WO2019015130A1 - 用于刻号机的识别号补值方法及系统 - Google Patents

用于刻号机的识别号补值方法及系统 Download PDF

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Publication number
WO2019015130A1
WO2019015130A1 PCT/CN2017/105328 CN2017105328W WO2019015130A1 WO 2019015130 A1 WO2019015130 A1 WO 2019015130A1 CN 2017105328 W CN2017105328 W CN 2017105328W WO 2019015130 A1 WO2019015130 A1 WO 2019015130A1
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WIPO (PCT)
Prior art keywords
marking machine
identification area
offset information
data table
preset value
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PCT/CN2017/105328
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English (en)
French (fr)
Inventor
龚成波
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Wuhan China Star Optoelectronics Semiconductor Display Technology Co Ltd
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Wuhan China Star Optoelectronics Semiconductor Display Technology Co Ltd
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Priority to US15/576,901 priority Critical patent/US10838397B2/en
Publication of WO2019015130A1 publication Critical patent/WO2019015130A1/zh
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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B44—DECORATIVE ARTS
    • B44B—MACHINES, APPARATUS OR TOOLS FOR ARTISTIC WORK, e.g. FOR SCULPTURING, GUILLOCHING, CARVING, BRANDING, INLAYING
    • B44B3/00—Artists' machines or apparatus equipped with tools or work holders moving or able to be controlled substantially two-dimensionally for carving, engraving, or guilloching shallow ornamenting or markings
    • B44B3/009—Artists' machines or apparatus equipped with tools or work holders moving or able to be controlled substantially two-dimensionally for carving, engraving, or guilloching shallow ornamenting or markings using a computer control means
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09F—DISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
    • G09F9/00—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/18—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of program data in numerical form
    • G05B19/4093—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of program data in numerical form characterised by part programming, e.g. entry of geometrical information as taken from a technical drawing, combining this with machining and material information to obtain control information, named part program, for the NC machine
    • G05B19/40931—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of program data in numerical form characterised by part programming, e.g. entry of geometrical information as taken from a technical drawing, combining this with machining and material information to obtain control information, named part program, for the NC machine concerning programming of geometry
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/31—From computer integrated manufacturing till monitoring
    • G05B2219/31304—Identification of workpiece and data for control, inspection, safety, calibration
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W46/00—Marks applied to devices, e.g. for alignment or identification
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W46/00—Marks applied to devices, e.g. for alignment or identification
    • H10W46/101—Marks applied to devices, e.g. for alignment or identification characterised by the type of information, e.g. logos or symbols
    • H10W46/103—Marks applied to devices, e.g. for alignment or identification characterised by the type of information, e.g. logos or symbols alphanumeric information, e.g. words, letters or serial numbers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W46/00—Marks applied to devices, e.g. for alignment or identification
    • H10W46/401—Marks applied to devices, e.g. for alignment or identification for identification or tracking
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W46/00—Marks applied to devices, e.g. for alignment or identification
    • H10W46/601—Marks applied to devices, e.g. for alignment or identification for use after dicing
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W46/00—Marks applied to devices, e.g. for alignment or identification
    • H10W46/601—Marks applied to devices, e.g. for alignment or identification for use after dicing
    • H10W46/607—Located on parts of packages, e.g. on encapsulations or on package substrates

Definitions

  • the invention relates to a display panel production technology, in particular to an identification number complementing method and system for a marking machine.
  • each unit (Chip, array substrate unit) on the glass substrate is given an ID number (identification number), which is mainly used for product identification and information transmission, and each unit has The unique ID logo is like everyone has their own ID card.
  • the ID number is abnormal, the subsequent decoder will not be recognized, and the related information will not be transmitted.
  • the most important form of the ID number is the offset of the ID number.
  • the current monitoring is mainly determined by the camera.
  • the offset value cannot be directly obtained.
  • the method to be obtained can only be measured manually by measuring the machine. Perform manual replenishment. Taking 5.5 inches as an example, there are about 500 ID numbers on each substrate. All manual measurement and replenishment takes too long, which is not suitable for large-scale production.
  • the present invention provides a method and system for recognizing the identification number of the engraving machine, so that the offset of the ID number can be automatically measured and fed back to the engraving machine for automatic replenishment. , thereby improving the efficiency of both sides.
