WO2021057849A1 - Procédé de mesure de facteur de qualité d'inductance, circuit de mesure correspondant et application associée - Google Patents

Procédé de mesure de facteur de qualité d'inductance, circuit de mesure correspondant et application associée Download PDF

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WO2021057849A1
WO2021057849A1 PCT/CN2020/117474 CN2020117474W WO2021057849A1 WO 2021057849 A1 WO2021057849 A1 WO 2021057849A1 CN 2020117474 W CN2020117474 W CN 2020117474W WO 2021057849 A1 WO2021057849 A1 WO 2021057849A1
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voltage
value
quality factor
circuit
main control
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PCT/CN2020/117474
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English (en)
Chinese (zh)
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顾丽娟
王聪颖
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无锡华润矽科微电子有限公司
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables

Definitions

  • This application relates to the field of electricity, in particular to the field of measurement of electronic component parameters, in particular to a method for measuring the quality factor of inductance, a corresponding measurement circuit and its application.
  • the inductor is a relatively commonly used electronic device, and the value of the inductor quality factor Q is an important parameter for evaluating the entire circuit, and the value of the inductor quality factor Q is a positive integer.
  • the method for measuring the Q factor (Q factor) of the inductance in the LC oscillating circuit is often more complicated and requires higher processing timing of the circuit.
  • the purpose of this application is to provide an inductance quality factor measurement method, a corresponding measurement circuit and its application that is easy to implement, does not require a complicated circuit structure and a complicated circuit control method, and is simple to operate.
  • the embodiment of the present application provides a method for measuring the quality factor of inductance, and the method is:
  • v pp (t i) t i is the measured point peak - peak voltage
  • v pp (t i + T ) is measured with a point interval t i oscillation period T at the peak - peak voltage
  • the system corresponds to each i All numbers are calculated;
  • the method includes the following steps:
  • the oscillation period T is measured.
  • Step voltage generation module used to generate step voltage
  • An oscillating circuit which performs under-damped oscillation after obtaining the step voltage
  • the main control module is respectively connected with the step voltage generating module and the oscillation circuit for measuring the oscillation circuit, and the main control module is built-in the following formula 1 or formula 2, combined with formula 1 or formula 2 Find the value of the quality factor Q of the inductor in the oscillation circuit:
  • v pp (t i) t i is the measured point peak - peak voltage
  • v pp (t i + T ) is measured with a point interval t i oscillation period T at the peak - peak voltage
  • i is a natural number, and the number preset by the system i, Q i standby inductor quality factor Q value of i, the main control module of the alternate value is determined according to the inductance of the quality factor Q i The value of the quality factor Q of the inductor.
  • the step voltage generation module includes a DC power supply and a controllable switch
  • the positive terminal of the DC power supply is connected to the first terminal of the oscillating circuit through the controllable switch, and the negative terminal of the DC power supply is directly connected to the second terminal of the oscillating circuit;
  • the oscillating circuit includes a capacitor and an inductor connected in parallel, one end of the capacitor and the inductor is connected to form the first end of the oscillating circuit, and the other of the capacitor and the inductor The connection at one end constitutes the second end of the oscillating circuit.
  • the main control module includes a voltage comparison unit, a timing unit, a voltage sampling unit, and a main control unit,
  • the first input terminal of the voltage comparison unit is connected with the first terminal of the oscillating circuit; the second input terminal of the voltage comparison unit is connected with the DC power supply;
  • the first input terminal of the voltage sampling unit is connected to the first terminal of the oscillating circuit; the second input terminal of the voltage sampling unit is connected to the first output terminal of the main control unit;
  • the output terminal of the voltage comparison unit is connected to the input terminal of the timing unit
  • the output terminal of the timing unit is connected to the first input terminal of the main control unit; the output terminal of the voltage sampling unit is connected to the second input terminal of the main control unit; The second output terminal of the main control unit is connected with the control terminal of the controllable switch;
  • the main control unit When the number of i is 1, the main control unit will obtain the value of the spare inductance quality factor Q i obtained as the value of the inductance quality factor Q in the oscillation circuit, when the number of the oscillation circuit when i is greater than 1, the main control unit averaging values alternate inductor quality factor Q of the plurality of seek removed i, determining the quality factor of the inductance The value of Q.
