WO2017024744A1 - 显示基板及其制作方法和显示装置 - Google Patents
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- WO2017024744A1 WO2017024744A1 PCT/CN2015/099876 CN2015099876W WO2017024744A1 WO 2017024744 A1 WO2017024744 A1 WO 2017024744A1 CN 2015099876 W CN2015099876 W CN 2015099876W WO 2017024744 A1 WO2017024744 A1 WO 2017024744A1
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- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1203—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body the substrate comprising an insulating body on a semiconductor body, e.g. SOI
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/124—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
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- H—ELECTRICITY
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- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
Definitions
- Embodiments of the present invention relate to a display substrate, a method of fabricating the same, and a display device.
- Liquid crystal display technology has replaced cathode ray tube technology. It has become the mainstream technology in the field of daily display; due to its own advantages, it has become an ideal display device in the market and consumers.
- stereoscopic display technology is on the rise in the market, so it is increasingly important to solve the technical shortcomings of the stereoscopic display technology and improve the imaging quality (such as reducing color shift, reducing stereo crosstalk, flickering the screen, increasing the viewing angle, etc.).
- ADSDS liquid crystal display technology has the advantages of high transmittance, large viewing angle, and easy cost reduction. It has become the mainstream technology in the field of high-precision display. The technology is widely used in high-end mobile phone screens, mobile applications, television and other fields.
- At least one embodiment of the present invention provides a display substrate, a manufacturing method thereof, and a display device for solving the problem of low charging rate in a large-sized display panel.
- At least one embodiment of the present invention provides a display substrate including a substrate substrate, gate lines arranged on the substrate substrate, data lines, and matrix arrays divided by the gate lines and the data lines a pixel unit, wherein the pixel unit is provided with a thin film transistor, a pixel electrode, and a common electrode; wherein the pixel electrode and the common electrode are insulated from each other, and the pixel electrode includes a plurality of strip-shaped sub-pixel electrodes.
- the common electrode includes a plurality of strip-shaped sub-common electrodes, and the plurality of strip-shaped sub-pixel electrodes are alternately distributed with the plurality of strip-shaped sub-common electrodes, and each of the sub-pixel electrodes and adjacent thereto
- the width between the sub-common electrodes is 1-5 ⁇ m.
- the interval width between the sub-pixel electrode and the sub-common electrode is 1-2 ⁇ m.
- the common electrode further includes a first connection region for electrically connecting the plurality of strip-shaped sub-common electrodes, the first connection region and the plurality of strip-shaped sub-common electrodes forming a closed region, Distributed around the pixel electrode.
- the width of the sub-pixel electrode and the sub-common electrode are both 2-10 ⁇ m.
- the display substrate may further include a common electrode line including a gate, a gate insulating layer, an active layer, a source, and a drain.
- a common electrode line including a gate, a gate insulating layer, an active layer, a source, and a drain.
- the gate and the common electrode line are disposed in the same layer above the base substrate; the gate insulating layer is located above the gate and the common electrode line; the active layer is located at the gate insulation Above the layer; the source and drain are above the active layer.
- the gate electrode and the common electrode line are disposed in the same layer, and can be formed by one process and the same material, which is advantageous for simplifying the manufacturing process of the display substrate, improving production efficiency, and reducing production cost.
- the common electrode does not overlap the data line in the forward projection direction.
- the common electrode may be provided with a second connection region; the common electrode overlaps at least partially with the common electrode line in a right projection direction, and the common electrode and the common electrode line pass the second connection
- the first via between the region and the sub-common electrode line is electrically connected.
- the display substrate further includes a passivation layer disposed between the layer where the pixel electrode and the common electrode are located and the layer where the thin film transistor is located, and the first via hole passes through the corresponding portion of the second connection region.
- a passivation layer and the gate insulating layer are disposed between the layer where the pixel electrode and the common electrode are located and the layer where the thin film transistor is located, and the first via hole passes through the corresponding portion of the second connection region.
- At least one embodiment of the present invention also provides a display device including the display substrate described above.
- At least one embodiment of the present invention further provides a method of fabricating a display substrate, the method comprising: forming a pattern including a common electrode on a substrate; forming a pixel including the pixel electrode on the substrate including the pattern of the common electrode a pattern; or a pattern including a pixel electrode formed on the substrate, and a pattern including the common electrode formed on the substrate including the pattern of the pixel electrode; wherein the pixel electrode and the common electrode are insulated from each other in a layer,
- the pixel electrode includes a plurality of strip-shaped sub-pixel electrodes, the common electrode includes a plurality of strip-shaped sub-common electrodes, and the plurality of strip-shaped sub-pixel electrodes alternate with the plurality of strip-shaped sub-common electrodes
- the distribution width between each of the sub-pixel electrodes and the sub-common electrode adjacent thereto is 1-5 ⁇ m.
