WO2020237888A1 - 显示面板及其检测方式 - Google Patents

显示面板及其检测方式 Download PDF

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Publication number
WO2020237888A1
WO2020237888A1 PCT/CN2019/103784 CN2019103784W WO2020237888A1 WO 2020237888 A1 WO2020237888 A1 WO 2020237888A1 CN 2019103784 W CN2019103784 W CN 2019103784W WO 2020237888 A1 WO2020237888 A1 WO 2020237888A1
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WIPO (PCT)
Prior art keywords
display panel
lines
electrode
test
electrically connected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2019/103784
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English (en)
French (fr)
Inventor
奚苏萍
王添鸿
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen China Star Optoelectronics Semiconductor Display Technology Co Ltd
Original Assignee
Shenzhen China Star Optoelectronics Semiconductor Display Technology Co Ltd
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Publication of WO2020237888A1 publication Critical patent/WO2020237888A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3648—Control of matrices with row and column drivers using an active matrix
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Definitions

  • the invention relates to a display panel and a detection method thereof, in particular to a data line signal line routing design which is beneficial to the analysis and repair of the panel.
  • the active liquid crystal display panel is usually composed of an array substrate, a color filter substrate and a liquid crystal layer. Wherein, multiple scan lines (Gate lines) and data lines (Data lines) are alternately arranged on the array substrate to form multiple pixel regions.
  • GOA Gate Driver On Array
  • Figure 1 is a schematic diagram of electrode routing of a display panel 1 with a conventional resolution of UD (3840 x 2160). It has 2160 scan lines G1, G2, G3,..., G2159, G2160, and 3840 data lines D1, D2, and D2. D3,..., D3840. As shown in Figure 1, the 2160 scan lines are respectively connected to the effective display area 14, and the Data line signal line from the control board (C-board) 11 first passes through the drive boards (X-board) 121 and 122, and then Enter the effective display area 14 through the wire on array (WOA) 13.
  • C-board Control board
  • the data line signal lines from the X-board 121 and 122 will be routed through WOA first, and then each data line signal line will be converted into data lines D1, D2, D3 after passing through the hole ,..., D3840, and finally input to the AA area.
  • the gate line signal lines G1, G2, G3,..., G2159, G2160 will also be input to the effective display area 14.
  • the most intuitive method is to observe the waveform of each level of the gate line; at the same time, how to determine whether it is a certain level Data If there is a problem with the line signal line, the most intuitive method is to detect the data line waveform and compare and then judge.
  • the conventional panel signal line routing is not conducive to the analysis of this design.
  • the purpose of the present invention is to provide a display panel and a detection method thereof.
  • the display panel has a new data line routing design scheme. Based on the original data line signal line routing, the data line The line signal is designed for proper routing, and the Gate line waveform and Data line waveform of the required number of stages can be detected according to the requirements, so that the circuit is conducive to analysis.
  • the present invention provides a display panel, including; a control board; a first drive board electrically connected to the control board; a plurality of first connecting lines electrically connected to the first drive board Connection; multiple horizontal scan lines (gate lines) are arranged alternately with a plurality of longitudinal data lines, wherein the data line is connected to the first connection line on the first side of the display panel; a horizontal test electrode is arranged on the display panel The second side of the display panel is vertically intersected with the data line, wherein the first side is opposite to the second side; a first longitudinal test electrode is disposed on the third side of the display panel and is connected to the The scan lines are staggered vertically, wherein the horizontal test electrode and the first vertical test electrode are electrically connected; and a first floating electrode having an end point is electrically connected to the first driving board.
  • the present invention also provides a panel detection method, including the following steps:
  • S10 provides a display panel, including: a control board; a first drive board, which is electrically connected to the control board; a plurality of first connection lines, which are electrically connected to the first drive board; and a plurality of horizontal scanning lines Line (gate lines) are arranged alternately with a plurality of longitudinal data lines, wherein the data line is connected to the first connection line on the first side of the display panel; a horizontal test electrode is arranged on the display panel The second side of the display panel is perpendicular to the data line, wherein the first side is opposite to the second side; a first vertical test electrode is arranged on the third side of the display panel and is perpendicular to the scan line And the one first floating electrode having an end point electrically connected to the first driving board;
  • S40a collects the signals sent back to the control board to perform a waveform test on the data line.
  • the implementation sequence of steps S20a, S25a, and S30a can be adjusted arbitrarily.
  • the present invention further provides a panel detection method, including the following steps:
  • S10 provides a display panel, including: a control board; a first drive board, which is electrically connected to the control board; a plurality of first connection lines, which are electrically connected to the first drive board; and a plurality of horizontal scanning lines Line (gate lines) are arranged alternately with a plurality of longitudinal data lines, wherein the data lines are connected to the first connecting lines on the first side of the display area; a horizontal test electrode is arranged on the display panel The second side of the display panel is perpendicular to the data line, wherein the first side is opposite to the second side; a first vertical test electrode is arranged on the third side of the display panel and is perpendicular to the scan line And the one first floating electrode having an end point electrically connected to the first driving board;
  • S30b Use laser to weld the vertically interlaced first longitudinal test electrodes and a scanning line to form a welding point
  • S40b collects the signal sent back to the control board to perform a waveform test on the scan line.
  • the sequence of steps S20a and S30b can be adjusted arbitrarily.
