WO2017012348A1 - 一种新型具有双凸结构的压电石英晶片及其加工工艺 - Google Patents
一种新型具有双凸结构的压电石英晶片及其加工工艺 Download PDFInfo
- Publication number
- WO2017012348A1 WO2017012348A1 PCT/CN2016/074955 CN2016074955W WO2017012348A1 WO 2017012348 A1 WO2017012348 A1 WO 2017012348A1 CN 2016074955 W CN2016074955 W CN 2016074955W WO 2017012348 A1 WO2017012348 A1 WO 2017012348A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- etching
- quartz wafer
- boss
- central member
- quartz
- Prior art date
Links
- 239000010453 quartz Substances 0.000 title claims abstract description 101
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 title claims abstract description 101
- 238000012545 processing Methods 0.000 title claims description 11
- 239000000758 substrate Substances 0.000 claims description 36
- 238000005530 etching Methods 0.000 claims description 28
- 230000001681 protective effect Effects 0.000 claims description 19
- 239000011241 protective layer Substances 0.000 claims description 18
- 238000005520 cutting process Methods 0.000 claims description 12
- 238000001312 dry etching Methods 0.000 claims description 9
- 238000000034 method Methods 0.000 claims description 9
- 238000001039 wet etching Methods 0.000 claims description 9
- 238000004140 cleaning Methods 0.000 claims description 6
- 238000004528 spin coating Methods 0.000 claims description 6
- 238000005507 spraying Methods 0.000 claims description 6
- 238000005422 blasting Methods 0.000 claims description 3
- 238000003698 laser cutting Methods 0.000 claims description 3
- 238000010329 laser etching Methods 0.000 claims description 3
- 235000012431 wafers Nutrition 0.000 abstract description 45
- 239000013078 crystal Substances 0.000 abstract description 10
- 230000000694 effects Effects 0.000 abstract description 8
- 230000003071 parasitic effect Effects 0.000 abstract description 4
- 230000009286 beneficial effect Effects 0.000 abstract description 2
- 238000010923 batch production Methods 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000010295 mobile communication Methods 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/704—Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings
- H10N30/706—Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings characterised by the underlying bases, e.g. substrates
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
- H10N30/05—Manufacture of multilayered piezoelectric or electrostrictive devices, or parts thereof, e.g. by stacking piezoelectric bodies and electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
- H10N30/06—Forming electrodes or interconnections, e.g. leads or terminals
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/20—Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators
Definitions
- the present invention relates to the technical field of piezoelectric quartz wafer construction, and more particularly to a novel piezoelectric quartz wafer having a double convex structure and a processing technique thereof.
- a quartz crystal resonator is generally composed of a piezoelectric quartz wafer and a package outer casing, wherein the piezoelectric quartz crystal wafer is rectangular or circular, and the outer casing material is ceramic, glass or the like.
- the electrodes on the upper and lower sides of the piezoelectric quartz wafer are vapor-deposited, and the electrodes are connected to the pedestal pins in the package casing through the leads of the sealed package.
- the AC voltage can be connected to the upper and lower electrodes of the quartz wafer through the pins, causing the quartz wafer to have an inverse piezoelectric effect, which causes oscillation.
- Quartz crystal resonators are widely used in the electronics industry such as mobile electronic devices, mobile phones, and mobile communication devices due to their frequency accuracy and stability.
- Quartz crystal resonators have a lower resonance frequency.
- the edge effect of the quartz wafer is weakened, and the shape of the quartz wafer needs to be changed.
- the barrel grinding method is used to change the shape of the quartz wafer, that is, the biconvex surface structure.
- the cost has always been high. Therefore, the technology of quartz wafers needs to be improved.
- the object of the present invention is to overcome the shortcomings of the prior art, to provide a low cost, can be used for miniaturizing the mass production of quartz wafers, reducing the parasitic vibration generated by the edges, and enhancing the trapping effect of the center of the quartz wafer, A new piezoelectric quartz wafer with a double convex structure and its processing technology for increasing the consistency of the product.
