WO2015011775A1 - Système de test automatisé à grande échelle pour supports de stockage - Google Patents

Système de test automatisé à grande échelle pour supports de stockage Download PDF

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Publication number
WO2015011775A1
WO2015011775A1 PCT/JP2013/069827 JP2013069827W WO2015011775A1 WO 2015011775 A1 WO2015011775 A1 WO 2015011775A1 JP 2013069827 W JP2013069827 W JP 2013069827W WO 2015011775 A1 WO2015011775 A1 WO 2015011775A1
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WO
WIPO (PCT)
Prior art keywords
test
test apparatus
crane
shelf
storage medium
Prior art date
Application number
PCT/JP2013/069827
Other languages
English (en)
Japanese (ja)
Inventor
政幸 草野
博 本郷
秋山　秀樹
Original Assignee
株式会社ダイチューテクノロジーズ
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社ダイチューテクノロジーズ filed Critical 株式会社ダイチューテクノロジーズ
Priority to JP2015528042A priority Critical patent/JP6209610B2/ja
Priority to PCT/JP2013/069827 priority patent/WO2015011775A1/fr
Publication of WO2015011775A1 publication Critical patent/WO2015011775A1/fr

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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B25/00—Apparatus characterised by the shape of record carrier employed but not specific to the method of recording or reproducing, e.g. dictating apparatus; Combinations of such apparatus
    • G11B25/04—Apparatus characterised by the shape of record carrier employed but not specific to the method of recording or reproducing, e.g. dictating apparatus; Combinations of such apparatus using flat record carriers, e.g. disc, card
    • G11B25/043—Apparatus characterised by the shape of record carrier employed but not specific to the method of recording or reproducing, e.g. dictating apparatus; Combinations of such apparatus using flat record carriers, e.g. disc, card using rotating discs
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B33/00—Constructional parts, details or accessories not provided for in the other groups of this subclass
    • G11B33/12—Disposition of constructional parts in the apparatus, e.g. of power supply, of modules
    • G11B33/125—Disposition of constructional parts in the apparatus, e.g. of power supply, of modules the apparatus comprising a plurality of recording/reproducing devices, e.g. modular arrangements, arrays of disc drives
    • G11B33/127—Mounting arrangements of constructional parts onto a chassis
    • G11B33/128—Mounting arrangements of constructional parts onto a chassis of the plurality of recording/reproducing devices, e.g. disk drives, onto a chassis

Definitions

  • the present invention relates to a large-scale automated test system for storage media such as HDDs.
  • HDD hard disk drive
  • SSD solid state drive
  • a hard drive carrier equipped with an HDD is mounted on a carrier pallet, and this carrier pallet is inserted into a plurality of slots provided in the test chamber, thereby providing one test chamber. Is testing multiple HDDs.
  • test time has been prolonged, and as a result, the number of test devices has increased greatly.
  • a building in which test equipment to be greatly increased that is, a floor on which the test equipment is installed, is newly required, and the assets and costs required for it are a great burden on the storage medium manufacturer.
  • the present invention has been made in view of the above, and provides a large-scale automated test system for a storage medium that enables effective use of floor space and can greatly improve the work efficiency of an operator. For the purpose.
  • a large-scale automated test system for a storage medium includes a test apparatus that holds a plurality of storage media and tests the storage medium, and the test apparatus An attachment / detachment portion for attaching / detaching the storage medium, a storage portion for storing the test device, a stacker rack having a plurality of storage portions in the horizontal direction and the vertical direction, the attachment / detachment portion, and the stacker rack, A transport device for transporting the test device between the storage device, loading the test device to the storage portion, and collecting the test device from the storage portion, and a transport device control device for controlling the transport device And system control capable of communicating with the test apparatus accommodated in the accommodating unit, and receiving information related to the control of the test apparatus and the test of the storage medium from the test apparatus The system control device instructs the test device loaded in the storage unit to start the test of the storage medium, and before the test starts to the transport device control device A loading instruction for transporting the test apparatus located
  • the storage unit is provided with a communication mechanism that is connected by an operation of loading the test device into the storage unit. It is preferable to communicate with the test apparatus via a mechanism.
  • the storage unit is provided with a power supply mechanism that is connected by the loading operation of the test apparatus to the storage unit, and the test apparatus includes the power supply mechanism. It is preferable to operate with the power supplied by.
  • the power supply mechanism supplies power to the test apparatus after the loading of the test apparatus into the housing unit is completed.
  • the test apparatus can attach and detach the storage medium from two surfaces facing in opposite directions.
  • the large-scale automated test system for a storage medium according to the present invention has an effect that the floor space can be effectively used and the work efficiency of the worker can be greatly improved.
  • FIG. 1 is a side view of a storage medium large-scale automated test system according to an embodiment.
  • FIG. 2 is an AA arrow view of FIG.
  • FIG. 3 is a BB arrow view of FIG.
  • FIG. 4 is a schematic diagram of the test apparatus shown in FIG.
