WO2018070284A1 - 気相プロセス用再熱捕集装置 - Google Patents
気相プロセス用再熱捕集装置 Download PDFInfo
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- WO2018070284A1 WO2018070284A1 PCT/JP2017/035784 JP2017035784W WO2018070284A1 WO 2018070284 A1 WO2018070284 A1 WO 2018070284A1 JP 2017035784 W JP2017035784 W JP 2017035784W WO 2018070284 A1 WO2018070284 A1 WO 2018070284A1
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D45/00—Separating dispersed particles from gases or vapours by gravity, inertia, or centrifugal forces
- B01D45/04—Separating dispersed particles from gases or vapours by gravity, inertia, or centrifugal forces by utilising inertia
- B01D45/08—Separating dispersed particles from gases or vapours by gravity, inertia, or centrifugal forces by utilising inertia by impingement against baffle separators
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D53/00—Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases, aerosols
- B01D53/005—Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases, aerosols by heat treatment
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D53/00—Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases, aerosols
- B01D53/34—Chemical or biological purification of waste gases
- B01D53/46—Removing components of defined structure
- B01D53/68—Halogens or halogen compounds
- B01D53/70—Organic halogen compounds
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D53/00—Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases, aerosols
- B01D53/34—Chemical or biological purification of waste gases
- B01D53/74—General processes for purification of waste gases; Apparatus or devices specially adapted therefor
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B32/00—Carbon; Compounds thereof
- C01B32/90—Carbides
- C01B32/914—Carbides of single elements
- C01B32/956—Silicon carbide
- C01B32/963—Preparation from compounds containing silicon
- C01B32/977—Preparation from organic compounds containing silicon
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4412—Details relating to the exhausts, e.g. pumps, filters, scrubbers, particle traps
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/54—Apparatus specially adapted for continuous coating
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D2257/00—Components to be removed
- B01D2257/20—Halogens or halogen compounds
- B01D2257/204—Inorganic halogen compounds
- B01D2257/2045—Hydrochloric acid
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D2257/00—Components to be removed
- B01D2257/20—Halogens or halogen compounds
- B01D2257/206—Organic halogen compounds
- B01D2257/2064—Chlorine
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D2257/00—Components to be removed
- B01D2257/55—Compounds of silicon, phosphorus, germanium or arsenic
- B01D2257/553—Compounds comprising hydrogen, e.g. silanes
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D2257/00—Components to be removed
- B01D2257/55—Compounds of silicon, phosphorus, germanium or arsenic
- B01D2257/556—Organic compounds
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D2258/00—Sources of waste gases
- B01D2258/02—Other waste gases
- B01D2258/0216—Other waste gases from CVD treatment or semi-conductor manufacturing
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C2222/00—Aspects relating to chemical surface treatment of metallic material by reaction of the surface with a reactive medium
- C23C2222/20—Use of solutions containing silanes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67109—Apparatus for thermal treatment mainly by convection
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02C—CAPTURE, STORAGE, SEQUESTRATION OR DISPOSAL OF GREENHOUSE GASES [GHG]
- Y02C20/00—Capture or disposal of greenhouse gases
- Y02C20/30—Capture or disposal of greenhouse gases of perfluorocarbons [PFC], hydrofluorocarbons [HFC] or sulfur hexafluoride [SF6]
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P20/00—Technologies relating to chemical industry
- Y02P20/151—Reduction of greenhouse gas [GHG] emissions, e.g. CO2
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the present disclosure relates to an apparatus for reheating exhaust gas and collecting a solid phase in a gas phase process.
- CVD chemical vapor deposition
- the exhaust of these processes contains unreacted source gas and various by-products.
- substances such as methyltrichlorosilane, hydrogen chloride, and hydrogen are included in the exhaust. Some of these may cause undesirable results if released into the atmosphere as they are, and are usually exhausted to the outside after being treated using a suitable scrubber.
