WO2018095092A1 - 测量功耗的方法、装置和计算机存储介质 - Google Patents

测量功耗的方法、装置和计算机存储介质 Download PDF

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Publication number
WO2018095092A1
WO2018095092A1 PCT/CN2017/099243 CN2017099243W WO2018095092A1 WO 2018095092 A1 WO2018095092 A1 WO 2018095092A1 CN 2017099243 W CN2017099243 W CN 2017099243W WO 2018095092 A1 WO2018095092 A1 WO 2018095092A1
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tested
target
power consumption
voltage
trace
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PCT/CN2017/099243
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English (en)
French (fr)
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潘敏
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深圳市中兴微电子技术有限公司
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R21/00—Arrangements for measuring electric power or power factor
    • G01R21/06—Arrangements for measuring electric power or power factor by measuring current and voltage

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  • the present invention relates to the field of electronic automated measurement technologies, and in particular, to a method, apparatus, and computer storage medium for measuring power consumption.
  • Power consumption measurement has always been one of the key projects in the development of system boards, terminal boards or chips. It is also one of the indispensable items. In order to meet the requirements of energy saving, green and environmental protection, the power consumption requirements for boards and chips are more. The higher the power consumption, the more important it is to measure power consumption.
  • the first one is to supply the power supply of the single board or the chip with the voltage regulator source, and read the current value on the voltage regulator source to obtain the single board or the chip.
  • the current of the power supply is used to calculate the power consumption; the second is to calculate the power consumption by taking the current meter in series on the branch to obtain the current.
  • Embodiments of the present invention are directed to a method, apparatus, and computer storage medium for measuring power consumption to enable automated measurement of power consumption and to improve stability and accuracy of power consumption measurements.
  • An embodiment of the present invention provides a method for measuring power consumption, where the method includes:
  • said method further comprising:
  • the method before the obtaining the power supply output voltage V 1 and the power input terminal voltage V 2 of the target to be tested, the method further includes:
  • the power-on target is set according to a power-on timing rule.
  • the method further includes:
  • determining, according to a comparison result of the V 2 and the set voltage V 0 of the target to be tested, whether to adjust the V 1 includes:
  • V 2 is equal to the V 0 , and if the V 2 is not equal to the V 0 , the V 1 is adjusted until the V 2 is equal to Said V 0 ;
  • the method further includes:
  • the power consumption of the target to be tested is saved, and the output shows the power consumption of the target to be tested.
  • the determining a trace DC equivalent resistance R 1 of the target to be tested and a package point DC equivalent resistance R 2 of the target to be tested includes:
  • R 1 ⁇ 1 L / ( 0.03W) calculating said R 1, wherein, ⁇ 1 is the resistivity traces, L is the length of the trace, W is track width;
  • R 2 ⁇ 2 h / ⁇ r 2 is calculated to obtain the R 2, wherein, ⁇ 2 is the resistivity of the package points, h is the radius of the point of packaging, r is the radius of the package pads point;
  • the current I of the trace of the object to be tested according to the V 1 , V 2 , and R 1 includes:
  • the obtaining the actual voltage V 3 that reaches the target to be tested according to the V 1 , V 2 , R 1 , R 2 , and I includes:
  • V3 (V 2 - IR 2 ).
  • An embodiment of the present invention further provides an apparatus for measuring power consumption, where the apparatus includes:
  • a determining module configured to determine a trace DC equivalent resistance R 1 of the target to be tested and a package point DC equivalent resistance R 2 of the target to be tested;
  • Obtaining a module configured to obtain a power output terminal voltage V 1 and a power input terminal voltage V 2 of the target to be tested;
  • a processing module configured in accordance with the current I V 1, V 2, R 1 to obtain the alignment of the object to be measured; according to the V 1, V 2, R 1 , R 2, I to be obtained reaches the The actual voltage V 3 of the target is measured; and the power consumption of the target to be tested is obtained according to the V 3 and the I.
  • the processing module is further configured to count at least one of the average power consumption, the maximum power consumption, and the minimum power consumption of the target to be tested in a preset period.
  • the apparatus further includes:
  • the setting module is configured to perform power-on setting on the object to be tested according to the power-on timing rule.
  • the processing module is further configured to determine whether to adjust the V 1 according to a comparison result of the V 2 and the set voltage V 0 of the target to be tested.
  • the processing module is configured to determine whether the difference between the V 2 and the V 0 exceeds a preset threshold range, and if the difference exceeds a preset threshold range, adjust the V 1 Until the difference between the V 2 and the V 0 does not exceed the preset threshold range;
  • V 2 is equal to the V 0 , and if the V 2 is not equal to the V 0 , the V 1 is adjusted until the V 2 is equal to Said V 0 ;
  • V 2 is equal to the V 0 , the V 1 is not adjusted.
  • the apparatus further includes:
  • An output module configured to save power consumption of the target to be tested, and output display power consumption of the target to be tested.
  • An embodiment of the present invention further provides an apparatus for measuring power consumption, comprising: a processor and a memory for storing a computer program capable of running on a processor, wherein the processor is used for transporting When the computer program is executed, the steps of the method for measuring power consumption according to the embodiment of the present invention are performed.
  • the embodiment of the invention further provides a computer storage medium, wherein the computer storage medium stores computer executable instructions, and the computer executable instructions are used to execute the method for measuring power consumption according to the embodiment of the invention.
  • the method, device and computer storage medium for measuring power consumption determine the power supply line equivalent resistance R 1 of the target to be tested and the DC equivalent resistance R 2 of the package point of the object to be tested;
  • the output terminal voltage V 1 and the power input terminal voltage V 2 of the target to be tested obtaining the current I of the trace of the target to be tested according to the V 1 , V 2 , and R 1 ; according to the V 1 , V 2 , R 1 , R 2 , I obtain the actual voltage V 3 reaching the target to be tested; obtain the power consumption of the target to be tested according to the V 3 and the I; fully consider the working process of the target to be tested
  • the voltage is lost and no need for the staff to read the measurement data, thus achieving automatic measurement of power consumption and improved stability and accuracy of measurement power consumption.
  • Embodiment 1 is a flow chart of Embodiment 1 of a method for measuring power consumption according to the present invention
  • Embodiment 2 is a flowchart of Embodiment 2 of a method for measuring power consumption according to the present invention
  • Embodiment 3 is a display diagram of real-time values of measurement results of Embodiment 2 of a method for measuring power consumption according to the present invention
  • Embodiment 4 is a statistical display diagram of measurement results of Embodiment 2 of a method for measuring power consumption according to the present invention
  • FIG. 5 is a schematic structural diagram of an apparatus for measuring power consumption according to the present invention.
  • FIG. 1 is a flowchart of Embodiment 1 of a method for measuring power consumption according to the present invention. As shown in FIG. 1 , a method for measuring power consumption provided by an embodiment of the present invention may include the following steps:
  • Step 101 Determine a trace DC equivalent resistance R 1 of the target to be tested and a package point DC equivalent resistance R 2 of the target to be tested.
  • the method for measuring power consumption in the embodiment of the present invention can be applied to a device for measuring power consumption; the device for measuring power consumption determines a DC equivalent resistance R 1 of a target to be tested and a DC equivalent resistance of a package point of the target to be tested. R 2 ;
  • the material, resistivity, width and length of the power trace on the target to be tested can be obtained by extracting the source file of the target to be tested in advance.
  • At least one of the information can calculate the DC equivalent resistance R 1 of the target to be tested according to the extracted correlation; and the DC equivalent resistance R 2 of the package point of the target to be tested can be previously provided by the package provided by the package manufacturer
  • the point related information obtains at least one of information such as material, resistivity, ball diameter and pad diameter of the package point of the target to be tested, and the DC equivalent resistance of the package point of the object to be tested can be calculated according to the extracted related information. R 2 .
  • the target to be tested includes any type of single board or any type of chip.
  • Step 102 acquires the power input terminal voltage V2 1 of the object to be measured and the power supply output voltage V.
  • the device for measuring power consumption obtains the power output terminal voltage V 1 at a certain power supply output end, and obtains the power input terminal voltage V 2 of the target to be tested at the power pin input end of the tested chip.