  • FIG. 5 is a schematic plan view showing the relationship between the devices of the large-scale automated test system according to the embodiment.
  • FIG. 6 is a system configuration diagram of the large-scale automated test system according to the embodiment.
  • FIG. 1 is a side view of a storage medium large-scale automated test system according to an embodiment.
  • FIG. 2 is an AA arrow view of FIG.
  • FIG. 3 is a BB arrow view of FIG.
  • the upper side in the normal usage mode of the large-scale automated test system 1 according to the present embodiment is the upper side of the large-scale automated test system 1, and the lower side in the normal usage mode of the large-scale automated test system 1 The side will be described as the lower side of the large-scale automated test system 1.
  • the large-scale automated test system 1 is a test system that performs a large number of tests using a plurality of test apparatuses 50 that perform an operation test or the like of a storage medium, and the test apparatus 50 is installed when performing a test.
  • a stacker rack 4 is provided.
  • the stacker rack 4 is provided with a shelf 5 that is an accommodating portion that can accommodate the test apparatus 50, and the stacker rack 4 has a plurality of shelves 5 in the horizontal direction and the vertical direction, respectively.
  • a stacker rack 4 is provided with 20 shelves 5 in the horizontal direction, and the 20 shelves 5 are provided in two upper and lower rows. . That is, one stacker rack 4 has 40 shelves 5.
  • the openings 6 for taking in and out the test apparatus 50 are all opened in the same direction in one stacker rack 4, that is, the plurality of openings 6 are arranged in the stacker rack 4.
  • the rack 4 is formed on the same surface.
  • the large-scale automated test system 1 has one set or two sets of two stacker racks 4 arranged in parallel so that the openings 6 of the shelves 5 face each other.
  • the large-scale automated test system 1 has a work space 8 on the extension line in the longitudinal direction of the stacker rack 4 that is an attaching / detaching portion for attaching / detaching the storage medium to be tested to / from the test apparatus 50.
  • the work space 8 is adjacent to one end side in the longitudinal direction of one stacker rack 4 of the pair of stacker racks 4, and two of the work spaces 8 are provided side by side in the extending direction of the stacker rack 4.
  • the work space 8 is provided so that the storage medium can be attached to and detached from the test apparatus 50 located in the work space 8 from both sides in the extending direction of the stacker rack 4.
  • the crane 10 which is a transport device that transports the test device 50, loads the test device 50 into the shelf 5, and collects the test device 50 from the shelf 5, and the crane 10 rails 15 are arranged.
  • the rail 15 is disposed on the floor of the building where the stacker rack 4 is installed, along the stacker rack 4 between the two stacker racks 4 arranged in the direction in which the openings 6 face each other.
  • the stacker rack 4 is arranged over the arrangement area of the rack 4 in the longitudinal direction. That is, the rail 15 is arranged on the side where the opening 6 of the shelf 5 in the stacker rack 4 is located.
  • the rail 15 extends from the arrangement area of the stacker rack 4 to the work space 8 side, and is also installed in the area where the work space 8 is located in the longitudinal direction of the stacker rack 4. As described above, the rail 15 is provided from a portion where the work space 8 is located to a portion where the end of the stacker rack 4 opposite to the side where the work space 8 is located is located.
  • the crane 10 is movable in a desired direction by a crane driving device 40 (see FIG. 6) configured by an electric motor or the like. Specifically, the crane 10 can be moved along the rail 15 by the crane driving device 40, and for this reason, the crane 10 moves from the portion where the work space 8 is located to the arrangement area of the stacker rack 4. It can move across. For this reason, the crane 10 can carry the test apparatus 50 between the work space 8 and the stacker rack 4.
  • the crane 10 has the mounting part 12 which mounts the test apparatus 50, and the mounting part 12 can be raised / lowered by the crane drive apparatus 40 along the raising / lowering guide 11 extended to an up-down direction. Yes. Further, the placing portion 12 can be moved in the horizontal direction perpendicular to the extending direction of the rail 15 by the crane driving device 40, that is, move closer to or away from both opposing stacker racks 4. It is possible to move in the direction to do.
  • the crane 10 includes an ECU (Electronic Control Unit) that performs various arithmetic processes, a storage unit that stores information, and the like, and is connected to a crane control device 25 that is a transport device control device that manages the operation of the crane 10. Yes. Thereby, the crane 10 is controlled by the crane control apparatus 25, and each operation
  • ECU Electronic Control Unit
  • the crane control device 25 includes an ECU that performs various arithmetic processes similarly to the crane control device 25, a storage unit that stores information, and the like, and a system control device that controls and manages the entire large-scale automated test system 1. 20 is connected. Thereby, the crane control device 25 can be controlled by the system control device 20, and the crane control device 25 manages the operation of the crane 10 based on the control signal from the system control device 20.
