WO2014112475A1 - 導電性微粒子 - Google Patents
導電性微粒子 Download PDFInfo
- Publication number
- WO2014112475A1 WO2014112475A1 PCT/JP2014/050456 JP2014050456W WO2014112475A1 WO 2014112475 A1 WO2014112475 A1 WO 2014112475A1 JP 2014050456 W JP2014050456 W JP 2014050456W WO 2014112475 A1 WO2014112475 A1 WO 2014112475A1
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- Prior art keywords
- fine particles
- conductive fine
- conductive
- polymer
- mpa
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/02—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors mainly consisting of metals or alloys
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K3/00—Use of inorganic substances as compounding ingredients
- C08K3/28—Nitrogen-containing compounds
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J11/00—Features of adhesives not provided for in group C09J9/00, e.g. additives
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J9/00—Adhesives characterised by their physical nature or the effects produced, e.g. glue sticks
- C09J9/02—Electrically-conducting adhesives
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/09—Use of materials for the conductive, e.g. metallic pattern
- H05K1/092—Dispersed materials, e.g. conductive pastes or inks
- H05K1/095—Dispersed materials, e.g. conductive pastes or inks for polymer thick films, i.e. having a permanent organic polymeric binder
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K9/00—Use of pretreated ingredients
- C08K9/02—Ingredients treated with inorganic substances
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
- H05K1/189—Printed circuits structurally associated with non-printed electric components characterised by the use of a flexible or folded printed circuit
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/02—Fillers; Particles; Fibers; Reinforcement materials
- H05K2201/0203—Fillers and particles
- H05K2201/0206—Materials
- H05K2201/0221—Insulating particles having an electrically conductive coating
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/321—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
Definitions
- the present invention relates to conductive fine particles having excellent connection reliability.
- Conductive fine particles are used in various fields such as adhesives in the electronics field, additives for pressure-sensitive rubber, and additives for imparting conductivity to resin compositions.
- the initial conductive fine particles used are fine particles composed of only metal such as silver particles and gold particles, and the common problem when applying them to various applications is that the specific gravity of the matrix resin is high. Further, sedimentation of metal particles and the like occurred, and it was difficult to uniformly disperse in the matrix resin.
- Patent Documents 1 and 2 a method of using conductive fine particles coated with a metal or an inorganic compound using resin particles as a core material is disclosed.
- adhesives, pressure-sensitive rubbers, resin compositions, etc. which are conductive fine particle applications, are more severe than before, such as processing into complex shapes, resistance to bending and elongation, and use at high and low temperatures. High durability under the usage environment is required.
- conductive fine particles having resin particles as a core material since the production method of resin particles is limited, cross-linked acrylic particles and cross-linked polystyrene particles are used, but in the conductive fine particles using these resin particles, In applications where more complex shapes are required, it is difficult to relieve stress due to shape changes and cracks occur, and electrical conduction cannot be ensured at missing parts such as cracks, reducing connection reliability. was there.
- an object of the present invention is to provide conductive fine particles that are flexible, have high connection reliability, and are suitable for applications such as a flexible substrate that requires flexibility in bending use.
- the conductive fine particles according to the present invention are: “[1] Conductive fine particles composed of polymer fine particles and a conductive layer in which the surface of the polymer fine particles is coated with a metal, and the elastic modulus (E) at 5% displacement of the conductive fine particles is in the range of 1 to 100 MPa.
- Conductive fine particles characterized by [2] The conductive fine particles according to [1], wherein the deformation recovery rate (SR) of the conductive fine particles under a load of 9.8 mN is in the range of 0.1 to 13%, [3] The conductive fine particles according to [1] or [2], wherein the conductive fine particles have a particle size distribution index in the range of 1.0 to 3.0, [4] The conductive fine particles according to any one of [1] to [3], wherein the polymer is a polyether ester copolymer or a polyamide elastomer. [5] The conductive fine particles according to any one of [1] to [4], wherein the volume average particle diameter of the conductive fine particles is in the range of 0.1 to 100 ⁇ m. [6] The conductive fine particles according to any one of [1] to [5], wherein the polymer has a flexural modulus in the range of 10 to 1500 MPa. It is.
- the conductive fine particles according to the present invention since the flexibility is high, there is an effect that even when bending deformation is performed on a flexible substrate or the like, cracking of the conductive fine particles does not occur and high connection reliability is obtained.
- the characteristics of the conductive fine particles according to the present invention can be suitably used for antistatic molded products, ink for electronic circuits, conductive adhesives, electromagnetic wave shielding molded products, conductive paints, conductive spacers, and the like. In particular, it is very useful in that conduction can be maintained because the particles can be deformed without cracking when processed into a complicated shape, bent or stretched.
- the conductive fine particles according to the present invention comprise polymer fine particles and a conductive layer in which the surface of the polymer fine particles is coated with a metal.
- the conductive fine particles of the present invention are characterized in that the elastic modulus (E) at 5% displacement due to compression is in the range of 1 to 100 MPa.
- the elastic modulus (E) in the present invention will be described.
- the following expression (1) is derived from Hertz's contact theory, which is a theory that governs deformation of the sphere.
- E elastic modulus at the time of sphere displacement
- ⁇ strain at the time of sphere displacement
- P load applied to the sphere
- R diameter of the sphere.
- the above formula (1) is an effective relational expression in the elastic deformation region.
- a polymer in the case of a polymer, it cannot be treated as elastic deformation particularly in a region with a large displacement because of its viscoelastic characteristics. Application becomes difficult. Therefore, it is important to evaluate the deformation of the conductive fine particles in a region where elastic deformation occurs.