  • the step voltage generating module is caused to generate the step voltage
  • the second input terminal of the voltage comparison unit is connected to the negative terminal of the DC power supply
  • the voltage comparison unit When the main control unit controls the controllable switch from the off state to the on state, so that the step voltage generation module generates the step voltage, the voltage comparison unit The second input terminal is connected to the positive terminal of the DC power supply.
  • the voltage sampling unit is an analog/digital converter.
  • the third aspect of the embodiments of the present application provides an application based on the above-mentioned inductance quality factor measurement circuit, and the application includes:
  • the voltage comparison unit compares the oscillating voltage generated by the oscillating circuit with the reference voltage generated by the DC power supply. When the oscillating voltage is greater than the reference voltage, the voltage The comparing unit outputs a high level, and when the oscillating voltage is less than the reference voltage, the voltage comparing unit outputs a low level;
  • the timing unit determines the oscillation period T by measuring the interval between two adjacent rising edges output by the voltage comparison unit, or by measuring the two output times of the voltage comparison unit The interval between adjacent falling edges determines the oscillation period T;
  • the main control unit controls the voltage sampling unit to sample the output voltage of the oscillating circuit in several cycles preset by the system, and determines the voltage value according to the sampled voltage value.
  • peak oscillation circuit with a period corresponding to point t i - the peak voltage v pp (t i), and a period after the point adjacent to t i, a voltage sampling unit for controlling the oscillation circuit to said output
  • the voltage is sampled again, and the peak-to-peak voltage v pp (t i + T) of the next cycle adjacent to the point t i is determined according to the voltage value obtained by the re-sampling;
  • the main control unit obtains the value of the inductance quality factor Q i according to the formula 2 to obtain the value of the inductance quality factor Q in the oscillation circuit;
  • i is a natural number, and the number of i is preset by the system.
  • the main control unit will obtain the value of the spare inductor quality factor Q i
  • the main control unit calculates the value of the plurality of spare inductor quality factors Q i The values are averaged to determine the value of the quality factor Q of the inductor in the oscillation circuit.
  • the t i point is the time point corresponding to the peak or trough of the corresponding system preset period when the oscillation circuit oscillates; the step (a4) includes the following step:
  • the main control unit executes the following steps in a preset period of each system:
  • the main control unit controls the voltage sampling unit at t i , t i +T, The output voltage of the oscillating circuit is sampled at one point to obtain the voltage value v 2 (t i ), v 2 (t i +T) and
  • the fourth aspect of the embodiments of the present application provides an application based on the above-mentioned inductance quality factor measurement circuit, and the application includes:
  • the voltage comparison unit compares the oscillating voltage generated by the oscillating circuit with the reference voltage generated by the DC power supply. When the oscillating voltage is greater than the reference voltage, the voltage The comparing unit outputs a high level, and when the oscillating voltage is less than the reference voltage, the voltage comparing unit outputs a low level;
  • the timing unit determines the oscillation period T by measuring the interval between two adjacent rising edges output by the voltage comparison unit, or by measuring the two output times of the voltage comparison unit The interval between adjacent falling edges determines the oscillation period T;
  • the main control unit controls the voltage sampling unit to perform voltage sampling on the output voltage of the oscillating circuit in a predetermined number of cycles in the system, and obtains that the oscillating circuit is at point ti
  • the main control unit obtains the value of the inductance quality factor Q i according to the formula 1 to obtain the value of the inductance quality factor Q in the oscillation circuit;
  • i is a natural number, and the number of i is preset by the system.
  • the main control unit will obtain the value of the spare inductor quality factor Q i
  • the main control unit calculates the value of the plurality of spare inductor quality factors Q i The values are averaged to determine the value of the quality factor Q of the inductor in the oscillation circuit.
  • the t i point is the time point corresponding to the peak or trough of the corresponding system preset period when the oscillation circuit oscillates; the step (b4) includes the following step:
  • the main control unit executes the following steps in a preset period of each system:
  • control means controlling the voltage at point t i is the output voltage of the sampling unit of the oscillation circuit is a voltage sampling, to obtain a voltage value v C of the oscillation circuit at point t i (t i );
  • said main control unit (B4.2) samples the output voltage of the voltage of the oscillation circuit voltage sampling point t i + T cells of the control, to obtain the oscillation circuit at point t i + T The voltage value v C (t i +T).