  • the invention provides an ID number complementing method for a marking machine, comprising the following steps:
  • the first distance a and the second distance g are respectively subtracted from the first preset value a' and the second preset value g', thereby obtaining an offset of the X-axis and the Y-axis direction of the identification number in each recognition area. information;
  • the offset information and the identification area number corresponding to the offset information are output.
  • the method further includes writing the offset information into the first complementary value data table at a position corresponding to the identification area number according to the identification area number.
  • the method further includes: before the offset information is written into the first complementary value data table at a position corresponding to the identification area number, each of the offset information and the identification area corresponding to the offset information The serial number is counted, and the second supplementary value data table is established, and the offset information corresponding to the identification area number in the second supplementary value data table is written into the first complementary value data table at a position corresponding to the identification area serial number. .
  • the method further includes: before the offset information is written into the first complementary value data table at a position corresponding to the identification area number, each of the offset information and the identification area corresponding to the offset information The serial number is counted, and the second supplementary value data table is created, and the second supplementary value data table is replaced with the first supplementary value data table.
  • first preset value a' and the second preset value g' have a value ranging from 100 to 300 um.
  • the invention also provides an ID number complementing system for a marking machine, comprising:
  • a measuring device configured to sequentially acquire a first distance a and a second distance g of each character in the identification area located at the first position of the identification number to the edge of the identification area;
  • the first distance a and the second distance g are respectively subtracted from the first preset value a' and the second preset value g', thereby obtaining an offset of the X-axis and the Y-axis direction of the identification number in each recognition area. information;
  • the statistical process control system is configured to set the upper and lower limits of the management according to the offset information, and output the offset information and the identification area number corresponding to the offset information to the marking machine.
  • the marking machine further writes the offset information according to the identification area number to the position stored in the first supplementary value data table of the marking machine corresponding to the identification area number.
  • the marking machine writes the offset information according to the identification area serial number before the position corresponding to the identification area number in the first supplementary value data table of the marking machine, and the measuring device further The offset information and the identification area number corresponding to the offset information are counted, and are generated into a second supplementary value data table and output to the statistical process control system, and the statistical process control system sends the second supplementary value data table to the numbering machine. And the marking machine writes the offset information corresponding to the identification area serial number in the second supplementary value data table into a position corresponding to the identification area serial number in the first supplementary value data table.
  • the marking machine writes the offset information according to the identification area number to the position stored in the first supplementary value data table of the marking machine corresponding to the identification area number, and the measuring device will bias each
  • the shift information and the identification area number corresponding to the offset information are counted, and are generated into a second supplementary value data table and output to the statistical process control system, and the statistical process control system sends the second supplementary value data table to the numbering machine.
  • the marking machine replaces the second supplementary value data table with the first supplementary value data table.
  • first preset value a' and the second preset value g' have a value ranging from 100 to 300 um.
  • the present invention acquires the first distance a and the second distance g of the character located in the first position of the identification number in each recognition area to the edge of the identification area and the first distance a and the second distance g and the first
  • the preset value a' and the second preset value g' are respectively subtracted, thereby obtaining offset information of the X-axis and Y-axis directions of the identification number in each identification area and outputting, so that the offset of the ID number can be made
  • the automatic measurement is realized; by outputting the offset information to the marking machine and complementing the value, the automatic replenishment of the marking machine is realized, and the working efficiency is improved by the above method.
  • Figure 1 is a schematic illustration of one of the identification zones of the present invention
  • FIG. 3 is a block diagram showing the structure of the value-added system of the present invention.
  • FIG. 4 is a schematic diagram showing the format of a first supplementary value data table and a second supplementary value data table according to the present invention.
  • the ID number complementing method for a marking machine of the present invention is characterized in that it comprises the following steps:
  • the first distance a and the second distance g of the character located in the first place of the identification number in the identification area to the edge of the identification area are sequentially acquired; specifically, as shown in FIG. 1 , the leftmost side of the figure is the character of the first digit of the identification number.
  • the first distance a and the second distance g are respectively subtracted from the first preset value a' and the second preset value g', thereby obtaining an offset of the X-axis and the Y-axis direction of the identification number in each recognition area.
  • the offset information and the identification area number corresponding to the offset information are output, and specifically, the offset information is written in the first complementary value data table at a position corresponding to the identification area number according to the identification area number.
