WO2016108624A1 - 모듈형 컨버터의 커패시터 상태진단방법 - Google Patents
모듈형 컨버터의 커패시터 상태진단방법 Download PDFInfo
- Publication number
- WO2016108624A1 WO2016108624A1 PCT/KR2015/014492 KR2015014492W WO2016108624A1 WO 2016108624 A1 WO2016108624 A1 WO 2016108624A1 KR 2015014492 W KR2015014492 W KR 2015014492W WO 2016108624 A1 WO2016108624 A1 WO 2016108624A1
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- WO
- WIPO (PCT)
- Prior art keywords
- capacitor
- input voltage
- fit
- temperature
- modular converter
- Prior art date
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/16571—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/64—Testing of capacitors
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
- G06F17/10—Complex mathematical operations
- G06F17/18—Complex mathematical operations for evaluating statistical data, e.g. average values, frequency distributions, probability functions, regression analysis
-
- G—PHYSICS
- G08—SIGNALLING
- G08B—SIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS
- G08B3/00—Audible signalling systems; Audible personal calling systems
- G08B3/10—Audible signalling systems; Audible personal calling systems using electric transmission; using electromagnetic transmission
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2817—Environmental-, stress-, or burn-in tests
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
Definitions
- the present invention relates to a method for diagnosing a state of a capacitor, and in particular, to diagnose a state of a corresponding capacitor by extracting a mean failure time (MTBF) of a capacitor by using the cumulative average value of the input voltage and the temperature of the capacitor constituting the modular converter.
- the present invention relates to a method for diagnosing capacitor state of a modular converter.
- HVDC high voltage direct current
- STATCOM static synchronous compensators
- High-priced passive electric devices such as large capacity capacitors or discharge resistors are used in the modular converter. Although the life of the device itself is determined by these parts, it is difficult to actively determine the state of the parts due to the characteristics of the passive devices.
- Japanese Patent No. 4011016 discloses a technique for determining capacitance from a measurement result of mounting a device for measuring voltage, current, and ambient temperature in a power supply device to which a capacitor is applied, and measuring the life of the capacitor. Is disclosed. However, in Japanese Patent No. 4011016, the internal resistance of the capacitor is additionally considered, and since the internal resistance changes from time to time according to the use environment, there is a problem that it is difficult to determine a practically accurate life.
- Korean Patent No. 10-1133478 discloses a discharge compensation time required for each power compensator for a discharge time that a capacitor formed by a capacitor can discharge while outputting a rated power or a load required power (rated power).
- the present invention provides a device for diagnosing the residual life of a capacitor for diagnosing the remaining life in which a capacitor configured by a capacitor can be used under a state in which an output time is possible).
- a disadvantage in that the life of the accumulator can be determined only under the condition that the rated compensation time is exceeded.
- the present invention measures the input voltage and temperature of the capacitor in order to diagnose the state of the capacitor applied to the modular converter, and calculates the mean failure time (MTBF) using the cumulative average value of these measurements to diagnose the state of the capacitor.
- the purpose of the present invention is to provide a method for diagnosing capacitor state of a modular converter.
- MTBF average failure time
- the table determining step may include determining an FIT value according to an input voltage and a temperature for a capacitor for each of the plurality of sample modular converters; Generating a FIT graph from the determined FIT value for each of the sample modular converters; Extracting a FIT value corresponding to a preset range of the input voltage and temperature from the FIT graph and setting the FIT table; It includes.
- the method may further include generating an alarm when the MTBF of the extracted capacitor arrives.
- the input voltage and temperature of the high voltage are measured, and the average failure time (MTBF) is calculated using the cumulative average value of each of these measured values. Extraction can increase the reliability of the capacitor's status diagnosis.
- the maintenance time of the capacitor can be accurately predicted.
- FIG. 1 is a block diagram of a capacitor state diagnosis apparatus of a modular converter according to the present invention
- FIG. 2 is a graph illustrating a process of generating an FIT according to the present invention
- FIG. 3 is a flow chart showing a method for diagnosing a capacitor state of a modular converter according to the present invention.
- first, second, A, B, (a), and (b) may be used. These terms are only to distinguish the components from other components, and the nature, order, order, etc. of the components are not limited by the terms. If a component is described as being “connected”, “coupled” or “connected” to another component, that component may be directly connected or connected to that other component, but there may be another component between each component. It will be understood that may be “connected”, “coupled” or “connected”.