- the amount of deformation should be 5% as a guide.
- the elastic modulus (E) of the polymer fine particles is within the range specified in the present invention, defects due to particle cracking or the like do not occur when used as a filler for matrix resins, such as adhesives and pressure-sensitive rubber applications. Connection reliability is improved.
- a compressive load is applied to the conductive fine particles, and the elastic modulus (E) of the conductive fine particles when the surface of the conductive fine particles is displaced by 5% (the elastic modulus at the time of 5% displacement of the conductive fine particles (E )) Is defined as 100 MPa, but the upper limit of the elastic modulus (E) is preferably 80 MPa or less, more preferably 60 MPa or less, and particularly preferably 50 MPa or less from the viewpoint that connection reliability can be further improved. . If the conductive fine particles are too flexible, the conductive layer may be cracked due to excessive deformation.
- the lower limit value of the elastic modulus (E) is defined as 1 MPa, but this lower limit value is preferably 5 MPa or more, and 10 MPa.
- the above is more preferable, 20 MPa or more is further preferable, and 30 MPa or more is particularly preferable.
- the elastic modulus (E) at the time of 5% displacement due to the compression is determined by arranging conductive fine particles on a platen using a micro compression tester (manufactured by Shimadzu Corporation, model MCT-210).
- R is the value obtained by measuring the diameter of the randomly selected conductive fine particles, and the particles of the conductive fine particles when loaded to 9.8 mN at a compression speed of 0.29 mN / sec with a diamond indenter with a diameter of 50 ⁇ m.
- the load value when deformed by 5% with respect to the diameter (R) is P 5%
- the strain at 5% displacement is ⁇ , and is calculated using the following equation (2).
- this measurement is implemented by 10 electroconductive fine particles selected at random, and let the average value be the elasticity modulus (E) at the time of 5% displacement by compression in this invention.
- E elastic modulus at 5% displacement (MPa)
- ⁇ strain at 5% displacement of individual particles (mm)
- P 5% Load value at the time of 5% displacement of each particle (kgf)
- R Particle size (mm) of each particle.
- the matrix resin when the deformation recovery rate of the conductive fine particles under a load of 9.8 mN is in the range of 0.1 to 13%, the matrix resin can be used when applied to an adhesive or pressure sensitive rubber. Even during more complicated deformations such as bending and stretching, the conductive fine particles can be flexibly deformed without breaking, and durability such as ensuring conduction can be improved. Furthermore, since the particles are deformed and filled, it is possible to increase the filling in the matrix resin and to improve the conductivity.
- the upper limit of the deformation recovery rate at a load of 9.8 mN is preferably 11% or less, more preferably 9% or less, further preferably 7% or less, and more preferably 5% or less because the conductive fine particles are more easily deformed flexibly. Is most preferred. If the amount of deformation is too large, the particles will be deformed flexibly, but the conductive layer may be cracked, so the lower limit is preferably 0.5% or more, more preferably 1% or more, and even more preferably 2% or more. 3% or more is most preferable.
- the deformation recovery rate (SR) of the conductive fine particles under a load of 9.8 mN is determined by setting the conductive fine particles on the platen using a micro compression tester (manufactured by Shimadzu Corporation, model MCT-210). After measuring randomly selected conductive fine particles, the deformation amount of the conductive fine particles when loaded to 9.8 mN at a compression speed of 0.29 mN / sec with a diamond indenter of 50 ⁇ m in diameter is L 1 ( ⁇ m) Then, the displacement of the conductive fine particles when the load was unloaded to 1 mN at a speed of 0.29 mN / sec was L 2 ( ⁇ m), and this measurement was performed with 10 randomly selected conductive fine particles. It calculates using the following formula
- SR deformation recovery rate (%)
- L 1 deformation amount ( ⁇ m) of fine particles when loaded to 9.8 mN of each particle
- L 2 Displacement when uncompressing individual particles.
- the particle diameter of the conductive fine particles of the present invention is usually from 0.1 to 100 ⁇ m.
- the lower limit is preferably 0.2 ⁇ m or more, more preferably 0.5 ⁇ m or more, further preferably 1 ⁇ m or more, and more preferably 2 ⁇ m or more because sufficient flexibility cannot be imparted.
- Particularly preferable is 5 ⁇ m or more, and most preferable is 7 ⁇ m or more.
- the upper limit is 100 ⁇ m or less, preferably 50 ⁇ m or less, more preferably 30 ⁇ m or less, further preferably 25 ⁇ m or less, 20 ⁇ m or less is particularly preferable, and 15 ⁇ m or less is most preferable.
- the particle size distribution index of the conductive fine particles according to the present invention is usually preferably 1.0 to 3.0. As the particle size distribution index is smaller, the distance between the contacts can be made uniform, so the reliability of conduction between the substrates is improved. Therefore, 3.0 or less is preferable, more preferably 2.0 or less, and still more preferably. 1.8 or less, particularly preferably 1.5 or less, and most preferably 1.3 or less.
- the particle size distribution index of the conductive fine particles in the present invention is calculated as a ratio of the volume average particle size to the number average particle size of the fine particles by the following formula (6).
- the volume average particle diameter of the conductive fine particles referred to in the present invention is calculated from the following formula (5) by observing 100 particles at random in a scanning electron micrograph and measuring the diameter.
- the particle size distribution index is calculated by the ratio of the volume average particle size to the number average particle size according to the following formula (6).
