WO2015165194A1 - 一种射频测试座和射频测试线缆 - Google Patents

一种射频测试座和射频测试线缆 Download PDF

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Publication number
WO2015165194A1
WO2015165194A1 PCT/CN2014/086763 CN2014086763W WO2015165194A1 WO 2015165194 A1 WO2015165194 A1 WO 2015165194A1 CN 2014086763 W CN2014086763 W CN 2014086763W WO 2015165194 A1 WO2015165194 A1 WO 2015165194A1
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WO
WIPO (PCT)
Prior art keywords
test
radio frequency
elastic
cable
socket
Prior art date
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PCT/CN2014/086763
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English (en)
French (fr)
Inventor
刘锋昱
Original Assignee
中兴通讯股份有限公司
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Filing date
Publication date
Application filed by 中兴通讯股份有限公司 filed Critical 中兴通讯股份有限公司
Priority to JP2016565315A priority Critical patent/JP2017520141A/ja
Priority to KR1020167031310A priority patent/KR101900171B1/ko
Priority to US15/307,307 priority patent/US10168355B2/en
Priority to EP14890952.6A priority patent/EP3139579B1/en
Priority to ES14890952T priority patent/ES2813675T3/es
Publication of WO2015165194A1 publication Critical patent/WO2015165194A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/045—Sockets or component fixtures for RF or HF testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/44—Testing lamps
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/66—Structural association with built-in electrical component
    • H01R13/70—Structural association with built-in electrical component with built-in switch
    • H01R13/703—Structural association with built-in electrical component with built-in switch operated by engagement or disengagement of coupling parts, e.g. dual-continuity coupling part
    • H01R13/7031—Shorting, shunting or bussing of different terminals interrupted or effected on engagement of coupling part, e.g. for ESD protection, line continuity
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/66—Structural association with built-in electrical component
    • H01R13/70—Structural association with built-in electrical component with built-in switch
    • H01R13/703—Structural association with built-in electrical component with built-in switch operated by engagement or disengagement of coupling parts, e.g. dual-continuity coupling part
    • H01R13/7036—Structural association with built-in electrical component with built-in switch operated by engagement or disengagement of coupling parts, e.g. dual-continuity coupling part the switch being in series with coupling part, e.g. dead coupling, explosion proof coupling
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M1/00—Substation equipment, e.g. for use by subscribers
    • H04M1/24—Arrangements for testing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/02—Connectors or connections adapted for particular applications for antennas
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
    • H01R24/38—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
    • H01R24/40—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency
    • H01R24/42—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency comprising impedance matching means or electrical components, e.g. filters or switches
    • H01R24/46—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency comprising impedance matching means or electrical components, e.g. filters or switches comprising switches

Definitions

  • the present invention relates to the field of terminal radio frequency testing technologies, and in particular, to an RF test socket and an RF test cable.
  • the RF test socket used now is mainly used to test the power and sensitivity of the RF cable.
  • the signal can flow in both directions.
  • the line with the arrow is the signal line.
  • the direction of the arrow indicates the flow of the signal.
  • the signal can only be single-passed.
  • Figure 2 and Figure 3 show the schematic diagram of the RF test socket and the RF test cable.
  • the RF test socket is unidirectional, and is only conductive with the RF chip.
  • the motherboard must be destroyed to make a test antenna passive fixture
  • the passive board usually has a certain difference from the active board. We can't adjust the antenna performance of the standing wave and the active board test on the passive board.
  • an embodiment of the present invention provides a radio frequency test socket and an RF test cable.
  • the embodiments of the present invention provide a radio frequency test socket and a radio frequency test cable to solve at least the problem that the antenna passive board and the radio frequency active board can be unified when the antenna fixture is not required to be damaged in the related art. .
  • a radio frequency test socket including:
  • the first elastic device and the second elastic device fixed in the RF test stand are respectively elastically connected to the connecting device.
  • the connecting device includes:
  • the first contact point and the second contact point are disposed at both ends of the lower side of the metal piece.
