WO2017159856A1 - Appareil d'inspection par rayons x - Google Patents

Appareil d'inspection par rayons x Download PDF

Info

Publication number
WO2017159856A1
WO2017159856A1 PCT/JP2017/010933 JP2017010933W WO2017159856A1 WO 2017159856 A1 WO2017159856 A1 WO 2017159856A1 JP 2017010933 W JP2017010933 W JP 2017010933W WO 2017159856 A1 WO2017159856 A1 WO 2017159856A1
Authority
WO
WIPO (PCT)
Prior art keywords
ray
luminance
contents
packaging material
inspection apparatus
Prior art date
Application number
PCT/JP2017/010933
Other languages
English (en)
Japanese (ja)
Inventor
廣瀬 修
Original Assignee
株式会社イシダ
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社イシダ filed Critical 株式会社イシダ
Priority to JP2018506043A priority Critical patent/JPWO2017159856A1/ja
Publication of WO2017159856A1 publication Critical patent/WO2017159856A1/fr

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18Investigating the presence of flaws defects or foreign matter

Definitions

  • the present invention relates to an inspection apparatus that determines a missing item on the basis of an X-ray transmission image irradiated on an inspection object.
  • an X-ray inspection apparatus has been used to inspect missing items in packaged contents.
  • X-ray inspection apparatus described in Patent Document 1 (Japanese Patent Application Laid-Open No. 2014-115138)
  • X-rays are radiated to contents that are partitioned and arranged inside the packaging material, and based on transmitted X-ray data. The number of contents has been inspected.
  • An object of the present invention is to provide an X-ray inspection apparatus capable of reliably performing a missing part inspection without being affected by the change in the thickness of a packaging material in lot units.
  • the X-ray inspection apparatus irradiates a product in which contents are packaged with a packaging material with X-rays, detects the amount of X-ray transmitted through the product with an X-ray detection sensor,
  • An X-ray inspection apparatus that determines and inspects a content based on a detection result of an X-ray detection sensor, and includes an image generation unit, a region generation unit, a luminance correction unit, and a determination unit. ing.
  • the image generation unit generates an X-ray transmission image from the detection result of the X-ray detection sensor.
  • the region generation unit divides the region into a packaging region made up of only the packaging material that does not contain the content and a content region made up of the content and the packaging material.
  • the brightness correction unit corrects the brightness of the content area based on the brightness of the packaging area in the X-ray transmission image.
  • the determination unit determines the presence / absence of the content based on the luminance in the corrected content area.
  • the luminance in the content area is a value after passing through the content and the packaging material, and the luminance is reduced (ie, darkened) by the amount of X-rays absorbed by the packaging material. Therefore, the brightness of the content area from which the influence of the packaging material is removed can be obtained by correcting the amount. As a result, it is possible to prevent erroneous determination of defect inspection due to variations in packaging material thickness.
  • An X-ray inspection apparatus is the X-ray inspection apparatus according to the first aspect, in which the luminance correction unit is configured to determine the luminance of the contents region based on the luminance of all or part of the packaging region. The influence of the brightness of the packaging area on the content is obtained, and the influence is offset from the brightness of the contents area.
  • the X-ray inspection apparatus is the X-ray inspection apparatus according to the first aspect or the second aspect, wherein the X-ray transmittance of the packaging material is smaller than the X-ray transmittance of the contents. Inspected.
  • the X-ray inspection apparatus is the X-ray inspection apparatus according to any one of the first aspect to the third aspect, and the packaging material includes a resin packaging material. And the thing whose thickness of the resin packaging material is 0.3 mm or less is an inspection object.
  • the determination unit determines the presence / absence of contents based on the luminance in the corrected content area, the shortage inspection is surely performed without being affected by the thickness of the packaging material.
  • the X-ray inspection apparatus is the X-ray inspection apparatus according to any one of the first aspect to the third aspect, wherein the content is 4 mm or less in thickness. is there.
  • the determination unit determines the presence / absence of contents based on the luminance in the corrected content area, the shortage inspection is surely performed without being affected by the thickness of the packaging material.