  • the offset information is also collected in two ways, as follows:
  • One is: before the offset information is written into the first complementary value data table at a position corresponding to the identification area number, each offset information and the identification area number corresponding to the offset information are counted. Establishing a second supplementary value data table, and writing the offset information corresponding to the identification area number in the second supplementary value data table into a position corresponding to the identification area serial number in the first supplementary value data table; It has the ability to collect and output data, reduce the number of outputs, and improve efficiency.
  • the other is: before the offset information is written into the first complementary value data table at the position corresponding to the identification area number, each offset information and the identification area number corresponding to the offset information are counted. , the second complement data table is established, and the second complement data table is replaced with the first complement data table; in this manner, the complement time can be saved by using the second complement data table and the first complement value
  • the data table is set to the same format to quickly replace the first complement data table.
  • the second complement data table and the first complement data table are set to the same format, specifically, the suffix name (ie, file extension) of the file is the same, and the format of the file in the file shown in FIG.
  • the table includes at least three columns, n rows (corresponding to the number of identification numbers), the first column of the three columns is the identification zone number, and the second column is the offset ⁇ X of the X-axis direction, the third column. The offset ⁇ Y in the Y-axis direction.
  • the ID number complementing system for the marking machine of the present invention comprises a measuring device 1, a statistical process control system (SPC) connected to the measuring device 1, and a number connected to the SPC 2.
  • SPC statistical process control system
  • the measuring device 1 is configured to sequentially acquire the first distance a and the second distance g of the character located in the first position of the identification number in each identification area to the edge of the identification area; specifically, as shown in FIG.
  • the first character of the number by measuring the first distance a of the character to the left edge of the recognition area, and the second distance g of the character to the upper and lower edges of the recognition area, due to the distance from the character to the upper edge of the recognition area and the character to the recognition area
  • the distance between the edges is the same, so you only need to get one of them;
  • the first distance a and the second distance g are respectively subtracted from the first preset value a' and the second preset value g', thereby obtaining an offset of the X-axis and the Y-axis direction of the identification number in each recognition area.
  • the SPC 2 is configured to set the upper and lower limits of the management according to the offset information, and output the offset information and the identification area number corresponding to the offset information to the marking machine 3; specifically, the meaning of the upper and lower limits of the management is allowed by the system
  • the error if the error is within the upper and lower limits of the control, can continue to mark; when the upper and lower limits of the control are exceeded, SPC 2 will send a stop command to the numbering machine, thereby stopping all operations, which can facilitate heavy work, and Save on heavy work costs.
  • the upper and lower limits of the control can be set as needed, and can be set to ⁇ 100 um here.
  • the marking machine 3 After the SPC 2 outputs the offset information and the identification area number corresponding to the cheap amount information to the marking machine 3, the marking machine 3 writes the offset information into the marking machine 3 according to the identification area number. The position of the first complement value data table corresponding to the identification area number is realized, thereby realizing automatic complementation.
  • the marking machine 3 writes the offset information according to the identification area number to the position stored in the first supplementary value data table of the marking machine 3 corresponding to the identification area number, and the measuring device 1 also applies to each
  • the offset information and the identification area number corresponding to the offset information are counted, and are generated into a second supplementary value data table and output to the statistical process control system 2, and the statistical process control system 2 sends the second supplementary value data table to the engraved
  • the numbering machine 3 writes the offset information corresponding to the identification area number in the second supplementary value data table into the position corresponding to the identification area number in the first supplementary value data table.
  • the format of the second supplementary value data table is also converted, and converted into a format recognizable by the marking machine 3 Send, it is worth noting here that the format includes the file suffix name.
  • the marking machine 3 writes the offset information according to the identification area number to the position stored in the first supplementary value data table of the marking machine 3 corresponding to the identification area number, and the measuring device 1 will bias each Migration information And the identification area number corresponding to the offset information is collected, and is generated into a second supplementary value data table and output to the statistical process control system 2, and the statistical process control system 2 sends the second supplementary value data table to the numbering machine 3,
  • the marking machine 3 replaces the second supplementary value data table with the first supplementary value data table.
  • the format of the second supplementary value data table is also converted, and converted into a format corresponding to the first supplementary value data table.
  • the same file it is worth noting here that when the second complement data table is created, the table format is the same as the table format of the first complement data table, so that the replacement can be directly performed after the conversion is completed, but the present invention is not limited to For example, when the second supplementary value data table is created, a file of the same format as the first supplementary value data table may be used.
