WO2018119730A1 - Optical integrated testing platform - Google Patents

Optical integrated testing platform Download PDF

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WO2018119730A1
WO2018119730A1 PCT/CN2016/112582 CN2016112582W WO2018119730A1 WO 2018119730 A1 WO2018119730 A1 WO 2018119730A1 CN 2016112582 W CN2016112582 W CN 2016112582W WO 2018119730 A1 WO2018119730 A1 WO 2018119730A1
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optical
unit
mechanical
disposed
platform
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PCT/CN2016/112582
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French (fr)
Chinese (zh)
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华洋洋
倪明阳
孙振
李显凌
杨怀江
隋永新
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中国科学院长春光学精密机械与物理研究所
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Priority to PCT/CN2016/112582 priority Critical patent/WO2018119730A1/en
Publication of WO2018119730A1 publication Critical patent/WO2018119730A1/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor

Abstract

An optical integrated testing platform, comprising: a platform body frame used for supporting other components; a testing system used for testing an optical element or a mechanical element; an adjusting system used for adjusting the position of the optical element or the mechanical element on the basis of the testing; and an assembly system used for assembling the optical element or the mechanical element. The highly integrated and multifunctional optical integrated testing platform implements multiple measurements, adjustments and assemblies on one platform.

Description

光学集成检测平台Optical integrated inspection platform 技术领域Technical field
本发明涉及光学设备领域,尤其涉及一种光学集成检测平台,可用于光学元件、镜组及镜头的检测或集成。The invention relates to the field of optical devices, and in particular to an optical integrated detection platform, which can be used for detecting or integrating optical components, mirrors and lenses.
背景技术Background technique
光学设备对集成装配的要求复杂、多样,主要体现在集成精度和集成效率方面的要求差别较大。随着手持光学设备在商业领域的不断发展和成熟,特别是对拍照手机和相机而言,对光学元件的装配集成精度要求不高,但对集成效率的要求却较高,这就需要一个集成度和自动化程度较高的集成平台为其提供集成载体。The requirements for integrated assembly of optical equipment are complex and diverse, mainly reflecting the differences in integration accuracy and integration efficiency. With the continuous development and maturity of handheld optical devices in the commercial field, especially for camera phones and cameras, the precision of assembly and integration of optical components is not high, but the requirements for integration efficiency are high, which requires an integration. An integrated platform with a high degree of automation and automation.
随着集成电路特征线宽的不断推进和光刻投影装备节点的不断提高,极大规模集成电路制造所需的核心装备——光刻投影物镜的分辨率也在随之提高,因此物镜的光学系统对各镜组的集成精度以及集成效率也提出了更高的要求。With the continuous advancement of feature line width of integrated circuits and the continuous improvement of lithographic projection equipment nodes, the resolution of lithographic projection objectives, which is the core equipment required for the manufacture of very large scale integrated circuits, is also increasing, so the opticals of objective lenses The system also puts higher requirements on the integration precision and integration efficiency of each mirror group.
在高端的光刻投影物镜装配领域,较高的镜组集成精度可以提高光刻投影物镜集成后的光学系统成像质量,同时亦可减少用于光学系统光学性能补偿的调整装置的调整量,降低调整装置的设计和加工难度。光刻投影物镜的光学镜组、镜头装配的主要目标是保证内部镜片光轴与外部镜框基准面的垂直度,进而保证整个物镜的系统光轴与光学镜片的同轴度。一个光刻投影物镜一般由多组的分镜组和镜筒组合而成,因此高集成度、多功能性的镜组集成检测平台会对物镜的集成效率起到决定性作用。In the field of high-end lithographic projection objective assembly, higher mirror integration accuracy can improve the imaging quality of the lithographic projection objective integrated optical system, and also reduce the adjustment of the adjustment device for optical system optical performance compensation, reducing Adjust the design and processing difficulty of the device. The main objective of the optical lens assembly and lens assembly of the lithographic projection objective is to ensure the perpendicularity of the optical axis of the inner lens and the reference surface of the outer frame, thereby ensuring the coaxiality of the optical axis of the entire objective lens with the optical lens. A lithographic projection objective is generally composed of a plurality of sets of mirror segments and a lens barrel. Therefore, a highly integrated and versatile mirror integrated detection platform plays a decisive role in the integration efficiency of the objective lens.
除此之外,为适应不同装配精度和效率的需求以及特殊装配要求的光学元件、镜组、镜头集成检测工况,集成检测平台还需满足定制化需求,通过对集成检测平台的合理配置,使其满足不同工况的个性化的使用需求。In addition, in order to meet the requirements of different assembly precision and efficiency and the special assembly requirements of optical components, mirrors, and lens integration detection conditions, the integrated inspection platform needs to meet the customization requirements. Through the reasonable configuration of the integrated detection platform, To meet the individual needs of different working conditions.
发明内容Summary of the invention
鉴于上述技术问题,为了克服上述现有技术的不足,本发明提出了一种光学集成检测平台。In view of the above technical problems, in order to overcome the deficiencies of the above prior art, the present invention proposes an optical integrated detection platform.
根据本发明的一个方面,提供了一种光学集成检测平台,包括:平台主体框架,用于支撑其他组件;检测系统,用于对光学元件或机械元件进 行检测;调节系统,用于基于所述检测对所述光学元件或机械元件进行位置调节;以及装配系统,用于光学元件和/或机械元件的装配。According to an aspect of the present invention, an optical integrated detection platform is provided, comprising: a platform main body frame for supporting other components; and a detection system for feeding optical components or mechanical components Line detection; an adjustment system for positional adjustment of the optical or mechanical element based on the detection; and an assembly system for assembly of the optical element and/or mechanical element.
优选地,所述平台主体框架包括:基台;旋转台,设置在基台上,能够绕通过旋转台中心的旋转轴相对于基台旋转。Preferably, the platform main body frame comprises: a base; and a rotary table disposed on the base and rotatable relative to the base about a rotation axis passing through the center of the rotary table.
优选地,所述检测系统包括可拆卸的:偏心检测单元,与所述旋转台共轴,用于对光学元件进行偏心检测;厚度与间隔检测单元,与所述旋转台共轴,用于检测光学元件的厚度及间隔;机械接触式检测单元,用于对光学元件或机械元件进行快速检测;和/或机械非接触式检测单元,用于对光学元件或机械元件进行精细检测。Preferably, the detection system comprises a detachable: eccentricity detecting unit coaxial with the rotating table for eccentricity detection of the optical element; a thickness and interval detecting unit coaxial with the rotating table for detecting Thickness and spacing of optical components; mechanical contact detection units for rapid detection of optical or mechanical components; and/or mechanical non-contact detection units for fine inspection of optical or mechanical components.
优选地,所述平台主体框架还包括:带导轨立柱,设置在基台上,包括平行于所述旋转轴第一导轨和第二导轨;支架,第一端部通过所述第一导轨耦接与所述带导轨立柱,第二端部位于旋转台的旋转中心的上方;以及升降台,通过带导轨立柱上的平行于旋转轴的第二导轨与所述带导轨立柱耦接,所述偏心检测单元,设置在所述支架的第二端部,所述厚度与间隔检测单元,设置在基台下部,所述机械接触式检测单元及所述机械非接触式检测单元设置在所述升降台上。Preferably, the platform main body frame further includes: a guide rail column disposed on the base, including a first rail and a second rail parallel to the rotating shaft; and a bracket, the first end being coupled by the first rail And the belt rail column, the second end portion is located above the rotation center of the rotating table; and the lifting platform is coupled to the belt rail column by a second rail parallel to the rotating shaft on the rail column, the eccentricity a detecting unit disposed at a second end of the bracket, the thickness and interval detecting unit being disposed at a lower portion of the base, wherein the mechanical contact detecting unit and the mechanical non-contact detecting unit are disposed on the lifting platform on.
优选地,所述偏心检测单元包括依次靠近旋转台设置的传感器、光源、准直镜组以及变焦镜头。Preferably, the eccentricity detecting unit includes a sensor, a light source, a collimator lens group, and a zoom lens which are disposed in close proximity to the turntable.
优选地,所述厚度与间隔检测单元包括:机械夹持机构,设置在所述基台下部;第三导轨,在所述机械夹持机构内壁上沿平行于所述旋转轴的方向设置;以及定位传感器,通过与第三导轨与机械夹持机构耦接,所述基台和所述旋转台分别设置有第一通孔和第二通孔,同样保障厚度与间隔检测单元的检测光路,所述第一通孔和第二通孔与所述旋转台共轴。Preferably, the thickness and interval detecting unit comprises: a mechanical clamping mechanism disposed at a lower portion of the base; and a third rail disposed on an inner wall of the mechanical clamping mechanism in a direction parallel to the rotating shaft; The positioning sensor is coupled to the third rail and the mechanical clamping mechanism, and the base and the rotating table are respectively provided with a first through hole and a second through hole, and the detection light path of the thickness and interval detecting unit is also ensured. The first through hole and the second through hole are coaxial with the rotating table.
优选地,所述机械接触式检测单元包括接触式测头、万向节以及测头底座,所述接触式测头包括电感式测头、LVDT直线位移传感器测头或百分表。Preferably, the mechanical contact detecting unit comprises a contact probe, a universal joint and a probe base, and the contact probe comprises an inductive probe, an LVDT linear displacement sensor probe or a dial indicator.
