WO2015093194A1 - 計測装置 - Google Patents
計測装置 Download PDFInfo
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- WO2015093194A1 WO2015093194A1 PCT/JP2014/080077 JP2014080077W WO2015093194A1 WO 2015093194 A1 WO2015093194 A1 WO 2015093194A1 JP 2014080077 W JP2014080077 W JP 2014080077W WO 2015093194 A1 WO2015093194 A1 WO 2015093194A1
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- Prior art keywords
- irradiation
- imaging
- light
- specified wavelength
- wavelength
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B17/00—Details of cameras or camera bodies; Accessories therefor
- G03B17/55—Details of cameras or camera bodies; Accessories therefor with provision for heating or cooling, e.g. in aircraft
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/50—Constructional details
- H04N23/51—Housings
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/90—Arrangement of cameras or camera modules, e.g. multiple cameras in TV studios or sports stadiums
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B35/00—Stereoscopic photography
- G03B35/08—Stereoscopic photography by simultaneous recording
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10004—Still image; Photographic image
- G06T2207/10012—Stereo images
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10024—Color image
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10141—Special mode during image acquisition
- G06T2207/10152—Varying illumination
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
Definitions
- the present invention relates to a measuring apparatus for measuring the surface shape of a measurement object.
- a measuring device that measures the surface shape of a measurement object by three-dimensional image measurement is known.
- an apparatus including one imaging unit and a shape recognition device is known.
- One imaging unit is a unit that irradiates light of a prescribed irradiation pattern and images a region irradiated with the light of the irradiation pattern.
- an imaging unit for example, an imaging unit including one irradiator and two imaging devices has been proposed (see Patent Document 1).
- the irradiator irradiates a fringe-like (grid-like) light onto a predetermined area.
- Each of the imaging devices images a common area on the measurement object on which the fringe fringe from the irradiator is projected.
- Each of the irradiator and the imaging device is fixed to the frame at a predetermined distance and attachment angle. That is, one irradiator and two imaging devices are arranged so that their positional relationship is a predetermined relationship.
- the shape recognition device in the measuring device described in Patent Document 1 recognizes the surface shape (three-dimensional shape) of the measurement object from the images captured by the respective imaging devices by the active measurement method in the three-dimensional image measurement. . That is, the measuring device described in Patent Document 1 operates one irradiator and two imaging devices as one imaging unit, and changes the surface shape of the measurement object based on the images captured by the imaging devices. recognize.
- the time length required for recognizing the surface shape of the measurement object in the measurement device is shortened as much as possible.
- the measurement apparatus of the present invention includes at least two or more irradiation units, at least two or more imaging units, and a measurement unit.
- each irradiation means irradiates the specified wavelength light which is the light of the specified wavelength with the set irradiation pattern.
- Each imaging unit is paired with one of the irradiating units, and is arranged so that the positional relationship with the corresponding irradiating unit is a predetermined positional relationship defined in advance. Then, each of the imaging units images an irradiation region of the measurement object onto which the irradiation pattern by the specified wavelength light irradiated by the corresponding irradiation unit is projected.
- each of the irradiation means uses light of a specified wavelength defined as a different wavelength as the specified wavelength light, and a part of the irradiation pattern is measured on the object to be measured. Irradiation is performed so as to overlap a part of the irradiation pattern from the irradiation means. Then, each of the imaging means passes through the irradiation region of the measurement object on which the irradiation pattern by the specified wavelength light irradiated by the paired irradiation means is projected, and passes the light of the specified wavelength in the paired irradiation means. In addition, an image is taken through a specified wavelength transmission filter that blocks light of wavelengths other than the specified wavelength.
- the measuring means calculates the surface shape in each irradiation region of the measurement object based on each of the images taken by the imaging means and the specified positional relationship with the irradiation means that makes a pair with the imaging means that picked up each image. measure.
- a plurality of regions in the measurement object can be imaged at the same timing by a plurality of pairs of irradiation means and imaging means that make a pair. Furthermore, according to one aspect of the measurement apparatus of the present invention, it is not necessary to move one pair of the irradiation unit and the imaging unit that make a pair when imaging a plurality of regions in the measurement object. Therefore, according to one aspect of the measurement apparatus of the present invention, the surface shape over a wide range of the measurement object can be recognized in a short time.
- the time required to recognize the surface shape of the measurement object can be shortened as much as possible.
- the measuring apparatus when recognizing the entire surface shape of the measurement object based on each of the images picked up by the plurality of image pickup means, it is necessary to integrate the surface shape in each irradiation region of the measurement object on one plane. There is.
- the prescribed wavelength light (irradiation pattern) from each of the irradiation means is partially overlapped on the measurement object.