  • the format of the second complement data table and the first complement data table is set to be the same, the suffix name of the file (ie, the file extension) is the same, and the format of the table in the file shown in FIG. 2 is also the same, the table is the same. It includes at least 3 columns, n rows (corresponding to the number of identification numbers), the first column of the three columns is the identification zone number, the second column is the offset ⁇ X in the X-axis direction, and the third column is the Y-axis direction. The offset ⁇ Y.
  • the first supplementary value data table and the second supplementary value data table in the present invention are Excle tables.
  • the second supplementary value data table may be uploaded by directly uploading the second supplementary value data table by means of FTP (File Transfer Protocol), etc., of course, the present invention also Other file uploading methods may be used, and are not specifically limited herein.
  • FTP File Transfer Protocol
  • the measuring device for acquiring the first distance a and the second distance g of the character located in the first position of the identification number in each identification area to the edge of the identification area is AOI (Automatic Optic Inspection, automatic) Optical inspection).

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Abstract

一种用于刻号机（3）的ID号补值方法和补值系统，方法包括如下步骤：依次获取每个识别区中位于识别号首位的字符到识别区边缘的第一距离a、第二距离g；将第一距离a和第二距离g与第一预设值a'和第二预设值g'分别相减，从而得到每个识别区中识别号的X轴和Y轴方向的偏移量信息；将偏移量信息以及偏移量信息所对应的识别区序号输出。系统包括：量测设备（1）、统计过程控制系统（2）以及刻号机（3）。与现有技术相比，实现了刻号机（3）自动补值，提高了工作效率。

Description

用于刻号机的识别号补值方法及系统 技术领域
本发明涉及一种显示面板生产技术，特别是一种用于刻号机的识别号补值方法及系统。
背景技术
薄膜晶体管基板的生产中，会将玻璃基板上每个单元(Chip，阵列基板单元)赋予一个ID号(识别号)，该ID号主要用于产品的识别和信息的传递，每一个单元都会有独一无二的ID标识，就如同每个人有一张自己的身份证一样。
ID号异常会使得后续解码器无法识别，相关的信息也就无法传递。ID号异常最主要的形式就是ID号位置的偏移，目前监控主要靠摄像机来识别，偏移的数值无法直接获得，想要获得的方法只能通过手动到量测机台进行量测，再进行手动补值。以5.5英寸为例，每个基板上有500个左右的ID号，全部手动量测和补值花费的时间太长，不适合大规模生产的需要。
发明内容
