WO2018014651A1 - 用于校准电流测量装置的方法、电流测量方法及装置、显示装置 - Google Patents

用于校准电流测量装置的方法、电流测量方法及装置、显示装置 Download PDF

Info

Publication number
WO2018014651A1
WO2018014651A1 PCT/CN2017/085631 CN2017085631W WO2018014651A1 WO 2018014651 A1 WO2018014651 A1 WO 2018014651A1 CN 2017085631 W CN2017085631 W CN 2017085631W WO 2018014651 A1 WO2018014651 A1 WO 2018014651A1
Authority
WO
WIPO (PCT)
Prior art keywords
current
measuring device
current measuring
time
calibrating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2017/085631
Other languages
English (en)
French (fr)
Inventor
陈蕾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BOE Technology Group Co Ltd
Hefei Xinsheng Optoelectronics Technology Co Ltd
Original Assignee
BOE Technology Group Co Ltd
Hefei Xinsheng Optoelectronics Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BOE Technology Group Co Ltd, Hefei Xinsheng Optoelectronics Technology Co Ltd filed Critical BOE Technology Group Co Ltd
Priority to JP2017567351A priority Critical patent/JP7126827B2/ja
Priority to US16/318,569 priority patent/US11187772B2/en
Publication of WO2018014651A1 publication Critical patent/WO2018014651A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0023—Measuring currents or voltages from sources with high internal resistance by means of measuring circuits with high input impedance, e.g. OP-amplifiers
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/0233—Improving the luminance or brightness uniformity across the screen
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/029—Improving the quality of display appearance by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/04—Maintaining the quality of display appearance
    • G09G2320/043—Preventing or counteracting the effects of ageing