- the number average particle diameter is calculated from the following formula (4) by observing 100 particles randomly in a scanning electron micrograph, measuring the diameter. In addition, when a particle is not a perfect circle, the major axis shall be measured.
- the shape of the conductive fine particles is preferably a true sphere, but may be elliptical because it is deformed into an elliptical shape by a load.
- the conductive fine particles according to the present invention comprise polymer fine particles and a conductive layer in which the surface of the polymer fine particles is coated with a metal.
- the metal used for the conductive layer is not particularly limited, and examples thereof include nickel, gold, silver, copper, platinum, aluminum, palladium, cobalt, tin, indium, lead, and iron. From the viewpoint of conductivity, gold, Silver, copper and the like are particularly preferable.
- the thickness of the conductive layer is preferably in the range of 0.01 to 5 ⁇ m.
- the apparent specific gravity of the conductive fine particles increases and sedimentation in the matrix resin occurs, so that it is more preferably 3 ⁇ m or less, more preferably 1 ⁇ m or less, and most preferably 0.8 ⁇ m or less. . If the conductive layer is too thin, sufficient conductivity cannot be ensured. More desirably, the thickness is more preferably 0.05 ⁇ m or more, more preferably 0.1 ⁇ m or more, further preferably 0.2 ⁇ m or more, and most preferably 0.4 ⁇ m or more. .
- the material of the polymer fine particles which is the core material used for the conductive fine particles according to the present invention, has a thermal modulus (E) at 5% displacement due to compression of the conductive fine particles within the range of 1 to 100 MPa.
- a plastic resin is preferred.
- thermoplastic resins examples include polyamide, polyester, polycarbonate, polyphenylene ether, polyamideimide, polyetherimide, polyethersulfone, polyarylate, polyamide elastomer, and polyester elastomer, and 5% by compression of conductive fine particles. Since the elastic modulus (E) at the time of displacement can be adjusted within the range of the present invention, aliphatic polyamides such as nylon 12, nylon 11 and nylon 1010, polyester elastomers such as polyamide elastomers and polyether ester block copolymers are preferred.
- the bending elastic modulus of the polymer that is the raw material of the polymer fine particles is a polymer in the range of 10 to 1500 MPa and the thermal deformation temperature is 160 ° C. or higher, it can be connected to an adhesive using conductive fine particles at a high temperature.
- Polyamide elastomers and polyetherester block copolymers are particularly preferred because they can provide reliability.
- the elastic modulus of the conductive fine particles is too high, cracking of the polymer fine particles is likely to occur. Therefore, the bending elastic modulus of the polymer is preferably 1300 MPa or less, more preferably 1100 MPa or less, and more preferably 900 MPa or less.
- the bending elastic modulus of the polymer is desirably 10 MPa or more, preferably 50 MPa or more, preferably 100 MPa or more. Is more preferable, 300 MPa or more is further preferable, and 500 MPa or more is particularly preferable.
- polyester elastomers such as polyamide elastomers and polyether ester block copolymers are extremely preferable as the thermoplastic resin used.
- the heat distortion temperature is preferably 170 ° C. or higher, more preferably 180 ° C. or higher, particularly preferably 190 ° C. or higher, and 200 ° C. or higher.
- the polyether ester block copolymer is most preferable as the thermoplastic resin used.
- disassembly of a thermoplastic resin etc. arise, it is preferable that it is 300 degrees C or less, and it is more preferable that it is 280 degrees C or less.
- the flexural modulus as used in the present invention refers to a value measured based on ASTM-D790-98.
- pellets obtained by drying the polymer with hot air at 90 ° C. for 3 hours or more were molded using an injection molding machine (NEX-1000, manufactured by Nissei Plastic Industries) at a cylinder temperature of 240 ° C. and a mold temperature of 50 ° C.
- NEX-1000 manufactured by Nissei Plastic Industries
- the heat distortion temperature referred to in the present invention indicates a glass transition point or melting point of a polymer, and a polymer having both a glass transition point and a melting point indicates a melting point.
- the glass transition point was measured using a differential scanning calorimeter (for example, robot DSC RDC220 manufactured by Seiko Instruments Inc.) under a nitrogen gas atmosphere at a temperature rising rate of 30 ° C. to 10 ° C./min.
- the melting point means a melting point measured at a heating rate of 10 ° C./min using a differential scanning calorimeter (for example, Robot DSC RDC220 manufactured by Seiko Instruments Inc.).
- the polyether ester block copolymer in the present invention is a block copolymer containing a polyester unit and a polyether unit.
- the polyester unit is not particularly limited as long as it has an ester bond in the main chain or side chain, and can be obtained by polycondensation from an acid component and a glycol component.
- the acid component constituting the polyester unit includes terephthalic acid, isophthalic acid, phthalic acid, 2,5-dimethylterephthalic acid, 1,4-naphthalenedicarboxylic acid, biphenyldicarboxylic acid, 2,6-naphthalenedicarboxylic acid, 1,2 -Bisphenoxyethane-p, p'-dicarboxylic acid, phenylindanedicarboxylic acid, succinic acid, adipic acid, sebacic acid, azelaic acid, dodecanedioic acid, dimer acid, 1,3-cyclopentanedicarboxylic acid, 1,2- Cyclohexanedicarboxylic acid, 1,4-cyclohexanedicarboxylic acid, and the like, and ester-forming derivatives thereof, and acid components containing a sulfonic acid group and its base include, for example, sulfoterephthalic acid, 5-sulfoisophthalic
- glycol component constituting the polyester unit examples include ethylene glycol, diethylene glycol, polyethylene glycol, propylene glycol, polypropylene glycol, 1,3-propanediol, 1,3-butanediol, 1,4-butanediol, and 1,5-pentane.