- Patent Documents 1 and 2 report that a solid chlorosilane polymer is generated from chlorosilane in a gas phase and adheres to a device, and a method for removing this from the device is disclosed.
- the pressure is usually controlled by the balance between the supply amount of the raw material gas and the exhaust amount by the vacuum pump. Therefore, if the exhaust efficiency varies, the pressure control will be hindered. In extreme cases, the process must be frequently stopped to remove deposits, which significantly reduces the efficiency of the process. In addition, there are deposits that cause an undesirable reaction when exposed to the air, such as the chlorosilane polymer described above, and post-treatment of the removed deposits may be difficult.
- the device disclosed below has been devised to solve the above-mentioned problems at the same time.
- a reheat collector for a vapor phase process includes a container extending in an axial direction along an axis and defining a chamber, and inflows that communicate with the chamber and are spaced apart from each other in the axial direction. And a heater for heating the chamber between the inflow path and the exhaust path.
- the reheat collector for a vapor phase process includes one or more baffles, is movable in the axial direction, and at least one of the baffles is positioned between the inflow passage and the exhaust passage in the chamber.
- a baffle structure that can be damped is further provided.
- the one or more baffles are formed of a curved plate that spirals around the axis, or a plurality of plates that are expanded radially from the axis.
- the baffle structure further includes a support body made of a rod, a polygonal column, or a cylindrical body that is movable in the axial direction and extends in the axial direction in the chamber, and the one or more baffles are mutually connected.
- a plurality of independent plates each supported by the support to move together with the support. More preferably, a reaction chamber heated by the heater, and a standby chamber and a refuge chamber respectively extending outward from the reaction chamber in the axial direction so as to sandwich the reaction chamber in communication with the reaction chamber, respectively , And the baffle structure is movable throughout the standby chamber, the reaction chamber, and the evacuation chamber.
- the inflow path and the exhaust path are arranged to communicate with the chamber in a direction non-parallel to the axial direction.
- unreacted source gas or by-product can be collected in a container as a safe solid phase, and can be continuously collected for a long time.
- FIG. 1 is a schematic block diagram of a chemical vapor processing apparatus.
- FIG. 2 is a schematic longitudinal sectional view of a reheat collection device for a chemical vapor process.
- FIG. 3A is a plan view of the baffle among the components of the baffle structure.
- FIG. 3B is a plan view of a support bar among the components of the baffle structure.
- FIG. 3C is a plan view of a nut among the components of the baffle structure.
- FIG. 4 is a partial plan view showing the assembled baffle structure according to the embodiment.
- FIG. 5A is a diagram illustrating an example of an arrangement of baffles.
- FIG. 5B is a diagram illustrating another example of arrangement of baffles.
- FIG. 6A is a diagram illustrating another example of the baffle.
- FIG. 5A is a diagram illustrating another example of the baffle.
- FIG. 6B is a diagram illustrating an example of arrangement of baffles according to another example.
- FIG. 7A is a diagram illustrating still another example of the baffle.
- FIG. 7B is a diagram illustrating an example of arrangement of baffles according to still another example.
- FIG. 8A is a plan view of a support bar of a baffle structure according to another example.
- FIG. 8B is a plan view of a baffle structure according to another example.
- FIG. 9 is a plan view of a baffle structure according to still another example.
- FIG. 10A is a plan view of a baffle according to a first example of another embodiment.
- FIG. 10B is a plan view of a baffle according to a second example of another embodiment.
- FIG. 10A is a plan view of a baffle according to a first example of another embodiment.
- FIG. 10B is a plan view of a baffle according to a second example of another embodiment.
- FIG. 10C is a plan view of a baffle according to a third example of another embodiment.
- FIG. 10D is a plan view of a baffle according to a fourth example of another embodiment.
- FIG. 10E is a plan view of a baffle according to a fifth example of another embodiment.