  • the display panel further includes: a second driving board electrically connected to the control board; a plurality of second connecting lines electrically connected to the second driving board, wherein The plurality of second connecting lines and the second driving board are arranged on the first side of the display panel; the second vertical test electrode is arranged on the fourth side of the display panel and is perpendicular to the scan line Staggered, where the fourth side is opposite to the third side; and a second floating electrode having an end that is electrically connected to the second driving board.
  • the plurality of first connection lines, the first floating electrode, the plurality of horizontal scan lines, and the horizontal test electrode are located on a gate metal layer; and A plurality of vertical data lines and the first vertical test electrode are located on a source/drain metal layer, wherein the source/drain metal layer is located on the gate metal layer.
  • the display panel further includes: a first floating electrode pin, disposed on the control board, and connected to the first floating electrode.
  • the display panel further includes: a second floating electrode pin, which is disposed on the control board, and is connected to the second floating electrode.
  • the panel inspection method further includes the following steps:
  • S20b uses a laser to weld the other end of the second floating electrode and the second longitudinal test electrode
  • S30c Use laser to weld the vertically interleaved horizontal test electrodes and another data line, wherein the signal transmission between the other data line and the control board does not pass through the welding point in step S30a or S30b; and S40c Collect the signal sent back to the control board to perform a waveform test on the data line.
  • the sequence of steps S20b, S25b, and S30c can be adjusted arbitrarily.
  • the panel inspection method further includes the following steps:
  • S20b uses a laser to weld the other end of the second floating electrode and the second longitudinal test electrode
  • laser welding is used to weld the vertically interleaved second longitudinal test electrodes and another scanning line, wherein the signal transmission between the other scanning line and the control board does not pass through the welding point in step S30a or S30b; as well as
  • S40d collects the signal sent back to the control board to perform a waveform test on the scan line.
  • the order of implementation of steps S20b and S30d can be adjusted arbitrarily.
  • the display panel and its detection method provided by the present invention can not only detect the gate according to the demand through the new data line routing design scheme.
  • the line waveform can also detect the Data line waveform, which is convenient to quickly find the cause of the abnormality when the panel is abnormal.
  • Figure 1 is a schematic diagram of the electrode trace of a GOA with a conventional resolution of UD (3840 x 2160).
  • FIG. 2 is a schematic diagram of electrode wiring of a display panel according to an embodiment of the invention.
  • FIG 3 is a schematic side view of electrode traces of a display panel according to an embodiment of the invention.
  • FIG. 4 is a schematic diagram of electrode traces and signal lines during detection of a display panel according to an embodiment of the invention.
  • FIG. 5 is a schematic diagram of electrode traces and signal lines during inspection of a display panel according to another embodiment of the invention.
  • FIG. 6 is a flowchart of steps of a panel inspection method according to an embodiment of the invention.
  • FIG. 7 is a flowchart of steps of a panel inspection method according to another embodiment of the present invention.
  • FIG. 8 is a flowchart of the steps of a panel inspection method according to another embodiment of the present invention.
  • FIG. 9 is a flowchart of steps of a panel inspection method according to another embodiment of the present invention.
  • the present invention provides a display panel and a detection method thereof.
  • the display panel detection method panel has a new data line routing design scheme. Based on the original data line signal line routing, the data line The line signal is designed for proper routing, and the Gate line waveform and Data line waveform of the required number of stages can be detected according to the requirements, so that the circuit is conducive to analysis.
  • the present invention provides a display panel 2, including: a control board 21; a first drive board 221 electrically connected to the control board 21; a plurality of first connecting wires 231, and The first driving board 221 is electrically connected; a plurality of horizontal scan lines (Gate lines) G1, G2, G3, ..., Gn-1, Gn and a plurality of vertical data lines (Data lines) D1, D2, D3 ,..., Dn-1, Dn pass through a display area 24 and are alternately arranged in the display area 24, wherein the data lines D1, D2, D3,..., Dn-1, Dn are located on the first of the display area 24
  • One side is connected to the first connection line 231; a horizontal test electrode 25 is disposed on the second side of the display area 24 and is vertically intersected with the data lines D1, D2, D3, ..., Dn-1, The first side is opposite to the second side;
  • the display panel of the present invention may further include: a second driving board 222 electrically connected to the control board 21; a plurality of second connecting lines 232 electrically connected to the second driving board 222 Connection, wherein the plurality of second connecting wires 232 and the second driving board 222 are arranged on the first side of the display area 24; a second longitudinal test electrode 262 is arranged on the fourth side of the display area 24 Side, and perpendicular to the scan lines G1, G2, G3,..., Gn-1, Gn, where the fourth side is opposite to the third side; and a second floating electrode 272 having an end point and the first The two driving boards 222 are electrically connected.
  • the display panel may further include a first floating electrode pin (not shown), which is disposed on the control board 21 and connected to the first floating electrode 271. Furthermore, the display panel may further include a second floating electrode pin (not shown), which is disposed on the control board 21 and is connected to the second floating electrode.
  • FIG. 3 is a schematic side view of electrode traces of a display panel according to an embodiment of the invention.
  • the plurality of first connecting lines 231, the first floating electrode 271, and the plurality of horizontal scan lines G1, G2, G3 ,..., Gn-1, Gn, and the lateral test electrode 25 are located on a gate metal layer M1; and the plurality of longitudinal data lines D1, D2, D3,..., Dn-1, Dn and the first A vertical test electrode 261 is located on a source/drain metal layer M2, wherein the source/drain metal layer M2 is located on the gate metal layer M1.
