WO2015174471A1 - オニウム塩、光酸発生剤、感光性樹脂組成物及びデバイスの製造方法 - Google Patents
オニウム塩、光酸発生剤、感光性樹脂組成物及びデバイスの製造方法 Download PDFInfo
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- WO2015174471A1 WO2015174471A1 PCT/JP2015/063830 JP2015063830W WO2015174471A1 WO 2015174471 A1 WO2015174471 A1 WO 2015174471A1 JP 2015063830 W JP2015063830 W JP 2015063830W WO 2015174471 A1 WO2015174471 A1 WO 2015174471A1
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C309/00—Sulfonic acids; Halides, esters, or anhydrides thereof
- C07C309/01—Sulfonic acids
- C07C309/02—Sulfonic acids having sulfo groups bound to acyclic carbon atoms
- C07C309/03—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton
- C07C309/06—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton containing halogen atoms, or nitro or nitroso groups bound to the carbon skeleton
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C381/00—Compounds containing carbon and sulfur and having functional groups not covered by groups C07C301/00 - C07C337/00
- C07C381/12—Sulfonium compounds
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
- G03F7/0382—Macromolecular compounds which are rendered insoluble or differentially wettable the macromolecular compound being present in a chemically amplified negative photoresist composition
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
- G03F7/0397—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having an alicyclic moiety in a side chain
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/162—Coating on a rotating support, e.g. using a whirler or a spinner
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/168—Finishing the coated layer, e.g. drying, baking, soaking
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
- G03F7/2004—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image characterised by the use of a particular light source, e.g. fluorescent lamps or deep UV light
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
- G03F7/325—Non-aqueous compositions
- G03F7/327—Non-aqueous alkaline compositions, e.g. anhydrous quaternary ammonium salts
Definitions
- Some embodiments of the invention relate to onium salts. Moreover, some aspects of the present invention relate to a photoacid generator and a photosensitive resin composition containing an onium salt, and a device manufacturing method using these.
- photoacid generators are known as such photoacid generators for photoresists (see Patent Document 1).
- the photoacid generator is a photosensitizer having a function of generating an acid when irradiated with light.
- bump formation with the downsizing of electronic equipment, bump formation using a resist has attracted attention as a method replacing the conventional solder bump formation using a solder paste.
- the sulfonic acid ester of N-hydroxyphthalimide compound described in Patent Document 1 has strong absorption even in a wavelength region of 360 nm or more, there is a possibility that light does not reach the deepest part of the film in a thick film. .
- the solubility is low due to a strong structure and the like, and it is not easy to prepare a composition for photoresist.
- photoacid generators that are highly sensitive to long-wavelength ultraviolet light such as i-line, have high transmittance so that they can handle thick films, and can be manufactured at low cost.
- one aspect of the present invention is to provide an onium salt that is highly sensitive to ultraviolet light having a long wavelength such as i-line.
- some aspects of the present invention have a moderate molar extinction coefficient for long-wavelength ultraviolet light such as i-line as a photoresist photoacid generator for thick films,
- One object is to provide an onium salt that can reach the surface.
- one form of the present invention is an onium salt represented by the following formula (a).
- Z, A, W, Y, (R) n and X have the following meanings:
- Z is a monovalent organic group having a cyclic structure with a conjugated ⁇ -electron system that may have at least one substituent;
- W is a divalent organic group having a cyclic structure with a conjugated ⁇ -electron system that may have at least one substituent;
- A is a direct bond or a divalent linking group containing at least one bond selected from the group consisting of a carbon-carbon single bond, a carbon-carbon double bond, and a carbon-carbon triple bond (the above Z And any of the substituents of W and W may form a saturated or partially saturated cyclic structure together with A and at least one atom contained in
- One embodiment of the present invention is an onium salt having a cation part and an anion part, and the cation part includes at least a first aromatic ring, a second aromatic ring, a cation center, Including The cation center is bonded to either the first aromatic ring or the second aromatic ring;
- the first carbon atom contained in the first aromatic ring is at least one selected from the group consisting of a single bond directly or a carbon-carbon single bond, a carbon-carbon double bond, and a carbon-carbon triple bond.
- the onium salt is bonded to the second carbon atom contained in the second aromatic ring through a divalent linking group containing one bond.
- One form of the present invention is a photoacid generator containing any of the above onium salts.
- One embodiment of the present invention is a composition comprising the photoacid generator and a polymerizable synthetic compound that reacts with an acid.
- the compound that reacts with an acid has a protecting group that is deprotected with an acid, or is crosslinked with an acid.
- the coating film is patterned using a first step of forming a coating film on a substrate using any of the above-described compositions, and first light of electromagnetic waves or particle beams. And a pattern forming step of developing a coating film subjected to the second step to obtain a resist pattern.
- the said coating film may be heated between the said 1st process and the said 2nd process, the said coating film may be heated after the said 2nd process, but the said composition used Depending on the product, steps other than the first to third steps can be added as appropriate.
- an onium salt that has high sensitivity to long-wavelength ultraviolet light such as i-line.
- the onium salt which can make light reach the deepest part of a film
- FIG. 1 shows an absorption spectrum of an onium salt according to one embodiment of the present invention.
- the manufacturing process of the device of an integrated circuit (IC) using the photosensitive resin composition of one aspect of this invention is shown.
- FIG. 4 is a diagram obtained by dividing FIG. 3.
- the manufacturing process of the display apparatus of an organic electroluminescent device (OLED) using the photosensitive resin composition of one aspect of this invention is shown.
- FIG. 4 is a diagram obtained by dividing FIG. 3.
- the manufacturing process of the display apparatus of an organic electroluminescent device (OLED) using the photosensitive resin composition of one aspect of this invention is shown.
- FIG. 4 is a diagram obtained by dividing FIG. 3.
- the manufacturing process of the display apparatus of an organic electroluminescent device (OLED) using the photosensitive resin composition of one aspect of this invention is shown.
- Onium salt 1 One form of the present invention is an onium salt represented by the following formula (a). Z-A-W-Y + (R) n X - (a) In the above formula (a), Z, A, W, Y, (R) n and X have the following meanings: Z is a monovalent organic group having a cyclic structure with a conjugated ⁇ -electron system that may have at least one substituent; W is a divalent organic group having a cyclic structure with a conjugated ⁇ -electron system that may have at least one substituent; A is a direct bond or a divalent linking group containing at least one bond selected from the group consisting of a carbon-carbon single bond, a carbon-carbon double bond, and a carbon-carbon triple bond (the above Z And any of the substituents of W and W may form a saturated or partially saturated cyclic structure together with A and at least one atom contained in each of Z and W); Y is an iodine atom or
- Z is a monovalent organic group having a cyclic structure containing a conjugated ⁇ -electron system that may have at least one substituent. It is a monovalent organic group including a benzene aromatic ring that may have, a heteroaromatic ring that may have a substituent, or a non-benzene aromatic ring that may have a substituent. .
- W is a divalent organic group having a cyclic structure including a conjugated ⁇ electron system that may have at least one substituent, and typically has, for example, a substituent.
- a divalent organic group including a benzene aromatic ring, a heteroaromatic ring which may have a substituent, or a non-benzene aromatic ring which may have a substituent.
- the benzene aromatic ring is an aromatic ring whose ring skeleton is formed of carbon atoms.