- a first transparent conductive film layer is formed on the base substrate; Depositing a photoresist over the first transparent conductive film layer, forming a first photoresist pattern matching the first electrode in a region where the first electrode is pre-formed by a patterning process; and pre-forming the first electrode by a patterning process Forming a first electrode including a plurality of strip-shaped sub-first electrodes, and a width of the sub-first electrode is smaller than a width of the first photoresist pattern located above the first lithography layer; Forming a second transparent conductive film layer on the substrate of the glue pattern, peeling off the first photoresist pattern and the second transparent conductive film layer directly above the first photoresist pattern to form a plurality of strips a second electrode of the second electrode; wherein the first electrode is a common electrode, the second electrode is a pixel electrode, the sub-first electrode is a sub-common electrode, and the sub-second electrode is a sub-pixel electrode Or the first electrode is a common electrode, the second
- the interval width between the sub-pixel electrode and the sub-common electrode is 1-2 ⁇ m.
- the method may further include: forming a pattern including the gate line and the common electrode line on the substrate by using a patterning process; Forming a pattern including a gate insulating layer on a substrate of a pattern of gate lines and a common electrode line; forming a pattern including an active layer on the substrate including the pattern of the gate insulating layer; and a substrate on the pattern including the active layer A pattern including a data line, a source and a drain is formed thereon; and a pattern including a passivation layer is formed on the substrate including the pattern of the data line, the source and the drain.
- the common electrode formed further includes a first connection region for electrically connecting the plurality of strip-shaped sub-common electrodes, the first connection region and the plurality of strip-shaped sub-common electrodes forming a closed region Surrounding the sub-pixel electrode distribution.
- the common electrode does not overlap the data line in the forward projection direction.
- the width of the sub-pixel electrode and the sub-common electrode are both 2-10 ⁇ m.
- the common electrode may further be provided with a second connection region; the common electrode overlaps at least partially with the common electrode line in a right projection direction, and the common electrode and the common electrode line pass through the first The first via between the second connection region and the common electrode line is electrically connected.
- 1 is a schematic plan view showing a planar structure of a substrate
- Figure 2 is a cross-sectional view showing the structure of the substrate shown in Figure 1 along A-A';
- FIG. 3 is a schematic plan view showing a planar structure of a display substrate according to Embodiment 1 of the present invention.
- FIG. 4 is a schematic cross-sectional view of the display substrate of FIG. 1 taken along B-B';
- FIG. 5 is a schematic diagram of a planar structure of a display substrate according to Embodiment 2 of the present invention.
- FIG. 6 is a schematic cross-sectional structural view of a display substrate according to Embodiment 3 of the present invention.
- FIG. 7 to FIG. 15 are schematic cross-sectional views showing the flow of the method for fabricating the display substrate shown in FIG. 4.
- the common electrode of the ADS type and the high-grade super-dimension-switching type (HADS) type liquid crystal panel may be composed of a strip-shaped ITO common electrode or a plate-shaped ITO common electrode connected to the entire surface, and the common electrode and the pixel electrode are at least Partial overlap, see Figure 1 and Figure 2.
- a constant voltage signal is applied to the common electrode, and a thin film transistor (TFT) is turned on, and a different voltage signal is supplied to the pixel electrode through the data line, so that a common electrode and a pixel electrode are generated.
- TFT thin film transistor
- the electric field in turn drives the liquid crystal molecules to rotate to achieve image display.
- the pixel size of the liquid crystal display panel also increases, and the storage capacitance C st between the common electrode and the pixel electrode also increases; but when the storage capacitor C st becomes large, the charging rate is difficult. Guaranteed.
- TFT Thin Film Transistor
- increasing the size of the TFT not only reduces the aperture ratio of the pixel, but also increases the coupling capacitance between the gate and the source and the gate and the drain in the corresponding thin film transistor as the TFT size increases. , thereby affecting the performance of the thin film transistor, thereby reducing the picture quality of the display panel.
- At least one embodiment of the present invention provides a display substrate, a manufacturing method thereof, and a display device for solving the problem of low charging rate in a large-sized display panel.
- Embodiment 1 of the present invention provides a display substrate, see FIG. 3 and FIG. 4; the display substrate a base substrate 101, a gate line 102 disposed on the base substrate 101, a data line 103, and a pixel unit arranged in a matrix divided by the gate line 102 and the data line 103, the pixel a thin film transistor, a pixel electrode and a common electrode are disposed in the unit; wherein the pixel electrode and the common electrode are insulated from each other, the pixel electrode includes a plurality of strip-shaped sub-pixel electrodes 104, and the common electrode includes a plurality of Strip-shaped sub-common electrodes 105, the plurality of strip-shaped sub-pixel electrodes 104 are alternately distributed with the plurality of strip-shaped sub-common electrodes 105, and each of the sub-pixel electrodes 104 and its adjacent sub-pixels The width between the common electrodes 105 is 1-5 ⁇ m.