  • FIG. 4 is a schematic diagram of electrode traces and signal lines during inspection of a display panel according to an embodiment of the present invention
  • FIG. 6 is a flowchart of steps of a panel inspection method according to an embodiment of the present invention. Referring to FIGS. 4 and 6 together, as shown in FIGS. 4 and 6, an embodiment of the present invention provides a panel inspection method, which includes the following steps:
  • S10 provides a display panel 2 including; a control board 21; a first driving board 221 electrically connected to the control board 11; a plurality of first connecting wires 231 electrically connected to the first driving board 221 ; Multiple horizontal scan lines (Gate lines) G1, G2, G3, ..., Gn-1, Gn and multiple vertical data lines (Data lines) D1, D2, D3, ..., Dn-1, Dn pass through one
  • the display area 24 is alternately arranged in the display area 24, wherein the data lines D1, D2, D3, ..., Dn-1, Dn are on the first side of the display area 24 and the first connecting line 231 Connection; a lateral test electrode 25, configured on the second side of the display area 24, and perpendicular to the data lines D1, D2, D3, ..., Dn-1, wherein the first side and the first side The two sides are opposite; a first vertical test electrode 261 is arranged on the third side of the display area 24, and is perpendicular to the scan lines G1, G2, G3, ...,
  • S25a Use a laser to weld the vertically interleaved horizontal test electrodes 25 and the first longitudinal test electrodes 261 to form a welding point P3;
  • S40a collects the signal sent back to the control board 21 to perform a waveform test on the data line (not labeled in the figure).
  • the order of implementation of steps S20a, S25a, and S30a can be adjusted arbitrarily.
  • FIGS. 4 and 6 specifically describe a method that can quickly determine whether the GOA circuit has a problem and make the circuit easier to analyze.
  • the method can directly observe the data that requires the number of stages.
  • the waveform of the line is used to determine whether there is a problem with the data line signal line of a certain level.
  • the transverse test electrodes and data lines that have been laser welded can be further laser fused, and other data lines can be continuously performed row by row.
  • Line or Gate line waveform test, other selected Data above The signal routing of the welding point of the line or gate line and the test electrode must be located between the previous laser fuse point and the control board, and not pass the previous laser fuse point.
  • FIG. 5 is a schematic diagram of electrode traces and signal lines during inspection of a display panel according to another embodiment of the present invention
  • FIG. 7 is a flowchart of steps of a panel inspection method according to another embodiment of the present invention. Referring to FIGS. 5 and 7 together, as shown in FIGS. 5 and 7, another embodiment of the present invention provides a panel inspection method, which includes the following steps:
  • S10 provides a display panel 2, the detailed structure of which is the same as the foregoing embodiment, and will not be repeated here;
  • S30b Laser welding is used to weld the vertically interlaced first longitudinal test electrodes 261 and a scanning line G3 to form a welding point P2;
  • S40b collects the signals sent back to the control board 21 to perform a waveform test on the scan line G3.
  • Fig. 5 and Fig. 7 specifically describe a method that can quickly determine whether the GOA circuit has a problem, so that the circuit is conducive to analysis.
  • the method can directly observe the gate of the required number of stages.
  • the waveform of the line is used to determine whether there is a problem with the signal line of a certain gate line.
  • the lateral test electrodes and data lines that have been laser welded can be further laser fused, and other Gate line waveform tests are performed column by column.
  • the signal traces for the welding points of other selected gate lines and test electrodes must be located between the previous laser fuse point and the control board, and do not pass through the previous laser fuse point.
  • FIG. 8 is a flowchart of the steps of a panel inspection method according to another embodiment of the present invention. Referring to FIGS. 4 and 8 together, as shown in FIGS. 4 and 8, another embodiment of the present invention provides a panel inspection method, which further includes the following steps:
  • S20b uses a laser to weld the other end of the second floating electrode 272 and the second longitudinal test electrode 262 to form a welding point P5;
  • S30c Use a laser to weld the vertically interleaved horizontal test electrodes 25 and another data line (not numbered in the figure), wherein the signal transmission between the other data line (not numbered in the figure) and the control board 21 does not go through steps The welding point P4 or P2 in S30a or S30b; and
  • S40c collects the signal sent back to the control board to perform a waveform test on the data line (not labeled in the figure).
  • the order of implementation of steps S20b, S25b, and S30c can be adjusted arbitrarily.
  • Line or Gate line for waveform test.
  • the horizontal test electrode and the data line that have been welded by the laser can be further laser fused, and continue to perform other data line by line.
  • Line or Gate line waveform test other selected Data above The signal routing of the welding point of the line or gate line and the test electrode must be located between the previous laser fuse point and the control board, and not pass the previous laser fuse point.
  • FIG. 9 is a flowchart of steps of a panel inspection method according to still another embodiment of the present invention. Referring to FIGS. 5 and 9 together, as shown in FIGS. 5 and 9, yet another embodiment of the present invention provides a panel inspection method, which further includes the following steps:
  • S20b uses a laser to weld the other end of the second floating electrode 272 and the second longitudinal test electrode 262 to form a welding point P5;
  • S30d uses laser welding to weld the vertically interlaced second longitudinal test electrodes 262 and another scan line (not shown), wherein the signal between the other scan line (not shown) and the control board does not pass through The welding point P4 or P2 in step S30a or S30b;
  • S40d collects the signal sent back to the control board 21 to perform a waveform test on the scan line (not shown).
