WO2017161709A1 - Amoled显示面板检测方法及检测装置 - Google Patents

Amoled显示面板检测方法及检测装置 Download PDF

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WO2017161709A1
WO2017161709A1 PCT/CN2016/086432 CN2016086432W WO2017161709A1 WO 2017161709 A1 WO2017161709 A1 WO 2017161709A1 CN 2016086432 W CN2016086432 W CN 2016086432W WO 2017161709 A1 WO2017161709 A1 WO 2017161709A1
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display panel
amoled display
detecting
amoled
temperature
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PCT/CN2016/086432
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English (en)
French (fr)
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王振岭
黄泰钧
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深圳市华星光电技术有限公司
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Priority to US15/114,849 priority Critical patent/US20180108297A1/en
Publication of WO2017161709A1 publication Critical patent/WO2017161709A1/zh

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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
    • G09G3/3258—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix with pixel circuitry controlling the voltage across the light-emitting element
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10—OLED displays
    • H10K59/12—Active-matrix OLED [AMOLED] displays
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/70—Testing, e.g. accelerated lifetime tests
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/04—Maintaining the quality of display appearance
    • G09G2320/041—Temperature compensation
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/02—Details of power systems and of start or stop of display operation
    • G09G2330/021—Power management, e.g. power saving
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/12—Test circuits or failure detection circuits included in a display system, as permanent part thereof
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/831—Aging
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/861—Repairing

Definitions

  • the present invention relates to the field of organic light emitting diode display technologies, and in particular, to an AMOLED display panel detecting method and detecting device.
  • OLED Organic Light Emitting Diode
  • OLED Organic Light Emitting Diode
  • OLED display panels can be classified into two types: passive matrix OLED (PMOLED) and active matrix OLED (AMOLED).
  • the AMOLED display panel has arrayed pixels. Each pixel is driven by a driving circuit composed of a plurality of thin film transistors and capacitors, and belongs to an active display type, which has high luminous efficiency and is generally used for high-definition large-sized display devices.
  • the AMOLED is a current driving device. When a current flows through the organic light emitting diode, the organic light emitting diode emits light, and the luminance of the light is determined by the current flowing through the organic light emitting diode itself. Before the AMOLED display panel is shipped from the factory, the AMOLED display panel needs to be tested.
  • the conventional AMOLED display panel detecting device generally includes only one detecting signal generating module 100 and an AMOLED display panel 200 electrically connected to the detecting signal generating module 100.
  • the detecting signal generating module 100 The AMOLED display panel 200 provides a power supply positive voltage OVDD, a power supply negative voltage OVSS, a detection data signal Data, and a detection scan signal Gate, and the AMOLED display panel 200 receives each signal display test screen.
  • the technician can determine whether the AMOLED display panel 200 has dot and line defects by visually or using the image capturing device.
  • This detection mode is only applicable to the short circuit or open circuit in the AMOLED display panel 200, and the AMOLED display cannot be detected. A situation in which a micro short circuit occurs in the panel 200.
  • micro-short circuit means that during the manufacturing process of the AMOLED display panel, the small particles (Particle) will cause the line impedance between the data line and the scan line (or the power supply positive voltage trace and the power supply negative voltage trace) in the panel. Too small and there is no point or line defect.
  • the micro short circuit causes the current driving the organic light emitting diode to be larger than the expected current value corresponding to the data signal, so that the brightness and temperature of the organic light emitting diode increase, and the temperature of the AMOLED display panel follows. Elevation, and the rise of the panel temperature will further increase the current, increase the temperature, form a vicious circle, and eventually cause the AMOLED display panel to burn out. Therefore, it is necessary to detect the AMOLED display panel with micro-short condition to intercept its flow direction. The assembly process of the back end.
  • An object of the present invention is to provide a method for detecting an AMOLED display panel, which can effectively detect and timely intercept an AMOLED display panel having a short circuit and a micro short circuit condition, prevent the assembly process from flowing to the back end, and improve the panel yield.
  • Another object of the present invention is to provide an AMOLED display panel detecting device capable of effectively detecting and timely intercepting an AMOLED display panel having a short circuit and a micro short circuit condition, preventing the assembly process from flowing to the back end, and improving the panel yield.
