BR112017014139A2 - método para diagnosticar o estado de capacitor no conversor modular - Google Patents

método para diagnosticar o estado de capacitor no conversor modular

Info

Publication number
BR112017014139A2
BR112017014139A2 BR112017014139-6A BR112017014139A BR112017014139A2 BR 112017014139 A2 BR112017014139 A2 BR 112017014139A2 BR 112017014139 A BR112017014139 A BR 112017014139A BR 112017014139 A2 BR112017014139 A2 BR 112017014139A2
Authority
BR
Brazil
Prior art keywords
capacitor
input voltage
temperature
modular converter
diagnosing
Prior art date
Application number
BR112017014139-6A
Other languages
English (en)
Inventor
Hoon Oh Jae
Jin Seo Jae
Original Assignee
Hyosung Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hyosung Corporation filed Critical Hyosung Corporation
Publication of BR112017014139A2 publication Critical patent/BR112017014139A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/16571—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/64—Testing of capacitors
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G06F17/18—Complex mathematical operations for evaluating statistical data, e.g. average values, frequency distributions, probability functions, regression analysis
    • G—PHYSICS
    • G08—SIGNALLING
    • G08B—SIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS
    • G08B3/00—Audible signalling systems; Audible personal calling systems
    • G08B3/10—Audible signalling systems; Audible personal calling systems using electric transmission; using electromagnetic transmission
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2817—Environmental-, stress-, or burn-in tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Data Mining & Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Pure & Applied Mathematics (AREA)
  • Computational Mathematics (AREA)
  • Mathematical Analysis (AREA)
  • Operations Research (AREA)
  • Evolutionary Biology (AREA)
  • Probability & Statistics with Applications (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Algebra (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electromagnetism (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

a presente invenção diz respeito a um método para diagnosticar o estado do capacitor em um conversor modular. o método para diagnosticar o estado do capacitor em um conversor modular inclui a determinação de uma tabela fit dependendo da tensão de entrada e da temperatura de um capacitor interno para várias amostras de conversores modulares; a detecção, por meio de uma unidade de detecção de tensão de entrada, a tensão de entrada do capacitor em um conversor modular alvo, o estado do capacitor a ser diagnosticado durante um período preestabelecido; a detecção, por meio de uma unidade de detecção de temperatura, da temperatura do capacitor do conversor modular alvo durante o período preestabelecido; o cálculo da média cumulativa para a tensão de entrada e a temperatura, as quais são detectadas respectivamente por meio da unidade de detecção da tensão de entrada e a unidade de detecção de temperatura durante o período preestabelecido; e a seleção, por meio de uma unidade de controle, de um valor fit, correspondendo à média cumulativa calculada da tensão de entrada e da temperatura, a partir da tabela fit; e a extração do mtbf do capacitor a partir do valor fit.
BR112017014139-6A 2014-12-31 2015-12-30 método para diagnosticar o estado de capacitor no conversor modular BR112017014139A2 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
KR1020140195574A KR101651883B1 (ko) 2014-12-31 2014-12-31 모듈형 컨버터의 커패시터 상태진단방법
KR10-2014-0195574 2014-12-31
PCT/KR2015/014492 WO2016108624A1 (ko) 2014-12-31 2015-12-30 모듈형 컨버터의 커패시터 상태진단방법

Publications (1)

Publication Number Publication Date
BR112017014139A2 true BR112017014139A2 (pt) 2018-03-06

Family

ID=56284675

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112017014139-6A BR112017014139A2 (pt) 2014-12-31 2015-12-30 método para diagnosticar o estado de capacitor no conversor modular

Country Status (5)

Country Link
US (1) US20180003745A1 (pt)
EP (1) EP3242138A4 (pt)
KR (1) KR101651883B1 (pt)
BR (1) BR112017014139A2 (pt)
WO (1) WO2016108624A1 (pt)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102018114092B4 (de) * 2018-06-13 2021-04-29 Infineon Technologies Ag Verfahren, Vorrichtungen und Systeme zur Überwachung von Datenwandlern welche einen Kalibrierungsdatensatz aufweisen
US11209808B2 (en) 2019-05-21 2021-12-28 At&T Intellectual Property I, L.P. Systems and method for management and allocation of network assets
FR3104727B1 (fr) 2019-12-13 2021-12-24 Commissariat Energie Atomique Surveillance du vieillissement d’un composant
KR102219058B1 (ko) * 2020-09-25 2021-02-24 서일대학교산학협력단 Mmc의 수명 진단방법
KR102433860B1 (ko) 2021-01-28 2022-08-18 최종관 Led 모듈의 자기진단 절약형 컨버터 회로 장치
KR102289106B1 (ko) * 2021-06-09 2021-08-12 탑아이티 주식회사 Led 전광판 시스템
KR20230148525A (ko) 2022-04-18 2023-10-25 국민대학교산학협력단 구형파 전류에 대한 커패시터 시험 장치

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6148848A (ja) 1984-08-17 1986-03-10 Fuji Photo Film Co Ltd カラ−写真感光材料
JPH0792213A (ja) 1993-09-28 1995-04-07 Meidensha Corp 直流電解コンデンサの寿命診断装置
JP2004037258A (ja) * 2002-07-03 2004-02-05 Toshiba Corp フィルムコンデンサの劣化診断装置
JP4011016B2 (ja) * 2003-12-05 2007-11-21 株式会社東芝 電気二重層キャパシタシステムの監視装置
JP4812368B2 (ja) 2005-08-24 2011-11-09 三菱電機エンジニアリング株式会社 電力用コンデンサの寿命診断機能付き充電装置
JP3969734B1 (ja) 2006-09-15 2007-09-05 株式会社パワーシステム キャパシタ電源の寿命推定評価システム
JP4042917B1 (ja) 2007-04-23 2008-02-06 株式会社パワーシステム キャパシタ電源の異常判別方法及び異常判別装置
US7719808B2 (en) * 2007-05-15 2010-05-18 Astec International Limited Power converters with operating efficiency monitoring for fault detection
CN102057282B (zh) * 2008-06-06 2013-04-17 株式会社明电舍 电容器的剩余寿命诊断装置以及具备剩余寿命诊断装置的电力补偿装置

Also Published As

Publication number Publication date
KR20160081571A (ko) 2016-07-08
US20180003745A1 (en) 2018-01-04
KR101651883B1 (ko) 2016-08-29
WO2016108624A1 (ko) 2016-07-07
EP3242138A4 (en) 2018-10-17
EP3242138A1 (en) 2017-11-08

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Legal Events

Date Code Title Description
B25A Requested transfer of rights approved

Owner name: HYOSUNG HEAVY INDUSTRIES CORPORATION (KR)

B06U Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette]
B11B Dismissal acc. art. 36, par 1 of ipl - no reply within 90 days to fullfil the necessary requirements