- FIG. 11A is a partial cross-sectional plan view illustrating the assembled baffle structure according to one embodiment.
- FIG. 11B is a partial cross-sectional plan view showing the assembled baffle structure according to one embodiment.
- FIG. 12 is a plan view of a baffle made of a curved plate that draws a spiral.
- a chemical vapor process apparatus 1 using a chemical vapor impregnation (CVI) method, a chemical vapor deposition (CVD) method, or the like includes, for example, a gas supply device 3, a reaction vessel 5 communicated therewith, and a reaction vessel. 5 includes a vacuum pump 7 for depressurizing the inside, and an exhaust scrubber 9 for treating the exhaust.
- CVI chemical vapor impregnation
- CVD chemical vapor deposition
- a plurality of cylinders that individually store gas can be connected to the gas supply device 3, and each cylinder supplies, for example, a purge gas or a raw material gas to the reaction vessel 5.
- the gas used for the reaction is introduced into the exhaust scrubber 9, processed, and released to the atmosphere.
- the pressure is controlled by the balance between the supply amount of the raw material gas and the exhaust amount by the vacuum pump 7.
- the reheat collection device 10 is connected to the exhaust system of the chemical vapor processing apparatus 1, preferably upstream of the vacuum pump 7 and the exhaust scrubber 9, and is used to process the exhaust. According to the reheat collection device 10, since unreacted raw material gas or by-product is collected on the baffle as a safe solid phase by heating, the chlorosilane polymer is prevented from adhering to the exhaust system, and The burden on the exhaust scrubber 9 is reduced. As will be described in detail later, the chemical vapor process apparatus 1 can be operated continuously for a long time by gradually moving and collecting the baffle structure.
- methyltrichlorosilane is contained in the exhaust gas as an unreacted raw material, which is pyrolyzed and collected as silicon carbide.
- unreacted raw material which is pyrolyzed and collected as silicon carbide.
- it is applied to a process using different raw materials, for example, to collect BN, Si 3 N 4 , B 4 C, or rare metals from unreacted raw material gases or by-products. Forms can be used.
- the reheat collection device 10 roughly includes a container 11 that defines a chamber therein, an inflow path 13 and an exhaust path 15 that communicate with the chamber defined by the container 11, and the interior of the container 11.
- a heater 17 for heating and a baffle structure disposed in the container 11 are provided.
- the flow that has flowed in through the inflow path 13 as indicated by the arrow Fin is heated by the heater 17 while being meandered or spirally swirled around the baffle structure as indicated by the arrow F, and repeatedly touches the baffle 21 and then the arrow Fout. In this way, the gas is discharged from the exhaust passage 15.
- the methyltrichlorosilane left unreacted in the reaction vessel 5 produces a solid or semi-solid chlorosilane polymer if not heated, but is decomposed by heating by the heater 17 to form solid-phase silicon carbide. Change. This is collected by the baffle 21 and removed. That is, unreacted methyltrichlorosilane is removed or reduced, and then discharged from the exhaust passage 15.
- the container 11 is made of an appropriate material that can withstand heating and corrosion, and for example, graphite or quartz glass can be applied thereto.
- the container 11 extends long in the axial direction along the axis so as to have a certain length, and the chamber inside the container 11 also extends in the axial direction.
- the outer shape can be cylindrical, and the inner chamber can be cylindrical, but is not necessarily limited thereto.
- the container 11 has an inner diameter D of about 30 to 300 mm.
- the chamber inside the container 11 is generally composed of a reaction chamber 11b between the inflow passage 13 and the exhaust passage 15, and a waiting chamber 11a and a waiting chamber 11c communicating with both ends of the reaction chamber 11b.
- the reaction chamber 11b is a chamber for thermally decomposing exhaust gas, and the heater 17 may extend from the immediate vicinity of the inflow path 13 to the immediate vicinity of the exhaust path 15 in order to heat the whole.