  • the present invention first provides an AMOLED display panel detecting method, which includes the following steps:
  • Step 1 providing an AMOLED display panel detecting device
  • the AMOLED display panel detecting device includes at least a detection signal generating module, an AMOLED display panel electrically connected to the detecting signal generating module, and a temperature detecting module electrically connected to the AMOLED display panel;
  • Step 2 The detection signal generating module outputs a power positive voltage, a power negative voltage, a detection data signal, and a detection scan signal to the AMOLED display panel, and controls the AMOLED display panel to display a test screen;
  • Step 3 detecting whether the AMOLED display panel has bright spots and bright line defects
  • Step 4 The detection signal generating module controls the AMOLED display panel to continuously display a pure white screen, and simultaneously captures and records the temperature of each display area of the AMOLED display panel by using the temperature detecting module;
  • Step 5 Setting a threshold temperature to intercept an AMOLED display panel in which any display area temperature exceeds the threshold temperature.
  • the temperature detecting module is a thermal imager.
  • the time for the AMOLED display panel to continuously display the pure white screen in step 4 is 10 minutes.
  • the AMOLED display panel detecting device in the step 1 further includes an impedance detecting module electrically connected to the AMOLED display panel.
  • the method for detecting an AMOLED display panel further includes the step of: performing impedance detection on the display area exceeding the threshold temperature in the intercepted AMOLED display panel by the impedance detecting module, and finding that a short circuit occurs in the intercepted AMOLED display panel The location of the short circuit.
  • the method for detecting an AMOLED display panel further includes the step of: repairing, by the laser, a position where a short circuit and a micro short circuit occur in the intercepted AMOLED display panel.
  • the present invention further provides an AMOLED display panel detecting device, comprising at least a detection signal generating module, an AMOLED display panel electrically connected to the detecting signal generating module, and a temperature detecting module electrically connected to the AMOLED display panel.
  • the temperature detecting module is a thermal imager.
  • the AMOLED display panel detecting device further includes an impedance detecting module electrically connected to the AMOLED display panel.
  • the invention also provides a method for detecting an AMOLED display panel, comprising the following steps:
  • Step 1 providing an AMOLED display panel detecting device
  • the AMOLED display panel detecting device includes at least a detection signal generating module, an AMOLED display panel electrically connected to the detecting signal generating module, and a temperature detecting module electrically connected to the AMOLED display panel;
  • Step 2 The detection signal generating module outputs a power positive voltage, a power negative voltage, a detection data signal, and a detection scan signal to the AMOLED display panel, and controls the AMOLED display panel to display a test screen;
  • Step 3 detecting whether the AMOLED display panel has bright spots and bright line defects
  • Step 4 The detection signal generating module controls the AMOLED display panel to continuously display a pure white screen, and simultaneously captures and records the temperature of each display area of the AMOLED display panel by using the temperature detecting module;
  • Step 5 setting a threshold temperature, and intercepting an AMOLED display panel in which any display area temperature exceeds the threshold temperature;
  • the temperature detecting module is a thermal imager
  • the time that the AMOLED display panel continuously displays the pure white screen in step 4 is 10 minutes.
  • the invention provides the AMOLED panel detecting method and the detecting device.
  • the temperature detecting module detects and records the temperature of each display area of the AMOLED display panel, and the temperature detecting module detects the AMOLED display panel.
  • the temperature of the display area exceeds the set threshold temperature, the short circuit and micro short circuit condition of the AMOLED display panel are described, so that the AMOLED display panel with short circuit and micro short circuit condition can be effectively detected and prevented from flowing backward.
  • End assembly process further setting impedance detection module to perform impedance detection on the display area exceeding the threshold temperature in the intercepted AMOLED display panel, and finding the position of the shorted and micro short circuit in the intercepted AMOLED display panel to be accurate Repair to improve panel yield.
  • FIG. 1 is a structural block diagram of a conventional AMOLED display panel detecting device
  • FIG. 2 is a flow chart of a method for detecting an AMOLED display panel according to the present invention
  • FIG. 3 is a block diagram showing the structure of an AMOLED display panel detecting device of the present invention.
  • the present invention first provides an AMOLED display panel detection method, which includes the following steps:
  • Step 1 Providing an AMOLED display panel detecting device.
  • the AMOLED display panel detecting device includes a detection signal generating module 1, an AMOLED display panel 2 electrically connected to the detecting signal generating module 1, and a temperature detector electrically connected to the AMOLED display panel 2.
  • the measuring module 3 and the impedance detecting module 4 electrically connected to the AMOLED display panel 2 .
  • Step 2 The detection signal generation module 1 outputs a power supply positive voltage OVDD, a power supply negative voltage OVSS, a detection data signal Data, and a detection scan signal Gate to the AMOLED display panel 2, and controls the AMOLED display panel 2 to display a test screen.