- polyester unit in the present invention a glycol polycondensate of aromatic dicarboxylic acid is preferable in terms of flexural modulus and heat distortion temperature, and polyethylene terephthalate, polybutylene terephthalate, and the like are most preferable.
- the polyether unit in the present invention is represented by the following general formula (Formula 1).
- R represents a divalent aliphatic group, specifically, a linear saturated hydrocarbon group, a branched saturated hydrocarbon group, a linear unsaturated hydrocarbon group, or a branched unsaturated hydrocarbon group.
- n is the number of repeating units and indicates a positive number.
- the linear saturated hydrocarbon group, branched saturated hydrocarbon group, linear unsaturated hydrocarbon group, branched unsaturated hydrocarbon group preferably has 1 to 20 carbon atoms from the viewpoint of excellent heat distortion temperature, In particular, the number of carbon atoms is preferably 1 to 10.
- polyether unit examples include polyethylene glycol, polypropylene glycol, polytrimethylene glycol, polytetramethylene glycol, polyhexamethylene glycol, a copolymer of ethylene oxide and propylene oxide, an ethylene oxide adduct of polypropylene glycol, and ethylene oxide and tetrahydrofuran. And the like. From the viewpoint of improving the heat distortion temperature, it is particularly preferable that R has 1 to 10 carbon atoms such as polyethylene glycol, polypropylene glycol, polytrimethylene glycol, polytetramethylene glycol.
- the content of the polyether unit is 90% by mass or less in the polyether ester block copolymer, and is preferably 80% by mass or less, more preferably 70% by mass or less from the viewpoint of improving the flexural modulus of the resin.
- a lower limit is 2 mass% or more, Preferably it is 5 mass% or more, More preferably, it is 10 mass% or more, Most preferably, it is 20 mass% or more.
- the weight average molecular weight of the polyetherester block polymer fine particles in the present invention is not particularly limited, but is usually 1,000 to 100,000, preferably 2,000 to 60,000, more preferably. 3,000 to 40,000.
- the weight average molecular weight is a weight average molecular weight measured by gel permeation chromatography (GPC) using hexafluoroisopropanol as a solvent and converted to standard polystyrene.
- the particle diameter of the polymer fine particles in the present invention is not particularly limited as long as the volume average particle diameter of the conductive fine particles is in the range of 0.1 to 100 ⁇ m when the conductive layer is coated, and is usually 0.1 to less than 100 ⁇ m. It is a range.
- the lower limit of the volume average particle diameter of the polymer fine particles is preferably 0.2 ⁇ m or more, and 0.5 ⁇ m or more. Is more preferable, more than 1 ⁇ m is more preferable, 2 ⁇ m or more is particularly preferable, 5 ⁇ m or more is extremely preferable, and 7 ⁇ m or more is most preferable.
- the upper limit of the volume average particle diameter of the polymer fine particles is desirably less than 100 ⁇ m, preferably 50 ⁇ m or less, preferably 30 ⁇ m. The following is more preferable, 25 ⁇ m or less is further preferable, 20 ⁇ m or less is particularly preferable, and 15 ⁇ m or less is most preferable.
- the particle size distribution index of the polymer fine particles in the present invention is preferably in the range of 1.0 to 3.0 because it becomes the particle size distribution index of the conductive fine particles.
- the particle size distribution index of the polymer fine particles is a volume average with respect to the number average particle size according to the following formulas (4), (5), and (6) according to the calculation method of the particle size distribution index of the conductive fine particles described later. Calculated by the ratio of particle diameters. In addition, the average particle diameter shall measure the long diameter, when a particle is not a perfect circle.
- Examples of the method for producing conductive fine particles of the present invention include an electroless plating method, a method of coating metal fine particles with polymer powder together with a binder, ion sputtering, vacuum evaporation, etc.
- An electroless plating method is preferably used because it is easy to form a conductive layer.
- polymer fine particles or an aqueous slurry of polymer fine particles are added to an electroless plating solution containing a desired conductive metal salt, reducing agent, complexing agent and various additives, and then electroless plating treatment is performed. Do.
- the conductive metal salt examples include metal chlorides, sulfates, acetates, nitrates, carbonates and the like exemplified above as the conductive metal layer.
- nickel salts such as nickel chloride, nickel sulfate, and nickel acetate can be used.
- a salt a gold salt, a silver salt, and a copper salt are preferable because a conductive layer is easily formed, and among them, a silver salt is preferable.
- silver salt for example, silver oxide, silver chloride, silver sulfate, silver carbonate, silver nitrate, silver acetate and the like can be used, but silver nitrate is most preferable in terms of solubility and economy.
- sodium hypophosphite, borane dimethylamine complex, sodium borohydride, potassium borohydride, hydrazine, glyoxal, formaldehyde, ascorbic acid, glucose, hydroquinone, formic acid, etc. are used as the reducing agent.
- Glucose, glyoxal, formaldehyde, and ascorbic acid are preferred because they can be reduced to silver and can be reduced to silver in a shorter time.
- the preferred pH of the electroless plating solution in the electroless plating method is 4-14.
- the state of the conductive layer of the obtained conductive fine particles varies depending on the pH.
- the pH of the electroless plating solution is preferably in the range of 4 to 12, and the pH is 4 to 10. The range is more preferable, and the range of pH 4 to 8 is particularly preferable.