- the surface shape based on the image imaged by each of the imaging means can be easily integrated on one plane with reference to specific points (for example, specific four points) in a part overlapping each other.
- the surface shape in each irradiation region recognized from a plurality of images can be easily recognized as the surface shape in one space.
- the bandwidths of the prescribed wavelengths of the prescribed wavelength light emitted by each of the irradiation means are non-overlapping. For this reason, according to one aspect of the measurement apparatus of the present invention, even if the prescribed wavelength lights (irradiation patterns) from different irradiation means overlap, it is possible to reduce the occurrence of light interference in the region.
- the measurement apparatus of the present invention it is possible to reduce the occurrence of unnecessary deformation in each irradiation pattern, and it is possible to suppress a reduction in the recognition accuracy of the surface shape of the measurement object.
- the surface shape over a wide range of the measurement object can be accurately recognized, and the surface shape of the measurement object is recognized. Can be shortened as much as possible.
- the measuring device of the present invention is applied to an inspection process in a production line that produces a large amount of products, the surface shape of a large number of products can be inspected at high speed.
- the measurement apparatus of the present invention in one set of the irradiation unit and the imaging unit, even if the measurement target has a complicated surface shape that causes a blind spot, another set of irradiation unit and The blind spot can be covered by the imaging means. For this reason, according to one aspect of the measurement apparatus of the present invention, the surface shape of the measurement object can be accurately recognized even if the measurement object has a complicated surface shape.
- a housing may be provided in which each of the pair of irradiation means and imaging means is held and stored in a specified positional relationship.
- one aspect of the measurement apparatus of the present invention may include a cooling unit that cools the irradiation unit and the imaging unit housed in the housing by the gas taken into the housing.
- the irradiation means and the imaging means housed in the housing can be cooled. For this reason, it can reduce that the member (namely, housing
- One aspect of the measurement apparatus of the present invention may include a first optical element and a second optical element.
- a 1st optical element is an optical element provided in the housing
- the second optical element is on the path of light from the outside of the casing to the imaging means housed in each casing, and is provided on the casing so as to form the outer surface of the casing It is an optical element.
- the light from the irradiating means is irradiated to the outside via the first optical element provided in the housing, and the imaging means is provided via the second optical element provided in the housing. Light enters.
- the irradiation pattern does not become a predetermined pattern, or noise appears in the image captured by the imaging means.
- the measurement accuracy of the surface shape of the measurement object is lowered.
- the cooling means cools the irradiation means and the imaging means housed in the housing, and the outer surfaces of the first optical element and the second optical element. You may provide the ejection means which ejects toward.
- the present invention can be realized in various forms such as a program executed by a computer and a measurement method in order to measure the shape of a measurement object in addition to the measurement apparatus described above.
- a measuring apparatus 1 shown in FIG. 1 is a system that measures the surface shape of a measurement object 100.
- the measuring device 1 includes a frame 3, a first imaging unit 20, a second imaging unit 50, and a shape measuring device 70.
- the frame 3 includes side wall portions 5 and 7 and a top plate portion 9 spanned over the upper ends of the side wall portions 5 and 7.
- the measurement object 100 is arranged in an open space surrounded by the side wall portions 5 and 7 and the top plate portion 9.
- the measurement object 100 is an object having irregularities on the surface.
- the measurement object 100 may be, for example, an industrial product that is produced in large quantities in a factory.
- the measuring device 1 may be used to measure the surface shape of each measurement object 100 in an environment where a large amount of the measurement object 100 moves sequentially. That is, the measuring device 1 may be used in an inspection process in a production line that produces the measurement object 100, and the measurement object 100 may be conveyed by a conveying means such as a belt conveyor.
- the first imaging unit 20 irradiates light of a prescribed wavelength, which is a wavelength in a prescribed band, with a prescribed irradiation pattern, and images a region irradiated with the light of the prescribed wavelength.
- a prescribed wavelength which is a wavelength in a prescribed band
- a prescribed irradiation pattern images a region irradiated with the light of the prescribed wavelength.
- the light irradiated by the first imaging unit 20 is referred to as a first specified wavelength light
- the wavelength in the first specified wavelength light is referred to as a first specified wavelength.
- the second imaging unit 50 irradiates light of a specified wavelength with a specified irradiation pattern, and images a region irradiated with the light of that wavelength.
- the light emitted by the second imaging unit 50 is referred to as second specified wavelength light
- the wavelength of the second specified wavelength light is referred to as second specified wavelength. Irradiation of the second specified wavelength light by the second imaging unit 50 is such that part of the irradiation pattern of the second specified wavelength light from the second imaging unit 50 is irradiated with the first specified wavelength light from the first imaging unit 20. It is carried out so as to overlap a part of the pattern.