为克服现有技术的不足，本发明提供一种用于刻好机的识别号补值方法及系统，使得能够对ID号的偏移量进行自动量测以及反馈给刻号机进行自动补值，从而提高两侧效率。
本发明提供了一种用于刻号机的ID号补值方法，包括如下步骤：
依次获取每个识别区中位于识别号首位的字符到识别区边缘的第一距离a、第二距离g；
将第一距离a和第二距离g与第一预设值a’和第二预设值g’分别相减，从而得到每个识别区中识别号的X轴和Y轴方向的偏移量信息；
将偏移量信息以及偏移量信息所对应的识别区序号输出。
进一步地，所述方法还包括根据识别区序号将偏移量信息写入第一补值数据表中与识别区序号相对应的位置处。
进一步地，所述方法还包括将偏移量信息写入第一补值数据表中与识别区序号相对应的位置处之前，将每条偏移量信息以及偏移量信息所对应的识别区序号进行统计，建立成第二补值数据表，且将第二补值数据表中识别区序号所对应的偏移量信息写入第一补值数据表中与识别区序号相对应的位置处。
进一步地，所述方法还包括将偏移量信息写入第一补值数据表中与识别区序号相对应的位置处之前，将每条偏移量信息以及偏移量信息所对应的识别区序号进行统计，建立成第二补值数据表，且将第二补值数据表与第一补值数据表进行替换。
进一步地，所述第一预设值a’和第二预设值g’的取值范围为100～300um。
本发明还提供了一种用于刻号机的ID号补值系统，包括：
量测设备，用于依次获取每个识别区中位于识别号首位的字符到识别区边缘的第一距离a、第二距离g；
将第一距离a和第二距离g与第一预设值a’和第二预设值g’分别相减，从而得到每个识别区中识别号的X轴和Y轴方向的偏移量信息；
将偏移量信息以及偏移量信息所对应的识别区序号输出至统计过程控制系统；
统计过程控制系统，用于根据偏移量信息设置管控上下限并将偏移量信息以及偏移量信息所对应的识别区序号输出至刻号机。
进一步地，所述刻号机还根据识别区序号将偏移量信息写入存储在刻号机的第一补值数据表中与识别区序号相对应的位置处。
进一步地，所述刻号机根据识别区序号将偏移量信息写入存储在刻号机的第一补值数据表中与识别区序号相对应的位置处之前，量测设备还对每条偏移量信息以及偏移量信息所对应的识别区序号进行统计，建立成第二补值数据表后输出至统计过程控制系统，统计过程控制系统将第二补值数据表发送至刻号机，所述刻号机将第二补值数据表中识别区序号所对应的偏移量信息写入第一补值数据表中与识别区序号相对应的位置处。
进一步地，所述刻号机根据识别区序号将偏移量信息写入存储在刻号机的第一补值数据表中与识别区序号相对应的位置处之前，量测设备将每条偏移量信息以及偏移量信息所对应的识别区序号进行统计，建立成第二补值数据表后输出至统计过程控制系统，统计过程控制系统将第二补值数据表发送至刻号机，所述刻号机将第二补值数据表与第一补值数据表进行替换。
进一步地，所述第一预设值a’和第二预设值g’的取值范围为100～300um。
本发明与现有技术相比，通过获取每个识别区中位于识别号首位的字符到识别区边缘的第一距离a、第二距离g并将第一距离a和第二距离g与第一预设值a’和第二预设值g’分别相减，从而得到每个识别区中识别号的X轴和Y轴方向的偏移量信息并输出，使得能够对ID号的偏移量实现自动量测；通过将偏移量信息输出至刻号机并补值，实现了刻号机自动补值，通过上述方法使得提高了工作效率。
附图说明
图1是本发明其中一个识别区的示意图；
图2是本发明补值方法的流程图；
图3是本发明补值系统的结构框图；
图4是本发明第一补值数据表以及第二补值数据表的格式示意图。
具体实施方式
下面结合附图和实施例对本发明作进一步详细说明。
如图2所示，本发明的用于刻号机的ID号补值方法，其特征在于：包括如下步骤：
依次获取每个识别区中位于识别号首位的字符到识别区边缘的第一距离a、第二距离g；具体地，如图1所示，图中最左侧即为识别号首位的字符，通过测量该字符到识别区左侧边缘的第一距离a，以及该字符到识别区上下边缘的第二距离g，由于字符到识别区上边缘的距离以及字符到识别区下边缘的距离相同，因此仅需要获取其中一个即可；
将第一距离a和第二距离g与第一预设值a’和第二预设值g’分别相减，从而得到每个识别区中识别号的X轴和Y轴方向的偏移量信息(ΔX，ΔY)，其中(ΔX，ΔY)为正数；具体地，第一预设值a’和第二预设值g’为100～300um；
将偏移量信息以及偏移量信息所对应的识别区序号输出，具体为，根据识别区序号将偏移量信息写入第一补值数据表中与识别区序号相对应的位置处。
在根据识别区序号将偏移量信息写入第一补值数据表中与识别区序号相对应的位置处之前，还进行两种方式对偏移量信息进行收集，具体如下：
