したように、駆動源としてモータ２３を備えたターンテーブルを用いることが望ましい。ターンテーブル２０には、試料皿１０の白度用領域１２を載置するための開口２０ａまたは白度測定用の第３の光を透過する窓が設けられている。ターンテーブル２０の下面には、１以上の基準板２１，２２が配置されていてもよい。白度用領域１２を載置するための開口２０ａと、基準板２１、２２は、ターンテーブル２０の回転軸２４を中心に同心円上に配置されている。このように色の異なる２以上の基準板２１，２２を備えることにより、白度を精度よく求めることができる。また、本実施形態の装置の出荷前の白度の較正も精度よく行うことができる。例えば、白度測定用の白色の基準板２１と茶色度測定用の茶色の基準板２２をターンテーブル２０の下面に固定することができる。白色の基準板２１および茶色の基準板２２としては、予め白度が求められた樹脂板を用いる。なお、茶色の基準板２２に替えて、グレー等の他の色の基準板２１を用いることもできる。また、３種類以上の基準板を用いてさらに較正精度を向上させることも可能である。 As the table 20, as shown in FIGS. 4 and 5, it is desirable to use a turntable equipped with a motor 23 as a drive source. The turntable 20 is provided with an opening 20a for placing the whiteness region 12 of the sample dish 10 or a window for transmitting a third light for measuring the whiteness. One or more reference plates 21 and 22 may be arranged on the lower surface of the turntable 20. The opening 20a for placing the whiteness region 12 and the reference plates 21 and 22 are arranged concentrically around the rotation axis 24 of the turntable 20. By providing two or more reference plates 21 and 22 having different colors in this way, the whiteness can be accurately obtained. In addition, the whiteness of the device of the present embodiment can be calibrated before shipment with high accuracy. For example, the white reference plate 21 for measuring the whiteness and the brown reference plate 22 for measuring the brownness can be fixed to the lower surface of the turntable 20. As the white reference plate 21 and the brown reference plate 22, a resin plate whose whiteness has been determined in advance is used. Instead of the brown reference plate 22, a reference plate 21 of another color such as gray can be used. It is also possible to further improve the calibration accuracy by using three or more types of reference plates.
　このような構成では、ターンテーブルの回転に伴い、試料皿と１以上の基準板２１、２２が順次、第３光源４１ａ，４１ｂの青色光が照射される位置に配置され、それぞれの反射光強度を受光部４２で検出する。これにより、試料の白度を精度よく計測可能である。 In such a configuration, as the turntable rotates, the sample dish and one or more reference plates 21 and 22 are sequentially arranged at positions where the blue light of the third light sources 41a and 41b is irradiated, and the reflected light intensity of each is arranged. Is detected by the light receiving unit 42. This makes it possible to accurately measure the whiteness of the sample.
　なお、図４および図５の構成では、試料皿１０の光沢測定用試料領域１１は、ターンテーブル２０の回転中心（回転軸２４）に載置される。これにより、ターンテーブル２０の回転に伴い、全周方向から第１および第２波長の光を照射して光沢値を測定することができる。 In the configurations of FIGS. 4 and 5, the gloss measurement sample region 11 of the sample dish 10 is placed on the rotation center (rotation axis 24) of the turntable 20. As a result, as the turntable 20 rotates, the gloss value can be measured by irradiating light of the first and second wavelengths from the entire circumferential direction.
　＜光沢および白度の測定時の動作＞
　実施形態１の米粒品質測定装置によって、米粒の光沢および白度を測定する場合の各部の動作について図６のフローチャートを用いて説明する。 <Operation when measuring gloss and whiteness>
The operation of each part when measuring the gloss and whiteness of rice grains by the rice grain quality measuring device of the first embodiment will be described with reference to the flowchart of FIG.
　（ステップ１０１）
　まず、図３（ａ），（ｂ）の試料皿１０の光沢測定領域１１に米粒１５を倒した状態で１層並べ、一方、白度測定領域１２には米粒を多層に充填し、図４のように、ターンテーブル２０に搭載する。 (Step 101)
First, one layer of rice grains 15 is arranged in a state where the rice grains 15 are laid down in the gloss measurement area 11 of the sample dish 10 of FIGS. 3 (a) and 3 (b), while the whiteness measurement area 12 is filled with rice grains in multiple layers, and FIG. Like, it is mounted on the turntable 20.
　（ステップ１０２）
　モータ２３によりターンテーブル２０を所定の回転速度で連続回転させる。 (Step 102)
The turntable 20 is continuously rotated at a predetermined rotation speed by the motor 23.
　（ステップ１０３）
　つぎに、回転しているターンテーブル２０に搭載された試料皿１０の中心の光沢測定領域１１の米粒１５に第１光源３１および第２光源３２から第１波長光および第２波長光を照射し、カメラ３３により第１波長光および第２波長光の画像を撮像する。 (Step 103)
Next, the rice grains 15 in the gloss measurement region 11 at the center of the sample dish 10 mounted on the rotating turntable 20 are irradiated with the first wavelength light and the second wavelength light from the first light source 31 and the second light source 32. , The camera 33 captures images of the first wavelength light and the second wavelength light.
　（ステップ１０４）
　光沢算出部３４は、カメラ３３の画像を処理することにより光沢値を測定する。 (Step 104)
The gloss calculation unit 34 measures the gloss value by processing the image of the camera 33.