- the second specified wavelength light mentioned here is light having a wavelength different from the first specified wavelength (that is, non-overlapping).
- a red wavelength is assumed as the first specified wavelength
- a blue wavelength is assumed as the second specified wavelength.
- the first imaging unit 20 is attached to the frame 3.
- the first imaging unit 20 is attached to the frame 3 such that the irradiation pattern with the first specified wavelength light is irradiated to the first irradiation region.
- the first irradiation region is a region defined in advance as a region irradiated with the first specified wavelength light from the first imaging unit 20.
- the second imaging unit 50 is attached to the frame 3.
- the second imaging unit 50 is attached to the frame 3 so that the second irradiation region is irradiated with the irradiation pattern by the second specified wavelength light.
- the second irradiation region is a region defined in advance as a region irradiated with the second specified wavelength light from the second imaging unit 50.
- the second irradiation region is defined on the outer surface of the measurement object 100 such that a part of the second irradiation region overlaps a part of the first irradiation region.
- the shape measuring device 70 measures (recognizes) the surface shape of the measuring object 100 based on each of the images picked up by the first image pickup units 20 and 50 according to a known three-dimensional image measuring method.
- the shape measuring device 70 is configured around a known computer having at least a ROM 71, a RAM 72, and a CPU 73, as shown in FIG.
- the ROM 71 stores processing programs and / or data that need to retain the stored contents even when the power is turned off.
- the RAM 72 temporarily stores processing programs and / or data.
- the CPU 73 executes various processes according to the processing program stored in the ROM 71 and / or the RAM 72.
- the ROM 71 stores a processing program for the shape measuring apparatus 70 to execute a shape recognition process for recognizing the surface shape of the measurement object 100 based on images captured by the imaging units 20 and 50. .
- the measurement object 100 is irradiated with light having an irradiation pattern formed in a grid shape in advance, and the measurement object is based on the degree of distortion of the irradiation pattern projected onto the measurement object 100.
- a method of measuring the surface shape of the object 100 is used.
- a moire method can be considered.
- Such a method is a well-known method as described in, for example, Japanese Patent No. 3781438 and Japanese Patent No. 3519698, and therefore detailed description in this embodiment is omitted.
- ⁇ Imaging unit> Next, the first imaging unit 20 will be described.
- the first imaging unit 20 shown in FIG. 3 includes one irradiation device 22, one imaging device 30, a housing 42, and a cooling dustproof mechanism 74 (see FIG. 6).
- the irradiation device 22 is a device that irradiates light with a first specified wavelength in an irradiation pattern, and includes a light emitting unit 24, an irradiation pattern generation unit 26, and a first optical element 28 as shown in FIG. .
- the light emitting unit 24 is a light emitting device that emits light having a first specified wavelength as first specified wavelength light.
- the light emitting unit 24 may be configured by a red light emitting diode or a red laser diode.
- the irradiation pattern generation unit 26 is a member in which slits and / or holes are formed in a shape suitable for the irradiation pattern.
- the irradiation pattern generation unit 26 irradiates the specified wavelength light by the irradiation pattern by allowing the specified wavelength light emitted from the light emitting unit 24 to pass through the slits and / or holes formed in the irradiation pattern generation unit 26. Is realized.
- the irradiation pattern in this embodiment is a grid
- the lattice shape referred to here is, for example, a fringe fringe shape or a lattice pattern.
- the first optical element 28 is at least one optical element that irradiates the first irradiation region with the first specified wavelength light emitted from the light emitting unit 24 and passed through the irradiation pattern generating unit 26.
- the first optical element 28 includes, for example, a lens.
- the first optical element 28 is disposed on the light path from the irradiation device 22 housed in the housing 42 to the outside, and the mounting hole 90 of the front cover 46 is formed so as to form the outer surface of the housing 42. (See FIG. 7).
- the imaging device 30 images a region (hereinafter referred to as a “first imaging region”) on the measurement object 100 onto which the first specified wavelength light emitted from the irradiation device 22 is projected.
- the imaging device 30 includes a second optical element 32, a specified wavelength transmission filter 34, and an imaging element 36.
- the second optical element 32 is at least one optical element that condenses light from the first imaging region.
- the second optical element 32 includes a lens, for example.
- the second optical element 32 is disposed on the light path from the outside of the housing 42 to the imaging device 30 and is attached to the mounting hole 91 (FIG. 7) of the front cover 46 so as to form the outer surface of the housing 42. See).
- the specified wavelength transmission filter 34 is a filter that passes light of the first specified wavelength emitted by the light emitting unit 24 and blocks light of wavelengths other than the first specified wavelength.