优选地,所述机械非接触式检测单元包括非接触测头、测头导轨和测头机械底座,所述非接触测头指向旋转台的旋转中心设置,并可沿指向旋转台的旋转中心设置的测头导轨远离或靠近旋转中心运动。Preferably, the mechanical non-contact detecting unit comprises a non-contact probe, a probe rail and a probe mechanical base, the non-contact probe is disposed at a center of rotation of the rotary table, and is set along a rotation center of the rotary table The probe rail moves away from or near the center of rotation.
优选地,所述调节系统设置在所述旋转台上,包括:偏心调节机构, 用于对光学元件或机械元件进行偏心调节;倾斜调节机构,用于对光学元件或机械元件进行倾斜调节;以及光学元件支撑机构,用于支撑光学元件。Preferably, the adjustment system is disposed on the rotating table, including: an eccentric adjustment mechanism, For eccentric adjustment of optical or mechanical components; tilt adjustment mechanism for tilt adjustment of optical components or mechanical components; and optical component support mechanism for supporting optical components.
优选地,所述偏心调节机构包括:偏心调节基板,设置在所述倾斜调节机构上;以及上层偏心驱动单元和/或下层偏心驱动单元,设置在所述偏心调节基板,对光学元件和/或机械元件进行偏心调节。Preferably, the eccentric adjustment mechanism comprises: an eccentric adjustment substrate disposed on the tilt adjustment mechanism; and an upper eccentric drive unit and/or a lower eccentric drive unit disposed on the eccentric adjustment substrate, for optical elements and/or The mechanical components are eccentrically adjusted.
优选地,所述上层偏心驱动单元以及下层偏心驱动单元均包括:至少一个径向位移驱动器,以及支撑所述径向位移驱动器的至少一个驱动器立柱,所述至少一个径向位移驱动器沿周向均匀间隔分布。Preferably, the upper eccentric drive unit and the lower eccentric drive unit each include: at least one radial displacement drive, and at least one drive post supporting the radial displacement drive, the at least one radial displacement drive being uniform along the circumference Interval distribution.
优选地,倾斜调节机构包括:倾斜调节基板,设置在所述旋转台上;至少一个球窝配合单元,设置在所述倾斜调节基板上,并支撑所述偏心调节机构;以及至少一个倾斜调节驱动单元,设置在相应球窝配合单元上,包括径向位移驱动器和输出换向机构。Preferably, the tilt adjustment mechanism comprises: a tilt adjustment substrate disposed on the rotary table; at least one ball and socket mating unit disposed on the tilt adjustment substrate and supporting the eccentric adjustment mechanism; and at least one tilt adjustment drive The unit is disposed on the corresponding ball and socket mating unit, including a radial displacement drive and an output reversing mechanism.
优选地,光学元件支撑机构包括:光学元件升降单元,设置在所述倾斜调节基板上,用于沿旋转轴方向升降;以及光学元件支撑单元,设置在所述光学元件升降单元上,用于支撑光学元件,所述偏心调节基板设置有避免与所述光学元件升降单元及光学元件支撑单元干涉的第三通孔,所述倾斜调节基板、光学元件支撑单元及光学元件升降单元均设与所述旋转轴共轴的通孔保障间隔检测单元的检测光路。Preferably, the optical element supporting mechanism includes: an optical element lifting unit disposed on the tilt adjusting substrate for lifting and lowering in a rotation axis direction; and an optical element supporting unit disposed on the optical element lifting unit for supporting An optical element, the eccentric adjustment substrate is provided with a third through hole for avoiding interference with the optical element lifting unit and the optical element supporting unit, and the tilt adjusting substrate, the optical element supporting unit and the optical element lifting unit are both provided The through hole of the coaxial axis of the rotating shaft ensures the detection optical path of the interval detecting unit.
优选地,所述装配系统包括可拆卸的:元件取放单元,用于取放光学元件和/或机械元件;注胶与固化单元,用于镜组集成的注胶和固化;位置标记单元,用于提供方位基准并标装配元件间的位置关系;和/或清洁单元,用于获取洁净集成检测环境。Preferably, the assembly system comprises a detachable component pick-and-place unit for picking and placing optical components and/or mechanical components; a glue injection and curing unit for injection molding and curing of the mirror assembly; a position marking unit, Used to provide an orientation reference and to positional relationships between component components; and/or a cleaning unit for obtaining a clean integrated inspection environment.
优选地,所述元件取放单元设置在基台上,包括:机械元件取放工装,采用机械夹持的方式取放所述机械元件;光学元件取放工装,采用机械夹持或真空吸附的方式取放所述光学元件;以及取放机械臂,支撑所述机械元件取放工装及光学元件取放工装。Preferably, the component pick-and-place unit is disposed on the base, and includes: a mechanical component pick-and-place tool, which is mechanically clamped to pick up and place the mechanical component; the optical component pick-and-place tool is mechanically clamped or vacuum-adsorbed. The optical component is taken and placed; and the mechanical arm is taken and supported to support the mechanical component pick-and-place tool and the optical component pick-and-place tool.
优选地,所述注胶与固化单元设置在所述升降台上,包括:注胶笔,用于在气压控制下出胶形成点状、线状或面状的结构胶形态;注胶控制器,设置在升降台下表面,对控制所述注胶笔进行控制;以及固化灯,用于对胶合后的光学元件进行固化。 Preferably, the glue injection and curing unit is disposed on the lifting platform, and comprises: a glue pen for forming a point, line or surface structural adhesive form under pressure control; and a glue injection controller , the lower surface of the lifting platform is arranged to control the plastic pen; and the curing lamp is used for curing the glued optical component.
优选地,所述位置标记单元设置在所述升降台上,包括:标记激光器,其出射光线对准所述旋转轴;以及支撑架,支撑所述标记激光器。Preferably, the position marking unit is disposed on the lifting platform, comprising: a marking laser having an outgoing light aligned with the rotating shaft; and a support frame supporting the marking laser.
优选地,所述清洁单元包括:清洁吸头,设置在所述升降台下表面上,通过吸附或吹气方式去除异物;以及清洁控制器,设置在所述基台侧壁上,对所述清洁吸头进行控制。Preferably, the cleaning unit comprises: a cleaning tip disposed on a lower surface of the lifting platform to remove foreign matter by adsorption or blowing; and a cleaning controller disposed on the side wall of the abutment Clean the tip for control.
优选地,所述平台主体框架还包括:支撑腿,用于支撑基台,所述支撑腿包括:机械腿,用于起到支撑作用;隔震器,设置在所述机械腿和基台之间,用于屏蔽振动干扰。Preferably, the platform main body frame further comprises: a support leg for supporting the base, the support leg comprises: a mechanical leg for supporting, and a vibration isolator disposed on the mechanical leg and the base Between, used to shield vibration interference.
从上述技术方案可以看出,本发明具有以下有益效果:It can be seen from the above technical solutions that the present invention has the following beneficial effects:
(1)集成检测平台包括检测系统和调节系统,在同一平台上实现光学元件或机械件的多种测量与调节,高集成度、多功能性的光学集成检测平台使多种测量及调节等在一个平台上完成;(1) The integrated detection platform includes detection system and adjustment system, which realizes various measurement and adjustment of optical components or mechanical parts on the same platform. The highly integrated and versatile optical integrated detection platform enables various measurement and adjustment. Completed on one platform;
(2)检测系统包括光学检测机构和机械检测机构,用于实现光学元件的偏心和厚度与间隔测量,及机械元件的位置与平面度测量;(2) The detection system includes an optical detecting mechanism and a mechanical detecting mechanism for performing eccentricity and thickness and interval measurement of the optical component, and measuring the position and flatness of the mechanical component;
(3)调节系统偏心调节机构及倾斜调节机构,实现元件的偏心与倾斜的调节,保证多个元件间的相对位置关系;(3) Adjusting the eccentricity adjustment mechanism and the tilt adjustment mechanism of the system to realize the adjustment of the eccentricity and tilt of the component to ensure the relative positional relationship among the multiple components;
(4)装配系统实现元件的安全取放、注胶与固化、位置标记和环境清洁等多个功能,保证装调工序的安全、清洁、有序进行。(4) The assembly system realizes multiple functions such as safe pick-and-place, glue injection and curing, position marking and environmental cleaning to ensure the safe, clean and orderly process of the assembly process.
附图说明DRAWINGS
图1为本发明实施例提供的光学集成检测平台的结构示意图;1 is a schematic structural diagram of an optical integrated detection platform according to an embodiment of the present invention;
图2为图1中检测系统的结构分布示意图;2 is a schematic structural view of the detection system of FIG. 1;
图3为图1中调节系统的结构示意图;Figure 3 is a schematic structural view of the adjustment system of Figure 1;
图4为图3中双层偏心驱动单元的俯视图;Figure 4 is a plan view of the double eccentric drive unit of Figure 3;
图5为图1中装配系统的结构分布示意图;Figure 5 is a schematic view showing the structure distribution of the assembly system of Figure 1;
图6为图1中光学集成检测平台应用于胶合镜的装配的示意图;6 is a schematic view showing the assembly of the optical integrated detection platform of FIG. 1 applied to a cemented mirror;
图7为图1中光学集成检测平台应用于非球面镜片的楔角测量的示意图;7 is a schematic diagram of the wedge angle measurement applied to the aspherical lens by the optical integrated detection platform of FIG. 1;
图8图1中光学集成检测平台应用于镜头的装配的示意图。Figure 8 is a schematic view of the assembly of the optical integrated detection platform applied to the lens in Figure 1.