  • the AMOLED display panel 2 is provided with test connection terminals corresponding to the respective signals, and is respectively responsible for receiving the power supply positive voltage OVDD, the power supply negative voltage OVSS, and the detection output by the detection signal generation module 1 to the AMOLED display panel 2.
  • the AMOLED display panel 2 can display a test screen.
  • the test screen is a solid color picture of pure black, pure red, pure green, pure blue or other commonly used test pictures used by the existing panel test technology.
  • Step 3 Detect whether the AMOLED display panel 2 has bright spots and bright line defects.
  • the function of the step 3 is to perform routine detection on the test screen of the AMOLED display panel 2, and the technician observes the test screen by visual observation or using the image capturing device. If a bright spot or a bright line is found, the AMOLED display panel 2 has a point. Line defects.
  • Step 4 After the routine detection of the test screen is completed, the detection signal generating module 1 controls The AMOLED display panel 2 continuously displays a pure white picture, and the temperature of each display area of the AMOLED display panel 2 is captured and recorded by the temperature detecting module 3.
  • the temperature detecting module 3 is preferably a thermal imager; the time for the AMOLED display panel 2 to continuously display a pure white screen is selected to be about 10 minutes to ensure that the AMOLED display panel 2 has sufficient heat generation time.
  • the display area may increase in temperature due to an increase in current.
  • Step 5 Set a threshold temperature to intercept the AMOLED display panel 2 in which any display area temperature exceeds the threshold temperature.
  • the threshold temperature may be determined according to the model of the AMOLED display panel 2, the configuration of the driving circuit, and the materials and characteristics of each component in the driving circuit. If the AMOLED display panel 2 is measured by the temperature detecting module 3 If the temperature of a display area exceeds the threshold temperature, the problem of short circuit and micro short circuit in the AMOLED display panel 2 is described, so that the AMOLED display panel 2 having short circuit and micro short circuit condition can be effectively detected and intercepted in time to prevent it. The assembly process that flows to the back end.
  • the AMOLED display panel detection method of the present invention further includes:
  • Step 6 Perform impedance detection on the display area exceeding the threshold temperature in the intercepted AMOLED display panel 2 by the impedance detecting module 4, and find a position where the shorted and micro short circuit occurs in the intercepted AMOLED display panel 2.
  • step 6 Since the step 6 only performs impedance detection on the display area exceeding the threshold temperature in the AMOLED display panel 2 intercepted by the previous step, that is, the impedance detection is performed on the display area where the short circuit and the micro short circuit problem are determined, and the target is strong.
  • the impedance detection time is shortened, and the position where the short circuit and the micro short circuit appear in the intercepted AMOLED display panel 2 are found more quickly.
  • step 7 repairing a position where a short circuit and a micro short circuit occur in the intercepted AMOLED display panel 2 by a laser.
  • step 7 the short-circuited and micro-short-circuited signal traces are laser-blown, and then laser-welded to the corresponding repair line to achieve repair, so that the AMOLED display panel returns to normal and improves product yield.
  • the present invention also provides an AMOLED display panel detecting device.
  • the AMOLED display panel detecting apparatus of the present invention includes a detection signal generating module 1, an AMOLED display panel 2 electrically connected to the detecting signal generating module 1, and a temperature electrically connected to the AMOLED display panel 2.
  • the detecting module 3 and the impedance detecting module 4 electrically connected to the AMOLED display panel 2 .
  • the temperature detecting module 3 is preferably hot Like the instrument.
  • the detection signal generation module 1 is configured to output a power supply positive voltage OVDD, a power supply negative voltage OVSS, a detection data signal Data, and a detection scan signal Gate to the AMOLED display panel 2 to control the AMOLED display panel 2 .
  • the AMOLED display panel 2 is configured to display a test screen, which is provided with test terminals corresponding to the respective signals, and is respectively responsible for receiving the power supply positive voltage OVDD and the power supply negative voltage output by the detection signal generating module 1 to the AMOLED display panel 2.
  • OVSS, the detection data signal Data, and the detection scan signal Gate are respectively responsible for receiving the power supply positive voltage OVDD and the power supply negative voltage output by the detection signal generating module 1 to the AMOLED display panel 2.