　光沢値の算出方法は、種々の方法を用いることが可能であるが、例えば以下の方法を用いる。第１光源３１は、試料皿１０を挟んでカメラ３３と対向する位置に配置されているため、カメラ３３は、第１波長光の照射された試料皿１０に載せられた米粒の反射光を撮像する。このとき、試料皿１０の米粒の周辺領域（試料皿１０の縁やテーブル等）に照射された第１波長光の反射光もカメラ３３は受光する。一方、第２光源３２は試料皿１０の上方に配置されているため、照射した第２波長光のうち米粒によって反射した光がカメラ３３に到達する。 Various methods can be used to calculate the gloss value, for example, the following method is used. Since the first light source 31 is arranged at a position facing the camera 33 with the sample dish 10 interposed therebetween, the camera 33 captures the reflected light of the rice grains placed on the sample dish 10 irradiated with the first wavelength light. do. At this time, the camera 33 also receives the reflected light of the first wavelength light irradiated to the peripheral region of the rice grain of the sample dish 10 (the edge of the sample dish 10, the table, etc.). On the other hand, since the second light source 32 is arranged above the sample dish 10, the light reflected by the rice grains among the irradiated second wavelength light reaches the camera 33.
　光沢算出部３４は、カメラ３３で撮像された第１波長光の画像を予め定めた適切な閾値により２値化処理することにより、第１波長光の反射光の画像を抽出する。第１波長光の反射光は、米粒の腹の滑らかな面で反射された光であるが、周辺部材からの反射光も合わせてカメラ３３に撮影されるため、反射光の画像は、米粒の光沢領域と、米粒の周辺領域（試料皿１０の縁やテーブル等）の平滑面の領域とを合わせた画像である。 The gloss calculation unit 34 extracts the image of the reflected light of the first wavelength light by binarizing the image of the first wavelength light captured by the camera 33 according to an appropriate predetermined threshold value. The reflected light of the first wavelength light is the light reflected by the smooth surface of the belly of the rice grain, but since the reflected light from the peripheral members is also taken by the camera 33, the image of the reflected light is the rice grain. It is an image which combined the glossy region and the smooth surface region of the peripheral region (edge of sample dish 10, table, etc.) of rice grains.
　一方、光沢算出部３４は、カメラ３３で撮像された第２波長光の画像を予め定めた適切な閾値により２値化処理することにより、米粒以外の領域からの反射光等を除去し、米粒からの反射光の画像を抽出する。第２光源３２が試料皿１０の上方に配置されているため、カメラ３３で撮像された第２波長光の反射光は、米粒の表面や内部によって反射された光であり、２値化処理後の第２波長光の画像は、米粒が存在する領域（穀物領域）の画像である。 On the other hand, the gloss calculation unit 34 removes reflected light and the like from regions other than rice grains by binarizing the image of the second wavelength light captured by the camera 33 according to an appropriate predetermined threshold value, and the rice grains. Extract the image of the reflected light from. Since the second light source 32 is arranged above the sample dish 10, the reflected light of the second wavelength light captured by the camera 33 is the light reflected by the surface or the inside of the rice grain, and after the binarization process. The image of the second wavelength light of is an image of a region (grain region) in which rice grains are present.
　光沢算出部３４は、第２波長光の２値化処理後の画像（穀物領域）の面積(S0)を算出する。また、光沢算出部３４は、第１波長光の２値化画像と第２波長光の２値化処理後の画像の重複領域の面積を算出することにより、穀物領域内の光沢領域を抽出し、その面積（S2)を算出する。光沢領域の面積（S2)と穀物領域の面積（S0)の比（S2/S0)を求めることにより、光沢値を算出する。 The gloss calculation unit 34 calculates the area (S0) of the image (grain region) after the binarization process of the second wavelength light. Further, the gloss calculation unit 34 extracts the gloss region in the grain region by calculating the area of the overlapping region of the binarized image of the first wavelength light and the binarized image of the second wavelength light. , Calculate its area (S2). The gloss value is calculated by obtaining the ratio (S2 / S0) of the area of the gloss region (S2) and the area of the grain region (S0).
　このとき、本実施形態では、ターンテーブル２０を３６０度回転させながら、第１および第２光源３１，３２から試料皿１０の光沢測定領域１１の米粒に光を照射して、３６０度の回転角度ごとの光沢値を算出した後、その平均値を求める。これにより、試料皿１０の光沢測定領域１１の米粒の並び方にムラがある場合でも、各角度の光沢値の平均を求めることにより、並び方のムラの影響を受けることなく、精度よく光沢値を算出することができる。 At this time, in the present embodiment, while rotating the turntable 20 by 360 degrees, the rice grains in the gloss measurement region 11 of the sample dish 10 are irradiated with light from the first and second light sources 31, 32, and the rotation angle is 360 degrees. After calculating the gloss value for each, the average value is calculated. As a result, even if the arrangement of rice grains in the gloss measurement region 11 of the sample dish 10 is uneven, the gloss value is calculated accurately without being affected by the uneven arrangement by calculating the average of the gloss values at each angle. can do.
　光沢値の算出後、第１および第２の光源３１，３２を消灯する。このとき、必要に応じてターンテーブル２０の回転を停止させてもよい。 After calculating the gloss value, turn off the first and second light sources 31 and 32. At this time, the rotation of the turntable 20 may be stopped if necessary.
　（ステップ１０５）
　ターンテーブル２０を停止させた場合には、再びモータ２３によりターンテーブル２０の回転を開始させる。これにより所定の回転速度で連続回転させる。 (Step 105)
When the turntable 20 is stopped, the motor 23 starts the rotation of the turntable 20 again. As a result, it is continuously rotated at a predetermined rotation speed.
　（ステップ１０６）
　ターンテーブル２０に載置された白色の基準板２１が、ターンテーブル２０の回転にともなって白度測定器４０の第３光源４１ａ，４１ｂの照射領域に到達したならば、白度測定器４０は、第３光源４１ａ，４１ｂから青色光を照射された白色の基準板２１の反射光を受光する受光部４２からその出力データの取得を開始することにより、光量を検出する。受光部４２は、白色基準板２１が第３光源４１ａ，４１ｂの照射領域から外れるまで、出力データの取得を継続する。 (Step 106)
If the white reference plate 21 placed on the turntable 20 reaches the irradiation region of the third light sources 41a and 41b of the whiteness measuring device 40 as the turntable 20 rotates, the whiteness measuring device 40 The amount of light is detected by starting the acquisition of the output data from the light receiving unit 42 that receives the reflected light of the white reference plate 21 irradiated with blue light from the third light sources 41a and 41b. The light receiving unit 42 continues to acquire output data until the white reference plate 21 deviates from the irradiation region of the third light sources 41a and 41b.