  • the first elastic means is elastically coupled to the first contact point of the connecting means
  • the second elastic means is elastically coupled to the second contact point of the connecting means
  • a radio frequency test cable including:
  • An insulating thimble device mounted on one side of the RF test plug and longer than the RF test plug.
  • a mobile phone radio frequency testing device including:
  • the test module is configured to perform testing by using the RF test cable and the RF test socket respectively by a first test device and a second test device respectively connected by the first elastic device and the second elastic device in the RF test socket.
  • the test module includes:
  • a first test sub-module configured to press the second elastic device with the insulating thimble device to disconnect the RF test cable from the second test device while using the RF test plug and the device
  • the connecting devices are connected for testing via the first testing device connected by the first elastic device.
  • the test module further includes:
  • a second test sub-module configured to press the first elastic device with the insulating thimble device, disconnect the RF test cable from the first test device, and utilize the RF test plug and the device
  • the connecting means are connected for testing via the second testing means connected by the second resilient means.
  • the second elastic device When the insulating thimble device presses the second elastic device, the second elastic device is disconnected from the second contact point of the connecting device to be elastically connected, so that the radio frequency test cable and the first testing device disconnect.
  • the first elastic device When the insulating thimble device presses the first elastic device, the first elastic device is disconnected from the first contact point of the connecting device to be elastically connected, so that the radio frequency test cable and the second testing device are disconnect.
  • a mobile phone radio frequency testing method including the following steps:
  • the first test device and the second test device are connected by a first elastic device connected to the first test device and a second elastic device connected to the second test device in the RF test socket;
  • the insulating thimble device of the RF test cable is connected to the second test device by pressing the second elastic device, and the first test device is connected to the first test device via the RF test head and the first elastic device. test;
  • the insulating thimble device of the RF test cable is connected to the first test device by pressing the first elastic device, and the second test device is connected to the second test device via the RF test head and the second elastic device. test.
  • the first test unit and the second test unit can be unified by using the RF test socket and the RF test cable, and the antenna fixture is not required to be damaged to improve the user experience.
  • FIG. 1 is a bottom view of a radio frequency test socket provided by a related art
  • FIG. 2 is a schematic diagram of a radio frequency test socket provided by the related art
  • FIG. 3 is a schematic diagram of a radio frequency test cable provided by the related art
  • FIG. 4 is a structural diagram of an operation of a radio frequency test socket and an RF test cable provided by the related art
  • FIG. 5 is a schematic diagram of a radio frequency test socket provided by the present invention.
  • FIG. 6 is a schematic diagram of an RF test cable provided by the present invention.
  • FIG. 7 is a schematic diagram of an apparatus for radio frequency test of a mobile phone according to an embodiment of the present invention.
  • FIG. 8 is a flowchart of a method for radio frequency test of a mobile phone according to an embodiment of the present invention.
  • FIG. 9 is a schematic diagram of testing a radio frequency test socket according to an embodiment of the present invention.
  • FIG. 10 is a schematic diagram of testing power and sensitivity of a radio frequency cable according to an embodiment of the present invention.
  • FIG. 11 is a schematic diagram of a passive waveform of a test cell phone antenna according to an embodiment of the present invention.
  • FIG. 5 is a schematic diagram of an RF test socket provided by the present invention.
  • the method includes: an RF test stand; and a connection device fixed in the RF test stand, configured to be connected with an RF test cable.
  • the first elastic device and the second elastic device fixed in the RF test rig are respectively elastically connected to the connecting device, and are configured to connect/disconnect the RF test cable and the first test device and the second test Device.
  • the connecting device comprises: a metal piece; a first contact point and a second contact point disposed at two ends of the lower side of the metal piece.
  • the first elastic means is elastically coupled to the first contact point of the connecting means
  • the second elastic means is elastically coupled to the second contact point of the connecting means.
  • FIG. 6 is a schematic diagram of a radio frequency test cable provided by the present invention, as shown in FIG. 6, including: a radio frequency test plug fixed at an end of the radio frequency test line, and configured to be connected to a connection device of the radio frequency test socket; An insulating thimble device mounted on one side of the radio frequency test plug and longer than the radio frequency test plug is configured to press a first elastic device or a second elastic device in the radio frequency test socket.