- the polymer fine particles can be produced by a known method. Specifically, a polymer is dissolved in an organic solvent, added to water to form an O / W emulsion, and then the organic solvent is dried under reduced pressure to remove fine particles to produce fine particles.
- International Publication No. 2012/043509 The polymer (A) and the polymer (B) different from the polymer (A) are dissolved in an organic solvent to form an emulsion, and then contacted with water, which is a poor solvent for the polymer (A), to produce fine particles A method is mentioned.
- the polymer (A) and the polymer (A) described in International Publication No. 2012/043509 are organic solvents.
- a method of producing fine particles by dissolving different polymers (B), forming an emulsion at a temperature of 100 ° C. or higher, and then contacting water, which is a poor solvent for the polymer, is preferable.
- the polymer (A) of the above production method has a flexural modulus of 100 to 1500 MPa
- the polymer (B) different from the polymer (A) is any one of polyvinyl alcohol, polyethylene glycol, and hydroxypropyl cellulose, and the organic solvent is an aprotic polar solvent.
- a method of producing fine particles by bringing water (A), which is a poor solvent, into contact, is preferred.
- the bending elastic modulus of the polymer (A) is preferably 1300 MPa or less, more preferably 1100 MPa or less, and further preferably 900 MPa or less. If the polymer fine particles are too flexible, the conductive layer is cracked due to the deformation of the conductive fine particles. Therefore, the bending elastic modulus of the polymer (A) is desirably 10 MPa or more, preferably 50 MPa or more, and 100 MPa. The above is more preferable, 300 MPa or more is further preferable, and 500 MPa or more is particularly preferable.
- a polyamide elastomer or a polyether ester block copolymer is preferable, and a polyether ester block copolymer is particularly preferable because heat resistance can be imparted to the conductive fine particles. preferable.
- the polymer (B) is preferably polyvinyl alcohol or polyethylene glycol, particularly preferably polyvinyl alcohol.
- organic solvent examples include N-methyl-2-pyrrolidone, dimethyl sulfoxide, N, N-dimethylformamide, N, N-dimethylacetamide, propylene carbonate, and the like, particularly preferably N-methyl 2-pyrrolidone, dimethyl sulfoxide, and the like.
- the conductive fine particles according to the present invention have high flexibility, even if they are bent and deformed on a flexible substrate or the like, the conductive fine particles are not cracked and the connection reliability is high. It is suitable for conductive molded products, ink for electronic circuits, conductive adhesives, electromagnetic shielding molded products, conductive paints, conductive spacers, and the like. Furthermore, since the particles can be deformed without breaking with respect to processing, bending, and elongation into a complicated shape, it is very useful in that conduction can be maintained.
- volume average particle diameter is a scanning electron micrograph, where 100 particles are randomly observed and the diameter is measured. Calculated from the following equation (5).
- the particle size distribution index is calculated by the ratio of the volume average particle size to the number average particle size according to the following formula (6).
- the number average particle diameter is calculated from the following equation (4) by observing 100 particles at random in a scanning electron micrograph and measuring the diameter. In addition, when a particle is not a perfect circle, the major axis shall be measured.
- Ri is the particle size of each particle
- n is the number of measurements 100
- Dn is the number average particle size
- Dv is the volume average particle size
- PDI is the particle size distribution index.
- the compressive elastic modulus (E) at 5% displacement of conductive fine particles was measured by a micro compression tester (manufactured by Shimadzu Corporation, MCT- 210 type) was measured by the following method. Conductive fine particles are placed on the platen of a micro-compression tester, and the particle diameter (R) of the conductive fine particles randomly selected from the fine particles is measured. A compression rate of 0. From the load value (P 5% ) when deformed 5% with respect to the particle diameter (R) of the conductive fine particles at 29 mN / sec up to 9.8 mN, the strain ( ⁇ ) at the time of 5% displacement is It calculated using Formula (2). This measurement is carried out with 10 randomly selected conductive fine particles, and the compression elastic modulus at 5% displacement of each is measured, and the arithmetic average value thereof is calculated as the compression elastic modulus at 5% displacement (E ).
- E Elastic modulus at 5% displacement (MPa)
- ⁇ Strain at 5% displacement of individual particles (mm)
- P 5% At 5% displacement of individual particles
- R particle diameter (mm) of each particle.
- SR Deformation recovery rate after loading
- the deformation amount of the conductive fine particles when loaded to 9.8 mN at a compression speed of 0.29 mN / sec with a diamond indenter of 50 ⁇ m in diameter is L 1 ( ⁇ m)
- the displacement of the conductive fine particles when the load was unloaded to 1 mN at a speed of 0.29 mN / sec was L 2 ( ⁇ m), and this measurement was performed with 10 randomly selected conductive fine particles. It calculates using Formula (3).
- SR deformation recovery rate (%)
- L 1 deformation amount ( ⁇ m) of fine particles when loaded to 9.8 mN of individual particles
- L 2 compression of individual particles Displacement when unloaded.
- a conductive adhesive is applied on an ITO film (10 ⁇ 70 ⁇ 0.2 mm), and a copper foil (10 ⁇ 70 ⁇ 0.2 mm) is formed thereon.
- the conductive adhesive layer is adjusted to have a thickness of 0.1 mm and cured under conditions of 180 ° C. and 30 minutes.
- the obtained film is repeatedly bent (the bending at an angle of 180 ° is counted as one time), and the digital film is placed on each of the ITO film side and the copper foil side so as to sandwich the bent portion at the 10, 50, and 100th bending.