- the monovalent organic group containing the benzene aromatic ring include an aromatic organic group in which at least one benzene ring such as a phenyl group, a biphenyl group, a terphenyl group, or a quaterphenyl group is directly connected. It is done. Of these, when i-line, h-line and g-line are used as excitation light for the onium salt, a phenyl group, a biphenyl group and a terphenyl group are preferred.
- the monovalent organic group containing a benzene-based aromatic ring include a naphthyl group, an anthryl group, a phenanthrenyl group, a pentaenyl group, an indenyl group, an indacenyl group, an acenaphthyl group, a fluorenyl group, a heptaenyl group, a naphthacenyl group, A condensed polycycle having a structure in which at least two atoms among carbon atoms constituting one aromatic ring such as pyrenyl group, chrysenyl group and tetracenyl group are also contained in at least one adjacent aromatic ring An aromatic ring is mentioned. Of these, when i-line, h-line and g-line are used as excitation light for the onium salt, a naphthyl group, anthryl group and phenanthrenyl group are preferred.
- the above heteroaromatic ring contains at least one hetero atom such as an oxygen atom, a sulfur atom and a nitrogen atom in the ring skeleton other than carbon atoms.
- the monovalent organic group containing the heteroaromatic ring include furanyl group, thienyl group, pyranyl group, thiopyranyl group, pyrrolyl group, imidazolyl group, oxazolyl group, thiazolyl group, pyrazoyl group, pyridyl group, iso Examples thereof include monocyclic or condensed heteroaromatic groups such as benzofuranyl group, benzofuranyl group, isochromenyl group, chromenyl group, indolyl group, isoindolyl group, benzoimidazolyl group, xanthenyl group, aquadinyl group, and carbazoyl group.
- i-line, h-line and g-line are used as excitation light for the onium salt, furanyl group, thienyl group, pyranyl group, thiopyranyl group, pyrrolyl group, imidazolyl group, oxazolyl group, thiazolyl group, pyrazoyl group, and pyridyl group
- An isobenzofuranyl group, a benzofuranyl group, and the like are preferable.
- the non-benzene aromatic ring has a cyclic conjugated system other than the benzene nucleus.
- Specific examples of the non-benzene aromatic ring include azulene, annulene, tropylium cation and metallocene.
- organic groups exemplified above can be introduced into the onium salt as monovalent and divalent organic groups with respect to Z and W, respectively.
- At least one hydrogen atom may be substituted with various substituents.
- substituents include cyano group, trifluoromethyl group, nitro group, acetyl group, iodo group, bromo group, chloro group, fluoro group, amide group, alkyl group, aryl group, alkoxy group, hydroxy group, and thiol.
- alkylthio group amino group, alkylamino group, dialkylamino group and the like.
- an electron donating group such as an N-arylamino group (—NR 1 Ar 1 ) is directly bonded to the ⁇ electron system of Z or W donates an electron to the cation salt to the onium salt, and It is preferable for reasons such as improving the generation efficiency. More preferably, the electron donating group is directly bonded to the Z ⁇ -electron system.
- the “cation center” means “Y” in the above formula (a).
- R 1 and R 2 contained in the electron donating group are each independently an alkyl group having 1 or more carbon atoms which may have a substituent. It is preferably any one selected.
- alkyl group having 1 or more carbon atoms which may have a substituent for R 1 and R 2 are each independently, for example, a methyl group, an ethyl group, an n-propyl group, an n-butyl group, linear alkyl groups such as n-pentyl, n-hexyl, n-octyl and n-decyl; isopropyl, isobutyl, tert-butyl, isopentyl, tert-pentyl, 2-ethylexyl, etc.
- a trialkylsilyl group such as a trimethylsilyl group, a triethylsilyl group or a dimethylethylsilyl group, or at least one of these hydrogen atoms is a cyano group or a halogen atom
- an alkyl group substituted with a group is a trialkylsilyl group such as a trimethylsilyl group, a triethylsilyl group or a dimethylethylsilyl group, or at least one of these hydrogen atoms is a cyano group or
- an alkoxy group, an aryloxy group, and an alkylthio group are particularly preferable because of their relatively high stability against an acid generated from the onium salt.
- an alkoxy group, an aryloxy group, and the like are more preferable because a bond of carbon atom-oxygen atom is more stable than a bond of carbon atom-sulfur atom.
- A is a direct bond or a divalent linking group containing at least one bond selected from the group consisting of a carbon-carbon single bond, a carbon-carbon double bond and a carbon-carbon triple bond.
- “Divalent linking group containing at least one carbon-carbon double bond or carbon-carbon triple bond” means a divalent linking group containing at least one of —C ⁇ C— and —C ⁇ C—. If there is no particular limitation, for example, —C ⁇ C—, —C ⁇ C—C ⁇ C—, —C ⁇ C—, —C ⁇ C—C ⁇ C—, —C ⁇ C—C ⁇ C— Etc.
- A is a direct bond or an ethynylene group (—C ⁇ C—).
- any one of Z and W may form a saturated or partially saturated cyclic structure together with at least one atom contained in Z and W and A.
- Z and W are respectively a phenyl group which is a cyclic organic group and a phenylene group which is a cyclic organic group
- the following structures (1) and (2) are exemplified (in the following general formula, “—Y ( R) n X ⁇ ”is omitted).
- Z and W are a phenyl group and a phenylene group, respectively, but the onium salt according to one embodiment of the present invention is not limited thereto.
- the cyclic structure is not limited to the four-membered ring and the five-membered ring shown below, and the cyclic structure includes at least one heteroatom such as an oxygen atom, a nitrogen atom, a silicon atom or a sulfur atom. Also good.
- the onium salt ZAW- (in the general formula, “Y (R) n X ⁇ ” is omitted) in one embodiment of the present invention
- the following structures (3) to (11) are preferably exemplified Is done.
- at least one bond selected from the group consisting of a carbon-carbon single bond, a carbon-carbon double bond, and a carbon-carbon triple bond is used instead of a direct single bond.
- the structure which is the said connection group containing may be sufficient.
- Z and W may be exchanged via a direct single bond. That is, it is only necessary that —Y (R) n X — in the formula (a) is bonded to any cyclic organic group in the following structure.
- any one hydrogen atom of the linked cyclic organic group shown below may be substituted with the substituent exemplified above.
- a carbon atom constituting at least one cyclic structure of the linked cyclic organic group may be substituted with at least one heteroatom selected from an oxygen atom, a sulfur atom and a nitrogen atom.
- the Z is a phenyl group and / or the W is a phenylene group.
- Y is preferably a sulfonium cation that is a sulfur atom or an iodonium cation that is an iodine atom.
- the above X ⁇ represents CF 3 CO 2 ⁇ , CH 3 CO 2 ⁇ , CF 3 CF 2 C 4 H 4 SO 3 ⁇ , CH 3 SO 3 ⁇ , (C 6 F 5 ) 4 B ⁇ , SbF 6 ⁇ , PF 6 ⁇ , BF 4 ⁇ , CF 3 SO 3 ⁇ , HSO 4 ⁇ , (CF 3 CF 2 ) 3 PF 3 ⁇ , (CF 3 CF 2 ) 2 PF 4 ⁇ , (CF 3 CF 2 ) PF 5 ⁇ , ((CF 3 ) 2 C 6 H 3 ) 4 B ⁇ , (C 6 F 5 ) 4 Ga ⁇ , ((CF 3 ) 2 C 6 H 3 ) 4 Ga ⁇ , Nonafluorobutanesulfonate anion, butanesulfonate anion, camphorsulfonate anion, benzenesulfonate
- each (R) n is 1 or more carbon atoms which may have a substituent a monovalent organic group And typically an organic group such as a monovalent hydrocarbon group and an aryl group which may have a substituent.