　白度測定器４０は、例えば、ターンテーブル２０の回転角度が予め定めておいた角度範囲に到達したことを検出したならば、第３光源４１ａ，４１ｂの照射領域に到達したと判定し、受光部４２からの出力データの取得を開始することができる。 If, for example, the whiteness measuring instrument 40 detects that the rotation angle of the turntable 20 has reached a predetermined angle range, it determines that the third light sources 41a and 41b have reached the irradiation region, and receives light. Acquisition of output data from unit 42 can be started.
　（ステップ１０７）
　ターンテーブル２０の回転にともなって、茶色の基準板２２が第３光源４１ａ，４１ｂの照射領域に到達したならば、白度測定器４０は、第３光源４１ａ，４１ｂから青色光を照射された茶色の基準板２２の反射光を受光する受光部４２からその出力データの取得を開始することにより、光量を検出する。受光部４２は、茶色の基準板２２が第３光源４１ａ，４１ｂの照射領域から外れるまで、出力データの取得を継続する。 (Step 107)
When the brown reference plate 22 reached the irradiation region of the third light sources 41a and 41b with the rotation of the turntable 20, the whiteness measuring instrument 40 was irradiated with blue light from the third light sources 41a and 41b. The amount of light is detected by starting the acquisition of the output data from the light receiving unit 42 that receives the reflected light of the brown reference plate 22. The light receiving unit 42 continues to acquire output data until the brown reference plate 22 deviates from the irradiation regions of the third light sources 41a and 41b.
　（ステップ１０８）
　ターンテーブル２０の回転にともなって、試料皿１０の白度測定用領域１２の底面が第３光源４１ａ，４１ｂの照射領域に到達したならば、白度測定器４０は、第３光源４１ａ，４１ｂから青色光を照射された白度測定用領域１２の米粒からの反射光を受光する受光部４２からその出力データの取得を開始することにより、光量を検出する。受光部４２は、白度測定用領域１２の底面が第３光源４１ａ，４１ｂの照射領域から外れるまで、出力データの取得を継続する。 (Step 108)
If the bottom surface of the whiteness measuring region 12 of the sample dish 10 reaches the irradiation region of the third light sources 41a and 41b with the rotation of the turntable 20, the whiteness measuring instrument 40 will use the third light sources 41a and 41b. The amount of light is detected by starting the acquisition of the output data from the light receiving unit 42 that receives the reflected light from the rice grains in the whiteness measuring region 12 irradiated with blue light. The light receiving unit 42 continues to acquire output data until the bottom surface of the whiteness measurement region 12 deviates from the irradiation regions of the third light sources 41a and 41b.
　（ステップ１０９）
　白度算出部４３は、ステップ１０６、１０７、１０８で受光したそれぞれの反射光の光量の平均（時間平均）から白度を算出する。白度の算出方法は、どのような方法でもよいが、例えば、予め定めておいた反射光量と白度との関係を用いて、ステップ１０８で受光した試料の米粒からの反射光量に基づいて白度を求め、ステップ１０４、１０６で求めた基準板からの反射光量によって、求めた白度を補正する方法を用いることができる。また、ステップ１０４、１０６で求めた基準板からの反射光量によってステップ１０８において第３光源４１ａ，４１ｂから試料に照射する光量を制御する構成にしてもよい。 (Step 109)
The whiteness calculation unit 43 calculates the whiteness from the average (time average) of the amount of reflected light received in steps 106, 107, and 108. The whiteness may be calculated by any method. For example, using a predetermined relationship between the reflected light amount and the whiteness, white is white based on the reflected light amount from the rice grain of the sample received in step 108. A method can be used in which the degree is obtained and the obtained whiteness is corrected by the amount of reflected light from the reference plate obtained in steps 104 and 106. Further, the amount of light reflected from the reference plate obtained in steps 104 and 106 may be used to control the amount of light emitted from the third light sources 41a and 41b to the sample in step 108.
　（ステップ１１０）
　ステップ１０４および１０９で求めた、光沢値、白度を表示部５１に表示する。 (Step 110)
The gloss value and whiteness obtained in steps 104 and 109 are displayed on the display unit 51.
　上述してきたように、本実施形態によれば、１台のコンパクトな測定装置により、米粒の白度と光沢値を測定することができる。 As described above, according to the present embodiment, the whiteness and gloss value of rice grains can be measured by one compact measuring device.
　また、試料皿１０の試料を途中で光沢値用と白度用とで入れ替える必要がなく、基準板２１と試料皿１０を入れ替える必要もない。よって、短時間で容易に光沢値と白度を測定することができる。 Further, it is not necessary to replace the sample of the sample dish 10 for the gloss value and the whiteness in the middle, and it is not necessary to replace the reference plate 21 and the sample dish 10. Therefore, the gloss value and the whiteness can be easily measured in a short time.
　しかも、本実施形態では、ターンテーブル２０を回転させながら光沢値と白度をそれぞれ測定することができるため、試料皿１０の米粒の並び方のムラの影響を排除し、基準板による較正を毎測定自動で行うことができるため、精度よく光沢値と白度を測定できる。 Moreover, in the present embodiment, since the gloss value and the whiteness can be measured while rotating the turntable 20, the influence of the uneven arrangement of the rice grains in the sample dish 10 is eliminated, and the calibration by the reference plate is measured every time. Since it can be performed automatically, the gloss value and whiteness can be measured accurately.