- the length of the reaction chamber 11b needs to be sufficient in view of the decomposition reaction speed, which depends on the heating temperature, the exhaust gas pressure, the flow rate, and the like. However, if it is long, it is disadvantageous in terms of piping resistance.
- the length of the reaction chamber 11b is, for example, about 200 to 2000 mm.
- the container 11 is extended outward in the axial direction from the inflow passage 13 by a certain length La, and the inside thereof is a standby chamber 11a for waiting for an unused portion of the baffle structure.
- the plunger 25 for moving the baffle structure may be pulled out, and the space between the closed end and the plunger 25 is hermetically sealed. Since the heat of the heater 17 does not reach such an end, an O-ring made of fluorine rubber or the like can be used for sealing, or a structure with higher heat resistance such as a metal bellows may be adopted.
- means for movement may be accommodated inside the container 11.
- the container 11 is extended outward in the axial direction from the exhaust passage 15 by a length Lc, and the inside thereof is a retreat chamber 11c in which a portion after use of the baffle structure is retreated. Although such a terminal is also closed, for the convenience of exchanging the baffle structure, an openable / closable door that can be hermetically sealed can be employed.
- La and Lc can be determined according to the length of the required baffle structure.
- the exhaust flow F in the container 11 does not reach the waiting room 11a and the waiting room 11c, and is limited to the reaction chamber 11b. Since heating is also limited within the reaction chamber 11b, the formation and deposition of silicon carbide is limited exclusively within the reaction chamber 11b.
- the inner wall of the container 11 may be covered with a protective material 19 such as a graphite sheet, and the protective material 19 may be limited to the reaction chamber 11b.
- the inflow path 13 is a pipe communicating with the reaction vessel 5, and the exhaust path 15 is a pipe communicating with the outside air.
- the inflow passage 13 and the exhaust passage 15 are arranged away from each other in the axial direction, and the length of the reaction chamber 11b depends on the distance between them.
- the inflow path 13 and the exhaust path 15 may be parallel and connected to the container 11 from the same side, or one may be on the opposite side of the other. Further alternatively, both may not be parallel and may be twisted.
- the two may intersect at an arbitrary angle different from orthogonal to the axis of the container 11. However, since it is necessary to secure the waiting room 11a and the waiting room 11c, it is inevitable that the direction is not parallel to the axis of the container 11.
- any heating device having sufficient ability to heat the gas in the reaction chamber 11 b by radiation and heat transfer can be used, and for example, a carbon heater can be applied thereto. Or you may utilize a high frequency induction heating apparatus.
- the heater 17 may be installed outside the reaction chamber 11b, or may be installed in the chamber 11b.
- the baffle structure includes one or more baffles 21 for controlling the exhaust flow F and collecting the decomposition products.
- the entire baffle structure is made of, for example, graphite.
- the surface may be covered with carbon felt.
- the baffle structure also has a certain length in the axial direction and extends long inside the chamber in the container 11. Further, the baffle structure is not fixed to the container 11 and is movable in the axial direction. As will be described in detail later, by gradually moving the baffle structure in the axial direction, the place where silicon carbide is collected can be moved. Further, in addition to moving in the axial direction, it may be rotated around the axis. This contributes to uniform deposition of silicon carbide.
- At least one of the baffles 21 can always be positioned in the reaction chamber 11b at all times before and during the movement.
- the baffle structure can take various forms, for example, a plurality of semicircular and flat plate-like baffles 21 illustrated in FIG. 3A and a support bar 23 illustrated in FIG. 3B over the entire length thereof. And a nut 33 illustrated in FIG. 3C for fixing the baffle 21 to the support bar 23.
- the baffle 21 has a semicircular shape in which a half of the circle is cut off by a straight cutout 21c passing through the center of the circle, and includes a semicircular coupling hole 31 around the center of the circle.