  • the order of implementation of steps S20b and S30d can be adjusted arbitrarily.
  • gate lines are selected for waveform testing
  • those skilled in the art can select gate lines of other levels according to the panel inspection method of the present invention.
  • Line performs waveform test.
  • the transverse test electrode and the data line that have been welded by the laser can be further laser fused, and other gate line waveform tests are performed column by column.
  • the other gate lines are selected as above.
  • the signal routing of the welding point with the test electrode must be located between the previous laser fuse point and the control board, and not pass the previous laser fuse point.
  • the panel inspection method provided by the embodiment of the present invention can simultaneously perform one, two or more levels of Gate line and/or Data line waveform testing, and conduct a specific level of Gate line and/or Data line waveform test.
  • the horizontal test electrode and the gate electrode that have been welded by the laser can be further line and/or Data Line laser fuse, continue to perform other Gate line and/or Data line waveform tests column by column to make the circuit easier to analyze.

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  • Engineering & Computer Science (AREA)
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  • Crystallography & Structural Chemistry (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Electroluminescent Light Sources (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)

Abstract

一种显示面板（2）及其检测方式，显示面板（2）包括：多条第一连接线（231）；多条横向的扫描线（G1、G2、G3、…、Gn-1、Gn）与多条纵向的数据线（D1、D2、D3、…、Dn-1、Dn）交错配置，其中数据线（D1、D2、D3、…、Dn-1、Dn）于显示面板（2）之第一侧与第一连接线（231）连接；一第一纵向测试电极（261），配置于显示面板（2）的第三侧，并与扫描线（G1、G2、G3、…、Gn-1、Gn）垂直交错；以及一第一浮空电极（271），具有一端点与第一驱动板（221）电性连接。

Description

显示面板及其检测方式 技术领域
本发明涉及一种显示面板及其检测方式，尤其涉及一种有利于解析及修复面板的数据线讯号线走线设计。
 背景技术
主动式液晶显示面板通常由阵列基板、彩色滤光片基板和液晶层组成。其中，阵列基板上交错布置多条扫描线(Gate line)和数据线(Data line)以形成多个像素区域。
阵列基板行驱动技术(Gate Driver On Array，简称GOA)，也就是利用现有薄膜晶体管液晶显示器中的阵列基板(Array)制程将扫描驱动信号电路制作在阵列基板上，实现对扫描线(Gate line)逐行扫描的驱动方式。
图1是一个常规分辨率为UD (3840 x2160)的显示面板1的电极走线示意图，它有2160级扫描线G1、G2、G3、…、G2159、G2160，以及3840条数据线D1、D2、D3、…、D3840。如图1所示，其中2160级扫描线分别接入到有效显示区14，以及从控制板(C-board)11出来的Data line讯号线先经过驱动板(X-board)121、122，再经过连接线(wire on array，WOA) 13进入到有效显示区14。如图1所示，从驱动板(X-board)121、122出来的Data line讯号线会先经过WOA走线，然后每根Data line讯号线经过孔后会转成数据线D1、D2、D3、…、D3840，最后输入到AA区。同样的，如图1所示， Gate line讯号线 G1、G2、G3、…、G2159、G2160也会输入到有效显示区14。