　なお、上述の測定動作では、光沢値を測定した後で白度を測定する動作であるが、上下の測定器３０，４０から同時に光を照射して、光沢値と白度を同時に測定することも可能である。 In the above-mentioned measurement operation, the whiteness is measured after the gloss value is measured. However, the gloss value and the whiteness are measured at the same time by irradiating light from the upper and lower measuring instruments 30 and 40 at the same time. Is also possible.
　なお、試料皿１０は、ターンテーブル２０と一体構造としてもよい。 The sample dish 10 may be integrated with the turntable 20.
　また、本実施形態では、白度測定の際にターンテーブル２０を回転させながら反射光の測定を行ったが、基準板２１，基準板２２、試料皿１０の白度測定領域１２が、第３光源４１ａ，４１ｂの照射領域に到達したならば、一旦ターンテーブル２０を停止させて、反射光の測定を行ってもよい。 Further, in the present embodiment, the reflected light is measured while rotating the turntable 20 at the time of whiteness measurement, but the whiteness measurement region 12 of the reference plate 21, the reference plate 22, and the sample dish 10 is the third. When the irradiation region of the light sources 41a and 41b is reached, the turntable 20 may be stopped once and the reflected light may be measured.
　＜＜実施形態２＞＞
　実施形態２として、実施形態１とは異なる試料皿の形状例について説明する。 << Embodiment 2 >>
As the second embodiment, an example of the shape of the sample dish different from the first embodiment will be described.
　実施形態１の試料皿１０は、光沢測定用領域１１と白度測定用領域１２とを両方備えた一体型の試料皿であったが、図７（ｂ）、（ｃ）のように２つの試料皿１１０ｂ，１１０ｃのように分離されていてもよい。また、図７（ａ）のように、基準板２１を基準用試料皿１１０ａの底面に配置し、試料皿１１０ｂと入れ替えて配置することにより、基準板２１の反射光量を測定してもよい。 The sample dish 10 of the first embodiment was an integrated sample dish provided with both a gloss measurement area 11 and a whiteness measurement area 12, but there are two as shown in FIGS. 7 (b) and 7 (c). It may be separated like the sample dishes 110b and 110c. Further, as shown in FIG. 7A, the reflected light amount of the reference plate 21 may be measured by arranging the reference plate 21 on the bottom surface of the reference sample plate 110a and arranging the reference plate 21 in place of the sample plate 110b.
　また、図８（ａ）のように、光沢測定用の試料皿１１０ａの底面に基準板２１を配置してもよい。この場合、白度測定用の試料皿１１０ｂは、図７（ｂ）と同様の構成である。図８（ａ）、（ｂ）の試料皿１１０ａ，１１ｂを用いることにより、光沢測定用の試料皿と基準板２１とを試料皿１１０ａに兼用させることができるため、試料皿の数を図７の場合よりも低減できる。 Further, as shown in FIG. 8A, the reference plate 21 may be arranged on the bottom surface of the sample dish 110a for gloss measurement. In this case, the sample dish 110b for measuring the whiteness has the same configuration as in FIG. 7B. By using the sample dishes 110a and 11b of FIGS. 8A and 8B, the sample dish for gloss measurement and the reference plate 21 can be shared with the sample dish 110a, so that the number of sample dishes is shown in FIG. 7. It can be reduced more than in the case of.
　また、図９（ｂ）に断面図を、図９（ｃ）に斜視図を示したように、試料皿１１２ｂは、中央に白度用試料領域１２が設けられ、白度用試料領域１２の外周を取り囲むように、白度用試料領域１２よりも深さの浅い光沢用試料領域１１が設けられている構成のものを用いることもできる。この場合、基準板２１は、図７（ａ）と同様に試料皿１１０ａの底面に配置したものを用いることができる。 Further, as shown in the cross-sectional view in FIG. 9 (b) and the perspective view in FIG. 9 (c), the sample dish 112b is provided with the whiteness sample area 12 in the center, and the whiteness sample area 12 is provided. It is also possible to use a configuration in which a glossy sample region 11 having a depth shallower than that of the whiteness sample region 12 is provided so as to surround the outer periphery. In this case, as the reference plate 21, a reference plate 21 arranged on the bottom surface of the sample dish 110a can be used as in FIG. 7A.
　上記図８、図９の試料皿を用いる場合、光沢測定用の光が照射される領域と白度測定用の光が照射される領域の両方が中心軸上に配置されるテーブル２０を用いる。すなわち、テーブル２０の中央に開口または窓を設け、試料皿や基準板２１を配置する構成とする。この構成の試料皿１１２ｂは、上下の測定器３０，４０から同時に光を照射して、光沢値と白度を同時に測定することが可能である。 When using the sample dishes of FIGS. 8 and 9, a table 20 is used in which both the region irradiated with the light for gloss measurement and the region irradiated with the light for whiteness measurement are arranged on the central axis. That is, an opening or a window is provided in the center of the table 20, and the sample dish and the reference plate 21 are arranged. The sample dish 112b having this configuration can simultaneously irradiate light from the upper and lower measuring instruments 30 and 40 to measure the gloss value and the whiteness at the same time.