  • the system control device 20 has not only the operation management of the crane 10 via the crane control device 25 but also a management function of the shelf 5 and the test device 50 and an emergency test stop function. Further, the system control device 20 issues a test start instruction for the storage medium held by the test device 50 to the test device 50, collects and manages test result information of the storage medium, and performs the large-scale automated test system 1 Manage maintenance information.
  • FIG. 4 is a schematic diagram of the test apparatus shown in FIG.
  • the test apparatus 50 is formed in a substantially rectangular parallelepiped shape that can be accommodated in the shelf 5, and is an apparatus that can test an HDD (Hard Disk Drive) 60 among various storage media.
  • This test apparatus 50 includes a large number of insertion portions 51 for inserting the HDD 60 on two sides facing in opposite directions among the four side surfaces in the use state.
  • the insertion unit 51 can insert and remove the HDD 60 to be tested from the test apparatus 50 and can also hold the HDD 60.
  • 120 insertion parts 51 are provided on one surface, and since this surface is two surfaces, one test apparatus 50 includes: 240 insertion parts 51 are provided.
  • Each insertion portion 51 is provided with a control board (not shown) connected to an interface board (not shown) provided in the HDD 60, and supplies power to the HDD 60 and exchanges signals with the HDD 60. It is possible to do.
  • the test apparatus 50 can test the HDDs 60 inserted into the insertion portion 51, and can test a maximum of 240 HDDs 60 in parallel with one test apparatus 50. Can do.
  • FIG. 5 is a schematic plan view showing the relationship between the devices of the large-scale automated test system according to the embodiment.
  • Each shelf 5 of the stacker rack 4 is provided with a test apparatus control controller 30 that is a test apparatus control section that supplies power to the test apparatus 50 and communicates with the test apparatus 50.
  • the test apparatus control controller 30 is connected to an external power source (connection shown in the figure), and is connected to a power contact on the test apparatus 50 side to supply power to the test apparatus 50.
  • 31 and a communication connection unit 32 that performs network connection with the test apparatus 50 by connecting to the communication contact on the test apparatus 50 side.
  • the power supply connection part 31 is comprised by the electric power feeding mechanism connected by the loading operation
  • the communication connection unit 32 is configured by a communication mechanism connected by the loading operation of the test apparatus 50 to the shelf 5.
  • the power supply connection unit 31 and the communication connection unit 32 have, for example, connection portions on the lower surface of the test device 50 and the bottom surface of the shelf 5, respectively, and guide pins are disposed, and the test device 50 is placed on the shelf 5. In this case, the connection portions are mechanically connected by the weight of the test apparatus 50 while being guided by the guide pins.
  • the power supply connection unit 31 and the communication connection unit 32 are configured so that mechanical connection can be performed by the loading operation of the test apparatus 50 without performing an operation for connection. Yes.
  • each control device included in the large-scale automated test system 1 can exchange information between the devices via a LAN (Local Area Network) 35.
  • the system control device 20, the crane control device 25, and the test device control controller 30 are connected to each other via the LAN 35.
  • the system control device 20 can communicate with the test device 50 via the test device control controller 30 to cause the test device 50 to perform an operation for a test or to perform a test.
  • Information about the state of the test can be received from the test apparatus 50.
  • the crane control device 25 is connected to the crane 10 via the LAN 35, and can operate the crane 10 by transmitting a control signal to the crane drive device 40 (see FIG. 6).
  • the system control device 20 can control the crane 10 via the crane control device 25.
  • FIG. 6 is a system configuration diagram of the large-scale automated test system according to the embodiment.
  • the crane control device 25 that operates the crane 10 is connected to a crane drive device 40 that drives the crane 10, and the crane drive device 40 can be controlled.
  • the crane drive device 40 includes a crane moving device 41 that moves the crane 10 along the rail 15, a lifting device 42 that lifts and lowers the placement unit 12 of the crane 10 along the lifting guide 11, and a stacker rack. And a loading / recovering device 43 that horizontally moves in the direction of approaching or moving away from the four shelves 5. Among these, the loading / recovery device 43 can move the mounting unit 12 in and out of the shelf 5 by horizontally moving the mounting unit 12.
  • the crane moving device 41, the lifting device 42, and the loading and collecting device 43 include a power source such as a motor and power transmission means such as a gear, and the crane 10 is operated by using the power generated by the power source. 10 can perform a desired operation.
  • test device control controllers 30 are provided according to the shelf 5 of the stacker rack 4, and the plurality of test device control controllers 30 are all connected to the system control device 20 via the LAN 35.
  • the power supply connection unit 31 and the communication connection unit 32 are provided in each of the test device control controllers 30, whereby the test device control controller 30 performs power supply connection to different test devices 50. Network connection is possible.
  • Each of the test device control controllers 30 includes a loading confirmation sensor 47 that detects whether or not the test device 50 is loaded in the shelf 5, and whether or not the placement unit 12 is located in the shelf 5.