  • Step 103 Obtain a current I of the trace of the target to be tested according to the V 1 , V 2 , and R 1 .
  • the relationship between the voltage, the resistance and the current is used to calculate the current I of the trace of the target to be tested.
  • Step 104 Obtain an actual voltage V 3 that reaches the target to be tested according to the V 1 , V 2 , R 1 , R 2 , and I.
  • V 1 , V 2 , R 1 , R 2 , and I calculated according to the above steps calculate the actual voltage V 3 reaching the object to be tested by using the theorem of the series circuit current.
  • Step 105 the I V 3 obtained according to the power consumption of the object to be measured.
  • the power consumption of the target to be tested is calculated according to the relationship between power consumption, voltage, and current.
  • the method for measuring power consumption determines the DC equivalent resistance R 1 of the target to be tested and the DC equivalent resistance R 2 of the package point of the target to be tested; and obtains the voltage V 1 of the power output terminal and the object to be measured input power supply voltage V 2; according to the V 1, V 2, R 1 of the object to be measured to obtain a current trace I; according to the V 1, V 2, R 1 , R 2 , I obtain the actual voltage V 3 reaching the target to be tested; obtain the power consumption of the target to be tested according to the V 3 and the I; fully consider the voltage loss during the working process of the target to be tested, and do not need to work The personnel read the measurement data, thus achieving automatic measurement of power consumption and improved stability and accuracy of measurement power consumption.
  • Embodiment 2 is a flowchart of Embodiment 2 of a method for measuring power consumption according to the present invention. As shown in FIG. 2, the method for measuring power consumption provided by the embodiment of the present invention may include the following steps:
  • Step 201 Determine a trace DC equivalent resistance R 1 of the target to be tested and a package point DC equivalent resistance R 2 of the target to be tested.
  • the trace copper of the board to be tested is usually 1 oz, the corresponding thickness is 0.035 mm for the international unit, and the thickness is only 0.03 mm after processing.
  • the trace width is W
  • the DC of the board to be tested is DC.
  • ⁇ 1 is the resistivity of copper
  • ⁇ 1 0.0175 ⁇ mm 2 / m
  • L is the length of the trace
  • W is the trace Width; the width and length of the power trace on the board to be tested can be obtained by extracting the source data file.
  • the coreVDD trace width of a board is 100 mils, and the effective length of the trace is 5000 mil, which is converted to the international length unit.
  • W 2.54 mm
  • the entire power supply trace contains more segments, it should be routed according to each segment of the light painting file.
  • the size of the segment is calculated, and finally the data of each segment is accumulated to obtain the actual DC link equivalent resistance value of the power supply trace.
  • solder ball components which need to be packaged.
  • the factory knows the solder ball composition on the board to be tested; taking the solder ball of Sn63Pb37 as an example, the resistivity of tin is 0.113 ⁇ mm 2 /m, and the resistivity of lead is 0.2068 ⁇ mm 2 /m, and the solder ball of Sn63Pb37 composition can be obtained.
  • Step 202 Perform power-on setting on the object to be tested according to a power-on sequence rule.
  • the power-on module of the device for measuring power consumption delays (t 1 /t 2 /.../t n ) between the voltages set by the worker, the measured voltage value V 0 , and the equivalent resistance value R 1
  • the script of ⁇ R 2 and other parameters is downloaded to the processing module, and different voltage power-on sequence and voltage value setting are implemented according to the predetermined value of the test plan.
  • the prior art generally controls the voltage regulator source manually by the measuring personnel. If there are many types of power sources to be tested, the power-on timing cannot be well controlled, and if it does not meet the requirements, it may appear. The system does not work or the operation is unstable, and there is a certain risk.
  • the power-on module is controlled by the power-on module, and the power-on sequence is controlled. The stability of the test.
  • Step 203 Acquire a power output terminal voltage V 1 and a power input terminal voltage V 2 of the target to be tested.
  • the voltage sampling module of the device for measuring power consumption obtains the power output terminal voltage V 1 and the power input terminal voltage V 2 of the target to be tested; for example, the voltage sampling module includes two precision probes capable of adjusting the position and a high gain connected thereto A low-noise amplifier and analog-to-digital converter that accurately samples the voltage of the circuit being measured.
  • a plurality of voltage sampling modules corresponding to a plurality of targets to be tested may be disposed in the device for measuring power consumption, so that different targets to be tested may be simultaneously measured.
  • Step 204 determine whether to adjust the V 1 V 2 based on the comparison result of the object to be measured is set voltage V 0.
  • the device for measuring power consumption determines whether to adjust V 1 according to the comparison result of V 2 and the set voltage V 0 of the target to be tested; specifically, whether the difference between V 2 and V 0 exceeds a preset threshold range, and if the difference exceeds a predefined threshold, adjusting the difference V 1 and V 2 V 0 until the date does not exceed the predetermined threshold range;
  • the predetermined threshold range may be set according to actual demand, not limited thereto;
  • V 2 is equal to V 0 so far; if V 2 is equal to 0 V, not adjusted V 1 ; Calculate, compare, iteratively control the feedback voltage of the power module, adjust the output voltage value, monitor the line voltage of the target to be detected in real time, and finely adjust the output voltage of the power module in time to monitor the voltage fluctuation to achieve the effect of voltage regulation. Further reducing the loss of the line leads to measurement deviation.
  • Step 205 Obtain a current I of the trace of the target to be tested according to the V 1 , V 2 , and R 1 .
  • Step 206 Obtain an actual voltage V 3 that reaches the target to be tested according to the V 1 , V 2 , R 1 , R 2 , and I.
  • the processing module of the device for measuring power consumption obtains the actual voltage V 3 reaching the object to be tested according to V 1 , V 2 , R 1 , R 2 , I obtained according to the above steps; specifically, the theorem of the current consistency of the series circuit can be known.
  • Step 207 the I V 3 obtained according to the power consumption of the object to be measured.
  • Step 208 Count at least one power consumption information of the average power consumption, the maximum power consumption, and the minimum power consumption of the target to be tested in a preset period.
  • the device for measuring power consumption can calculate at least one power consumption related information of an average power consumption, a maximum power consumption, a minimum power consumption, and the like of the target to be measured in a preset period; wherein the preset period can be set according to actual requirements. There is no limit here.
  • Step 209 Save power consumption of the target to be tested, and output power consumption of the target to be tested.
  • the device for measuring power consumption outputs measured power consumption information, for example, real-time power consumption value, calculated average value, maximum value, minimum value, etc., to a display screen or a terminal for real-time display, and also consumes the power consumption information. Save to storage media for later recall and processing.
  • measured power consumption information for example, real-time power consumption value, calculated average value, maximum value, minimum value, etc.
  • FIG. 3 is a display diagram of the real-time value of the measurement result of the second embodiment of the method for measuring power consumption according to the present invention
  • FIG. 4 is a statistical display diagram of the measurement result of the second embodiment of the method for measuring power consumption according to the present invention
  • FIG. 3 and FIG. The power consumption measurement results and trends of the target to be tested can be clearly seen.
  • the method for measuring power consumption determines the trace DC equivalent resistance R 1 of the target to be tested and the package point DC equivalent resistance R 2 of the target to be tested;
  • the target to be tested is powered on; the power output terminal voltage V 1 and the power input terminal voltage V 2 of the target to be tested are obtained ; and the comparison result of the V 2 and the set voltage V 0 of the target to be tested is determined.
  • the solution provided by the embodiment of the present invention can fully consider the voltage loss during the working process of the target to be tested, and does not require the staff to read the measurement data, thus achieving Automated measurement of power consumption and improved measurement power consumption And accuracy; in addition, by enabling the power-on setting of the target to be measured, the power-on timing is well controlled, the stability of the test can be further ensured, and the feedback voltage of the power module can be adjusted by performing calculation, comparison, and iterative control. Adjust the output voltage value, monitor the line voltage of the target to be detected in real time, and finely adjust the output voltage of the power module in time to monitor the voltage fluctuation to achieve the effect of voltage regulation, further reducing the measurement loss caused by the line loss.
  • FIG. 5 is a schematic structural diagram of an apparatus for measuring power consumption according to the present invention.
