WO2020173203A1 - 电子传输层及其制备方法、发光器件和显示装置 - Google Patents
电子传输层及其制备方法、发光器件和显示装置 Download PDFInfo
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- WO2020173203A1 WO2020173203A1 PCT/CN2019/128231 CN2019128231W WO2020173203A1 WO 2020173203 A1 WO2020173203 A1 WO 2020173203A1 CN 2019128231 W CN2019128231 W CN 2019128231W WO 2020173203 A1 WO2020173203 A1 WO 2020173203A1
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- Prior art keywords
- electron transport
- film
- transport film
- layer
- light emitting
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- 238000002360 preparation method Methods 0.000 title claims description 14
- 239000000463 material Substances 0.000 claims abstract description 115
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 172
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 96
- 238000000034 method Methods 0.000 claims description 85
- 239000000243 solution Substances 0.000 claims description 68
- ZBCBWPMODOFKDW-UHFFFAOYSA-N diethanolamine Chemical compound OCCNCCO ZBCBWPMODOFKDW-UHFFFAOYSA-N 0.000 claims description 54
- 239000011787 zinc oxide Substances 0.000 claims description 48
- 239000000725 suspension Substances 0.000 claims description 31
- 238000010438 heat treatment Methods 0.000 claims description 26
- ZOIORXHNWRGPMV-UHFFFAOYSA-N acetic acid;zinc Chemical compound [Zn].CC(O)=O.CC(O)=O ZOIORXHNWRGPMV-UHFFFAOYSA-N 0.000 claims description 25
- 239000004246 zinc acetate Substances 0.000 claims description 25
- 238000002347 injection Methods 0.000 claims description 24
- 239000007924 injection Substances 0.000 claims description 24
- FUBACIUATZGHAC-UHFFFAOYSA-N oxozirconium;octahydrate;dihydrochloride Chemical compound O.O.O.O.O.O.O.O.Cl.Cl.[Zr]=O FUBACIUATZGHAC-UHFFFAOYSA-N 0.000 claims description 24
- MCMNRKCIXSYSNV-UHFFFAOYSA-N ZrO2 Inorganic materials O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 claims description 19
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 claims description 17
- 229910052726 zirconium Inorganic materials 0.000 claims description 17
- 238000011282 treatment Methods 0.000 claims description 16
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 claims description 15
- 230000005525 hole transport Effects 0.000 claims description 13
- 239000000758 substrate Substances 0.000 claims description 11
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 11
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 claims description 8
- 229910021193 La 2 O 3 Inorganic materials 0.000 claims description 8
- 235000011114 ammonium hydroxide Nutrition 0.000 claims description 8
- 238000010030 laminating Methods 0.000 claims description 8
- 229910006404 SnO 2 Inorganic materials 0.000 claims description 7
- 229910010413 TiO 2 Inorganic materials 0.000 claims description 7
- 238000002156 mixing Methods 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 claims 2
- 239000010410 layer Substances 0.000 description 184
- 238000004528 spin coating Methods 0.000 description 16
- 230000006798 recombination Effects 0.000 description 11
- 238000005215 recombination Methods 0.000 description 11
- 229910044991 metal oxide Inorganic materials 0.000 description 9
- 150000004706 metal oxides Chemical class 0.000 description 9
- JZOLATIJRQNCPM-UHFFFAOYSA-N O.O.O.O.O.O.O.O.[Zr] Chemical compound O.O.O.O.O.O.O.O.[Zr] JZOLATIJRQNCPM-UHFFFAOYSA-N 0.000 description 8
- 238000010586 diagram Methods 0.000 description 7
- -1 ZnO Chemical class 0.000 description 6
- 239000007864 aqueous solution Substances 0.000 description 6
- 230000004888 barrier function Effects 0.000 description 6
- 230000009286 beneficial effect Effects 0.000 description 6
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- 238000007254 oxidation reaction Methods 0.000 description 6
- 230000015572 biosynthetic process Effects 0.000 description 5
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- 238000004070 electrodeposition Methods 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 238000004544 sputter deposition Methods 0.000 description 4
- 239000011521 glass Substances 0.000 description 3
- 238000000227 grinding Methods 0.000 description 3
- 238000013508 migration Methods 0.000 description 3
- 230000005012 migration Effects 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- IVORCBKUUYGUOL-UHFFFAOYSA-N 1-ethynyl-2,4-dimethoxybenzene Chemical compound COC1=CC=C(C#C)C(OC)=C1 IVORCBKUUYGUOL-UHFFFAOYSA-N 0.000 description 2
- HZAXFHJVJLSVMW-UHFFFAOYSA-N 2-Aminoethan-1-ol Chemical compound NCCO HZAXFHJVJLSVMW-UHFFFAOYSA-N 0.000 description 2
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- 238000005266 casting Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- MRELNEQAGSRDBK-UHFFFAOYSA-N lanthanum(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[La+3].[La+3] MRELNEQAGSRDBK-UHFFFAOYSA-N 0.000 description 2
- 230000001590 oxidative effect Effects 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 229910001928 zirconium oxide Inorganic materials 0.000 description 2
- PNOHSRQQJYJYJH-UHFFFAOYSA-N O.O.O.O.O.O.O.O.[Cl] Chemical compound O.O.O.O.O.O.O.O.[Cl] PNOHSRQQJYJYJH-UHFFFAOYSA-N 0.000 description 1
- PTFCDOFLOPIGGS-UHFFFAOYSA-N Zinc dication Chemical compound [Zn+2] PTFCDOFLOPIGGS-UHFFFAOYSA-N 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 238000013329 compounding Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- ZCUAOSPTDXJIJR-UHFFFAOYSA-N ethanol;2-(2-hydroxyethylamino)ethanol Chemical compound CCO.OCCNCCO ZCUAOSPTDXJIJR-UHFFFAOYSA-N 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- LSYIMYXKHWXNBV-UHFFFAOYSA-N lanthanum(3+) oxygen(2-) titanium(4+) Chemical compound [O-2].[La+3].[Ti+4] LSYIMYXKHWXNBV-UHFFFAOYSA-N 0.000 description 1
- 239000002346 layers by function Substances 0.000 description 1
- 238000005036 potential barrier Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- 239000004408 titanium dioxide Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/14—Carrier transporting layers
- H10K50/16—Electron transporting layers
- H10K50/166—Electron transporting layers comprising a multilayered structure
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/40—Thermal treatment, e.g. annealing in the presence of a solvent vapour
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K2102/00—Constructional details relating to the organic devices covered by this subclass
- H10K2102/301—Details of OLEDs
- H10K2102/351—Thickness
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
Definitions
- the present disclosure relates to the field of display technology, and in particular to an electron transport layer and a preparation method thereof, a light emitting device and a display device.