  • the temperature detecting module 3 is configured to capture and record the temperature of each display area of the AMOLED display panel 2 when the AMOLED display panel 2 continuously displays a pure white screen. If the AMOLED display panel 2 is measured by the temperature detecting module 3 If the temperature of a display area exceeds the set threshold temperature, the problem of short circuit and micro short circuit in the AMOLED display panel 2 is required, and the AMOLED display panel 2 needs to be intercepted to prevent its assembly process from flowing to the back end.
  • the impedance detecting module 4 is configured to perform impedance detection on a display area exceeding the threshold temperature in the intercepted AMOLED display panel 2, and find a position where the shorted and micro short circuit occurs in the intercepted AMOLED display panel 2, so as to be shorted. And the location of the micro short circuit is accurately repaired.
  • the working process of the AMOLED display panel detecting device of the present invention is:
  • the detection signal generating module 1 outputs various signals to the AMOLED display panel 2, and controls the AMOLED display panel 2 to display a test screen.
  • the technician performs normal detection on the test screen, that is, by visually or using an image capturing device. Observe the test screen. If bright spots and bright lines are found, the AMOLED display panel 2 has dot and line defects.
  • the detection signal generating module 1 controls the AMOLED display panel 2 to continuously display a pure white screen for about 10 minutes, and simultaneously captures and records each display of the AMOLED display panel 2 through the temperature detecting module 3. The temperature of the area.
  • a threshold temperature is set, and if the AMOLED display panel 2 is measured by the temperature detecting module 3 If the temperature of the display area exceeds the threshold temperature, it indicates that there is a problem of short circuit and micro short circuit in the AMOLED display panel 2. Then, the AMOLED display panel 2 is intercepted to prevent its assembly process from flowing to the back end.