  • the corresponding measurement circuit and its application by giving the oscillating circuit a step voltage, the oscillating circuit is caused to perform under-damped oscillation, through or
  • the value of the spare inductance quality factor Q i can be calculated by simple four arithmetic operations, and then the inductance in the oscillation circuit can be determined by averaging the values of the calculated spare inductance quality factor Q i The value of the quality factor Q.
  • the inductance quality factor measurement method of the present invention the corresponding measurement circuit and its application are used to measure the voltage parameters at several points in the test process, and then the quality factor Q of the inductance in the oscillation circuit can be obtained by simple four arithmetic operations Value, lower requirements on the circuit, effectively saving the measurement cost, but also making the measurement process simpler.
  • FIG. 1 is a schematic structural diagram of an inductor quality factor measurement circuit in an embodiment of the present invention.
  • Figure 2 is a schematic diagram of the waveform of an underdamped oscillation.
  • Figure 3 is a model diagram of the RLC series circuit.
  • Fig. 4 is an equivalent schematic diagram of the switch in Fig. 3 at point b.
  • the inductance quality factor measurement method is:
  • v pp (t i) t i is the measured point peak - peak voltage
  • v pp (t i + T ) is measured with a point interval t i oscillation period T at the peak - peak voltage
  • the system corresponds to each i All numbers are calculated; the t i point is a time point corresponding to the peak or trough of the corresponding system preset period when the oscillation circuit oscillates.
  • Figure 2 is a schematic diagram of the waveform of the under-damped oscillation (note that Figure 2 is only a diagram to illustrate the approximate form of the waveform of the under-damped oscillation, not a diagram after actual measurement, and the diagram only illustrates This figure shows the trend of oscillation instead of completing the whole oscillation process).
  • a total of 4 half cycles are drawn, with a total of 5 peaks and 4 troughs.
  • the oscillation waveform gradually tends to be stable.
  • the measurement process can be performed by the following inductance quality factor measurement circuit.
  • the inductance quality factor measurement circuit includes:
  • Step voltage generation module used to generate step voltage
  • An oscillating circuit which performs under-damped oscillation after obtaining the step voltage
  • the main control module is respectively connected with the step voltage generating module and the oscillation circuit for measuring the oscillation circuit, and the main control module is built-in the following formula 1 or formula 2, combined with formula 1 or formula 2 Find the value of the quality factor Q of the inductor in the oscillation circuit:
  • v pp (t i) t i is the measured point peak - peak voltage
  • v pp (t i + T ) is measured with a point interval t i oscillation period T at the peak - peak voltage
  • i is a natural number, and the number preset by the system i, Q i standby inductor quality factor Q value of i, the main control module of the alternate value is determined according to the inductance of the quality factor Q i The value of the quality factor Q of the inductor.
  • the step voltage generating module includes a DC power supply and a controllable switch
  • the positive terminal of the DC power supply is connected to the first terminal of the oscillating circuit through the controllable switch, and the negative terminal of the DC power supply is directly connected to the second terminal of the oscillating circuit;
  • the oscillating circuit includes a capacitor and an inductor connected in parallel, one end of the capacitor and the inductor is connected to form the first end of the oscillating circuit, and the capacitor is connected to the other end of the inductor. It constitutes the second end of the oscillating circuit.
  • the main control module includes a voltage comparison unit, a timing unit, a voltage sampling unit and a main control unit,
  • the first input terminal of the voltage comparison unit is connected with the first terminal of the oscillating circuit; the second input terminal of the voltage comparison unit is connected with the DC power supply;
  • the first input terminal of the voltage sampling unit is connected to the first terminal of the oscillating circuit; the second input terminal of the voltage sampling unit is connected to the first output terminal of the main control unit;
  • the output terminal of the voltage comparison unit is connected to the input terminal of the timing unit
  • the output terminal of the timing unit is connected with the first input terminal of the voltage sampling unit; the output terminal of the voltage sampling unit is connected with the second input terminal of the main control unit;
  • the second output terminal of the main control unit is connected to the control terminal of the controllable switch
  • the main control unit When the number of i is 1, the main control unit will obtain the value of the spare inductance quality factor Q i obtained as the value of the inductance quality factor Q in the oscillation circuit, when the number of the oscillation circuit when i is greater than 1, the main control unit averaging values alternate inductor quality factor Q of the plurality of seek removed i, determining the quality factor of the inductance The value of Q.