- R n are each independently a methyl group, ethyl group, n-propyl group, n-butyl group, n-pentyl group, n-hexyl group, n-octyl group, n-decyl group, etc.
- R may have an electron-withdrawing group such as a cyano group, a nitro group, a perfluoroalkyl group, or a halogen atom as a substituent, and an electron-donating group as described above.
- each of (R) n is a cyclic structure such as a 4-membered ring to an 8-membered ring containing a sulfur atom as shown in (12) to (16) below, which is bonded to the other. May be.
- Y is preferably bonded to an aromatic ring group such as a phenyl group as R exemplified above.
- R is preferably an aromatic ring group.
- the onium salt according to one aspect of the present invention has a cation part and an anion part, and includes at least a first aromatic ring, a second aromatic ring, and a cation center, and the cation center is the above-mentioned
- a first carbon atom bonded to either the first aromatic ring or the second aromatic ring, and the first carbon atom contained in the first aromatic ring is a single bond directly or a carbon-carbon single bond; Bonded to the second carbon atom contained in the second aromatic ring through a divalent linking group containing at least one bond selected from the group consisting of a carbon-carbon double bond and a carbon-carbon triple bond is doing.
- the cation moiety has a first organic group having a cyclic structure having the first aromatic ring which may have at least one substituent, and at least one substituent.
- the cation center is preferably a sulfur atom or an iodine atom.
- the first organic group include a benzene aromatic ring that forms a ring skeleton with only carbon atoms, a heteroaromatic ring that includes atoms other than carbon atoms in the ring skeleton, and a cyclic conjugated system other than a benzene nucleus.
- An organic group having a non-benzene aromatic ring can be mentioned.
- examples of the second organic group include organic groups having a benzene aromatic ring, a heteroaromatic ring, or a non-benzene aromatic ring.
- Specific examples of the organic group having a benzene aromatic ring, a heteroaromatic ring, or a non-benzene aromatic ring are as described above.
- the first organic group and the second organic group are directly bonded, or at least one selected from the group consisting of a carbon-carbon single bond, a carbon-carbon double bond, and a carbon-carbon triple bond. It is preferable that it couple
- the first organic group is a benzene aromatic ring group, a heteroaromatic ring group or a non-benzene aromatic ring group
- the second organic group is a benzene aromatic ring group or a heteroaromatic group.
- An aromatic ring group or a non-benzene aromatic ring group, at least one carbon atom contained in the aromatic ring of the first organic group and at least one carbon contained in the aromatic ring of the second organic group Through a divalent linking group that is bonded directly or contains at least one bond selected from the group consisting of a carbon-carbon single bond, a carbon-carbon double bond, and a carbon-carbon triple bond, Are connected.
- the first carbon atom may be directly or as a single bond through a divalent linking group containing at least one bond selected from the group consisting of a carbon-carbon double bond and a carbon-carbon triple bond. It is preferably bonded to the second carbon atom.
- the two aromatic rings form an extended ⁇ -electron system due to the bonding form described above.
- Such an onium salt causes a reduction reaction of the ⁇ -electron system due to a photoreaction, and can improve the transmittance.
- the onium salt is used as a light for patterning a thick film having a thickness of 10 ⁇ m or more, for example. When used as an acid generator, light can be transmitted to the deep part of the film.
- At least one carbon atom contained in the aromatic ring of the first organic group and at least one carbon atom contained in the aromatic ring of the second organic group are directly bonded, or Are bonded through an ethynylene group.
- an onium salt represented by the above formula (a) is preferably exemplified.
- the absorption coefficient at the first wavelength of the onium salt is decreased by the onium salt absorbing electromagnetic waves or particle beams having the first wavelength.
- the electromagnetic wave or particle beam is more preferably i-line, g-line or h-line. Further, the electromagnetic wave is preferably i-line.
- the first wavelength is preferably longer than 350 nm, and preferably 365 nm.
- the cation portion of the onium salt according to one embodiment of the present invention has a relatively high electron accepting property at a cation center such as a sulfur atom or an iodine atom. For this reason, the electron transition to the lowest excited state or an excited state in the vicinity thereof has a property of charge transfer from the ⁇ -electron system bonded to the cation center to the cation center. By irradiating light to the absorption band having such charge transfer properties, electrons move to the cation center, and the acid generation efficiency is improved.
- the onium salt according to one embodiment of the present invention is suitable for thick film patterning.
- an aromatic ring connected to the cation center (a divalent organic group represented by W in the formula (a)) and / or the cation It is preferable to introduce at least one electron donating group on the aromatic ring (monovalent organic group represented by Z in the above formula (a)) that is not connected to the center.
- the aromatic ring include a benzene aromatic ring, a heteroaromatic ring, and a non-benzene aromatic ring.
- the aromatic ring connected to the cation center any one of a benzene aromatic ring, a heteroaromatic ring, a non-benzene aromatic ring and the like may be introduced.
- Specific examples of the electron donating group and the organic group having an aromatic ring include those exemplified above.
- the degree of electron delocalization of the ⁇ -electron system connected to the cation center is increased, and the level of the highest occupied orbit (HOMO) is increased.
- HOMO highest occupied orbit
- At least one electron donating group such as an alkoxy group is further substituted with an aromatic ring (a monovalent organic group represented by Z in the above formula (a) and / or W
- an aromatic ring a monovalent organic group represented by Z in the above formula (a) and / or W
- the onium salt according to one embodiment of the present invention includes at least a first aromatic ring and a second aromatic ring that are the same or different, and one carbon atom that forms a ring skeleton of the first aromatic ring. It is preferable that one carbon atom is directly bonded to one of the carbon atoms forming the ring skeleton of the second aromatic ring.
- the cation center of the cation part is bonded to only one of the first aromatic ring and the second aromatic ring. Further, as in the compounds (17), (20) and (21), at least one of the first aromatic ring and the second aromatic ring is not bonded to the aromatic ring to which the cation center is not bonded. It is preferable to introduce one electron-donating group because charge transfer absorption having a transition moment in the major axis direction is enhanced, electrons can be supplied to the cation center, and acid generation efficiency can be improved. .
- the onium salt according to one embodiment of the present invention includes at least a first aromatic ring and a second aromatic ring that are the same or different, and one carbon atom that forms a ring skeleton of the first aromatic ring.
- One carbon atom is bonded to one carbon atom forming the ring skeleton of the second aromatic ring through at least one ⁇ -electron linking group such as a double bond or a triple bond.
- the cation center of the cation part is bonded to only one of the first aromatic ring and the second aromatic ring.
- at least one electron donating property is present in the aromatic ring to which the cation center is not bonded among the first aromatic ring and the second aromatic ring.
- the method for producing the onium salt represented by the above formula (a) is not particularly limited, and a method using a well-known organic synthesis reaction can be used.
- examples of the synthesis of a sulfonium salt in which A is a direct bond and Y is a sulfur atom include the schemes described below.
- TfO ⁇ represents trifluoromethanesulfonate.
- Substance A-3 exhibits excellent long-term stability because all the substituents on the sulfur atom that is the cation center are aromatic rings.
- TfO - shows the trifluoromethane sulfonate.
- MMA which is a diphenylacetylene derivative
- MMA is synthesized by Wittig reaction, bromination, and dehydrobromination.