- the display substrate includes a substrate substrate, gate lines arranged on the substrate substrate, data lines, and pixel units sequentially arranged by the gate lines and the data lines
- a thin film transistor, a pixel electrode, and a common electrode are disposed in the pixel unit.
- the pixel electrode and the common electrode are provided in the same layer, and are disposed on the same insulating layer and spaced apart from each other.
- the pixel electrode includes a plurality of strip-shaped sub-pixel electrodes, and the common electrode includes a plurality of strips.
- the plurality of strip-shaped sub-pixel electrodes are alternately distributed with the plurality of strip-shaped sub-common electrodes, and an interval width between each of the sub-pixel electrodes and a sub-common electrode adjacent thereto is 1-5 ⁇ m.
- the storage capacitor C st in the pixel unit of the large-size liquid crystal display panel can be reduced, thereby ensuring the size of the thin film transistor without increasing the size of the thin film transistor.
- the charging rate of the storage capacitor C st can not only improve the aperture ratio of the pixel, but also ensure good performance of the thin film transistor, thereby improving the display quality of the display panel.
- the common electrode includes a plurality of strip-shaped sub-common electrodes, and the plurality of strip-shaped sub-pixel electrodes and the plurality of strip-shaped sub-pixels
- the common electrodes are alternately distributed, and the interval width between each of the sub-pixel electrodes and the sub-common electrode adjacent thereto is 1-5 ⁇ m, which can generate a uniform driving electric field when the pixel unit operates to display, thereby driving liquid crystal molecules. Deflection occurs to achieve image realization, further improving the display quality of the liquid crystal display panel.
- the base substrate may be a glass substrate, a plastic substrate, or the like.
- the interval width between the sub-pixel electrode 104 and the sub-common electrode 105 is 1-2 ⁇ m.
- the interval width is controlled within a range of 1-2 ⁇ m, thereby further improving the uniformity of the driving electric field, avoiding display defects caused by uneven distribution of electric field strength in the driving electric field due to excessive spacing, and further improving the display of the liquid crystal display panel. quality.
- the common electrode may further include a first connection region 116 for electrically connecting the plurality of strip-shaped sub-common electrodes 105, and the first connection region 116 may be
- the plurality of strip-shaped sub-common electrodes 105 form a closed region or a partially closed region, which is distributed around the pixel electrode 104.
- the material used for the sub-pixel electrode 104 and the sub-common electrode 105 is the same, and the material for the fabrication may be a transparent conductive material such as indium tin oxide (ITO).
- the common electrode is distributed around the pixel electrode, and the common electrode and the pixel electrode can respectively receive an externally applied driving voltage through a via hole, which is advantageous for simplifying the manufacturing process and improving the production efficiency.
- the sub-pixel electrode 104 and the sub-common electrode 105 have a width of 2 to 10 ⁇ m.
- the widths of the sub-pixel electrode and the sub-common electrode are both 2-10 ⁇ m, and the width range can be fabricated by using an existing fabrication process, and the sub-pixel electrode and the sub-common electrode can be formed.
- the electric field is uniformly driven, and it is possible to prevent the display line from being further broken due to the excessively small width of the sub-pixel electrode and the sub-common electrode.
- a common electrode line 106 for transmitting a voltage signal to the common electrode is further disposed in the display substrate.
- the thin film transistor includes a gate electrode 107, a gate insulating layer 108, an active layer 109, a source 110, and a drain 111 in this order from bottom to top.
- the thin film crystal is of a bottom gate type, but the present invention is not limited to the specific structure of the thin film transistor, and for example, the thin film transistor may be of a top gate type.
- the display substrate further includes a passivation layer 112 disposed between the layer where the pixel electrode and the common electrode are located and the layer where the thin film transistor is located.
- a passivation layer disposed between the layer where the pixel electrode and the common electrode are located and the layer where the thin film transistor is located may be used to protect the thin film transistor from damage, and at the same time, the source and the drain may be a layer where the data line is located and the layer where the common electrode and the pixel electrode are located The insulation is isolated to form a common electrode and a pixel electrode.
- the structure of the display substrate according to the first embodiment of the present invention includes: the gate electrode 107 and the common electrode line 106 disposed in the same layer above the substrate substrate 101; a gate insulating layer 108 over the layer where the electrode 107 and the common electrode line 106 are located; an active layer 109 over the gate insulating layer 108; the data line 103, the source 110 and the drain located above the active layer 109 a gate 111; a passivation layer 112 over the layer where the data line 103, the source 110 and the drain 111 are located; a pixel electrode and a common electrode above the passivation layer 112.
- the pixel electrode and the common electrode are insulated from each other, the pixel electrode includes a plurality of strip-shaped sub-pixel electrodes 104, and the common electrode includes a plurality of strip-shaped sub-common electrodes 105.
- the plurality of strip-shaped sub-pixel electrodes 104 are alternately distributed with the plurality of strip-shaped sub-common electrodes 105, and the interval width between each of the sub-pixel electrodes 104 and the sub-common electrode 105 adjacent thereto is 1 -5 ⁇ m.