当面板出现显示异常时，需要采用多方面手段对面板进行解析，找出异常的原因，但是随着面板尺寸的不断变大，很难很迅速地找出问题的根源。为了快速找出原因，判断是否是GOA 电路出现问题，最直观的手段就是观测每一级Gate line的波形；同时，如何判断是否是某级数 Data line讯号线出现问题，最直观的方法也是通过探测Data line波形进行比对然后来判断，常规的面板讯号线走线没有利于解析这方面的设计。
 技术问题
为了解决现有技术所存在的问题，有必要进行新的走线设计，从而使其不仅可以根据需求探测Gate line波形，还能够探测Data line波形，方便在面板出现异常时，快速找出异常原因。
 技术解决方案
基于上述，本发明的目的在于提供了一种显示面板及其检测方式，所述显示面板具有一种新型的Data line走线设计方案，在原有Data line讯号线走线基础上，通过对Data line讯号进行合适的走线设计，可以根据需求探测所需要级数的Gate line波形及Data line波形，使电路利于解析。
为了实现上述目的，本发明提供一种显示面板，包括；一控制板；一第一驱动板，与所述控制板电性连接；多条第一连接线，与所述第一驱动板电性连接；多条横向的扫描线(gate lines)与多条纵向的数据线(data lines)交错配置，其中所述数据线于所述显示面板之第一侧与所述第一连接线连接；一横向测试电极，配置于所述显示面板的第二侧，并与所述数据线垂直交错，其中所述第一侧与所述第二侧相对；一第一纵向测试电极，配置于所述显示面板的第三侧，并与所述扫描线垂直交错，其中所述横向测试电极及所述第一纵向测试电极电性相接；以及一第一浮空电极，具有一端点与所述第一驱动板电性连接。
本发明另提供了一种面板检测方式，包括以下步骤：
S10 提供一显示面板，包括：一控制板；一第一驱动板，与所述控制板电性连接；多条第一连接线，与所述第一驱动板电性连接；多条横向的扫描线(gate lines)与多条纵向的数据线(data lines)交错配置，其中所述数据线于所述显示面板之第一侧与所述第一连接线连接；一横向测试电极，配置于所述显示面板的第二侧，并与所述数据线垂直交错，其中第一侧与第二侧相对；一第一纵向测试电极，配置于所述显示面板的第三侧，并与所述扫描线垂直交错；以及所述一第一浮空电极，具有一端点与所述第一驱动板电性连接；
S20a 利用激光熔接所述第一浮空电极之另一端点及所述第一纵向测试电极；
S25a 利用激光熔接垂直交错的所述横向测试电极及所述第一纵向测试电极；
S30a 利用激光熔接垂直交错的所述横向测试电极及一数据线，形成一熔接点；以及
S40a 收集传回所述控制板的讯号，以对所述数据线进行波形测试。
依据本发明的一实施例，在所述面板检测方法中，步骤S20a、S25a、S30a的实施先后顺序可任意调整。
本发明再提供了一种面板检测方式，包括以下步骤：
S10 提供一显示面板，包括：一控制板；一第一驱动板，与所述控制板电性连接；多条第一连接线，与所述第一驱动板电性连接；多条横向的扫描线(gate lines)与多条纵向的数据线(data lines)交错配置，其中所述数据线于所述显示区之第一侧与所述第一连接线连接；一横向测试电极，配置于所述显示面板的第二侧，并与所述数据线垂直交错，其中第一侧与第二侧相对；一第一纵向测试电极，配置于所述显示面板的第三侧，并与所述扫描线垂直交错；以及所述一第一浮空电极，具有一端点与所述第一驱动板电性连接；
S20a 利用激光熔接所述第一浮空电极之另一端点及所述第一纵向测试电极；
S30b 利用激光熔接垂直交错的所述第一纵向测试电极及一扫描线，形成一熔接点；以及
S40b 收集传回所述控制板的讯号，以对所述扫描线进行波形测试。
依据本发明的一实施例，在所述面板检测方法中，步骤S20a、S30b的实施先后顺序可任意调整。
依据本发明的一实施例，所述显示面板，更包括：一第二驱动板，与所述控制板电性连接；多条第二连接线，与所述第二驱动板电性连接，其中所述多条第二连接线与所述第二驱动板配置于所述显示面板之第一侧；第二纵向测试电极，配置于所述显示面板之第四侧，并与所述扫描线垂直交错，其中第四侧与第三侧相对；以及一第二浮空电极，具有一端点与所述第二驱动板电性连接。
依据本发明的一实施例，所述多条第一连接线、所述第一浮空电极、所述多条横向的扫描线、以及所述横向测试电极位于一闸极金属层；以及所述多条纵向的数据线及所述第一纵向测试电极位于一源极/漏极金属层，其中所述源极/漏极金属层位于所述闸极金属层之上。
依据本发明的另一实施例，所述显示面板，更包括：一第一浮空电极引脚，配置于所述控制板上，与所述第一浮空电极相接。
依据本发明的又一实施例，所述显示面板，更包括：一第二浮空电极引脚，配置于所述控制板上，与所述第二浮空电极相接。
依据本发明的再一实施例，所述面板检测方式更包括以下步骤：
S20b 利用激光熔接所述第二浮空电极之另一端点及所述第二纵向测试电极;
S25b 利用激光熔接垂直交错的所述横向测试电极及所述第二纵向测试电极；
S30c 利用激光熔接垂直交错的所述横向测试电极及另一数据线，其中所述另一数据线与所述控制板之间的讯号传送不经过步骤S30a或S30b中的所述熔接点；以及S40c 收集传回所述控制板的讯号，以对所述数据线进行波形测试。
依据本发明的一实施例，在所述面板检测方法中，步骤S20b、S25b、S30c的实施先后顺序可任意调整。
依据本发明的另一实施例，所述面板检测方式，更包括以下步骤；
S20b 利用激光熔接所述第二浮空电极之另一端点及所述第二纵向测试电极;
S30d 利用激光熔接垂直交错的所述第二纵向测试电极及另一扫描线，其中所述另一扫描线与所述控制板之间的讯号传送不经过步骤S30a或S30b中的所述熔接点；以及