  • FIG. 7 is a schematic diagram of a device for radio frequency test of a mobile phone according to an embodiment of the present invention.
  • the radio frequency test socket 701; the radio frequency test cable 702; and the test module 703 are respectively configured to pass radio frequency test.
  • a first testing device and a second testing device connected to the first elastic device and the second elastic device in the seat, The RF test cable and the RF test socket are separately tested.
  • the test module 703 includes: a first test sub-module configured to press the second elastic device with the ejector device to disconnect the RF test cable from the second test device Simultaneously using the radio frequency test plug to connect with the connecting device for testing via the first testing device connected by the first elastic device; specifically, the insulating thimble device presses the second device When the elastic device is disconnected, the second elastic device is disconnected from the second contact point of the connecting device to be elastically connected, so that the radio frequency test cable is disconnected from the first testing device.
  • a second test sub-module configured to press the first elastic device with the thimble device to disconnect the RF test cable from the first test device while using the RF test plug and the
  • the connecting device is connected for testing by the second testing device connected by the second elastic device, in particular, the first elastic device is disconnected when the insulating thimble device presses the first elastic device
  • the device is resiliently coupled to the first contact point of the connection device such that the RF test cable is disconnected from the second test device.
  • FIG. 8 is a flowchart of a method for radio frequency test of a mobile phone according to an embodiment of the present invention. As shown in FIG. 8, the method includes the following steps:
  • Step S801 the first testing device and the second testing device are connected by a first elastic device connected to the first testing device and a second elastic device connected to the second testing device in the RF test socket;
  • Step S802 The insulating thimble device of the radio frequency test cable is connected to the second test device by pressing the second elastic device, so as to be connected to the second test device via the radio frequency test head and the first elastic device. Testing the device for testing;
  • Step S803 The insulating thimble device of the radio frequency test cable is connected to the first test device by pressing the first elastic device, so as to be connected to the first test device via the radio frequency test head and the second elastic device pair. The test device is tested.
  • FIG. 9 is a schematic diagram showing the test of the radio frequency test socket provided by the embodiment of the present invention. As shown in FIG. 9 , when the reed is received by the hard plastic ejector pin, it is disconnected from the intermediate metal piece, and the signal of the circuit is broken. The other signal is turned on and the RF test cable is turned on.
  • FIG. 10 is a schematic diagram showing the power and sensitivity of a test RF cable according to an embodiment of the present invention.
  • the RF test cable is inserted into the RF test socket according to the first direction, so that the RF test cable is The RF test plug is in contact with the metal piece of the RF test socket, and the insulating thimble of the RF test cable is pressed down against the second reed of the RF test socket; Contacting the metal sheet, and the insulating thimble pressing the second reed downwardly, disconnecting the radio frequency test socket from the mobile phone antenna, and passing the radio frequency test cable via the first A reed is coupled to the radio frequency transceiver to test the radio frequency transceiver.
  • the number in the RF test socket that connects the mobile phone antenna The second reed is squeezed, the second reed being disconnected from the metal piece in the radio frequency test socket, such that the radio frequency test cable is connected to the radio frequency transceiver via the first reed to The transceiver is tested.
  • FIG 11 is a schematic diagram showing the passive waveform of the test cell phone antenna provided by the embodiment of the present invention.
  • the radio frequency test cable is inserted into the radio frequency test socket according to the second direction, so that the radio frequency test cable is
  • the RF test plug is in contact with the metal piece of the RF test socket, and the insulating thimble of the RF test cable is pressed down against the first reed of the RF test socket;
  • the metal sheets are in contact, and the insulating thimble presses the first reed downwardly, disconnecting the radio frequency test socket from the radio frequency transceiver, and the radio frequency test cable is A second reed is coupled to the handset antenna for testing the handset antenna.
  • the first reed in the RF test socket that connects the RF transceiver is squeezed, and the first reed is disconnected from the metal piece in the RF test socket to make the RF test cable
  • the handset antenna is connected via the second reed to test the S11 and Smith charts of the handset antenna.