  • the voltage comparison unit When the main control unit controls the controllable switch from the on state to the off state, so that the step voltage generation module generates the step voltage, the voltage comparison unit The second input terminal is connected to the negative terminal of the DC power supply.
  • Figure 1 shows the circuit connection mode that causes the step voltage generation module to generate the step voltage by controlling the controllable switch from the on state to the off state. After the circuit obtains the step voltage in this way, the waveform of the oscillating circuit produced is similar to that shown in Figure 2, and the oscillating waveform gradually approaches 0, reaching stability.
  • the second input terminal of the voltage comparison unit is connected to the negative terminal (ie, the ground terminal GND) of the DC power supply.
  • the voltage comparison unit When the main control unit controls the controllable switch from the off state to the on state, so that the step voltage generation module generates the step voltage, the voltage comparison unit The second input terminal is connected to the positive terminal of the DC power supply.
  • the circuit can also be formed in this way. Since the circuit composition is similar to the circuit composition in FIG. 1, the difference is only in the circuit formed in this way, the second input terminal of the voltage comparison unit is The positive terminal of the DC power supply is connected, therefore, the schematic diagram of the circuit structure of another embodiment is not drawn.
  • the voltage sampling unit is an analog/digital converter (ie, analog-to-digital converter ADC).
  • the voltage comparison unit compares the oscillating voltage generated by the oscillating circuit with the reference voltage generated by the DC power supply. When the oscillating voltage is greater than the reference voltage, the voltage The comparing unit outputs a high level, and when the oscillating voltage is less than the reference voltage, the voltage comparing unit outputs a low level;
  • the controllable switch changes from the on state to the off state, and the second input terminal of the voltage comparison unit is connected to the negative terminal of the DC power supply. Therefore, the reference voltage is 0( That is, the ground GND voltage value). If the controllable switch is changed from the off state to the on state, the second input terminal of the voltage comparison unit is connected to the positive terminal of the DC power supply, then the reference voltage is the voltage of the positive terminal of the DC power supply , That is, the voltage value of V1.
  • the timing unit determines the oscillation period T by measuring the interval between two adjacent rising edges output by the voltage comparison unit, or by measuring the two output times of the voltage comparison unit The interval between adjacent falling edges determines the oscillation period T;
  • the main control unit controls the voltage sampling unit to sample the output voltage of the oscillating circuit in several cycles preset by the system, and determines the voltage value according to the sampled voltage value.
  • peak oscillation circuit with a period corresponding to point t i - the peak voltage v pp (t i), and a period after the point adjacent to t i
  • a voltage sampling unit for controlling the oscillation circuit to said output peak voltage of voltage sampled again, and after a determined period t i and the point adjacent to the voltage value obtained by sampling again - peak voltage v pp (t i + T) , the point t i and the
  • the main control unit executes the following steps in a preset period of each system:
  • the main control unit controls the voltage sampling unit at t i , t i +T, The output voltage of the oscillating circuit is sampled at one point to obtain the voltage value v 2 (t i ), v 2 (t i +T) and
  • the main control unit obtains the value of the inductance quality factor Q i according to the formula 2 to obtain the value of the inductance quality factor Q in the oscillation circuit;
  • i is a natural number, and the number of i is preset by the system.
  • the main control unit will obtain the value of the spare inductor quality factor Q i
  • the main control unit calculates the value of the plurality of spare inductor quality factors Q i The values are averaged to determine the value of the quality factor Q of the inductor in the oscillation circuit.
