WO2017012348A1 - 一种新型具有双凸结构的压电石英晶片及其加工工艺 - Google Patents

一种新型具有双凸结构的压电石英晶片及其加工工艺 Download PDF

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Publication number
WO2017012348A1
WO2017012348A1 PCT/CN2016/074955 CN2016074955W WO2017012348A1 WO 2017012348 A1 WO2017012348 A1 WO 2017012348A1 CN 2016074955 W CN2016074955 W CN 2016074955W WO 2017012348 A1 WO2017012348 A1 WO 2017012348A1
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Prior art keywords
etching
quartz wafer
boss
central member
quartz
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PCT/CN2016/074955
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English (en)
French (fr)
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叶竹之
陆旺
雷晗
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成都泰美克晶体技术有限公司
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Priority to JP2016570247A priority Critical patent/JP2017530569A/ja
Priority to KR1020167032162A priority patent/KR20170022976A/ko
Publication of WO2017012348A1 publication Critical patent/WO2017012348A1/zh

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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/704Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings
    • H10N30/706Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings characterised by the underlying bases, e.g. substrates
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H3/00Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
    • H03H3/007Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
    • H03H3/02Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/01Manufacture or treatment
    • H10N30/05Manufacture of multilayered piezoelectric or electrostrictive devices, or parts thereof, e.g. by stacking piezoelectric bodies and electrodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/01Manufacture or treatment
    • H10N30/06Forming electrodes or interconnections, e.g. leads or terminals
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/20Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators

Definitions

  • the present invention relates to the technical field of piezoelectric quartz wafer construction, and more particularly to a novel piezoelectric quartz wafer having a double convex structure and a processing technique thereof.
  • a quartz crystal resonator is generally composed of a piezoelectric quartz wafer and a package outer casing, wherein the piezoelectric quartz crystal wafer is rectangular or circular, and the outer casing material is ceramic, glass or the like.
  • the electrodes on the upper and lower sides of the piezoelectric quartz wafer are vapor-deposited, and the electrodes are connected to the pedestal pins in the package casing through the leads of the sealed package.
  • the AC voltage can be connected to the upper and lower electrodes of the quartz wafer through the pins, causing the quartz wafer to have an inverse piezoelectric effect, which causes oscillation.
  • Quartz crystal resonators are widely used in the electronics industry such as mobile electronic devices, mobile phones, and mobile communication devices due to their frequency accuracy and stability.
  • Quartz crystal resonators have a lower resonance frequency.
  • the edge effect of the quartz wafer is weakened, and the shape of the quartz wafer needs to be changed.
  • the barrel grinding method is used to change the shape of the quartz wafer, that is, the biconvex surface structure.
  • the cost has always been high. Therefore, the technology of quartz wafers needs to be improved.
  • the object of the present invention is to overcome the shortcomings of the prior art, to provide a low cost, can be used for miniaturizing the mass production of quartz wafers, reducing the parasitic vibration generated by the edges, and enhancing the trapping effect of the center of the quartz wafer, A new piezoelectric quartz wafer with a double convex structure and its processing technology for increasing the consistency of the product.
  • a novel piezoelectric quartz wafer having a double convex structure comprising a central member, a protective frame and a connecting portion, wherein the central member and the protective frame are both rectangular a cavity is disposed in the protection frame, a central member is disposed in the cavity, a top surface of the central member is provided with a boss I, and a bottom surface of the central member is provided with a boss II, and two of the protection frame are long A through groove A is formed between the edge and the two long sides of the central member, and two short sides of the protective frame form a through groove B between the two short sides of the central member, and the through groove A communicates with the through groove B. Any one of the short sides of the protective frame and the central member are connected by a connecting portion, and the connecting portion is disposed in any one of the through grooves B.
  • the boss I and the boss II are circular bosses, rectangular bosses or trapezoidal bosses.
  • the connecting portion has a shape of a rectangle or a trapezoid.
  • the piezoelectric quartz wafer has a length of 0.8 to 3.2 mm.
  • the piezoelectric quartz wafer has a width of 0.6 to 2.5 mm.
  • the material of the central member, the protective frame and the connecting portion are all quartz.
  • a process for processing a piezoelectric quartz wafer comprising the steps of:
  • a uniform thickness of the lithographic anti-etching protective layer ER is formed on the surface of the quartz substrate by spin coating or spraying, and then the surface of the lithographic anti-etching protective layer ER is exposed by photolithography. Forming a pattern to be etched;
  • the surface of the quartz substrate is etched by wet etching, dry etching, laser etching, physical blasting, etc., thereby forming a through groove A and a through groove B;
  • the present invention has the following advantages: (1) The top surface of the central member of the present invention is provided with a boss I, and the bottom surface of the central member is provided with a boss II, and the boss I and the boss II can attenuate the parasitic generated by the edge Vibration, and can enhance the trapping effect at the center of the quartz wafer. (2) The present invention can be used for miniaturizing the mass production of quartz wafers, greatly improving the manufacturing efficiency of wafers and crystals, and improving the consistency. (3) When the protective frame is subjected to external forces, the force is not transmitted to the central member, thus protecting the central member well.
  • Embodiment 1 is a schematic structural view of Embodiment 1 of the present invention.
  • Figure 2 is a plan view of Figure 1;
  • Figure 3 is a cross-sectional view taken along line A-A of Figure 2;
  • Figure 4 is a bottom view of Figure 1;
  • FIG. 5 is a top view of a product based on a quartz substrate processed by a manufacturing process according to an embodiment of the present invention
  • Figure 6 is a bottom view of Figure 5;
  • FIG. 7 is a schematic structural view of a second embodiment of the present invention.
  • Figure 8 is a plan view of Figure 7;
  • Figure 9 is a bottom view of Figure 7;
  • FIG. 10 is a top plan view of a product based on a quartz substrate processed by a manufacturing process according to Embodiment 2 of the present invention.
  • Figure 11 is a bottom plan view of Figure 10;
  • a novel piezoelectric quartz wafer having a double convex structure the quartz wafer adopting an AT cut type, which is generally applied to a quartz crystal resonator in which long sides of the wafer are parallel
  • the X axis is the electrical axis of the quartz crystal
  • the short side is parallel to the Z' axis
  • the thickness direction is parallel to the Y' axis. It is not excluded that the long side of the quartz wafer is parallel to the Z' axis, the width is parallel to the X axis, and the thickness direction is parallel to the Y' axis.
  • the piezoelectric quartz wafer includes the central member 1, the protective frame 2 and the connecting portion 3, and the central member 1,
  • the material of the protective frame 2 and the connecting portion 3 is quartz.
  • the central member 1 and the protective frame 2 are both rectangular.
  • the protective frame 2 is provided with a cavity, and the central member 1 is disposed in the cavity.
  • the top surface of the central member 1 is provided with a boss 14, and the bottom surface of the central member 1 is provided with a boss 115.
  • the boss 14 and the boss 115 can attenuate the parasitic vibration generated by the edge and enhance the trapping effect of the center of the quartz wafer .
  • a through groove A6 is formed between the two long sides of the protective frame 2 and the two long sides of the central member 1. As shown in FIG. 1 to FIG.
  • the two short sides of the protective frame 2 and the two short sides of the central member 1 are formed with a through groove B7, and the through groove A6 communicates with the through groove B7, and any of the protective frames 2 A short side is connected to the central member 1 via a connecting portion 3, and the connecting portion 3 is disposed in any one of the through grooves B7.
  • the boss 14 and the boss 115 are circular bosses, rectangular bosses or trapezoidal bosses.
  • the shape of the connecting portion 3 is rectangular or trapezoidal.
  • the boss 14 and the boss 115 are rectangular bosses, and the connecting portions 3 in this embodiment are all rectangular.
  • the piezoelectric quartz wafer has a length of 0.8 to 3.2 mm, and the length in the embodiment is 1.6 mm, and the piezoelectric quartz wafer has a width of 0.6 to 2.5 mm, and the width in the present example is 1.2.
  • a novel piezoelectric quartz wafer having a double convex structure is processed as follows: [0041] Sl, a quartz substrate 8 of a certain specification is taken out, and the quartz substrate 8 is mounted thereon. The lower surface is ground and polished;
  • a uniform thickness of the lithographic anti-etching protective layer ER is formed on the surface of the quartz substrate 8 by spin coating or spraying, and then lithographically exposed on the lithographic anti-etching protective layer ER. Forming a surface to be etched;
  • Embodiment 2 is a diagrammatic representation of Embodiment 1
  • the second embodiment is different from the first embodiment in that: two short connecting sides of the protective frame 2 and the central member 1 are connected with two connecting portions 3, two The connecting portion 3 increases the mechanical strength between the center member 1 and the frame 2 .