- the image sensor 36 is a well-known image sensor that forms an image, and is, for example, a CCD image sensor and / or a CMOS image sensor. The image sensor 36 images light that has passed through the specified wavelength filter 34.
- the housing 42 is a case having an open space inside, and includes a case main body 44, a front cover 46, and two annular members 48.
- the case main body 44 is a case that forms a rectangular parallelepiped with one surface open.
- the front cover 46 is a plate-like member that covers the open surface of the case main body 44, and is provided with mounting holes 90 and 91.
- the annular members 48 are ring-shaped members that are fixed to the peripheral edges of the attachment holes 90 and 91, respectively, and have a thickness along the circumferential direction.
- the housing 42 is assembled with the first optical element 28 and the second optical element 32, so that an inflow port and a jet, which will be described later in detail. It is formed as a sealed container having no opening other than the outlet 89.
- the irradiation device 22 and the imaging device 30 are stored so as to be held in a predetermined positional relationship (hereinafter referred to as “specified positional relationship”).
- the specified positional relationship here refers to at least the distance between the irradiation device 22 and the imaging device 30 and the angle formed by the central axis of imaging with respect to the irradiation axis of the first specified wavelength light (that is, the mounting angle).
- the first imaging unit 20 irradiates the first irradiation region with the irradiation pattern of the first specified wavelength light. Furthermore, the first imaging unit 20 captures an area of the measurement object 100 onto which the irradiation pattern of the first specified wavelength light is projected as a first imaging area, and outputs the captured image to the shape measuring device 70. .
- the second imaging unit 50 includes one irradiation device 52, one imaging device 60, a housing 43, and a cooling dustproof mechanism 74 (see FIG. 6).
- the irradiation device 52 is a device that irradiates the second prescribed wavelength light in an irradiation pattern, and includes a light emitting unit 54, an irradiation pattern generation unit 56, and a first optical element 58, as shown in FIG. .
- the light emitting unit 54 is a light emitting device that emits light of the second specified wavelength.
- the light emitting unit 54 may be configured by a blue light emitting diode, or may be configured by a blue laser diode.
- the irradiation pattern generation unit 56 is a member in which slits and / or holes are formed in a shape suitable for the irradiation pattern.
- the irradiation pattern generation unit 56 allows the second specified wavelength light emitted from the light emitting unit 54 to pass through the slits and / or holes formed in the irradiation pattern generation unit 56, so that the second specification by the irradiation pattern is performed.
- the irradiation pattern in this embodiment is a grid
- the lattice shape referred to here is, for example, a fringe fringe shape or a lattice pattern.
- the first optical element 58 is at least one optical element that irradiates the second irradiation region with the second specified wavelength light emitted from the light emitting section 54 and passed through the irradiation pattern generating section 56.
- the first optical element 58 is disposed on the path of light from the irradiation device 52 housed in the housing 43 to the outside, and the mounting hole of the front cover 47 is formed so as to form the outer surface of the housing 43. 92 (see FIG. 7).
- the imaging device 60 images an area (hereinafter referred to as “second imaging region”) on the measurement object 100 onto which the second specified wavelength light emitted from the irradiation device 52 is projected.
- the imaging device 60 includes a second optical element 62, a specified wavelength transmission filter 64, and an imaging element 66.
- the second optical element 62 is at least one optical element that condenses light from the second imaging region.
- the second optical element 62 is disposed on the light path from the outside of the housing 43 to the imaging device 60, and the mounting hole 93 (see FIG. 7) of the front cover 47 so as to form the outer surface of the housing 43. ).
- the specified wavelength transmission filter 64 is a filter that passes light of the second specified wavelength and blocks light of wavelengths other than the second specified wavelength.
- the image sensor 66 is a well-known image sensor that forms an image, and includes, for example, a CCD image sensor and / or a CMOS image sensor.
- the imaging element 66 images light that has passed through the specified wavelength filter 64.
- casing 43 is a case which has an open space inside, and is provided with one case main body 45, one front cover 47, and two annular members 49.
- the case main body 45 is a case that forms a rectangular parallelepiped whose one surface is open.
- the front cover 47 is a plate-like member that covers the open surface of the case body 45, and is provided with mounting holes 92 and 93.
- the annular members 49 are ring-shaped members fixed to the peripheral edges of the mounting holes 92 and 93, respectively, and have a thickness along the circumferential direction.
- the irradiation device 52 and the imaging device 60 are stored so as to be held in a specified positional relationship.
- the prescribed positional relationship referred to here is at least the angle between the central axis of imaging with respect to the distance between the irradiation device 52 and the imaging device 60 and the central axis that irradiates the second prescribed wavelength light (that is, attachment) Angle).