　＜＜実施形態３＞＞
　実施形態３では、実施形態１で求めた白度測定器４０で測定した白度を、光沢測定器３０から求めた値を用いて補正する補正部４３ａ（図１参照）について説明する。米粒に乳白色の米粒が混じっている場合、乳白色の米粒は光の反射率が高いために、白度測定器５０の受光部４２の検出する反射光の光量が大きくなる傾向がある。そのため、ステップ１０９で算出される白度が、正確な白度よりも大きくなる。しかも、白度が大きくなる傾向は、乳白色の米粒の試料皿１０の試料（米粒）の面積において占める面積に依存する。そこで、本実施形態では、算出した白度を乳白色の米粒の面積によって補正する補正部４３ａを白度算出部４３に備えている。乳白色の米粒の面積は、光沢算出部３４のカメラ３３が撮像した第２波長の光による試料皿１０の米粒の画像に、所定の処理を施すことにより算出する。 << Embodiment 3 >>
In the third embodiment, the correction unit 43a (see FIG. 1) for correcting the whiteness measured by the whiteness measuring device 40 obtained in the first embodiment by using the value obtained from the gloss measuring device 30 will be described. When milky white rice grains are mixed with rice grains, the amount of reflected light detected by the light receiving portion 42 of the whiteness measuring device 50 tends to be large because the milky white rice grains have high light reflectance. Therefore, the whiteness calculated in step 109 is larger than the accurate whiteness. Moreover, the tendency for the whiteness to increase depends on the area occupied in the area of the sample (rice grain) of the sample dish 10 of the milky white rice grain. Therefore, in the present embodiment, the whiteness calculation unit 43 is provided with a correction unit 43a for correcting the calculated whiteness by the area of milky white rice grains. The area of the milky white rice grains is calculated by subjecting an image of the rice grains of the sample dish 10 to the light of the second wavelength imaged by the camera 33 of the gloss calculation unit 34 to a predetermined process.
　実施形態３の米粒品質測定装置の装置構成は、実施形態１の装置と同様である。 The device configuration of the rice grain quality measuring device of the third embodiment is the same as that of the device of the first embodiment.
　具体的な処理を図１０のフローチャートを用いて説明する。 Specific processing will be described using the flowchart of FIG.
　まず、図６のステップ１０１～１０９までは実施形態１と同様に行って、白度Wを求める。 First, steps 101 to 109 in FIG. 6 are performed in the same manner as in the first embodiment to obtain the whiteness W.
　（ステップ９０１）
　つぎに、光沢算出部３４は、実施形態１０２で撮像した、第２波長の光の試料皿１０の米粒の画像を、予め求めておいた閾値により２値化処理する。この閾値はステップ１０３で米粒ではない領域からの反射光等を除去した閾値よりも大きい値である。乳白色の米粒は、光の反射率が通常の米粒よりも大きいため、第２波長の光の試料皿１０の米粒の画像において、輝度の大きな米粒像となる。よって、光沢算出部３４は、乳白色部分を明確に検出することができるように予め定めた閾値により画像を２値化処理する。光沢算出部３４は、２値化した画像の乳白色の米粒像の面積(S1)を算出する。 (Step 901)
Next, the gloss calculation unit 34 binarizes the image of the rice grain of the sample dish 10 of the light of the second wavelength imaged in the embodiment 102 according to a predetermined threshold value. This threshold value is larger than the threshold value obtained by removing the reflected light and the like from the region other than the rice grain in step 103. Since the milky white rice grain has a higher light reflectance than the normal rice grain, it becomes a rice grain image having high brightness in the image of the rice grain of the sample dish 10 of the light of the second wavelength. Therefore, the gloss calculation unit 34 binarizes the image according to a predetermined threshold value so that the milky white portion can be clearly detected. The gloss calculation unit 34 calculates the area (S1) of the milky white rice grain image of the binarized image.
　（ステップ９０２）
　光沢算出部３４は、乳白色の米粒像の面積(S1)と、ステップ１０３の穀物領域の面積（S0)との比X（＝S1/S0)を算出する。 (Step 902)
The gloss calculation unit 34 calculates the ratio X (= S1 / S0) of the area (S1) of the milky white rice grain image to the area (S0) of the grain region in step 103.
　（ステップ９０３）
　光沢算出部は、ステップ９０２で求めた比Xを用いて、予め定めた数式を用いてステップ１０９で算出した白度Wを補正し、補正後の白度W’を求める。 (Step 903)
The gloss calculation unit uses the ratio X obtained in step 902 to correct the whiteness W calculated in step 109 using a predetermined mathematical formula, and obtains the corrected whiteness W'.
　このように、本実施形態の装置は、光沢値と白度の両方を測定する装置であるため、光沢値の算出する途中の画像の値から、白度を補正し、精度のよい白度を算出することができる。 As described above, since the device of the present embodiment is a device that measures both the gloss value and the whiteness, the whiteness is corrected from the value of the image in the process of calculating the gloss value, and the whiteness is accurately obtained. Can be calculated.
　＜＜実施形態４＞＞
　上述してきた実施形態１～３では、光沢測定器３０がテーブル２０の上方に配置され、白度測定器４０がテーブル２０の下方に配置する例について説明したが、光沢測定器３０と白度測定器４０の両者を、テーブル２０の上方に配置してもよいし、両者をテーブル２０の下方に配置してもよい。例えば、図１１に示したように、光沢測定器３０と白度測定器４０の両者をテーブル２０の上方に配置した場合、白度測定器４０は、試料皿１０の米粒の上方から光を照射し、その反射光を試料皿１０の上方に配置された受光部４２によって受光する構成とする。このとき、試料皿１０の白度測定領域１２の米粒の上には、透明板を搭載し、米粒の上面を平たんにしておくことが望ましい。 << Embodiment 4 >>
In the above-described first to third embodiments, the example in which the gloss measuring device 30 is arranged above the table 20 and the whiteness measuring device 40 is arranged below the table 20 has been described, but the gloss measuring device 30 and the whiteness measurement have been described. Both of the vessels 40 may be arranged above the table 20 or both may be arranged below the table 20. For example, as shown in FIG. 11, when both the gloss measuring device 30 and the whiteness measuring device 40 are arranged above the table 20, the whiteness measuring device 40 irradiates light from above the rice grains of the sample dish 10. Then, the reflected light is received by the light receiving unit 42 arranged above the sample dish 10. At this time, it is desirable to mount a transparent plate on the rice grains in the whiteness measuring region 12 of the sample dish 10 and keep the upper surface of the rice grains flat.