一种为：将偏移量信息写入第一补值数据表中与识别区序号相对应的位置处之前，将每条偏移量信息以及偏移量信息所对应的识别区序号进行统计，建立成第二补值数据表，且将第二补值数据表中识别区序号所对应的偏移量信息写入第一补值数据表中与识别区序号相对应的位置处；此种方式具有可将数据集中收集后输出，减少输出的次数，提高效率。
另一种为：将偏移量信息写入第一补值数据表中与识别区序号相对应的位置处之前，将每条偏移量信息以及偏移量信息所对应的识别区序号进行统计，建立成第二补值数据表，且将第二补值数据表与第一补值数据表进行替换；此种方式可节省补值时间，通过将第二补值数据表与第一补值数据表设置为相同的格式，从而快速替换第一补值数据表。
本发明中，第二补值数据表与第一补值数据表设置为相同的格式具体为，其文件的后缀名(即文件扩展名)相同，以及如图2所示中文件的表格的格式也相同，表格至少包括3列，n行(此处与识别号的数量相对应)，3列种第一列为识别区序号，第二列为X轴方向的偏移量ΔX，第三列为Y轴方向的偏移量ΔY。
如图3所示，本发明的用于刻号机的ID号补值系统，包括量测设备1、与量测设备1连接的统计过程控制系统(SPC)2、与SPC 2连接的刻号机3，其中：
量测设备1，用于依次获取每个识别区中位于识别号首位的字符到识别区边缘的第一距离a、第二距离g；具体地，如图1所示，图中最左侧即为识别 号首位的字符，通过测量该字符到识别区左侧边缘的第一距离a，以及该字符到识别区上下边缘的第二距离g，由于字符到识别区上边缘的距离以及字符到识别区下边缘的距离相同，因此仅需要获取其中一个即可；
将第一距离a和第二距离g与第一预设值a’和第二预设值g’分别相减，从而得到每个识别区中识别号的X轴和Y轴方向的偏移量信息(ΔX，ΔY)，其中(ΔX，ΔY)为正数；具体地，第一预设值a’和第二预设值g’为100～300um；
将偏移量信息以及偏移量信息所对应的识别区序号输出至SPC 2；
SPC 2，用于根据偏移量信息设置管控上下限并将偏移量信息以及偏移量信息所对应的识别区序号输出至刻号机3；具体地，管控上下限的含义为系统所允许的误差，若误差在该管控上下限范围内，均可继续刻号；当超出了该管控上下限，SPC 2则会向刻号机发送停机指令，从而停止所有操作，这样能够方便重工，而且节省重工成本。
所述管控上下限可根据需要进行设置，在此可设置为±100um。
在SPC 2将偏移量信息以及便宜量信息所对应的识别区序号输出至刻号机3后，所述刻号机3根据识别区序号将偏移量信息写入存储在刻号机3的第一补值数据表中与识别区序号相对应的位置处，从而实现了自动补值。
所述刻号机3根据识别区序号将偏移量信息写入存储在刻号机3的第一补值数据表中与识别区序号相对应的位置处之前，量测设备1还对每条偏移量信息以及偏移量信息所对应的识别区序号进行统计，建立成第二补值数据表后输出至统计过程控制系统2，统计过程控制系统2将第二补值数据表发送至刻号机3，所述刻号机3将第二补值数据表中识别区序号所对应的偏移量信息写入第一补值数据表中与识别区序号相对应的位置处。
上述方法中，在统计过程控制系统2将第二补值数据表发送至刻号机3之前还对第二补值数据表的格式进行转换，将其转换为刻号机3可识别的格式后发送，这里值得注意的是，格式包括文件后缀名。
所述刻号机3根据识别区序号将偏移量信息写入存储在刻号机3的第一补值数据表中与识别区序号相对应的位置处之前，量测设备1将每条偏移量信息 以及偏移量信息所对应的识别区序号进行统计，建立成第二补值数据表后输出至统计过程控制系统2，统计过程控制系统2将第二补值数据表发送至刻号机3，所述刻号机3将第二补值数据表与第一补值数据表进行替换。
上述方法中，在统计过程控制系统2将第二补值数据表发送至刻号机3之前还对第二补值数据表的格式进行转换，将其转换为与第一补值数据表的格式相同的文件，这里值得注意的是，在建立第二补值数据表时，其表格格式与第一补值数据表的表格格式相同，从而可以在转换完成后直接进行替换，但本发明不限于此，例如还可以在建立第二补值数据表时，就采用与第一补值数据表相同格式的文件。
第二补值数据表与第一补值数据表设置为相同的格式具体为，其文件的后缀名(即文件扩展名)相同，以及如图2所示中文件的表格的格式也相同，表格至少包括3列，n行(此处与识别号的数量相对应)，3列种第一列为识别区序号，第二列为X轴方向的偏移量ΔX，第三列为Y轴方向的偏移量ΔY。
本发明中，本发明中第一补值数据表与第二补值数据表为Excle表格。
本发明中，第二补值数据表的上传方式可以采用直接将第二补值数据表通过FTP(File Transfer Protocol(文件传输协议))等方式将第二补值数据表上传，当然本发明还可以采用其他的文件上传方式，在此不做具体限定。
本发明的补值方法及系统中，用于获取每个识别区中位于识别号首位的字符到识别区边缘的第一距离a、第二距离g的量测设备为AOI(Automatic Optic Inspection、自动光学检测)。