  • the impedance detecting module 4 performs impedance detection on the display area exceeding the threshold temperature in the intercepted AMOLED display panel 2, and quickly finds the position of the shorted and micro short circuit in the intercepted AMOLED display panel 2 for subsequent Laser repair provides location basis to improve product yield.
  • the AMOLED panel detecting method and detecting device of the present invention are set by using a temperature
  • the degree detecting module captures and records the temperature of each display area of the AMOLED display panel.
  • the temperature detecting module detects that the temperature of a display area of the AMOLED display panel exceeds a set threshold temperature, the short circuit exists in the AMOLED display panel. And the condition of the micro short circuit, so that the AMOLED display panel with short circuit and micro short circuit condition can be effectively detected and intercepted in time to prevent the assembly process from flowing to the back end; further, the impedance detection module is set to exceed the intercepted AMOLED display panel.
  • the display area of the threshold temperature is subjected to impedance detection to find out the position of the shorted and micro short circuit in the intercepted AMOLED display panel, so as to perform accurate repair and improve the panel yield.

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Electroluminescent Light Sources (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)

Abstract

一种AMOLED面板检测方法及检测装置，通过设置温度侦测模块(3)拍摄并记录AMOLED显示面板(2)各显示区域的温度，当该温度侦测模块(3)侦测到AMOLED显示面板(2)某一显示区域的温度超过设定的阈值温度时则说明该AMOLED显示面板(2)内存在短路及微短路的状况，从而能够有效地检测出并及时拦截存在短路及微短路状况的AMOLED显示面板(2)，防止其流向后端的装配制程；进一步通过设置阻抗检测模块(4)来对被拦截的AMOLED显示面板(2)中超过阈值温度的显示区域进行阻抗检测，找出该被拦截的AMOLED显示面板(2)中出现短路及微短路的位置，以进行准确的修复，提高面板良率。

Description

AMOLED显示面板检测方法及检测装置 技术领域
本发明涉及有机发光二极管显示技术领域，尤其涉及一种AMOLED显示面板检测方法及检测装置。
背景技术
有机发光二极管(Organic Light Emitting Diode，OLED)显示面板具有自发光、驱动电压低、发光效率高、响应时间短、清晰度与对比度高、近180°视角、使用温度范围宽，可实现柔性显示和大面积全彩显示等诸多优点，被业界公认为最有潜力的显示面板。
OLED显示面板按照驱动方式可以分为无源矩阵型OLED(Passive Matrix OLED，PMOLED)和有源矩阵型OLED(Active Matrix OLED，AMOLED)两大类，其中AMOLED显示面板具有呈阵列式排布的像素，每一像素由数个薄膜晶体管与电容构成的驱动电路进行驱动，属于主动显示类型，发光效能高，通常用于高清晰度的大尺寸显示装置。
AMOLED是电流驱动器件，当有电流流经有机发光二极管时，有机发光二极管发光，且发光亮度由流经有机发光二极管自身的电流决定。在AMOLED显示面板出厂前，需对AMOLED显示面板进行检测。