Definitions

  • Embodiments of the present disclosure relate to display technologies, and in particular, to a method for calibrating a current measuring device, a current measuring method and device, and a display device.
  • the driving transistor may generate a driving current according to the data voltage to drive the organic light emitting diode to emit light for display.
  • the threshold voltage of the driving transistor affects the correspondence between the data voltage and the driving current.
  • the threshold voltages of different driving transistors may be different, and the threshold voltages of the same driving transistor may be different at different times. Therefore, the same driving current may not be obtained for the same data voltage, which may cause uneven illumination of the display device. .
  • Embodiments of the present disclosure provide a method for calibrating a current measuring device, a current measuring method and device, and a display device.
  • an embodiment of the present disclosure provides a method for calibrating a current measuring device.
  • the current measuring device measures the current based on the time parameter, and the time parameter is the current making the electricity The time required for the voltage in the flow measuring device to change the predetermined value.
  • the method includes: inputting a plurality of specified currents to a current measuring device; detecting a plurality of time parameters corresponding to the plurality of specified currents; obtaining a function of current and time parameters according to the plurality of specified currents and corresponding plurality of time parameters .
  • the functional relationship is a linear relationship.
  • the plurality of designated currents are two specified currents.
  • the plurality of designated currents are more than two specified currents.
  • an embodiment of the present disclosure provides a current measurement method including: detecting a time parameter corresponding to a current; determining a current according to a time parameter corresponding to the current, and a function of the current and the time parameter .
  • the current measurement method further includes calibrating the function of the current and time parameters using the method of calibrating the current measuring device described above.
  • calibration is periodically performed as a function of current and time parameters.
  • the functional relationship is a linear relationship.
  • an embodiment of the present disclosure provides a current measuring apparatus including an operational amplifier, an integrating capacitor; an operational amplifier including a positive input terminal, a negative input terminal, and an output terminal; and an integrating capacitor connected to the negative input terminal and the output terminal
  • the negative input is configured as an input current
  • the positive input is configured to input an initialization voltage
  • the current measuring device further includes: a control unit configured to detect a time parameter corresponding to the current, and according to the current The current is determined as a function of time parameters; wherein the time parameter is the time required for the current to change the voltage at the output to a predetermined value.
  • the current measuring device further includes a switching element connected between the negative input terminal and the output terminal.
  • the switching element is configured to directly connect the negative input and the output before the input current to set the voltage at the positive input, the negative input, and the output.
  • the current measuring device further includes: a current source configured to provide a plurality of specified currents to the negative input terminal; the control unit is further configured to detect a plurality of times corresponding to the plurality of specified currents Parameters, and based on a plurality of specified currents and corresponding multiple time parameters, a function of current and time parameters is obtained.
  • an embodiment of the present disclosure provides a display device including the above-described current measuring device.
  • the method for calibrating a current measuring device, the current measuring method and device, and the display device provided according to an embodiment of the present disclosure improve the accuracy of current measurement.
  • FIG. 1 is a schematic diagram of a current measurement principle of an embodiment of the present disclosure
  • Figure 2 is a schematic diagram showing the relationship between current and time parameters shown in Figure 1;
  • FIG. 3 is a flow chart of a method for calibrating a current measuring device provided by an embodiment of the present disclosure
  • FIG. 5 is a schematic circuit diagram of a current measuring device according to an embodiment of the present disclosure.
  • Figure 6 is a schematic illustration of time parameters associated with the circuit measuring device shown in Figure 5;
  • Figure 7 is a schematic illustration of time parameters corresponding to different currents
  • Figure 8 is a graphical illustration of the relationship between current and time parameters associated with the circuit measuring device of Figure 5;
  • Figure 9 is a graphical illustration of the relationship between current and time parameters associated with the circuit measuring device of Figure 5 before and after calibration.
  • FIG. 1 is a schematic diagram of a current measurement principle of an embodiment of the present disclosure. As shown in Figure 1, for electricity Stream I can be converted to a corresponding time parameter TP using current measuring circuit 1 to facilitate measurement. This method can be well applied to the measurement of the drive current of the drive transistor in the display device.
  • the current measuring circuit 1 can be any circuit capable of converting current into a time parameter TP.
  • the time parameter may be the time required for the current to cause the voltage in the current measuring device to change a predetermined value.
  • the current measuring circuit 1 may include an energy storage element such as a capacitor.
  • Current I can charge the capacitor and the time parameter can correspond to the charging time.
  • Current I can also be used to discharge the capacitance, and the time parameter can correspond to the discharge time.
  • the time parameter TP may directly adopt the value of the above charging time or discharging time, or may be obtained by converting the value of the charging time or the discharging time.
  • Figure 2 is a graphical representation of the relationship between current and time parameters shown in Figure 1.
  • the current and the corresponding time parameter TP may have a one-to-one functional relationship such as a linear relationship.
  • This functional relationship can be calculated theoretically or by calibration.