- Organic light-emitting diode (Organic Light-Emitting Diode, abbreviated as OLED) display is a display device that uses current to drive light-emitting devices to achieve image display. It has self-luminous, no backlight, high contrast, thin thickness, wide viewing angle, and response. Excellent features such as high speed.
- an electron transport layer is provided.
- the electron transport layer is applied to a light emitting device, the light emitting device includes a light emitting layer, and the electron transport layer is disposed on one side of the light emitting layer.
- the electron transport layer includes: a first electron transport film; and a second electron transport film laminated on a side of the first electron transport film close to the light-emitting layer, and the second electron transport film is configured Is in contact with the light-emitting layer.
- the conduction band energy level of the material contained in the second electron transport film is greater than the conduction band energy level of the material contained in the first electron transport film, and the conduction band energy level of the material contained in the second electron transport film It is smaller than the conduction band energy level of the material contained in the light-emitting layer.
- the valence band energy level of the material contained in the second electron transport film is less than the valence band energy level of the material contained in the first electron transport film.
- the thickness of the second electron transport film is less than the thickness of the first electron transport film.
- the molar ratio of the material contained in the second electron transport film to the material contained in the first electron transport film ranges from 1:5 to 1:3.
- the first electron transport film includes a ZnO film, a TiO 2 film, or a SnO 2 film.
- the second electron transport film includes a ZrO 2 film, a La 2 O 3 film, or a LaTi 2 O 7 film.
- the preparation method is used to prepare the electron transport layer as described in some of the above embodiments.
- the preparation method includes: stacking a first electron transport film and a second electron transport film together.
- the first electron transport film is located on the side of the second electron transport film layer close to the light-emitting layer; the conduction band energy level of the material contained in the first electron transport film is smaller than that of the second electron transport film.
- the conduction band energy level of the material contained in the second electron transport film is smaller than the conduction band energy level of the material contained in the light-emitting layer.
- the laminating the first electron transport film and the second electron transport film together includes: forming the first electron transport film on a substrate using a film forming process; The second electron transport film is formed on the surface of the first electron transport film away from the substrate.
- the laminating the first electron transport film and the second electron transport film together includes: forming the first electron transport film by a film forming process; forming the second electron transport film by a film forming process Film; The first electron transport film and the second electron transport film are compounded together.
- the first electron transport film includes a ZnO film.
- the film forming process to form the first electron transport film includes: adding an ethanol solution of diethanolamine to an ethanol suspension of zinc acetate, and heating the solution to obtain a diethanolamine complex sol solution; removing the diethanolamine Ethanol contained in the complex sol solution; the diethanolamine complex sol solution from which ethanol has been removed is made into a zinc oxide prefabricated film by a film forming process; the diethanolamine complex contained in the zinc oxide prefabricated film is oxidized to form a ZnO film .
- the molar ratio of diethanolamine contained in the ethanol solution of diethanolamine to zinc acetate contained in the ethanol suspension of zinc acetate ranges from 1:1.5 to 1:1.
- the second electron transport film includes a ZrO 2 film.
- the film forming process to form the second electron transport film includes: adding ammonia water dropwise to an ethanol suspension of zirconyl chloride octahydrate under heating to obtain a zirconium hydrolyzed sol solution; removing the zirconium hydrolyzed sol The ethanol contained in the liquid; the zirconium hydrolyzed sol solution from which the ethanol is removed is produced by a film forming process to produce a zirconium dioxide prefabricated film; the zirconium dioxide prefabricated film is oxidized to form a ZrO 2 film.
- the forming of the second electron transport film by a film forming process further includes: before the dropwise addition of ammonia to the ethanol suspension of zirconyl chloride octahydrate, combining anhydrous ethanol with Water is mixed to obtain an aqueous ethanol solution; wherein the volume ratio of the absolute ethanol to the water ranges from 1:4 to 1:2.5; the aqueous ethanol solution and zirconyl chloride octahydrate are mixed to obtain chlorine octahydrate An ethanol suspension of zirconium oxide.
- a light emitting device in yet another aspect, includes: the electron transport layer as described in some of the above embodiments, the electron transport layer includes a first electron transport film and a second electron transport film that are stacked; and, the second electron transport film is provided on the The light-emitting layer on the side of the film away from the first electron transport film; wherein the conduction band energy level of the material contained in the light-emitting layer is greater than the conduction band energy level of the material contained in the second electron transport film.