  • the apparatus for measuring power consumption provided by the embodiment of the present invention includes: a determining module 51, an obtaining module 52, and a processing module 53;
  • the determining module 51 is configured to determine a trace DC equivalent resistance R 1 of the target to be tested and a package point DC equivalent resistance R 2 of the target to be tested;
  • the obtaining module 52 is configured to obtain a power output terminal voltage V 1 and a power input terminal voltage V 2 of the target to be tested;
  • the processing module 53 configured to the V 1, V 2, R 1 to give the target traces according to the current to be measured I; according to the V 1, V 2, R 1 , R 2, arrive to give The actual voltage V 3 of the target to be tested is obtained according to the V 3 and the I, and the power consumption of the target to be tested is obtained.
  • the processing module 53 is further configured to calculate at least one power consumption information of the average power consumption, the maximum power consumption, and the minimum power consumption of the object to be tested in a preset period.
  • the device further includes: a setting module 54; wherein
  • the setting module 54 is configured to perform power-on setting on the object to be tested according to a power-on sequence rule.
  • the processing module 53 is further configured to determine whether to adjust the V 1 according to a comparison result of the V 2 and the set voltage V 0 of the target to be tested.
  • the processing module 53 is configured to determine whether the difference between the V 2 and the V 0 exceeds a preset threshold range, and if the difference exceeds a preset threshold range, adjust the V 1 until the The difference between V 2 and the V 0 does not exceed the preset threshold range;
  • V 2 is equal to the V 0 , and if the V 2 is not equal to the V 0 , the V 1 is adjusted until the V 2 is equal to Said V 0 ;
  • V 2 is equal to the V 0 , the V 1 is not adjusted.
  • the device further includes: an output module 55; wherein
  • the output module 55 is configured to save power consumption of the target to be tested, and output power consumption of the target to be tested.
  • the device in this embodiment may be used to implement the technical solution of the foregoing method embodiment, and the implementation principle and the technical effect are similar, and details are not described herein again.
  • the determining module 51, the obtaining module 52, the processing module 53, the setting module 54, and the output module 55 may all be processed by a central processing unit (CPU) located in the device 05 for measuring power consumption.
  • CPU central processing unit
  • Realizer Micro Processor Unit, MPU
  • DSP Digital Signal Processor
  • FPGA Field Programmable Gate Array
  • the device for measuring power consumption provided by the foregoing embodiment performs power consumption measurement, only the division of each of the foregoing program modules is illustrated. In actual applications, the foregoing processing may be allocated to different programs according to requirements. Module completion, dividing the internal structure of the device into different Program modules to perform all or part of the processing described above.
  • the apparatus for measuring power consumption provided by the foregoing embodiment is the same as the method embodiment for measuring power consumption, and the specific implementation process is described in detail in the method embodiment, and details are not described herein again.
  • Embodiments of the present invention also provide an apparatus for measuring power consumption, including: a processor and a memory for storing a computer program executable on a processor, wherein the processor is configured to execute when the computer program is executed Determining a trace DC equivalent resistance R 1 of the target to be tested and a package point DC equivalent resistance R 2 of the target to be tested; obtaining a power supply output terminal voltage V 1 and a power input terminal voltage V 2 of the target to be tested ; according to the V 1, V 2, R 1 of the object to be measured to obtain a current trace I; according to the V 1, V 2, R 1 , R 2, we get the actual arrival of the object to be measured Voltage V 3 ; according to the V 3 and the I, the power consumption of the object to be tested is obtained.
  • the processor when the processor is configured to run the computer program, performing: counting at least one of an average power consumption, a maximum power consumption, and a minimum power consumption of the target to be tested in a preset period. information.
  • the processor when used to run the computer program, it is determined whether to determine the V 1 according to a comparison result of the V 2 and the set voltage V 0 of the target to be tested.
  • the processor when configured to run the computer program, it is executed to: determine whether a difference between the V 2 and the V 0 exceeds a preset threshold range, if the difference exceeds a preset threshold range is adjusted until the V 1 V 2 V 0 and the difference value does not exceed the predetermined threshold range so far; if the difference does not exceed the predetermined threshold range, it is determined that V 2 is equal to the The V 0 , if the V 2 is not equal to the V 0 , adjusting the V 1 until the V 2 is equal to the V 0 ; if the V 2 is equal to the V 0 , then not adjusting Said V 1 .
  • the processor when used to run the computer program, perform: The power consumption of the target to be tested is saved, and the output shows the power consumption of the target to be tested.
  • the memory can be implemented by any type of volatile or non-volatile storage device, or a combination thereof.
  • the non-volatile memory may be a Read Only Memory (ROM), a Programmable Read-Only Memory (PROM), or an Erasable Programmable Read (EPROM). Only Memory), Electrically Erasable Programmable Read-Only Memory (EEPROM), Ferromagnetic Random Access Memory (FRAM), Flash Memory, Magnetic Surface Memory , CD-ROM, or Compact Disc Read-Only Memory (CD-ROM); the magnetic surface memory can be a disk storage or a tape storage.
  • the volatile memory can be a random access memory (RAM) that acts as an external cache.
  • RAM Static Random Access Memory
  • SSRAM Synchronous Static Random Access Memory
  • SSRAM Dynamic Random Access
  • DRAM Dynamic Random Access Memory
  • SDRAM Synchronous Dynamic Random Access Memory
  • DDRSDRAM Double Data Rate Synchronous Dynamic Random Access Memory
  • ESDRAM enhancement Synchronous Dynamic Random Access Memory
  • SLDRAM Synchronous Connection Random Access Memory
  • DRRAM Direct Memory Bus Random Access Memory
  • the memory is used to store various types of data to support the operation of the device that measures power consumption. Examples of such data include any computer program for operation on a device that measures power consumption.
  • the operating system includes various system programs, such as a framework layer, a core library layer, a driver layer, and the like, for implementing various basic services and processing hardware-based tasks.
  • the application can include various applications, such as a Media Player, a Browser, etc., for implementing various application services.
  • a program implementing the method of the embodiment of the present invention may be included in an application.
  • the processor may be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above method may be completed by an integrated logic circuit of hardware in a processor or an instruction in a form of software.
  • the above described processor may be a general purpose processor, a DSP, or other programmable logic device, discrete gate or transistor logic device, discrete hardware component, or the like.
  • the processor may implement or perform the methods, steps, and logic blocks disclosed in the embodiments of the present invention.
  • a general purpose processor can be a microprocessor or any conventional processor or the like.
  • the steps of the method disclosed in the embodiment of the present invention may be directly implemented as a hardware decoding processor, or may be performed by a combination of hardware and software modules in the decoding processor.
  • the software module can be located in a storage medium, the storage medium being located in the memory, the processor reading the information in the memory, and completing the steps of the foregoing methods in combination with the hardware thereof.
  • the device for measuring power consumption may be configured by at least one Application Specific Integrated Circuit (ASIC), DSP, Programmable Logic Device (PLD), Complex Programmable Logic Device (CPLD) , Complex Programmable Logic Device), FPGA, general purpose processor, controller, MCU, microprocessor, or other electronic component implementation for performing the aforementioned methods.
  • ASIC Application Specific Integrated Circuit
  • DSP Digital Signal processor
  • PLD Programmable Logic Device
  • CPLD Complex Programmable Logic Device
  • FPGA general purpose processor
  • controller MCU
  • microprocessor or other electronic component implementation for performing the aforementioned methods.
  • the embodiment of the present invention further provides a computer storage medium, where the computer storage medium stores computer executable instructions for performing: determining a trace DC equivalent resistance R 1 of the target to be tested and a package point DC equivalent resistance R 2 of the target to be tested; obtaining a power supply output terminal voltage V 1 and a power input terminal voltage V 2 of the target to be tested; and obtaining the according to the V 1 , V 2 , and R 1 Current I of the trace of the target to be tested; obtaining an actual voltage V 3 reaching the target to be tested according to the V 1 , V 2 , R 1 , R 2 , I; obtaining the location according to the V 3 and the I Describe the power consumption of the target to be measured.
  • the computer executable instructions are configured to: calculate at least one of the average power consumption, the maximum power consumption, and the minimum power consumption of the target to be tested in a preset period.
  • the computer executable instructions are configured to: perform power-on setting on the object to be tested according to a power-on timing rule.