如图1所示，现有的AMOLED显示面板检测装置通常仅包括一检测信号产生模块100、及一电性连接所述检测信号产生模块100的AMOLED显示面板200，所述检测信号产生模块100向AMOLED显示面板200提供电源正电压OVDD、电源负电压OVSS、检测用数据信号Data、以及检测用扫描信号Gate，所述AMOLED显示面板200接收各信号显示测试画面。技术人员通过目视或利用影像撷取设备来判断该AMOLED显示面板200是否存在点和线缺陷，这种检测方式仅适用于AMOLED显示面板200内出现短路或开路的状况，并不能检测出AMOLED显示面板200内出现微短路的状况。
所谓“微短路”是指在AMOLED显示面板制造过程中，细小的颗粒(Particle)会造成面板内出现数据线与扫描线(或电源正电压走线与电源负电压走线)之间的线路阻抗过小，且没有造成点或线缺陷的现象。微短路会造成驱动有机发光二极管的电流比预期的对应于数据信号的电流值大，使有机发光二极管的亮度和温度升高，AMOLED显示面板的温度随之 升高，而面板温度升高会进一步造成电流增大、温度升高，形成恶性循环，最终导致AMOLED显示面板老化烧毁，因此非常有必要检测出存在微短路状况的AMOLED显示面板，以拦截其流向后端的装配制程。
发明内容
本发明的目的在于提供一种AMOLED显示面板检测方法，能够有效地检测出并及时拦截存在短路及微短路状况的AMOLED显示面板，防止其流向后端的装配制程，提高面板良率。
本发明的另一目的在于提供一种AMOLED显示面板检测装置，能够有效地检测出并及时拦截存在短路及微短路状况的AMOLED显示面板，防止其流向后端的装配制程，提高面板良率。
为实现上述目的，本发明首先提供一种AMOLED显示面板检测方法，包括以下步骤：
步骤1、提供AMOLED显示面板检测装置；
所述AMOLED显示面板检测装置至少包括检测信号产生模块、与所述检测信号产生模块电性连接的AMOLED显示面板、及与所述AMOLED显示面板电性连接的温度侦测模块；
步骤2、所述检测信号产生模块向AMOLED显示面板输出电源正电压、电源负电压、检测用数据信号、以及检测用扫描信号，控制所述AMOLED显示面板显示测试画面；
步骤3、检测AMOLED显示面板是否存在亮点、与亮线缺陷；
步骤4、所述检测信号产生模块控制所述AMOLED显示面板持续显示纯白色画面，同时通过所述温度侦测模块拍摄并记录AMOLED显示面板各显示区域的温度；
步骤5、设定阈值温度，对任一显示区域温度超过该阈值温度的AMOLED显示面板进行拦截。
所述温度侦测模块为热像仪。
步骤4中所述AMOLED显示面板持续显示纯白色画面的时间为10分钟。
所述步骤1中的AMOLED显示面板检测装置还包括与所述AMOLED显示面板电性连接的阻抗检测模块。
所述AMOLED显示面板检测方法还包括步骤6、通过所述阻抗检测模块对被拦截的AMOLED显示面板中超过阈值温度的显示区域进行阻抗检测，找出该被拦截的AMOLED显示面板中出现短路及微短路的位置。
所述AMOLED显示面板检测方法还包括步骤7、通过激光对被拦截的AMOLED显示面板中出现短路及微短路的位置进行修复。
本发明还提供一种AMOLED显示面板检测装置，至少包括检测信号产生模块、与所述检测信号产生模块电性连接的AMOLED显示面板、及与所述AMOLED显示面板电性连接的温度侦测模块。
所述温度侦测模块为热像仪。
所述AMOLED显示面板检测装置还包括与所述AMOLED显示面板电性连接的阻抗检测模块。
本发明还提供一种AMOLED显示面板检测方法，包括以下步骤：
步骤1、提供AMOLED显示面板检测装置；
所述AMOLED显示面板检测装置至少包括检测信号产生模块、与所述检测信号产生模块电性连接的AMOLED显示面板、及与所述AMOLED显示面板电性连接的温度侦测模块；
步骤2、所述检测信号产生模块向AMOLED显示面板输出电源正电压、电源负电压、检测用数据信号、以及检测用扫描信号，控制所述AMOLED显示面板显示测试画面；
步骤3、检测AMOLED显示面板是否存在亮点、与亮线缺陷；
步骤4、所述检测信号产生模块控制所述AMOLED显示面板持续显示纯白色画面，同时通过所述温度侦测模块拍摄并记录AMOLED显示面板各显示区域的温度；
步骤5、设定阈值温度，对任一显示区域温度超过该阈值温度的AMOLED显示面板进行拦截；
其中，所述温度侦测模块为热像仪；
其中，步骤4中所述AMOLED显示面板持续显示纯白色画面的时间为10分钟。
本发明的有益效果：本发明提供的AMOLED面板检测方法及检测装置，通过设置温度侦测模块拍摄并记录AMOLED显示面板各显示区域的温度，当该温度侦测模块侦测到AMOLED显示面板某一显示区域的温度超过设定的阈值温度时则说明该AMOLED显示面板内存在短路及微短路的状况，从而能够有效地检测出并及时拦截存在短路及微短路状况的AMOLED显示面板，防止其流向后端的装配制程；进一步通过设置阻抗检测模块来对被拦截的AMOLED显示面板中超过阈值温度的显示区域进行阻抗检测，找出该被拦截的AMOLED显示面板中出现短路及微短路的位置，以进行准确的修复，提高面板良率。
附图说明
为了能更进一步了解本发明的特征以及技术内容，请参阅以下有关本发明的详细说明与附图，然而附图仅提供参考与说明用，并非用来对本发明加以限制。
附图中，
图1为现有的AMOLED显示面板检测装置的结构框图；
图2为本发明的AMOLED显示面板检测方法的流程图；
图3为本发明的AMOLED显示面板检测装置的结构框图。
具体实施方式
为更进一步阐述本发明所采取的技术手段及其效果，以下结合本发明的优选实施例及其附图进行详细描述。
请同时参阅图2与图3，本发明首先提供一种AMOLED显示面板检测方法，包括以下步骤：
步骤1、提供AMOLED显示面板检测装置。