  • An X-ray inspection apparatus is an X-ray inspection apparatus according to any one of the first aspect to the fifth aspect, wherein a defect in the contents is a missing part of the contents, Including foreign matters in the contents and cracking or chipping of the contents are included.
  • the luminance in the content region is a value after passing through the content and the packaging material, and the X-ray is reduced by the amount absorbed by the packaging material.
  • FIG. 1 is an external perspective view of an X-ray inspection apparatus according to an embodiment of the present invention.
  • the schematic diagram which shows the principle of a X-ray inspection.
  • the block block diagram of a control computer The process block diagram before and behind an X-ray inspection apparatus.
  • the perspective view of the goods which are inspection objects.
  • FIG. 6B is a cross-sectional view of the product G along the line SS in FIG. 6A.
  • the image figure of the X-ray transmissive image of goods The figure of a pocket outline extraction image.
  • a histogram based on an X-ray transmission image of a product. Explanatory drawing which shows the setting state of the threshold value at the time of producing
  • 7 is a control flowchart for missing item inspection of the X-ray inspection apparatus.
  • FIG. 1 is an external perspective view of an X-ray inspection apparatus according to an embodiment of the present invention.
  • an X-ray inspection apparatus 10 is one of apparatuses that are incorporated in a production line for a product G such as food (see FIG. 5) and inspects the quality of the product G, and is continuously conveyed. This is an apparatus for determining whether the product G is acceptable by irradiating the product G with X-rays.
  • the product G which is an inspection object, is carried to the X-ray inspection apparatus 10 by the pre-stage conveyor 60.
  • the product G is classified as a non-defective product or a defective product in the X-ray inspection apparatus 10.
  • the inspection result obtained by the X-ray inspection apparatus 10 is sent to a distribution mechanism 70 disposed on the downstream side of the X-ray inspection apparatus 10.
  • the distribution mechanism 70 sends the product G determined to be a non-defective product by the X-ray inspection apparatus 10 to the conveyor 80 that discharges the normal product, and discharges the product G determined to be a defective product by the X-ray inspection apparatus 10.
  • the direction 90 and the defective discharge direction 91 are distributed.
  • FIG. 2 is an internal configuration diagram of the shield box of the X-ray inspection apparatus. 1 and 2, the X-ray inspection apparatus 10 includes a shield box 11, a conveyor 12, an X-ray irradiator 13, an X-ray line sensor 14, and a monitor 30 with a touch panel function (see FIG. 1). It is comprised from the control computer 20 (refer FIG. 4).
  • Shield box 11 On both side surfaces of the shield box 11, openings 11 a for allowing the product G to be carried in and out of the shield box 11 are formed.
  • the opening 11 a is closed by a shielding noren (not shown) in order to prevent leakage of X-rays to the outside of the shield box 11.
  • This shielding nolen is formed from rubber containing lead and is pushed away by the product G when the product G passes through the opening 11a.
  • a conveyor 12 In the shield box 11, a conveyor 12, an X-ray irradiator 13, an X-ray line sensor 14, a control computer 20 and the like are accommodated.
  • a key insertion slot, a power switch, and the like are disposed on the front upper portion of the shield box 11.
  • the conveyor 12 conveys the commodity G in the shield box 11 and is disposed so as to penetrate through the openings 11a formed on both side surfaces of the shield box 11 as shown in FIG. And the conveyor 12 conveys the goods G mounted on the belt, rotating an endless belt with the drive roller driven by the conveyor motor 12a (refer FIG. 4).
  • the conveyance speed by the conveyor 12 is finely controlled by the inverter control of the conveyor motor 12a by the control computer 20 so as to be the set speed input by the operator.
  • the conveyor motor 12a is equipped with an encoder 12b (see FIG. 4) that detects the conveying speed of the conveyor 12 and sends it to the control computer 20.
  • the X-ray irradiator 13 is disposed above the conveyor 12 and irradiates the fan-shaped irradiation range X with X-rays toward the lower X-ray line sensor 14.
  • FIG. 3 is a schematic diagram showing the principle of X-ray inspection.
  • the X-ray line sensor 14 is disposed below the conveyor 12, and mainly includes a large number of pixel sensors 14a. These pixel sensors 14 a are horizontally arranged in a straight line in a direction orthogonal to the conveying direction by the conveyor 12. Each pixel sensor 14a detects X-rays that have passed through the product G or the conveyor 12, and outputs an X-ray fluoroscopic image signal.
  • the X-ray fluoroscopic image signal indicates the brightness (density) of X-rays.