  • a proportional relationship is taken as an example. It can be understood that the linear relationship can also be an inverse proportional relationship.
  • a method for calibrating a current measuring device includes: inputting a plurality of specified currents to a current measuring device; detecting a plurality of time parameters corresponding to a plurality of specified currents; according to a plurality of specified currents and corresponding multiples Time parameters are obtained as a function of current and time parameters.
  • Embodiments of the present disclosure may be used to calibrate current measuring devices of array substrates.
  • the functional relationship may be a linear relationship.
  • the two coefficients can be calculated.
  • more than two currents and corresponding more than two time parameters may be used, and at this time, two coefficients expressing a linear relationship are obtained by fitting or the like. Using more than 2 currents can improve accuracy.
  • the current measurement method includes: determining a time parameter corresponding to the current; determining the current according to a time parameter corresponding to the current, and a function of the current and the time parameter.
  • a functional relationship can be a linear relationship.
  • the current measurement method can also include calibrating the function of the current and time parameters using the method described above for calibrating the current measuring device. Also, the calibration can be performed periodically to maintain high accuracy.
  • the method for calibrating a current measuring device and the current measuring method provided according to an embodiment of the present disclosure enable more accurate measurement of a driving current of a driving transistor.
  • FIG. 5 is a circuit schematic diagram of a current measuring device provided by an embodiment of the present disclosure.
  • the current measuring device includes an operational amplifier OA and an integrating capacitor Cop.
  • the operational amplifier OA includes a positive input terminal, a negative input terminal, and an output terminal.
  • the integrating capacitor Cop is connected between the negative input terminal and the output terminal.
  • the negative input is configured as input current I.
  • the positive input is configured to input an initialization voltage.
  • the influence of the external circuit of the array substrate is expressed using the parasitic capacitance Cs.
  • the time parameter CT is used to represent the time required for the current I to cause the voltage at the output to change by a predetermined value.
  • the time parameter CT is the discharge time of the integration capacitor Cop, that is, the time required for the voltage Vo at the output terminal to decrease by a predetermined value ⁇ V when the current I is input to the negative input terminal.
  • the operational amplifier OA which is used to convert the current I into a time parameter CT.
  • the current measuring device can further comprise a control unit for calculating the current I from the time parameter CT.
  • the control unit is configured to determine a time parameter corresponding to the current and to determine the current based on a predetermined functional relationship of the current and time parameters.
  • the current measuring device can also include a current source configured to provide a plurality of specified currents to the negative input.
  • the control unit is further configured to determine a plurality of time parameters corresponding to the plurality of specified currents and to derive a current as a function of time parameters based on the plurality of specified currents and the corresponding plurality of time parameters.
  • FIG. 6 is a schematic illustration of time parameters associated with the circuit measuring device shown in Figure 5.
  • the time parameter can be determined according to the following procedure: setting the voltages of the positive input terminal, the negative input terminal, and the output terminal to be the first reference voltage Vr1.
  • the current I is input to the negative input terminal, and the current time is recorded as the discharge start time T0.
  • the voltage Vo at the output terminal is detected until it is lowered to the second reference voltage Vr2 (the voltage difference is ⁇ V), and the current time is recorded as the discharge end time.
  • the difference between the discharge end time and the discharge start time, that is, the discharge time CT is recorded.
  • the current measuring device can also include a switching element coupled between the negative input and the output.
  • the switching element is configured to directly connect the negative input and the output before the input current to set the voltage at the positive input, the negative input, and the output.
  • the step of setting the voltages of the positive input terminal, the negative input terminal and the output terminal to the first reference voltage Vr1 includes directly connecting the negative input terminal and the output terminal through the switching element, and applying the first reference voltage Vr1 at the positive input terminal.
  • the voltage setting and discharging of the integrating capacitor Cop by the operational amplifier OA can increase the speed of the voltage setting and increase the stability of the discharging process, and improve the current measuring accuracy.
  • Figure 7 is a schematic illustration of time parameters corresponding to different currents. As shown in FIG. 7, the first current I1 and the second current I2 correspond to the first discharge time CT1 and the second discharge time CT2, respectively.
  • Figure 8 is a graphical illustration of the relationship between current and time parameters associated with the circuit measuring device of Figure 5.
  • the relationship between the current I and the discharge time CT is obtained based on the first current I1, the second current I2, the first discharge time CT1, and the second discharge time CT2.
  • the current I and the discharge time CT are inversely proportional to the linear relationship.
  • the reciprocal of the current I is proportional to the discharge time CT.
  • the representation in Figure 8 better demonstrates the process of calculating the current: first, the discharge time CT is measured, then the reciprocal of the current I is calculated, and finally the current I is calculated.
  • the current I can be directly calculated according to any discharge time CT during current measurement.
  • the method and current measuring device enable a more accurate measurement of the drive current of the drive transistor.
  • Embodiments of the present disclosure also provide a display device including the above-described current measuring device.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Control Of El Displays (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)