- the outer radius Re of the baffle 21 is slightly smaller than the inner radius D / 2 of the container 11, and the inner radius Ri of the coupling hole 31 is determined so as to match the outer diameter of the support bar.
- the support bar 23 may be in the form of a stud bolt having a screw thread 23t over its entire length. By combining this with the nut 33 having the screw hole 35, each baffle 21 can be fixed at an arbitrary position as shown in FIG.
- the pitch P between the baffles 21 is, for example, about 20 to 200 mm, but can be appropriately increased or decreased depending on the pressure in the reaction chamber 11b and the flow rate of the exhaust.
- Each baffle 21 is arranged to meander the exhaust flow F.
- the other baffle 21 adjacent to the one baffle 21 can be disposed on the opposite side to the axis, that is, at a position rotated by 180 ° around the axis.
- the flow F deflected to one side by one baffle 21 is deflected to the other by the next baffle 21, and the flow F meanders in the reaction chamber 11b by being repeated.
- the meandering of the flow F is advantageous in efficiently collecting the decomposition products because the time during which the exhaust gas stays in the reaction chamber 11b is extended and the opportunity to touch the baffle 21 is increased.
- another baffle 21 adjacent to one baffle 21 is disposed at a position rotated 120 ° around the axis, and then the adjacent baffle 21 is disposed at a position further rotated 120 °. be able to.
- the position is not limited to 120 °, and the position may be shifted at an arbitrary angle.
- Such an arrangement not only causes the exhaust flow F to meander, but also turns it. Such an arrangement is also advantageous for efficiently collecting the decomposition products.
- the baffle 21 may be a fan shape having a fan-shaped notch 21c as shown in FIG.
- the notch 21c is, for example, 1 ⁇ 4 of a circle, but may be more or less than that.
- the baffle 21 can be arranged to meander or spirally swirl the flow.
- the notch 21c may not be a fan shape, but may be a straight shape that does not pass through the center of the circle as shown in FIG. 7A.
- the baffle 21 can be arranged so as to meander or spirally turn the flow.
- each support bar 37 is a relatively short bar that can be connected to each other. You may comprise a long support bar by connecting linearly. This is advantageous in that the length of the baffle structure can be increased or decreased as necessary.
- the outer periphery of the support bar 37 can be a smooth cylinder or prism.
- a relatively short bolt part 39 projects from one end thereof, and the other end has a screw hole 41 corresponding thereto. The bolt part 39 can be screwed into the screw hole 41.
- the baffle 21 can be fixed without a nut. That is, as shown in FIG. 8B, a long baffle structure can be configured while fixing the baffle 21 by connecting the support bars 37 while sandwiching the baffle 21 therebetween.
- the baffle 21 can be supported without being fixed, for example, only by fitting.
- the support bar 43 includes a circumferential groove 45 that fits into the baffle 21, and the baffle 21 is fitted into the circumferential groove 45 to constitute a baffle structure. A force is not applied to the baffle 21, and if silicon nitride is deposited, the baffle 21 is bonded thereby, so that a firm fixation is not essential.
- a means such as adhesion may be used.
- adhesion for example, a ceramic adhesive made of an inorganic polymer can be used.
- the support bar that penetrates the center of the baffle structure is used.
- the support structure is not limited to the rod, but may be another structure such as a polygonal column or a cylindrical body. In that case, as illustrated in FIG. 10A and FIG. 10B, the baffle 21 may not have a coupling hole.
- a through-hole 47 through which exhaust gas can pass may be used.
- a plurality of through holes 47 may pass through the baffle 21 symmetrically or asymmetrically as shown in FIG. 10C, or a single through hole 47 near or off the center may pass through the baffle 21 as shown in FIG. 10D or 10E. It may penetrate.
- the positions of the through holes 47 may be shifted between the adjacent baffles 21, or the baffle in FIG. 10C and the baffle in FIG. 10D. It is also possible to combine different types of baffles, such as
- FIG. 11A is an example in which a plurality of baffles 21 are sandwiched by a plurality of cylindrical bodies 49 to constitute a baffle structure.