具体实施方式detailed description
本发明某些实施例于后方将参照所附附图做更全面性地描述,其中一 些但并非全部的实施例将被示出。实际上,本发明的各种实施例可以许多不同形式实现,而不应被解释为限于此数所阐述的实施例;相对地,提供这些实施例使得本发明满足适用的法律要求。Certain embodiments of the invention will be described more fully hereinafter with reference to the accompanying drawings, in which Some but not all of the embodiments will be shown. In fact, the various embodiments of the invention can be embodied in many different forms and should not be construed as limited to the embodiments set forth herein.
为使本发明的目的、技术方案和优点更加清楚明白,以下结合具体实施例,并参照附图,对本发明进一步详细说明。The present invention will be further described in detail below with reference to the specific embodiments of the invention.
本发明旨在提高光学元件、镜组、镜头等的集成效率和集成精度,降低集成成本、节约集成空间,本发明中的光学集成检测平台可适用于不同装配精度和效率以及特殊装配要求,本发明中涉及的待装配元件、待测元件及待调元件可以是光学元件和/或机械元件。The invention aims to improve the integration efficiency and integration precision of the optical component, the lens group, the lens, etc., reduce the integration cost, and save the integration space. The optical integrated detection platform of the invention can be applied to different assembly precisions and efficiencies as well as special assembly requirements. The component to be assembled, the component to be tested and the component to be modulated which are involved in the invention may be optical components and/or mechanical components.
下面结合附图,详细介绍本发明实施例提供的光学集成检测平台的结构和功能。The structure and function of the optical integrated detection platform provided by the embodiment of the present invention are described in detail below with reference to the accompanying drawings.
图1为本发明实施例提供的光学集成检测平台的结构示意图,如图1所示,光学集成检测平台100主要包括平台主体框架30、检测系统10、调节系统20以及装配系统40。FIG. 1 is a schematic structural diagram of an optical integrated detection platform according to an embodiment of the present invention. As shown in FIG. 1 , the optical integrated detection platform 100 mainly includes a platform main body frame 30 , a detection system 10 , an adjustment system 20 , and an assembly system 40 .
其中,平台主体框架30,用于支撑平台光学集成检测平台100内的其他组件,包括:基台33、支撑腿34、旋转台35、带导轨立柱31、升降台32以及支架36。The platform main body frame 30 is configured to support other components in the platform optical integrated detection platform 100, including: a base 33, a support leg 34, a rotary table 35, a guide rail column 31, a lifting platform 32, and a bracket 36.
请参照图1,基台33水平设置,支撑腿34用于支撑基台33,负荷整个集成检测平台100上的所有重量。其中,支撑腿34包括隔振器341和机械腿342两部分。机械腿342用于起到支撑作用。隔振器341用于屏蔽振动干扰,隔振器341可以包括主动隔振器和/或被动隔振器等。Referring to Figure 1, the base 33 is horizontally disposed, and the support legs 34 are used to support the base 33 to load all of the weight on the integrated inspection platform 100. Wherein, the support leg 34 includes two parts of the vibration isolator 341 and the mechanical leg 342. Mechanical legs 342 are used to support. The vibration isolator 341 is for shielding vibration interference, and the vibration isolator 341 may include an active vibration isolator and/or a passive vibration isolator or the like.
旋转台35设置在基台33上,旋转台35其可以绕其旋转中心相对于基台33旋转,为元件的检测和集成提供回转,在运行模式上分为快速和慢速两种旋转模式,分别用于待装配元件的快速粗测粗调和慢速精测精调两种工况。旋转台35的旋转轴是集成检测平台100的偏心基准。旋转台35设置为中空结构,便于检测系统10的检测光线通过旋转台对光学元件进行检测,旋转台35可以采用机械式旋转台、气浮式旋转台、磁浮式旋转台、静压式旋转台等多种形式,旋转台35优选采用气浮式旋转台。The rotary table 35 is disposed on the base 33. The rotary table 35 is rotatable relative to the base 33 about its center of rotation, providing rotation for detecting and integrating components, and is divided into two rotation modes, fast and slow, in the operation mode. They are used for fast coarse coarse adjustment and slow fine fine adjustment for the components to be assembled. The axis of rotation of the rotary table 35 is an eccentric reference of the integrated detection platform 100. The rotating table 35 is arranged in a hollow structure, and the detecting light of the detecting system 10 is facilitated to detect the optical component through the rotating table. The rotating table 35 can be a mechanical rotating table, an air floating type rotating table, a magnetic floating type rotating table, and a static pressure type rotating table. In various forms, the rotary table 35 preferably employs an air floating rotary table.
带导轨立柱31设置在基台33端部,垂直于基台33设置,其上设置有两条导轨,分别第一导轨311和第二导轨312,第一导轨311为支架36 提供支撑和大行程的轴向位移导向驱动,第二导轨312为升降台32提供支撑和相对较小行程的轴向位移导向驱动。The guide rail column 31 is disposed at the end of the base 33, is disposed perpendicular to the base 33, and is provided with two guide rails, respectively a first guide rail 311 and a second guide rail 312, and the first guide rail 311 is a bracket 36. The support and the large stroke axial displacement guide drive are provided, and the second guide rail 312 provides support for the lift table 32 and axial displacement guide drive for relatively small strokes.
升降台32用于带动其支撑的组件沿平台轴向上下移动,其第一端部通过第二导轨312与所述带导轨立柱31耦接,其与基台33平行,始终处于水平状态,升降台32设置为中空框架结构,在沿着带导轨立柱31的第二导轨312轴向运行中不与调节系统20和光学、机械元件发生干涉。The lifting platform 32 is configured to drive the assembly of the supporting device to move up and down along the axial direction of the platform, and the first end portion thereof is coupled to the belt rail column 31 through the second rail 312, and is parallel with the base platform 33, and is always in a horizontal state, lifting The table 32 is configured as a hollow frame structure that does not interfere with the adjustment system 20 and optical and mechanical components during axial operation along the second rail 312 with the rail uprights 31.
支架36用于带动其支撑的组件沿平台轴向上下移动,其第一端部通过第一导轨311与所述带导轨立柱31耦接,其与基台33平行,始终处于水平状态,其第二端部位于旋转台35的旋转中心的正上方。The bracket 36 is configured to drive the assembly of the support thereof to move up and down along the axial direction of the platform, and the first end portion thereof is coupled to the belt rail 33 by the first rail 311, which is parallel to the base 33 and is always in a horizontal state. The two end portions are located directly above the center of rotation of the rotary table 35.
如图2所示,检测系统10用于实现多种检测,包括偏心检测单元11、厚度与间隔检测单元12、机械接触式检测单元13和/或机械非接触式检测单元14。As shown in FIG. 2, the detection system 10 is used to implement a variety of detections, including an eccentricity detection unit 11, a thickness and spacing detection unit 12, a mechanical contact detection unit 13, and/or a mechanical non-contact detection unit 14.
偏心检测单元11设置在支架36的第二端部,检测中心与旋转台35的旋转中心共轴,并可在支架36的带动下沿竖直方向上下移动,偏心检测单元11包括:共轴且依次设置的传感器、光源111、准直镜组112和变焦透镜113,通过光学镜片的反射汇聚光并由传感器接收进而判断光学镜片的偏心量。The eccentricity detecting unit 11 is disposed at the second end of the bracket 36. The detecting center is coaxial with the center of rotation of the rotating table 35, and can be moved up and down in the vertical direction by the support 36. The eccentricity detecting unit 11 includes: The sensors, the light source 111, the collimator group 112, and the zoom lens 113, which are sequentially disposed, collect light by reflection of the optical lens and are received by the sensor to determine the amount of eccentricity of the optical lens.
厚度与间隔检测单元12设置在基台33中心下部,检测中心与旋转台35的旋转中心共轴,包括:定位传感器121、第三导轨122和机械夹持机构123,第三导轨122设置在机械夹持机构123的内壁上,定位传感器121通过与第三导轨122与机械夹持机构123耦接,其可沿第三导轨122沿竖直方向上下移动来调整工作高度,用于检测光学元件中心厚度和相邻光学元件的间隔。基台33与旋转台35均为中空结构,中心处分别设置有通孔331和351,允许厚度与间隔检测单元12的检测用光通过,通孔331和通孔351与旋转台35的旋转中心共轴。The thickness and interval detecting unit 12 is disposed at a lower portion of the center of the base 33. The detecting center is coaxial with the center of rotation of the rotating table 35, and includes: a positioning sensor 121, a third rail 122, and a mechanical clamping mechanism 123. The third rail 122 is disposed on the machine. On the inner wall of the clamping mechanism 123, the positioning sensor 121 is coupled to the mechanical clamping mechanism 123 by the third rail 122, and is movable up and down along the third rail 122 in the vertical direction to adjust the working height for detecting the center of the optical component. Thickness and spacing of adjacent optical components. The base 33 and the rotary table 35 are both hollow structures, and through holes 331 and 351 are respectively provided at the center, allowing the detection light of the thickness and interval detecting unit 12 to pass, and the through holes 331 and the through holes 351 and the rotation center of the rotary table 35 Coaxial.