  • the computer executable instructions are configured to: determine whether to adjust the V 1 according to a comparison result of the V 2 and the set voltage V 0 of the target to be tested.
  • the computer executable instructions are configured to: determine whether a difference between the V 2 and the V 0 exceeds a preset threshold range, and if the difference exceeds a preset threshold range, adjust the location Said V 1 until the difference between V 2 and the V 0 does not exceed the preset threshold range; if the difference does not exceed the preset threshold range, it is determined whether the V 2 is equal to the V 0 And if the V 2 is not equal to the V 0 , adjusting the V 1 until the V 2 is equal to the V 0 ; if the V 2 is equal to the V 0 , the V 1 is not adjusted.
  • the computer executable instructions are configured to: save power consumption of the target to be tested, and output power consumption of the target to be tested.
  • embodiments of the present invention can be provided as a method, system, or computer program product. Accordingly, the present invention can take the form of a hardware embodiment, a software embodiment, or a combination of software and hardware. Moreover, the invention can take the form of a computer program product embodied on one or more computer-usable storage media (including but not limited to disk storage and optical storage, etc.) including computer usable program code.
  • the computer program instructions can also be stored in a computer readable memory that can direct a computer or other programmable data processing device to operate in a particular manner, such that the instructions stored in the computer readable memory produce an article of manufacture comprising the instruction device.
  • the apparatus implements the functions specified in one or more blocks of a flow or a flow and/or block diagram of the flowchart.
  • These computer program instructions can also be loaded onto a computer or other programmable data processing device such that a series of operational steps are performed on a computer or other programmable device to produce computer-implemented processing for execution on a computer or other programmable device.
  • the instructions provide steps for implementing the functions specified in one or more of the flow or in a block or blocks of a flow diagram.
  • the technical solution of the embodiment of the present invention determines the trace DC equivalent resistance R 1 of the target to be tested and the package point DC equivalent resistance R 2 of the target to be tested; and performs the target to be tested according to the power-on timing rule. Electrically setting; obtaining a power output terminal voltage V 1 and a power input terminal voltage V 2 of the target to be tested; determining whether to adjust the V according to a comparison result of the V 2 and the set voltage V 0 of the target to be tested 1; the V 1, V 2, R 1 to give the traces object to be measured according to the current I; according to the V 1, V 2, R 1 , R 2, I reaches the object to be measured to obtain The actual voltage V 3 is obtained according to the V 3 and the I, and the average power consumption, the maximum power consumption, and the minimum power consumption of the target to be tested are counted in a preset period; The power consumption of the target to be measured is saved and presented; the solution provided by the embodiment of the present invention can fully consider the voltage loss during the working process of the target to be tested

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Abstract

一种测量功耗的方法、装置（05）和计算机存储介质，测量功耗的方法包括：确定待测目标的走线直流等效电阻R1和待测目标的封装点直流等效电阻R2（101， 201）；获取电源输出端电压V1和待测目标的电源输入端电压V2（102， 203）；根据V1、V2、R1得到待测目标的走线的电流I（103， 205）；根据V1、V2、R1、R2、I得到到达待测目标的实际电压V3（104， 206）；根据V 3与I得到待测目标的功耗（105， 207）。测量功耗的方法提高了测量功耗的稳定性及准确性。