  • the above circuit can also be used for measurement; when the circuit in this embodiment is used for measurement, the following steps are performed:
  • the voltage comparison unit compares the oscillating voltage generated by the oscillating circuit with the reference voltage generated by the DC power supply. When the oscillating voltage is greater than the reference voltage, the voltage The comparing unit outputs a high level, and when the oscillating voltage is less than the reference voltage, the voltage comparing unit outputs a low level;
  • the timing unit determines the oscillation period T by measuring the interval between two adjacent rising edges output by the voltage comparison unit, or by measuring the two output times of the voltage comparison unit The interval between adjacent falling edges determines the oscillation period T;
  • the main control unit controls the voltage sampling unit to perform voltage sampling on the output voltage of the oscillating circuit in a predetermined number of cycles in the system, and obtains that the oscillating circuit is at point ti
  • the voltage value v C (t i ) of, and control the voltage sampling unit to sample the output voltage of the oscillating circuit again when an oscillation period T is separated from the point t i to obtain the oscillating circuit in t i + T point voltage value v C (t i + T) , the point of oscillation t i of the oscillation circuit corresponding to peaks or troughs within the system preset period of time corresponding to point Specifically including the following steps:
  • the main control unit executes the following steps in a preset period of each system:
  • control means controlling the voltage at point t i is the output voltage of the sampling unit of the oscillation circuit is a voltage sampling, to obtain a voltage value v C of the oscillation circuit at point t i (t i );
  • said main control unit (B4.2) samples the output voltage of the voltage of the oscillation circuit voltage sampling point t i + T cells of the control, to obtain the oscillation circuit at point t i + T Voltage value v C (t i +T);
  • the main control unit obtains the value of the inductance quality factor Q i according to the formula 1 to obtain the value of the inductance quality factor Q in the oscillation circuit;
  • i is a natural number, and the number of i is preset by the system.
  • the main control unit will obtain the value of the spare inductor quality factor Q i
  • the main control unit calculates the value of the plurality of spare inductor quality factors Q i The values are averaged to determine the value of the quality factor Q of the inductor in the oscillation circuit.
  • the voltage value of the part that starts to oscillate is larger. Therefore, it is more convenient to measure the voltage by choosing the time point close to the beginning of the oscillation during the measurement process. Therefore, it is more convenient to measure the voltage during actual operation. Alternatively voltage starts to oscillate close to the measurement point t i.
  • the formula derivation process is as follows (in order to facilitate the description, the following derivation process is only for obtaining The value of the quality factor Q of the primary inductor is explained, that is, only one relevant parameter corresponding to point t is selected from each t i to obtain):
  • Fig. 3 is the model diagram of the RLC series circuit
  • Us is a voltage source
  • i(t) represents the current current value
  • Fig. 4 is the equivalent schematic diagram of the switch at point b in Fig. 3, according to Kirchhoff’s voltage law (KVL ), it can be seen that the circuit in Figure 3 can be represented by Equation 3:
  • v R , v L , and v C are the voltages across the resistor R, the inductor L, and the capacitor C, respectively.
  • R represents the resistance value of the resistor R
  • C represents the capacitance value of the capacitor C
  • L represents the inductance value of the inductor L
  • v L (t) represents the voltage at the inductor L
  • equation 5 is the differential equation of motion for damped oscillation:
  • the attenuation factor ⁇ determines the attenuation characteristics of the voltage and current during the discharge process.
  • the attenuation factor ⁇ can be obtained by the following formula 6-1, and the circuit
  • the angular frequency ⁇ 0 in can be obtained by the following equations 6-2 and 6-3, and the details are as follows:
  • f is the oscillation frequency
  • Equation 7 The general solution of Equation 7 is:
  • over-damped oscillation there are three main situations, namely over-damped oscillation, critically damped oscillation and under-damped oscillation.
  • the oscillation process of underdamped oscillation is an attenuated oscillation curve (see Figure 2 for the oscillation trend of the oscillation process of underdamped oscillation).
  • the resonance circuit used in the present invention is an underdamped oscillation circuit, that is, an oscillation circuit with ⁇ 0 is selected.
  • the time variation characteristic parameters of the voltage value of the inductor in the circuit are:
  • a and It is a undetermined constant, which is determined by the initial conditions.
  • T is the period of the oscillating signal. From Equation 10, the proportional relationship between the amplitude changes before and after the resonant circuit after an interval of one oscillation period T can be known.
  • Equation 10 find the logarithmic expression with e as the base, that is, take the logarithm of both sides of the equation of Equation 10 to obtain Equation 11:
  • the formula for calculating the value of the inductance quality factor Q is:
  • Equation 13 If the formula in Equation 13 is to be used to obtain the value of the inductor quality factor Q, it is necessary to obtain the logarithmic value of the voltage ratio separated by an oscillation signal period T, although the voltage of the oscillation signal is applied to ADC (ADC, Analog-to-Digital Converter).