　このように光沢測定器３０と白度測定器４０の両者をテーブル２０の上方に配置することより、白度測定器４０の第３光源から照射される第３の光が試料皿１０の底面を通りぬけて照射されず、米粒の試料の表面から照射され、その反射光を直接受光部４２により受光できる。よって、試料皿１０の底面の影響を受けることなく、反射光を受光できるというメリットがある。 By arranging both the gloss measuring instrument 30 and the whiteness measuring instrument 40 above the table 20 in this way, the third light emitted from the third light source of the whiteness measuring instrument 40 hits the bottom surface of the sample dish 10. It is not irradiated through, but is irradiated from the surface of the rice grain sample, and the reflected light can be directly received by the light receiving unit 42. Therefore, there is an advantage that the reflected light can be received without being affected by the bottom surface of the sample dish 10.
　また、本実施形態では、光沢測定器３０の第１および第２の光源３１，３２の一方または両方を、白度測定器４０の第３の光源４１ａ，４１ｂと兼用させることも可能である。 Further, in the present embodiment, one or both of the first and second light sources 31 and 32 of the gloss measuring instrument 30 can be used in combination with the third light sources 41a and 41b of the whiteness measuring instrument 40.
　＜＜実施形態５＞＞
　実施形態５として、実施形態１～４のいずれかの米粒品質測定装置を用いた精米装置について図１２を用いて説明する。図１２の精米装置は、精米機２０１と研米機２０２と、精米機２０１と研米機２０２にそれぞれ接続された米粒品質測定装置１とを備えている。 << Embodiment 5 >>
As the fifth embodiment, the rice milling apparatus using the rice grain quality measuring apparatus according to any one of the first to fourth embodiments will be described with reference to FIG. The rice milling apparatus of FIG. 12 includes a rice milling machine 201 and a rice milling machine 202, and a rice grain quality measuring device 1 connected to the rice milling machine 201 and the rice milling machine 202, respectively.
　精米機２０１で所定時間精米された後の米粒の一部は、試料として米粒品質測定装置１に搬入され、白度および光沢が測定される。測定値は、米粒品質測定装置１から精米機２０１の精米制御部に出力される。精米制御部は、受け取った測定値が目標としている白度および／または光沢値に到達していない場合には、さらに精米を行うように各部を制御する。目標値に到達した場合には、精米制御部は精米を終了し、精米後の米粒を研米機２０２に搬出する。 A part of the rice grains after being milled by the rice milling machine 201 for a predetermined time is carried into the rice grain quality measuring device 1 as a sample, and the whiteness and gloss are measured. The measured value is output from the rice grain quality measuring device 1 to the rice milling control unit of the rice milling machine 201. When the received measured value does not reach the target whiteness and / or gloss value, the rice milling control unit controls each unit to further mill rice. When the target value is reached, the rice milling control unit finishes the milling and carries out the milled rice grains to the rice mill 202.
　研米機２０２は、所定時間研米された後の米粒の一部は、試料として米粒品質測定装置１に搬入され、白度および光沢が測定される。測定値は、米粒品質測定装置１から研米機２０２の研米制御部に出力される。研米制御部は、受け取った測定値が目標としている白度および／または光沢値に到達していない場合には、さらに研米を行うように各部を制御する。目標値に到達した場合には、研米を終了し、精米後の米粒を搬出する。 In the rice polishing machine 202, a part of the rice grains after being polished for a predetermined time is carried into the rice grain quality measuring device 1 as a sample, and the whiteness and gloss are measured. The measured value is output from the rice grain quality measuring device 1 to the rice polishing control unit of the rice polishing machine 202. If the received measured value does not reach the target whiteness and / or gloss value, the rice polishing control unit controls each unit to further polish the rice. When the target value is reached, the rice polishing is completed and the polished rice grains are carried out.
　このように、本実施形態の精米装置は、米粒品質測定装置１で測定された白度および／または光沢値に基づいて制御を行うことができるため、精米工程を自動制御することが可能になる。また、実施形態３の米粒品質測定装置１を用いた場合には、補正された精度のよい白度を用いて制御を行うことができるため、精米の制御の精度を向上させることができる。 As described above, since the rice milling apparatus of the present embodiment can be controlled based on the whiteness and / or the gloss value measured by the rice grain quality measuring apparatus 1, it becomes possible to automatically control the rice milling process. .. Further, when the rice grain quality measuring device 1 of the third embodiment is used, the control can be performed by using the corrected and accurate whiteness, so that the accuracy of the rice milling control can be improved.
１０…試料皿、１０ａ…底面、１１…光沢測定用領域、１２…白度測定用領域、１５…米粒、２０…テーブル、２０ａ…開口、２３…モータ、３０…光沢測定器、３１…第１光源、３２…第２光源、３３…カメラ、３４…光沢算出部、４０…白度測定器、４１ａ、４１ｂ…第３光源、４２…受光部、４３…白度算出部、４３ａ…補正部、５１…表示部、２０１…精米機、２０２…研米機 10 ... sample dish, 10a ... bottom surface, 11 ... gloss measurement area, 12 ... whiteness measurement area, 15 ... rice grain, 20 ... table, 20a ... opening, 23 ... motor, 30 ... gloss measuring instrument, 31 ... first. Light source, 32 ... second light source, 33 ... camera, 34 ... gloss calculation unit, 40 ... whiteness measuring instrument, 41a, 41b ... third light source, 42 ... light receiving unit, 43 ... whiteness calculation unit, 43a ... correction unit, 51 ... Display, 201 ... Rice milling machine, 202 ... Rice milling machine

Claims (15)

  1. 　米粒を載せた試料皿が載置されるテーブルと、
    　前記テーブルに載置された前記試料皿の米粒の表面に対して光沢測定用の光を照射し、その反射光を受光することにより前記米粒の光沢を測定する光沢測定器と、
    　前記テーブルに載置された前記試料皿の米粒に対して白度測定用の光を照射し、前記試料皿の米粒からの反射光を受光することにより前記米粒の白度を測定する白度測定器とを有することを特徴とする米粒品質測定装置。     A table on which a sample plate with rice grains is placed, and
    A gloss measuring device that measures the gloss of the rice grains by irradiating the surface of the rice grains of the sample dish placed on the table with light for measuring gloss and receiving the reflected light.