虽然已经参照特定实施例示出并描述了本发明，但是本领域的技术人员将理解：在不脱离由权利要求及其等同物限定的本发明的精神和范围的情况下，可在此进行形式和细节上的各种变化。

Claims (16)

  1. 一种用于刻号机的ID号补值方法，其中：包括如下步骤：
    依次获取每个识别区中位于识别号首位的字符到识别区边缘的第一距离a、第二距离g；
    将第一距离a和第二距离g与第一预设值a’和第二预设值g’分别相减，从而得到每个识别区中识别号的X轴和Y轴方向的偏移量信息；
    将偏移量信息以及偏移量信息所对应的识别区序号输出。
  2. 根据权利要求1所述的用于刻号机的ID号补值方法，其中：所述方法还包括根据识别区序号将偏移量信息写入第一补值数据表中与识别区序号相对应的位置处。
  3. 根据权利要求2所述的用于刻号机的ID号补值方法，其中：所述方法还包括将偏移量信息写入第一补值数据表中与识别区序号相对应的位置处之前，将每条偏移量信息以及偏移量信息所对应的识别区序号进行统计，建立成第二补值数据表，且将第二补值数据表中识别区序号所对应的偏移量信息写入第一补值数据表中与识别区序号相对应的位置处。
  4. 根据权利要求2所述的用于刻号机的ID号补值方法，其中：所述方法还包括将偏移量信息写入第一补值数据表中与识别区序号相对应的位置处之前，将每条偏移量信息以及偏移量信息所对应的识别区序号进行统计，建立成第二补值数据表，且将第二补值数据表与第一补值数据表进行替换。
  5. 根据权利要求1所述的用于刻号机的ID号补值方法，其中：所述第一预设值a’和第二预设值g’的取值范围为100～300um。
  6. 根据权利要求2所述的用于刻号机的ID号补值方法，其中：所述第一预设值a’和第二预设值g’的取值范围为100～300um。
  7. 根据权利要求3所述的用于刻号机的ID号补值方法，其中：所述第一预设值a’和第二预设值g’的取值范围为100～300um。
  8. 根据权利要求4所述的用于刻号机的ID号补值方法，其中：所述第一预设值a’和第二预设值g’的取值范围为100～300um。
  9. 一种用于刻号机的ID号补值系统，其中：包括：
    量测设备，用于依次获取每个识别区中位于识别号首位的字符到识别区边缘的第一距离a、第二距离g；
    将第一距离a和第二距离g与第一预设值a’和第二预设值g’分别相减，从而得到每个识别区中识别号的X轴和Y轴方向的偏移量信息；
    将偏移量信息以及偏移量信息所对应的识别区序号输出至统计过程控制系统；
    统计过程控制系统，用于根据偏移量信息设置管控上下限并将偏移量信息以及偏移量信息所对应的识别区序号输出至刻号机。
  10. 根据权利要求9所述的用于刻号机的ID号补值系统，其中：所述刻号机还根据识别区序号将偏移量信息写入存储在刻号机的第一补值数据表中与识别区序号相对应的位置处。
  11. 根据权利要求10所述的用于刻号机的ID号补值系统，其中：所述刻号机根据识别区序号将偏移量信息写入存储在刻号机的第一补值数据表中与识别区序号相对应的位置处之前，量测设备还对每条偏移量信息以及偏移量信息所对应的识别区序号进行统计，建立成第二补值数据表后输出至统计过程控制系统，统计过程控制系统将第二补值数据表发送至刻号机，所述刻号机将第二补值数据表中识别区序号所对应的偏移量信息写入第一补值数据表中与识别区序号相对应的位置处。
  12. 根据权利要求10所述的用于刻号机的ID号补值系统，其中：所述刻号机根据识别区序号将偏移量信息写入存储在刻号机的第一补值数据表中与识别区序号相对应的位置处之前，量测设备将每条偏移量信息以及偏移量信息所对应的识别区序号进行统计，建立成第二补值数据表后输出至统计过程控制系统，统计过程控制系统将第二补值数据表发送至刻号机，所述刻号机将第二补值数据表与第一补值数据表进行替换。
  13. 根据权利要求9所述的用于刻号机的ID号补值系统，其中：所述第一预设值a’和第二预设值g’的取值范围为100～300um。
  14. 根据权利要求10所述的用于刻号机的ID号补值系统，其中：所述第一预设值a’和第二预设值g’的取值范围为100～300um。
  15. 根据权利要求11所述的用于刻号机的ID号补值系统，其中：所述第一预设值a’和第二预设值g’的取值范围为100～300um。
  16. 根据权利要求12所述的用于刻号机的ID号补值系统，其中：所述第一预设值a’和第二预设值g’的取值范围为100～300um。
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