- the light emitting device further includes: an electron injection layer disposed on a side of the electron transport layer away from the light emitting layer; and an electron injection layer disposed on a side of the light emitting layer away from the electron transport layer.
- An exciton adjusting layer, the exciton adjusting layer is configured to adjust the transport efficiency of holes transported into the light-emitting layer so that the holes and electrons transported into the light-emitting layer are as close as possible to the Exciton recombination occurs in the light-emitting layer; a hole transport layer arranged on the side of the exciton adjusting layer away from the light-emitting layer; and a hole arranged on the side of the hole transport layer away from the light-emitting layer Hole injection layer.
- a display device in another aspect, includes a plurality of light-emitting devices as described in some of the above embodiments.
- Fig. 1 is a structural diagram of a light emitting device in the related art
- Fig. 2 is a structural diagram of an electron transport layer in some embodiments according to the present disclosure
- FIG. 3 is an energy level diagram of a material contained in an electron transport layer in some embodiments according to the present disclosure
- FIG. 4 is a flowchart of a method for preparing an electron transport layer in some embodiments of the present disclosure
- FIG. 5 is a flowchart of another method for preparing an electron transport layer in some embodiments of the present disclosure
- Fig. 6 is a flow chart of a method for preparing a first electron transport layer in some embodiments of the present disclosure
- Fig. 7 is a flow chart of a method for preparing a second electron transport film in some embodiments of the present disclosure
- Fig. 8 is a structural diagram of a light emitting device in some embodiments according to the present disclosure.
- FIG. 9 is a structural diagram of a display device in some embodiments according to the present disclosure.
- first and second are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Thus, the features defined with “first” and “second” may explicitly or implicitly include one or more of these features. In the description of the embodiments of the present disclosure, unless otherwise specified, “plurality” means two or more.
- the light emitting device in the related art includes an anode 200 ′, a cathode 300 ′, and a light emitting function layer 100 ′ located between the anode 200 ′ and the cathode 300 ′.
- the light emitting function layer 100' includes a hole injection layer 111', a hole transport layer 112', a light emitting layer 130', an electron transport layer 122', and an electron injection layer 121'.
- the material used for the electron transport layer 122' is generally a metal oxide such as ZnO.
- Metal oxides such as ZnO have high conductivity and high transmittance, and play an active role in the development of electron transport materials.
- the electron transport layer 122' made of metal oxide can effectively promote the electron transport speed, but due to the energy band structure characteristics of the metal oxide, the transfer of the conduction band electrons of the metal oxide to the light emitting layer 130' still has to go beyond a relatively large distance.
- a large potential barrier which tends to make the electron transport efficiency relatively low compared to the hole transport efficiency, resulting in a mismatch in the number of electrons and holes, which may easily lead to exciton recombination at the interface between the light-emitting layer 130' and the electron transport layer 122', which reduces The efficiency and stability of light-emitting devices.
- some embodiments of the present disclosure provide a display device 300 including a plurality of light emitting devices 200.
- the light emitting device 200 includes a hole injection layer 25, a hole transport layer 24, a light emitting layer 21, an electron transport layer 100, and an electron injection layer 22.
- the light emitting device 200 also includes an exciton adjusting layer 23 disposed between the hole transport layer 24 and the light emitting layer 21, and the exciton adjusting layer 23 can adjust the transmission efficiency of holes to the light emitting layer 21, so that exciton recombination occurs as much as possible.
- the electron transport layer 100 contained in the light emitting device 200 has a relatively high electron transport efficiency.
- the electron transport layer 100 provided by the embodiments of the present disclosure will be schematically described below.
- an embodiment of the present disclosure provides an electron transport layer 100, which is applied to a light emitting device 200, and the light emitting device 200 includes a light emitting layer 21 disposed on one side of the electron transport layer 100 .
- the electron transport layer 100 includes: a first electron transport film 11 and a second electron transport film laminated on the side of the first electron transport film 11 close to the light emitting layer 21
- the film 22 and the second electron transport film 22 are configured to be in contact with the light-emitting layer 21.
- the conduction band energy level of the material contained in the first electron transport film 11 is smaller than the conduction band energy level of the material contained in the second electron transport film 12, and the conduction band energy level of the material contained in the second electron transport film 12 is smaller than the light emitting layer 21 The conduction band energy level of the material contained.
- the first electron transport film 11 and the second electron transport film 12 can form a heterojunction, which improves the electron transport efficiency of the electron transport layer 100, so that the number of electrons and holes migrated to the light-emitting layer 21 can be matched, and the light-emitting layer 21 is improved. Luminous efficiency.
- the second electron transport film 12 is located between the light emitting layer 21 and the first electron transport film 11, and the first electron transport film 11 is located on the electron injection layer 22 and the second electron transport film 12.
- the conduction band electrons of the material contained in the electron injection layer 22 will first migrate to the conduction band of the material contained in the first electron transport film 11, and then from the conduction band of the material contained in the first electron transport film 11
- the conduction band electrons migrate to the conduction band of the material contained in the second electron transport film 12, and finally from the conduction band of the material contained in the second electron transport film 12 to the conduction band of the material contained in the light-emitting layer 21.
- the holes will also migrate to the valence band of the material contained in the light-emitting layer 21, so that the holes and electrons can undergo exciton recombination in the light-emitting layer 21, and the energy released by the exciton recombination is in the form of light. Release, thereby causing the light emitting device 200 to emit light.