    Whiteness measurement for measuring the whiteness of the rice grains by irradiating the rice grains of the sample dish placed on the table with light for measuring whiteness and receiving the reflected light from the rice grains of the sample dish. A rice grain quality measuring device characterized by having a vessel.
  2. 　請求項１に記載の米粒品質測定装置であって、
    　前記光沢測定器は、前記テーブルの上方に配置され、
    　前記白度測定器は、前記テーブルの下方に配置され、前記テーブルに載置された前記試料皿の下面から前記試料皿を通して白度測定用の光を照射し、前記試料皿の米粒からの反射光を前記試料皿を通して受光することを特徴とする米粒品質測定装置。     The rice grain quality measuring device according to claim 1.
    The gloss measuring instrument is placed above the table.
    The whiteness measuring device is arranged below the table, irradiates light for whiteness measurement from the lower surface of the sample dish placed on the table through the sample dish, and reflects from rice grains of the sample dish. A rice grain quality measuring device characterized in that light is received through the sample dish.
  3. 　請求項２に記載の米粒品質測定装置であって、試料皿をさらに有し、
    　前記試料皿は、前記光沢を測定するために米粒を一層配置する光沢用試料領域と、前記白度を測定するために米粒を多層充填する白度用試料領域とを有し、
    　前記白度用試料領域は、前記試料皿が前記白度測定用の光を透過する材質で構成されていること特徴とする米粒品質測定装置。     The rice grain quality measuring apparatus according to claim 2, further comprising a sample dish.
    The sample dish has a glossy sample area in which rice grains are further arranged for measuring the gloss, and a whiteness sample area in which rice grains are multi-layered for measuring the whiteness.
    The whiteness sample region is a rice grain quality measuring device characterized in that the sample dish is made of a material that transmits light for measuring whiteness.
  4. 　請求項３に記載の米粒品質測定装置であって、前記テーブルは、ターンテーブルであり、
    　前記ターンテーブルには、前記試料皿の前記白度用領域を載置するための開口または前記白度測定用光を透過する窓が設けられ、
    　前記テーブルの下面には、１以上の基準板が配置され、
    　前記ターンテーブルの回転に伴い、前記試料皿と前記１以上の基準板が順次、前記白度測定用の光が照射される位置に配置されることを特徴とする米粒品質測定装置。     The rice grain quality measuring apparatus according to claim 3, wherein the table is a turntable.
    The turntable is provided with an opening for placing the whiteness area of the sample dish or a window for transmitting the whiteness measurement light.
    One or more reference plates are arranged on the lower surface of the table.
    A rice grain quality measuring device, characterized in that, as the turntable rotates, the sample dish and the one or more reference plates are sequentially arranged at positions where the light for measuring whiteness is irradiated.
  5. 　請求項４に記載の米粒品質測定装置であって、前記白度測定器は、前記ターンテーブルを連続的に回転させながら、前記白度測定用の光が照射される位置を通過する前記試料皿の米粒と前記１以上の基準板に白度測定用の光を順次照射し、反射光を受光することを特徴とする米粒品質測定装置。 The rice grain quality measuring device according to claim 4, wherein the whiteness measuring device passes through a position where the light for measuring the whiteness is irradiated while continuously rotating the turntable. A rice grain quality measuring device, characterized in that light for measuring whiteness is sequentially irradiated to the rice grains and the above-mentioned one or more reference plates, and the reflected light is received.
  6. 　請求項４に記載の米粒品質測定装置であって、前記白度測定器は、前記白度測定用の光が照射される位置に前記試料皿および前記１以上の基準板が順次到達したならば、前記ターンテーブルを停止させ、白度測定用の光を照射し、反射光を受光することを特徴とする米粒品質測定装置。 The rice grain quality measuring device according to claim 4, wherein the whiteness measuring device sequentially reaches a position where the light for measuring whiteness is irradiated with the sample dish and the one or more reference plates. , The rice grain quality measuring apparatus, characterized in that the turntable is stopped, light for measuring whiteness is irradiated, and reflected light is received.
  7. 　請求項３に記載の米粒品質測定装置であって、前記テーブルは、ターンテーブルであり、
    　前記光沢測定器は、前記ターンテーブルを連続的に回転させながら、前記試料皿の光沢用試料領域の米粒に光沢測定用の光を順次照射し、反射光を受光することを特徴とする米粒品質測定装置。     The rice grain quality measuring apparatus according to claim 3, wherein the table is a turntable.
    The gloss measuring instrument is characterized in that the rice grains in the gloss sample region of the sample dish are sequentially irradiated with the light for gloss measurement while the turntable is continuously rotated, and the reflected light is received. measuring device.
  8. 　請求項４ないし７のいずれか１項に記載の米粒品質測定装置であって、前記試料皿の前記光沢測定用試料領域は、前記ターンテーブルの回転中心に載置されることを特徴とする米粒品質測定装置。 The rice grain quality measuring apparatus according to any one of claims 4 to 7, wherein the sample region for gloss measurement of the sample dish is placed on the rotation center of the turntable. Quality measuring device.