- the second imaging unit 50 irradiates the second irradiation region with the irradiation pattern of the second specified wavelength light. Further, the second imaging unit 50 captures an area of the measurement object 100 onto which the irradiation pattern of the second specified wavelength light is projected as a second imaging area, and outputs the captured image to the shape measuring device 70. .
- the shape measuring device 70 that has acquired the image measures the three-dimensional surface shape of each of the first imaging region and the second imaging region in the measurement object 100 by executing a shape recognition process. Then, the shape measuring device 70 executes a coordinate integration process for integrating the surface shapes of the first imaging region and the second imaging region on one plane, and acquires the surface shape of the measurement object 100.
- the coordinate integration processing here refers to the surface shape of each area based on the captured image with reference to specific points (for example, specific four points) common to the first imaging area and the second imaging area. This is a well-known process of integrating on one plane. This coordinate integration process is a well-known process and may be performed based on a specific point in a portion where the first imaging area and the second imaging area overlap each other, and thus detailed description thereof is omitted here.
- ⁇ Cooling and dustproof mechanism> Next, a cooling dustproof mechanism provided in each of the first imaging unit 20 and the second imaging unit 50 will be described.
- cooling and dustproof mechanism provided in the first imaging unit 20 and the cooling and dustproof mechanism provided in the second imaging unit 50 have a common configuration, in this embodiment, the cooling and dustproof mechanism provided in the first imaging unit 20 will be described. The description of the cooling dustproof mechanism included in the second imaging unit 50 is omitted.
- the cooling dustproof mechanism 74 shown in FIG. 6 is a mechanism that suppresses the temperature rise in the first imaging unit 20 and suppresses dust from adhering to the outer surfaces of the first optical element 28 and the second optical element 32. .
- the cooling dustproof mechanism 74 includes a suction part 76, a fan 78, an air chamber 80, and a jet part 83.
- the suction portion 76 is a part of the case main body 44 having an opening (hereinafter referred to as “inflow port”) formed in the case main body 44. It is preferable that a plurality of inflow ports are provided.
- the fan 78 is a blower that blows air into the casing 42 from an inlet provided in the suction portion 76. A plurality of fans 78 are preferably provided.
- the air chamber 80 is one room provided in the housing 42 and the air blown by the fan 78 flows in. Further, the air chamber 80 includes a dustproof filter 82 along the air flow path from the inlet to the housing 42.
- the dustproof filter 82 here is a known filter that blocks the passage of dust and passes air, and for example, a non-woven fabric may be used. It is preferable that a plurality of dustproof filters 82 in the present embodiment are provided.
- the ejection unit 83 is a mechanism that ejects the air that has passed through the dust filter 82 to the outside of the housing 42.
- the ejection portion 83 in the present embodiment is formed by the front cover 46 and the annular member 48.
- the front cover 46 has a plurality of vent holes 84 and 86.
- the vent holes 84 and 86 are formed around the mounting holes 90 and 91 so that the distances between the vent holes 84 and 86 are equal.
- the annular member 48 is provided with a ventilation path 88 as shown in FIG.
- the ventilation path 88 is a hole formed so that a cross-sectional shape obtained by cutting the annular member 48 in the circumferential direction and the axial direction is “L-shaped”.
- the number of the air passages 88 in this embodiment is the same as the number of the air holes 84 and 86. Further, the air passage 88 is formed to have a diameter substantially the same as that of the air holes 84 and 86.
- Each air passage 88 has one end of the air passage 88 opposed to each of the air holes 84 and 86 formed in the front cover 46, and the other end of the air passage 88 has the first optical element 28 and It is directed to the inner periphery of the annular member 48 so as to be positioned on the outer surface of the second optical element 32.
- An opening directed toward the inner periphery of the annular member 48 functions as a jet port 89.
- the air that has flowed into the housing 42 exchanges heat with the irradiation device 22 and the imaging device 30 to cool the irradiation device 22 and the imaging device 30.
- the air that has cooled the irradiation device 22 and the imaging device 30 passes through the vent holes 84 and 86 provided in the front cover 46 and flows into the respective air passages 88 provided in the annular member 48.
- each of the imaging units 20 and 50 irradiates different areas with the first specified wavelength light and the second specified wavelength light, respectively.
- the measurement apparatus 1 unlike the conventional technique, it is not necessary to sequentially move one imaging unit when imaging a plurality of regions in the measurement object 100, and the measurement object 100 can be widely used. Crossing images can be taken at the same timing.