- the second electron transport film 12 Based on the structure and application of the electron transport layer 100 provided by the embodiments of the present disclosure, it can be known that by arranging the second electron transport film 12 on the side of the first electron transport film 11 close to the light emitting layer 21, the second electron transport film 12 and the light emitting The layer 31 is in contact with each other so that the conduction band energy level of the material contained in the first electron transport film 11 is smaller than the conduction band energy level of the material contained in the second electron transport film 12, and the conduction band energy level of the material contained in the second electron transport film 12 The band energy level is smaller than the conduction band energy level of the material contained in the light-emitting layer 31, so that the difference in conduction band energy between the material contained in the first electron transport film 11 and the material contained in the second electron transport film 12 will be smaller than the first
- the conduction band electrons of the material contained in the first electron transport film 11 migrate to the barrier of the conduction band of the material contained in the light-emitting layer 21, and the conduction band electrons of the material contained in the first electron transport film 11 migrate
- the barrier to the conduction band of the material contained in the second electron transport film 12 will be relatively low, and the barrier of the conduction band of the material contained in the second electron transport film 12 and the material contained in the light-emitting layer 21 will also be relatively low.
- the conduction band of the material contained in the layer is used as a reference, and it is easier to migrate to the conduction band of the material contained in the light-emitting layer 21 having a higher energy level.
- the conduction band electrons of the material contained in the first electron transport film 112a can use the conduction band of the material contained in the second electron transport film 12 as a springboard for migration.
- the electron transport efficiency of the electron transport layer 100 can be effectively improved, so that when holes migrate to the light-emitting layer 21, more electrons can also migrate to the light-emitting layer 21, it can effectively improve the matching of the number of electrons and holes transmitted to the light-emitting layer 21, so that the process of exciton recombination occurs in the light-emitting layer 21 as much as possible, reducing the interface between the electron transport layer 100 and the light-emitting layer 21 The probability of exciton recombination occurs at any location, thereby effectively improving the efficiency and stability of the light emitting device 200.
- the conduction band electrons of the material contained in the first electron transport film 11 migrate to the conduction band of the material contained in the light-emitting layer 21, the conduction band electrons of the material contained in the first electron transport film 11 migrate
- the barrier to the conduction band of the material contained in the second electron transport film 12 is relatively low, and the barrier to the conduction band of the material contained in the second electron transport film 12 and the material contained in the light-emitting layer 21 is relatively low.
- the valence band energy level of the material contained in the second electron transport film 12 is smaller than the valence band energy level of the material contained in the first electron transport film 11.
- the valence band holes of the material contained in the light-emitting layer 21 migrate to the valence band of the material contained in the second electron transport film 12, and the barrier is higher, so that The difficulty of hole migration to the interface between the light-emitting layer 21 and the electron transport layer 100 can be increased, and the mobility of the hole to the interface between the light-emitting layer 21 and the electron transport layer 100 can be reduced, so that exciton recombination occurs in the light-emitting layer 21.
- the second electron transport film 12 serves as an intermediate springboard for the conduction band electrons of the material contained in the first electron transport film 11 to migrate to the conduction band of the material contained in the light emitting layer 21, the second electron The thickness of the transmission film 12 can be selected and set according to actual needs, which is not limited in the embodiment of the present disclosure.
- the thickness of the first electron transport film 11 is greater than the thickness of the second electron transport film 12. In this way, the thickness of the light emitting device 200 applied with the electron transport layer 100 can be kept basically unchanged or the thickness increased less, avoiding the impact on the slim design of the display device (for example, organic electroluminescent display) applied with the light emitting device 4.
- the molar ratio of the material contained in the second electron transport film 12 to the material contained in the first electron transport film 11 ranges from 1:5 to 1:3. This can ensure that the electrons have a higher transmission rate, so that the conduction band electrons of the material contained in the second electron transport film 12 can migrate to the conduction band of the material contained in the light-emitting layer 21 faster.
- the molar ratio of the material contained in the second electron transport film 12 to the material contained in the first electron transport film 11 is 1:4, 1:3, or 1:5.
- the first electron transport film 11 includes a ZnO (zinc oxide) film, a TiO 2 (titanium dioxide) film, or a SnO 2 (tin oxide) film, of course, it is not limited thereto.
- the material contained in the first electron transport film 11 may include ZnO, TiO 2 or SnO 2 .
- the second electron transport film 12 includes a ZrO 2 (zirconium dioxide) film, a La 2 O 3 (lanthanum oxide) film, or a LaTi 2 O 7 (lanthanum titanium oxide) film, but of course it is not limited thereto.
- the material contained in the second electron transport film 12 may include ZrO 2 , La 2 O 3 or LaTi 2 O 7 .
- the first electron transport film 11 is a ZnO film, and the ZnO film has characteristics such as higher electrical conductivity and higher light transmittance.
- the second electron transport film 12 is a ZrO 2 film.
- the second electron transport film 12 may also be a La 2 O 3 film or a LaTi 2 O 7 film.
- Figure 3 shows the energy level matching relationship diagram of ZnO and ZrO 2 , the energy level unit is eV. It can be seen from Figure 3 that ZrO 2 has a higher conduction band energy level and a lower valence band energy level than ZnO.
- the conduction band electrons of the material contained in the first electron transport film 11 can be relatively easily transferred to the conduction band of the material contained in the second electron transport film 12, which improves The transport efficiency of electrons from the electron transport layer 100 to the light emitting layer 21.
- Some embodiments of the present disclosure also provide a method for preparing the electron transport layer, which is used to prepare the electron transport layer as provided in some of the above embodiments.