- the peripheral surface of the cylinder is not closed and is open on the side facing the inflow path 13 and the exhaust path 15.
- the cylindrical body and the baffle are separate, but they may be integrated as shown in FIG. 11B.
- the integrated structure may be cut out from a bulk material, or the integrated structure may be formed by sintering or the like, or the cylindrical portion 51 and the baffle portion 53 may be individually manufactured and joined together.
- the baffle 21 or the baffle portion 53 may be a flat plate, but may be a curved plate for the purpose of rectifying the flow F or the like.
- the baffle portion 53 has a conical shape protruding in the axial direction.
- the baffle structure may be a curved plate that spirals around the axis as a whole. It may be configured only by the baffle 55 that draws a spiral curved surface, or the spacer 57 may cover the outer periphery thereof. Of course, this structure also causes the flow F to spiral.
- the baffle structure is located in the reaction chamber 11b, but the remaining part is accommodated in the standby chamber 11a, and the waiting chamber 11c is empty.
- the inside of the reaction vessel 5 is controlled to a constant pressure, for example, 100 Pa to 5 kPa by supplying the raw material gas.
- the pressure is determined by the gas supply amount, the displacement of the vacuum pump 7, and the piping resistance.
- the temperature of the baffle structure is raised together with the exhaust by radiation. If the temperature of the baffle structure is too low, sufficient reaction efficiency cannot be obtained, and rather the formation of a chlorosilane polymer may be promoted.
- the exhaust after being subjected to the reaction in the reaction vessel 5 contains hydrogen chloride and hydrogen as a by-product and unreacted methyltrichlorosilane, and flows into the reaction chamber 11b through the inflow path 13.
- the exhaust gas is swirled or spiraled by the baffle structure, repeatedly touching the baffle, and methyltrichlorosilane is decomposed and collected as silicon carbide in the baffle. If the temperature rise is sufficient, chlorosilane polymer will not be formed in this process. After the unreacted methyltrichlorosilane is removed or reduced, the exhaust is discharged from the exhaust passage 15.
- the silicon carbide gradually becomes thicker on the baffle, and the pipe resistance in the reheat collector 10 increases. This is a factor that raises the pressure in the reaction vessel 5, and the chemical vapor phase process cannot be continued if the control capability by the gas supply amount and the vacuum pump 7 exhaust amount is exceeded.
- the baffle structure is gradually and continuously moved toward the waiting room 11c.
- the moving speed is, for example, about 1 mm / min, but can be appropriately increased or decreased depending on the reaction speed or the growth speed of the decomposition product.
- the thickly adhering portion is retracted to the retreat chamber 11c and the new portion enters the reaction chamber 11b, so that the pipe resistance is kept constant.
- the collection of silicon carbide can be continued until the tip of the baffle structure reaches the end of the waiting room 11c. During this time, the pressure in the reaction vessel 5 can be easily kept constant.
- the entire chemical vapor processing apparatus 1 is purged with an appropriate gas, and then the reheat collecting apparatus 10 is opened to the atmosphere.
- the generated silicon carbide is recovered as a collected material on the baffle. Since the generation of the chlorosilane polymer is prevented by heating, the collected material can be discarded without requiring troublesome post-treatment.
- the chemical vapor phase process may take a very long time, for example, 200 hours, but a fixed baffle can be operated continuously only for about 20 hours at most. It is necessary to frequently stop the process and replace the baffle, which significantly impairs productivity. Alternatively, workers need to be stationed throughout the day and night for pressure adjustment and replacement. Compared to this, according to the present embodiment, the baffle structure and the container 11 are appropriately lengthened, so that the operation can be continued continuously even for a long time such as 200 hours. In addition, it is easy to automate the operation, and work through day and night becomes unnecessary.