Abstract

一种用于校准电流测量装置的方法、电流测量方法及装置、显示装置。用于校准电流测量装置的方法包括：向电流测量装置输入多个指定电流；检测与多个指定电流相对应的多个时间参数；根据多个指定电流和相对应的多个时间参数，得到电流和时间参数的函数关系。提高了电流测量的精度。

Description

用于校准电流测量装置的方法、电流测量方法及装置、显示装置
相关申请的交叉引用
本申请要求2016年7月19日递交的中国专利申请第201610567191.9号的优先权，在此全文引用上述中国专利申请所公开的内容以作为本申请的一部分。
技术领域
本公开的实施例涉及显示技术，尤其涉及用于校准电流测量装置的方法、电流测量方法及装置、显示装置。
背景技术
在显示技术领域，有机发光二极管(Organic Light-Emitting Diode,OLED)得到了广泛应用。在显示装置的阵列基板中，驱动晶体管可以根据数据电压产生驱动电流来驱动有机发光二极管发光以进行显示。驱动晶体管的阈值电压会影响数据电压和驱动电流的对应关系。不同的驱动晶体管的阈值电压可能不同，并且同一驱动晶体管在不同时期的阈值电压也可能不同，因此，对于同样的数据电压，并不一定能够得到同样的驱动电流，这会导致显示装置发光不均匀。
为了使显示装置发光均匀，需要检测实际的驱动电流并调整数据电压使得实际的驱动电流等于设定的驱动电流。这需要对于实际的驱动电流进行高精度的检测。
发明内容
本公开的实施例提供了用于校准电流测量装置的方法、电流测量方法及装置、显示装置。
根据第一个方面，本公开的实施例提供了一种用于校准电流测量装置的方法。电流测量装置基于时间参数来测量电流，时间参数是电流使得电 流测量装置中的电压改变预定值所需要的时间。该方法包括：向电流测量装置输入多个指定电流；检测与多个指定电流相对应的多个时间参数；根据多个指定电流和相对应的多个时间参数，得到电流和时间参数的函数关系。
在本公开的实施例中，函数关系是线性关系。
在本公开的实施例中，多个指定电流是2个指定电流。
在本公开的实施例中，多个指定电流是多于2个的指定电流。
根据第二个方面，本公开的实施例提供了一种电流测量方法，包括：检测与电流相对应的时间参数；根据与电流相对应的时间参数，以及电流和时间参数的函数关系，确定电流。电流测量方法还包括：使用上述的校准电流测量装置的方法，对于电流和时间参数的函数关系进行校准。
在本公开的实施例中，周期性地对于电流和时间参数的函数关系进行校准。
在本公开的实施例中，函数关系是线性关系。
根据第三个方面，本公开的实施例提供了一种电流测量装置，包括运算放大器，积分电容；运算放大器包括正输入端、负输入端和输出端；积分电容连接在负输入端和输出端之间；负输入端被配置为输入电流，正输入端被配置为输入初始化电压；其中，电流测量装置还包括：控制单元，控制单元被配置为检测与电流相对应的时间参数，并根据电流与时间参数的函数关系，确定电流；其中，时间参数是电流使得输出端的电压改变预定值所需要的时间。
在本公开的实施例中，电流测量装置还包括连接在负输入端和输出端之间的开关元件。开关元件被配置为在输入电流前，将负输入端和输出端直接连接，以设置正输入端、负输入端和输出端的电压。
在本公开的实施例中，电流测量装置还包括：电流源，电流源被配置为向负输入端提供多个指定电流；控制单元还被配置为检测与多个指定电流相对应的多个时间参数，并且根据多个指定电流和相对应的多个时间参数，得到电流和时间参数的函数关系。
根据第四个方面，本公开的实施例提供了一种显示装置，包括上述的电流测量装置。
根据本公开的实施例提供的用于校准电流测量装置的方法、电流测量方法及装置、显示装置，提高了电流测量的精度。
附图说明
为了更清楚地说明本公开的实施例的技术方案，下面将对实施例的附图进行简要说明，应当知道，以下描述的附图仅仅涉及本公开的一些实施例，而非对本公开的限制，其中：
图1是本公开的实施例的电流测量原理示意图；
图2是图1所示的电流和时间参数的函数关系示意图；
图3是本公开的实施例提供的用于校准电流测量装置的方法的流程图；
图4是本公开的实施例提供的电流测量方法的流程图；
图5是本公开的实施例提供的电流测量装置的一个电路示意图；
图6是与图5所示的电路测量装置相关的时间参数的示意图；
图7是与不同的电流相对应的时间参数的示意图；
图8是与图5所示的电路测量装置相关的电流和时间参数的函数关系示意图；
图9是校准前后的与图5所示的电路测量装置相关的电流和时间参数的函数关系示意图。
具体实施方式
为了使本公开的实施例的技术方案和优点更加清楚，下面将结合附图，对本公开的实施例的技术方案进行清楚、完整的描述。显然，所描述的实施例是本公开的一部分实施例，而不是全部的实施例。基于所描述的本公开的实施例，本领域技术人员在无需创造性劳动的前提下所获得的所有其他实施例，也都属于本公开保护的范围。
图1是本公开的实施例的电流测量原理示意图。如图1所示，对于电 流I，可以使用电流测量电路1将其转换为相对应的时间参数TP，以便于测量。该方式能够很好的应用于显示装置中驱动晶体管的驱动电流的测量。
电流测量电路1可以是任何能够将电流转换为时间参数TP的电路。时间参数可以是电流使得电流测量装置中的电压改变预定值所需要的时间。例如，电流测量电路1可以包括电容等储能元件。电流I可以对于电容进行充电，时间参数可以对应于充电时间。电流I也可以用于对电容进行放电，时间参数可以对应于放电时间。时间参数TP可以直接采用上述充电时间或者放电时间的值，也可以对于上述充电时间或者放电时间的值进行转换而得到。