  • a crane insertion sensor 48 to be detected is connected. Both the loading confirmation sensor 47 and the crane insertion sensor 48 are disposed in the shelf 5. In each shelf 5, the loading state of the test apparatus 50 in the shelf 5 and the placement unit in the shelf 5 are placed. 12 insertion states can be detected. The test device control controller 30 to which the loading confirmation sensor 47 and the crane insertion sensor 48 are connected can detect these states.
  • the loading confirmation sensor 47 and the crane insertion sensor 48 may be any sensor that can appropriately detect the state of the test apparatus 50 and the placement unit 12 in the shelf 5 such as a sensor that uses infrared rays or a sensor that detects weight.
  • the form and form are not limited.
  • the system control device 20 controls and manages the entire large-scale automated test system 1, and also operates the large-scale automated test system 1, information on the HDD 60 test, and information on the operating state of the large-scale automated test system 1.
  • the operator can acquire it. Therefore, an input device 21 such as a keyboard and an output device 22 such as an information display device and a speaker are connected to the system control device 20.
  • the large-scale automated test system 1 is configured as described above, and the operation thereof will be described below.
  • the HDD 60 is inserted into the test apparatus 50 in the work space 8, and the test apparatus 50 is transported to the shelf 5 of the stacker rack 4 by the crane 10 and accommodated in the shelf 5.
  • the test apparatus 50 is collected from the shelf 5 and transported to the work space 8.
  • a plurality of HDDs 60 are continuously tested by operating a plurality of test apparatuses 50 in parallel in these flows. For this flow, the flow of one test apparatus 50 is Will be described in detail.
  • the test apparatus 50 When testing the HDD 60, first, an operator manually inserts a number of HDDs 60 into the insertion portion 51 of the test apparatus 50 with respect to the test apparatus 50 located in the work space 8.
  • the test apparatus 50 is provided with the insertion part 51 on two surfaces located in opposite directions, but when the test apparatus 50 is placed in the work space 8, the insertion part 51 is provided 2.
  • the surface is placed so as to be oriented along the direction in which the stacker rack 4 extends or the direction in which the rail 15 extends. Thereby, the worker can attach and detach the HDD 60 by a plurality of workers from both sides of the test apparatus 50 in the extending direction of the stacker rack 4.
  • the operator When the HDD 60 is inserted into the insertion portion 51 of the test apparatus 50 and the HDD 60 to be tested is held by the test apparatus 50, the operator operates the input device 21 to input an instruction to perform the test with the test apparatus 50.
  • the system controller 20 To the system controller 20.
  • the system control device 20 to which the test effect is input performs the test device 50 located in the work space 8 while holding the HDD 60 before starting the test on the crane control device 25, the shelf of the stacker rack 4. 5 is instructed to carry in.
  • the system control device 20 manages the shelves 5, and among the plurality of shelves 5 of the stacker rack 4, grasps which shelf 5 has the test apparatus 50 and which shelf 5 is free. ing. For this reason, the system control device 20 to which an input for performing the test is performed selects the shelf 5 into which the test device 50 is carried out from the empty shelves 5, and the test device 50 in the work space 8 is selected. A carry-in instruction for carrying to the selected shelf 5 is given to the crane control device 25.
  • the crane control device 25 that has received a carry-in instruction from the system control device 20 controls the crane drive device 40 to cause the crane 10 to perform an operation according to the instruction. Specifically, the crane 10 is moved along the rail 15 to the vicinity of the work space 8 by operating the crane moving device 41. Once the crane 10 has been moved to the vicinity of the work space 8, the loading / recovering device 43 is then operated to move the placement unit 12 horizontally, and the load is placed below the test device 50 placed in the work space 8. The placement unit 12 is positioned.
  • the crane control device 25 operates the lifting device 42 to operate the loading device 42.
  • the placement unit 12 is moved in the vertical direction.
  • the mounting portion 12 is moved horizontally and the mounting portion 12 is positioned below the test device 50.
  • the mounting portion 12 When the mounting portion 12 is positioned below the test device 50, the mounting device 12 is raised by operating the lifting device 42, the test device 50 is mounted on the mounting portion 12, and the test is performed from the work space 8. The device 50 is lifted. When the test device 50 is lifted, the crane control device 25 operates the loading / recovery device 43 to move the placement unit 12 horizontally, and places the placement unit 12 in the neutral position, that is, above the rail 15.
  • the crane control device 25 When the placement unit 12 moves to the neutral position, the crane control device 25 operates the crane moving device 41 to reach the portion where the shelf 5 selected by the system control device 20 is located in the extending direction of the rail 15. The crane 10 is moved along the rail 15. Thereby, the crane 10 is moved to the front of the opening 6 of the shelf 5 selected by the system control device 20.
  • the crane control device 25 When the crane 10 is moved to the front of the selected shelf 5, the crane control device 25 operates the lifting device 42 to move the lifting guide to a height at which the selected shelf 5 is positioned among the shelves 5 arranged in the vertical direction. 11, the placement unit 12 is moved. Specifically, the height of the test device 50 placed on the placement unit 12 can be made to enter the shelf 5 from the opening 6 of the selected shelf 5, and the test device 50 is placed on the shelf 5. The mounting portion 12 is moved to a height at which it can enter the shelf 5 while being lifted from the bottom surface.