S40d 收集传回所述控制板的讯号，以对所述扫描线进行波形测试。
依据本发明的一实施例，在所述面板检测方法中，步骤S20b、S30d的实施先后顺序可任意调整。
 有益效果
本发明所提供之一种显示面板及其检测方式，通过新型的Data line走线设计方案，不仅可以根据需求探测Gate line波形，还能够探测Data line波形，方便在面板出现异常时，快速找出异常原因。
 附图说明
为了更清楚地说明实施例或现有技术中的技术方案，下面将对实施例或现有技术描述中所需要使用的附图作简单介绍，显而易见地，下面描述中的附图仅仅是发明的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
图1为一个常规分辨率为UD (3840 x2160)的GOA的电极走线示意图。
图2为依据本发明一实施例之显示面板的电极走线示意图。
图3为依据本发明一实施例之显示面板的电极走线的侧视示意图。
图4为依据本发明一实施例之显示面板进行检测时的电极走线及讯号线示意图。
图5为依据本发明另一实施例之显示面板进行检测时的电极走线及讯号线示意图。
图6为依据本发明一实施例之面板检测方式的步骤流程图。
图7为依据本发明另一实施例之面板检测方式的步骤流程图。
图8为依据本发明又一实施例之面板检测方式的步骤流程图。
图9为依据本发明再一实施例之面板检测方式的步骤流程图。
 本发明的最佳实施方式
为让本发明的上述内容能更明显易懂，下文特举优选实施例，并配合所附图式作详细说明。
以下各实施例的说明是参考附加的图示，用以例示本发明可用以实施的特定实施例。本发明所提到的方向用语，例如[纵向]、[横向]、[上]、[下]、[前]、[后]、[左]、[右]、[内]、[外]、[侧面]等，仅是参考附加图式的方向。因此，使用的方向用语是用以说明及理解本发明，而非用以限制本发明。在图中，结构相似的单元是用以相同标号表示。
本发明提供了一种显示面板及其检测方式，所述显示面板检测方式面板具有一种新型的Data line走线设计方案，在原有Data line讯号线走线基础上，通过对Data line讯号进行合适的走线设计，可以根据需求探测所需要级数的Gate line波形及Data line波形，使电路利于解析。
图2为依据本发明的一实施例之显示面板的电极走线示意图。具体的，如图2所示，本发明提供一显示面板2，包括:一控制板21；一第一驱动板221，与所述控制板21电性连接；多条第一连接线231，与所述第一驱动板221电性连接；多条横向的扫描线(Gate lines)G1、G2、G3、…、Gn-1、Gn与多条纵向的数据线(Data lines)D1、D2、D3、…、Dn-1、Dn通过一显示区24，并于所述显示区24交错配置，其中所述数据线D1、D2、D3、…、Dn-1、Dn于所述显示区24之第一侧与所述第一连接线231连接；一横向测试电极25，配置于所述显示区24的第二侧，并与所述数据线D1、D2、D3、…、Dn-1垂直交错，其中所述第一侧与所述第二侧相对；一第一纵向测试电极261，配置于所述显示区24的第三侧，并与所述扫描线G1、G2、G3、…、Gn-1、Gn垂直交错，其中所述横向测试电极25及所述第一纵向测试电极261电性相接；以及一第一浮空电极271，具有一端点与所述第一驱动板221电性连接。
如图2所示，本发明之显示面板可更包括：一第二驱动板222，与所述控制板21电性连接；多条第二连接线232，与所述第二驱动板222电性连接，其中所述多条第二连接线232与所述第二驱动板222配置于所述显示区24之第一侧；一第二纵向测试电极262，配置于所述显示区24之第四侧，并与所述扫描线G1、G2、G3、…、Gn-1、Gn垂直交错，其中第四侧与第三侧相对；以及一第二浮空电极272，具有一端点与所述第二驱动板222电性连接。
进一步地，所述显示面板可更包括一第一浮空电极引脚(图未示)，配置于所述控制板21上，与所述第一浮空电极271相接。再者，所述显示面板可更包括一第二浮空电极引脚(图未示)，配置于所述控制板21上，与所述第二浮空电极相接。
图3为依据本发明一实施例之显示面板的电极走线的侧视示意图。具体的，如图3所示，在本发明之显示面板2中，所述多条第一连接线231、所述第一浮空电极271、所述多条横向的扫描线G1、G2、G3、…、Gn-1、Gn、以及所述横向测试电极25位于一闸极金属层M1；以及所述多条纵向的数据线D1、D2、D3、…、Dn-1、Dn及所述第一纵向测试电极261位于一源极/漏极金属层M2，其中所述源极/漏极金属层M2位于所述闸极金属层M1之上。
图4为依据本发明的一实施例之显示面板进行检测时的电极走线及讯号线示意图；图6为依据本发明一实施例之面板检测方式的步骤流程图。一并参见图4及图6，如图4及图6所示，本发明一实施例提供一种面板检测方式，包括以下步骤：
S10 提供一显示面板2，包括；一控制板21；一第一驱动板221，与所述控制板11电性连接；多条第一连接线231，与所述第一驱动板221电性连接；多条横向的扫描线(Gate lines) G1、G2、G3、…、Gn-1、Gn与多条纵向的数据线(Data lines) D1、D2、D3、…、Dn-1、Dn通过一显示区24，并于所述显示区24交错配置，其中所述数据线D1、D2、D3、…、Dn-1、Dn于所述显示区24之第一侧与所述第一连接线231连接；一横向测试电极25，配置于所述显示区24的第二侧，并与所述数据线D1、D2、D3、…、Dn-1垂直交错，其中所述第一侧与所述第二侧相对；一第一纵向测试电极261，配置于所述显示区24的第三侧，并与所述扫描线G1、G2、G3、…、Gn-1、Gn垂直交错，其中所述横向测试电极25及所述第一纵向测试电极261电性相接；以及一第一浮空电极271，具有一端点与所述第一驱动板221电性连接。