机械接触式检测单元13安装在升降台32上,包括:接触式测头131、万向节132和测头底座133。接触式测头131包括:电感式测头、LVDT直线位移传感器测头或百分表等,其与待测机械元件接触,通过旋转台35的快速回转模式完成测量,机械接触式检测单元13的测量精度较低,用于快速对待测元件进行粗测,可根据测量结果快速粗调,快速判断待测元 件的调整量,通过快速检测和快速调整使元件进入检测精度较高的非接触式检测进程。The mechanical contact detecting unit 13 is mounted on the lifting platform 32 and includes a contact probe 131, a universal joint 132 and a probe base 133. The contact type probe 131 includes: an inductive probe, an LVDT linear displacement sensor probe or a dial indicator, etc., which is in contact with the mechanical component to be tested, and the measurement is completed by the rapid rotation mode of the rotary table 35, and the mechanical contact type detecting unit 13 Low measurement accuracy, used for fast measurement of components to be tested, can be quickly adjusted according to the measurement results, and quickly determine the elements to be tested The amount of adjustment of the component enables the component to enter the non-contact detection process with high detection accuracy through rapid detection and rapid adjustment.
机械非接触式检测单元14包括:非接触测头141、测头导轨142和测头机械底座143,安装在升降台32上,非接触测头141方向指向旋转台35的旋转中心设置,并可沿指向旋转台35的旋转中心设置的测头导轨142远离或靠近旋转中心运动,方位布置上可安装在平台坐标的X轴或Y轴上,便于获得待测元件的调节方位矢量,机械非接触式检测单元14通过旋转台35的慢速回转模式完成精密测量,根据测得的调节方位矢量对待测机械元件进行精确调整,保证机械元件处于装调的理想位置。另外,机械非接触式检测单元14对准机械元件上侧待测机械基准面,利用旋转台35的回转生成测量数据并拟合平面度曲线,用于完成对待测机械元件平面度的评价。另外机械非接触式检测单元14还可用于非球面光学镜片的楔角检测及光学元件的轮廓检测等。The mechanical non-contact detecting unit 14 includes a non-contact measuring head 141, a probe rail 142 and a probe mechanical base 143 mounted on the lifting platform 32, and the non-contact measuring head 141 is directed to the rotation center of the rotating table 35, and The probe rail 142 disposed along the center of rotation of the rotating table 35 moves away from or near the center of rotation, and the azimuth arrangement can be mounted on the X-axis or the Y-axis of the platform coordinates, so as to obtain the adjusted orientation vector of the component to be tested, mechanical non-contact The type detecting unit 14 performs precise measurement through the slow rotation mode of the rotary table 35, and precisely adjusts the mechanical component to be measured according to the measured adjusted orientation vector, thereby ensuring that the mechanical component is in an ideal position for adjustment. In addition, the mechanical non-contact detecting unit 14 aligns the mechanical reference surface to be tested on the upper side of the mechanical component, generates measurement data by using the rotation of the rotating table 35, and fits the flatness curve for completing the evaluation of the flatness of the mechanical component to be tested. In addition, the mechanical non-contact detecting unit 14 can also be used for wedge angle detection of an aspherical optical lens, contour detection of an optical element, and the like.
调节系统20设置在旋转台35上,用于在于配合检测系统10对光学、机械元件进行偏心和倾斜调节,使待调元件符合装配需求,从而满足装配指标要求。The adjustment system 20 is disposed on the rotary table 35 for eccentricity and tilt adjustment of the optical and mechanical components in conjunction with the detection system 10, so that the components to be adjusted meet the assembly requirements, thereby meeting the assembly index requirements.
如图3所示,调节系统20包括:偏心调节机构21、倾斜调节机构22、以及光学元件支撑机构23。As shown in FIG. 3, the adjustment system 20 includes an eccentric adjustment mechanism 21, a tilt adjustment mechanism 22, and an optical element support mechanism 23.
偏心调节机构21包括:偏心调节基板211,上层偏心驱动单元212以及下层偏心驱动单元213。偏心调节基板211为中空基板,中心设置有通孔2111,用于光学元件支撑机构23通过该通孔对光学元件,例如组装用的镜片L,进行支撑。偏心调节基板211还用于支撑机械元件,例如组装用的镜框F等,上层偏心驱动单元212以及下层偏心驱动单元213设置在偏心调节基板211上,分别通过径向位移输出调整光学元件及机械元件产生的偏心移动,将待调元件推至理想的装配位置。The eccentric adjustment mechanism 21 includes an eccentric adjustment substrate 211, an upper eccentric drive unit 212, and a lower eccentric drive unit 213. The eccentricity adjusting substrate 211 is a hollow substrate, and a through hole 2111 is provided in the center, and the optical element supporting mechanism 23 supports the optical element, for example, the lens L for assembly, through the through hole. The eccentric adjustment substrate 211 is also used to support a mechanical component, such as a frame F for assembly, etc., and the upper eccentric drive unit 212 and the lower eccentric drive unit 213 are disposed on the eccentric adjustment substrate 211, and respectively adjust the optical component and the mechanical component through the radial displacement output. The resulting eccentric movement pushes the component to be adjusted to the desired assembly position.
如图3、4所示,上层偏心驱动单元212以及下层偏心驱动单元213构成双层偏心驱动单元,上层偏心驱动单元212和下层偏心驱动单元213均包括三个径向位移驱动器2121、2131及与其对应的驱动器立柱2122、2132,例如为微分头、直线电机驱动器、伺服电机驱动器、音圈电机驱动器、压电驱动器等,对于上层偏心驱动单元212或下层偏心驱动单元213 来说,其三个驱动器2121、2131沿周向间隔120°均匀分布,且每一驱动器2121输出端均指向平台旋转台35的旋转中心,驱动器2121、2131安装在驱动器立柱2122、2132上,在竖直轴向上可根据待调元件的轴向位置调整位移输出的高度,上、下两层径向位移驱动器2121、2131在圆周方位上有一个60°的相位差。As shown in FIGS. 3 and 4, the upper eccentric drive unit 212 and the lower eccentric drive unit 213 constitute a double eccentric drive unit, and the upper eccentric drive unit 212 and the lower eccentric drive unit 213 each include three radial displacement drivers 2121, 2131 and Corresponding driver posts 2122, 2132, such as differential heads, linear motor drivers, servo motor drivers, voice coil motor drivers, piezoelectric actuators, etc., for the upper eccentric drive unit 212 or the lower eccentric drive unit 213 The three drivers 2121, 2131 are evenly spaced at intervals of 120° in the circumferential direction, and the output end of each driver 2121 is directed to the center of rotation of the platform rotating table 35, and the drivers 2121, 2131 are mounted on the driver columns 2122, 2132. The height of the displacement output can be adjusted in the vertical axial direction according to the axial position of the component to be adjusted, and the upper and lower radial displacement drivers 2121, 2131 have a phase difference of 60 in the circumferential direction.
请参照图3,倾斜调节机构22包括:倾斜调节基板221、倾斜调节驱动单元222和球窝配合单元223,其中球窝配合单元223设置在倾斜调节基板221上,本实施例中数量为3个,并用于支撑偏心调节基板211,倾斜调节驱动单元222数量与球窝配合单元223一致,设置在球窝配合单元223上,包括径向位移驱动器和输出换向机构,径向的位移输出在球窝配合单元223的配合下通过输出换向机构转化为轴向的位移输出,完成对待调机械元件倾斜姿态的调整。Referring to FIG. 3, the tilt adjustment mechanism 22 includes a tilt adjustment substrate 221, a tilt adjustment drive unit 222, and a ball and socket mating unit 223. The ball and socket mating unit 223 is disposed on the tilt adjustment substrate 221, and the number is three in this embodiment. And for supporting the eccentric adjustment substrate 211, the number of the tilt adjustment driving unit 222 is consistent with the ball and socket matching unit 223, and is disposed on the ball and socket matching unit 223, including a radial displacement driver and an output reversing mechanism, and the radial displacement output is in the ball. With the cooperation of the socket matching unit 223, the output reversing mechanism is converted into an axial displacement output, and the adjustment of the tilting posture of the mechanical component to be adjusted is completed.
本发明其他实施例中上层偏心驱动单元212和下层偏心驱动单元213中驱动器的数量并不限于3个,倾斜调节驱动单元222和球窝配合单元223的数量并也不限于3个,均可以为多个,例如为4个或5个等。In other embodiments of the present invention, the number of drivers in the upper eccentric drive unit 212 and the lower eccentric drive unit 213 is not limited to three, and the number of the tilt adjustment drive unit 222 and the ball and socket matching unit 223 is not limited to three, and may be Multiple, for example, 4 or 5, etc.
光学元件支撑机构23包括:光学元件支撑单元231和光学元件升降单元232,光学元件支撑单元231用于待装配或待检测光学元件的保护性支撑,支撑位置选择光学元件的通光口径之外,避免划伤或污染光学元件有效的通光口径,光学元件支撑单元231在支撑镜片的同时为镜片提供相对于镜框的旋转,保证光学元件和机械元件的相对位置。The optical element supporting mechanism 23 includes: an optical element supporting unit 231 and an optical element lifting unit 232 for protecting the optical element to be assembled or to be detected, and the supporting position selecting the optical element outside the light passing diameter To avoid scratching or contaminating the effective aperture of the optical element, the optical element supporting unit 231 provides rotation of the lens relative to the frame while supporting the lens, ensuring the relative position of the optical element and the mechanical element.