- 2.5 g of MMA is dissolved in 10 ml of methylene chloride, and then 20 ml of diethyl ether solution containing 2.6 g of silver triflate is added and mixed.
- 1.4 ml of iodomethane in 10 ml of methylene chloride is stirred for 2 hours at room temperature.
- 20 ml of acetonitrile is added to the mixture, and the insoluble material is filtered.
- diisopropyl ether is added and stirred to form a precipitate.
- the precipitate is collected by filtration and dried to obtain 1.substance B-1 as a target product. 2 g is obtained.
- Substance B-2 is synthesized as follows. After 2.5 g of MMA was dissolved in 10 ml of methylene chloride, 20 ml of diethyl ether solution containing 2.6 g of silver triflate was added and mixed. To this mixture, 10 ml of 1.9 g of p-cyanobenzyl bromide was added. The methylene chloride solution is gradually added, and the mixture is stirred for 2 hours at room temperature. After stirring, 20 ml of acetonitrile is added to the mixture, and the insoluble matter is filtered. When the solvent of the filtrate is reduced to about one third, diisopropyl ether is added and stirred to form a precipitate. The precipitate is collected by filtration and dried to obtain 3.7 g of Substance B-2.
- the chemical structure of the obtained sulfonium salt and iodonium salt can be identified by a general analytical method such as liquid chromatography, 1 H-NMR, 13 C-NMR, IR and / or elemental analysis.
- Photoacid generator and photosensitive resin composition using the same is a photoacid generator containing the onium salt.
- the photoacid generator of the present invention has a property of releasing an acid upon irradiation with an electromagnetic wave or particle beam having a first wavelength, and can act on an acid-reactive organic substance to cause decomposition or polymerization. Therefore, the onium salt of the present invention can be preferably used as a photoacid generator for positive and negative photosensitive resin compositions.
- the photoacid generator according to one embodiment of the present invention can be used for a photosensitive resin composition containing a compound that reacts with an acid.
- the compound that reacts with an acid preferably has a protecting group that is deprotected with an acid or is crosslinked with an acid. That is, the compound that reacts with an acid is preferably at least one selected from the group consisting of a compound having a protecting group that is deprotected by an acid and a crosslinking agent having a crosslinking action by an acid.
- the compound having a protecting group that is deprotected by an acid is a compound whose solubility in a developer is changed by deprotecting the protecting group by an acid.
- a protecting group that is deprotected by an acid For example, in the case of aqueous development using an alkaline developer or the like, it is insoluble in an alkaline developer, but the protective group is deprotected in the exposed area by an acid generated from the photoacid generator upon exposure, whereby an alkaline developer. It is a compound that becomes soluble in.
- the developer is not limited to an alkali developer, and may be a neutral developer or an organic solvent development. Therefore, when an organic solvent developer is used, the compound having a protecting group that is deprotected by an acid is deprotected in the exposed area by the acid generated from the photoacid generator upon exposure, and the organic solvent developer Is a compound whose solubility is reduced.
- the protecting group to be deprotected with an acid examples include an ester group, an acetal group, a tetrahydropyranyl group, a siloxy group, and a benzyloxy group.
- the compound having the protecting group a compound having a styrene skeleton, a methacrylate or an acrylate skeleton pendant with these protecting groups is preferably used.
- the crosslinking agent having a crosslinking action with an acid is a compound that changes the solubility in a developer by crosslinking with an acid.
- aqueous development it acts on a compound that is soluble in an aqueous developer, and reduces the solubility of the compound in an aqueous developer after crosslinking.
- Specific examples include a crosslinking agent having an epoxy group, an acetal group, an oxetanyl group, and the like.
- examples of the cross-linking partner compound include compounds having a phenolic hydroxyl group.
- the resist composition of one embodiment of the present invention may further contain a polymer component having a weight average molecular weight of 2000 or more. What is necessary is just to use what is normally used by the resist composition as said polymer component.
- the content of the polymer component can be 60 to 99% by mass in the total amount of the resist composition.
- the hydroxy styrene may be in the form of a polymer containing hydroxy styrene as a structural unit, may be in the form of polyhydroxy styrene, or may be in the form of a compound having a weight average molecular weight of less than 2000.
- the hydroxystyrene is preferably contained in an amount of 40% by mass or more in the polymer component. Thereby, it is possible to improve the photoacid generation efficiency of an onium salt. More preferably, the content of hydroxystyrene relative to all polymer components is 50% by mass or more, and more preferably 60% by mass or more.
- resist composition according to one embodiment of the present invention include the following.
- Resist composition comprising a compound having a protecting group that is deprotected by an acid and the photoacid generator; a compound having a crosslinking action by an acid, and a compound that reacts with the crosslinking agent to change solubility in a developer. And a resist composition containing a photoacid generator; and the like.
- the content of the photoacid generator in the resist composition of one embodiment of the present invention is preferably 1 to 50 parts by mass with respect to 100 parts by mass of the resist composition component excluding the photoacid generator.
- the amount is more preferably 15 parts by mass, further preferably 5 to 8 parts by mass, and particularly preferably 2 to 5 parts by mass.
- the photosensitive resin composition of one embodiment of the present invention in any embodiment, other components may be blended as long as the effects of the present invention are not impaired.
- the polymer component and known additives, for example, known photoacid generators other than the photoacid generator, sensitizers, quenchers such as trioctylamine, surfactants, And at least one selected from fillers, pigments, antistatic agents, flame retardants, light stabilizers, antioxidants, ion scavengers, solvents and the like.
- the method for preparing the photosensitive resin composition of the present invention is not particularly limited, and a known method such as mixing, dissolving or kneading the photoacid generator containing the onium salt, the compound that reacts with the acid, and other optional components. Can be prepared.
- One embodiment of the present invention includes a coating film forming step of forming a coating film on a substrate using the photosensitive resin composition containing the onium salt, A photolithography process in which the coating film is exposed in a pattern using first light of electromagnetic waves or particle beams; And a pattern forming step of obtaining a photoresist pattern by developing the exposed coating film.
- the first light used for exposure in the photolithography process may be any light that can activate the onium salt of the present invention to generate an acid. UV, visible light, X-ray, electron beam, ion beam, i-line , EUV and the like. Since the photoacid generator according to one embodiment of the present invention has high sensitivity to i-line, the first light is preferably i-line.
- the amount of light irradiation varies depending on the type and mixing ratio of each component in the sensitive resin composition, the film thickness of the coating film, and the like, but is preferably 1 J / cm 2 or less.
- FIG. 2 shows a process for manufacturing a device such as an integrated circuit using the photosensitive resin composition of one embodiment of the present invention as a photoresist.
- the surface of the silicon wafer is oxidized by heating the silicon wafer in the presence of oxygen gas.
- the photosensitive resin composition is applied to the Si wafer surface by spin coating to form a coating film.
- Pre-bake the coating After pre-baking the Si wafer, the coating film and the silicon wafer are irradiated through the mask with the first light having a wavelength of 220 nm or more.
- a typical light source for coating film irradiation as the first light is i-line or g-line. Thereafter, the remaining film is removed. Since the irradiation time of the coating film can be shortened, deterioration of the apparatus due to light irradiation is suppressed as compared with existing photoresists.
- FIG. 3 shows a manufacturing process of the active matrix organic electroluminescence element.
- the lower layer 2 is formed on a substrate 1 such as a glass substrate, a quartz substrate, and a plastic substrate.
- a semiconductor film 4 formed by patterning is formed on the lower layer 2.
- the semiconductor film 4 is formed of low temperature polysilicon.