- the preparation method includes S100.
- the first electron transport film is located on the side of the second electron transport film layer close to the light-emitting layer.
- the conduction band energy level of the material contained in the first electron transport film is smaller than the conduction band energy level of the material contained in the second electron transport film, and the conduction band energy level of the material contained in the second electron transport film is smaller than that of the light emitting layer. The conduction band energy level of the contained material.
- the materials contained in the first electron transport film include multiple types.
- the material contained in the first electron transport film may be ZnO, TiO 2 or SnO 2 , of course, it is not limited thereto.
- the material contained in the second electron transport film includes a variety of materials.
- the material contained in the second electron transport film may be ZrO 2 , La 2 O 3 or LaTi 2 O 7 , of course, it is not limited thereto.
- beneficial effects that can be achieved by the method for preparing the electron transport layer provided by the embodiments of the present disclosure are the same as the beneficial effects that can be achieved by the electron transport layer 100 provided in the foregoing embodiments, and will not be repeated here.
- the above-mentioned method of laminating the first electron transport film and the second electron transport film together is, for example, laminating the two together in the process of preparing the first electron transport film and the second electron transport film; After the first electron transport film and the second electron transport film, the first electron transport film and the second electron transport film are laminated together.
- the above method is to laminate the first electron transport film and the second electron transport film together in the process of preparing the first electron transport film and the second electron transport film, as shown in FIG.
- the electron transport films are laminated together, including S110a to S120a.
- the film forming process is, for example, a sputtering process or an electrodeposition process that can realize the film formation of semiconductor materials (for example, metal oxides such as ZnO, TiO 2 or SnO 2 ).
- semiconductor materials for example, metal oxides such as ZnO, TiO 2 or SnO 2 .
- the aforementioned substrate may be, for example, a common glass substrate, or may be a glass substrate formed with an electron injection layer.
- the substrate is an electron injection layer formed on a glass substrate
- the preparation of the electron transport layer is completed, the stack of the electron transport layer and the electron injection layer is also completed.
- the film forming process is, for example, a sputtering process or an electrodeposition process that can realize the film formation of semiconductor materials (for example, metal oxides such as ZrO 2 , La 2 O 3 or LaTi 2 O 7 ).
- semiconductor materials for example, metal oxides such as ZrO 2 , La 2 O 3 or LaTi 2 O 7 .
- the above method is to prepare the first electron transport film and the second electron transport film separately, and then laminate the first electron transport film and the second electron transport film together, as shown in FIG. 5 As shown, the first electron transport film and the second electron transport film are laminated together, including S110b to S130b.
- the film forming process is, for example, a spin coating process, or a sputtering process or an electrodeposition process that can realize the film formation of semiconductor materials (such as metal oxides such as ZnO, TiO 2 or SnO 2 ).
- semiconductor materials such as metal oxides such as ZnO, TiO 2 or SnO 2 .
- the film forming process is, for example, a spin coating process, or a sputtering process or an electrodeposition process that can realize the film formation of semiconductor materials (for example, metal oxides such as ZrO 2 , La 2 O 3 or LaTi 2 O 7 ) .
- semiconductor materials for example, metal oxides such as ZrO 2 , La 2 O 3 or LaTi 2 O 7 .
- the method of compounding the first electron transport film and the second electron transport film is a process such as sheeting or lamination.
- the first electron transport film and the second electron transport film should be prevented from being damaged during the recombination process.
- the first electron transport film includes a ZnO film, that is, the material contained in the first electron transport film includes ZnO, as shown in FIG. 6, a film forming process is used to form the first electron transport film, including S111b ⁇ S114b .
- the temperature range of the heat treatment is 60°C to 80°C.
- zinc acetate will undergo a coordination reaction with diethanolamine to form a zinc diethanolamine complex.
- the temperature range of the coordination reaction is 60°C to 80°C.
- the ethanol suspension of zinc acetate is always in an excess state relative to the ethanol solution of diethanolamine, so that the zinc acetate Always in an excessive state, so as to ensure that there is no free diethanolamine in the final diethanolamine complex sol.
- the molar ratio of the diethanolamine contained in the ethanol solution of diethanolamine to the zinc acetate contained in the ethanol suspension of zinc acetate ranges from 1:1.5 to 1:1. In this way, when the diethanolamine zinc complex is formed, the coordination of the diethanolamine and the zinc ion can be made relatively complete, and the obtained diethanolamine complex sol solution is in a clear state.
- the viscosity of the diethanolamine complex sol solution from which ethanol is removed can be increased.
- the ethanol removal method is, for example, a drying removal method
- the drying temperature can be selected as 60° C.
- the drying time is set according to specific actual conditions, for example, 2 h.
- the film forming process may be a casting film forming process or a spin coating film forming process.
- the rotation speed during spin coating can be set according to actual conditions, and the rotation speed during spin coating can be 1000 rpm.
- the oxidation treatment of the diethanolamine complex contained in the zinc oxide preformed film may be heating treatment, and the temperature range of the heating treatment may be 80°C to 100°C.
- the two The ethanolamine complex is oxidized so that the zinc oxide pre-film is formed as a ZnO film.
- the second electron transport film includes a ZrO 2 film, that is, the material contained in the second electron transport film is ZrO 2 , as shown in FIG. 7, the second electron transport film is formed by a film forming process, including S121b ⁇ S124b.
- the zirconium oxide contained in the zirconium hydrolyzed sol solution is in the form of zirconium hydroxide. And when the zirconium hydrolyzed sol is obtained, the zirconium hydrolyzed sol is in a clear state.