  • the embodiment of the present invention only needs to turn the RF test line in one direction, and the two states of FIG. 10 and FIG. 11 can be realized.
  • the antenna passive board and the radio frequency active board can be unified by using a new type of radio frequency test socket and the matched radio frequency test cable, and the antenna fixture can be fabricated without destroying the main board.
  • the radio frequency test socket and the radio frequency test cable provided by the embodiments of the present invention have the following beneficial effects: the first test unit and the second test unit are implemented by the radio frequency test socket and the radio frequency test cable in the embodiment of the present invention. Can be unified, do not need to damage the motherboard to make antenna fixtures, improve the user experience.

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Signal Processing (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Details Of Connecting Devices For Male And Female Coupling (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Telephone Function (AREA)
  • Telephone Set Structure (AREA)

Abstract

本发明公开了一种射频测试座和射频测试线缆，涉及射频测试技术领域，其射频测试方法包括：第一测试装置与第二测试装置通过射频测试座中的连接第一测试装置的第一弹性装置和连接第二测试装置的第二弹性装置进行连接；射频测试线缆的绝缘顶针装置通过顶压所述第二弹性装置，断开射频测试座与第二测试装置连接，以便经由所述射频测试头和所述第一弹性装置对第一测试装置进行测试；射频测试线缆的绝缘顶针装置通过顶压所述第一弹性装置，断开射频测试座与第一测试装置连接，以便经由所述射频测试头和所述第二弹性装置对第二测试装置进行测试。

Description

一种射频测试座和射频测试线缆 技术领域
本发明涉及终端射频测试技术领域，特别涉及一种射频测试座和射频测试线缆。
背景技术
现在所使用的射频测试座，主要是用来测试射频线缆的功率和灵敏度的，当不插入射频测试线缆的时候，信号可以双向流通，如图1所示，带箭头的线是信号线，箭头的方向表示信号的流向，但是，当插入射频测试线缆的时候，信号只能单向导通，如图2和图3分别显示了射频测试座和射频测试线缆的示意图。如图4所示，在测试射频线缆功率的场景，当射频测试线缆连接到射频测试座的时候，射频测试座就是单向导通的，只与射频芯片这边是导通的，与天线这一端是断开的，也就是说，当不插入射频测试线缆的时候，射频测试座里面一个簧片是在图中虚线所在的状态。当插入射频测试线缆的时候，射频测试座中的簧片就从虚线的状态，被往下挤压到了实线这个状态。