  • Monitor 30 is a full-dot liquid crystal display, and displays a screen that prompts the operator to input inspection parameters and the like necessary for inspection.
  • the monitor 30 also has a touch panel function and accepts input of inspection parameters and the like from the operator.
  • FIG. 4 is a block diagram of the control computer.
  • the control computer 20 includes a CPU (Central Processing Unit) 21, ROM (Read Only Memory) 22, RAM (Random Access Memory) 23, HDD (Hard Disk) 25, and a drive 24 for inserting a storage medium. It is equipped with.
  • CPU Central Processing Unit
  • ROM Read Only Memory
  • RAM Random Access Memory
  • HDD Hard Disk
  • the CPU 21 executes various programs stored in the ROM 22 and the HDD 25.
  • the HDD 25 stores and accumulates inspection parameters and inspection results.
  • the inspection parameters can be set and changed by input from the operator using the touch panel function of the monitor 30. The operator can set so that these data are stored and accumulated not only in the HDD 25 but also in a storage medium inserted in the drive 24.
  • control computer 20 includes a display control circuit (not shown) for controlling data display on the monitor 30 and a key input circuit (not shown) for capturing key input data input by the operator via the touch panel of the monitor 30. And a communication port (not shown) that enables connection with an external device such as a printer (not shown) or a network such as a LAN.
  • the units (21 to 25) of the control computer 20 are connected to each other via a bus line such as an address bus or a data bus.
  • the control computer 20 is connected to a conveyor motor 12a, an encoder 12b, a photoelectric sensor 15, an X-ray irradiator 13, an X-ray line sensor 14, and the like.
  • the photoelectric sensor 15 is a synchronous sensor for detecting the timing when the product G as a specimen passes through the fan-shaped X-ray irradiation range X (see FIG. 2), and is mainly a pair of sensors arranged with the conveyor 12 interposed therebetween. It consists of a projector and a light receiver.
  • the HDD 25 of the control computer 20 includes an image generation module, an area generation module, a brightness correction module, a pass / fail determination module, a foreign substance inspection module, a comprehensive diagnosis module, a histogram generation module, and a binarized image generation module. Contains various programs. Then, the CPU 21 of the control computer 20 reads and executes these program modules, whereby an image generation unit 21a, a region generation unit 21b, a luminance correction unit 21c, a quality determination unit 21d, a foreign matter inspection unit 21e, and a comprehensive diagnosis unit 21f. , And operates as a histogram creation unit 21g and a binarized image generation unit 21h (see FIG. 4).
  • the image generation unit 21 a generates an X-ray transmission image of the product G based on the X-ray fluoroscopic image signal output from the X-ray line sensor 14.
  • the image generation unit 21a uses the X-ray fluoroscopic image signal output from each pixel sensor 14a of the X-ray line sensor 14 when the product G passes the fan-shaped X-ray irradiation range X (see FIG. 2) at fine time intervals. And an X-ray transmission image of the product G is generated based on the acquired X-ray fluoroscopic image signal.
  • the timing at which the product G passes through the fan-shaped X-ray irradiation range X is determined by a signal from the photoelectric sensor 15.
  • the image generation unit 21a copies the product G by connecting the data for each fine time interval related to the X-ray brightness obtained from each pixel sensor 14a of the X-ray line sensor 14 in a matrix in time series. A line transmission image is generated.
  • Region generator 21b In the X-ray transmission image which copies the goods G produced
  • the brightness correction unit 21c corrects the brightness of the content area based on the brightness of the packaging area in the X-ray transmission image.
  • the brightness in the contents area is a value after passing through the contents and the packaging material, and X-rays are reduced by the amount absorbed by the packaging material (that is, darkened). Thus, the brightness of the content area from which the influence of the packaging material is removed can be obtained.
  • the pass / fail determination unit 21d determines the presence / absence of contents based on the luminance in the corrected content area. If the luminance in the content area is within a preset allowable range, a non-defective product is determined that an appropriate amount of content is present. On the other hand, if the luminance is out of the allowable range, it is determined that the content lacks an appropriate amount or does not exist.