- amorphous silicon or metal oxide can be used as the material of the semiconductor film 4.
- the gate insulating film 3 is formed so as to cover the semiconductor film 4.
- the gate electrode 5 is formed on the gate insulating film 3 so that the gate electrode 5 and the semiconductor film 4 face each other.
- the photosensitive resin composition of one embodiment of the present invention is applied by spin coating so that the coating film 6 covers the gate electrode 5 and the gate insulating film 3, and the coating film 6 is disposed.
- the coating film 6 is irradiated with light having a wavelength of 365 nm through the photomask 8. Only a part of the coating film 6 is exposed with light passing through the opening 7.
- the exposed portion of the coating film 6 exposed to light is removed by development, and a contact hole 10 is formed.
- the coating film 6 is converted into a first interlayer insulating film by a heat treatment performed at a temperature higher than 150 ° C., and then the coating film 6 is formed.
- the pixel electrode 11 electrically connected to the semiconductor film 4 is formed.
- the pixel electrode 11 is made of indium tin oxide (ITO) or a magnesium silver alloy.
- the coating film 12 is disposed by a spin coating process so that the coating film 12 covers the pixel electrode 11 and the first interlayer insulating film 9.
- the coating film 12 is irradiated with light having a wavelength of 365 nm through the photomask 14. Only a part of the coating film 12 is exposed with light passing through the opening 13.
- the exposed portion of the coating film 12 by light is removed by development.
- the coating film 12 is converted into a second interlayer insulating film by a heat treatment performed at a temperature higher than 150 ° C., and then the coating film 12 is formed.
- a hole transport layer 15, a light emitting layer 16, and a charge transport layer 17 are formed in this order by a vacuum deposition method through a mask.
- the common electrode 18 is formed on the charge transport layer 17 and the second interlayer insulating film 14.
- the protective film 19 is formed on the common electrode 18.
- Onium salt 1 is synthesized as follows. In the scheme below, TfO ⁇ represents trifluoromethanesulfonate.
- Onium salt 1 is synthesized as follows. After immersing 0.3 g of magnesium in anhydrous tetrahydrofuran and activating with a small amount of dibromoethane, a solution of 5 ml of anhydrous tetrahydrofuran containing 1.9 g of p-anisyl bromide is gradually added dropwise at room temperature. After stirring for 6 hours at room temperature, 0.3 g of [1,2-bis (diphenylphosphino) ethane] nickel (II) dichloride is added.
- the onium salt 3 is synthesized as follows.
- TfO - shows the trifluoromethane sulfonate.
- MMA which is a diphenylacetylene derivative, is synthesized by Wittig reaction, bromination, and dehydrobromination.
- 2.5 g of MMA is dissolved in 10 ml of methylene chloride, and then 20 ml of diethyl ether solution containing 2.6 g of silver triflate is added and mixed.
- the onium salt 4 is synthesized as follows. After 2.5 g of MMA obtained in Example 3 above was dissolved in 10 ml of methylene chloride, 20 ml of diethyl ether solution containing 2.6 g of silver triflate was added and mixed. To this mixture, 1.9 g of p. -Gradually add 10 ml of methylene chloride solution of cyanobenzyl bromide and stir for 2 hours at room temperature. After stirring, add 20 ml of acetonitrile to the mixture and filter insolubles. When the solvent of the filtrate became about one third, diisopropyl ether was added and stirred to form a precipitate. The precipitate was collected by filtration and dried to obtain 3 onium salt 4 (Substance B-2). 0.7 g is obtained.
- the onium salt 5 is synthesized as follows.
- FIG. 1 shows an absorption spectrum of onium salt 5 (Substance A-3) obtained.
- PSDS-PFBS widely used as an i-line photoacid generator is also shown.
- the absorption spectrum of the Substance A-3 reaches around 365 nm, similar to PSDS-PFBS.
- a photoresist sample is prepared using 9.0 mg of any one of the onium salts 1 to 5 obtained in Examples 1 to 5, 225 mg of the following polymer A and 225 mg of polymer B. Using this as an evaluation sample, sensitivity evaluation is performed as follows.
- An example using PSDS-PFBS widely used as a photoacid generator for i-line instead of the onium salts 1 to 5 is referred to as Comparative Example 1.
- HMDS hexamethyldisilazane
- HMDS Tokyo Chemical Industry
- the evaluation sample is spin-coated on the surface of the Si wafer treated with HMDS at 2000 rpm for 20 seconds to form a coating film.
- the coating film is pre-baked at 110 ° C. for 60 seconds.
- the coating film of the evaluation sample was exposed with i-line (365 nm) output from a UV light emitting device (HMW-661C-3, manufactured by Oak Manufacturing Co., Ltd.).
- post-baking PEB
- PEB post-baking
- the coated film is developed with NMD-3 (tetra-methylammonium hydroxide 2.38%, manufactured by Tokyo Ohka Kogyo Co., Ltd.) at 25 ° C. for 20 seconds and washed with deionized water for 10 seconds.
- the thickness of the coating film measured with the film thickness measurement tool is approximately 500 nm.
- Sensitivity is to measure the dose size for forming a pattern consisting of a 100 ⁇ m line where the thickness of the coating film is not zero and a 100 ⁇ m space where the thickness of the coating film is zero using UV exposure.
- the dose of E 0 sensitivity is calculated by measuring the illuminance of the UV source with a 365 nm illuminometer. The results are shown in Table 1.
- the onium salt 5 of Example 5 has a high transmittance substantially equal to that of PSDS-PFBS of Comparative Example 1 which is a typical high-permeability photoacid generator, but the sensitivity to PSDPS-PFBS is 1.3. The sensitivity is as high as twice or more.
- onium salts 1, 2 and 5 have an appropriate molar extinction coefficient, they are considered to have very high transmittance.
- the molar extinction coefficient after irradiation is about 1/5 compared with that before i-ray irradiation.
- the onium salts 1 to 4 show an attenuation of the extinction coefficient at a wavelength longer than 350 nm.
- the onium salt according to one embodiment of the present invention is sensitive to i-line and has high light transmittance
- a photosensitive resin composition containing the onium salt as a photoacid generator is used as a photoresist. It can also be used for film patterning.