Description

测量功耗的方法、装置和计算机存储介质
相关申请的交叉引用
本申请基于申请号为201611051133.7、申请日为2016年11月24日的中国专利申请提出，并要求该中国专利申请的优先权，该中国专利申请的全部内容在此以引入方式并入本申请。
技术领域
本发明涉及电子自动化测量技术领域，尤其涉及一种测量功耗的方法、装置和计算机存储介质。
背景技术
功耗测量一直是系统单板、终端单板或芯片开发的关键项目之一，也是必不可少的项目之一；为了达到节能、绿色、环保的要求，对于单板和芯片的功耗要求越来越高，功耗测量也越来越显得重要。
对于传统的功耗测量，通常有两种方法：第一种是用稳压源给单板或者芯片的各路电源供电，通过读取稳压源上的电流值，获取单板或者芯片各路电源的电流大小来计算功耗；第二种是通过在支路上串联电流表的方法来获取电流大小来计算功耗。
但这两种方法一般都要使用飞线把稳压源的正负极焊接到单板上，或者把单板上器件取下来，串接上电流表；对于可能多达十几路电源的芯片详细功耗测量，无论是对于使用稳压源的方法还是使用电流表的方法，都会有众多繁琐的线缆要焊接或者器件要取下，接入表笔等，而且通常飞线线缆较长，造成线上压降过大，或者焊点较多、接触点阻抗较大造成电压损耗太大，因此，无法保证测量的稳定性及准确性。
发明内容
本发明实施例期望提供一种测量功耗的方法、装置和计算机存储介质，以实现自动化测量功耗，并且提高功耗测量的稳定性及准确性。
为达到上述目的，本发明实施例的技术方案是这样实现的：
本发明实施例提供一种测量功耗的方法，所述方法包括：
确定待测目标的走线直流等效电阻R1和所述待测目标的封装点直流等效电阻R2；
获取电源输出端电压V1和所述待测目标的电源输入端电压V2；
根据所述V1、V2、R1得到所述待测目标的走线的电流I；
根据所述V1、V2、R1、R2、I得到到达所述待测目标的实际电压V3；
根据所述V3与所述I得到所述待测目标的功耗。
在一实施例中，在所述根据所述V3与所述I得到所述待测目标的功耗之后，所述方法还包括：
在预设周期内统计所述待测目标的平均功耗、最大功耗、最小功耗中的至少一种功耗信息。
在一实施例中，在所述获取电源输出端电压V1和所述待测目标的电源输入端电压V2之前，所述方法还包括：
根据上电时序规则对所述待测目标进行上电设置。
在一实施例中，在所述获取电源输出端电压V1和所述待测目标的电源输入端电压V2之后，所述方法还包括：
根据所述V2与所述待测目标的设定电压V0的比较结果确定是否调整所述V1。
在一实施例中，所述根据所述V2与所述待测目标的设定电压V0的比较结果确定是否调整所述V1，包括：
判断所述V2与所述V0的差值是否超出预设阈值范围，若所述差值超 出预设阈值范围，则调整所述V1直到所述V2与所述V0的差值没有超出所述预设阈值范围为止；
若所述差值未超出预设阈值范围，则判断所述V2是否等于所述V0，若所述V2不等于所述V0，则调整所述V1直到所述V2等于所述V0为止；
若所述V2等于所述V0，则不调整所述V1。
在一实施例中，所述方法还包括：
保存所述待测目标的功耗，输出显示所述待测目标的功耗。
在一实施例中，所述确定待测目标的走线直流等效电阻R1和所述待测目标的封装点直流等效电阻R2，包括：
根据公式R1＝ρ1L/(0.03W)计算得到所述R1，其中，ρ1为走线的电阻率，L为走线长度，W为走线宽度；
根据公式R2＝ρ2h/πr2计算得到所述R2，其中，ρ2为封装点的电阻率，h为封装点的半径，r为封装点焊盘的半径；
所述根据所述V1、V2、R1得到所述待测目标的走线的电流I，包括：
根据公式I＝(V1-V2)/R1计算得到所述I；
所述根据所述V1、V2、R1、R2、I得到到达所述待测目标的实际电压V3，包括：
利用串联电路电流一致的定理，根据公式V3＝(V2-IR2)计算得到所述V3。
本发明实施例还提供一种测量功耗的装置，所述装置包括：
确定模块，配置为确定待测目标的走线直流等效电阻R1和所述待测目标的封装点直流等效电阻R2；
获取模块，配置为获取电源输出端电压V1和所述待测目标的电源输入端电压V2；
处理模块，配置为根据所述V1、V2、R1得到所述待测目标的走线的电 流I；根据所述V1、V2、R1、R2、I得到到达所述待测目标的实际电压V3；根据所述V3与所述I得到所述待测目标的功耗。
在一实施例中，所述处理模块，还配置为在预设周期内统计所述待测目标的平均功耗、最大功耗、最小功耗中的至少一种功耗信息。
在一实施例中，所述装置还包括：
设置模块，配置为根据上电时序规则对所述待测目标进行上电设置。
在一实施例中，所述处理模块，还配置为根据所述V2与所述待测目标的设定电压V0的比较结果确定是否调整所述V1。
在一实施例中，所述处理模块，配置为判断所述V2与所述V0的差值是否超出预设阈值范围，若所述差值超出预设阈值范围，则调整所述V1直到所述V2与所述V0的差值没有超出所述预设阈值范围为止；
若所述差值未超出预设阈值范围，则判断所述V2是否等于所述V0，若所述V2不等于所述V0，则调整所述V1直到所述V2等于所述V0为止；
若所述V2等于所述V0，则不调整所述V1。
在一实施例中，所述装置还包括：
输出模块，配置为保存所述待测目标的功耗，输出显示所述待测目标的功耗。
在一实施例中，所述确定模块，配置为根据公式R1＝ρ1L/(0.03W)计算得到所述R1，其中，ρ1为走线的电阻率，L为走线长度，W为走线宽度；根据公式R2＝ρ2h/πr2计算得到所述R2，其中，ρ2为封装点的电阻率，h为封装点的半径，r为封装点焊盘的半径；
所述处理模块，配置为根据公式I＝(V1-V2)/R1计算得到所述I；利用串联电路电流一致的定理，根据公式V3＝(V2-IR2)计算得到所述V3。
本发明实施例还提供了一种测量功耗的装置，包括：处理器和用于存储能够在处理器上运行的计算机程序的存储器，其中，所述处理器用于运 行所述计算机程序时，执行本发明实施例所述测量功耗的方法的步骤。
本发明实施例还提供了一种计算机存储介质，所述计算机存储介质中存储有计算机可执行指令，所述计算机可执行指令用于执行本发明实施例所述的测量功耗的方法。
本发明实施例提供的测量功耗的方法、装置和计算机存储介质，通过确定待测目标的走线直流等效电阻R1和所述待测目标的封装点直流等效电阻R2；获取电源输出端电压V1和所述待测目标的电源输入端电压V2；根据所述V1、V2、R1得到所述待测目标的走线的电流I；根据所述V1、V2、R1、R2、I得到到达所述待测目标的实际电压V3；根据所述V3与所述I得到所述待测目标的功耗；充分考虑待测目标工作过程中的电压损耗，并且无需工作人员读取测量数据，因此，达到了自动化测量功耗及提高了测量功耗的稳定性及准确性。
附图说明
图1为本发明测量功耗的方法实施例一的流程图；
图2为本发明测量功耗的方法实施例二的流程图；
图3为本发明测量功耗的方法实施例二的测量结果实时值的显示图；
图4为本发明测量功耗的方法实施例二的测量结果统计显示图；
图5为本发明测量功耗的装置实施例的结构示意图。
具体实施方式
下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚、完整地描述。
图1为本发明测量功耗的方法实施例一的流程图，如图1所示，本发明实施例提供的测量功耗的方法可以包括如下步骤：
步骤101、确定待测目标的走线直流等效电阻R1和所述待测目标的封 装点直流等效电阻R2。
本发明实施例的测量功耗的方法可应用于测量功耗的装置中；测量功耗的装置确定出待测目标的走线直流等效电阻R1和待测目标的封装点直流等效电阻R2；例如，对于待测目标的走线直流等效电阻R1，事先可以通过提取待测目标的光绘源文件得到待测目标上电源走线的材质、电阻率、宽度及长度等信息中的至少一种信息，根据提取出的相关能够计算得到待测目标的走线直流等效电阻R1；对于待测目标的封装点直流等效电阻R2，事先可以通过封装厂商提供的封装点相关信息得到待测目标的封装点的材质、电阻率、球径及焊盘直径等信息中的至少一种信息，根据提取出的相关信息能够计算得到待测目标的封装点直流等效电阻R2。
其中，待测目标包括了任意类型的单板或任意类型的芯片。
步骤102、获取电源输出端电压V1和所述待测目标的电源输入端电压V2。
测量功耗的装置在被测某一电源输出端获取电源输出端电压V1，在被测芯片的电源管脚输入端获取待测目标的电源输入端电压V2。
步骤103、根据所述V1、V2、R1得到所述待测目标的走线的电流I。
根据步骤102获得的V1、V2以及步骤101获得的R1，运用电压、电阻与电流之间的关系，计算得到待测目标的走线的电流I。
步骤104、根据所述V1、V2、R1、R2、I得到到达所述待测目标的实际电压V3。
根据上述步骤计算得到的V1、V2、R1、R2、I利用串联电路电流一致的定理，计算得到到达待测目标的实际电压V3。
步骤105、根据所述V3与所述I得到所述待测目标的功耗。
根据功耗、电压、电流之间的关系计算得到待测目标的功耗。