- the gate electrode and the common electrode line are disposed in the same layer, the two can be formed by one process and the same material, which is advantageous for simplifying the manufacturing process of the display substrate, improving production efficiency, and reducing production cost.
- the common electrode does not overlap the data line 103 in the forward projection direction.
- the common electrode does not overlap with the data line in the forward projection direction, which can reduce the coupling capacitance in the thin film transistor and improve the electrical characteristics of the thin film transistor.
- the common electrode may further be provided with a second connection region 113; the common electrode overlaps at least a part of the common electrode line 106 in a right projection direction, the common electrode and the common electrode line
- the electrical connection is made through the first via 114 between the second connection region 113 and the common electrode line 106.
- the first via 114 penetrates the gate insulating layer 108 and the passivation layer 112.
- the display panel further includes a second via 115 disposed through the passivation layer 112, and the sub-pixel electrode 104 is electrically connected to the drain 111 through the second via 115.
- the second embodiment of the present invention further provides a display substrate.
- the structure of the display substrate provided by the second embodiment of the present invention is substantially the same as that of the display substrate provided by the first embodiment of the present invention.
- the difference between the two is that the sub-common electrode 105 and the sub-pixel electrode 104 are distributed in the direction parallel to the gate line 102 in the display substrate provided by the first embodiment of the present invention, and the display base provided in the second embodiment of the present invention
- the plate neutron common electrode 105 and the sub-pixel electrode 104 are distributed parallel to the direction of the data line 103; the specific structure will not be described herein.
- the third embodiment of the present invention further provides a display substrate.
- the structure of the display substrate provided by the third embodiment of the present invention and the structure of the display substrate provided by the first embodiment of the present invention are basically the same.
- the thin film transistor in the display substrate provided by the first embodiment of the present invention is a bottom gate thin film transistor
- the thin film transistor in the display substrate provided by the third embodiment of the present invention is a top gate thin film transistor, wherein the source is 110 and a drain 111 are located above the base substrate 101; the active layer 109 is located above a layer where the source 110 and the drain 111 are located; the gate insulating layer 108 is located above the active layer 109
- the gate electrode 107 and the common electrode line 106 are located above the gate insulating layer 108; the passivation layer 112 is located above the layer where the gate electrode 107 and the common electrode line 106 are located; the sub-pixel electrode 104 and the sub-pixel
- the common electrode 105 is located above the passivation layer 112.
- a first via 114' for electrically connecting the sub-common electrode 105 and the common electrode line 106 penetrates the passivation layer 112; for electrically connecting the drain 111 and the sub-pixel
- a second via 115' of the electrode 105 penetrates the gate insulating layer 108 and the passivation layer 112.
- Embodiment 4 of the present invention provides a method for fabricating a display substrate, the method comprising: forming a common electrode and a pixel electrode on a substrate. For example, a pattern including a common electrode is formed on a base substrate; a pattern including a pixel electrode is formed on the substrate including the pattern of the common electrode; or a pattern including a pixel electrode is formed on the base substrate, including A pattern including a common electrode is formed on the substrate of the pattern of the pixel electrode; or, the common electrode and the pixel electrode are formed by the same electrode material in the same patterning process.
- the pixel electrode and the common electrode are insulated from each other, the pixel electrode includes a plurality of strip-shaped sub-pixel electrodes, and the common electrode includes a plurality of strip-shaped sub-common electrodes, and the plurality of strip-shaped sub-children
- the pixel electrode is alternately distributed with the plurality of strip-shaped sub-common electrodes, and a width between each of the sub-pixel electrodes and a sub-common electrode adjacent thereto is 1-5 ⁇ m.
- the display substrate produced by the method provided in the fourth embodiment of the present invention includes a pixel electrode and a common electrode disposed in the same layer, the pixel electrode includes a plurality of strip-shaped sub-pixel electrodes, and the common electrode includes a plurality of strips a sub-common electrode, the plurality of strip-shaped sub-pixel electrodes are alternately distributed with the plurality of strip-shaped sub-common electrodes, and an interval between each of the sub-pixel electrodes and a sub-common electrode adjacent thereto The width is 1-5 ⁇ m.
- the storage capacitor C st in the large-size liquid crystal display panel can be reduced, thereby ensuring the charging rate of the storage capacitor C st without increasing the size of the thin film transistor; Since it is not necessary to increase the size of the thin film transistor, not only the aperture ratio of the pixel can be increased, but also the thin film transistor can be ensured to have good performance, thereby improving the display quality of the display panel.
- the pixel electrode includes a plurality of strip-shaped sub-pixel electrodes
- the common electrode includes a plurality of strip-shaped sub-common electrodes
- the plurality of strip-shaped sub-pixel electrodes and the plurality of strip-shaped sub-commons are alternately distributed, and the interval width between each of the sub-pixel electrodes and the sub-common electrode adjacent thereto is 1-5 ⁇ m, so that a uniform driving electric field can be generated, thereby driving liquid crystal molecules to deflect to realize image realization, further Improve the display quality of the liquid crystal display panel.