- FIG. 1 is a block diagram of a capacitor state diagnosis apparatus of a modular converter according to an embodiment of the present invention.
- a modular converter according to an embodiment of the present invention may be applied to, for example, an HVDC system or a STATCOM device.
- the modular converter receives a high input voltage and stores it in an internal capacitor.
- the capacitor state diagnosis device of the present invention diagnoses a state of such a capacitor.
- an input voltage detector 110 for detecting an input voltage input to a capacitor and a temperature detector for contacting or non-contacting the capacitor to detect the temperature of the capacitor ( 120 and an operation unit 130 that receives input voltages and temperatures of capacitors detected by the input voltage detector 110 and the temperature detector 120, respectively, accumulate them for a predetermined time period, and calculate a cumulative average value of the accumulated values.
- a controller 140 for extracting the mean failure time (MTBF) from the cumulative average value.
- the input voltage pre-detection 110 detects an input voltage input to the capacitor from the front end to the capacitor.
- the input voltage refers to the magnitude of the voltage supplied to the capacitor, unlike the charging voltage of the capacitor.
- the temperature detector 120 measures the temperature of the capacitor in contact with the capacitor or detects the temperature of the capacitor or its ambient temperature in a non-contact manner with the capacitor.
- the present invention uses a FIT (Failure In Time) table for the modular converter to extract the average failure time (MTBF) of the capacitor from the cumulative average value of the input voltage and temperature.
- This FIT table is a table that defines the FIT value according to the temperature and input voltage of the capacitor of the same product as the modular converter to diagnose the condition of the capacitor.
- the FIT value defines the time when a failure occurs in the capacitor of the modular converter. That is, it means a failure occurrence time determined according to the temperature and the input voltage of the capacitor of the modular converter.
- the FIT table may be determined based on, for example, product reliability data of a capacitor manufactured by a manufacturer, or in another example, the temperature and input voltage of the same modular converter may be measured through several experiments, and the measured value may be determined. By measuring the time of failure, the FIT table can be set according to the capacitor temperature and input voltage of the modular converter.
- the cumulative average value of the temperature and the input voltage of the capacitor of the modular converter is calculated.
- the FIT value is extracted by applying the FIT table to extract the MTBF corresponding to the FIT value.
- Mean Time Between Failure MTBF
- the MTBF is one of the indicators indicating the reliability of parts, devices, or systems. The longer the MTBF, the higher the reliability.
- the present embodiment may further include an alarm generating unit 150, the alarm generating unit 150 is determined that the average failure time (MTBF) of the capacitor extracted by the controller 140 has arrived when the alarm arrives Try to generate sound. This is to perform repairs, replacements, checks, etc. with alarm sound when the average failure time of the capacitor is reached.
- MTBF average failure time
- FIG. 2 is a graph illustrating a process of generating an FIT table according to the present invention.
- a plurality of sample modular converters are provided, and the FIT value according to the temperature and the input voltage of the capacitor of each sample modular converter is determined.
- the controller 140 generates a two-dimensional graph in which the temperature and the input voltage are X-Y axes using a predetermined program from a plurality of FIT values. From this graph, the FIT table is generated according to the capacitor temperature and the input voltage range. 2 shows an example of an FIT table for a temperature range of 55 ° C. to 85 ° C. and a range of input voltage 15 ° C. to 27 mA. This range may vary depending on the capacitance of the capacitor to be measured.
- FIG. 3 is a flowchart illustrating a method for diagnosing a capacitor state of a modular converter according to the present invention.
- a method for diagnosing a capacitor state of a modular converter according to the present invention is to diagnose a capacitor state of a modular converter applied to, for example, an HVDC system or a STATCOM device.
- the FIT table according to the input voltage and the temperature of the capacitor is set for the plurality of sample modular converters (S101).
- the FIT value is determined according to the input voltage and the temperature for the capacitor for each of the plurality of sample modular converters, and the FIT graph is generated from the FIT values for each of the sample modular converters.
- the input voltage detection unit 110 detects the input voltage of the capacitor for a predetermined period for the measurement target modular converter to diagnose the state of the capacitor (S103) and the temperature detection unit 120 to diagnose.
- the temperature of the capacitor is detected at each cycle (S105).
- the steps S103 and S105 may be set in any order, and may be performed simultaneously.
- the calculating unit 130 calculates a cumulative average value of input voltages and temperatures of the plurality of capacitors detected at each cycle (S107).