- the viscosity of the zirconium hydrolyzed sol solution from which ethanol is removed can be increased.
- the ethanol removal method is, for example, a dry removal method
- the drying temperature can be selected as 60° C.
- the drying time is set according to specific actual conditions, for example, 2 hours.
- the film forming process may be a casting film forming process or a spin coating film forming process.
- the rotation speed of the spin coating can be set according to the actual situation, for example, the rotation speed of the spin coating is 1000 rpm.
- the above-mentioned oxidation treatment is heating treatment, and the temperature range of the heating treatment is 80°C-100°C.
- the zirconium hydroxide contained in the zirconium dioxide prefabricated film will be oxidized, so that the zirconium dioxide prefabricated film is formed into a ZrO 2 film.
- using a film forming process to form the second electron transport film further includes: before dripping ammonia water into the ethanol solution of zirconyl chloride octahydrate, mixing absolute ethanol with water to obtain an ethanol aqueous solution ; Mix the ethanol aqueous solution with zirconyl chloride octahydrate to obtain an ethanol suspension of zirconyl chloride octahydrate. This can increase the solubility of zirconyl chloride octahydrate in ethanol.
- the method for preparing the electron transport layer using methods such as S11b to S130b is taken as an example to illustrate the method for preparing the electron transport layer in more detail.
- the preparation method of the electron transport layer includes the first step to the seventh step.
- the first step weigh 6.6 g (that is, 0.036 mol) zinc acetate, add zinc acetate to a beaker after grinding, and add 50 mL of absolute ethanol to the beaker, and stir in a water bath at 60°C for 1 hour to obtain ethanol for zinc acetate. Suspension.
- the ethanol solution of diethanolamine was slowly added dropwise to the ethanol suspension of zinc acetate and heated at 60° C. to obtain a diethanolamine complex sol solution. At this time, the diethanolamine complex sol solution was in a clear state. Then stand at room temperature for 24h.
- the diethanolamine complex sol solution was dried at 60° C. for 2 hours to remove the ethanol contained in the diethanolamine complex sol solution.
- a spin-coating process is used to spin-coat the ethanol-removed diethanolamine complex sol solution to obtain a zinc oxide preformed film.
- the zinc oxide prefabricated film is subjected to three heating treatments, each with a heating temperature of 90° C. and a heating time of 3 minutes to obtain a ZnO film.
- the absolute ethanol is mixed with water in a volume ratio of 1:3 to obtain an aqueous ethanol solution.
- ammonia water was added dropwise to the ethanol suspension of zirconyl chloride octahydrate under heating at 85°C until the ethanol suspension of zirconyl chloride octahydrate was in a clear state to obtain clear zirconium octahydrate Hydrolyzed sol liquid.
- the zirconium octahydrate hydrolyzed sol solution was dried at 60° C. for 2 hours to remove the ethanol contained in the zirconium octahydrate hydrolyzed sol solution.
- a spin coating process is used to spin-coat the ethanol-removed zirconium hydrolyzed sol solution to obtain a zirconium dioxide prefabricated film.
- a sixth step pre-film of zirconium dioxide under conditions of 90 deg.] C in the oxidation treatment to obtain the ZrO 2 film, so that the ZrO 2 film of ZrO contained in a molar ratio of 2 ZnO ZnO film contained 1: 4.
- the ZnO film and the ZrO 2 film are combined together by means of sheeting to obtain an electron transport layer.
- the preparation method of the electron transport layer includes the first step to the seventh step.
- the first step weigh 0.045 mol of zinc acetate, add zinc acetate to a beaker after grinding, and add 60 mL of absolute ethanol to the beaker, and stir in a water bath at 60° C. for 2 hours to obtain an ethanol suspension of zinc acetate.
- the ethanol solution of diethanolamine is slowly added dropwise to the ethanol suspension of zinc acetate and heated at 80° C. to obtain a diethanolamine complex sol solution. At this time, the diethanolamine complex sol solution is in a clear state. Then stand at room temperature for 24h.
- the diethanolamine complex sol solution was dried at 60° C. for 2 hours to remove the ethanol contained in the diethanolamine complex sol solution.
- a spin-coating process is used to spin-coat the ethanol-removed diethanolamine complex sol solution to obtain a zinc oxide preformed film.
- the zinc oxide prefabricated film is subjected to three heating treatments respectively, the heating temperature of each heating treatment is 100 DEG C, and the heating time is 3 min, to obtain a ZnO film.
- the absolute ethanol is mixed with water in a volume ratio of 1:2.5 to obtain an ethanol aqueous solution.
- the fifth step is to add ammonia water dropwise to the ethanol suspension of zirconyl chloride octahydrate under heating at 80°C until the ethanol suspension of zirconyl chloride octahydrate is in a clear state to obtain clear zirconium octahydrate Hydrolyzed sol liquid.
- the zirconium octahydrate hydrolyzed sol solution was dried at 60° C. for 2 hours to remove the ethanol contained in the zirconium octahydrate hydrolyzed sol solution.
- the ethanol-removed zirconium hydrolyzed sol solution was spin-coated by a spin-coating process to obtain a zirconium dioxide preformed film.
- a sixth step pre-film of zirconia at 100 °C for oxidation treatment to obtain the ZrO 2 film, so that the ZrO 2 film of ZrO contained in a molar ratio of 2 ZnO ZnO film contained 1: 3.
- the ZnO film and the ZrO 2 film are combined together by means of sheeting to obtain an electron transport layer.