- the step of fabricating the display substrate includes: forming a first transparent conductive film layer on the base substrate; depositing a photoresist over the first transparent conductive film layer, and pre-forming the first electrode by a patterning process Forming a first photoresist pattern matching the first electrode; forming a first electrode including a plurality of strip-shaped sub-first electrodes in a region where the first electrode is pre-formed by a patterning process, and the sub-first The width of the electrode is smaller than the width of the first photoresist pattern located above the second photoresist film layer on the substrate including the first photoresist pattern, and the first photoresist pattern is peeled off and a second transparent conductive film layer directly above the first photoresist pattern to form a second electrode including a plurality of strip-shaped sub-second electrodes.
- the first electrode is a sub-common electrode
- the second electrode is a sub-pixel electrode
- the sub-first electrode is a sub-common electrode
- the sub-second electrode is a sub-pixel electrode
- the first The electrode is a sub-pixel electrode
- the second electrode is a sub-common electrode
- the sub-first electrode is a sub-pixel electrode
- the sub-second electrode is a sub-common electrode
- a photoresist is first deposited over the first transparent conductive film layer, and a first photolithography matching the first electrode is formed in a region where the first electrode is pre-formed by a patterning process.
- a glue pattern and forming a first electrode including a plurality of strip-shaped sub-first electrodes in a region where the first electrode is pre-formed by a patterning process, and a width of the sub-first electrode is smaller than the first portion located above a width of the photoresist pattern, then forming a second transparent conductive film layer on the substrate including the first photoresist pattern, stripping the first photoresist pattern and directly above the first photoresist pattern a second transparent conductive film layer to form a second electrode including a plurality of strip-shaped sub-second electrodes, and the first electrode and the second electrode formed by the method can effectively reduce the sub-first electrode and the second second The spacing between the electrodes makes the distribution of the driving electric field more uniform.
- the interval width between the sub-pixel electrode and the sub-common electrode is 1-2 ⁇ m.
- the interval width between the sub-pixel electrode and the sub-common electrode is set to 1-2 ⁇ m, which can further improve the uniformity of the driving electric field, and avoid the uneven distribution of the electric field intensity in the driving electric field due to the excessive spacing.
- the display is poor, and the display quality of the liquid crystal display panel is further improved.
- the method may further include: forming a pattern including the gate line and the common electrode line on the substrate by using a patterning process; Forming a pattern including a gate insulating layer on a substrate of a pattern of gate lines and a common electrode line; forming a pattern including an active layer on the substrate including the pattern of the gate insulating layer; and a substrate on the pattern including the active layer A pattern including a data line, a source and a drain is formed thereon; and a pattern including a passivation layer is formed on the substrate including the pattern of the data line, the source and the drain.
- the gate electrode and the common electrode line are disposed in the same layer, and can be formed by one process and the same material, which is advantageous for simplifying the manufacturing process of the display substrate, improving production efficiency, and reducing production cost.
- the common electrode formed further includes a first connection region for electrically connecting the plurality of strip-shaped sub-common electrodes, the first connection region and the The plurality of strip-shaped sub-common electrodes form a closed region that is distributed around the pixel electrode.
- the common electrode is distributed around the pixel electrode, so that the common electrode and the pixel electrode can respectively receive the driving voltage applied by the external circuit through one via hole, which is advantageous for simplifying the manufacturing process and improving the production efficiency.
- the common electrode does not overlap the data line in the forward projection direction.
- the common electrode does not overlap with the data line in the forward projection direction, which can reduce the coupling capacitance in the thin film transistor and improve the electrical characteristics of the thin film transistor.
- the widths of the sub-pixel electrode and the sub-common electrode are both set to 2 to 10 ⁇ m.
- the width range can be fabricated by using an existing fabrication process, and between the sub-pixel electrode and the sub-common electrode. A uniform driving electric field is formed, and it is possible to prevent the display line from being further broken due to the excessively small width of the sub-pixel electrode and the sub-common electrode.
- the common electrode may further be provided with a second connection region 113; the common electrode overlaps at least partially with the common electrode line 106 in a front projection direction, the common electrode and the common electrode line 106 electrically connecting through the first via 114 between the second connection region 113 and the common electrode line 106, the common electrode line 106 providing a drive for the common electrode Dynamic voltage.
- the method for forming the display substrate specifically includes the following steps.
- Step 1 referring to FIG. 7, a metal thin film for forming the gate line 102, the gate electrode 107, and the common electrode line 106 is formed (eg, sputtered or coated, etc.) on the base substrate 101; Coating a photoresist on the film; then, exposing the photoresist with a mask provided with a pattern including the gate line 102, the gate 107 and the common electrode line 106; finally, developing and etching to form a gate including the gate The pattern of the pole 107 and the common electrode line 106.