图2是图1所示的电流和时间参数的函数关系示意图。如图2所示，对于确定的电流测量电路1，电流和相对应的时间参数TP可以将存在例如线性关系的一一对应的函数关系。该函数关系可以通过理论计算得到，也可以通过校准得到。图中以正比例的关系为例进行了说明，可以理解，线性关系还可以是反比例的关系。
图3是本公开的实施例提供的用于校准电流测量装置的方法的流程图。如图3所示，用于校准电流测量装置的方法包括：向电流测量装置输入多个指定电流；检测与多个指定电流相对应的多个时间参数；根据多个指定电流和相对应的多个时间参数，得到电流和时间参数的函数关系。
本公开的实施例可以用于校准阵列基板的电流测量装置。
本公开的实施例中，函数关系可以是线性关系。此时，仅需要使用2个系数表达该关系。当已知2个指定电流及相对应的2个时间参数时，就可以计算得到这2个系数。此外，也可以使用多于2个的电流及相对应的多于2个的时间参数，此时通过拟合等方式得到表达线性关系的2个系数。使用多于2个的电流可以提高精确度。
图4是本公开的实施例提供的电流测量方法的流程图。如图4所示，电流测量方法包括：确定与电流相对应的时间参数；根据与电流相对应的时间参数，以及电流和时间参数的函数关系，确定电流。函数关系可以是线性关系。
电流测量方法还可以包括：使用上述的用于校准电流测量装置的方法，对于所述电流和时间参数的函数关系进行校准。并且，该校准可以周期性地进行，以维持高的精度。
根据本公开的实施例提供的用于校准电流测量装置的方法和电流测量方法，能够对于驱动晶体管的驱动电流进行更精确的测量。
以下，使用具体的示例电路对于本公开的实施例提供的用于校准电流测量装置的方法、电流测量方法及装置进行进一步说明。
图5是本公开的实施例提供的电流测量装置的一个电路示意图。如图5所示，电流测量装置包括运算放大器OA，积分电容Cop。运算放大器OA包括正输入端、负输入端和输出端。积分电容Cop连接在负输入端和输出端之间。负输入端被配置为输入电流I。正输入端被配置为输入初始化电压。在图5中，使用寄生电容Cs表示阵列基板的外部电路的影响。
作为示例，使用时间参数CT表示电流I使得输出端的电压改变预定值所需要的时间。时间参数CT是积分电容Cop的放电时间，即，向负输入端输入电流I时，输出端的电压Vo降低预定值ΔV所需要的时间。
运算放大器OA，积分电容Cop用于将电流I转换为时间参数CT。电流测量装置还可以包括控制单元，用于根据时间参数CT计算得到电流I。具体而言，控制单元被配置为确定与电流相对应的时间参数，并根据电流与时间参数的预设定的函数关系，确定电流。
此外，为了对于预设定的函数关系进行校准，电流测量装置，还可以包括电流源，电流源被配置为向负输入端提供多个指定电流。控制单元还被配置为确定与多个指定电流相对应的多个时间参数，并且根据多个指定电流和相对应的多个时间参数，得到电流和时间参数的函数关系。
图6是与图5所示的电路测量装置相关的时间参数的示意图。使用图5所示的电流测量装置时，可以按照以下过程确定时间参数：设置正输入端、负输入端和输出端的电压为第一参考电压Vr1。将电流I输入负输入端，并记录当前时刻为放电开始时刻T0。检测输出端的电压Vo，直至降低为第二参考电压Vr2(电压差为ΔV)，记录当前时刻为放电结束时刻。 记录放电结束时刻和放电开始时刻的差值即放电时间CT。
电流测量装置还可以包括连接在负输入端和输出端之间的开关元件。开关元件被配置为在输入电流前，将负输入端和输出端直接连接，以设置正输入端、负输入端和输出端的电压。则设置正输入端、负输入端和输出端的电压为第一参考电压Vr1的步骤包括：通过开关元件将负输入端和输出端直接连接，并且在正输入端施加第一参考电压Vr1。
根据本公开的实施例，利用运算放大器OA进行积分电容Cop的电压设置以及放电，能够提高电压设置的速度和增加放电过程的稳定性，提高电流测量精度。
图7是与不同的电流相对应的时间参数的示意图。如图7所示，第一电流I1和第二电流I2分别与第一放电时间CT1和第二放电时间CT2相对应。
图8是与图5所示的电路测量装置相关的电流和时间参数的函数关系示意图。如图8所示，根据第一电流I1、第二电流I2、第一放电时间CT1和第二放电时间CT2，得到电流I和放电时间CT的函数关系。电流I与放电时间CT是反比例的线性关系，反之，电流I的倒数与放电时间CT是正比例的线性关系。图8中的表示方式更好的展现了计算电流的过程：首先测量得到放电时间CT，然后计算得到电流I的倒数，最后计算电流I。
图9是校准前后的与图5所示的电路测量装置相关的电流和时间参数的函数关系示意图。如图9，理想的函数关系根据电路结构直接得到，即：I＝Cop*ΔV/CT。由于未能考虑外部电路的干扰以及积分电容Cop制造过程中的误差，理想的函数关系和校准得到的实际函数关系相差较大。
校准得到的实际函数关系可以由下式表示：I＝C_eff*ΔV/(CT-CT0)，其中，曲线斜率C_eff为等效电容，曲线截距CT0为放电时间校准系数。在校准得到曲线斜率C_eff和曲线截距CT0后，在电流测量时，根据任一放电时间CT，即可直接计算得到电流I。
根据本公开的实施例提供的用于校准电流测量装置的方法、电流测量 方法和电流测量装置，能够对于驱动晶体管的驱动电流进行更精确的测量。
本公开的实施例还提供了显示装置，包括上述的电流测量装置。
可以理解的是，以上实施方式仅仅是为了说明本公开的原理而采用的示例性实施方式，然而本公开并不局限于此。对于本领域内的普通技术人员而言，在不脱离本公开的精神和实质的情况下，可以做出各种变型和改进，这些变型和改进也视为本公开的保护范围。