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)

Abstract

本发明公开了一种新型具有双凸结构的压电石英晶片,它包括中央构件(1)、保护框(2)和连接部(3),保护框(2)内设置有型腔,中央构件(1)的顶表面设置有凸台I(4),中央构件(1)的底表面设置有凸台II(5),保护框(2)的两条长边与中央构件(1)的两条长边之间形成有通槽A(6),保护框(2)的两条短边与中央构件(1)的两条短边之间形成有通槽B(7),通槽A(6)与通槽B(7)连通,连接部(3)设置在任意一个通槽B(7)内。本发明的有益效果是:可用于小型化石英晶片批量型生产、减弱边缘产生的寄生振动,并能够增强石英晶片中心的能陷效应、提高加工精度、大幅度提升产品的一致性。

Description

说明书 发明名称:一种新型具有双凸结构的压电石英晶片及其加工工艺 技术领域
[0001] 本发明涉及压电石英晶片构造的技术领域, 特别是一种新型具有双凸结构的压 电石英晶片及其加工工艺。
背景技术
[0002] 目前, 石英晶体谐振器通常由压电石英晶片及封装外壳构成, 其中压电石英晶 片为长方形或圆形, 封装外壳材料为陶瓷、 玻璃等。 压电石英晶片上下两面需 蒸镀电极, 电极通过密封封装的引线, 与封装外壳中的基座引脚相连。 交流电 压可通过引脚连通石英晶片的上下电极, 使石英晶片产生逆压电效应, 从而产 生振荡。 石英晶体谐振器因其频率的准确性和稳定性等特性广泛应用在移动电 子设备、 手机、 移动通信装置等电子行业。
[0003] 随着移动通信电子的迅速发展, 器件小型化需求越来越高, 石英晶体谐振器的 小型化也势在必行。 在石英晶体谐振器小型化的进程中, 传统设计结构已很难 生产, 且成本较高。 传统的切条、 腐蚀等工艺方式难以加工超小型石英晶片, 已经不能满足小型化的要求。
[0004] 石英晶体谐振器的谐振频率较低吋, 为了提高能陷效应, 削弱石英晶片边缘效 应, 需改变石英晶片的外形。 通常情况下, 采用的是滚磨磨削方式, 改变石英 晶片外形, 即双凸曲面结构。 但因滚磨工艺的稳定性差、 重复性低, 所以成本 一直居高不下, 因此, 石英晶片技术亟待提升。
技术问题
[0005] 本发明的目的在于克服现有技术的缺点, 提供一种成本低、 可用于小型化石英 晶片批量型生产、 减弱边缘产生的寄生振动, 并能够增强石英晶片中心的能陷 效应、 大幅度提升产品的一致性的新型具有双凸结构的压电石英晶片及其加工 工艺。
问题的解决方案
技术解决方案 [0006] 本发明的目的通过以下技术方案来实现: 一种新型具有双凸结构的压电石英晶 片, 它包括中央构件、 保护框和连接部, 所述的中央构件和保护框均呈矩形状 , 保护框内设置有型腔, 型腔内设置有中央构件设置在型腔内, 中央构件的顶 表面设置有凸台 I, 中央构件的底表面设置有凸台 II, 保护框的两条长边与中央 构件的两条长边之间形成有通槽 A, 保护框的两条短边与中央构件的两条短边之 间形成有通槽 B, 通槽 A与通槽 B连通, 所述的保护框的任意一条短边与中央构 件之间通过连接部相连接, 连接部设置在任意一个通槽 B内。
[0007] 所述的凸台 I和凸台 II为圆形凸台、 矩形凸台或梯形凸台。
[0008] 所述的连接部的形状为矩形或梯形。
[0009] 所述的压电石英晶片的长度为 0.8~3.2mm。
[0010] 所述的压电石英晶片的宽度为 0.6~2.5mm。
[0011] 所述的中央构件、 保护框和连接部的材质均为石英。