- the manufacturing process of the film layer formed by the patterning process is the same as that of the substrate, and will not be described in detail hereinafter.
- Step 2 referring to FIG. 8, a silicon dioxide or silicon nitride layer, gate insulating layer 108 is deposited by plasma enhanced chemical vapor deposition on the substrate including the pattern of the gate electrode 107 and the common electrode line 106. And forming a via hole in a region corresponding to the second connection region overlapping the common electrode line.
- Step 3 referring to FIG. 9, a pattern including the active layer 109 is formed on the substrate including the gate insulating layer 108; the active layer 109 may be formed of amorphous silicon, polysilicon, or a metal oxide semiconductor material.
- Step 4 referring to FIG. 10, depositing a metal layer such as molybdenum (Mo), aluminum (Al) or cadmium (Cr) on the substrate including the pattern of the active layer 109, and then forming a data line 103 by a patterning process. , the pattern of the source 110 and the drain 111.
- a metal layer such as molybdenum (Mo), aluminum (Al) or cadmium (Cr)
- a passivation layer 112 is formed on the pattern substrate including the data line 103, the source 110, and the drain 111. And forming a via hole penetrating the passivation layer over the via hole corresponding to the step 602 by a patterning process, forming a first through-gate insulating layer and a passivation layer for electrically connecting the common electrode and the common electrode line.
- the via hole 114; and a second via 115 penetrating the passivation layer is formed in a region where the pixel electrode overlaps the drain, so that the pixel electrode and the drain are electrically connected through the second via 115.
- Step 6 referring to FIG. 12, a layer of indium tin oxide (ITO) transparent conductive film is deposited on the passivation layer 112 by magnetron sputtering to form a first transparent conductive film layer 61.
- ITO indium tin oxide
- Step 7 referring to FIG. 13, depositing a photoresist over the first transparent conductive film layer, and forming a first photoresist pattern 62 matching the pixel electrode in a region where the pixel electrode is pre-formed by a patterning process.
- Step 8 referring to FIG. 14, forming a pixel electric field in a region where the pixel electrode is pre-formed by a patterning process
- the pixel electrode includes a plurality of strip-shaped sub-pixel electrodes 104 (see also FIG. 4), and the width of the sub-pixel electrode 104 is smaller than the width of the first photoresist pattern located above the pixel.
- Step 9 referring to FIG. 15, an indium tin oxide (ITO) transparent conductive film is deposited on the substrate including the first photoresist pattern by magnetron sputtering to form a second transparent conductive film layer 63.
- ITO indium tin oxide
- Step 10 peeling off the first photoresist pattern and the second transparent conductive film layer directly above the first photoresist pattern to form a common electrode.
- the common electrode includes a plurality of strip-shaped sub-common electrodes 105, and the plurality of strip-shaped sub-pixel electrodes 104 are alternately distributed with the plurality of strip-shaped sub-common electrodes 105, and each of the sub-pixel electrodes 104 and The interval between the sub-common electrodes 105 adjacent thereto is 1-5 ⁇ m.
- the common electrode may be fabricated first, and then the pixel electrode is fabricated.
- a photoresist is deposited over the first transparent conductive film layer, and a region where the common electrode is pre-formed by a patterning process.
- a first photoresist pattern 62 matching the common electrode is formed.
- Forming a common electrode in a region where the common electrode is pre-formed by a patterning process, the common electrode including a plurality of strip-shaped sub-common electrodes 105, and a width of the sub-common electrode 105 is smaller than the first photoresist located above the strip The width of the pattern.
- the pixel electrode includes a plurality of strip-shaped sub-pixel electrodes 104, and the plurality of strip-shaped sub-pixel electrodes 104 are alternately distributed with the plurality of strip-shaped sub-common electrodes 105, and each of the sub-pixel electrodes 104 and The interval between the sub-common electrodes 105 adjacent thereto is 1-5 ⁇ m.
- At least one embodiment of the present invention also provides a display device including the above display substrate.
- an embodiment of the present invention provides a display substrate, a manufacturing method thereof, and a display panel.
- the display substrate includes a substrate substrate, gate lines arranged on the substrate substrate, data lines, and pixel units arranged in a matrix divided by the gate lines and the data lines, in the pixel unit a thin film transistor, a pixel electrode, and a common electrode are disposed; wherein the pixel electrode and the common electrode are insulated from each other, the pixel electrode includes a plurality of strip-shaped sub-pixel electrodes, and the common electrode includes a plurality of strips Sub-sub-electrode electrodes, the plurality of strip-shaped sub-pixel electrodes are alternately distributed with the plurality of strip-shaped sub-common electrodes, and each of the sub-pixel electrodes and a sub-common electrode adjacent thereto The interval between the widths is 1-5 ⁇ m.
- the storage capacitor C st in the large-size liquid crystal display panel can be reduced, thereby ensuring the storage capacitor C st without increasing the size of the thin film transistor.