也就是说，LTE的终端上在每个射频芯片和天线之间都有一个射频测试座，现有的射频测试座在插上射频测试线缆以后，只有单向导通，如果需要测量天线的S11参数或者史密斯Smith圆图的时候，必须把射频测试座吹掉，把射频测试线缆焊到主板上。这样做有几个缺点：
1、必须破坏主板来制作测试天线无源治具；
2、无源板通常和有源板有一定的差异，我们在无源板上调好天线的驻波和有源板测试的天线性能经常不能一一对应；
3、如果更换主板射频匹配或者更换主板厂家，我们需要重新制作无源板，这样就需要破坏很多主板。
为解决上述问题，本发明实施例提供了一种射频测试座和射频测试线缆。
发明内容
本发明实施例提供了一种射频测试座和射频测试线缆，以至少解决相关技术中在不需要破坏主板来制作天线治具时，使得天线无源板和射频有源板可以统一起来的问题。
根据本发明的一个实施例，提供了一种射频测试座，包括：
射频测试机座；
固定在所述射频测试机座内的连接装置；
固定在所述射频测试机座内的第一弹性装置和第二弹性装置，分别与所述连接装置弹性连接。
所述连接装置包括：
金属片；
设置在所述金属片下侧两端的第一接触点和第二接触点。
所述第一弹性装置与所述连接装置的第一接触点弹性连接，所述第二弹性装置与所述连接装置的第二接触点弹性连接。
根据本发明的另一个实施例，提供了一种射频测试线缆，包括：
固定在射频测试线末端的射频测试插头；
安装在所述射频测试插头一侧并长于所述射频测试插头的绝缘顶针装置。
根据本发明的另一个实施例，提供了一种手机射频测试设备，包括：
上述射频测试座；
上述射频测试线缆；
测试模块，设置为分别通过射频测试座中的第一弹性装置和第二弹性装置连接的第一测试装置和第二测试装置，利用所述射频测试线缆和所述射频测试座分别进行测试。
所述测试模块包括：
第一测试子模块，设置为利用所述绝缘顶针装置顶压所述第二弹性装置，断开所述射频测试线缆与所述第二测试装置的连接，同时利用所述射频测试插头与所述连接装置相连接，以便经由所述第一弹性装置连接的所述第一测试装置进行测试。
所述测试模块还包括：
第二测试子模块，设置为利用所述绝缘顶针装置顶压所述第一弹性装置，断开所述射频测试线缆与所述第一测试装置的连接，同时利用所述射频测试插头与所述连接装置相连接，以便经由所述第二弹性装置连接的所述第二测试装置进行测试。
所述绝缘顶针装置顶压所述第二弹性装置时，断开所述第二弹性装置与所述连接装置的第二接触点弹性连接，使得所述射频测试线缆与所述第一测试装置断开。
所述绝缘顶针装置顶压所述第一弹性装置时，断开所述第一弹性装置与所述连接装置的第一接触点弹性连接，使得所述射频测试线缆与所述第二测试装置断开。
根据本发明的另一个实施例，提供了一种手机射频测试方法，包括以下步骤：
第一测试装置与第二测试装置通过射频测试座中的连接第一测试装置的第一弹性装置和连接第二测试装置的第二弹性装置进行连接；
射频测试线缆的绝缘顶针装置通过顶压所述第二弹性装置，断开射频测试座与第二测试装置连接，以便经由所述射频测试头和所述第一弹性装置对第一测试装置进行测试；
射频测试线缆的绝缘顶针装置通过顶压所述第一弹性装置，断开射频测试座与第一测试装置连接，以便经由所述射频测试头和所述第二弹性装置对第二测试装置进行测试。
与相关技术相比较，本发明实施例的有益效果在于：
本发明实施例通过射频测试座和射频测试线缆，使第一测试单元和第二测试单元可以统一起来，不需要破坏主板来制作天线治具，提高了用户体验。
附图说明
图1是相关技术提供的射频测试座的仰视图；
图2是相关技术提供的射频测试座的示意图；
图3是相关技术提供的射频测试线缆的示意图；
图4是相关技术提供的射频测试座和射频测试线缆工作的结构图；
图5是本发明提供的一种射频测试座的示意图；
图6是本发明提供的一种射频测试线缆的示意图；
图7是本发明实施例提供的一种手机射频测试的装置示意图；
图8是本发明实施例提供的一种手机射频测试的方法流程图；
图9是本发明实施例提供的射频测试座进行测试的示意图；
图10是本发明实施例提供的测试射频线缆功率和灵敏度的示意图；
图11是本发明实施例提供的测试手机天线的无源波形的示意图。
具体实施方式
以下结合附图对本发明的优选实施例进行详细说明，应当理解，以下所说明的优选实施例仅用于说明和解释本发明，并不用于限定本发明。