[0012] 一种加工压电石英晶片的工艺, 它包括以下步骤:
[0013] Sl、 取出一定规格的石英基板, 并对石英基板的上、 下表面进行研磨、 抛光处 理;
[0014] S2、 通过旋涂或喷淋方式在石英基板表面形成厚度均匀的光刻抗刻蚀保护层 E R, 然后使用光刻曝光在光刻抗刻蚀保护层 ER上, 在表面形成待刻蚀图形;
[0015] S3、 通过湿法刻蚀或干法刻蚀方式在石英基板上表面刻蚀, 从而在石英基板表 面形成凸台 I和凸台 II, 凸台 I和凸台 II的刻蚀深度通过控制湿法刻蚀或干法刻蚀 反应吋间决定;
[0016] S4、 去除步骤 S3中的光刻抗刻蚀保护层 ER并将石英基板表面清洗干净;
[0017] S5、 清洗结束后, 先通过旋涂或喷淋方式在石英基板表面形成厚度均匀的光刻 抗刻蚀保护层 ER, 再使用光刻曝光在光刻抗刻蚀保护层 ER上表面形成待刻蚀图 形;
[0018] S6、 通过湿法刻蚀、 干法刻蚀、 激光刻蚀、 物理喷砂等方式在石英基板上表面 刻蚀, 从而形成通槽 A和通槽 B ;
[0019] S7、 去除光刻抗刻蚀保护层 ER并将石英基板表面清洗干净, 从而制得具有双 凸结构的压电石英晶片。 [0020] S8、 在石英基板上加工出切割定位孔;
[0021] S9、 使用激光切割或刀片切割沿着切割定位孔对石英基板进行切割分离, 从而 实现了石英晶片的加工。
发明的有益效果
有益效果
[0022] 本发明具有以下优点: (1) 本发明的中央构件的顶表面设置有凸台 I, 中央构 件的底表面设置有凸台 II, 凸台 I和凸台 II能够减弱边缘产生的寄生振动, 并能够 增强石英晶片中心的能陷效应。 (2) 本发明可用于小型化石英晶片批量型生产 、 大幅度提升了晶片和晶体的制造效率, 同吋一致性也得到提升。 (3) 当保护 框受到外界力的作用吋, 力不会传递到中央构件上, 从而很好地保护了中央构 件。
对附图的简要说明
附图说明
[0023] 图 1为本发明实施例一的结构示意图;
[0024] 图 2为图 1的俯视图;
[0025] 图 3为图 2的 A- A剖视图;
[0026] 图 4为图 1的仰视图;
[0027] 图 5为本发明实施例一基于石英基板经制造工艺加工后产品俯视图;
[0028] 图 6为图 5的仰视图;
[0029] 图 7为本发明实施例二的结构示意图;
[0030] 图 8为图 7的俯视图;
[0031] 图 9为图 7的仰视图;
[0032] 图 10为本发明实施例二基于石英基板经制造工艺加工后产品俯视图;
[0033] 图 11为图 10的仰视图;
[0034] 图中, 1-中央构件, 2-保护框, 3-连接部, 4-凸台 I, 5-凸台 II, 6-通槽 A, 7-通 槽 B, 8-石英基板, 9-切割定位孔。 本发明的实施方式
[0035] 下面结合附图对本发明做进一步的描述, 本发明的保护范围不局限于以下所述 [0036] 实施例一:
[0037] 如图 1~4所示, 一种新型具有双凸结构的压电石英晶片, 该石英晶片采用 AT切 型, 此切型普遍应用于石英晶体谐振器中, 其中晶片的长边平行于 X轴, X轴是 石英晶体的电轴, 短边平行于 Z'轴, 厚度方向平行于 Y'轴。 