  • the crane control device 25 moves the mounting portion 12 horizontally by operating the loading and collecting device 43, and the test device 50 is placed.
  • the placement unit 12 is inserted into the shelf 5.
  • the crane control device 25 stops the loading and collecting device 43 when the position of the mounting portion 12 in the depth direction from the opening 6 reaches a predetermined position.
  • the crane control device 25 lowers the placement unit 12 by operating the lifting device 42 in this state.
  • the test device 50 placed on the placement unit 12 is placed on the bottom surface of the shelf 5, and the test device 50 is loaded on the shelf 5 selected by the system control device 20.
  • the power connection unit 31 and the communication connection unit 32 provided on the shelf 5 are mechanically connected to the test device 50 by the weight of the test device 50. . That is, the power supply connection unit 31 and the communication connection unit 32 are connected to the test device 50 side by a loading operation of lowering the mounting unit 12 in a state where the test device 50 is lifted from the bottom surface of the shelf 5 in the shelf 5. And mechanically connected.
  • the loading confirmation sensor 47 detects that the test apparatus 50 has been loaded.
  • the shelf 5 is also provided with a crane insertion sensor 48 that detects whether or not the placement unit 12 is located in the shelf 5, so that the placement unit can be mounted even when the test apparatus 50 is loaded on the shelf 5.
  • the crane insertion sensor 48 detects whether or not the placement unit 12 is located in the shelf 5, so that the placement unit can be mounted even when the test apparatus 50 is loaded on the shelf 5.
  • the system control device 20 supplies power to the test device 50 in the shelf 5 when it is detected that the test device 50 is loaded and the placement unit 12 is retracted from the shelf 5. For this reason, if the system control device 20 receives the information that the test device 50 is loaded, but receives the information that the placement unit 12 is not retracted from the shelf 5, the system control device 20 No power supply instruction is given.
  • the crane control device 25 that places the test device 50 on the bottom surface of the shelf 5 by lowering the placement unit 12 then moves the placement unit 12 horizontally by operating the loading / recovery device 43, thereby placing the placement unit 12. 12 is placed in the neutral position. Thereby, the crane control device 25 retracts the placement unit 12 from the shelf 5.
  • the crane insertion sensor 48 detects this retraction, and the detection result is transmitted to the system control device 20 via the test device control controller 30.
  • the system controller 20 that detects that the test device 50 is loaded into the shelf 5 and that the placement unit 12 has been withdrawn from the shelf 5 is placed in the shelf 5 with respect to the controller 30 for controlling the test device. Is instructed to start power supply to the test apparatus 50.
  • the test apparatus control controller 30 Upon receiving the power supply start instruction, the test apparatus control controller 30 supplies power to the test apparatus 50 by energizing the external power supply and the test apparatus 50 via the power supply connection unit 31.
  • the power supply connection unit 31 not only places the test apparatus 50 on the bottom surface of the shelf 5, but also loads the test apparatus 50 onto the shelf 5 when the placement unit 12 of the crane 10 is retracted from the shelf 5. Is completed, power is supplied to the test apparatus 50.
  • test apparatus 50 starts to operate, and a network connection is started with the system control apparatus 20 or the like via the communication connection unit 32.
  • This network connection is performed by optical communication, for example.
  • the test apparatus control controller 30 is ready for the system control apparatus 20 for the test. Report that.
  • the system control device 20 Upon receipt of this report, the system control device 20 sends an instruction to start testing the HDD 60 to the test device control controller 30. Upon receiving the test start instruction, the test apparatus control controller 30 sends a test start instruction to the test apparatus 50 based on this instruction. As a result, the test apparatus 50 starts testing the HDD 60.
  • the test apparatus 50 for testing the HDD 60 confirms the operation state and performs a test while causing the HDD 60 to perform a predetermined operation in accordance with a preset test program.
  • the power supply to the HDD 60 and the exchange of signals when operating the HDD 60 are conducted between the control board in the test apparatus 50 and the interface board of the HDD 60, and signals are transmitted and received.
  • the test apparatus 50 supplies power to the plurality of HDDs 60 held by the test apparatus 50 as described above, transmits a signal for operating the HDD 60 to perform a predetermined operation, and confirms the operation state. Thus, a plurality of HDDs 60 are tested.
  • test apparatus 50 reports the test status and result to the test apparatus control controller 30 via the communication connection unit 32, and the test apparatus control controller 30 is sent from the test apparatus 50.
  • the test status and result are reported to the system control device 20 via the LAN 35.
  • the test status report from the test device control controller 30 to the system control device 20 is periodically performed while the test is being performed.
  • the status and result of the test are output by the output device 22 continuously or when the operator operates the input device 21.