- a reheat collection device that can be operated continuously and does not require troublesome post-treatment is provided.
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Abstract
Description
Claims (6)
- 軸に沿う軸方向に延びて室を画する容器と、
それぞれ前記室に連通し、前記軸方向に互いに離れて配置された流入路および排気路と、
前記流入路と前記排気路との間において前記室を加熱するヒータと、
を備えた気相プロセス用再熱捕集装置。 - 一以上のバッフルを備え、前記軸方向に可動であって前記室において前記バッフルの少なくとも一を前記流入路と前記排気路との間に位置せしめることが可能なバッフル構造体、
をさらに備えた請求項1の気相プロセス用再熱捕集装置。 - 前記一以上のバッフルは、前記軸の周りに螺旋を描く曲面板、またはそれぞれ平面あるいは曲面の複数の板よりなる、請求項2の気相プロセス用再熱捕集装置。
- 前記バッフル構造体は、前記軸方向に可動であって前記室において前記軸方向に延びた棒、多角柱または円筒体よりなる支持体をさらに備え、
前記一以上のバッフルは互いに独立した複数の板であって、前記支持体と共に移動するべく前記支持体にそれぞれ支持されている、請求項2の気相プロセス用再熱捕集装置。 - 前記ヒータにより加熱される反応室と、それぞれ前記反応室と連通して前記反応室を挟むように前記反応室から前記軸方向に外方にそれぞれ延長された待機室および待避室と、を前記室が含むべく前記容器は寸法づけられ、
前記バッフル構造体は、前記待機室、前記反応室および前記待避室の全体にわたり可動である、請求項2の気相プロセス用再熱捕集装置。 - 前記流入路および前記排気路は、前記軸方向に対して非平行な向きに前記室に連通するべく配置されている、請求項1ないし5の何れか1項の気相プロセス用再熱捕集装置。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
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EP17860242.1A EP3527691A4 (en) | 2016-10-14 | 2017-10-02 | HEAT RECOVERY DEVICE FOR GAS PHASE PROCESS |
JP2018544961A JP6610806B2 (ja) | 2016-10-14 | 2017-10-02 | 気相プロセス用再熱捕集装置 |
CN201780042825.1A CN109477217A (zh) | 2016-10-14 | 2017-10-02 | 气相工艺用再热捕集装置 |
RU2019113768A RU2724260C1 (ru) | 2016-10-14 | 2017-10-02 | Устройство для отбора повторным нагреванием для газофазного процесса |
CA3033747A CA3033747C (en) | 2016-10-14 | 2017-10-02 | Reheating collection device for gas phase process |
US16/239,589 US10507414B2 (en) | 2016-10-14 | 2019-01-04 | Reheating collection device for gas phase process |
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JP2016202313 | 2016-10-14 |
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US16/239,589 Continuation US10507414B2 (en) | 2016-10-14 | 2019-01-04 | Reheating collection device for gas phase process |
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EP (1) | EP3527691A4 (ja) |
JP (1) | JP6610806B2 (ja) |
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FR3112797B1 (fr) * | 2020-07-24 | 2022-12-02 | Safran Ceram | Procédé de traitement d’une phase gazeuse résiduelle issue d’une technique CVI |
FR3114329B1 (fr) * | 2020-09-24 | 2023-06-23 | Safran Ceram | Procédé de traitement d’une phase gazeuse résiduelle issue d’une technique CVI |
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CN109477217A (zh) | 2019-03-15 |
JPWO2018070284A1 (ja) | 2019-04-11 |
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US20190134545A1 (en) | 2019-05-09 |
US10507414B2 (en) | 2019-12-17 |
CA3033747A1 (en) | 2018-04-19 |
EP3527691A4 (en) | 2020-06-24 |
RU2724260C1 (ru) | 2020-06-22 |
CA3033747C (en) | 2021-01-19 |
EP3527691A1 (en) | 2019-08-21 |
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