光学元件升降单元232设置在基倾斜调节基板221上,光学元件支撑单元231安装在光学元件升降单元232的立柱导轨上,并通过光学元件升降单元232电动或手动驱动为光学元件提供轴向位移,配合完成装配工艺要求的光学元件的升降工序。The optical element lifting unit 232 is disposed on the base tilt adjusting substrate 221, and the optical element supporting unit 231 is mounted on the column rail of the optical element lifting unit 232, and is electrically or manually driven by the optical element lifting unit 232 to provide axial displacement of the optical element. Cooperate with the lifting process of the optical components required to complete the assembly process.
倾斜调节基板221、光学元件支撑单元231及光学元件升降单元232采用中间设计与旋转台35旋转轴共轴的通孔或其他避让该旋转轴的设计,保障厚度与间隔检测单元12的检测光到达光学元件完成检测。The tilt adjustment substrate 221, the optical element supporting unit 231, and the optical element lifting unit 232 adopt a through hole designed to be coaxial with the rotating shaft of the rotating table 35 or other design to avoid the rotating shaft, and ensure the detection light of the thickness and interval detecting unit 12 is reached. The optical component completes the test.
本实施例中,装配系统40用于实现多项辅助功能,如图5所示,其包括:元件取放单元41、点胶与固化单元42、位置标记单元43和/或清洁单元44。 In the present embodiment, the assembly system 40 is used to implement a plurality of auxiliary functions, as shown in FIG. 5, including: a component pick-and-place unit 41, a dispensing and curing unit 42, a position marking unit 43, and/or a cleaning unit 44.
其中,元件取放单元41设置在基台33上,保证光学元件、机械元件在检测和装配过程的安全取放,包括:机械元件取放工装411、光学元件取放工装412和取放机械臂413,用于替代人力安全平稳地取放光学元件或机械元件。机械件取放工装411用于取放机械元件,例如镜框等,其上设置机械夹手,方便夹持镜框。光学元件取放工装412用于光学元件的取放,利用真空吸附或者机械夹持的方式紧固光学元件。取放机械臂413是元件取放单元41的支撑机构,中间设置旋转关节,可自由旋转和锁紧,内部设置金属钢丝和气路,为光学、机械元件取放提供拉力和吸附力。Wherein, the component pick-and-place unit 41 is disposed on the base 33 to ensure safe access of the optical component and the mechanical component during the detecting and assembling process, including: the mechanical component pick-and-place tool 411, the optical component pick-and-place tool 412, and the pick-and-place arm 413, used to replace the human safety to smoothly pick and place optical components or mechanical components. The mechanical pick-and-place tooling 411 is used for picking up and placing mechanical components, such as a picture frame, etc., on which a mechanical clip is placed to facilitate holding the frame. The optical component pick-and-place tool 412 is used for picking up and placing optical components, and the optical components are fastened by vacuum suction or mechanical clamping. The pick-and-place robot arm 413 is a support mechanism of the component pick-and-place unit 41, and is provided with a rotating joint in the middle, which can be freely rotated and locked, and is internally provided with a metal wire and a gas path to provide pulling and attracting force for optical and mechanical components.
注胶与固化单元42设置在升降台32上,用于镜组集成的注胶和固化工序,包括固化灯421、注胶笔422和注胶控制器423,固化灯421用于结构胶的快速、均匀固化,固化灯包括紫外固化灯和加热固化灯等,紫外固化灯为光敏胶提供固化所需的紫外线,加热固化灯为热敏胶提供固化所需的能量;注胶笔422内部填胶,在气压控制下出胶形成点状、线状或面状不同要求的结构胶形态;注胶控制器423根据所选结构胶的物理特性、注胶笔型号以及出胶量进行气压和注胶时间等参数设置,注胶控制器423可以安装在升降台32的下侧。The glue injection and curing unit 42 is disposed on the lifting platform 32 for the injection molding and curing process of the mirror assembly, including the curing lamp 421, the glue pen 422 and the glue injection controller 423, and the curing lamp 421 is used for the structural glue. Uniform curing, curing lamp includes UV curing lamp and heating curing lamp, etc. The ultraviolet curing lamp provides the ultraviolet light required for curing of the photosensitive adhesive, and the heating curing lamp provides the energy required for curing the thermal adhesive; Under the pressure control, the glue is formed into a shape, a line shape or a surface shape with different structural adhesive forms; the glue injection controller 423 performs air pressure and glue injection according to the physical characteristics of the selected structural glue, the type of the glue pen and the amount of glue discharged. The glue injection controller 423 can be mounted on the lower side of the lifting platform 32 by parameter setting such as time.
位置标记单元43设置在升降台32上,包括标记激光器431和支撑该标记激光器431的支撑架432,为装配提供方位基准并标记多个元件间的位置关系,例如光学元件和机械元件间的相对角度或者多组镜组级之间的相对位置关系的校准等,其出射光线对准旋转台35的旋转中心。The position marking unit 43 is disposed on the lifting platform 32, including a marking laser 431 and a support frame 432 supporting the marking laser 431, providing an orientation reference for the assembly and marking the positional relationship between the plurality of elements, such as the relative relationship between the optical element and the mechanical element. The angle or the calibration of the relative positional relationship between the sets of mirror groups, etc., the outgoing rays are aligned with the center of rotation of the rotary table 35.
清洁单元44用于集成检测平台和待装配元件的清洁,保证检测和装配等环节的环境质量,包括:清洁吸头441和清洁控制器442两部分,通过清洁控制器442控制清洁吸头441吸附颗粒等异物,保证装配所需洁净等级,清洁控制器442安装在基台33侧面方便控制,清洁控制器442包括开关按钮和吸附力调节旋钮,对不同的异物提供不同的吸附力,清洁吸头441安装在升降台32下侧便于操作。The cleaning unit 44 is used for integrating the detection platform and the cleaning of the components to be assembled, and ensuring the environmental quality of the inspection and assembly, including: cleaning the suction head 441 and the cleaning controller 442, and controlling the cleaning of the cleaning nozzle 441 by the cleaning controller 442. The foreign matter such as particles ensures the cleanliness level required for assembly. The cleaning controller 442 is mounted on the side of the base 33 for convenient control. The cleaning controller 442 includes a switch button and an adsorption force adjustment knob to provide different adsorption forces for different foreign objects, and the cleaning tip is cleaned. The 441 is mounted on the lower side of the lifting platform 32 for easy operation.
在本发明其他实施例中,清洁单元44还可以采用喷射气体去除异物的方式来代替本实施中吸附异物的方式。In other embodiments of the present invention, the cleaning unit 44 may also replace the manner of adsorbing foreign matter in the present embodiment by means of injecting gas to remove foreign matter.
在上述实施例中,上述组件并不是必须的,具有独立功能的组件可以采用可拆卸的方式集成在光学集成检测平台100上,例如,厚度与间隔检 测单元12、光学元件支撑机构23、元件取放单元41、点胶与固化单元42、位置标记单元43等都采用可拆卸的方式集成在光学集成检测平台100上,当不需要其对应的功能时,可以去除相应组件。In the above embodiments, the above components are not essential, and the components having independent functions may be detachably integrated on the optical integrated detection platform 100, for example, thickness and interval inspection. The measuring unit 12, the optical element supporting mechanism 23, the component pick-and-place unit 41, the dispensing and curing unit 42, the position marking unit 43, and the like are all detachably integrated on the optical integrated detecting platform 100, when the corresponding functions are not required. When you can remove the corresponding components.
高集成度、多功能性的光学集成检测平台使检测、集成等多个工序均可在一个平台上完成,提高了装配效率、节约集成空间并降低集成成本。此外,该平台可通过选取不同形式或精度的组件进行合理组合,组合成符合不同精度需求的集成检测平台,适用于其他设备的光学元件的集成检测,亦适用于多镜片组成的胶合镜的集成检测,例如针对不同精度的检测需要,偏心检测单元11、厚度与间隔检测单元12可以选用不同精度的组件。The highly integrated and versatile optical integrated inspection platform enables multiple processes such as inspection and integration to be completed on one platform, improving assembly efficiency, saving integration space and reducing integration costs. In addition, the platform can be combined by selecting components of different forms or precisions to form an integrated detection platform that meets different precision requirements. It is suitable for integrated detection of optical components of other devices, and is also suitable for integration of glue mirrors composed of multiple lenses. For detection, for example, for different precision detection needs, the eccentricity detecting unit 11, the thickness and interval detecting unit 12 may select components of different precisions.
以下介绍本发明实施例中的光学集成检测平台100的几个具体应用例:Several specific application examples of the optical integrated detection platform 100 in the embodiment of the present invention are described below:
第一应用例First application example
本应用例为光学集成检测平台100应用于光刻投影物镜中光学镜组集成装配。This application example is an optical integrated detection platform 100 applied to an optical lens assembly integrated assembly in a lithographic projection objective.