  • the system control device 20 determines the status of the test device 50 as follows. The image is displayed on the display device included in the output device 22. The operator confirms the status of the test in the test apparatus 50 by visually checking the display on the display device.
  • the test apparatus 50 reports the test result and the test completion to the test apparatus control controller 30. Then, the test apparatus control controller 30 reports to the system control apparatus 20. The system control device 20 that has received the test completion signal instructs the crane control device 25 to carry out the test device 50 holding the HDD 60 that has been tested to the work space 8.
  • the crane control device 25 that has received the carry-out instruction from the system control device 20 controls the crane drive device 40 to cause the crane 10 to perform an operation according to the instruction. Specifically, first, by operating the crane moving device 41, the crane 10 is moved to the front of the shelf 5 in which the test device 50 that has completed the test is accommodated.
  • the lifting device 42 and the loading collection device 43 are operated to horizontally move the mounting portion 12 so as to be inserted below the testing device 50, and the mounting portion 12 is placed on the shelf. Raise within 5. As a result, the test apparatus 50 is lifted from the bottom surface of the shelf 5 and placed on the placement unit 12.
  • the power supply at the power supply connection unit 31 and the communication at the communication connection unit 32 are cut off by this stage.
  • the timing is transmitted from the system control device 20 to the test device control controller 30 by transmitting a signal to cut off the power supply and communication.
  • These interruptions may be performed by the device control controller 30.
  • the system control device 20 detects that the placement unit 12 has been inserted into the shelf 5 based on the detection state of the crane insertion sensor 48, power supply and communication are similarly performed from the system control device 20. Blocking may be performed by transmitting a signal indicating blocking.
  • the power supply connection unit 31 and the communication connection unit 32 mechanically connected to the test apparatus 50 are moved by the movement of the test apparatus 50. Are separated together. That is, the power supply connection unit 31 and the communication connection unit 32 are mechanically separated from the connection unit on the test apparatus 50 side by a recovery operation that is an operation of floating the test apparatus 50 placed on the bottom surface of the shelf 5.
  • the crane control device 25 When the crane control device 25 floats, the crane control device 25 operates the loading / recovery device 43 to move the placement portion 12 horizontally to place the placement portion 12 in the neutral position. As a result, the test apparatus 50 goes out of the shelf 5 through the opening 6, and the test apparatus 50 is recovered from the shelf 5.
  • the crane control device 25 moves the crane 10 along the rail 15 to the vicinity of the work space 8 by operating the crane moving device 41. At that time, two work spaces 8 are provided, but the system control device 20 also knows the current state of the work space 8, so the system control device 20 is in the vacant work space 8. The crane control device 25 is instructed to move the crane 10.
  • the crane control device 25 When the crane 10 moves to the vicinity of the vacant work space 8, the crane control device 25 operates the lifting device 42 and the load collection device 43 in the same manner as when the test device 50 is loaded on the shelf 5, and the placement is performed.
  • the test apparatus 50 is positioned in the work space 8 by moving the unit 12 up and down or horizontally.
  • the crane control apparatus 25 reports to the system control apparatus 20 that the movement of the test apparatus 50 has been completed.
  • the system control device 20 notifies the operator that the test device 50 that has been tested has moved to the work space 8 by the output device 22.
  • the notification to the worker in this case is preferably performed not only by display on the display device but also by sound using a speaker of the output device 22.
  • the worker who has been notified that the test apparatus 50 has moved to the work space 8 takes out a large number of HDDs 60 inserted and held in the insertion section 51 of the test apparatus 50 from the insertion section 51 by hand.
  • all the HDDs 60 are taken out from the test apparatus 50, another HDD 60 that has not been tested is inserted into the insertion portion 51, and the test is performed according to the flow described above.
  • a plurality of test apparatuses 50 are used, and a test of a large number of HDDs 60 is performed by changing the attachment / detachment timing of the HDD 60 to / from each test apparatus 50 and the transport timing of the test apparatus 50.
  • a plurality of test apparatuses 50 are continuously performed by a plurality of test apparatuses 50.
  • the test apparatus 50 is transported in an efficient order in consideration of the position of the shelf 5 accommodating the test apparatus 50 and the transport time. Is preferred.
  • the system The control device 20 transmits a signal for stopping the test in the test device 50 to the test device control controller 30 to which the test device 50 is connected. Upon receiving this signal, the test device control controller 30 cuts off the power supply to the test device 50.
  • the test apparatus 50 that has stopped the test at a timing that does not affect the transport of the other test apparatuses 50 is used. Collect and move to work space 8.
  • the preset recovery timing may be changed. Instead, the test apparatus 50 is recovered at this recovery timing and moved to the work space 8.
  • the test apparatus 50 for testing the HDD 60 is provided not only in the horizontal direction. A plurality of tests can be installed in the height direction. Thereby, the installation number of the test apparatus 50 per floor area can be increased, and space efficiency can be improved.