- An electrode of a multimeter manufactured by ADC was attached, its electrical resistance was measured, and continuity was evaluated.
- the obtained powder was observed with a scanning electron microscope, it was a spherical fine particle, a polyether ester block copolymer fine particle having a volume average particle size of 14.7 ⁇ m and a particle size distribution index of 1.23. Met.
- Example 1 Production of conductive fine particles 40 g of polymer fine particles prepared in Production Example 2 were added to 160 g of water adjusted to pH 5, and 88 mL of silver nitrate ammonia solution (7.7 g of silver nitrate was added to water to add aqueous ammonia. In addition, after conducting a substitution reaction treatment while slowly adding 30 mL of time) over a period of 30 minutes, 5.0 g of glucose was added and a reduction reaction treatment was conducted for 30 minutes. Got. The conductive fine particles were separated, washed with ion exchange water, and vacuum dried at 80 ° C. to obtain conductive fine particles.
- the volume average particle size of the conductive fine particles is 10.5 ⁇ m, the particle size distribution index is 1.77, the compression elastic modulus (E) at 5% displacement of the conductive fine particles is 33 MPa, and the deformation recovery after loading The rate (SR) was 1.2%.
- Example 2 Production of conductive fine particles Silver plating was performed in the same manner as in Example 1 except that the polyether ester block copolymer fine particles produced in Production Example 3 were used.
- the volume average particle diameter of the conductive fine particles is 19.5 ⁇ m
- the particle size distribution index is 1.31
- the compression elastic modulus (E) at 5% displacement of the conductive fine particles is 33 MPa
- deformation recovery after loading was 31%.
- Example 3 When the bending resistance test and the connection reliability test were performed using the conductive adhesive produced in Production Example 4, conduction was ensured even at the 100th bending, and A determination with high connection reliability was made.
- Example 4 Using the conductive fine particles produced in Example 2, a conductive adhesive was produced according to the method of Production Example 4 and subjected to a bending resistance test and a connection reliability test. As a result, conduction was ensured at the 50th bending. However, the film was cracked at the 60th bending, and the conduction was lost at the 100th bending. Therefore, it was set as B determination with sufficient connection reliability.
- Comparative Example 3 Using the conductive fine particles produced in Comparative Example 1, a conductive adhesive was produced in accordance with the method of Production Example 4, and the bending resistance test and the connection reliability test were conducted. In the 10th bend, continuity is lost, and D determination with low connection reliability is made.
- Comparative Example 4 Except for using the conductive fine particles of Comparative Example 2, an attempt was made to produce a conductive adhesive according to Production Example 4, but the conductive fine particles aggregated and the conductive fine particles could not be dispersed in the epoxy resin. I could't paint.