图5显示了本发明提供的一种射频测试座的示意图，如图5所示，包括：射频测试机座；固定在所述射频测试机座内的连接装置，设置为与射频测试线缆相连接；固定在所述射频测试机座内的第一弹性装置和第二弹性装置，分别与所述连接装置弹性连接，设置为连接/断开射频测试线缆与第一测试装置和第二测试装置。其中，所述连接装置包括：金属片；设置在所述金属片下侧两端的第一接触点和第二接触点。所述第一弹性装置与所述连接装置的第一接触点弹性连接，所述第二弹性装置与所述连接装置的第二接触点弹性连接。
图6显示了本发明提供的一种射频测试线缆的示意图，如图6所示，包括：固定在射频测试线末端的射频测试插头，设置为与所述射频测试座的连接装置相连接；安装在所述射频测试插头一侧并长于所述射频测试插头的绝缘顶针装置，设置为顶压所述射频测试座中的第一弹性装置或第二弹性装置。
图7显示了本发明实施例提供的一种手机射频测试的装置示意图，如图7所示，包括：上述射频测试座701；上述射频测试线缆702；测试模块703，设置为分别通过射频测试座中的第一弹性装置和第二弹性装置连接的第一测试装置和第二测试装置， 利用所述射频测试线缆和所述射频测试座分别进行测试。具体地说，所述测试模块703包括：第一测试子模块，设置为利用所述顶针装置顶压所述第二弹性装置，断开所述射频测试线缆与所述第二测试装置的连接，同时利用所述射频测试插头与所述连接装置相连接，以便经由所述第一弹性装置连接的所述第一测试装置进行测试；具体地说，所述绝缘顶针装置顶压所述第二弹性装置时，断开所述第二弹性装置与所述连接装置的第二接触点弹性连接，使得所述射频测试线缆与所述第一测试装置断开。第二测试子模块，设置为利用所述顶针装置顶压所述第一弹性装置，断开所述射频测试线缆与所述第一测试装置的连接，同时利用所述射频测试插头与所述连接装置相连接，以便经由所述第二弹性装置连接的所述第二测试装置进行测试，具体地说，所述绝缘顶针装置顶压所述第一弹性装置时，断开所述第一弹性装置与所述连接装置的第一接触点弹性连接，使得所述射频测试线缆与所述第二测试装置断开。
图8显示了本发明实施例提供的一种手机射频测试的方法流程图，如图8所示，包括以下步骤：
步骤S801：第一测试装置与第二测试装置通过射频测试座中的连接第一测试装置的第一弹性装置和连接第二测试装置的第二弹性装置进行连接；
步骤S802：射频测试线缆的绝缘顶针装置通过顶压所述第二弹性装置，断开射频测试座与第二测试装置连接，以便经由所述射频测试头和所述第一弹性装置对第一测试装置进行测试；
步骤S803：射频测试线缆的绝缘顶针装置通过顶压所述第一弹性装置，断开射频测试座与第一测试装置连接，以便经由所述射频测试头和所述第二弹性装置对第二测试装置进行测试。
图9显示了本发明实施例提供的射频测试座进行测试的示意图，如图9所示，当一边簧片收到硬塑料顶针挤压时，就和中间金属片断开，这路的信号就断开了，另外一路的信号与射频测试线缆导通。
图10显示了本发明实施例提供的测试射频线缆功率和灵敏度的示意图，如图10所示，按照第一方向，将射频测试线缆插入到射频测试座中，使得所述射频测试线缆的射频测试插头与所述射频测试座的金属片相接触，并使所述射频测试线缆的绝缘顶针向下顶压所述射频测试座的第二簧片；利用所述射频测试插头与所述金属片相接触，以及所述绝缘顶针向下顶压所述第二簧片，断开所述射频测试座与所述手机天线的连接，并使所述射频测试线缆经由所述第一簧片连接所述射频无线电收发机，以便对所述射频无线电收发机进行测试。也就是说，连接手机天线这一路的射频测试座中的第 二簧片被挤压，所述第二簧片与射频测试座中的金属片断开，使得所述射频测试线缆经由所述第一簧片连接所述射频无线电收发机，以便对所述射频无线电收发机进行测试。
图11显示了本发明实施例提供的测试手机天线的无源波形的示意图，如图11所示，按照第二方向，将射频测试线缆插入到射频测试座中，使得所述射频测试线缆的射频测试插头与所述射频测试座的金属片相接触，并使所述射频测试线缆的绝缘顶针向下顶压所述射频测试座的第一簧片；利用所述射频测试插头与所述金属片相接触，以及所述绝缘顶针向下顶压所述第一簧片，断开所述射频测试座与所述射频无线电收发机的连接，并使所述射频测试线缆经由所述第二簧片连接所述手机天线，以便对所述手机天线进行测试。也就是说，连接所述射频无线电收发机这一路的射频测试座中的第一簧片被挤压，所述第一簧片与射频测试座中的金属片断开，使所述射频测试线缆经由所述第二簧片连接所述手机天线，以便对所述手机天线的S11和Smith圆图进行测试。