  • the large-scale automated test system 1 includes the crane 10 that transports the test apparatus 50, the HDD 60 can be attached to and detached from the test apparatus 50 in the work space 8. Thereby, when a test of HDD 60 is performed using a plurality of test apparatuses 50, the movement distance of the worker can be shortened, and the burden on the worker can be reduced.
  • the large-scale automated test system 1 includes the system control device 20 that communicates with the test device 50 accommodated in the shelf 5, the test device 50 can be centrally managed. The status of the test in each test apparatus 50 can be recognized without directly confirming. Further, the system control device 20 instructs the test device 50 loaded in the shelf 5 to start the test of the HDD 60, and completes the carry-in instruction to transport the test device 50 before the test to the shelf 5 and the test. Since the unloading instruction for transporting the test apparatus 50 to the work space 8 is performed, the burden on the operator can be further reduced. As a result, the floor space can be effectively used and the work efficiency of the worker can be greatly improved.
  • the shelf 5 is provided with a communication connection unit 32 that is connected by the loading operation of the test device 50 to the shelf 5, the test device 50 and the system control device 20 can be manually communicated with each other.
  • communication can be performed between the test apparatus 50 accommodated in the shelf 5 and the system control apparatus 20 without providing a device for performing mechanical connection. As a result, the work efficiency of the worker can be improved more reliably, and an increase in manufacturing cost can be suppressed.
  • the shelf 5 since the shelf 5 is provided with the power supply connection portion 31 connected by the loading operation of the test device 50 to the shelf 5, the shelf 5 can be in a state where power can be supplied manually or mechanically. It is possible to supply power to the test apparatus 50 accommodated in the shelf 5 without providing an apparatus for making a simple connection. As a result, the work efficiency of the worker can be improved more reliably, and an increase in manufacturing cost can be suppressed.
  • the power supply connection unit 31 supplies power to the test apparatus 50 after the loading of the test apparatus 50 into the shelf 5, it is possible to suppress occurrence of a short circuit or the like when the test apparatus 50 is loaded. As a result, safety can be improved.
  • test apparatus 50 can attach and detach the HDD 60 from two surfaces facing in opposite directions, the number of HDDs 60 accommodated per test apparatus 50 can be increased. As a result, the floor space can be effectively used more reliably and the work efficiency of the worker can be greatly improved.
  • test apparatus 50 since the test apparatus 50 is housed in the shelf 5 only when the test is performed so as to be detachable from the shelf 5 installed at the time of the test, it is necessary to perform the test with a different type of test apparatus 50. In addition, it is possible to easily cope with a case where it is necessary to test a storage medium of a different size or type.
  • the test apparatus 50 is different in the number of storage media that can be held and tested by a single test apparatus 50, performs only an operation test of the storage medium, or performs a temperature test. There is something.
  • types of storage media such as different sizes of the HDD 60 or different types other than the HDD 60, such as SSD (Solid State Drive).
  • test apparatus 50 Since the test apparatus 50 is accommodated in the shelf 5 only when a test is performed, it is possible to easily cope with these different types of test apparatuses 50 and storage media. In other words, if the size of the test device 50 is large enough to fit in the shelf 5 and can be connected to the power supply connection unit 31 and the communication connection unit 32, a test can be performed with a different type of test device 50, You can test storage media of different sizes and types. As a result, versatility when testing the storage medium can be increased, and the cost can be reduced.
  • the stacker rack 4 includes 20 shelves 5 in the horizontal direction, and the shelves 5 are arranged in two upper and lower rows. Other than this, the number of shelves 5 possessed by may be different.
  • the stacker rack 4 may be of any number as long as it has a plurality of shelves 5 in the horizontal direction and the vertical direction. Further, in the large-scale automated test system 1 according to the above-described embodiment, two stacker racks 4 are used, but the number of stacker racks 4 may be other than this.
  • the crane 10 loads and collects the test apparatus 50 on the two stacker racks 4.
  • Other combinations of the stacker rack 4 and the crane 10 may be used.
  • the crane 10 may be installed corresponding to one stacker rack 4.
  • the power supply connection unit 31 and the communication connection unit 32 perform mechanical connection by the weight of the test device 50 when the test device 50 is loaded on the shelf 5.
  • the power supply connection unit 31 and the communication connection unit 32 may be connected by other means.
  • the power connection part 31 and the communication connection part 32 are provided, for example, on the surface of the shelf 5 that faces the portion where the opening 6 is located, and the connection part on the test apparatus 50 side is loaded when the test apparatus 50 is loaded on the shelf 5. You may provide in the part facing this surface. Thereby, when entering the test apparatus 50 from the opening 6, mechanical connection of the power supply connection section 31 and the communication connection section 32 can be performed by movement of the test apparatus 50 accompanying the operation of the crane 10. Connection can be made without manual connection or provision of a mechanical connection device.
  • the system control device 20 performs communication with the test device 50 and control of the operation of the crane 10, but even if other control is performed.