  • ADC Analog-to-Digital Converter
  • the abbreviation for A/D converter or A/D converter can be obtained by sampling, but the logarithmic calculation is more complicated.
  • ⁇ T when the value of ⁇ T is less than 0.2, ⁇ T and 1-e - ⁇ T can be approximately equal.
  • Equation 16 When using the formula in Equation 16 to calculate the value of the inductor quality factor Q, there is no need to perform complex logarithmic calculations, and the measurement is performed through the analog-to-digital converter ADC. In combination with Equation 16, simple four arithmetic operations can be used to calculate the inductance. The value of the quality factor Q has lower requirements on the main control module.
  • the above formula 2 can be derived by combining the contents of the above formula 14, formula 16 and Table 1, and the above formula 2 can be derived by combining the above formula 15, formula 16 and the content of Table 1.
  • the inductor L and the capacitor C are selected to form an oscillating circuit, and the output voltage of the oscillating circuit is V2; a DC power supply Q1 and a controllable switch K are used to form a step voltage generation module, and the voltage output from the positive terminal of the DC power supply Q1 It is V1; the relatively strong Q2 is used to form the voltage comparison unit, the timer Q3 is used to form the timing unit, the analog/digital converter Q5 (analog-to-digital converter ADC) forms the voltage sampling unit, and the main controller Q4 forms the main control unit.
  • V1 the relatively strong Q2 is used to form the voltage comparison unit
  • the timer Q3 is used to form the timing unit
  • the analog/digital converter Q5 analog-to-digital converter ADC
  • the main controller Q4 forms the main control unit.
  • the step voltage generation module When the main control unit controls the controllable switch from the on state to the off state, the step voltage generation module generates the step voltage, and adopts When performing measurement, the circuit in Figure 1 can be used for measurement, and the measurement process is as follows:
  • the main control chip Q4 controls the switch K from closed to open (that is, from the on state to the off state), and provides a step signal from the power supply voltage V1 to the ground to the oscillating circuit composed of the inductor L and the capacitor C, At this time, there is a damped oscillation signal between the inductor L and the capacitor C in the oscillating circuit. Its voltage is V2, and its maximum amplitude is the power supply voltage V1. During the oscillation process, the oscillation voltage V2 oscillates above and below 0, and eventually tends to 0 ;
  • the first oscillation decay process can be used to determine the period of damped oscillation. As shown in Figure 1, connect GND (ie the voltage at the negative terminal of the DC power supply) and V2 to the comparator Q2, compare the sizes of the two, when When V2>GND, the comparator outputs a high level, when V2 ⁇ GND, the comparator outputs a low level; (If the main control chip Q4 controls the switch K from open to closed and provides a step signal, the corresponding work The principle remains the same, but V2 is compared with V1. During the oscillation process, the oscillating voltage V2 oscillates above and below V1, and eventually tends to V1, so it will not be repeated here).
  • the timer Q3 By outputting two rising edges or two falling edges of the square wave signal, the timer Q3 outputs to the period T, and the damped oscillation frequency can be calculated according to the period T;
  • the main control chip Q4 clocks from the rising or falling edge of the square wave
  • the voltage v 2 (t) at the current time point is obtained by sampling the ADC Q5 of the analog-to-digital converter, and the time is up Get the voltage at the current time point by sampling the ADC Q5 Peak-to-peak value obtained by calculation Time is up
  • the voltage v 2 (t+T) at the current time point is obtained by sampling the analog-to-digital converter ADC Q5, and the time is up Get the voltage at the current time point by sampling the ADC Q5 Peak-to-peak value obtained by calculation
  • the step voltage generation module When the main control unit controls the controllable switch from the on state to the off state, the step voltage generation module generates the step voltage, and adopts When measuring, the circuit in Figure 1 can also be used for measurement, and the measurement process is as follows:
  • the main control chip Q4 controls the switch K from closed to open (that is, from the on state to the off state), and provides a step signal from the power supply voltage V1 to the ground to the oscillation circuit composed of L and C.
  • a damped oscillation signal between the oscillation circuits L and C, the voltage of which is V2, and its maximum amplitude is the power supply voltage V1.