- a novel piezoelectric quartz wafer having a double convex structure comprising a central member, a protective frame and a connecting portion, wherein the central member and the protective frame are both rectangular a cavity is disposed in the protection frame, a central member is disposed in the cavity, a top surface of the central member is provided with a boss I, and a bottom surface of the central member is provided with a boss II, and two of the protection frame are long A through groove A is formed between the edge and the two long sides of the central member, and two short sides of the protective frame form a through groove B between the two short sides of the central member, and the through groove A communicates with the through groove B. Any one of the short sides of the protective frame and the central member are connected by a connecting portion, and the connecting portion is disposed in any one of the through grooves B.
- the boss I and the boss II are circular bosses, rectangular bosses or trapezoidal bosses.
- the connecting portion has a shape of a rectangle or a trapezoid.
- the piezoelectric quartz wafer has a length of 0.8 to 3.2 mm.
- the piezoelectric quartz wafer has a width of 0.6 to 2.5 mm.
- the material of the central member, the protective frame and the connecting portion are all quartz.
- a process for processing a piezoelectric quartz wafer comprising the steps of:
- a uniform thickness of the lithographic anti-etching protective layer ER is formed on the surface of the quartz substrate by spin coating or spraying, and then the surface of the lithographic anti-etching protective layer ER is exposed by photolithography. Forming a pattern to be etched;
- the surface of the quartz substrate is etched by wet etching, dry etching, laser etching, physical blasting, etc., thereby forming a through groove A and a through groove B;
- the present invention has the following advantages: (1) The top surface of the central member of the present invention is provided with a boss I, and the bottom surface of the central member is provided with a boss II, and the boss I and the boss II can attenuate the parasitic generated by the edge Vibration, and can enhance the trapping effect at the center of the quartz wafer. (2) The present invention can be used for miniaturizing the mass production of quartz wafers, greatly improving the manufacturing efficiency of wafers and crystals, and improving the consistency. (3) When the protective frame is subjected to external forces, the force is not transmitted to the central member, thus protecting the central member well.
- Embodiment 1 is a schematic structural view of Embodiment 1 of the present invention.
- Figure 2 is a plan view of Figure 1;
- Figure 3 is a cross-sectional view taken along line A-A of Figure 2;
- Figure 4 is a bottom view of Figure 1;
- FIG. 5 is a top view of a product based on a quartz substrate processed by a manufacturing process according to an embodiment of the present invention
- Figure 6 is a bottom view of Figure 5;
- FIG. 7 is a schematic structural view of a second embodiment of the present invention.
- Figure 8 is a plan view of Figure 7;
- Figure 9 is a bottom view of Figure 7;
- FIG. 10 is a top plan view of a product based on a quartz substrate processed by a manufacturing process according to Embodiment 2 of the present invention.
- Figure 11 is a bottom plan view of Figure 10;
- a novel piezoelectric quartz wafer having a double convex structure the quartz wafer adopting an AT cut type, which is generally applied to a quartz crystal resonator in which long sides of the wafer are parallel
- the X axis is the electrical axis of the quartz crystal
- the short side is parallel to the Z' axis
- the thickness direction is parallel to the Y' axis. It is not excluded that the long side of the quartz wafer is parallel to the Z' axis, the width is parallel to the X axis, and the thickness direction is parallel to the Y' axis.
- the piezoelectric quartz wafer includes the central member 1, the protective frame 2 and the connecting portion 3, and the central member 1,
- the material of the protective frame 2 and the connecting portion 3 is quartz.
- the central member 1 and the protective frame 2 are both rectangular.
- the protective frame 2 is provided with a cavity, and the central member 1 is disposed in the cavity.
- the top surface of the central member 1 is provided with a boss 14, and the bottom surface of the central member 1 is provided with a boss 115.
- the boss 14 and the boss 115 can attenuate the parasitic vibration generated by the edge and enhance the trapping effect of the center of the quartz wafer .