本应用例中,光刻投影物镜中光学镜组集成装配所需的镜组集成检测平台精度要求极高,对于高精度的镜组集成平台,检测系统10采用测量精度0.1~1μm的偏心检测单元11和测量精度±0.5~±2μm的厚度与间隔检测单元12,机械接触式检测单元13采用测量精度0.5~5μm的电感式杠杆表,机械非接触式检测单元14采用测量精度20nm-2μm的色差位移传感器。调节系统20中的上层偏心驱动单元212、下层偏心驱动单元213以及倾斜调节驱动单元222采用分辨率0.5-2μm的手动微分头或分辨率更高的压电驱动器进行驱动调节;带导轨立柱31中采用气浮导轨形式,并利用高精度直线光栅尺实时测量轴向位置;带导轨立柱31和基台33的基材均采用综合性能稳定的大理石材质;支撑腿34采用隔振等级较高的主动型隔振器;旋转台35采用气浮转台,并利用高精度角度光栅尺实时测量角度和速度等旋转台信息。In this application example, the precision of the mirror integrated detection platform required for the integrated assembly of the optical lens assembly in the lithographic projection objective lens is extremely high. For the high precision mirror integrated platform, the detection system 10 adopts an eccentricity detecting unit with a measurement accuracy of 0.1 to 1 μm. 11 and a thickness and interval detecting unit 12 having a measuring accuracy of ±0.5 to ±2 μm, the mechanical contact detecting unit 13 adopts an inductive lever table having a measuring accuracy of 0.5 to 5 μm, and the mechanical non-contact detecting unit 14 adopts a color difference of a measuring accuracy of 20 nm to 2 μm. Motion detector. The upper eccentric drive unit 212, the lower eccentric drive unit 213, and the tilt adjustment drive unit 222 in the adjustment system 20 are driven and adjusted by a manual differential head having a resolution of 0.5-2 μm or a higher resolution piezoelectric actuator; The air-floating guide rail is adopted, and the axial position is measured in real time by using a high-precision linear scale; the base material with the guide rail 31 and the base 33 is made of a marble material with stable comprehensive performance; the support leg 34 adopts an active vibration isolation level. Type vibration isolator; the rotary table 35 adopts an air floating turntable, and uses a high-precision angle grating to measure the rotary table information such as angle and speed in real time.
第二应用例Second application example
本应用例为光学集成检测平台100应用于普通光学镜组集成装配。This application example is an optical integrated detection platform 100 applied to an integrated assembly of ordinary optical mirrors.
本应用例中,在手机镜头、相机镜头等要求集成检测精度不高的场合,综合考虑精度需求、效率和成本二者的关系,合理的对集成检测平台100进行配置。例如,检测系统10采用测量精度相对较低的偏心检测单元11 和间隔检测单元12,可单纯使用机械接触式检测单元13即可;调节系统20中的上层偏心驱动单元212、下层偏心驱动单元213以及倾斜调节驱动单元222采用低分辨率的手动微分头或普通电机驱动机构进行驱动调节;带导轨立柱31所用导轨采用直线导轨与滚珠丝杠配合等类似的机械方式进行导向和驱动;带导轨立柱31和基台33等可采用铸铁或铝制型材等材质;支撑腿34可采用隔振等级不高的被动型隔振器或不采取隔振的方式直接支撑;旋转台35采用普通机械转台和精度较低的角度光栅尺进行角度和速度的测量等。In this application example, when the integrated detection accuracy of the mobile phone lens, the camera lens, and the like is not high, the relationship between the accuracy requirement, the efficiency, and the cost is comprehensively considered, and the integrated detection platform 100 is configured reasonably. For example, the detection system 10 employs an eccentricity detecting unit 11 having a relatively low measurement accuracy. And the interval detecting unit 12 can simply use the mechanical contact detecting unit 13; the upper eccentric driving unit 212, the lower eccentric driving unit 213, and the tilt adjusting driving unit 222 in the adjusting system 20 adopt a low resolution manual differential head or a common The motor drive mechanism is driven and adjusted; the guide rails for the guide rails 31 are guided and driven by a mechanical mechanism such as a linear guide and a ball screw; and the guide rails 31 and the base 33 can be made of cast iron or aluminum profiles; The support leg 34 can be directly supported by a passive vibration isolator with a low vibration isolation level or without vibration isolation; the rotary table 35 uses an ordinary mechanical turntable and a lower precision angular scale to measure the angle and speed.
第三应用例Third application example
本应用例为光学集成检测平台100应用于胶合镜的装配。This application example is an assembly of an optical integrated inspection platform 100 for a glue mirror.
如图6所示,本应用例中,将两个或多个光学镜片的光轴通过检测和调整,使所有镜片的光轴共轴,镜片光轴之间的相对夹角符合装配指标需求。在集成检测平台的设置上,主要依靠偏心检测单元11对各个镜片的光轴进行检测,通过偏心调节机构21分别将各个待调整镜片调至与旋转台35的旋转中心共轴,并通过元件取放单元41和注胶与固化单元42配合完成镜片间的注胶与固化环节。As shown in FIG. 6, in the application example, the optical axes of two or more optical lenses are detected and adjusted so that the optical axes of all the lenses are coaxial, and the relative angle between the optical axes of the lenses meets the assembly index requirements. In the setting of the integrated detection platform, the optical axis of each lens is mainly detected by the eccentricity detecting unit 11, and each of the to-be-adjusted lenses is respectively adjusted to be coaxial with the rotation center of the rotary table 35 by the eccentric adjustment mechanism 21, and is taken by the component. The discharge unit 41 and the glue injection and curing unit 42 cooperate to complete the injection and solidification steps between the lenses.
第四应用例Fourth application example
本应用例为光学集成检测平台100应用于非球面镜片的楔角测量。This application example is an optical integrated detection platform 100 applied to the wedge angle measurement of an aspherical lens.
如图7所示,本应用例中,非球面镜片的楔角测量,即测量所加工镜片非球面旋转对称轮廓与镜片自身光轴之间的偏离程度。利用偏心检测单元11对镜片的光轴进行检测,通过调节系统20对镜片进行偏心和倾斜的调整,不同的是对单个镜片的检测而言,偏心驱动单元只需要进行单层布置,三个驱动器沿圆周方向间隔120°均匀分布即可。将镜片光轴调好之后,在旋转台35的配合下通过机械非接触式检测单元14对非球面镜片进行扫略检测,从而完成非球面镜片的楔角测量。上述方式同样适用于镜片轮廓测量需求。As shown in Fig. 7, in this application example, the wedge angle measurement of the aspherical lens measures the degree of deviation between the aspherical rotationally symmetric profile of the processed lens and the optical axis of the lens itself. The optical axis of the lens is detected by the eccentricity detecting unit 11, and the lens is eccentrically and tilted by the adjustment system 20, except that for the detection of a single lens, the eccentric drive unit only needs to be arranged in a single layer, three drivers It is evenly distributed at intervals of 120° in the circumferential direction. After the optical axis of the lens is adjusted, the aspherical lens is scanned by the mechanical non-contact detecting unit 14 under the cooperation of the rotating table 35, thereby completing the wedge angle measurement of the aspherical lens. The above approach is equally applicable to lens profile measurement needs.
第五应用例Fifth application example
本应用例为光学集成检测平台100应用于镜头的装配。This application example is an optical integrated detection platform 100 applied to the assembly of a lens.
如图8所示,本应用例中,对多个镜组进行组装,完成镜组间的相对偏心位置、相对角度位置调节以及多个镜组内镜片间隔的测量等。在偏心 检测单元11的测量下,通过调节系统20对最底层的第一级镜组调平并将镜组的光轴调整至旋转台35的旋转中心,将第二级镜组置于第一级镜组之上,通过偏心调节机构21将第二级镜组的光轴调至旋转中心,与第一级镜组的光轴共轴。在位置标记单元43的指示下,完成两级镜组间的相对角度调节。通过厚度与间隔检测单元12测量两个镜组的镜片厚度以及两个镜片之间的间隔距离,以此类推,实现整个镜头在集成检测平台下的装配。As shown in FIG. 8, in this application example, a plurality of mirror groups are assembled, and the relative eccentric position between the mirror groups, the relative angular position adjustment, and the measurement of the lens spacing in the plurality of mirror groups are completed. Eccentric Under the measurement of the detecting unit 11, the lowermost first stage mirror is leveled by the adjustment system 20 and the optical axis of the mirror is adjusted to the rotation center of the rotary table 35, and the second stage lens is placed in the first stage mirror. Above the group, the optical axis of the second stage lens set is adjusted to the center of rotation by the eccentric adjustment mechanism 21, and is coaxial with the optical axis of the first stage lens group. Under the direction of the position marking unit 43, the relative angle adjustment between the two stages of mirrors is completed. The thickness of the lens groups of the two mirror groups and the separation distance between the two lenses are measured by the thickness and interval detecting unit 12, and so on, so that the assembly of the entire lens under the integrated inspection platform is achieved.
至此,已经结合附图对本发明多个实施例进行了详细描述。依据以上描述,本领域技术人员应当对本发明光学集成检测平台有了清楚的认识。Heretofore, various embodiments of the present invention have been described in detail in conjunction with the drawings. Based on the above description, those skilled in the art should have a clear understanding of the optical integrated detection platform of the present invention.
应注意,附图中各部件的形状和尺寸不反映真实大小和比例,而仅示意本发明实施例的内容。It should be noted that the shapes and sizes of the various components in the drawings do not reflect the true size and proportions, but merely illustrate the contents of the embodiments of the present invention.
实施例中提到的方向用语,例如“上”、“下”、“前”、“后”、“左”、“右”等,仅是参考附图的方向,并非用来限制本发明的保护范围。并且上述实施例可基于设计及可靠度的考虑,彼此混合搭配使用或与其他实施例混合搭配使用,即不同实施例中的技术特征可以自由组合形成更多的实施例。The directional terms mentioned in the embodiments, such as "upper", "lower", "front", "back", "left", "right", etc., are merely referring to the directions of the drawings, and are not intended to limit the invention. protected range. The above embodiments may be used in combination with other embodiments or based on design and reliability considerations, that is, the technical features in different embodiments may be freely combined to form more embodiments.