此外，本发明实施例只需要把射频测试线转一个方向，就可以实现图10和图11的两种状态了。
综上所述，本发明实施例具有以下技术效果：
本发明实施例通过新型的射频测试座和与之配套的射频测试线缆，使天线无源板和射频有源板可以统一起来，不需要破坏主板来制作天线治具。
尽管上文对本发明进行了详细说明，但是本发明不限于此，本技术领域技术人员可以根据本发明的原理进行各种修改。因此，凡按照本发明原理所作的修改，都应当理解为落入本发明的保护范围。
工业实用性
如上所述，本发明实施例提供的一种射频测试座和射频测试线缆，具有以下有益效果：本发明实施例通过射频测试座和射频测试线缆，使第一测试单元和第二测试单元可以统一起来，不需要破坏主板来制作天线治具，提高了用户体验。

Claims (10)

  1. 一种射频测试座，包括：
    射频测试机座；
    固定在所述射频测试机座内的连接装置；
    固定在所述射频测试机座内的第一弹性装置和第二弹性装置，分别与所述连接装置弹性连接。
  2. 根据权利要求1所述的射频测试座，其中，所述连接装置包括：
    金属片；
    设置在所述金属片下侧两端的第一接触点和第二接触点。
  3. 根据权利要求2所述的射频测试座，其中，所述第一弹性装置与所述连接装置的第一接触点弹性连接，所述第二弹性装置与所述连接装置的第二接触点弹性连接。
  4. 一种射频测试线缆，包括：
    固定在射频测试线末端的射频测试插头；
    安装在所述射频测试插头一侧并长于所述射频测试插头的绝缘顶针装置。
  5. 一种手机射频测试设备，包括：
    权利要求1-3所述的射频测试座；
    权利要求4所述的射频测试线缆；
    测试模块，设置为分别通过射频测试座中的第一弹性装置和第二弹性装置连接的第一测试装置和第二测试装置，利用所述射频测试线缆和所述射频测试座分别进行测试。
  6. 根据权利要求5所述的设备，其中，所述测试模块包括：
    第一测试子模块，设置为利用所述绝缘顶针装置顶压所述第二弹性装置，断开所述射频测试线缆与所述第二测试装置的连接，同时利用所述射频测试插头与所述连接装置相连接，以便经由所述第一弹性装置连接的所述第一测试装置进行测试。
  7. 根据权利要求5所述的设备，其中，所述测试模块还包括：
    第二测试子模块，设置为利用所述绝缘顶针装置顶压所述第一弹性装置，断开所述射频测试线缆与所述第一测试装置的连接，同时利用所述射频测试插头与所述连接装置相连接，以便经由所述第二弹性装置连接的所述第二测试装置进行测试。
  8. 根据权利要求6所述的设备，其中，所述绝缘顶针装置顶压所述第二弹性装置时，断开所述第二弹性装置与所述连接装置的第二接触点弹性连接，使得所述射频测试线缆与所述第一测试装置断开。
  9. 根据权利要求7所述的设备，其中，所述绝缘顶针装置顶压所述第一弹性装置时，断开所述第一弹性装置与所述连接装置的第一接触点弹性连接，使得所述射频测试线缆与所述第二测试装置断开。
  10. 一种手机射频测试方法，包括以下步骤：
    第一测试装置与第二测试装置通过射频测试座中的连接第一测试装置的第一弹性装置和连接第二测试装置的第二弹性装置进行连接；
    射频测试线缆的绝缘顶针装置通过顶压所述第二弹性装置，断开射频测试座与第二测试装置连接，以便经由所述射频测试头和所述第一弹性装置对第一测试装置进行测试；
    射频测试线缆的绝缘顶针装置通过顶压所述第一弹性装置，断开射频测试座与第一测试装置连接，以便经由所述射频测试头和所述第二弹性装置对第二测试装置进行测试。
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EP3139579B1 (en) 2020-07-22
EP3139579A4 (en) 2018-01-10
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US10168355B2 (en) 2019-01-01
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