- the charging rate since it is not necessary to increase the size of the thin film transistor, not only the aperture ratio of the pixel can be improved, but also the thin film transistor can be ensured to have good performance, thereby improving the display quality of the display panel.
- the pixel electrode includes a plurality of strip-shaped sub-pixel electrodes
- the common electrode includes a plurality of strip-shaped sub-common electrodes
- the plurality of strip-shaped sub-pixel electrodes and the plurality of strip-shaped sub-commons are alternately distributed, and the interval width between each of the sub-pixel electrodes and the sub-common electrode adjacent thereto is 1-5 ⁇ m, so that a uniform driving electric field can be generated, thereby driving liquid crystal molecules to deflect to realize image realization, further Improve the display quality of the liquid crystal display panel.
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Abstract
Description
Claims (18)
- 一种显示基板,包括衬底基板、在所述衬底基板上交叉布置的栅线、数据线以及由所述栅线和所述数据线划分出的呈矩阵排列的像素单元,所述像素单元内设置有薄膜晶体管、像素电极和公共电极;其中,所述像素电极和所述公共电极同层绝缘设置,所述像素电极包括多条条状的子像素电极,所述公共电极包括多条条状的子公共电极,所述多条条状的子像素电极与所述多条条状的子公共电极交替分布,每一条所述子像素电极和与之相邻的子公共电极之间的间隔宽度为1-5μm。
- 如权利要求1所述的显示基板,其中,所述子像素电极和所述子公共电极之间的间隔宽度为1-2μm。
- 如权利要求1或2所述的显示基板,其中,所述公共电极还包括用于所述多条条状的子公共电极电连接的第一连接区,所述第一连接区与所述多条条状的子公共电极形成闭合区域,环绕所述像素电极分布。
- 如权利要求1-3任一项所述的显示基板,其中,所述子像素电极和所述子公共电极的宽度均为2-10μm。
- 如权利要求1-4任一项所述的显示基板,其中,所述显示基板还包括公共电极线,所述薄膜晶体管包括栅极、栅绝缘层、有源层、源极和漏极。
- 如权利要求5所述的显示基板,其中,所述栅极和公共电极线同层设置,位于所述衬底基板的上方;所述栅绝缘层位于所述栅极和公共电极线的上方;所述有源层位于所述栅绝缘层的上方;所述源极和漏极位于所述有源层的上方。
- 如权利要求6所述的显示基板,其中,所述公共电极在正投影方向上与所述数据线不重叠。
- 如权利要求7所述的显示基板,其中,所述公共电极上设置有第二连接区;所述公共电极在正投影方向上与至少部分与所述公共电极线重叠,所述公共电极与所述公共电极线通过所述第二连接区与所述公共电极线之间的第一过孔实现电连接。
- 如权利要求8所述的显示基板,其中,所述显示基板还包括设置在所述像素电极和公共电极所在层与所述薄膜晶体管所在层之间的钝化层,所述第一过孔穿过所述第二连接区对应的所述钝化层和所述栅绝缘层。
- 一种显示装置,包括权利要求1-9任一权项所述的显示基板。
- 一种显示基板的制作方法,包括:在衬底基板上形成包括公共电极的图形;在所述包括公共电极的图形的基板上形成包括像素电极的图形;或者,在衬底基板上形成包括像素电极的图形,在所述包括像素电极的图形的基板上形成包括公共电极的图形;其中,所述像素电极和所述公共电极同层绝缘设置,所述像素电极包括多条条状的子像素电极,所述公共电极包括多条条状的子公共电极,所述多条条状的子像素电极与所述多条条状的子公共电极交替分布,每一条所述子像素电极和与之相邻的子公共电极之间的间隔宽度为1-5μm。
- 如权利要求11所述的方法,其中,在所述衬底基板上形成第一透明导电膜层;在所述第一透明导电膜层上方沉积光刻胶,通过构图工艺在预形成第一电极的区域形成与所述第一电极匹配的第一光刻胶图案;通过构图工艺在预形成第一电极的区域形成包括多个条状的子第一电极的第一电极,且所述子第一电极的宽度小于所述位于其上方的第一光刻胶图案的宽度;在所述包括第一光刻胶图案的基板上形成第二透明导电膜层,剥离所述第一光刻胶图案以及位于所述第一光刻胶图案正上方的部分第二透明导电膜层,以形成包括多个条状的子第二电极的第二电极;其中,所述第一电极为公共电极,所述第二电极为像素电极,所述子第一电极为子公共电极,所述子第二电极为子像素电极;或者,所述第一电极为像素电极,所述第二电极为公共电极,所述子第一电极为子像素电极,所述子第二电极为子公共电极。
- 如权利要求11或12所述的方法,其中,所述子像素电极和所述子公共电极之间的间隔宽度为1-2μm。
- 如权利要求12所述的方法,在形成包括所述第一电极的图形之前, 所述方法还包括:在所述衬底基板上采用构图工艺形成包括栅线和公共电极线的图形;在所述包括所述栅线和公共电极线的图形的基板上形成包括栅绝缘层的图形;在所述包括栅绝缘层的图形的基板上形成包括有源层的图形;在所述包括有源层的图形的基板上形成包括数据线、源极和漏极的图形;在所述包括数据线、源极和漏极的图形的基板上形成包括钝化层的图形。