  • the oscillation voltage V2 oscillates above and below 0, and eventually tends to 0;
  • the first oscillation decay process can be used to determine the period of damped oscillation. As shown in Figure 1, connect GND (ie the voltage at the negative terminal of the DC power supply) and V2 to the comparator Q2, compare the sizes of the two, when When V2>GND, the comparator outputs a high level, when V2 ⁇ GND, the comparator outputs a low level; (If the main control chip Q4 controls the switch K from open to closed and provides a step signal, the corresponding work The principle remains the same, but compares V2 with V1. During the oscillation process, the oscillating voltage V2 oscillates above and below V1, and finally tends to V1, so it will not be repeated here).
  • the timer Q3 By outputting two rising edges or two falling edges of the square wave signal, the timer Q3 outputs to the period T, and the damped oscillation frequency can be calculated according to the period T;
  • the step signal formed by the DC power supply voltage V1 in the present invention can be a step up to the ground or a step down to the ground.
  • the circuit difference between the two types of steps is only at the second input terminal of the voltage comparison unit. Whether it is connected to the negative terminal of the DC power supply or the positive terminal of the DC power supply, the other structure of the circuit is basically the same, so that the quality factor Q value of the inductance can be obtained through the corresponding measurement process.
  • the magnitude of the DC power supply voltage V1 in the present invention can also be adjusted according to the actual situation, but it is recommended to provide as small a voltage as possible (less than 10V is more appropriate) to improve the cost performance of the circuit.
  • the circuit structure adopted is relatively simple, and the calculation is relatively simple and flexible.
  • the inductor quality factor Q can be calculated according to the system For the accuracy requirements of the value of the inductance, the value of the quality factor Q of the inductance calculated in a certain cycle can be obtained as the final measurement result, and the multiple cycles in the oscillation process of the oscillation circuit can also be measured to obtain multiple cycles. The value of the quality factor Q of the inductor, and then after the oscillation is over, the calculated values of the quality factor Q of each inductor are averaged, and the final value of the inductor quality factor Q is finally obtained to obtain a more accurate value.
  • the corresponding measurement circuit and its application by giving the oscillating circuit a step voltage, the oscillating circuit is caused to perform under-damped oscillation, through or
  • the value of the spare inductance quality factor Q i can be calculated by simple four arithmetic operations, and then the inductance in the oscillation circuit can be determined by averaging the values of the calculated spare inductance quality factor Q i The value of the quality factor Q.
  • the inductance quality factor measurement method of the present invention the corresponding measurement circuit and its application are used to measure the voltage parameters at several points in the test process, and then the quality factor Q of the inductance in the oscillation circuit can be obtained by simple four arithmetic operations Value, lower requirements on the circuit, effectively saving the measurement cost, but also making the measurement process simpler.

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  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Inductance-Capacitance Distribution Constants And Capacitance-Resistance Oscillators (AREA)

Abstract

La présente invention se rapporte à un procédé de mesure de facteur de qualité d'inductance, un circuit de mesure correspondant et une application associée. Une tension de pas est fournie à un circuit oscillant afin d'amener le circuit oscillant à effectuer une oscillation sous-amortie, une valeur d'un facteur de qualité d'inductance de secours Qi peut être calculée au moyen de l'exécution d'une opération arithmétique élémentaire simple sur la formule (I) ou la formule (II), puis une valeur d'un facteur de qualité d'inductance Q dans le circuit oscillant peut être déterminée au moyen de la moyenne des valeurs obtenues de plusieurs facteurs de qualité d'inductance de secours Qi. Le procédé de mesure du facteur de qualité d'inductance, le circuit de mesure correspondant et l'application associée sont utilisés pour mesurer des paramètres de tension en plusieurs points pendant l'essai, puis une valeur d'un facteur de qualité Q d'une inductance dans un circuit oscillant peut être obtenue au moyen d'une opération arithmétique élémentaire simple. Ainsi, les exigences sur le circuit sont plus faibles, les coûts de mesure sont efficacement réduits et le processus de mesure est également simplifié.
PCT/CN2020/117474 2019-09-24 2020-09-24 Procédé de mesure de facteur de qualité d'inductance, circuit de mesure correspondant et application associée WO2021057849A1 (fr)

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