需要说明的是,在附图或说明书正文中,未绘示或描述的实现方式,均为所属技术领域中普通技术人员所知的形式,并未进行详细说明。此外,上述对各元件和方法的定义并不仅限于实施例中提到的各种具体结构、形状或方式,本领域普通技术人员可对其进行简单地更改或替换。It should be noted that the implementations that are not shown or described in the drawings or the text of the specification are all known to those of ordinary skill in the art and are not described in detail. In addition, the above definitions of the various elements and methods are not limited to the specific structures, shapes or manners mentioned in the embodiments, and those skilled in the art can simply modify or replace them.
以上所述的具体实施例,对本发明的目的、技术方案和有益效果进行了进一步详细说明,应理解的是,以上所述仅为本发明的具体实施例而已,并不用于限制本发明,凡在本发明的精神和原则之内,所做的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。 The specific embodiments of the present invention have been described in detail in the foregoing detailed description of the embodiments of the present invention. All modifications, equivalents, improvements, etc., made within the spirit and scope of the invention are intended to be included within the scope of the invention.

Claims (19)

  1. 一种光学集成检测平台(100),其中,包括:An optical integrated detection platform (100), comprising:
    平台主体框架(30),用于支撑其他组件;a platform body frame (30) for supporting other components;
    检测系统(10),用于对光学元件或机械元件进行检测;a detection system (10) for detecting an optical component or a mechanical component;
    调节系统(20),用于基于所述检测对所述光学元件或机械元件进行位置调节;以及An adjustment system (20) for positionally adjusting the optical or mechanical component based on the detecting;
    装配系统(40),用于光学元件和/或机械元件的装配。Assembly system (40) for assembly of optical components and/or mechanical components.
  2. 根据权利要求1所述的光学集成检测平台,其中,所述平台主体框架(30)包括:The optical integrated inspection platform of claim 1 wherein said platform body frame (30) comprises:
    基台(33);以及Abutment (33);
    旋转台(35),设置在基台(33)上,能够绕通过旋转台(35)中心的旋转轴相对于基台(33)旋转。The rotary table (35) is disposed on the base (33) and is rotatable relative to the base (33) about a rotation axis passing through the center of the rotary table (35).
  3. 根据权利要求2所述的光学集成检测平台,其中,所述检测系统(10)包括可拆卸的:The optical integrated inspection platform of claim 2 wherein said detection system (10) comprises a detachable:
    偏心检测单元(11),与所述旋转台(35)共轴,用于对光学元件进行偏心检测;An eccentricity detecting unit (11) coaxial with the rotating table (35) for performing eccentricity detection on the optical component;
    厚度与间隔检测单元(12),与所述旋转台(35)共轴,用于检测光学元件的厚度及间隔;a thickness and interval detecting unit (12) coaxial with the rotating table (35) for detecting the thickness and spacing of the optical element;
    机械接触式检测单元(13),用于对光学元件或机械元件进行快速检测;和/或Mechanical contact detection unit (13) for rapid detection of optical or mechanical components; and/or
    机械非接触式检测单元(14),用于对光学元件或机械元件进行精细检测。A mechanical non-contact detection unit (14) for fine inspection of optical or mechanical components.
  4. 根据权利要求3所述的光学集成检测平台,其中,所述平台主体框架(30)还包括:The optical integrated detection platform of claim 3, wherein the platform body frame (30) further comprises:
    带导轨立柱(31),设置在基台(33)上,包括平行于所述旋转轴第一导轨和第二导轨;a guide rail (31), disposed on the base (33), comprising a first rail and a second rail parallel to the rotating shaft;
    支架(36),第一端部通过所述第一导轨耦接与所述带导轨立柱(31),第二端部位于旋转台(35)的旋转中心的上方;以及a bracket (36), the first end portion is coupled to the belt rail column (31) through the first rail, and the second end portion is located above a rotation center of the rotating table (35);
    升降台(32),通过带导轨立柱(31)上的平行于旋转轴的第二导轨 (312)与所述带导轨立柱(31)耦接,a lifting platform (32) passing through a second rail parallel to the rotating shaft on the rail column (31) (312) coupled to the rail-mounted column (31),
    所述偏心检测单元(11),设置在所述支架(36)的第二端部,所述厚度与间隔检测单元(12),设置在基台(33)下部,所述机械接触式检测单元(13)及所述机械非接触式检测单元(14)设置在所述升降台(32)上。The eccentricity detecting unit (11) is disposed at a second end of the bracket (36), and the thickness and interval detecting unit (12) is disposed at a lower portion of the base (33), the mechanical contact detecting unit (13) and the mechanical non-contact detecting unit (14) are disposed on the lifting platform (32).
  5. 根据权利要求4所述的光学集成检测平台,其中,The optical integrated detection platform according to claim 4, wherein
    所述偏心检测单元(11)包括依次靠近旋转台(35)设置的传感器、光源(111)、准直镜组(112)以及变焦镜头(113)。The eccentricity detecting unit (11) includes a sensor, a light source (111), a collimator lens group (112), and a zoom lens (113) which are disposed in close proximity to the rotary table (35).
  6. 根据权利要求4所述的光学集成检测平台,其中,所述厚度与间隔检测单元(12)包括:The optical integrated detection platform according to claim 4, wherein said thickness and interval detecting unit (12) comprises:
    机械夹持机构(123),设置在所述基台(33)下部;a mechanical clamping mechanism (123) disposed at a lower portion of the base (33);
    第三导轨(122),在所述机械夹持机构(123)内壁上沿平行于所述旋转轴的方向设置;以及a third rail (122) disposed on an inner wall of the mechanical clamping mechanism (123) in a direction parallel to the rotation axis;
    定位传感器(121),通过与第三导轨(122)与机械夹持机构(123)耦接,a positioning sensor (121) coupled to the third rail (122) and the mechanical clamping mechanism (123),
    所述基台(33)和所述旋转台(35)分别设置有第一通孔(331)和第二通孔(351),同样保障厚度与间隔检测单元(12)的检测光路,所述第一通孔(331)和第二通孔(351)与所述旋转台(35)共轴。The base (33) and the rotating table (35) are respectively provided with a first through hole (331) and a second through hole (351), and the detection light path of the thickness and interval detecting unit (12) is also ensured. The first through hole (331) and the second through hole (351) are coaxial with the rotating table (35).
  7. 根据权利要求4所述的光学集成检测平台,其中,所述机械接触式检测单元(13)包括接触式测头(131)、万向节(132)以及测头底座(133),所述接触式测头(131)包括电感式测头、LVDT直线位移传感器测头或百分表。The optical integrated detection platform according to claim 4, wherein said mechanical contact detecting unit (13) comprises a contact type probe (131), a universal joint (132), and a probe base (133), said contact The probe (131) includes an inductive probe, an LVDT linear displacement sensor probe or a dial indicator.
  8. 根据权利要求4所述的光学集成检测平台,其中,所述机械非接触式检测单元(14)包括非接触测头(141)、测头导轨(142)和测头机械底座(143),所述非接触测头(141)指向旋转台(35)的旋转中心设置,并可沿指向旋转台(35)的旋转中心设置的测头导轨(142)远离或靠近旋转中心运动。The optical integrated detection platform according to claim 4, wherein said mechanical non-contact detecting unit (14) comprises a non-contact probe (141), a probe rail (142) and a probe mechanical base (143). The non-contact probe (141) is pointed toward the center of rotation of the rotary table (35) and is movable away from or near the center of rotation along the probe rail (142) disposed toward the center of rotation of the rotary table (35).
  9. 根据权利要求2所述的光学集成检测平台,其中,所述调节系统(20)设置在所述旋转台(35)上,包括:The optical integrated detection platform according to claim 2, wherein the adjustment system (20) is disposed on the rotating table (35), comprising:
    偏心调节机构(21),用于对光学元件或机械元件进行偏心调节; An eccentric adjustment mechanism (21) for eccentrically adjusting an optical component or a mechanical component;
    倾斜调节机构(22),用于对光学元件或机械元件进行倾斜调节;以及a tilt adjustment mechanism (22) for tilting an optical component or a mechanical component;
    光学元件支撑机构(23),用于支撑光学元件。An optical element supporting mechanism (23) for supporting the optical element.
  10. 根据权利要求9所述的光学集成检测平台,其中,所述偏心调节机构(21)包括:The optical integrated detection platform according to claim 9, wherein the eccentricity adjustment mechanism (21) comprises:
    偏心调节基板(211),设置在所述倾斜调节机构(22)上;以及An eccentric adjustment substrate (211) disposed on the tilt adjustment mechanism (22);
    上层偏心驱动单元(212)和/或下层偏心驱动单元(213),设置在所述偏心调节基板(211),对光学元件和/或机械元件进行偏心调节。An upper eccentric drive unit (212) and/or a lower eccentric drive unit (213) are disposed on the eccentric adjustment substrate (211) to eccentrically adjust the optical element and/or the mechanical element.