S20a 利用激光熔接所述第一浮空电极271之另一端点及所述第一纵向测试电极261，形成一熔接点P1；
S25a 利用激光熔接垂直交错的所述横向测试电极25及所述第一纵向测试电极261，形成一熔接点P3；
S30a 利用激光熔接垂直交错的所述横向测试电极25及一数据线D3，形成一熔接点P4；以及
S40a 收集传回所述控制板21的讯号，以对所述数据线(图未标号)进行波形测试。
依据上述实施例，在所述面板检测方法中，步骤S20a、S25a、S30a的实施先后顺序可任意调整。
依据本实施例，图4及图6具体描述了一种可快速判断是否是GOA 电路出现问题，使电路利于解析的方法，所述方法可直接观测需要级数的Data line的波形，进而判断是否是某级扫描线(Data line)讯号线出现问题。
虽然于本实施例中选了特定级数的Data line进行波形测试，然而本领域技术人员当可依据本发明之面板检测方式，选择其他级数的Data line或Gate line进行波形测试。
依据本发明之一实施例，在进行特定级数的Data line波形测试后，更可进一步将已被激光熔接的横向测试电极及数据线激光熔断，继续逐列进行其他的Data line或Gate line波形测试，上述其他选定Data line或Gate line与测试电极的熔接点的讯号走线须位于前一激光熔断点与控制板之间，而不通过前一激光熔断点。
图5为依据本发明另一实施例之显示面板进行检测时的电极走线及讯号线示意图；图7为依据本发明的另一实施例之面板检测方式的步骤流程图。一并参见图5及图7，如图5及图7所示，本发明的另一实施例提供一种面板检测方式，包括以下步骤：
S10 提供一显示面板2，其详细构成如前述实施例，在此不予赘述；
S20a 利用激光熔接所述第一浮空电极271之另一端点及所述第一纵向测试电极261，形成一熔接点P1；
S30b 利用激光熔接垂直交错的所述第一纵向测试电极261及一扫描线G3，形成一熔接点P2；以及
S40b 收集传回所述控制板21的讯号，以对所述扫描线G3进行波形测试。
依据本实施例，在所述面板检测方法中，步骤S20a、S30b的实施先后顺序可任意调整。依据本实施例，图5及图7具体描述了一种可快速判断是否是GOA 电路出现问题，使电路利于解析的方法，所述方法可直接观测需要级数的Gate line的波形，进而判断是否是某级扫描线(Gate line)讯号线出现问题。
虽然于本实施例中选了特定级数的Gate line进行波形测试，然而本领域技术人员当可依据本发明之面板检测方式，选择其他级数的Gate line进行波形测试。
依据本发明之一实施例，在进行特定级数的Gate line波形测试后，更可进一步将已被激光熔接的横向测试电极及数据线激光熔断，继续逐列进行其他的Gate line波形测试，上述其他选定Gate line与测试电极的熔接点的讯号走线须位于前一激光熔断点与控制板之间，而不通过前一激光熔断点。
图8为依据本发明的又一实施例之面板检测方式的步骤流程图。一并参见图4及图8，如图4及图8所示，本发明的又一实施例提供一种面板检测方式，更包括以下步骤：
S20b 利用激光熔接所述第二浮空电极272之另一端点及所述第二纵向测试电极262，形成一熔接点P5;
S25b 利用激光熔接垂直交错的所述横向测试电极25及所述第二纵向测试电极262，形成一熔接点P6；
S30c 利用激光熔接垂直交错的所述横向测试电极25及另一数据线(图未标号)，其中所述另一数据线(图未标号)与所述控制板21之间的讯号传送不经过步骤S30a或S30b中的所述熔接点P4或P2；以及
S40c 收集传回所述控制板的讯号，以对所述数据线(图未标号)进行波形测试。
依据本实施例，在所述面板检测方法中，步骤S20b、S25b、S30c的实施先后顺序可任意调整。
同前述实施例，虽然于本实施例中选了特定级数的Data line进行波形测试，然而本领域技术人员当可依据本发明之面板检测方式，选择其他级数的Data line或Gate line进行波形测试。同样地，在进行特定级数的Data line波形测试后，更可进一步将已被激光熔接的横向测试电极及数据线激光熔断，继续逐列进行其他的Data line或Gate line波形测试，上述其他选定Data line或Gate line与测试电极的熔接点的讯号走线须位于前一激光熔断点与控制板之间，而不通过前一激光熔断点。
图9为依据本发明的再一实施例之面板检测方式的步骤流程图。一并参见图5及图9，如图5及图9所示，本发明的再一实施例提供一种面板检测方式，更包括以下步骤：
S20b 利用激光熔接所述第二浮空电极272之另一端点及所述第二纵向测试电极262，形成一熔接点P5;
S30d 利用激光熔接垂直交错的所述第二纵向测试电极262及另一扫描线(图未示)，其中所述另一扫描线(图未示)与所述控制板之间的讯号传送不经过步骤S30a或S30b中的所述熔接点P4或P2；以及
S40d 收集传回所述控制板21的讯号，以对所述扫描线(图未示)进行波形测试。
依据本发明的一实施例，在所述面板检测方法中，步骤S20b、S30d的实施先后顺序可任意调整。
同前述实施例，虽然于本实施例中选了特定级数的Gate line进行波形测试，然而本领域技术人员当可依据本发明之面板检测方式，选择其他级数的Gate line进行波形测试。同样地，在进行特定级数的Gate line波形测试后，更可进一步将已被激光熔接的横向测试电极及数据线激光熔断，继续逐列进行其他的Gate line波形测试，上述其他选定Gate line与测试电极的熔接点的讯号走线须位于前一激光熔断点与控制板之间，而不通过前一激光熔断点。