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Abstract
Description
Z-A-W-Y+(R)nX- (a)
上記式(a)中、Z、A、W、Y、(R)n及びXは以下の意味である:
Zは、少なくとも1つの置換基を有していてもよい共役π電子系を備えた環状構造を有する1価の有機基である;
Wは、少なくとも1つの置換基を有していてもよい共役π電子系を備えた環状構造を有する2価の有機基である;
Aは、直接結合、又は、炭素-炭素一重結合、炭素-炭素二重結合及び炭素-炭素三重結合からなる群より選ばれる少なくとも1つの結合を含む2価の連結基である(なお、上記Z及びWのいずれかの置換基は、上記Z及びWのそれぞれに含まれる少なくとも1つの原子と上記Aと一緒に飽和又は部分的に飽和した環状構造を形成してもよい);
Yはヨウ素原子又は硫黄原子であり、かつヨウ素原子であるときn=1であり、Yが硫黄原子であるときn=2である;
(R)nは、互いに同一又は異なっていても良く、(R)nの各々は、置換基を有していてもよい炭素数1以上の1価の有機基であり、典型的には、1価の炭化水素基及び置換基を有していてもよいアリール基等の有機基である;
Xは1価のアニオンを示す。
上記カチオン中心が、上記第1の芳香族環及び上記第2の芳香族環のいずれかと結合し、
上記第1の芳香族環に含まれる第1の炭素原子は、一重結合で直接、又は、炭素-炭素一重結合、炭素-炭素二重結合及び炭素-炭素三重結合からなる群より選ばれる少なくとも1つの結合を含む2価の連結基を介して、上記第2の芳香族環に含まれる第2の炭素原子に結合している、オニウム塩である。
本発明の1つの形態は、下記式(a)で表されるオニウム塩である。
Z-A-W-Y+(R)nX- (a)
上記式(a)中、Z、A、W、Y、(R)n及びXは以下の意味である:
Zは、少なくとも1つの置換基を有していてもよい共役π電子系を備えた環状構造を有する1価の有機基である;
Wは、少なくとも1つの置換基を有していてもよい共役π電子系を備えた環状構造を有する2価の有機基である;
Aは、直接結合、又は、炭素-炭素一重結合、炭素-炭素二重結合及び炭素-炭素三重結合からなる群より選ばれる少なくとも1つの結合を含む2価の連結基である(なお、上記Z及びWのいずれかの置換基は、上記Z及びWのそれぞれに含まれる少なくとも1つの原子と上記Aと一緒に飽和又は部分的に飽和した環状構造を形成してもよい);
Yはヨウ素原子又は硫黄原子であり、かつヨウ素原子であるときn=1であり、Yが硫黄原子であるときn=2である;
(R)nは、互いに同一又は異なっていても良く、(R)nの各々は、置換基を有していてもよい炭素数1以上の1価の有機基であり、典型的には、1価の炭化水素基及び置換基を有していてもよいアリール基等の有機基である;
Xは1価のアニオンを示す。
また、本発明の1つの形態に係るオニウム塩は、カチオン部とアニオン部とを有し、少なくとも第1の芳香族環と第2の芳香族環とカチオン中心とを含み、上記カチオン中心が上記第1の芳香族環及び上記第2の芳香族環のいずれかと結合し、上記第1の芳香族環に含まれる第1の炭素原子は、一重結合で直接、又は、炭素-炭素一重結合、炭素-炭素二重結合及び炭素-炭素三重結合からなる群より選ばれる少なくとも1つの結合を含む2価の連結基を介して、上記第2の芳香族環に含まれる第2の炭素原子に結合している。典型的には上記カチオン部は、少なくとも1つの置換基を有していてもよい上記第1の芳香族環を有する環状構造を備えた第1の有機基と、少なくとも1つの置換基を有していてもよい上記第2の芳香族環を有する環状構造を備えた第2の有機基を含んでいる。上記カチオン中心は、硫黄原子又はヨウ素原子等であることが好ましい。上記第1の有機基としては、例えば、炭素原子のみで環骨格を形成するベンゼン系芳香族環、環骨格に炭素原子以外の原子を含む複素芳香族環又はベンゼン核以外の環状共役系を有する非ベンゼン系芳香族環を有する有機基が挙げられる。上記第2の有機基も、同様に、例としてベンゼン系芳香族環、複素芳香族環又は非ベンゼン系芳香族環を有する有機基が挙げられる。ベンゼン系芳香族環、複素芳香族環又は非ベンゼン系芳香族環を有する有機基の具体例は先に述べたとおりである。
具体的には上記式(a)で表されるオニウム塩が好ましく挙げられる。
上記式(a)で表されるオニウム塩の製造方法は特に制限されることなく、周知の有機合成反応を応用した方法を用いることができる。
以下のスキームにおいて、TfO-は、トリフルオロメタンスルフォネートを示す。
マグネシウムを無水テトラヒドロフランに浸し、少量のジブロモエタンで活性化した後、1.9gのp-アニシルブロマイドを含む5ml無水テトラヒドロフランの溶液を室温で徐々に滴下する。6時間室温で攪拌した後に0.3gの[1,2-ビス(ジフェニルホスフィノ)エタン]ニッケル(II)ジクロリドを加える。その後に2.0gのp-メチルチオフェニルブロマイドの5ml無水テトラヒドロフラン溶液を徐々に滴下し、10時間加熱還流する。加熱還流後、室温に戻し、当該混合物をシリカゲルに通過させて得られた溶液から溶媒を留去する。得られた固体をメタノールで再結晶し、乾燥させることにより2.0gの4-メトキシ―4’-メチルチオ―ビフェニルが得られる。次に1.15gの4-メトキシ―4’-メチルチオ―ビフェニルを10mlの塩化メチレンに溶解させた後に1.5gの銀トリフラートを含む20mlのジエチルエーテル溶液を加えて、混合する。この混合物に0.7gのヨードメタンの10mlの塩化メチレン溶液を徐々に添加して、2時間室温で攪拌する。攪拌後、当該混合物にアセトニトリルを20ml添加し、不溶物をろ過する。ろ液の溶媒が3分の1程度になったところで、ジイソプロピルエーテルを加え、攪拌すると沈殿物が生じ、当該沈殿物をろ過後、乾燥することにより目的物であるSubstance A-1が1.2g得られる。
本発明の1つの形態は、上記オニウム塩を含む光酸発生剤である。本発明の光酸発生剤は、第1の波長を有する電磁波又は粒子線の照射により酸を放出する特性を有し、酸反応性有機物質に作用して分解や重合を引き起こすことができる。そのため、本発明のオニウム塩は、ポジ型及びネガ型の感光性樹脂組成物の光酸発生剤として好ましく用いることができる。
上記酸により反応する化合物は、酸により脱保護する保護基を有する、又は、酸により架橋することが好ましい。つまり、上記酸により反応する化合物は、酸により脱保護する保護基を有する化合物、及び、酸により架橋作用を有する架橋剤からなる群より選択される少なくともいずれかであることが好ましい。
本発明の1つの形態は、上記オニウム塩を含む感光性樹脂組成物を用いて基板上に塗布膜を形成する塗布膜形成工程と、
電磁波又は粒子線の第1の光を用いて、上記塗布膜をパターン状に露光するフォトリソグラフィ工程と、
露光された塗布膜を現像してフォトレジストパターンを得るパターン形成工程と、を含むデバイスの製造方法である。
シリコンウェハを準備する。シリコンウェハの表面を、酸素ガス存在下シリコンウェハを加熱することによって酸化する。感光性樹脂組成物をスピンコーティングによりSiウェハ表面に塗布し、塗膜を形成する。塗膜をプレベークする。Siウェハのプレベーク後に、波長が220nm以上の第1の光によりマスクを介して塗膜及びシリコンウェハを照射する。第1の光としての、塗膜照射の典型的な光源はi線又はg線である。
その後、残りの膜を除去する。塗布膜の照射時間が短くできるため、既存のフォトレジストと比べ、光照射による装置の劣化が抑制される。