如图3所示，所述AMOLED显示面板检测装置包括检测信号产生模块1、与所述检测信号产生模块1电性连接的AMOLED显示面板2、与所述AMOLED显示面板2电性连接的温度侦测模块3、及与所述AMOLED显示面板2电性连接的阻抗检测模块4。
步骤2、所述检测信号产生模块1向AMOLED显示面板2输出电源正电压OVDD、电源负电压OVSS、检测用数据信号Data、以及检测用扫描信号Gate，控制所述AMOLED显示面板2显示测试画面。
具体地，所述AMOLED显示面板2内设置有对应于各个信号的测试用接线端子，分别负责接收所述检测信号产生模块1向AMOLED显示面板2输出的电源正电压OVDD、电源负电压OVSS、检测用数据信号Data、以及检测用扫描信号Gate，AMOLED显示面板2即能够显示测试画面。进一步的，所述测试画面为现有面板测试技术所使用的纯黑、纯红、纯绿、纯蓝等纯色画面或其它常用的测试画面。
步骤3、检测AMOLED显示面板2是否存在亮点、与亮线缺陷。
该步骤3的作用在于对AMOLED显示面板2的测试画面进行常规检测，由技术人员通过目视或利用影像撷取设备来观察测试画面，若发现亮点、亮线则表明该AMOLED显示面板2存在点、线缺陷。
步骤4、完成对测试画面的常规检测后，所述检测信号产生模块1控制 所述AMOLED显示面板2持续显示纯白色画面，同时通过所述温度侦测模块3拍摄并记录AMOLED显示面板2各显示区域的温度。
具体地，所述温度侦测模块3优选为热像仪；所述AMOLED显示面板2持续显示纯白色画面的时间选定为10分钟左右，以保证AMOLED显示面板2有足够的发热时间。
在该步骤4的进行过程中，若AMOLED显示面板2的某一显示区域存在短路及微短路的状况，则该显示区域会由于电流增大而导致温度升高。
步骤5、设定阈值温度，对任一显示区域温度超过该阈值温度的AMOLED显示面板2进行拦截。
具体地，所述阈值温度可根据AMOLED显示面板2的型号、驱动电路构成、及驱动电路内各元件的材料、特性等因素来确定，若通过温度侦测模块3测得的AMOLED显示面板2某一显示区域的温度超过了该阈值温度，则说明该AMOLED显示面板2内存在短路及微短路的问题，从而能够有效地检测出并及时拦截存在短路及微短路状况的AMOLED显示面板2，防止其流向后端的装配制程。
进一步地，为了提高AMOLED显示面板的产品良率，本发明的AMOLED显示面板检测方法还包括：
步骤6、通过所述阻抗检测模块4对被拦截的AMOLED显示面板2中超过阈值温度的显示区域进行阻抗检测，找出该被拦截的AMOLED显示面板2中出现短路及微短路的位置。
由于该步骤6仅对由之前步骤所拦截的AMOLED显示面板2中超过阈值温度的显示区域进行阻抗检测，即对确定出现了现短路及微短路问题的显示区域做阻抗检测，针对性强，能够缩短阻抗检测时间，较快速地找出该被拦截的AMOLED显示面板2中出现短路及微短路的位置。
以及步骤7、通过激光(Laser)对被拦截的AMOLED显示面板2中出现短路及微短路的位置进行修复。
具体地，该步骤7先将出现短路及微短路的信号走线进行激光熔断，再将其与对应的修复线路进行激光熔接即可实现修复，使得AMOLED显示面板恢复正常，提高产品良率。
基于同一发明构思，本发明还提供一种AMOLED显示面板检测装置。如图3所示，本发明的AMOLED显示面板检测装置包括检测信号产生模块1、与所述检测信号产生模块1电性连接的AMOLED显示面板2、与所述AMOLED显示面板2电性连接的温度侦测模块3、及与所述AMOLED显示面板2电性连接的阻抗检测模块4。其中，所述温度侦测模块3优选为热 像仪。
具体地，所述检测信号产生模块1用于向AMOLED显示面板2输出电源正电压OVDD、电源负电压OVSS、检测用数据信号Data、以及检测用扫描信号Gate，对所述AMOLED显示面板2进行控制。
所述AMOLED显示面板2用于显示测试画面，其设置有对应于各个信号的测试用接线端子，分别负责接收所述检测信号产生模块1向AMOLED显示面板2输出的电源正电压OVDD、电源负电压OVSS、检测用数据信号Data、以及检测用扫描信号Gate。
所述温度侦测模块3用于在AMOLED显示面板2持续显示纯白色画面时拍摄并记录AMOLED显示面板2各显示区域的温度，若通过所述温度侦测模块3测得的AMOLED显示面板2某一显示区域的温度超过了设定的阈值温度，则说明该AMOLED显示面板2内存在短路及微短路的问题，需要对该AMOLED显示面板2进行拦截，防止其流向后端的装配制程。
所述阻抗检测模块4用于对被拦截的AMOLED显示面板2中超过阈值温度的显示区域进行阻抗检测，找出该被拦截的AMOLED显示面板2中出现短路及微短路的位置，以便于对短路及微短路的位置进行准确修复。
进一步地，本发明的AMOLED显示面板检测装置的工作过程为：
首先，所述检测信号产生模块1向AMOLED显示面板2输出各个信号，控制所述AMOLED显示面板2显示测试画面，由技术人员对测试画面进行常规检测，即通过目视或利用影像撷取设备来观察测试画面，若发现亮点、亮线则表明该AMOLED显示面板2存在点、线缺陷。
完成对测试画面的常规检测后，所述检测信号产生模块1控制所述AMOLED显示面板2持续显示纯白色画面10分钟左右，同时通过所述温度侦测模块3拍摄并记录AMOLED显示面板2各显示区域的温度。