据此，本发明实施例所提供的面板检测方式可同时进行一个、二个或多个级数的Gate line及/或Data line波形测试，且在进行特定级数的Gate line及/或Data line波形测试后，更可进一步将已被激光熔接的横向测试电极及Gate line及/或Data line激光熔断，继续逐列进行其他的Gate line及/或Data line波形测试，使电路利于解析。
综上所述，虽然本发明已以优选实施例揭露如上，但上述优选实施例并非用以限制本发明，本领域的普通技术人员，在不脱离本发明的精神和范围内，均可作各种更动与润饰，因此本发明的保护范围以权利要求界定的范围为准。

Claims (10)

  1. 一种显示面板，包括；
    多条第一连接线；
    多条横向的扫描线与多条纵向的数据线交错配置，其中所述数据线于所述显示面板之第一侧与所述第一连接线连接；
    一第一纵向测试电极，配置于所述显示面板的第三侧，并与所述扫描线垂直交错，其中所述横向测试电极及所述第一纵向测试电极电性相接；以及
    一第一浮空电极，具有一端点与所述第一驱动板电性连接。
  2. 根据权利要求1所述的显示面板，更包括：
    一横向测试电极，配置于所述显示面板的第二侧，并与所述数据线垂直交错，其中所述第一侧与所述第二侧相对。
  3. 根据权利要求1所述的显示面板，更包括：
    一控制板；
    一第一驱动板，与所述控制板电性连接，
    其中所述多条第一连接线与所述第一驱动板电性连接。
  4. 根据权利要求1所述的显示面板，更包括：
    一第二驱动板，与所述控制板电性连接；
    多条第二连接线，其中所述多条第二连接线与所述第二驱动板电性连接，且所述多条第二连接线与所述第二驱动板配置于所述显示面板之第一侧；
    一第二纵向测试电极，配置于所述显示面板之第四侧，并与所述扫描线垂直交错，其中第四侧与第三侧相对；以及
    一第二浮空电极，具有一端点与所述第二驱动板电性连接。
  5. 根据权利要求2所述的显示面板，其中
    所述多条第一连接线、所述第一浮空电极、所述多条横向的扫描线、以及所述横向测试电极位于一闸极金属层；以及
    所述多条纵向的数据线及所述第一纵向测试电极位于一源极/漏极金属层，其中所述源极/漏极金属层位于所述闸极金属层之上。
  6. 根据权利要求1所述的显示面板，更包括：
    一第一浮空电极引脚，配置于所述控制板上，与所述第一浮空电极相接。
  7. 根据权利要求4所述的显示面板，更包括：
    一第二浮空电极引脚，配置于所述控制板上，与所述第二浮空电极相接。
  8. 一种面板检测方式，包括；
    S10 提供一显示面板，包括：
    多条第一连接线；
    多条横向的扫描线(gate lines)与多条纵向的数据线(data lines)交错配置，其中所述数据线于所述显示面板之第一侧与所述第一连接线连接；
    一第一纵向测试电极，配置于所述显示面板的第三侧，并与所述扫描线垂直交错；以及
    一第一浮空电极，具有一端点与所述第一驱动板电性连接；
    S20a 利用激光熔接所述第一浮空电极之另一端点及所述第一纵向测试电极；
    S30b 利用激光熔接垂直交错的所述第一纵向测试电极及一扫描线，形成一熔接点；以及
    S40b 收集传回所述控制板的讯号，以对所述扫描线进行波形测试。
  9. 一种面板检测方式，包括；
    S10 提供一显示面板，包括：
    多条第一连接线；
    多条横向的扫描线(gate lines)与多条纵向的数据线(data lines)交错配置，其中所述数据线于所述显示面板之第一侧与所述第一连接线连接；
    一横向测试电极，配置于所述显示面板的第二侧，并与所述数据线垂直交错，其中第一侧与第二侧相对；
    一第一纵向测试电极，配置于所述显示面板的第三侧，并与所述扫描线垂直交错；以及所述
    一第一浮空电极，具有一端点与所述第一驱动板电性连接；
    S20a 利用激光熔接所述第一浮空电极之另一端点及所述第一纵向测试电极；
    S25a 利用激光熔接垂直交错的所述横向测试电极及所述第一纵向测试电极；
    S30a 利用激光熔接垂直交错的所述横向测试电极及一数据线，形成一熔接点；以及
    S40a 收集传回所述控制板的讯号，以对所述数据线进行波形测试。
  10. 根据权利要求8项所述的面板检测方式，其中所述显示面板，更包括：
    一控制板；
    一第一驱动板，与所述控制板电性连接；
    一第二驱动板，与所述控制板电性连接；
    多条第二连接线，其中所述多条第一连接线与所述第一驱动板电性连接，所述多条第二连接线与所述第二驱动板电性连接，且所述多条第一连接线及多条第二连接线与所述数据线于所述显示面板之第一侧连接；
    所述一第二纵向测试电极，配置所述显示面板之第四侧，并与所述扫描线垂直交错，其中所述第三侧与所述第四侧相对；以及
    一第二浮空电极，具有一端点与所述第二驱动板电性连接；
    所述面板检测方式，更包括；
    S20b 利用激光熔接所述第二浮空电极之另一端点及所述第二纵向测试电极;
    S25b 利用激光熔接垂直交错的所述横向测试电极及所述第二纵向测试电极；
    S30c 利用激光熔接垂直交错的所述横向测试电极及另一数据线，其中所述另一数据线与所述控制板之间的讯号传送不经过步骤S30a或S30b中的所述熔接点；以及
    S40c 收集传回所述控制板的讯号，以对所述数据线进行波形测试。
PCT/CN2019/103784 2019-05-29 2019-08-30 显示面板及其检测方式 Ceased WO2020237888A1 (zh)

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