図3(a)において、下層2を、ガラス基板、石英基板及びプラスチック基板等の基板1上に形成する。パターニングすることによって形成した半導体膜4を、下層2上に形成する。典型的に、半導体膜4は、低温ポリシリコンで形成される。また、アモルファスシリコン又は金属酸化物を半導体膜4の材料として利用できる。ゲート絶縁膜3を、半導体膜4を被覆するように形成する。ゲート電極5及び半導体膜4が互いに対向するようにゲート電極5をゲート絶縁膜3の上に形成する。
図3(c)において、塗布膜6をプレベーク処理した後、フォトマスク8を介して365nmの波長の光で塗布膜6を照射する。塗布膜6の一部のみを開口部7を通った光で露光する。
図3(e)において、電気的に半導体膜4に接続した画素電極11を形成する。典型的に、画素電極11は、酸化インジウム錫(ITO)又はマグネシウム銀合金で作られる。
図3(g)において、塗布膜12をプレベーク処理した後、塗布膜12をフォトマスク14を介して波長365nmの光で照射する。塗布膜12の一部のみを開口部13を通った光で露光する。
図3(i)において、正孔輸送層15、発光層16及び電荷輸送層17を、この順でマスクを介して真空蒸着法により形成する。共通電極18は、電荷輸送層17及び第2層間絶縁膜14の上に形成する。保護膜19は、共通電極18上に形成する。
下記の通りにしてオニウム塩1を合成する。
以下のスキームにおいて、TfO-は、トリフルオロメタンスルフォネートを示す。
0.3gのマグネシウムを無水テトラヒドロフランに浸し、少量のジブロモエタンで活性化した後、1.9gのp-アニシルブロマイドを含む5ml無水テトラヒドロフランの溶液を室温で徐々に滴下する。6時間室温で攪拌した後に0.3gの[1,2-ビス(ジフェニルホスフィノ)エタン]ニッケル(II)ジクロリドを加える。その後に2.0gのp-メチルチオフェニルブロマイドの5ml無水テトラヒドロフラン溶液を徐々に滴下し、10時間加熱還流する。加熱還流後、室温に戻し、当該混合物をシリカゲルに通過させて得られた溶液から溶媒を留去する。得られた固体をメタノールで再結晶し、乾燥させることにより2.0gの4-メトキシ―4’-メチルチオ―ビフェニルが得られる。次に1.15gの4-メトキシ―4’-メチルチオ―ビフェニルを10mlの塩化メチレンに溶解させた後に1.5gの銀トリフラートを含む20mlのジエチルエーテル溶液を加えて、混合する。この混合物に0.7gのヨードメタンの10mlの塩化メチレン溶液を徐々に添加して、2時間室温で攪拌する。攪拌後、当該混合物にアセトニトリルを20ml添加し、不溶物をろ過する。ろ液の溶媒が3分の1程度になったところで、ジイソプロピルエーテルを加え、攪拌すると沈殿物が生じ、当該沈殿物をろ過後、乾燥することにより目的物であるオニウム塩1(Substance A-1)が1.2g得られる。
下記の通りにしてオニウム塩1を合成する。
0.3gのマグネシウムを無水テトラヒドロフランに浸し、少量のジブロモエタンで活性化した後、1.9gのp-アニシルブロマイドを含む5ml無水テトラヒドロフランの溶液を室温で徐々に滴下する。6時間室温で攪拌した後に0.3gの[1,2-ビス(ジフェニルホスフィノ)エタン]ニッケル(II)ジクロリドを加える。その後に2.0gのp-メチルチオフェニルブロマイドの5ml無水テトラヒドロフラン溶液を徐々に滴下し、10時間加熱還流する。加熱還流後、室温に戻し、当該混合物をシリカゲルに通過させて得られた溶液から溶媒を留去する。得られた固体をメタノールで再結晶し、乾燥させることにより2.0gの4-メトキシ―4’-メチルチオ―ビフェニルが得られる。次に1.15gの4-メトキシ―4’-メチルチオ―ビフェニルを10mlの塩化メチレンに溶解させた後に1.5gの銀トリフラートを含む20mlのジエチルエーテル溶液を加えて、混合する。この混合物に1.0gのp-シアノベンジルブロマイドの10mlの塩化メチレン溶液を徐々に添加して、2時間室温で攪拌する。攪拌後、当該混合物にアセトニトリルを20ml添加し、不溶物をろ過する。ろ液の溶媒が3分の1程度になったところで、ジイソプロピルエーテルを加え、攪拌すると沈殿物が生じ、当該沈殿物をろ過後、乾燥することにより目的物であるオニウム塩2(Substance A-2)が1.7g得られる。
下記の通り、オニウム塩3の合成を行う。
ジフェニルアセチレン誘導体であるMMAは、Wittig反応、臭素化、脱臭化水素反応で合成される。次に2.5gのMMAを10mlの塩化メチレンに溶解させた後に2.6gの銀トリフラートを含む20mlのジエチルエーテル溶液を加えて、混合する。この混合物に1.4gのヨードメタンの10mlの塩化メチレン溶液を徐々に添加して、2時間室温で攪拌する。攪拌後、当該混合物にアセトニトリルを20ml添加し、不溶物をろ過する。ろ液の溶媒が3分の1程度になったところで、ジイソプロピルエーテルを加え、攪拌すると沈殿物が生じ、当該沈殿物をろ取し、乾燥することにより目的物であるオニウム塩3(Substance B-1)が1.2g得られる。
下記の通り、オニウム塩4の合成を行う。
上記実施例3で得られるMMAの2.5gを10mlの塩化メチレンに溶解させた後に2.6gの銀トリフラートを含む20mlのジエチルエーテル溶液を加えて、混合し、この混合物に1.9gのp-シアノベンジルブロマイドの10mlの塩化メチレン溶液を徐々に添加して、2時間室温で攪拌し、攪拌後、当該混合物にアセトニトリルを20ml添加し、不溶物をろ過する。ろ液の溶媒が3分の1程度になったところで、ジイソプロピルエーテルを加え、攪拌すると沈殿物が生じ、当該沈殿物をろ取し、乾燥することによりオニウム塩4(Substance B-2)が3.7g得られる。
下記の通り、オニウム塩5の合成を行う。
上記実施例1~5で得られたオニウム塩1~5のいずれか一種9.0mgと、下記のポリマーAを225mgとポリマーBを225mgとを用いて、フォトレジストサンプルを調製する。これを評価サンプルとして、感度評価を下記のように行う。オニウム塩1~5に代えて、i線用光酸発生剤として広く使用されているPSDS-PFBSを用いた例を比較例1とする。
Siウェハに上記評価サンプルを塗布する前に、ヘキサメチルジシラザン(HMDS、東京化成工業)をSiウェハ表面に2000rpm、20秒間でスピンコートし、110℃で1分間ベークする。その後、評価サンプルを上記HMDSで処理したSiウェハ表面に2000rpm、20秒間でスピンコートし、塗布膜を形成する。上記塗布膜のプリベークを110℃で60秒間行う。その後、評価サンプルの塗布膜をUV発光装置(HMW-661C-3、(株)オーク製作所製)から出力されるi線(365nm)で露光した。i線光露光後、ポストベーク(PEB)を110℃で60秒間行う。塗布膜をNMD-3(テトラ-メチルアンモニウムヒドロキド2.38%、東京応化工業(株)製)で25℃、20秒間で現像し、脱イオン水で10秒間洗う。膜厚測定ツールで測定した塗布膜の厚さは、おおよそ500nmである。
上記オニウム塩1~5及びPSDS-PFBSに対し、i線照射前の365nmにおけるモル吸光係数を評価する。結果を表1に示す。モル吸光係数は透過率の指標となる。
2 下層
3 絶縁膜
4 半導体膜
5 ゲート電極
6 塗布膜
7 開口部
8、8’ フォトマスク
9 第1層間絶縁膜
10 コンタクトホール
11 画素電極
12 塗布膜
13 開口部
14 第2層間絶縁膜
15 正孔輸送層
16 発光層
17 電荷輸送層
18 共通電極
19 保護膜
Claims (23)
- 下記式(a)で表されるオニウム塩。
Z-A-W-Y+(R)nX- (a)
(上記式(a)中、Z、A、W、Y、(R)n及びXは以下の意味である:
Zは、少なくとも1つの置換基を有していてもよい共役π電子系を備えた環状構造を有する1価の有機基である;
Wは、少なくとも1つの置換基を有していてもよい共役π電子系を備えた環状構造を有する2価の有機基である;