Claims (11)

  1. 一种用于校准电流测量装置的方法，其中所述电流测量装置基于时间参数来测量电流，所述时间参数是所述电流使得所述电流测量装置中的电压改变预定值所需要的时间；所述方法包括：
    向所述电流测量装置输入多个指定电流；
    检测与所述多个指定电流相对应的多个时间参数；
    根据多个所述指定电流和相对应的多个时间参数，得到电流和时间参数的函数关系。
  2. 根据权利要求1所述的用于校准电流测量装置的方法，其中，所述函数关系是线性关系。
  3. 根据权利要求1所述的用于校准电流测量装置的方法，其中，所述多个指定电流是2个指定电流。
  4. 根据权利要求1所述的用于校准电流测量装置的方法，其中，所述多个指定电流是多于2个的指定电流。
  5. 一种电流测量方法，包括：
    检测与电流相对应的时间参数；
    根据与电流相对应的时间参数，以及电流和时间参数的函数关系，确定电流；
    其中，还包括：使用权利要求1所述的用于校准电流测量装置的方法，对于所述电流和时间参数的函数关系进行校准。
  6. 根据权利要求5所述的电流测量方法，其中，周期性地对于所述电流和时间参数的函数关系进行校准。
  7. 根据权利要求5所述的电流测量方法，其中，所述函数关系是线性关系。
  8. 一种电流测量装置，包括运算放大器，积分电容；所述运算放大器包括正输入端、负输入端和输出端；所述积分电容连接在所述负输入端和所述输出端之间；所述负输入端被配置为输入电流；所述正输入端被配置为输入初始化电压；
    其中，所述电流测量装置还包括：控制单元，所述控制单元被配置为检测与所述电流相对应的时间参数，并根据电流与时间参数的函数关系，确定所述电流；
    其中，所述时间参数是所述电流使得所述输出端的电压改变预定值所需要的时间。
  9. 根据权利要求8所述的电流测量装置，还包括连接在所述负输入端和所述输出端之间的开关元件；所述开关元件被配置为在输入电流前，将所述负输入端和所述输出端直接连接，以设置所述正输入端、负输入端和输出端的电压。
  10. 根据权利要求7所述的电流测量装置，还包括：
    电流源，所述电流源被配置为向所述负输入端提供多个指定电流；
    所述控制单元还被配置为检测与多个指定电流相对应的多个时间参数，并且根据多个指定电流和相对应的多个时间参数，得到电流和时间参数的函数关系。
  11. 一种显示装置，包括根据权利要求8至10中的任一项所述的电流测量装置。
PCT/CN2017/085631 2016-07-19 2017-05-24 用于校准电流测量装置的方法、电流测量方法及装置、显示装置 Ceased WO2018014651A1 (zh)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2017567351A JP7126827B2 (ja) 2016-07-19 2017-05-24 電流測定装置の較正のための方法、電流測定方法及び装置、表示装置
US16/318,569 US11187772B2 (en) 2016-07-19 2017-05-24 Method for calibrating current measurement device, current measurement method and device, display device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201610567191.9A CN106093529B (zh) 2016-07-19 2016-07-19 电流测量校准方法、电流测量方法及装置、显示装置
CN201610567191.9 2016-07-19