- the cumulative average value is an arithmetic mean obtained by accumulating the input voltage value and the temperature value detected at each set period.
- the controller 140 selects the FIT value corresponding to the calculated cumulative average value from the FIT table set in step S101 (S109).
- the controller 140 extracts an average failure time MTBF of the capacitor from the selected FIT value (S111).
- the method may further include a step (S115) of generating an alarm sound when it is determined whether the average failure time (MTBF) of the extracted capacitor arrives (S113). This is to perform an operation such as repair, replacement, and check through an alarm when the extracted MTBF is reached while using a capacitor.
- a failure rate ⁇ for the plurality of sample modular converters is calculated.
- This failure rate ⁇ is calculated by the following equation.
- N N 0 ⁇ e - ⁇ t
- N 0 is the number of sample modular converters
- N is the number of modular converters that remained normal after the experiment
- ⁇ is the failure rate
- t is the experimental time.
- the failure rate ⁇ may be calculated by using the number of modular converters that remain normally after a predetermined time t has elapsed from the number of sample modular converters.
- MTBF is extracted from the failure rate ⁇ calculated as described above and the selected FIT value by using Equation 2 below.
- the mean failure time (MTBF) calculated as described above is a criterion for determining how long the capacitors of the corresponding modular converter will cause a failure. Therefore, the present invention can diagnose the state of the current capacitor using the mean failure time (MTBF), and when the mean failure time (MTBF) arrives in the modular converter by performing a process such as maintenance, inspection, or replacement It is possible to prevent an accident due to a capacitor failure in advance.
- MTBF mean failure time
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- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Data Mining & Analysis (AREA)
- Mathematical Optimization (AREA)
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- Mathematical Physics (AREA)
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- Testing Electric Properties And Detecting Electric Faults (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
Description
Claims (4)
- 다수의 샘플 모듈형 컨버터에 대하여 내부의 커패시터의 입력전압 및 온도에 따른 FIT 테이블을 결정하는 테이블 결정단계;입력전압검출부에서 커패시터의 상태를 진단하고자 하는 측정대상 모듈형 컨버터에서 커패시터의 입력전압을 기설정된 주기에 검출하는 입력전압 검출단계;온도검출부에서 상기 측정대상 모듈형 컨버터의 커패시터의 온도를 상기 주기에 따라 검출하는 온도검출단계;상기 주기동안 상기 입력전압검출부 및 온도검출부에서 각각 검출된 커패시터의 입력전압 및 온도에 대한 누적평균값을 연산하는 누적평균값 연산단계;제어부에서 상기 연산된 입력전압 및 온도 누적평균값에 대응하는 FIT값을 상기 FIT 테이블에서 선택하는 선택단계; 및상기 FIT값으로부터 상기 커패시터의 평균고장시간(MTBF)을 추출하는 추출단계; 를 포함하는 모듈형 컨버터의 커패시터 상태진단방법.
- 제1항에 있어서, 상기 테이블 결정단계는,상기 다수의 샘플 모듈형 컨버터마다 커패시터에 대한 입력전압 및 온도에 따른 FIT 값을 결정하는 단계;상기 결정된 샘플 모듈형 컨버터별 FIT 값로부터 FIT 그래프를 생성하는 단계; 및상기 FIT 그래프로부터 상기 입력전압 및 온도의 기설정된 범위에 대응하는 FIT값을 추출하여 FIT 테이블이 설정하는 단계; 를 포함하는 모듈형 컨버터의 커패시터 상태진단방법.
- 제1항에 있어서, 상기 평균고장시간(MTBF)의 추출단계는,상기 다수의 샘플 모듈형 컨버터에 대한 고장률(λ)을 (N = N0 × e-λt)로부터 계산하는 단계; 및상기 고장률(λ)과 FIT값으로부터 (MTBF = λ× FIT값)을 이용하여 상기 평균고장시간(MTBF)를 추출하는 단계; 를 포함하는 모듈형 컨버터의 커패시터 상태진단방법.