  11. 根据权利要求10所述的光学集成检测平台,其中,所述上层偏心驱动单元(212)以及下层偏心驱动单元(213)均包括:The optical integrated detection platform according to claim 10, wherein the upper eccentric drive unit (212) and the lower eccentric drive unit (213) each comprise:
    至少一个径向位移驱动器(2121、2131),以及支撑所述径向位移驱动器(2121、2131)的至少一个驱动器立柱(2122、2132),所述至少一个径向位移驱动器(2121、2131)沿周向均匀间隔分布。At least one radial displacement drive (2121, 2131), and at least one drive post (2122, 2132) supporting the radial displacement drive (2121, 2131), the at least one radial displacement drive (2121, 2131) along The circumferential direction is evenly spaced.
  12. 根据权利要求10所述的光学集成检测平台,其中,倾斜调节机构(22)包括:The optical integrated detection platform of claim 10, wherein the tilt adjustment mechanism (22) comprises:
    倾斜调节基板(221),设置在所述旋转台(35)上;Tilting the adjustment substrate (221), disposed on the rotating table (35);
    至少一个球窝配合单元(223),设置在所述倾斜调节基板(221)上,并支撑所述偏心调节机构(21);以及At least one ball and socket fitting unit (223) disposed on the tilt adjustment substrate (221) and supporting the eccentric adjustment mechanism (21);
    至少一个倾斜调节驱动单元(222),设置在相应球窝配合单元(223)上,包括径向位移驱动器和输出换向机构。At least one tilt adjustment drive unit (222) is disposed on the corresponding ball and socket mating unit (223), including a radial displacement drive and an output reversing mechanism.
  13. 根据权利要求12所述的光学集成检测平台,其中,光学元件支撑机构(23)包括:The optical integrated detection platform according to claim 12, wherein the optical element supporting mechanism (23) comprises:
    光学元件升降单元(232),设置在所述倾斜调节基板(221)上,用于沿旋转轴方向升降;以及An optical element lifting unit (232) disposed on the tilt adjustment substrate (221) for lifting in a direction of a rotation axis;
    光学元件支撑单元(231),设置在所述光学元件升降单元(232)上,用于支撑光学元件,An optical element supporting unit (231) disposed on the optical element lifting unit (232) for supporting the optical element,
    所述偏心调节基板(211)设置有避免与所述光学元件升降单元(232)及光学元件支撑单元(231)干涉的第三通孔(2111),所述倾斜调节基板(221)、光学元件支撑单元(231)及光学元件升降单元(232)均设与所述旋转轴共轴的通孔保障间隔检测单元(12)的检测光路。 The eccentric adjustment substrate (211) is provided with a third through hole (2111) for avoiding interference with the optical element lifting unit (232) and the optical element supporting unit (231), the tilt adjusting substrate (221), the optical element The support unit (231) and the optical element lifting unit (232) are each provided with a detection optical path of the through hole security interval detecting unit (12) coaxial with the rotating shaft.
  14. 根据权利要求4所述光学集成检测平台,其中,所述装配系统(40)包括可拆卸的:The optical integrated inspection platform of claim 4 wherein said assembly system (40) comprises a detachable:
    元件取放单元(41),用于取放光学元件和/或机械元件;a component pick-and-place unit (41) for picking up and placing optical components and/or mechanical components;
    注胶与固化单元(42),用于镜组集成的注胶和固化;Injection molding and curing unit (42) for injection molding and curing of the mirror assembly;
    位置标记单元(43),用于提供方位基准并标装配元件间的位置关系;和/或a position marking unit (43) for providing an orientation reference and a positional relationship between the components; and/or
    清洁单元(44),用于获取洁净集成检测环境。A cleaning unit (44) for obtaining a clean integrated detection environment.
  15. 根据权利要求14所述光学集成检测平台,其中,所述元件取放单元(41)设置在基台(33)上,包括:The optical integrated detection platform according to claim 14, wherein the component pick-and-place unit (41) is disposed on the base (33), and includes:
    机械元件取放工装(411),采用机械夹持的方式取放所述机械元件;a mechanical component pick-and-place tool (411) for picking up and placing the mechanical component by mechanical clamping;
    光学元件取放工装(412),采用机械夹持或真空吸附的方式取放所述光学元件;以及An optical component pick-and-place tool (412) for picking up the optical component by mechanical clamping or vacuum suction;
    取放机械臂(413),支撑所述机械元件取放工装(411)及光学元件取放工装(412)。The pick-and-place robot arm (413) supports the mechanical component pick-and-place tool (411) and the optical component pick-and-place tool (412).
  16. 根据权利要求14所述光学集成检测平台,其中所述注胶与固化单元(42)设置在所述升降台(32)上,包括:The optical integrated detection platform according to claim 14, wherein the glue injection and curing unit (42) is disposed on the lifting platform (32), comprising:
    注胶笔(422),用于在气压控制下出胶形成点状、线状或面状的结构胶形态;A glue pen (422) for forming a point, line or surface structural adhesive form under pressure control;
    注胶控制器(423),设置在升降台(32)下表面,对控制所述注胶笔(422)进行控制;以及a glue injection controller (423) disposed on a lower surface of the lifting platform (32) for controlling the injection molding pen (422);
    固化灯(421),用于对胶合后的光学元件进行固化。A curing lamp (421) for curing the glued optical component.
  17. 根据权利要求14所述光学集成检测平台,其中,The optical integrated detection platform according to claim 14, wherein
    所述位置标记单元(43)设置在所述升降台(32)上,包括:The position marking unit (43) is disposed on the lifting platform (32) and includes:
    标记激光器(431),其出射光线对准所述旋转轴;以及Marking a laser (431) with an exiting ray directed at the axis of rotation;
    支撑架(432),支撑所述标记激光器(431)。A support frame (432) supports the marking laser (431).
  18. 根据权利要求14所述光学集成检测平台,其中,所述清洁单元(44)包括:The optical integrated inspection platform of claim 14 wherein said cleaning unit (44) comprises:
    清洁吸头(441),设置在所述升降台(32)下表面上,通过吸附或吹气方式去除异物;以及a cleaning tip (441) disposed on a lower surface of the lifting platform (32) to remove foreign matter by adsorption or blowing;
    清洁控制器(442),设置在所述基台(33)侧壁上,对所述清洁吸头 (441)进行控制。a cleaning controller (442) disposed on a side wall of the base (33) for the cleaning tip (441) Control.
  19. 根据权利要求2所述的光学集成检测平台,其中,所述平台主体框架(30)还包括:The optical integrated detection platform of claim 2, wherein the platform body frame (30) further comprises:
    支撑腿(34),用于支撑基台(33),所述支撑腿(34)包括:A support leg (34) for supporting the abutment (33), the support leg (34) comprising:
    机械腿(342),用于起到支撑作用;Mechanical legs (342) for supporting purposes;
    隔震器(341),设置在所述机械腿(342)和基台(33)之间,用于屏蔽振动干扰。 A vibration isolator (341) is disposed between the mechanical leg (342) and the base (33) for shielding vibration interference.
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CN112924140A (en) * 2021-01-19 2021-06-08 北方夜视技术股份有限公司 Axial vertical alignment device and method for porous optical element channel hole
CN114354110A (en) * 2021-12-30 2022-04-15 中国科学院长春光学精密机械与物理研究所 Multidimensional micro-vibration simulator
CN114383512A (en) * 2021-12-03 2022-04-22 西安应用光学研究所 Optical machine dimension measuring device and calibration method for optical lens
CN114485343A (en) * 2021-12-20 2022-05-13 无锡鹰贝精密液压有限公司 Check tool for detecting sealing spherical surface of one-way valve element
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CN109270651A (en) * 2018-11-06 2019-01-25 中国工程物理研究院激光聚变研究中心 A kind of offline precision assembly system of optical elements of large caliber automation
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CN109324421A (en) * 2018-12-06 2019-02-12 中国航空工业集团公司洛阳电光设备研究所 A kind of debugging device and Method of Adjustment of off-axis formula optical system light path
CN109473372A (en) * 2018-12-19 2019-03-15 长安大学 A kind of LED electrode automatic detection platform
CN109764811A (en) * 2019-02-27 2019-05-17 深圳市圆梦精密技术研究院 Tool dimension detection machine
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CN111693253B (en) * 2020-06-23 2023-04-07 中国核动力研究设计院 Pressure vessel owner bolt hole detection device
CN111693253A (en) * 2020-06-23 2020-09-22 中国核动力研究设计院 Pressure vessel owner bolt hole detection device
CN112305775A (en) * 2020-12-09 2021-02-02 核工业理化工程研究院 Optical element assembling device and method based on low-temperature brazing
CN112880737A (en) * 2021-01-14 2021-06-01 四川雅吉芯电子科技有限公司 Integrated system for detecting monocrystalline silicon epitaxial wafer
CN112924140A (en) * 2021-01-19 2021-06-08 北方夜视技术股份有限公司 Axial vertical alignment device and method for porous optical element channel hole
CN114383512A (en) * 2021-12-03 2022-04-22 西安应用光学研究所 Optical machine dimension measuring device and calibration method for optical lens
CN114485343A (en) * 2021-12-20 2022-05-13 无锡鹰贝精密液压有限公司 Check tool for detecting sealing spherical surface of one-way valve element
CN114485343B (en) * 2021-12-20 2023-08-18 无锡鹰贝精密液压有限公司 Check tool for check valve element sealing spherical surface detection
CN114354110A (en) * 2021-12-30 2022-04-15 中国科学院长春光学精密机械与物理研究所 Multidimensional micro-vibration simulator
CN114624243A (en) * 2022-04-11 2022-06-14 南通新韦纳机械科技有限公司 Automobile parts surface defect detection device
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