- the preparation method of the electron transport layer includes the first step to the seventh step.
- the first step weigh 0.05 mol of zinc acetate, add zinc acetate to a beaker after grinding, and add 60 mL of absolute ethanol to the beaker, and stir in a water bath at 60° C. for 2 hours to obtain a zinc acetate suspension.
- the ethanol solution of diethanolamine was slowly added dropwise to the ethanol suspension of zinc acetate and heated at 70° C. to obtain a diethanolamine complex sol solution. At this time, the diethanolamine complex sol solution was in a clear state. Then stand at room temperature for 24h.
- the diethanolamine complex sol solution was dried at 60° C. for 2 hours to remove the ethanol contained in the diethanolamine complex sol solution.
- a spin-coating process is used to spin-coat the ethanol-removed diethanolamine complex sol solution to obtain a zinc oxide preformed film.
- the zinc oxide prefabricated film is subjected to three heating treatments respectively, the heating temperature of each heating treatment is 80 DEG C, and the heating time is 3 minutes, to obtain a ZnO film.
- the absolute ethanol is mixed with water in a volume ratio of 1:4 to obtain an ethanol aqueous solution.
- the fifth step is to add ammonia water dropwise to the ethanol suspension of zirconyl chloride octahydrate under heating at 100°C until the ethanol suspension of zirconyl chloride octahydrate is in a clear state to obtain clear zirconium octahydrate Hydrolyzed sol liquid.
- the zirconium hydrolyzed sol solution was dried at 60° C. for 2 hours to remove the ethanol contained in the zirconium octahydrate hydrolyzed sol solution.
- a spin coating process is used to spin-coat the ethanol-removed zirconium hydrolyzed sol solution to obtain a zirconium dioxide preformed film.
- a sixth step pre-film of zirconium dioxide at 80 °C for oxidation treatment to obtain the ZrO 2 film, so that the ZrO 2 film of ZrO contained in a molar ratio of 2 ZnO ZnO film contained 1: 5.
- the ZnO film and the ZrO 2 film are combined together by means of sheeting to obtain an electron transport layer.
- the light emitting device 200 includes the electron transport layer 100 as provided in some of the above embodiments, and the electron transport layer 100 includes a first electron transport film 11 and a second electron transport film 12 that are stacked.
- the light emitting device 200 further includes a light emitting layer 21 provided on the side of the second electron transport film 12 away from the first electron transport film 11.
- the conduction band energy level of the material contained in the light-emitting layer 21 is greater than the conduction band energy level of the material contained in the second electron transport film 12.
- the beneficial effects that can be achieved by the light emitting device 200 provided by the embodiments of the present disclosure are the same as the beneficial effects that can be achieved by the electron transport layer 100 provided in the foregoing embodiments, and will not be repeated here.
- the light emitting device 200 further includes an electron injection layer 22 disposed on the side of the electron transport layer 100 away from the light emitting layer 21, and the first electron transport film 11 in the electron transport layer 100 is located on the electron transport layer 100. Between the injection layer 11 and the second electron transport film 12.
- the light emitting device 200 further includes an exciton adjustment layer 23, a hole transport layer 24, and a hole injection layer 25.
- the exciton adjustment layer 23 is disposed on the side of the light emitting layer 21 away from the electron transport layer 100, and the hole transport layer 24 is disposed on the excitation layer.
- the sub-regulating layer 24 is far away from the light emitting layer 21, and the hole injection layer 25 is disposed on the side of the hole transport layer 24 far away from the light emitting layer 21.
- the above-mentioned exciton adjusting layer 23 is configured to adjust the transmission efficiency of holes transported into the light-emitting layer 21, so that the holes and the electrons transported into the light-emitting layer 21 will recombine with excitons in the light-emitting layer 21 as much as possible to improve light emission.
- the luminous efficiency of the device 200 is configured to adjust the transmission efficiency of holes transported into the light-emitting layer 21, so that the holes and the electrons transported into the light-emitting layer 21 will recombine with excitons in the light-emitting layer 21 as much as possible to improve light emission.
- the above-mentioned light-emitting device 200 further includes an anode A and a cathode K.
- the anode A is connected to the side of the hole injection layer 25 away from the light-emitting layer 21, and the cathode K is connected to the electron injection layer 22. The side facing away from the light-emitting layer 21 is connected.
- the anode A and the cathode K are used to provide a driving voltage to the light emitting device 200 to drive the light emitting device 200 to emit light.
- the structure of the light emitting device 200 is only described by taking the above structure as an example.
- the light emitting device 200 may not include one of the exciton adjustment layer 23, the hole transport layer 24, or the hole injection layer 25; or, the light emitting device 200 may not include the electron injection layer 22.
- the display device 300 includes a plurality of light emitting devices 200 as provided in some of the above embodiments.
- the beneficial effects that can be achieved by the display device 300 provided by the embodiments of the present disclosure are the same as the beneficial effects that can be achieved by the light emitting device 200 provided by some of the above embodiments, and will not be repeated here.
- the display device 300 provided in the foregoing embodiments may be any product or component with a display function, such as a mobile phone, a tablet computer, a television, a monitor, a notebook computer, a digital photo frame, or a navigator.
- a display function such as a mobile phone, a tablet computer, a television, a monitor, a notebook computer, a digital photo frame, or a navigator.