本发明实施例提供的测量功耗的方法，通过确定待测目标的走线直流 等效电阻R1和所述待测目标的封装点直流等效电阻R2；获取电源输出端电压V1和所述待测目标的电源输入端电压V2；根据所述V1、V2、R1得到所述待测目标的走线的电流I；根据所述V1、V2、R1、R2、I得到到达所述待测目标的实际电压V3；根据所述V3与所述I得到所述待测目标的功耗；充分考虑待测目标工作过程中的电压损耗，并且无需工作人员读取测量数据，因此，达到了自动化测量功耗及提高了测量功耗的稳定性及准确性。
为了更加体现出本发明的目的，在上述实施例的基础上，进一步的举例说明。
图2为本发明测量功耗的方法实施例二的流程图，如图2所示，本发明实施例提供的测量功耗的方法可以包括如下步骤：
步骤201、确定待测目标的走线直流等效电阻R1和所述待测目标的封装点直流等效电阻R2。
具体的，测量功耗的装置的计算模块根据公式R1＝ρ1L/(0.03W)计算得到R1，其中，ρ1为走线的电阻率，L为走线长度，W为走线宽度，根据公式R2＝ρ2h/πr2计算得到R2，其中，ρ2为封装点的电阻率，h为封装点的半径，r为封装点焊盘的半径。
例如，通常待测单板的走线覆铜是1oz，对应的厚度换算成国际单位是0.035mm，加工后厚度只有0.03mm；设走线宽度为W，则待测单板走线的直流等效电阻R1＝ρ1L/S＝R1＝ρ1L/(0.03W)，ρ1为铜的电阻率，ρ1＝0.0175Ωmm2/m，L为走线长度，W为走线宽度；待测单板上的电源走线宽度和长度可以通过提取光绘源文件得到，某块单板的coreVDD走线线宽为100mil，走线有效长度为5000mil，则换算为国际长度单位则W＝2.54mm，L＝127mm，这样计算出实际coreVDD走线的是直流等效电阻为0.0175×0.127/(0.03×2.54)＝0.0292Ω＝29mΩ。
如果整个电源走线含有较多片段组成，则应该根据光绘文件各段走线 的尺寸分段计算，最后将各段数据进行累加，得到实际的电源走线直流等效电阻值。
目前大多数芯片如多媒体处理芯片，基带(Baseband Processor，BP)芯片，应用(Application Processor，AP)芯片均为焊球阵列(Ball Grid Array，BGA)封装，一般焊球成分比较多，需向封装厂了解待测单板上的焊球成份；以Sn63Pb37成分的焊球为例，锡的电阻率为0.113Ωmm2/m，铅的电阻率为0.2068Ωmm2/m，可以得到Sn63Pb37成分的焊球电阻率实际为ρ2＝0.1477Ωmm2/m；又以封装点的球径为0.4mm为例，实际封装点焊盘的直径为0.3mm，则该封装点直流等效电阻为R2＝ρ2h/πr2＝0.1477×0.4/3.14×0.152＝0.0836Ω＝84mΩ。
步骤202、根据上电时序规则对所述待测目标进行上电设置。
测量功耗的装置的上电模块将工作人员设置的各电压上电之间的延时(t1/t2/……/tn)、被测电压值V0、等效电阻值R1\R2等参数的脚本往处理模块下载，按测试计划预定值实现不同电压上电顺序、电压值设定等。
由于单板或芯片都有一定的上电时序要求，现有技术一般通过测量人员手动控制稳压源，对于要测的电源种类众多的话无法很好的控制上电时序，若不符合要求可能出现系统不工作或者工作不稳定情况，存在一定的风险；而本发明实施例通过对上电模块的使能控制对待测单板或芯片进行上电设置，很好的控制上电时序，能够进一步保证测试的稳定性。
步骤203、获取电源输出端电压V1和所述待测目标的电源输入端电压V2。
测量功耗的装置的电压采样模块获取电源输出端电压V1和待测目标的电源输入端电压V2；例如，该电压采样模块包含两根可以调节位置的精密探针及与其相连的高增益低噪声的放大器和模数转换器，可以精确的采样被测量电路的电压值。
作为一种实施方式，在测量功耗的装置中可以设置有对应于多个待测目标的多个电压采样模块，这样可以同时对不同的待测目标进行测量。
步骤204、根据所述V2与所述待测目标的设定电压V0的比较结果确定是否调整所述V1。
测量功耗的装置根据V2与待测目标的设定电压V0的比较结果确定是否调整V1；具体的，判断V2与V0的差值是否超出预设阈值范围，若差值超出预设阈值范围，则调整V1直到V2与V0的差值没有超出预设阈值范围为止；该预设阈值范围可以根据实际需求进行设置，在此不加以限制；
若差值未超出预设阈值范围，则再判断V2是否等于V0，若V2不等于V0，则调整V1直到V2等于V0为止；若V2等于V0，则不调整V1；通过计算、比较、迭代控制调节电源模块的反馈电压，调节输出电压值，实时监测待检测目标的线上电压，监测到电压波动时及时微调电源模块的输出电压，达到稳压的作用，进一步减少线上损耗带来测量偏差。
例如，接收实时电压值(V1和V2)并跟设设定电压值(V0)进行比较，如果判断V2<V0，则通过寄存器方式或者反馈电压方式将电源模块按最小步进值进行调高输出，直至V2＝V0；同理，如果判断V2>V0，则通过寄存器方式或者反馈电压方式将电源模块按最小步进值调低输出电压，直至V2＝V0；最终目的是进行电源模块的电压微调以保持待检测目标的电压与设定电压一致，达到稳定的目的。
步骤205、根据所述V1、V2、R1得到所述待测目标的走线的电流I。
测量功耗的装置的处理模块根据公式I＝(V1-V2)/R1计算得到待测目标的走线的电流I。
步骤206、根据所述V1、V2、R1、R2、I得到到达所述待测目标的实际电压V3。
测量功耗的装置的处理模块根据上述步骤得到的V1、V2、R1、R2、I 得到到达待测目标的实际电压V3；具体的，利用串联电路电流一致的定理，可以知道通过BGA焊球的电流值也为I，则在焊球上的电压压降为IR2；所以根据公式V3＝(V2-IR2)计算得到到达待测目标的实际电压V3。
步骤207、根据所述V3与所述I得到所述待测目标的功耗。
测量功耗的装置根据公式P＝V3×I计算得到待测目标的功耗P。
步骤208、在预设周期内统计所述待测目标的平均功耗、最大功耗、最小功耗中的至少一种功耗信息。
测量功耗的装置在预设周期内可以统计待测目标的平均功耗、最大功耗、最小功耗等中的至少一种功耗相关信息；其中，预设周期可以根据实际需求进行设置，在此不加以限制。
步骤209、保存所述待测目标的功耗，输出显示所述待测目标的功耗。
测量功耗的装置将测量得到的功耗信息，例如，实时功耗值、计算得到的平均值、最大值、最小值等信息输出到显示屏或者终端进行实时显示，同时也将这些功耗信息保存到存储介质供后期调用和处理。
图3为本发明测量功耗的方法实施例二的测量结果实时值的显示图，图4为本发明测量功耗的方法实施例二的测量结果统计显示图；如图3、图4所示，可以很清晰的看到待测目标的功耗测量结果及变化趋势。
本发明实施例提供的测量功耗的方法，通过确定待测目标的走线直流等效电阻R1和所述待测目标的封装点直流等效电阻R2；根据上电时序规则对所述待测目标进行上电设置；获取电源输出端电压V1和所述待测目标的电源输入端电压V2；根据所述V2与所述待测目标的设定电压V0的比较结果确定是否调整所述V1；根据所述V1、V2、R1得到所述待测目标的走线的电流I；根据所述V1、V2、R1、R2、I得到到达所述待测目标的实际电压V3；根据所述V3与所述I得到所述待测目标的功耗；在预设周期内统计所述待测目标的平均功耗、最大功耗、最小功耗；将所述待测目标的功耗保 存并呈现出来；本发明实施例提供的方案能够充分考虑待测目标工作过程中的电压损耗，并且无需工作人员读取测量数据，因此，达到了自动化测量功耗及提高了测量功耗的稳定性及准确性；另外，通过使能控制对待测目标进行上电设置，很好的控制上电时序，能够进一步保证测试的稳定性，以及通过进行计算、比较、迭代控制去调节电源模块的反馈电压，调节输出电压值，实时监测待检测目标的线上电压，监测到电压波动时及时微调电源模块的输出电压，达到稳压的作用，进一步减少线上损耗带来测量偏差。
图5为本发明测量功耗的装置实施例的结构示意图，如图5所示，本发明实施例提供的测量功耗的装置05包括：确定模块51、获取模块52、处理模块53；其中，
所述确定模块51，配置为确定待测目标的走线直流等效电阻R1和所述待测目标的封装点直流等效电阻R2；
所述获取模块52，配置为获取电源输出端电压V1和所述待测目标的电源输入端电压V2；
所述处理模块53，配置为根据所述V1、V2、R1得到所述待测目标的走线的电流I；根据所述V1、V2、R1、R2、I得到到达所述待测目标的实际电压V3；根据所述V3与所述I得到所述待测目标的功耗。
作为一种实施方式，所述处理模块53，还配置为在预设周期内统计所述待测目标的平均功耗、最大功耗、最小功耗中的至少一种功耗信息。
作为一种实施方式，所述装置还包括：设置模块54；其中，
所述设置模块54，配置为根据上电时序规则对所述待测目标进行上电设置。
作为一种实施方式，所述处理模块53，还配置为根据所述V2与所述待测目标的设定电压V0的比较结果确定是否调整所述V1。
其中，所述处理模块53，配置为判断所述V2与所述V0的差值是否超出预设阈值范围，若所述差值超出预设阈值范围，则调整所述V1直到所述V2与所述V0的差值没有超出所述预设阈值范围为止；