接下来，根据AMOLED显示面板2的型号、驱动电路构成、及驱动电路内各元件的材料、特性等因素来设定一阈值温度，若通过温度侦测模块3测得的AMOLED显示面板2某一显示区域的温度超过了该阈值温度，则说明该AMOLED显示面板2内存在短路及微短路的问题，那么对该AMOLED显示面板2进行拦截，防止其流向后端的装配制程。
最后，所述阻抗检测模块4针对被拦截的AMOLED显示面板2中超过阈值温度的显示区域进行阻抗检测，快速找出该被拦截的AMOLED显示面板2中出现短路及微短路的位置，为后续的激光修复提供位置依据，提高产品良率。
综上所述，本发明的AMOLED面板检测方法及检测装置，通过设置温 度侦测模块拍摄并记录AMOLED显示面板各显示区域的温度，当该温度侦测模块侦测到AMOLED显示面板某一显示区域的温度超过设定的阈值温度时则说明该AMOLED显示面板内存在短路及微短路的状况，从而能够有效地检测出并及时拦截存在短路及微短路状况的AMOLED显示面板，防止其流向后端的装配制程；进一步通过设置阻抗检测模块来对被拦截的AMOLED显示面板中超过阈值温度的显示区域进行阻抗检测，找出该被拦截的AMOLED显示面板中出现短路及微短路的位置，以进行准确的修复，提高面板良率。
以上所述，对于本领域的普通技术人员来说，可以根据本发明的技术方案和技术构思作出其他各种相应的改变和变形，而所有这些改变和变形都应属于本发明后附的权利要求的保护范围。

Claims (13)

  1. 一种AMOLED显示面板检测方法，包括以下步骤：
    步骤1、提供AMOLED显示面板检测装置；
    所述AMOLED显示面板检测装置至少包括检测信号产生模块、与所述检测信号产生模块电性连接的AMOLED显示面板、及与所述AMOLED显示面板电性连接的温度侦测模块；
    步骤2、所述检测信号产生模块向AMOLED显示面板输出电源正电压、电源负电压、检测用数据信号、以及检测用扫描信号，控制所述AMOLED显示面板显示测试画面；
    步骤3、检测AMOLED显示面板是否存在亮点、与亮线缺陷；
    步骤4、所述检测信号产生模块控制所述AMOLED显示面板持续显示纯白色画面，同时通过所述温度侦测模块拍摄并记录AMOLED显示面板各显示区域的温度；
    步骤5、设定阈值温度，对任一显示区域温度超过该阈值温度的AMOLED显示面板进行拦截。
  2. 如权利要求1所述的AMOLED显示面板检测方法，其中，所述温度侦测模块为热像仪。
  3. 如权利要求1所述的AMOLED显示面板检测方法，其中，步骤4中所述AMOLED显示面板持续显示纯白色画面的时间为10分钟。
  4. 如权利要求1所述的AMOLED显示面板检测方法，其中，所述步骤1中的AMOLED显示面板检测装置还包括与所述AMOLED显示面板电性连接的阻抗检测模块。
  5. 如权利要求4所述的AMOLED显示面板检测方法，还包括步骤6、通过所述阻抗检测模块对被拦截的AMOLED显示面板中超过阈值温度的显示区域进行阻抗检测，找出该被拦截的AMOLED显示面板中出现短路及微短路的位置。
  6. 如权利要求5所述的AMOLED显示面板检测方法，还包括步骤7、通过激光对被拦截的AMOLED显示面板中出现短路及微短路的位置进行修复。
  7. 一种AMOLED显示面板检测装置，至少包括检测信号产生模块、与所述检测信号产生模块电性连接的AMOLED显示面板、及与所述AMOLED显示面板电性连接的温度侦测模块。
  8. 如权利要求7所述的AMOLED显示面板检测装置，其中，所述温度侦测模块为热像仪。
  9. 如权利要求7所述的AMOLED显示面板检测装置，还包括与所述AMOLED显示面板电性连接的阻抗检测模块。
  10. 一种AMOLED显示面板检测方法，包括以下步骤：
    步骤1、提供AMOLED显示面板检测装置；
    所述AMOLED显示面板检测装置至少包括检测信号产生模块、与所述检测信号产生模块电性连接的AMOLED显示面板、及与所述AMOLED显示面板电性连接的温度侦测模块；
    步骤2、所述检测信号产生模块向AMOLED显示面板输出电源正电压、电源负电压、检测用数据信号、以及检测用扫描信号，控制所述AMOLED显示面板显示测试画面；
    步骤3、检测AMOLED显示面板是否存在亮点、与亮线缺陷；
    步骤4、所述检测信号产生模块控制所述AMOLED显示面板持续显示纯白色画面，同时通过所述温度侦测模块拍摄并记录AMOLED显示面板各显示区域的温度；
    步骤5、设定阈值温度，对任一显示区域温度超过该阈值温度的AMOLED显示面板进行拦截；
    其中，所述温度侦测模块为热像仪；
    其中，步骤4中所述AMOLED显示面板持续显示纯白色画面的时间为10分钟。
  11. 如权利要求10所述的AMOLED显示面板检测方法，其中，所述步骤1中的AMOLED显示面板检测装置还包括与所述AMOLED显示面板电性连接的阻抗检测模块。
  12. 如权利要求11所述的AMOLED显示面板检测方法，还包括步骤6、通过所述阻抗检测模块对被拦截的AMOLED显示面板中超过阈值温度的显示区域进行阻抗检测，找出该被拦截的AMOLED显示面板中出现短路及微短路的位置。
  13. 如权利要求12所述的AMOLED显示面板检测方法，还包括步骤7、通过激光对被拦截的AMOLED显示面板中出现短路及微短路的位置进行修复。
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