  • the foreign substance inspection unit 21e detects a foreign substance contained in the product G by performing a binarization process on the X-ray transmission image of the product G generated by the image generation unit 21a. More specifically, when there is an area that appears darker than a preset threshold on the X-ray transmission image P of the product G, it is determined that foreign matter is mixed in the product G, and the product G is Judge as abnormal.
  • the foreign matter inspection unit 21e determines that a foreign matter is included, it immediately sends a signal indicating that to the comprehensive diagnosis unit 21f.
  • the comprehensive diagnosis unit 21f diagnoses the product G as a defective product and immediately ends the inspection by the foreign matter inspection unit 21e.
  • the comprehensive diagnosis unit 21f receives a signal indicating that no abnormality has been detected from the quality determination unit 21d and the foreign matter inspection unit 21e, the general diagnosis unit 21f diagnoses the product G as a non-defective product. Then, the comprehensive diagnosis unit 21 f sends the diagnosis result to the distribution mechanism 70.
  • Histogram creation unit 21g creates a histogram indicating the number of pixels for each luminance by classifying all the pixels constituting the X-ray transmission image for each luminance of a predetermined width and counting the number of pixels.
  • the binarized image generation unit 21h generates a binarized image by binarizing the X-ray transmission image using a predetermined threshold.
  • FIG. 6A is a perspective view of a product G to be inspected.
  • 6B is a cross-sectional view of the commodity G along the line SS in FIG. 6A.
  • the medicine m is sealed by the package 40.
  • the package 40 includes a resin package case 41 and a package cover 43.
  • the package case 41 is integrally formed with a plurality of concave pocket portions 41p and a sheet portion 41s that connects the peripheral edges of the openings of the pocket portions 41p.
  • the material of the package case 41 is plastic, and its thickness is thin and 0.3 mm or less.
  • the package cover 43 is a seal region that is in close contact with the sheet portion 41 s of the package case 41 except for a region that closes the opening of the pocket portion 41 p of the package case 41.
  • the package cover 43 is a sheet made of paper or aluminum and has a thin thickness of 0.3 mm or less.
  • FIG. 7A is an image diagram of the X-ray transmission image P0 of product G.
  • the region where the sheet portion 41s of the package case 41 and the package cover 43 are in close contact that is, the region of only the packaging material (hereinafter referred to as the packaging region Rf) has a low transmitted X-ray intensity.
  • the line transmission image P0 is darkly displayed.
  • the medicine m is accommodated in the pocket portion 41p of the package case 41 closed by the package cover 43, the medicine itself is thin and does not absorb X-rays sufficiently, so that it is difficult to make a difference from the packaging area Rf. (Hereinafter referred to as drug region Rn).
  • the circumferential wall 41pw (see FIG. 6B) of the pocket portion 41p has a lower transmission X-ray intensity than the packaging region Rf because the circumferential wall 41pw is raised in the X-ray irradiation direction and the transmission distance becomes longer. Become. Therefore, the circumferential wall 41pw of the pocket portion 41p has a lower transmission X-ray intensity than the packaging region Rf, and is displayed darker than the packaging region Rf in the X-ray transmission image P0 (hereinafter referred to as a pocket portion contour region Rp). ).
  • the outside of the packaging area Rf is the background (conveyor) and is displayed brightest (hereinafter referred to as the background area Rb).
  • the histogram creation unit 21g creates a histogram indicating the number of pixels for each luminance by classifying all the pixels constituting the X-ray transmission image P0 for each luminance of a predetermined width and counting the number of pixels.
  • FIG. 8 is a histogram based on the X-ray transmission image P0 of the product G.
  • the histogram includes a peak a corresponding to the packaging region Rf and a peak b corresponding to the background region Rb.
  • the luminance of the drug region Rn is estimated to be in the vicinity of the bottom of the distribution including the peak a because the difference from the luminance of the packaging region Rf is small.
  • the binarized image generation unit 21h generates a binarized image by binarizing the X-ray transmission image P0 with a threshold Th.
  • FIG. 9 is an explanatory diagram showing a setting state of the threshold Th when a binarized image is generated.
  • a brightness value that is darker than the packaging region Rf and brighter than the pocket contour region Rp is set as the threshold Th for generating the binarized image. More specifically, a luminance value slightly lower than the distribution including the peak a shown in FIG. 8 is set.
  • the binarized image generation unit 21h binarizes the X-ray transmission image P0 with the threshold Th, thereby generating a binarized image. This image is referred to as a pocket contour extraction image P1.