- the wavelengths of light emitted by the imaging units 20 and 50 are different (non-overlapping) wavelengths. For this reason, it is possible to reduce the occurrence of interference between the first specified wavelength light from the first imaging unit 20 and the second specified wavelength light from the second imaging unit 50.
- a part of the irradiation pattern by the first specified wavelength light from the first imaging unit 20 and a part of the irradiation pattern by the second specified wavelength light from the second imaging unit 50 overlap.
- the first specified wavelength light and the second specified wavelength light can be irradiated.
- each of the imaging units 20 and 50 images the imaging region via the specified wavelength transmission filters 34 and 64 that pass only the wavelength of light emitted by the imaging units 20 and 50 themselves.
- the measuring apparatus 1 it can suppress that the measurement precision of the measuring object 100 falls.
- the three-dimensional surface shape of the measurement object 100 can be recognized with high accuracy, and the time required for recognizing the three-dimensional surface shape of the measurement object 100. Can be shortened as much as possible.
- the irradiation patterns with light from the imaging units 20 and 50 are partially overlapped on the measurement object 100.
- the surface shape based on the image imaged by each of the imaging units 20 and 50 can be easily integrated on one plane with reference to specific points (for example, specific four points) in a part overlapping each other.
- the surface shape in each irradiation region recognized from a plurality of images can be easily recognized as the surface shape in one space. From the above, for example, if the measuring device 1 is applied to an inspection process in a production line that produces a large amount of products, it is possible to inspect the surface shape of a large number of products at high speed.
- the measuring apparatus 1 even if the measuring object 100 has a complicated surface shape that causes a blind spot in one imaging unit, the blind spot can be covered by another imaging unit. For this reason, according to the measuring apparatus 1, even if it is a measuring object with a complicated surface shape, the surface shape of the measuring object can be recognized with high accuracy.
- the measuring apparatus 1 includes a cooling dustproof mechanism 74. According to the cooling dustproof mechanism 74, the irradiation devices 22 and 52 and the imaging devices 30 and 60 can be cooled by the air that flows into the housings 42 and 43.
- fever from the irradiation apparatuses 22 and 52 and the imaging devices 30 and 60 can be suppressed by cooling the irradiation apparatuses 22 and 52 and the imaging devices 30 and 60.
- FIG. As a result, according to the measuring apparatus 1, it can suppress more reliably that the measurement precision of the surface shape of the measuring object 100 falls.
- the air taken into the casings 42 and 43 is passed through the first optical elements 28, 58, and the openings from the openings (that is, the jet ports 89) directed to the inner periphery of the annular members 48, 49, and The second optical elements 32 and 62 are sprayed onto the outer surface.
- the cooling dustproof mechanism 74 it can suppress that dust adheres to the outer surface of the 1st optical elements 28 and 58 and the 2nd optical elements 32 and 62.
- FIG. According to the measuring apparatus 1, since it can suppress that dust adheres to the outer surface of the 1st optical elements 28 and 58 and the 2nd optical elements 32 and 62, it can maintain an irradiation pattern in the pattern prescribed
- the first specified wavelength is the wavelength of the red region and the second specified wavelength is the wavelength of the blue region, but each of the first specified wavelength and the second specified wavelength is not limited to this.
- the first specified wavelength and the second specified wavelength may be any wavelength as long as the bands are non-overlapping, and the bands are not limited to visible light, but in the infrared wavelength region and the ultraviolet wavelength region. There may be.
- the livestock since the livestock cannot be detected at a wavelength in the ultraviolet region, the livestock can be used as the measurement object 100, and the measuring device 1 can be used for inspection of livestock with meat.
- lattice form namely, fringe fringe shape
- the irradiation pattern in this invention is restricted to this.
- a dot polyka dot pattern
- the moire method is cited as an example of the shape recognition process for recognizing the surface shape of the measurement object 100, but the shape recognition process in the present invention is not limited to the moire method. That is, as a shape recognition process in the present invention, any method may be used as long as it is a so-called pattern projection method in which a shape is projected and a shape is measured. For example, a shift fringe method and / or moire topography may be used. .
- the outside air is directly taken into the casings 42 and 43, but the outside air taken into the casings 42 and 43 may be cooled once.
- the cooling of the outside air may be realized by cooling with a known air conditioner or the like.
- the imaging unit with which the measuring device of this invention is provided is three or more. It may be.
- each imaging unit included in the measuring device 1 is arranged such that a part of the irradiation pattern by light from one imaging unit overlaps a part of the irradiation pattern by light from at least one other imaging unit. Need to be.
- each imaging unit passes through the region of the measuring object 100 irradiated with the light irradiation pattern from each imaging unit through a filter that passes the wavelength of the light from the imaging unit and blocks wavelengths other than the wavelength.