若所述差值未超出预设阈值范围，则判断所述V2是否等于所述V0，若所述V2不等于所述V0，则调整所述V1直到所述V2等于所述V0为止；
若所述V2等于所述V0，则不调整所述V1。
作为一种实施方式，所述装置还包括：输出模块55；其中，
所述输出模块55，配置为保存所述待测目标的功耗，输出显示所述待测目标的功耗。
本实施例中，所述确定模块51，配置为根据公式R1＝ρ1L/(0.03W)计算得到所述R1，其中，ρ1为走线的电阻率，L为走线长度，W为走线宽度；根据公式R2＝ρ2h/πr2计算得到所述R2，其中，ρ2为封装点的电阻率，h为封装点的半径，r为封装点焊盘的半径；
所述处理模块53，配置为根据公式I＝(V1-V2)/R1计算得到所述I；利用串联电路电流一致的定理，根据公式V3＝(V2-IR2)计算得到所述V3。
本实施例的装置，可以用于执行上述所示方法实施例的技术方案，其实现原理和技术效果类似，此处不再赘述。
在实际应用中，所述确定模块51、获取模块52、处理模块53、设置模块54、输出模块55均可由位于测量功耗的装置05中的中央处理器(Central Processing Unit，CPU)、微处理器(Micro Processor Unit，MPU)、数字信号处理器(Digital Signal Processor，DSP)或现场可编程门阵列(Field Programmable Gate Array，FPGA)等实现。
需要说明的是：上述实施例提供的测量功耗的装置在进行测量功耗时，仅以上述各程序模块的划分进行举例说明，实际应用中，可以根据需要而将上述处理分配由不同的程序模块完成，即将装置的内部结构划分成不同 的程序模块，以完成以上描述的全部或者部分处理。另外，上述实施例提供的测量功耗的装置与测量功耗的方法实施例属于同一构思，其具体实现过程详见方法实施例，这里不再赘述。
本发明实施例还提供了一种测量功耗的装置，包括：处理器和用于存储能够在处理器上运行的计算机程序的存储器，其中，所述处理器用于运行所述计算机程序时，执行：确定待测目标的走线直流等效电阻R1和所述待测目标的封装点直流等效电阻R2；获取电源输出端电压V1和所述待测目标的电源输入端电压V2；根据所述V1、V2、R1得到所述待测目标的走线的电流I；根据所述V1、V2、R1、R2、I得到到达所述待测目标的实际电压V3；根据所述V3与所述I得到所述待测目标的功耗。
作为一种实施方式，所述处理器用于运行所述计算机程序时，执行：在预设周期内统计所述待测目标的平均功耗、最大功耗、最小功耗中的至少一种功耗信息。
作为一种实施方式，所述处理器用于运行所述计算机程序时，执行：根据上电时序规则对所述待测目标进行上电设置。
作为一种实施方式，所述处理器用于运行所述计算机程序时，执行：根据所述V2与所述待测目标的设定电压V0的比较结果确定是否调整所述V1。
作为一种实施方式，所述处理器用于运行所述计算机程序时，执行：判断所述V2与所述V0的差值是否超出预设阈值范围，若所述差值超出预设阈值范围，则调整所述V1直到所述V2与所述V0的差值没有超出所述预设阈值范围为止；若所述差值未超出预设阈值范围，则判断所述V2是否等于所述V0，若所述V2不等于所述V0，则调整所述V1直到所述V2等于所述V0为止；若所述V2等于所述V0，则不调整所述V1。
作为一种实施方式，所述处理器用于运行所述计算机程序时，执行： 保存所述待测目标的功耗，输出显示所述待测目标的功耗。
作为一种实施方式，所述处理器用于运行所述计算机程序时，执行：根据公式R1＝ρ1L/(0.03W)计算得到所述R1，其中，ρ1为走线的电阻率，L为走线长度，W为走线宽度；根据公式R2＝ρ2h/πr2计算得到所述R2，其中，ρ2为封装点的电阻率，h为封装点的半径，r为封装点焊盘的半径；根据公式I＝(V1-V2)/R1计算得到所述I；利用串联电路电流一致的定理，根据公式V3＝(V2-IR2)计算得到所述V3。
本实施例中，存储器可以由任何类型的易失性或非易失性存储设备、或者它们的组合来实现。其中，非易失性存储器可以是只读存储器(ROM，Read Only Memory)、可编程只读存储器(PROM，Programmable Read-Only Memory)、可擦除可编程只读存储器(EPROM，Erasable Programmable Read-Only Memory)、电可擦除可编程只读存储器(EEPROM，Electrically Erasable Programmable Read-Only Memory)、磁性随机存取存储器(FRAM，Ferromagnetic Random Access Memory)、快闪存储器(Flash Memory)、磁表面存储器、光盘、或只读光盘(CD-ROM，Compact Disc Read-Only Memory)；磁表面存储器可以是磁盘存储器或磁带存储器。易失性存储器可以是随机存取存储器(RAM，Random Access Memory)，其用作外部高速缓存。通过示例性但不是限制性说明，许多形式的RAM可用，例如静态随机存取存储器(SRAM，Static Random Access Memory)、同步静态随机存取存储器(SSRAM，Synchronous Static Random Access Memory)、动态随机存取存储器(DRAM，Dynamic Random Access Memory)、同步动态随机存取存储器(SDRAM，Synchronous Dynamic Random Access Memory)、双倍数据速率同步动态随机存取存储器(DDRSDRAM，Double Data Rate Synchronous Dynamic Random Access Memory)、增强型同步动态随机存取存储器(ESDRAM，Enhanced Synchronous Dynamic Random Access  Memory)、同步连接动态随机存取存储器(SLDRAM，SyncLink Dynamic Random Access Memory)、直接内存总线随机存取存储器(DRRAM，Direct Rambus Random Access Memory)。本发明实施例描述的存储器旨在包括但不限于这些和任意其它适合类型的存储器。
存储器用于存储各种类型的数据以支持测量功耗的装置的操作。这些数据的示例包括：用于在测量功耗的装置上操作的任何计算机程序。其中，操作系统包含各种系统程序，例如框架层、核心库层、驱动层等，用于实现各种基础业务以及处理基于硬件的任务。应用程序可以包含各种应用程序，例如媒体播放器(Media Player)、浏览器(Browser)等，用于实现各种应用业务。实现本发明实施例方法的程序可以包含在应用程序中。
处理器可能是一种集成电路芯片，具有信号的处理能力。在实现过程中，上述方法的各步骤可以通过处理器中的硬件的集成逻辑电路或者软件形式的指令完成。上述的处理器可以是通用处理器、DSP，或者其他可编程逻辑器件、分立门或者晶体管逻辑器件、分立硬件组件等。处理器可以实现或者执行本发明实施例中的公开的各方法、步骤及逻辑框图。通用处理器可以是微处理器或者任何常规的处理器等。结合本发明实施例所公开的方法的步骤，可以直接体现为硬件译码处理器执行完成，或者用译码处理器中的硬件及软件模块组合执行完成。软件模块可以位于存储介质中，该存储介质位于存储器，处理器读取存储器中的信息，结合其硬件完成前述方法的步骤。
在示例性实施例中，测量功耗的装置可以被至少一个应用专用集成电路(ASIC，Application Specific Integrated Circuit)、DSP、可编程逻辑器件(PLD，Programmable Logic Device)、复杂可编程逻辑器件(CPLD，Complex Programmable Logic Device)、FPGA、通用处理器、控制器、MCU、微处理器(Microprocessor)、或其他电子元件实现，用于执行前述方法。
本发明实施例还提供了一种计算机存储介质，所述计算机存储介质中存储有计算机可执行指令，所述计算机可执行指令用于执行：确定待测目标的走线直流等效电阻R1和所述待测目标的封装点直流等效电阻R2；获取电源输出端电压V1和所述待测目标的电源输入端电压V2；根据所述V1、V2、R1得到所述待测目标的走线的电流I；根据所述V1、V2、R1、R2、I得到到达所述待测目标的实际电压V3；根据所述V3与所述I得到所述待测目标的功耗。
作为一种实施方式，所述计算机可执行指令用于执行：在预设周期内统计所述待测目标的平均功耗、最大功耗、最小功耗中的至少一种功耗信息。
作为一种实施方式，所述计算机可执行指令用于执行：根据上电时序规则对所述待测目标进行上电设置。
作为一种实施方式，所述计算机可执行指令用于执行：根据所述V2与所述待测目标的设定电压V0的比较结果确定是否调整所述V1。