Publications (1)

Publication Number Publication Date
WO2018014651A1 true WO2018014651A1 (zh) 2018-01-25

Family

ID=57220819

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2017/085631 Ceased WO2018014651A1 (zh) 2016-07-19 2017-05-24 用于校准电流测量装置的方法、电流测量方法及装置、显示装置

Country Status (4)

Country Link
US (1) US11187772B2 (zh)
JP (1) JP7126827B2 (zh)
CN (1) CN106093529B (zh)
WO (1) WO2018014651A1 (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106093529B (zh) 2016-07-19 2019-03-12 京东方科技集团股份有限公司 电流测量校准方法、电流测量方法及装置、显示装置
CN108693394B (zh) * 2017-04-12 2020-06-26 上海西门子医疗器械有限公司 X射线球管的管电流计算方法和设备

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1423807A (zh) * 2000-02-22 2003-06-11 萨尔诺夫公司 用于校准显示器设备并对其效率随时间降低自动补偿的方法和装置
CN1519796A (zh) * 2003-01-31 2004-08-11 ��˹���´﹫˾ 具有老化补偿的有机发光二极管显示器
CN1777926A (zh) * 2002-11-21 2006-05-24 皇家飞利浦电子股份有限公司 改进显示器件的输出均匀性的方法
CN1936603A (zh) * 2005-09-20 2007-03-28 安捷伦科技有限公司 像素驱动电流测量方法以及装置
US20130235023A1 (en) * 2009-11-30 2013-09-12 Ignis Innovation Inc. System and methods for aging compensation in amoled displays
CN103597534A (zh) * 2011-05-28 2014-02-19 伊格尼斯创新公司 用于快速补偿显示器中的像素的编程的系统和方法
US20150061537A1 (en) * 2013-08-29 2015-03-05 Samsung Display Co., Ltd. Optoelectronic device
CN106093529A (zh) * 2016-07-19 2016-11-09 京东方科技集团股份有限公司 电流测量校准方法、电流测量方法及装置、显示装置

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5943627A (ja) * 1982-09-02 1984-03-10 Toshiba Corp アナログ−デジタル変換装置
US6243034B1 (en) * 1998-10-29 2001-06-05 National Instruments Corporation Integrating analog to digital converter with improved resolution
JP2002148284A (ja) 2000-11-15 2002-05-22 Jeco Co Ltd 電流検出装置及びその製造方法
JP2005037286A (ja) 2003-07-17 2005-02-10 Mazda Motor Corp バッテリ充放電電流検出装置
US20060044227A1 (en) * 2004-06-18 2006-03-02 Eastman Kodak Company Selecting adjustment for OLED drive voltage
JP2006133135A (ja) 2004-11-08 2006-05-25 Rohm Co Ltd 電流検出回路およびそれを用いた信号検出装置
JP2012189490A (ja) 2011-03-11 2012-10-04 Toshiba Corp 電池監視回路、および、電池監視システム
JP2013205325A (ja) 2012-03-29 2013-10-07 Asahi Kasei Electronics Co Ltd 電流測定装置
JP2013253841A (ja) 2012-06-06 2013-12-19 Fuji Electric Co Ltd 電流検出回路
JP5939630B2 (ja) 2012-06-08 2016-06-22 ニチコン株式会社 充電装置
CN203414511U (zh) * 2013-07-04 2014-01-29 清华大学 电流测量电路
KR20150018966A (ko) * 2013-08-12 2015-02-25 삼성디스플레이 주식회사 유기 발광 표시 장치 및 이의 휘도 조정 방법
KR101530144B1 (ko) * 2014-01-29 2015-06-22 강동철 용접전류 측정 장치 및 측정 방법
WO2015166376A1 (en) 2014-05-02 2015-11-05 Semiconductor Energy Laboratory Co., Ltd. Display device and input/output device
KR102502482B1 (ko) * 2015-09-08 2023-02-23 삼성디스플레이 주식회사 표시 장치 및 표시 장치의 열화 보상 방법