- a through groove A6 is formed between the two long sides of the protective frame 2 and the two long sides of the central member 1. As shown in FIG. 1 to FIG.
- the two short sides of the protective frame 2 and the two short sides of the central member 1 are formed with a through groove B7, and the through groove A6 communicates with the through groove B7, and any of the protective frames 2 A short side is connected to the central member 1 via a connecting portion 3, and the connecting portion 3 is disposed in any one of the through grooves B7.
- the boss 14 and the boss 115 are circular bosses, rectangular bosses or trapezoidal bosses.
- the shape of the connecting portion 3 is rectangular or trapezoidal.
- the boss 14 and the boss 115 are rectangular bosses, and the connecting portions 3 in this embodiment are all rectangular.
- the piezoelectric quartz wafer has a length of 0.8 to 3.2 mm, and the length in the embodiment is 1.6 mm, and the piezoelectric quartz wafer has a width of 0.6 to 2.5 mm, and the width in the present example is 1.2.
- a novel piezoelectric quartz wafer having a double convex structure is processed as follows: [0041] Sl, a quartz substrate 8 of a certain specification is taken out, and the quartz substrate 8 is mounted thereon. The lower surface is ground and polished;
- a uniform thickness of the lithographic anti-etching protective layer ER is formed on the surface of the quartz substrate 8 by spin coating or spraying, and then lithographically exposed on the lithographic anti-etching protective layer ER. Forming a surface to be etched;
- Embodiment 2 is a diagrammatic representation of Embodiment 1
- the second embodiment is different from the first embodiment in that: two short connecting sides of the protective frame 2 and the central member 1 are connected with two connecting portions 3, two The connecting portion 3 increases the mechanical strength between the center member 1 and the frame 2 .
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016570247A JP2017530569A (ja) | 2015-07-22 | 2016-02-29 | 両面凸構造を有する新たな圧電石英チップ及びその加工プロセス |
KR1020167032162A KR20170022976A (ko) | 2015-07-22 | 2016-02-29 | 양면이 볼록 구조를 갖는 신형 압전 석영 웨이퍼 및 그 가공공정 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201510433212.3A CN104993797A (zh) | 2015-07-22 | 2015-07-22 | 一种新型具有双凸结构的压电石英晶片及其加工工艺 |
CN201510433212.3 | 2015-07-22 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2017012348A1 true WO2017012348A1 (zh) | 2017-01-26 |
Family
ID=54305562
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/CN2016/074955 WO2017012348A1 (zh) | 2015-07-22 | 2016-02-29 | 一种新型具有双凸结构的压电石英晶片及其加工工艺 |
Country Status (5)
Country | Link |
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JP (1) | JP2017530569A (zh) |
KR (1) | KR20170022976A (zh) |
CN (1) | CN104993797A (zh) |
TW (1) | TWI591868B (zh) |
WO (1) | WO2017012348A1 (zh) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104993797A (zh) * | 2015-07-22 | 2015-10-21 | 成都泰美克晶体技术有限公司 | 一种新型具有双凸结构的压电石英晶片及其加工工艺 |