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Abstract
Description
Claims (16)
- 一种电子传输层,应用于发光器件,所述发光器件包括发光层,所述电子传输层设置在所述发光层的一侧;所述电子传输层包括:第一电子传输膜;以及,层叠设置在所述第一电子传输膜的靠近所述发光层的一侧的第二电子传输膜,所述第二电子传输膜被配置为与所述发光层接触;其中,所述第二电子传输膜所含有的材料的导带能级大于所述第一电子传输膜所含有的材料的导带能级,所述第二电子传输膜所含有的材料的导带能级小于所述发光层所含有的材料的导带能级。
- 根据权利要求1所述的电子传输层,其中,所述第二电子传输膜所含有的材料的价带能级小于所述第一电子传输膜所含有的材料的价带能级。
- 根据权利要求1所述的电子传输层,其中,所述第二电子传输膜的厚度小于所述第一电子传输膜的厚度。
- 根据权利要求1~3中任一项所述的电子传输层,其中,所述第二电子传输膜所含有的材料与所述第一电子传输膜所含有的材料的摩尔比的范围为1:5~1:3。
- 根据权利要求1~4中任一项所述的电子传输层,其中,所述第一电子传输膜包括ZnO膜、TiO 2膜或SnO 2膜。
- 根据权利要求1~5中任一项所述的电子传输层,其中,所述第二电子传输膜包括ZrO 2膜、La 2O 3膜或LaTi 2O 7膜。
- 一种电子传输层的制备方法,用于制备如权利要求书1~5中任一项所述的电子传输层;所述制备方法包括:将第一电子传输膜和第二电子传输膜层叠在一起;其中,所述第一电子传输膜位于所述第二电子传输膜层的靠近所述发光层的一侧;所述第一电子传输膜所含有的材料的导带能级小于所述第二电子传输膜所含有的材料的导带能级,所述第二电子传输膜所含有的材料的导带能级小于发光层所含有的材料的导带能级。
- 根据权利要求7所述的制备方法,其中,所述将第一电子传输膜和第二电子传输膜层叠在一起,包括:采用成膜工艺在衬底上形成所述第一电子传输膜;采用成膜工艺在所述第一电子传输膜远离所述衬底的表面形成所述第二电子传输膜。
- 根据权利要求7所述的制备方法,其中,所述将第一电子传输膜和第二电子传输膜层叠在一起,包括:采用成膜工艺形成所述第一电子传输膜;采用成膜工艺形成所述第二电子传输膜;将所述第一电子传输膜和所述第二电子传输膜复合在一起。
- 根据权利要求9所述的制备方法,其中,所述第一电子传输膜包括ZnO膜;所述采用成膜工艺形成所述第一电子传输膜,包括:向醋酸锌的乙醇悬浊液加入二乙醇胺的乙醇溶液,并进行加热处理,获得二乙醇胺配合物溶胶液;去除所述二乙醇胺配合物溶胶液含有的乙醇;采用成膜工艺将去除乙醇的二乙醇胺配合物溶胶液制成氧化锌预制膜;对所述氧化锌预制膜所含有的二乙醇胺配合物进行氧化处理,形成ZnO膜。
- 根据权利要求10所述的制备方法,其中,所述二乙醇胺的乙醇溶液中所含有的二乙醇胺与所述醋酸锌的乙醇悬浊液中所含有的醋酸锌的摩尔比范围为1:1.5~1:1。
- 根据权利要求9~11中任一项所述的制备方法,其中,所述第二电子传输膜包括ZrO 2膜;所述采用成膜工艺形成所述第二电子传输膜,包括:在加热条件下向八水合氯化氧锆的乙醇悬浊液中滴加氨水,获得锆水解溶胶液;去除所述锆水解溶胶液含有的乙醇;采用成膜工艺将去除乙醇的锆水解溶胶液制作二氧化锆预制膜;对所述二氧化锆预制膜进行氧化处理,形成ZrO 2膜。
- 根据权利要求12所述的制备方法,其中,所述采用成膜工艺形成所述第二电子传输膜,还包括:在所述向八水合氯化氧锆的乙醇悬浊液中滴加氨水之前,将无水乙醇与水混合,获得乙醇水溶液;其中,所述无水乙醇与所述水的体积比范围为1:4~1:2.5;将所述乙醇水溶液与八水合氯化氧锆进行混合,获得八水合氯化氧锆的乙醇悬浊液。
- 一种发光器件,包括:如权利要求1~6中任一项所述的电子传输层,所述电子传输层包括层叠设置的第一电子传输膜和第二电子传输膜;以及,设置在所述第二电子传输膜远离所述第一电子传输膜的一侧的发光层;其中,所述发光层所含有的材料的导带能级大于所述第二电子传输膜所含有的材料的导带能级。
- 根据权利要求14所述的发光器件,还包括:设置在所述电子传输层远离所述发光层的一侧的电子注入层;设置在所述发光层远离所述电子传输层的一侧的激子调节层,所述激子调节层被配置为,调节传输至所述发光层内的空穴的传输效率,以使得所述空穴和传输至所述发光层内的电子尽量在所述发光层内发生激子复合;设置在所述激子调节层远离所述发光层的一侧的空穴传输层;以及,设置在所述空穴传输层远离所述发光层的一侧的空穴注入层。
- 一种显示装置,包括:多个如权利要求14或15所述的发光器件。
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CN108539034A (zh) * | 2018-05-31 | 2018-09-14 | 上海天马有机发光显示技术有限公司 | 有机发光显示面板和有机发光显示装置 |
CN109755405A (zh) * | 2019-02-28 | 2019-05-14 | 京东方科技集团股份有限公司 | 一种电子传输层及其制备方法、发光器件和显示装置 |
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