- a filter that passes the wavelength of the light from the imaging unit and blocks wavelengths other than the wavelength.
- the surface shape of the measurement object can be measured over a wider range in a short time.
- omitted a part of structure of the said embodiment as long as the subject could be solved is also embodiment of this invention.
- an aspect configured by appropriately combining the above embodiment and the modification is also an embodiment of the present invention.
- all the aspects which can be considered in the limit which does not deviate from the essence of the invention specified by the wording described in the claims are the embodiments of the present invention.
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Abstract
Description
このうち、各照射手段は、規定された規定波長の光である規定波長光を、設定された照射パターンで照射する。各撮像手段は、照射手段の一つと対をなし、かつ、対応する照射手段との位置関係が予め規定された規定位置関係となるように配置されている。そして、撮像手段のそれぞれは、対応する照射手段にて照射された規定波長光による照射パターンが投影された測定対象物の照射領域を撮像する。
ところで、計測装置においては、複数の撮像手段で撮像した画像それぞれに基づいて測定対象物の表面形状全体を認識する場合、測定対象物の照射領域それぞれにおける表面形状を一つの平面上に統合する必要がある。
しかも、本発明の計測装置における1つの局面において、照射手段のそれぞれが照射する規定波長光の規定波長は、帯域幅が非重複である。このため、本発明の計測装置における1つの局面によれば、互いに異なる照射手段からの規定波長光(照射パターン)が重なり合ったとしても、当該領域において、光の干渉が生じることを低減できる。
また、本発明の計測装置における1つの局面によれば、一組の照射手段及び撮像手段では、死角が生じる複雑な表面形状を有した測定対象物であっても、他の組の照射手段及び撮像手段によって、その死角をカバーできる。このため、本発明の計測装置における1つの局面によれば、複雑な表面形状を有した測定対象物であっても、その測定対象物の表面形状を精度良く認識することができる。
ところで、計測装置においては、対をなす照射手段と撮像手段との位置関係が規定位置関係から変化すると、測定対象物の表面形状の計測精度が低下する。そして、対をなす照射手段と撮像手段との位置関係が規定位置関係から変化する要因として、照射手段や撮像手段からの発熱による温度上昇に起因して、照射手段及び撮像手段が固定された部材が膨張することが考えられる。
また、本発明は、前述した計測装置の他、計測対象物の形状を計測するためにコンピュータが実行するプログラム、計測方法等、種々の形態で実現することができる。
〈計測装置〉
図1に示す計測装置1は、測定対象物100の表面形状を計測するシステムである。
フレーム3は、側壁部5,7と、側壁部5,7の上端に掛け渡された天板部9とを備えている。なお、本実施形態においては、側壁部5,7と天板部9とによって囲まれた開放空間に測定対象物100が配置される。
そして、計測装置1は、多量の測定対象物100が順次移動する環境において、各測定対象物100の表面形状を計測することに用いられても良い。すなわち、計測装置1は、測定対象物100を生産する生産ラインでの検査工程にて用いられても良く、測定対象物100は、ベルトコンベアなどの搬送手段によって搬送されても良い。
そして、本実施形態においては、第一規定波長として赤色の波長を想定し、第二規定波長として青色の波長を想定する。
〈撮像ユニット〉
次に、第一撮像ユニット20について説明する。
照射装置22は、第一規定波長光を照射パターンにて照射する装置であり、図4に示すように、発光部24と、照射パターン生成部26と、第一光学素子28とを備えている。
撮像素子36は、画像を形成する周知の撮像素子であり、例えば、CCDイメージセンサ及び/またはCMOSイメージセンサである。この撮像素子36は、規定波長フィルタ34を通過した光を撮像する。
第二撮像ユニット50は、図3に示すように、一つの照射装置52と、一つの撮像装置60と、筐体43と、冷却防塵機構74(図6参照)とを備えている。
発光部54は、第二規定波長光を発光する発光装置である。この発光部54は、例えば、青色発光ダイオードによって構成されていても良いし、青色レーザダイオードによって構成されていても良い。