不排除, 石英晶片的 长边平行于 Z'轴, 宽度平行于 X轴, 厚度方向平行于 Y'轴, 该压电石英晶片包括 中央构件 1、 保护框 2和连接部 3, 中央构件 1、 保护框 2和连接部 3的材质均为石 英, 所述的中央构件 1和保护框 2均呈矩形状, 保护框 2内设置有型腔, 型腔内设 置有中央构件 1设置在型腔内, 中央构件 1的顶表面设置有凸台 14, 中央构件 1的 底表面设置有凸台 115, 凸台 14和凸台 115能够减弱边缘产生的寄生振动, 并能够 增强石英晶片中心的能陷效应。 所述的保护框 2的两条长边与中央构件 1的两条 长边之间形成有通槽 A6。 如图 1~4所示, 保护框 2的两条短边与中央构件 1的两条 短边之间形成有通槽 B7, 通槽 A6与通槽 B7连通, 所述的保护框 2的任意一条短 边与中央构件 1之间通过连接部 3相连接, 连接部 3设置在任意一个通槽 B7内。
[0038] 所述的凸台 14和凸台 115为圆形凸台、 矩形凸台或梯形凸台。 所述的连接部 3的 形状为矩形或梯形, 本实施例中凸台 14和凸台 115均为矩形凸台, 本实施例中的 连接部 3均为矩形状。
[0039] 所述的压电石英晶片的长度为 0.8~3.2mm, 本实施例中的长度为 1.6mm, 所述 的压电石英晶片的宽度为 0.6~2.5mm, 本实例中的宽度为 1.2mm, 该石英晶片的 谐振频率为 t=1664/F, t表示石英晶片的厚度, 单位为 μηι; F表示谐振频率, 单位 为 ΜΗζ, 本实例中的石英晶片的谐振频率在 8MHz ~70MHz之间。
[0040] 如图 5和图 6所示, 一种新型具有双凸结构的压电石英晶片, 其加工步骤如下: [0041] Sl、 取出一定规格的石英基板 8, 并对石英基板 8的上、 下表面进行研磨、 抛光 处理;
[0042] S2、 通过旋涂或喷淋方式在石英基板 8表面形成厚度均匀的光刻抗刻蚀保护层 E R, 然后使用光刻曝光在光刻抗刻蚀保护层 ER上, 在表面形成待刻蚀图形; [0043] S3、 通过湿法刻蚀或干法刻蚀方式在石英基板 8上表面刻蚀, 从而在石英基板 8 表面形成凸台 14和凸台 115, 凸台 14和凸台 115的刻蚀深度通过控制湿法刻蚀或干 法刻蚀反应吋间决定;
[0044] S4、 去除步骤 S3中的光刻抗刻蚀保护层 ER并将石英基板 8表面清洗干净;
[0045] S5、 清洗结束后, 先通过旋涂或喷淋方式在石英基板 8表面形成厚度均匀的光 刻抗刻蚀保护层 ER, 再使用光刻曝光在光刻抗刻蚀保护层 ER上表面形成待刻蚀 图形;
[0046] S6、 通过湿法刻蚀、 干法刻蚀、 激光刻蚀、 物理喷砂等方式在石英基板 8上表 面刻蚀, 从而形成通槽 A6和通槽 B7 ;
[0047] S7、 去除光刻抗刻蚀保护层 ER并将石英基板 8表面清洗干净, 从而制得具有双 凸结构的压电石英晶片。
[0048] S8、 在石英基板 8上加工出切割定位孔 9;
[0049] S9、 使用激光切割或刀片切割沿着切割定位孔 9对石英基板 8进行切割分离, 从 而实现了石英晶片的加工。
[0050] 实施例二:
[0051] 如图 7~9所示, 本实施二与实施例一的不同点在于: 所述的保护框 2的任意一条 短边与中央构件 1之间连接有两个连接部 3, 两个连接部 3增加了中央构件 1和与 护框 2之间的机械强度。
[0052] 以上所述仅是本发明的优选实施方式, 应当理解本发明并非局限于本文所披露 的形式, 不应看作是对其他实施例的排除, 而可用于各种其他组合、 修改和环 境, 并能够在本文所述构想范围内, 通过上述教导或相关领域的技术或知识进 行改动。 而本领域人员所进行的改动和变化不脱离本发明的精神和范围, 则都 应在本发明所附权利要求的保护范围内。