  • FIG. 7B is an image diagram of the pocket contour extraction image P1.
  • a region brighter than the pocket outline region Rp portion greater than or equal to the threshold Th is displayed in white by binarization.
  • the pocket outline region Rp delimits the drug region Rn and the packaging region Rf.
  • FIG. 7C is an image diagram of the medicine region extraction image P2.
  • the region displayed in white is the drug region Rn.
  • the luminance of each medicine region Rn is influenced by the luminance of the packaging region Rf because it is based on the medicine and the X-ray data transmitted through the packaging material (the package case 41 and the package cover 43).
  • FIG. 10 is a control flowchart of the shortage inspection of the X-ray inspection apparatus 10.
  • the control computer 20 performs the following control.
  • Step S1 First, in step S1, the control computer 20 determines whether or not X-ray data is input. If X-ray data is input, the control computer 20 proceeds to step S2, and if no X-ray data is input, the control computer 20 Continue to determine whether there is input.
  • Step S2 the control computer 20 generates an X-ray transmission image P0 via the image generation unit 21a, and proceeds to step S3.
  • Step S3 Next, in step S3, the control computer 20 creates a histogram via the histogram creation unit 21g, and proceeds to step S4.
  • step S4 the control computer 20 generates the pocket contour extraction image P1 via the binarized image generation unit 21h, and proceeds to step S5.
  • Step S5 the control computer 20 generates a drug region extraction image P2 from the pocket contour extraction image P1 via the binarized image generation unit 21h, and proceeds to step S6.
  • Step S6 the control computer 20 obtains the average luminance (B 1 to B 10 ) of each drug region (Rn 1 to Rn 10 ) of the drug region extraction image P2 via the luminance correction unit 21c.
  • Bi is the average luminance B of any drug region Rn.
  • step S7 the control computer 20 acquires the brightness of the packaging region Rf via the brightness correction unit 21c.
  • the luminance A which is the mode value, is employed.
  • Step S8 the control computer 20 first obtains [Bi-A] via the luminance correction unit 21c, and then determines whether or not Bi-A ⁇ ⁇ via the pass / fail judgment unit 21d. To do. The control computer 20 proceeds to step S9 when Bi ⁇ A ⁇ ⁇ , and returns to step S1 when Bi ⁇ A ⁇ ⁇ .
  • step S9 the control computer 20 transmits a missing part determination signal to the comprehensive diagnosis unit 21f via the pass / fail determination unit 21d.
  • the influence of the packaging material can be offset from the luminance of the medicine region Rn. Therefore, even if the packaging material thickness varies from lot to lot, the influence is eliminated and the shortage inspection is performed. Even if the content is very thin, such as a drug, accurate missing item determination is performed.
  • the luminance in the medicine region Rn is a value after passing through the contents and the packaging material, and the luminance is reduced by the amount absorbed by the packaging material. Is corrected to obtain the luminance of the drug region Rn from which the influence of the packaging material is removed. As a result, misjudgment of missing item inspection due to variations in packaging material thickness can be prevented.
  • the luminance correction unit 21 c obtains the influence of the luminance of the packaging region Rf on the luminance of the medicine region Rn based on the luminance of all or part of the packaging region Rf, and calculates the luminance from the luminance of the medicine region Rn. Offset the impact.
  • the inspection target can be a case where a packaging material having a smaller X-ray transmittance than the contents is used.
  • the thickness of the resin packaging material is 0. Those having a thickness of 3 mm or less and those having a content thickness of 4 mm or less can be inspection objects.
  • the pass / fail determination unit 21 d determines the presence / absence of contents based on the luminance in the corrected drug region Rn, and therefore the influence of using a packaging material having a smaller X-ray transmittance than the contents. The shortage inspection is performed without fail.
  • the X-ray inspection apparatus 10 has been described by taking the shortage inspection for inspecting the presence or absence of contents as an example.
  • the application example of the X-ray inspection apparatus 10 is not limited to the shortage inspection, and for example, inspection of contamination of the contents, inspection of cracks or chipping of the contents, and the like can be performed.
  • the X-ray inspection apparatus of the present invention can be widely applied to X-ray inspection apparatuses that determine the presence / absence of a missing item from the brightness in an area included in an X-ray transmission image.