- 如权利要求11所述的方法,其中,形成的所述公共电极还包括用于将所述多条条状的子公共电极电连接的第一连接区,所述第一连接区与所述多条条状的子公共电极形成闭合区域,环绕所述像素电极分布。
- 如权利要求14所述的方法,其中,所述公共电极在正投影方向上与所述数据线不重叠。
- 如权利要求11所述的方法,其中,所述子像素电极和所述子公共电极的宽度均为2-10μm。
- 如权利要求14所述的方法,其中,所述公共电极上还设置有第二连接区;所述公共电极在正投影方向上与至少部分与所述公共电极线重叠,所述公共电极与所述公共电极线通过所述第二连接区与所述公共电极线之间的第一过孔实现电连接。
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CN105826328B (zh) * | 2016-05-03 | 2019-03-05 | 京东方科技集团股份有限公司 | 阵列基板及其制造方法、显示装置 |
CN106887439A (zh) * | 2017-03-21 | 2017-06-23 | 上海中航光电子有限公司 | 阵列基板及其制作方法、显示面板 |
CN106940507B (zh) * | 2017-05-12 | 2020-03-06 | 京东方科技集团股份有限公司 | 阵列基板及其制备方法、显示面板 |
CN107390443B (zh) | 2017-09-05 | 2020-06-02 | 京东方科技集团股份有限公司 | 显示面板和显示装置 |
CN108899331A (zh) * | 2018-07-16 | 2018-11-27 | 京东方科技集团股份有限公司 | 电子纸显示基板及其制作方法、显示装置 |
US11865538B2 (en) * | 2019-03-27 | 2024-01-09 | Beijing Boe Optoelectronics Technology Co., Ltd. | Biological detection chip, biological detection device, and detection method thereof |
CN112175815B (zh) * | 2019-07-05 | 2023-04-11 | 京东方科技集团股份有限公司 | Pcr基板、芯片、系统及液滴拉出方法 |
CN112639598A (zh) * | 2019-07-24 | 2021-04-09 | 京东方科技集团股份有限公司 | 显示基板及显示面板 |
CN111128025B (zh) * | 2019-12-30 | 2021-11-26 | 厦门天马微电子有限公司 | 阵列基板、显示面板及显示装置 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101308294A (zh) * | 2007-05-17 | 2008-11-19 | 乐金显示有限公司 | 面内切换模式液晶显示装置及其制造方法 |
CN102902113A (zh) * | 2011-07-28 | 2013-01-30 | 乐金显示有限公司 | 液晶显示装置 |
CN102902118A (zh) * | 2011-07-30 | 2013-01-30 | 乐金显示有限公司 | 面内转换模式液晶显示器件及其制造方法 |
CN103698950A (zh) * | 2012-09-27 | 2014-04-02 | 乐金显示有限公司 | 液晶显示面板及其制造方法 |
CN105161499A (zh) * | 2015-08-07 | 2015-12-16 | 京东方科技集团股份有限公司 | 一种显示基板及其制作方法和显示装置 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11174491A (ja) * | 1997-12-08 | 1999-07-02 | Nec Corp | アクティブマトリクス型液晶表示装置 |
KR101191442B1 (ko) * | 2004-04-29 | 2012-10-16 | 엘지디스플레이 주식회사 | 박막트랜지스터 어레이 기판 및 그 제조 방법 |
JP5052142B2 (ja) * | 2007-01-16 | 2012-10-17 | 株式会社ジャパンディスプレイイースト | 表示装置 |
KR101289041B1 (ko) * | 2010-03-25 | 2013-07-23 | 엘지디스플레이 주식회사 | 고투과 수평 전계형 액정표시장치 및 그 제조 방법 |
-
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Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101308294A (zh) * | 2007-05-17 | 2008-11-19 | 乐金显示有限公司 | 面内切换模式液晶显示装置及其制造方法 |
CN102902113A (zh) * | 2011-07-28 | 2013-01-30 | 乐金显示有限公司 | 液晶显示装置 |
CN102902118A (zh) * | 2011-07-30 | 2013-01-30 | 乐金显示有限公司 | 面内转换模式液晶显示器件及其制造方法 |
CN103698950A (zh) * | 2012-09-27 | 2014-04-02 | 乐金显示有限公司 | 液晶显示面板及其制造方法 |
CN105161499A (zh) * | 2015-08-07 | 2015-12-16 | 京东方科技集团股份有限公司 | 一种显示基板及其制作方法和显示装置 |
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