Claims

权利要求书
一种新型具有双凸结构的压电石英晶片, 其特征在于: 它包括中央构 件 (1) 、 保护框 (2) 和连接部 (3) , 所述的中央构件 (1) 和保护 框 (2) 均呈矩形状, 保护框 (2) 内设置有型腔, 型腔内设置有中央 构件 (1) 设置在型腔内, 中央构件 (1) 的顶表面设置有凸台 I (4) , 中央构件 (1) 的底表面设置有凸台 II (5) , 保护框 (2) 的两条 长边与中央构件 (1) 的两条长边之间形成有通槽 A (6) , 保护框 ( 2) 的两条短边与中央构件 (1) 的两条短边之间形成有通槽 B (7) , 通槽 A (6) 与通槽 B (7) 连通, 所述的保护框 (2) 的任意一条短 边与中央构件 (1) 之间通过连接部 (3) 相连接, 连接部 (3) 设置 在任意一个通槽 B (7) 内。
根据权利要求 1所述的一种新型具有双凸结构的压电石英晶片, 其特 征在于: 所述的凸台 I (4) 和凸台 II (5) 为圆形凸台、 矩形凸台或梯 形凸台。
根据权利要求 1所述的一种新型具有双凸结构的压电石英晶片, 其特 征在于: 所述的连接部 (3) 的形状为矩形或梯形。
根据权利要求 1所述的一种新型具有双凸结构的压电石英晶片, 其特 征在于: 所述的压电石英晶片的长度为 0.8~3.2mm。
根据权利要求 1所述的一种新型具有双凸结构的压电石英晶片, 其特 征在于: 所述的压电石英晶片的宽度为 0.6~2.5mm。
根据权利要求 1所述的一种新型具有双凸结构的压电石英晶片, 其特 征在于: 所述的中央构件 (1) 、 保护框 (2) 和连接部 (3) 的材质 均为石英。
一种加工压电石英晶片的工艺, 其特征在于: 它包括以下步骤:
51、 取出一定规格的石英基板 (8) , 并对石英基板 (8) 的上、 下表 面进行研磨、 抛光处理;
52、 通过旋涂或喷淋方式在石英基板 (8) 表面形成厚度均匀的光刻 抗刻蚀保护层 ER, 然后使用光刻曝光在光刻抗刻蚀保护层 ER上, 在 表面形成待刻蚀图形;
53、 通过湿法刻蚀或干法刻蚀方式在石英基板 (8) 上表面刻蚀, 从 而在石英基板 (8) 表面形成凸台 I (4) 和凸台 II (5) , 凸台 I (4) 和凸台 II (5) 的刻蚀深度通过控制湿法刻蚀或干法刻蚀反应吋间决 定;
54、 去除步骤 S3中的光刻抗刻蚀保护层 ER并将石英基板 (8) 表面清 洗干净;
55、 清洗结束后, 先通过旋涂或喷淋方式在石英基板 (8) 表面形成 厚度均匀的光刻抗刻蚀保护层 ER, 再使用光刻曝光在光刻抗刻蚀保 护层 ER上表面形成待刻蚀图形;
56、 通过湿法刻蚀、 干法刻蚀、 激光刻蚀、 物理喷砂等方式在石英基 板 (8) 上表面刻蚀, 从而形成通槽 A (6) 和通槽 B (7) ;
57、 去除光刻抗刻蚀保护层 ER并将石英基板 (8) 表面清洗干净, 从 而制得具有双凸结构的压电石英晶片。
[权利要求 8] S8、 在石英基板 (8) 上加工出切割定位孔 (9
S9、 使用激光切割或刀片切割沿着切割定位孔 (9) 对石英基板 (8 进行切割分离, 从而实现了石英晶片的加工。
PCT/CN2016/074955 2015-07-22 2016-02-29 一种新型具有双凸结构的压电石英晶片及其加工工艺 WO2017012348A1 (zh)

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