Aは、直接結合、又は、炭素-炭素一重結合、炭素-炭素二重結合及び炭素-炭素三重結合からなる群より選ばれる少なくとも1つの結合を含む2価の連結基である(なお、前記Z及びWのいずれかの置換基は、前記Z及びWのそれぞれに含まれる少なくとも1つの原子と前記Aと一緒に飽和又は部分的に飽和した環状構造を形成してもよい);
Yはヨウ素原子又は硫黄原子であり、かつヨウ素原子であるときn=1であり、Yが硫黄原子であるときn=2である;
(R)nは、互いに同一又は異なっていても良く、(R)nの各々は、置換基を有していてもよい炭素数1以上の1価の有機基である;
Xは1価のアニオンを示す。) - 前記Zは、1価のベンゼン系芳香族環基、1価の複素芳香族環基及び1価の非ベンゼン系芳香族環基からなる群より選ばれるいずれかの有機基である請求項1に記載のオニウム塩。
- 前記Wは、2価のベンゼン系芳香族環基、2価の複素芳香族環基及び2価の非ベンゼン系芳香族環基からなる群より選ばれるいずれかの有機基である請求項1又は2に記載のオニウム塩。
- 前記Z及びWの少なくともいずれかは、少なくとも1つの電子供与性基を有する請求項1~3のいずれか一項に記載のオニウム塩。
- 前記Zがフェニル基である及び/又は前記Wがフェニレン基である請求項1~4のいずれか一項に記載のオニウム塩。
- 前記少なくとも1つの電子供与性基は、アルキル基(-R1)、アリール基(-Ar1)、アルコキシ基(-OR1)、アリールオキシ基(-OAr1)、ヒドロキシ基、チオール基、アルキルチオ基(-SR1)、アミノ基、アルキルアミノ基(-NHR1)、ジアルキルアミノ基(-NR1R2)、アリールアミノ基(-NHAr1)、ジアリールアミノ基(-NAr1Ar2)及びN-アルキル-N-アリールアミノ基(-NR1Ar1)からなる群より選択されるいずれかである、請求項4又は5に記載のオニウム塩。
- 前記少なくとも1つの電子供与性基は、前記Zの前記π電子系に直接結合している請求項4~6のいずれか一項に記載のオニウム塩。
- 前記Aは直接結合又はエチニレン基である請求項1~7のいずれか一項に記載のオニウム塩。
- 前記Rが、置換基を有していてもよい炭素数1以上の1価の炭化水素基又は置換基を有していてもよいアリール基である請求項1~8のいずれか一項に記載のオニウム塩。
- 前記X-は、CF3CO2 -、CH3CO2 -、CF3CF2C4H4SO3 -、CH3SO3 -、(C6F5)4B-、SbF6 -、PF6 -、BF4 -、CF3SO3 -、HSO4 -、(CF3CF2)3PF3 -、(CF3CF2)2PF4 -、(CF3CF2)PF5 -、((CF3)2C6H3)4B-、(C6F5)4Ga-、((CF3)2C6H3)4Ga-、ノナフルオロブタンスルホン酸アニオン、ブタンスルホン酸アニオン、カンファースルホン酸アニオン、ベンゼンスルホン酸アニオン、p-トルエンスルホン酸アニオン、(CF3SO2)3C-、(CF3SO2)2N-及び(C4F9SO2)2N-からなる群より選ばれるアニオンである請求項1~9のいずれか一項に記載のオニウム塩。
- カチオン部とアニオン部とを有するオニウム塩であって、
前記カチオン部は、少なくとも第1の芳香族環と、第2の芳香族環と、カチオン中心と、を含み、
前記カチオン中心が、前記第1の芳香族環及び前記第2の芳香族環のいずれかと結合し、
前記第1の芳香族環に含まれる第1の炭素原子は、一重結合で直接、又は、炭素-炭素一重結合、炭素-炭素二重結合及び炭素-炭素三重結合からなる群より選ばれる少なくとも1つの結合を含む2価の連結基を介して、前記第2の芳香族環に含まれる第2の炭素原子に結合している、オニウム塩。 - 第1の波長を有する電磁波又は粒子線を吸収することにより、前記オニウム塩の前記第1の波長における吸光係数が減少する請求項11に記載のオニウム塩。
- 前記電磁波又は粒子線はi線である請求項11又は12に記載のオニウム塩。
- 前記第1の波長より長い波長には吸収極大を有さない請求項11~13のいずれか一項に記載のオニウム塩。
- 前記第1の炭素原子は、一重結合で直接、又は炭素-炭素二重結合及び炭素-炭素三重結合からなる群より選ばれる少なくとも1つの結合を含む2価の連結基を介して、前記第2の炭素原子に結合している請求項11~14のいずれか一項に記載のオニウム塩。
- 前記第1の芳香族環及び前記第2の芳香族環のうち少なくとも1つはベンゼン環である、請求項11~15のいずれか一項に記載のオニウム塩。
- 前記カチオン部は、さらに電子供与性基を含み、
前記電子供与性基は、前記第1の芳香族環及び前記第2の芳香族環のうち少なくとも1つに結合している、請求項12~16のいずれか一項に記載のオニウム塩。 - 前記電子供与性基は、前記第1の芳香族環及び前記第2の芳香族環のうち前記カチオン中心と結合しない芳香族環に結合している請求項17に記載のオニウム塩。
- 請求項1~18のいずれか一項に記載のオニウム塩を含む光酸発生剤。
- 請求項19に記載の光酸発生剤と、酸により反応する化合物と、を含む感光性樹脂組成物。
- 前記化合物は、酸により重合するか、酸により脱保護する保護基を有するか、酸により架橋する請求項20に記載の感光性樹脂組成物。
- 請求項20又は21に記載の感光性樹脂組成物を用いて基板上に塗布膜を形成する塗布膜形成工程と、
電磁波又は粒子線の第1の光を用いて、前記塗布膜をパターン状に露光するフォトリソグラフィ工程と、
露光された塗布膜を現像してフォトレジストパターンを得るパターン形成工程と、を含むデバイスの製造方法。 - 第1の光がi線である請求項22に記載の方法。
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BR112016006779A2 (pt) * | 2014-05-01 | 2017-08-01 | 3M Innovative Properties Co | artigos abrasivos flexíveis e método de abrasão de uma peça de trabalho |
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- 2015-05-13 WO PCT/JP2015/063830 patent/WO2015174471A1/ja active Application Filing
- 2015-05-13 JP JP2016519296A patent/JP6278367B2/ja active Active
- 2015-05-13 CN CN201580027065.8A patent/CN106458879A/zh active Pending
- 2015-05-13 US US15/310,733 patent/US20170075219A1/en not_active Abandoned
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JP2019086559A (ja) * | 2017-11-02 | 2019-06-06 | サンアプロ株式会社 | ネガ型フォトレジスト用樹脂組成物及び硬化膜 |
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US20170075219A1 (en) | 2017-03-16 |
CN106458879A (zh) | 2017-02-22 |
JPWO2015174471A1 (ja) | 2017-04-20 |
JP6278367B2 (ja) | 2018-02-14 |
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