- the conductive fine particles of the present invention have high flexibility, even if they are bent and deformed on a flexible substrate or the like, the conductive fine particles do not generate cracks and the connection reliability is high. Suitable for molded articles, ink for electronic circuits, conductive adhesives, electromagnetic shielding molded articles, conductive paints, conductive spacers, and the like. Furthermore, since the particles can be deformed without breaking with respect to processing, bending, and elongation into a complicated shape, it is very useful in that conduction can be maintained.
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Abstract
Description
すなわち本発明に係る導電性微粒子は、
「[1]ポリマー微粒子と該ポリマー微粒子の表面を金属で被膜した導電層からなる導電性微粒子であり、導電性微粒子の5%変位時の弾性率(E)が、1~100MPaの範囲にあることを特徴とする導電性微粒子、
[2]9.8mN荷重時の導電性微粒子の変形回復率(SR)が、0.1~13%の範囲にある[1]に記載の導電性微粒子、
[3]導電性微粒子の粒子径分布指数が、1.0~3.0の範囲にある[1]または[2]に記載の導電性微粒子、
[4]ポリマーが、ポリエーテルエステル共重合体またはポリアミドエラストマーである[1]~[3]のいずれか1項に記載の導電性微粒子、
[5]導電性微粒子の体積平均粒子径が、0.1~100μmの範囲にある[1]~[4]のいずれか1項に記載の導電性微粒子、
[6]ポリマーの曲げ弾性率が、10~1500MPaの範囲にある[1]~[5]のいずれか1項に記載の導電性微粒子」
である。
本発明に係る導電性微粒子は、ポリマー微粒子と該ポリマー微粒子の表面を金属で被膜した導電層からなる。この本発明の導電性微粒子は、圧縮による5%変位時の弾性率(E)が1~100MPaの範囲にあることが特徴である。
球体に対してかかる荷重と変位からその弾性率を導く関係式として、球体の変形をつかさどる理論であるヘルツの接触理論から下記の式(1)が導かれることが知られている。
重量平均分子量は、ゲルパーミエーションクロマトグラフィー法を用い、ポリスチレンによる校正曲線と対比させて分子量を算出した。
装置:株式会社島津製作所製 LC-10Aシリーズ
カラム:昭和電工株式会社製 HFIP-806M×2
移動相:ヘキサフルオロイソプロパノール
流速:0.5ml/min
検出:示差屈折率計
カラム温度:25℃
微粒子の体積平均粒子径とは、走査型電子顕微鏡写真にて、無作為に粒子100個を観測、直径を測定し、以下の式(5)より算出する。粒子径分布指数は、以下の式(6)に従い、数平均粒子径に対する体積平均粒子径の比により算出する。数平均粒子径は、走査型電子顕微鏡写真にて、無作為に粒子100個を観測、直径を測定し、以下の式(4)より算出する。尚、粒子が真円でない場合は、その長径を測定するものとする。
セイコーインスツル株式会社製ロボットDSC RDC220を使用し、窒素ガス雰囲気下、10℃/分の昇温速度で加熱し、ガラス転移点と融点を測定した。
導電性微粒子の5%変位時の圧縮弾性率(E)は、微小圧縮試験機(株式会社島津製作所製、MCT-210型)を用いて、下記の方法で測定を行った。
微小圧縮試験機の圧盤上に導電性微粒子を配置し、その中から無作為に選んだ導電性微粒子の粒子径(R)を測長し、ダイヤモンド製の直径50μmの圧子で、圧縮速度0.29mN/秒で9.8mNまで荷重し、導電性微粒子の粒子径(R)に対して5%変形した際の荷重値(P5%)、5%変位時のひずみ(δ)から、下記の式(2)を用いて算出した。本測定は、無作為に選択した10個の導電性微粒子で実施し、それぞれの5%変位時圧縮弾性率を測定し、その算術平均値を本発明における5%変位時の圧縮弾性率(E)とした。
9.8mN荷重時の導電性微粒子の変形回復率(SR)とは、微小圧縮試験機(株式会社島津製作所製、MCT-210型)を用いて、圧盤上に導電性微粒子を設置し、無作為に選んだ導電性微粒子を測長後、ダイヤモンド製の直径50μmの圧子で、圧縮速度0.29mN/秒で9.8mNまで荷重した際の導電性微粒子の変形量をL1(μm)、その後、荷重を速度0.29mN/秒で1mNまで除荷した際の導電性微粒子の変位をL2(μm)とし、本測定を無作為に選択した10個の導電性微粒子で実施し、以下の式(3)を用いて算出する。
ITOフィルム(10×70×0.2mm)上に、導電性接着剤を塗工し、その上に銅箔(10×70×0.2mm)を設置し、導電性接着剤層を0.1mmの厚さとなるよう調整し、180℃、30分の条件下で硬化させる。得られたフィルムを繰り返し屈曲させ(角度180°での屈曲を1回とカウント)、10,50,100回目の屈曲時に、屈曲部を挟み込むようにITOフィルム側と銅箔側のそれぞれに、デジタルマルチメータ(エーディーシー社製)の電極を取り付け、その電気抵抗を測定し、導通を評価した。屈曲回数に対する導通結果から、総合的な評価を以下のように行った。
A: 「屈曲100回目で、導通が確保」
B: 「屈曲50回目で、導通が確保、100回で導通がなかったもの」
C: 「屈曲10回目で、導通が確保、50回で導通がなかったもの」
D: 「屈曲10回目で、既に導通が失われる」
尚、A,Bを接続信頼性があると判断し、C,Dは接続信頼性がないと判断した。
テレフタル酸42.7部、1,4-ブタンジオール37.3部および重量平均分子量約3000のポリテトラメチレングリコール20.0部を、チタンテトラブトキシド0.01部とモノ-n-ブチル-モノヒドロキシスズオキサイド0.005部をヘリカルリボン型撹拌翼を備えた反応容器に仕込み、190~225℃で3時間加熱して反応水を系外に留出しながらエステル化反応を行った。反応混合物にテトラ-n-ブチルチタネート0.06部を追添加し、“イルガノックス”1098(チバ・ジャパン(株)製ヒンダードフェノール系酸化防止剤)0.02部を添加した後、245℃に昇温し、次いで50分かけて系内の圧力を30Paの減圧とし、その条件下で2時間50分重合を行わせて、ポリエーテルエステルブロック共重合体を得た。融点は、224℃であり、重量平均分子量は、27,000、曲げ弾性率は、1100MPaであった。