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1423807A (zh) * 2000-02-22 2003-06-11 萨尔诺夫公司 用于校准显示器设备并对其效率随时间降低自动补偿的方法和装置
CN1777926A (zh) * 2002-11-21 2006-05-24 皇家飞利浦电子股份有限公司 改进显示器件的输出均匀性的方法
CN1519796A (zh) * 2003-01-31 2004-08-11 ��˹���´﹫˾ 具有老化补偿的有机发光二极管显示器
CN1936603A (zh) * 2005-09-20 2007-03-28 安捷伦科技有限公司 像素驱动电流测量方法以及装置
US20130235023A1 (en) * 2009-11-30 2013-09-12 Ignis Innovation Inc. System and methods for aging compensation in amoled displays
CN103597534A (zh) * 2011-05-28 2014-02-19 伊格尼斯创新公司 用于快速补偿显示器中的像素的编程的系统和方法
US20150061537A1 (en) * 2013-08-29 2015-03-05 Samsung Display Co., Ltd. Optoelectronic device
CN106093529A (zh) * 2016-07-19 2016-11-09 京东方科技集团股份有限公司 电流测量校准方法、电流测量方法及装置、显示装置

Also Published As

Publication number Publication date
US20190285716A1 (en) 2019-09-19
JP7126827B2 (ja) 2022-08-29
US11187772B2 (en) 2021-11-30
CN106093529B (zh) 2019-03-12
JP2019527335A (ja) 2019-09-26
CN106093529A (zh) 2016-11-09

Similar Documents

Publication Publication Date Title
CN107924660B (zh) 基于经改进参考值进行像素校准的系统和方法
CN106097969A (zh) 子像素电路的校准装置、源极驱动器及数据电压补偿方法
CN111220891A (zh) 一种igbt结温测量方法和测量装置
CN110164374A (zh) 一种像素补偿电路、显示装置以及像素补偿电路的驱动方法
US20110141078A1 (en) Ambient light detection
WO2019109683A1 (zh) 用于显示面板的补偿方法、装置、电路、显示面板和显示装置
EP3622626B1 (en) An analog-to-digital conversion circuit, a pixel compensation circuit for display panel, and methods thereof
US9716398B2 (en) Auto correction driving device and wireless charger driving system using the same
CN107238743A (zh) 负电压检测电路
WO2021134849A1 (zh) 像素驱动电路电压补偿方法、电压补偿电路和显示面板
JP6660105B2 (ja) 気体熱伝導式ガスセンサおよび気体熱伝導式ガスセンサの出力補正方法
JP2014153090A5 (zh)
WO2020015335A1 (zh) 用于侦测感测线电容的侦测电路、侦测方法与oled显示装置
WO2018014651A1 (zh) 用于校准电流测量装置的方法、电流测量方法及装置、显示装置
KR101797676B1 (ko) 단일 광자 검출기에 대한 향상된 바이어스 회로
CN104682466B (zh) 充电控制电路的校准方法和校准电路
CN103383439B (zh) 一种电子负载的精密双重温度修正方法及电路
CN101109783A (zh) 一种发光二极管的电性参数测试电路
US20140195175A1 (en) Measuring dielectric breakdown in a dynamic mode
KR102738508B1 (ko) 화소센싱장치 및 패널구동장치
CN203414580U (zh) 一种电子负载的精密双重温度修正电路
JP4430007B2 (ja) 絶縁膜特性測定方法および絶縁膜特性測定装置
CN110853575B (zh) 显示面板的电压调节方法及存储介质
TWI484468B (zh) 可撓式顯示器及其控制方法
RU2010129691A (ru) Способ корректировки коэффициента усиления емкостного элемента и устройство для его осуществления

Legal Events

Date Code Title Description
ENP Entry into the national phase

Ref document number: 2017567351

Country of ref document: JP

Kind code of ref document: A

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 17830288

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

32PN Ep: public notification in the ep bulletin as address of the adressee cannot be established

Free format text: NOTING OF LOSS OF RIGHTS PURSUANT TO RULE 112(1) EPC (EPO FORM 1205A DATED 09/07/2019)

122 Ep: pct application non-entry in european phase

Ref document number: 17830288

Country of ref document: EP

Kind code of ref document: A1