CN110224681B (zh) * | 2019-07-09 | 2024-01-26 | 成都泰美克晶体技术有限公司 | 一种短h型结构的高频抛光石英晶片 |
CN110224684B (zh) * | 2019-07-09 | 2024-01-30 | 成都泰美克晶体技术有限公司 | 一种凸块结构的高频抛光石英晶片 |
CN110224683B (zh) * | 2019-07-09 | 2024-02-02 | 成都泰美克晶体技术有限公司 | 一种长h型结构的高频抛光石英晶片 |
CN111252728B (zh) * | 2020-01-22 | 2023-03-28 | 上海应用技术大学 | 一种mems压电装置的批量加工方法 |
CN114770781B (zh) * | 2022-06-22 | 2022-10-14 | 成都泰美克晶体技术有限公司 | 一种sc晶片改弦定位装置及其使用方法 |
Citations (3)
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CN203788250U (zh) * | 2014-03-21 | 2014-08-20 | 浙江东晶电子股份有限公司 | 一种smt低频小型玻璃封焊晶体谐振器 |
CN204465477U (zh) * | 2015-03-17 | 2015-07-08 | 浙江东晶电子股份有限公司 | 一种低频小型晶体谐振器 |
CN104993797A (zh) * | 2015-07-22 | 2015-10-21 | 成都泰美克晶体技术有限公司 | 一种新型具有双凸结构的压电石英晶片及其加工工艺 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2006238263A (ja) * | 2005-02-28 | 2006-09-07 | Seiko Epson Corp | 圧電振動片、及び圧電振動子 |
JP2009071640A (ja) * | 2007-09-14 | 2009-04-02 | Epson Toyocom Corp | 圧電振動素板のベベル加工方法、圧電振動片、及び圧電振動子 |
JP5625432B2 (ja) * | 2010-03-26 | 2014-11-19 | セイコーエプソン株式会社 | 圧電振動素子、及び圧電振動子 |
JP5797961B2 (ja) * | 2011-07-21 | 2015-10-21 | 日本電波工業株式会社 | 圧電振動片及び圧電デバイス |
JP2013062579A (ja) * | 2011-09-12 | 2013-04-04 | Nippon Dempa Kogyo Co Ltd | 圧電デバイス及び圧電デバイスの製造方法 |
JP5957997B2 (ja) * | 2012-03-21 | 2016-07-27 | セイコーエプソン株式会社 | 振動素子、振動子、電子デバイス、発振器、及び電子機器 |
JP6017189B2 (ja) * | 2012-06-12 | 2016-10-26 | 日本電波工業株式会社 | 圧電振動片及び圧電デバイス |
JP2014090290A (ja) * | 2012-10-30 | 2014-05-15 | Seiko Epson Corp | 振動片、振動デバイス、電子機器及び移動体 |
JP5573991B2 (ja) * | 2013-02-20 | 2014-08-20 | セイコーエプソン株式会社 | 接合用ウェハ |
JP2015019240A (ja) * | 2013-07-11 | 2015-01-29 | 日本電波工業株式会社 | 圧電振動片、圧電振動片の製造方法、圧電デバイス、及び圧電デバイスの製造方法 |
CN204836102U (zh) * | 2015-07-22 | 2015-12-02 | 成都泰美克晶体技术有限公司 | 一种新型具有双凸结构的压电石英晶片 |
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2015
- 2015-07-22 CN CN201510433212.3A patent/CN104993797A/zh active Pending
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2016
- 2016-02-29 JP JP2016570247A patent/JP2017530569A/ja active Pending
- 2016-02-29 WO PCT/CN2016/074955 patent/WO2017012348A1/zh active Application Filing
- 2016-02-29 KR KR1020167032162A patent/KR20170022976A/ko not_active Application Discontinuation
- 2016-07-22 TW TW105123165A patent/TWI591868B/zh active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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CN203788250U (zh) * | 2014-03-21 | 2014-08-20 | 浙江东晶电子股份有限公司 | 一种smt低频小型玻璃封焊晶体谐振器 |
CN204465477U (zh) * | 2015-03-17 | 2015-07-08 | 浙江东晶电子股份有限公司 | 一种低频小型晶体谐振器 |
CN104993797A (zh) * | 2015-07-22 | 2015-10-21 | 成都泰美克晶体技术有限公司 | 一种新型具有双凸结构的压电石英晶片及其加工工艺 |
Also Published As
Publication number | Publication date |
---|---|
CN104993797A (zh) | 2015-10-21 |
JP2017530569A (ja) | 2017-10-12 |
TW201705561A (zh) | 2017-02-01 |
TWI591868B (zh) | 2017-07-11 |
KR20170022976A (ko) | 2017-03-02 |
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