  • the system controller 20 may perform air conditioning management of a building where the large-scale automated test system 1 is installed. Since the test apparatus 50 may have different temperatures required from the test apparatus 50 depending on the storage medium to be tested and the type of test, the system controller 20 performs air-conditioning management so that the surroundings of the stacker rack 4 The temperature can be set to an appropriate temperature. Alternatively, the temperature in the building can be varied depending on the area, and the test apparatus 50 can be transported to the shelf 5 in the area of the temperature required from the test apparatus 50 when the test apparatus 50 is carried into the shelf 5. Thereby, the storage medium can be tested more appropriately.
  • the installation position of the test apparatus 50 is only the shelf 5 and the work space 8, but other installation positions of the test apparatus 50 may be provided.
  • a loading / unloading area for the test apparatus 50 may be provided at the end opposite to the end where the work space 8 is provided in the longitudinal direction of the stacker rack 4.
  • the large-scale automated test system 1 may appropriately combine the configurations used in the above-described embodiments and modifications, or may use configurations other than those described above. Regardless of the configuration of the large-scale automated test system 1, the stacker rack 4 having a plurality of shelves 5 and the crane 10 that transports the test apparatus 50 are provided. The HDD 60 is attached to and detached from the test apparatus 50 in the work space 8. By conducting the test while the test apparatus 50 is accommodated in the shelf 5, the floor space can be effectively used, and the work efficiency of the operator can be greatly improved.

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  • Automatic Disk Changers (AREA)
  • Warehouses Or Storage Devices (AREA)

Abstract

L'invention a pour but de permettre une utilisation efficace de l'espace au sol, et d'améliorer significativement le rendement de travail du personnel. À cette fin, un système (1) de test automatisé à grande échelle pour supports de stockage comporte des espaces (8) de travail destinés à permettre le montage et le démontage de disques durs (60) par rapport à des dispositifs (50) de test, des étagères (5) abritant les dispositifs (50) de test, un râtelier empileur (4) doté de pluralités desdites étagères (5) à la fois dans une direction horizontale et dans une direction verticale, un élévateur (10) qui transporte les dispositifs (50) de test, un dispositif (25) de commande d'élévateur qui commande l'élévateur (10), et un dispositif (20) de commande du système qui réalise une communication avec les dispositifs (50) de test logés dans les étagères (5), ledit dispositif (20) de commande du système donnant une consigne de démarrage des tests sur les disques durs (60) par rapport aux dispositifs (50) de test montés dans les étagères (5) et, par rapport au dispositif (25) de commande d'élévateur, réalisant des instructions de chargement visant à transporter un dispositif (50) de test, qui est positionné dans un espace (8) de travail dans un état de maintien d'un disque dur (60) préalablement au démarrage des tests, jusqu'à une étagère (5), et réalisant des instructions visant à transporter jusqu'à l'espace (8) de travail le dispositif (50) de test pour lequel les tests sont terminés.
PCT/JP2013/069827 2013-07-22 2013-07-22 Système de test automatisé à grande échelle pour supports de stockage WO2015011775A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2015528042A JP6209610B2 (ja) 2013-07-22 2013-07-22 記憶媒体の大規模自動化試験システム
PCT/JP2013/069827 WO2015011775A1 (fr) 2013-07-22 2013-07-22 Système de test automatisé à grande échelle pour supports de stockage

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2013/069827 WO2015011775A1 (fr) 2013-07-22 2013-07-22 Système de test automatisé à grande échelle pour supports de stockage

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WO2015011775A1 true WO2015011775A1 (fr) 2015-01-29

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JP (1) JP6209610B2 (fr)
WO (1) WO2015011775A1 (fr)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009140589A (ja) * 2007-12-07 2009-06-25 Hitachi Global Storage Technologies Netherlands Bv データ記憶装置のテスト装置及びデータ記憶装置のテスト方法
JP2011507145A (ja) * 2007-12-18 2011-03-03 テラダイン、 インコーポレイテッド ディスクドライブ搬送、クランピングおよびテスト
JP2011524060A (ja) * 2008-06-03 2011-08-25 テラダイン、 インコーポレイテッド 記憶デバイスを処理する方法

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Publication number Priority date Publication date Assignee Title
US7996174B2 (en) * 2007-12-18 2011-08-09 Teradyne, Inc. Disk drive testing
US8305751B2 (en) * 2008-04-17 2012-11-06 Teradyne, Inc. Vibration isolation within disk drive testing systems

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009140589A (ja) * 2007-12-07 2009-06-25 Hitachi Global Storage Technologies Netherlands Bv データ記憶装置のテスト装置及びデータ記憶装置のテスト方法
JP2011507145A (ja) * 2007-12-18 2011-03-03 テラダイン、 インコーポレイテッド ディスクドライブ搬送、クランピングおよびテスト
JP2011524060A (ja) * 2008-06-03 2011-08-25 テラダイン、 インコーポレイテッド 記憶デバイスを処理する方法

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