- 제1항에 있어서, 상기 평균고장시간(MTBF)의 추출단계 이후에,상기 추출된 커패시터의 평균고장시간(MTBF)이 도래한 경우 경보음을 발생시키는 단계를 더 포함하는 모듈형 컨버터의 커패시터 상태진단방법.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
BR112017014139-6A BR112017014139A2 (pt) | 2014-12-31 | 2015-12-30 | método para diagnosticar o estado de capacitor no conversor modular |
US15/538,029 US20180003745A1 (en) | 2014-12-31 | 2015-12-30 | Method for diagnosing state of capacitor in modular converter |
EP15875718.7A EP3242138A4 (en) | 2014-12-31 | 2015-12-30 | Method for diagnosing state of capacitor in modular converter |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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KR10-2014-0195574 | 2014-12-31 | ||
KR1020140195574A KR101651883B1 (ko) | 2014-12-31 | 2014-12-31 | 모듈형 컨버터의 커패시터 상태진단방법 |
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WO2016108624A1 true WO2016108624A1 (ko) | 2016-07-07 |
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PCT/KR2015/014492 WO2016108624A1 (ko) | 2014-12-31 | 2015-12-30 | 모듈형 컨버터의 커패시터 상태진단방법 |
Country Status (5)
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US (1) | US20180003745A1 (ko) |
EP (1) | EP3242138A4 (ko) |
KR (1) | KR101651883B1 (ko) |
BR (1) | BR112017014139A2 (ko) |
WO (1) | WO2016108624A1 (ko) |
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DE102018114092B4 (de) * | 2018-06-13 | 2021-04-29 | Infineon Technologies Ag | Verfahren, Vorrichtungen und Systeme zur Überwachung von Datenwandlern welche einen Kalibrierungsdatensatz aufweisen |
US11209808B2 (en) | 2019-05-21 | 2021-12-28 | At&T Intellectual Property I, L.P. | Systems and method for management and allocation of network assets |
FR3104727B1 (fr) | 2019-12-13 | 2021-12-24 | Commissariat Energie Atomique | Surveillance du vieillissement d’un composant |
KR102219058B1 (ko) * | 2020-09-25 | 2021-02-24 | 서일대학교산학협력단 | Mmc의 수명 진단방법 |
KR102433860B1 (ko) | 2021-01-28 | 2022-08-18 | 최종관 | Led 모듈의 자기진단 절약형 컨버터 회로 장치 |
KR102289106B1 (ko) * | 2021-06-09 | 2021-08-12 | 탑아이티 주식회사 | Led 전광판 시스템 |
KR20240072067A (ko) | 2022-11-16 | 2024-05-23 | (주) 오키 | 순간정전보상장치 및 이의 수명예측방법 |
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JPS6148848A (ja) | 1984-08-17 | 1986-03-10 | Fuji Photo Film Co Ltd | カラ−写真感光材料 |
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2014
- 2014-12-31 KR KR1020140195574A patent/KR101651883B1/ko active IP Right Grant
-
2015
- 2015-12-30 BR BR112017014139-6A patent/BR112017014139A2/pt not_active Application Discontinuation
- 2015-12-30 EP EP15875718.7A patent/EP3242138A4/en not_active Withdrawn
- 2015-12-30 US US15/538,029 patent/US20180003745A1/en not_active Abandoned
- 2015-12-30 WO PCT/KR2015/014492 patent/WO2016108624A1/ko active Application Filing
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JP2004037258A (ja) * | 2002-07-03 | 2004-02-05 | Toshiba Corp | フィルムコンデンサの劣化診断装置 |
JP2005168261A (ja) * | 2003-12-05 | 2005-06-23 | Toshiba Corp | 電気二重層キャパシタシステムの監視装置及び電気二重層キャパシタの余寿命予測方法 |
JP2008070296A (ja) * | 2006-09-15 | 2008-03-27 | Power System:Kk | キャパシタ電源の寿命推定評価システム |
JP2008268042A (ja) * | 2007-04-23 | 2008-11-06 | Power System:Kk | キャパシタ電源の異常判別方法及び異常判別装置 |
KR20110010101A (ko) * | 2008-06-06 | 2011-01-31 | 메이덴샤 코포레이션 | 커패시터의 잔여수명 진단 장치 및 잔여수명 진단 장치를 구비한 전력 보상 장치 |
Non-Patent Citations (1)
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See also references of EP3242138A4 * |
Also Published As
Publication number | Publication date |
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KR20160081571A (ko) | 2016-07-08 |
BR112017014139A2 (pt) | 2018-03-06 |
EP3242138A4 (en) | 2018-10-17 |
EP3242138A1 (en) | 2017-11-08 |
KR101651883B1 (ko) | 2016-08-29 |
US20180003745A1 (en) | 2018-01-04 |
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