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

La présente invention a pour but de fournir un appareil d'inspection par rayons X qui soit capable, même s'il existe une variation d'épaisseur de matériau d'emballage parmi des lots, d'effectuer de manière sûre une inspection pour une partie manquante sans être influencé par la variation. Dans l'appareil d'inspection par rayons X (10), la luminosité d'une région de réactif (Rn) est une valeur obtenue après que des rayons X ont été transmis à travers un contenu et un matériau d'emballage associé. La luminosité est inférieure à celle d'avant la transmission de la quantité de rayons X ayant été absorbée par le matériau d'emballage. Ainsi, en raison de la correction de la quantité, la luminosité de la région de réactif (Rn), à partir de laquelle l'influence du matériau d'emballage a été éliminée, est obtenue. Par conséquent, l'appareil peut empêcher une détermination erronée dans l'inspection pour une partie manquante, provoquée par une variation d'épaisseur parmi des matériaux d'emballage.
PCT/JP2017/010933 2016-03-18 2017-03-17 Appareil d'inspection par rayons x WO2017159856A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2018506043A JPWO2017159856A1 (ja) 2016-03-18 2017-03-17 X線検査装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016055556 2016-03-18
JP2016-055556 2016-03-18

Publications (1)

Publication Number Publication Date
WO2017159856A1 true WO2017159856A1 (fr) 2017-09-21

Family

ID=59852141

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2017/010933 WO2017159856A1 (fr) 2016-03-18 2017-03-17 Appareil d'inspection par rayons x

Country Status (2)

Country Link
JP (1) JPWO2017159856A1 (fr)
WO (1) WO2017159856A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020201155A (ja) * 2019-06-11 2020-12-17 Ckd株式会社 検査装置及び包装体製造装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006126149A (ja) * 2004-11-01 2006-05-18 Toshiba Corp 高圧容器内観察装置およびその観察方法
WO2015041259A1 (fr) * 2013-09-18 2015-03-26 株式会社イシダ Dispositif d'inspection
JP2015083967A (ja) * 2013-09-20 2015-04-30 株式会社イシダ 検査装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006126149A (ja) * 2004-11-01 2006-05-18 Toshiba Corp 高圧容器内観察装置およびその観察方法
WO2015041259A1 (fr) * 2013-09-18 2015-03-26 株式会社イシダ Dispositif d'inspection
JP2015083967A (ja) * 2013-09-20 2015-04-30 株式会社イシダ 検査装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020201155A (ja) * 2019-06-11 2020-12-17 Ckd株式会社 検査装置及び包装体製造装置
WO2020250580A1 (fr) * 2019-06-11 2020-12-17 Ckd株式会社 Dispositif d'inspection, appareil de fabrication de boîtier et procédé de fabrication de boîtier
KR20210135537A (ko) * 2019-06-11 2021-11-15 시케이디 가부시키가이샤 검사 장치 및 포장체 제조 장치
KR102547758B1 (ko) 2019-06-11 2023-06-23 시케이디 가부시키가이샤 검사 장치 및 포장체 제조 장치

Also Published As

Publication number Publication date
JPWO2017159856A1 (ja) 2019-01-24

Similar Documents

Publication Publication Date Title
CN111630519B (zh) 检查装置
AU2006201717B2 (en) X-ray inspection apparatus
US7477726B2 (en) X-ray inspection apparatus
KR102387529B1 (ko) 검사 장치
WO2015041259A1 (fr) Dispositif d'inspection
JP3828781B2 (ja) X線異物検出装置
JP5864404B2 (ja) X線検査装置
JP4585915B2 (ja) X線検査装置
JP2005003480A (ja) X線検査装置
JP6466671B2 (ja) 検査装置
WO2017159856A1 (fr) Appareil d'inspection par rayons x
JP2007183200A (ja) X線検査装置及び物品検査装置
JP2005031069A (ja) X線検査装置
JP2009080031A (ja) X線検査装置
JP2009080030A (ja) X線検査装置
JP4170366B2 (ja) X線検査装置
JP6861990B2 (ja) X線検査装置
JP2008175691A (ja) X線検査装置および検査方法
WO2017159855A1 (fr) Dispositif d'inspection à rayons x
JP2021025874A (ja) 検査装置
JP5336758B2 (ja) X線検査装置
JP6144584B2 (ja) 破損検査装置
CN111796336B (zh) 检查装置
JP2006071423A (ja) X線検査装置
JP5947674B2 (ja) X線検査装置

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 2018506043

Country of ref document: JP

NENP Non-entry into the national phase

Ref country code: DE

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 17766851

Country of ref document: EP

Kind code of ref document: A1

122 Ep: pct application non-entry in european phase

Ref document number: 17766851

Country of ref document: EP

Kind code of ref document: A1