撮像素子66は、画像を形成する周知の撮像素子であり、例えば、CCDイメージセンサ及び/またはCMOSイメージセンサを含む。この撮像素子66は、規定波長フィルタ64を通過した光を撮像する。
〈冷却防塵機構〉
次に、第一撮像ユニット20及び第二撮像ユニット50のそれぞれが備える冷却防塵機構について説明する。第一撮像ユニット20が備える冷却防塵機構と、第二撮像ユニット50が備える冷却防塵機構とは、共通の構成であるため、本実施形態では、第一撮像ユニット20が備える冷却防塵機構について説明し、第二撮像ユニット50が備える冷却防塵機構については説明を省略する。
吸入部76は、ケース本体44に形成された開口(以下、「流入口」と称す)を有したケース本体44の部位である。流入口は、複数設けられていることが好ましい。ファン78は、吸入部76に設けられた流入口から筐体42内に空気を送風する送風機である。ファン78は、複数設けられていることが好ましい。
〈冷却防塵機構の作用〉
つまり、冷却防塵機構74では、ファン78が動作することで、筐体42の外部から、筐体42の内部に設けられた空気室80に空気(外気)が流入する。そして、空気が流入することで、空気室80の内圧が上昇すると、空気室80内の空気は、防塵フィルタ82を通過して、筐体42内へと流入する。
[実施形態の効果]
以上説明したように、計測装置1では、撮像ユニット20,50のそれぞれは、第一規定波長光、及び第二規定波長光のそれぞれを、互いに異なる領域に照射する。
この結果、計測装置1によれば、測定対象物100の計測精度が低下することを抑制できる。
以上のことから、例えば、製品を大量に生産する生産ラインにおける検査工程に計測装置1を適用すれば、大量の製品の表面形状を高速に検査することが可能となる。
この冷却防塵機構74によれば、筐体42,43内へと流入した空気によって、照射装置22,52及び撮像装置30,60を冷却することができる。
計測装置1によれば、第一光学素子28,58、及び第二光学素子32,62の外表面に粉塵が付着することを抑制できるため、照射パターンを予め規定されたパターンに維持することや、撮像した画像にノイズが写り込むことを抑制できる。
[その他の実施形態]
以上、本発明の実施形態について説明したが、本発明は上記実施形態に限定されるものではなく、本発明の要旨を逸脱しない範囲において、様々な態様にて実施することが可能である。
さらに、各撮像ユニットは、各撮像ユニットからの光の照射パターンが照射された測定対象物100の領域を、当該撮像ユニットからの光の波長を通過し当該波長以外の波長を遮断するフィルタを介して撮像するように構成されている必要がある。
なお、上記実施形態の構成の一部を、課題を解決できる限りにおいて省略した態様も本発明の実施形態である。また、上記実施形態と変形例とを適宜組み合わせて構成される態様も本発明の実施形態である。また、特許請求の範囲に記載した文言によって特定される発明の本質を逸脱しない限度において考え得るあらゆる態様も本発明の実施形態である。
Claims (3)
- 計測装置であって、
規定された規定波長の光である規定波長光を、設定された照射パターンで照射する少なくとも2以上の照射手段と、
前記照射手段の一つと対をなし、かつ、対応する前記照射手段との位置関係が予め規定された規定位置関係となるように配置され、対応する前記照射手段にて照射された規定波長光による照射パターンが投影された測定対象物の照射領域を撮像する少なくとも2以上の撮像手段と、
前記撮像手段それぞれにて撮像した画像、及び前記撮像手段それぞれと対をなす前記照射手段との規定位置関係に基づいて、前記測定対象物の照射領域それぞれにおける表面形状を計測する計測手段と
を備え、
前記照射手段のそれぞれは、
互いに異なる波長として規定された規定波長の光を規定波長光として、前記測定対象物において、前記照射パターンの一部分が、他の前記照射手段からの照射パターンの一部分に重なるように照射し、
前記撮像手段のそれぞれは、
対をなす前記照射手段にて照射された規定波長光による照射パターンが投影された測定対象物の照射領域を、その対をなす照射手段における規定波長の光を通過し、かつ、当該規定波長以外の波長の光を遮断する規定波長透過フィルタを介して撮像する
計測装置。 - 対をなす前記照射手段と前記撮像手段とのそれぞれを、前記規定位置関係に保持して収納する筐体と、
前記筐体内に取り込んだ気体により、当該筐体内に収納されている前記照射手段と前記撮像手段とを冷却する冷却手段と
を備える、請求項1に記載の計測装置。 - 前記筐体それぞれに収納されている前記照射手段からの光の経路上であり、かつ、前記筐体の外表面を形成するように前記筐体に設けられた第一光学素子と、
前記筐体それぞれに収納されている前記撮像手段への前記筐体の外部からの光の経路上であり、かつ、前記筐体の外表面を形成するように前記筐体に設けられた第二光学素子と、
前記冷却手段にて、前記筐体に収納されている前記照射手段と前記撮像手段とを冷却した気体を、前記第一光学素子及び前記第二光学素子の外表面に向けて噴出する噴出手段と
を備える、請求項2に記載の計測装置。
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JP6408654B1 (ja) | 2017-06-16 | 2018-10-17 | 株式会社オプトン | 検査装置 |
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