1000mlの耐圧ガラスオートクレーブ(耐圧硝子工業(株)製、ハイパーグラスターTEM-V1000N)の中に、製造例1で作成したポリエーテルエステルブロック共重合体(重量平均分子量:27,000)33.25g、N-メチル-2-ピロリドン299.25g、ポリビニルアルコール(和光純薬工業株式会社製、PVA-1500、重量平均分子量29,000:メタノールでの洗浄により、酢酸ナトリウム含量を0.05質量%に低減したもの)17.5gを加え、窒素置換を行った後、180℃に加熱し、ポリマーが溶解するまで4時間攪拌を行った。その後、貧溶媒として350gのイオン交換水を、送液ポンプを経由して、2.92g/分のスピードで滴下した。全量の水を入れ終わった後、攪拌したまま降温させ、得られた懸濁液をろ過し、イオン交換水700gを加えてリスラリー洗浄し、濾別したものを、80℃で10時間真空乾燥させ、白色固体28.3gを得た。得られた粉体を走査型電子顕微鏡にて観察したところ真球状の微粒子であり、体積平均粒子径は、14.7μm、粒子径分布指数は、1.23のポリエーテルエステルブロック共重合体微粒子であった。
製造例1で作成したポリエーテルエステルブロック共重合体(重量平均分子量 27,000)35.00g、N-メチル-2-ピロリドン300.00g、ポリビニルアルコール(和光純薬工業株式会社製 PVA-1500、重量平均分子量29,000:メタノールでの洗浄により、酢酸ナトリウム含量を0.05質量%に低減したもの)15.0gに変更した以外は、製造例2と同様にした。得られた粉体を走査型電子顕微鏡にて観察したところ真球状の微粒子であり、体積平均粒子径は、18.5μm、粒子径分布指数は、1.27のポリエーテルエステルブロック共重合体微粒子であった。
pHを5に調整した水160gに製造例2で作成したポリマー微粒子40gを加え、硝酸銀アンモニア溶液88mL(硝酸銀7.7gを水に添加してアンモニア水を加え、88mLとして調整したもの)を、30分間の時間をかけてゆっくりと添加しながら置換反応処理を行った後に、グルコースを5.0g加え還元反応処理を30分間行い、銀メッキの導電性微粒子を得た。導電性微粒子を分離、イオン交換水で洗浄し、80℃で真空乾燥することで導電性微粒子を得た。導電性微粒子の体積平均粒子径は、10.5μm、粒子径分布指数は、1.77であり、導電性微粒子の5%変位時の圧縮弾性率(E)は、33MPa、荷重後の変形回復率(SR)は、1.2%であった。
製造例3で作製したポリエーテルエステルブロック共重合体微粒子を使用した以外は、実施例1と同様に銀メッキ処理を行った。導電性微粒子の体積平均粒子径は、19.5μm、粒子径分布指数は、1.31であり、導電性微粒子の5%変位時の圧縮弾性率(E)は、33MPa、荷重後の変形回復率(SR)は、31%であった。
日本化学工業株式会社製のブライト20GNR―EHの体積平均粒子径は、4.6μmであり、粒子径分布指数は、1.01、5%変位時の圧縮弾性率(E)は、189MPaであった。
製造例1で作製したポリエーテルエステルブロック共重合体を凍結粉砕処理した。その後、製造例3の方法に従い、銀メッキ処理を行った。導電性微粒子の体積平均粒子径は、60μmであり、粒子径分布指数は、5.2であり、導電性微粒子の5%変位時の圧縮弾性率(E)は、40MPaであった。
ビスフェノール型エポキシ樹脂(三菱化学株式会社製「JER 1004」)100g、硬化剤4,4’-ジアミノジフェニルスルホン30g、実施例1で作製した導電性微粒子10gの混合物を自転・公転ミキサー「あわとり練太郎ARE-310」(株式会社シンキー製)を用いて2,000rpm/minで3分間撹拌し、導電性接着剤を調整した。
製造例4で作製した導電性接着剤を用い、耐屈曲性試験と接続信頼性試験を行ったところ、屈曲100回目でも導通が確保されており、高い接続信頼性があるA判定とした。
実施例2で作製した導電性微粒子を用い、製造例4の方法に従い導電性接着剤を作製し、耐屈曲性試験と接続信頼性試験を行ったところ、屈曲50回目では導通が確保されていたが、屈曲60回目で、フィルムに割れが発生し、屈曲100回目では、導通が失われていた。したがって、十分な接続信頼性があるB判定とした。
比較例1で作製した導電性微粒子を用い、製造例4の方法に従い導電性接着剤を作製し、耐屈曲性試験と接続信頼性試験を行ったところ、屈曲3回目でフィルムに割れが発生し、屈曲10回目では、導通が失われており、接続信頼性が低いD判定とした。
比較例2の導電性微粒子を使用した以外は、製造例4に従い導電性接着剤の作製を試みたが、導電性微粒子が凝集し、エポキシ樹脂中に導電性微粒子を分散させることができず、塗工ができなかった。
Claims (6)
- ポリマー微粒子と該ポリマー微粒子の表面を金属で被膜した導電層からなる導電性微粒子であり、導電性微粒子の5%変位時の弾性率(E)が、1~100MPaの範囲にあることを特徴とする導電性微粒子。
- 9.8mN荷重時の導電性微粒子の変形回復率(SR)が、0.1~13%の範囲にある、請求項1に記載の導電性微粒子。
- 導電性微粒子の粒子径分布指数が、1.0~3.0の範囲にある、請求項1または2に記載の導電性微粒子。
- ポリマーが、ポリエーテルエステル共重合体またはポリアミドエラストマーである、請求項1~3のいずれか1項に記載の導電性微粒子。
- 導電性微粒子の体積平均粒子径が、0.1~100μmの範囲にある、請求項1~4のいずれか1項に記載の導電性微粒子。
- ポリマーの曲げ弾性率が、10~1500MPaの範囲にある、請求項1~5のいずれか1項に記載の導電性微粒子。
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KR101178745B1 (ko) * | 2004-07-15 | 2012-09-07 | 세키스이가가쿠 고교가부시키가이샤 | 도전성 미립자, 도전성 미립자의 제조 방법, 및 이방성도전 재료 |
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WO2012043509A1 (ja) | 2010-09-28 | 2012-04-05 | 東レ株式会社 | ポリマー微粒子およびその製造方法 |
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JP2016062879A (ja) * | 2014-09-22 | 2016-04-25 | デクセリアルズ株式会社 | 異方性導電材料 |
JP2021012041A (ja) * | 2019-07-03 | 2021-02-04 | デクセリアルズ株式会社 | 電気特性の検査冶具 |
Also Published As
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JPWO2014112475A1 (ja) | 2017-01-19 |
EP2947663A1 (en) | 2015-11-25 |
JP6066348B2 (ja) | 2017-01-25 |
TWI616897B (zh) | 2018-03-01 |
MY179393A (en) | 2020-11-05 |
KR20150109331A (ko) | 2015-10-01 |
CN104937674A (zh) | 2015-09-23 |
TW201435913A (zh) | 2014-09-16 |
US20150318067A1 (en) | 2015-11-05 |
EP2947663A4 (en) | 2016-09-07 |
CN104937674B (zh) | 2018-01-30 |
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