  9. 　請求項３に記載の米粒品質測定装置であって、前記光沢測定器は、前記テーブルに載置された前記試料皿の米粒に対し、斜め上方から第１波長の光を照射する第１光源と、前記試料皿の米粒に対し上方から第２波長の光を照射する第２光源と、前記試料皿からの前記第１波長の光および第２波長の光により前記試料皿を撮像するカメラと、光沢算出部とを備え、
    　前記光沢算出部は、前記カメラの撮像した画像から、前記第１波長の光の前記試料皿の米粒の画像と、前記第２波長の光の前記試料皿の米粒の画像とを生成し、両画像に基づいて前記試料皿の米粒の光沢値を算出することを特徴とする米粒品質測定装置。     The rice grain quality measuring device according to claim 3, wherein the gloss measuring device is a first light source that irradiates a rice grain of the sample dish placed on the table with light of a first wavelength from diagonally above. A second light source that irradiates the rice grains of the sample dish with light of the second wavelength from above, and a camera that images the sample dish with the light of the first wavelength and the light of the second wavelength from the sample dish. Equipped with a gloss calculation unit,
    The gloss calculation unit generates an image of rice grains in the sample dish of the first wavelength light and an image of rice grains in the sample dish of the second wavelength light from the image captured by the camera, and both of them. A rice grain quality measuring device, characterized in that the gloss value of rice grains in the sample dish is calculated based on an image.
  10. 　請求項９に記載の米粒品質測定装置であって、前記白度測定器は、前記テーブルの下方に配置され、前記試料皿の米粒に白度測定用の第３の光を照射する第３光源と、前記テーブルの下方に配置され、前記試料皿の米粒からの前記白度測定用の第３の光の反射光を受光する受光部と、前記受光部の受光強度から白度を算出する白度算出部とを備えることを特徴とする米粒品質測定装置。 The third light source according to claim 9, wherein the whiteness measuring device is arranged below the table and irradiates the rice grains in the sample dish with a third light for measuring whiteness. And white, which is arranged below the table and receives the reflected light of the third light for measuring the whiteness from the rice grains of the sample dish, and the whiteness which calculates the whiteness from the light receiving intensity of the light receiving part. A rice grain quality measuring device characterized by having a degree calculation unit.
  11. 　請求項１０に記載の米粒品質測定装置であって、前記白度算出部は、前記試料皿の米粒に前記白度測定用の第３の光を照射した場合の前記受光強度と、前記試料皿の米粒の代わりに基準板を配置した場合の前記受光強度とに基づいて、白度を算出することを特徴とする米粒品質測定装置。 The rice grain quality measuring apparatus according to claim 10, wherein the whiteness calculation unit has the light receiving intensity when the rice grains of the sample dish are irradiated with the third light for measuring the whiteness, and the sample dish. A rice grain quality measuring device, characterized in that the whiteness is calculated based on the light receiving intensity when a reference plate is arranged instead of the rice grains.
  12. 　請求項１０に記載の米粒品質測定装置であって、前記光沢算出部は、前記第２波長の光の前記試料皿の米粒の画像に所定の処理を施すことにより、前記試料皿の米粒に含まれる乳白色の米粒の面積を算出し、
    　前記白度算出部は、前記光沢算出部が算出した乳白色の米粒の面積に基づいて、前記白度を補正する補正部を備えることを特徴とする米粒品質測定装置。     The rice grain quality measuring apparatus according to claim 10, wherein the gloss calculation unit is included in the rice grains of the sample dish by subjecting an image of the rice grains of the sample dish of light of the second wavelength to a predetermined process. Calculate the area of milky white rice grains
    The whiteness calculation unit is a rice grain quality measuring device including a correction unit that corrects the whiteness based on the area of milky white rice grains calculated by the gloss calculation unit.
  13. 　請求項２に記載の米粒品質測定装置であって、前記試料皿は、中央に前記白度用試料領域が設けられ、前記白度用試料領域の外周を取り囲むように、前記白度用試料領域よりも深さの浅い光沢用試料領域が設けられていることを特徴とする米粒品質測定装置。 The rice grain quality measuring apparatus according to claim 2, wherein the sample dish is provided with the whiteness sample region in the center and surrounds the outer periphery of the whiteness sample region. A rice grain quality measuring device characterized in that a sample region for gloss having a shallower depth is provided.
  14. 　請求項１に記載の米粒品質測定装置であって、前記試料皿は、前記テーブルと一体であることを特徴とする米粒品質測定装置。 The rice grain quality measuring device according to claim 1, wherein the sample dish is integrated with the table.
  15. 　請求項１に記載の米粒品質測定装置であって、
    　前記光沢測定器および前記白度測定器は、いずれも前記テーブルの上方に配置されていることを特徴とする米粒品質測定装置。     The rice grain quality measuring device according to claim 1.
    The rice grain quality measuring device, wherein both the gloss measuring device and the whiteness measuring device are arranged above the table.
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JPH01142441A (en) * 1987-11-28 1989-06-05 Satake Eng Co Ltd Apparatus for measuring polishing degree of grain of rice
JP2000111542A (en) * 1998-09-30 2000-04-21 Nippon Seimai Kogyokai Comprehensive inspection and evaluation method for rice
JP2004101285A (en) * 2002-09-06 2004-04-02 Shizuoka Seiki Co Ltd Precision management method in grain quality determining apparatus
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JP2019211280A (en) * 2018-06-01 2019-12-12 株式会社サタケ Glossiness measurement device for grains

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JPH01142441A (en) * 1987-11-28 1989-06-05 Satake Eng Co Ltd Apparatus for measuring polishing degree of grain of rice
JP2000111542A (en) * 1998-09-30 2000-04-21 Nippon Seimai Kogyokai Comprehensive inspection and evaluation method for rice
JP2004101285A (en) * 2002-09-06 2004-04-02 Shizuoka Seiki Co Ltd Precision management method in grain quality determining apparatus
JP2012525575A (en) * 2009-04-30 2012-10-22 ビューラー ソーテックス リミテッド Apparatus and method for measuring the quality of a continuously flowing granular product
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