作为一种实施方式，所述计算机可执行指令用于执行：判断所述V2与所述V0的差值是否超出预设阈值范围，若所述差值超出预设阈值范围，则调整所述V1直到所述V2与所述V0的差值没有超出所述预设阈值范围为止；若所述差值未超出预设阈值范围，则判断所述V2是否等于所述V0，若所述V2不等于所述V0，则调整所述V1直到所述V2等于所述V0为止；若所述V2等于所述V0，则不调整所述V1。
作为一种实施方式，所述计算机可执行指令用于执行：保存所述待测目标的功耗，输出显示所述待测目标的功耗。
作为一种实施方式，所述计算机可执行指令用于执行：根据公式R1＝ρ1L/(0.03W)计算得到所述R1，其中，ρ1为走线的电阻率，L为走线长度，W为走线宽度；根据公式R2＝ρ2h/πr2计算得到所述R2，其中，ρ2 为封装点的电阻率，h为封装点的半径，r为封装点焊盘的半径；根据公式I＝(V1-V2)/R1计算得到所述I；利用串联电路电流一致的定理，根据公式V3＝(V2-IR2)计算得到所述V3。
本领域内的技术人员应明白，本发明的实施例可提供为方法、系统、或计算机程序产品。因此，本发明可采用硬件实施例、软件实施例、或结合软件和硬件方面的实施例的形式。而且，本发明可采用在一个或多个其中包含有计算机可用程序代码的计算机可用存储介质(包括但不限于磁盘存储器和光学存储器等)上实施的计算机程序产品的形式。
本发明是参照根据本发明实施例的方法、设备(系统)、和计算机程序产品的流程图和/或方框图来描述的。应理解可由计算机程序指令实现流程图和/或方框图中的每一流程和/或方框、以及流程图和/或方框图中的流程和/或方框的结合。可提供这些计算机程序指令到通用计算机、专用计算机、嵌入式处理机或其他可编程数据处理设备的处理器以产生一个机器，使得通过计算机或其他可编程数据处理设备的处理器执行的指令产生用于实现在流程图一个流程或多个流程和/或方框图一个方框或多个方框中指定的功能的装置。
这些计算机程序指令也可存储在能引导计算机或其他可编程数据处理设备以特定方式工作的计算机可读存储器中，使得存储在该计算机可读存储器中的指令产生包括指令装置的制造品，该指令装置实现在流程图一个流程或多个流程和/或方框图一个方框或多个方框中指定的功能。
这些计算机程序指令也可装载到计算机或其他可编程数据处理设备上，使得在计算机或其他可编程设备上执行一系列操作步骤以产生计算机实现的处理，从而在计算机或其他可编程设备上执行的指令提供用于实现在流程图一个流程或多个流程和/或方框图一个方框或多个方框中指定的功能的步骤。
以上所述，仅为本发明的较佳实施例而已，并非用于限定本发明的保护范围。
工业实用性
本发明实施例的技术方案通过确定待测目标的走线直流等效电阻R1和所述待测目标的封装点直流等效电阻R2；根据上电时序规则对所述待测目标进行上电设置；获取电源输出端电压V1和所述待测目标的电源输入端电压V2；根据所述V2与所述待测目标的设定电压V0的比较结果确定是否调整所述V1；根据所述V1、V2、R1得到所述待测目标的走线的电流I；根据所述V1、V2、R1、R2、I得到到达所述待测目标的实际电压V3；根据所述V3与所述I得到所述待测目标的功耗；在预设周期内统计所述待测目标的平均功耗、最大功耗、最小功耗；将所述待测目标的功耗保存并呈现出来；本发明实施例提供的方案能够充分考虑待测目标工作过程中的电压损耗，并且无需工作人员读取测量数据，因此，达到了自动化测量功耗及提高了测量功耗的稳定性及准确性；另外，通过使能控制对待测目标进行上电设置，很好的控制上电时序，能够进一步保证测试的稳定性，以及通过进行计算、比较、迭代控制去调节电源模块的反馈电压，调节输出电压值，实时监测待检测目标的线上电压，监测到电压波动时及时微调电源模块的输出电压，达到稳压的作用，进一步减少线上损耗带来测量偏差。

Claims (16)

  1. 一种测量功耗的方法，所述方法包括：
    确定待测目标的走线直流等效电阻R1和所述待测目标的封装点直流等效电阻R2；
    获取电源输出端电压V1和所述待测目标的电源输入端电压V2；
    根据所述V1、V2、R1得到所述待测目标的走线的电流I；
    根据所述V1、V2、R1、R2、I得到到达所述待测目标的实际电压V3；
    根据所述V3与所述I得到所述待测目标的功耗。
  2. 根据权利要求1所述的方法，其中，在所述根据所述V3与所述I得到所述待测目标的功耗之后，所述方法还包括：
    在预设周期内统计所述待测目标的平均功耗、最大功耗、最小功耗中的至少一种功耗信息。
  3. 根据权利要求1所述的方法，其中，在所述获取电源输出端电压V1和所述待测目标的电源输入端电压V2之前，所述方法还包括：
    根据上电时序规则对所述待测目标进行上电设置。
  4. 根据权利要求1所述的方法，其中，在所述获取电源输出端电压V1和所述待测目标的电源输入端电压V2之后，所述方法还包括：
    根据所述V2与所述待测目标的设定电压V0的比较结果确定是否调整所述V1。
  5. 根据权利要求4所述的方法，其中，所述根据所述V2与所述待测目标的设定电压V0的比较结果确定是否调整所述V1，包括：
    判断所述V2与所述V0的差值是否超出预设阈值范围，若所述差值超出预设阈值范围，则调整所述V1直到所述V2与所述V0的差值没有超出所述预设阈值范围为止；
    若所述差值未超出预设阈值范围，则判断所述V2是否等于所述V0，若 所述V2不等于所述V0，则调整所述V1直到所述V2等于所述V0为止；
    若所述V2等于所述V0，则不调整所述V1。
  6. 根据权利要求1所述的方法，其中，所述方法还包括：
    保存所述待测目标的功耗，输出显示所述待测目标的功耗。
  7. 根据权利要求1至6任一项所述的方法，其中，所述确定待测目标的走线直流等效电阻R1和所述待测目标的封装点直流等效电阻R2，包括：
    根据公式R1＝ρ1L/(0.03W)计算得到所述R1，其中，ρ1为走线的电阻率，L为走线长度，W为走线宽度；
    根据公式R2＝ρ2h/πr2计算得到所述R2，其中，ρ2为封装点的电阻率，h为封装点的半径，r为封装点焊盘的半径；
    所述根据所述V1、V2、R1得到所述待测目标的走线的电流I，包括：
    根据公式I＝(V1-V2)/R1计算得到所述I；
    所述根据所述V1、V2、R1、R2、I得到到达所述待测目标的实际电压V3，包括：
    利用串联电路电流一致的定理，根据公式V3＝(V2-IR2)计算得到所述V3。
  8. 一种测量功耗的装置，所述装置包括：
    确定模块，配置为确定待测目标的走线直流等效电阻R1和所述待测目标的封装点直流等效电阻R2；
    获取模块，配置为获取电源输出端电压V1和所述待测目标的电源输入端电压V2；
    处理模块，配置为根据所述V1、V2、R1得到所述待测目标的走线的电流I；根据所述V1、V2、R1、R2、I得到到达所述待测目标的实际电压V3；根据所述V3与所述I得到所述待测目标的功耗。
  9. 根据权利要求8所述的装置，其中，所述处理模块，还配置为在预 设周期内统计所述待测目标的平均功耗、最大功耗、最小功耗中的至少一种功耗信息。
  10. 根据权利要求8所述的装置，其中，所述装置还包括：
    设置模块，配置为根据上电时序规则对所述待测目标进行上电设置。
  11. 根据权利要求8所述的装置，其中，所述处理模块，还配置为根据所述V2与所述待测目标的设定电压V0的比较结果确定是否调整所述V1。
  12. 根据权利要求11所述的装置，其中，所述处理模块，配置为判断所述V2与所述V0的差值是否超出预设阈值范围，若所述差值超出预设阈值范围，则调整所述V1直到所述V2与所述V0的差值没有超出所述预设阈值范围为止；
    若所述差值未超出预设阈值范围，则判断所述V2是否等于所述V0，若所述V2不等于所述V0，则调整所述V1直到所述V2等于所述V0为止；
    若所述V2等于所述V0，则不调整所述V1。
  13. 根据权利要求8所述的装置，其中，所述装置还包括：
    输出模块，配置为保存所述待测目标的功耗，输出显示所述待测目标的功耗。
  14. 根据权利要求8至13任一项所述的装置，其中，所述确定模块，配置为根据公式R1＝ρ1L/(0.03W)计算得到所述R1，其中，ρ1为走线的电阻率，L为走线长度，W为走线宽度；根据公式R2＝ρ2h/πr2计算得到所述R2，其中，ρ2为封装点的电阻率，h为封装点的半径，r为封装点焊盘的半径；
    所述处理模块，配置为根据公式I＝(V1-V2)/R1计算得到所述I；利用串联电路电流一致的定理，根据公式V3＝(V2-IR2)计算得到所述V3。
  15. 一种测量功耗的装置，包括：处理器和用于存储能够在处理器上运行的计算机程序的存储器，其中，所述处理器用于运行所述计算机程序 时，执行权利要求1至7任一项所述测量功耗的方法的步骤。
  16. 一种计算机存储介质，所述计算机存储介质中存储有计算机可执行指令，所述计算机可执行指令用于执行权利要求1至7任一项所述的测量功耗的方法。
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