WO2014047978A1 - Tft-lcd基板的探测装置 - Google Patents
Tft-lcd基板的探测装置 Download PDFInfo
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- WO2014047978A1 WO2014047978A1 PCT/CN2012/082815 CN2012082815W WO2014047978A1 WO 2014047978 A1 WO2014047978 A1 WO 2014047978A1 CN 2012082815 W CN2012082815 W CN 2012082815W WO 2014047978 A1 WO2014047978 A1 WO 2014047978A1
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- Prior art keywords
- tft
- motors
- probes
- electrically connected
- programmable logic
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- 239000000758 substrate Substances 0.000 title claims abstract description 85
- 239000000523 sample Substances 0.000 claims abstract description 74
- 238000001514 detection method Methods 0.000 claims abstract description 36
- 230000003993 interaction Effects 0.000 claims abstract description 16
- 238000000034 method Methods 0.000 claims description 47
- 238000012545 processing Methods 0.000 claims description 35
- 238000004891 communication Methods 0.000 claims description 10
- 238000004519 manufacturing process Methods 0.000 abstract description 13
- 239000004973 liquid crystal related substance Substances 0.000 description 19
- 230000008569 process Effects 0.000 description 11
- 230000000694 effects Effects 0.000 description 4
- 230000008859 change Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 239000000565 sealant Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
Definitions
- the present invention relates to a TFT-LCD (Thin Film Transistor Liquid Crystal Display) array substrate detecting technology, and more particularly to a probe structure of a TFT-LCD substrate detecting device.
- TFT-LCD Thin Film Transistor Liquid Crystal Display
- Liquid crystal display has many advantages such as thin body, power saving, and no radiation, and has been widely used.
- Most of the liquid crystal display devices on the market are backlight type liquid crystal display devices, which include a liquid crystal display panel and a backlight module.
- the working principle of the liquid crystal display panel is to place liquid crystal molecules in two parallel glass substrates, control the liquid crystal molecules to change direction by energizing or not the glass substrate, and refract the light of the backlight module to produce a picture.
- the liquid crystal display panel is composed of an upper substrate (CF, Color Filter), a lower substrate (TFT, Thin Film Transistor), a liquid crystal (LC, liquid crystal) sandwiched between the upper substrate and the lower substrate, and a sealant.
- the molding process generally includes: an Array process (film, yellow light, etching, and stripping), a middle cell (Cell) process (a TFT substrate and a CF substrate are bonded), and a rear module assembly process (drive IC). Pressed with the printed circuit board).
- the front Array process mainly forms a TFT substrate to control the movement of liquid crystal molecules; the middle Cell process mainly adds liquid crystal between the TFT substrate and the CF substrate; the rear module assembly process is mainly to drive the IC to press and print the circuit.
- the integration of the plates drives the liquid crystal molecules to rotate, displaying images.
- the substrate filled with the liquid crystal is irradiated by UV1 (ultraviolet) irradiation in an HVA (high-voltage-activated) process, and the alignment effect is checked by an AOI (Automated Optical Inspection) inspection machine. Whether it is UV1 or AOI, it is necessary to press the probe (pin) on the probe to contact the panel detection signal input terminal (pad) of the TFT substrate to pressurize the liquid crystal.
- a block corresponding to the TFT substrate is disposed on the detector, and a probe corresponding to the panel detection signal input end of the TFT substrate is disposed on the block to complete the pressurization of the liquid crystal.
- Lifting detector The detector first advances to the position below the panel detection signal input end of the TFT substrate, and then the detector rises until the probe is tied to the panel detection signal input end of the TFT substrate, and then pressurized to complete the HVA. Process and AOI testing.
- Clamp-type detector The detector first rises to the height of the TFT substrate, and then the detector advances to the position of the panel detection signal input end of the TFT substrate. Then, the upper and lower parts of the block simultaneously sandwich the TFT substrate, and the probe is stuck on the TFT. The panel of the substrate detects the signal input terminal and then pressurizes to complete the HVA process and AOI detection.
- both the lift detector and the clamp detector have the following drawbacks: A detector can only pressurize a TFT substrate of one size. Since TFTs of different sizes have different press points, this requires different probe positions on the corresponding blocks. Therefore, for different sizes of TFT substrates, the Array Checker series devices need to be replaced. And re-confirm the contact condition and voltage output status of the probe and the TFT substrate, which wastes the production line time, increases the line load, and is easy to change the detector, and there is a risk of collision during the process of changing the detector. Summary of the invention
- the object of the present invention is to provide a detecting device for a TFT-LCD substrate, which can meet the detection needs of various TFT substrates of different sizes, improve the production efficiency of the production line, and avoid the risk of collision when the existing detector is replaced. .
- the present invention provides a detecting device for a TFT-LCD substrate, comprising: a main body of the machine, a circuit board mounted on the main body of the machine, and a plurality of motors mounted on the main body of the machine and respectively mounted on the motor
- the plurality of probes, the motor and the probe are arranged in one-to-one correspondence
- the circuit board comprises: a programmable logic controller and a human-machine interaction terminal electrically connected to the programmable logic controller, the plurality of motors and The plurality of probes are electrically connected to the programmable logic controller, and the positions of the plurality of probes correspond to the position setting of the panel detection signal input end of the TFT substrate of different sizes
- the programmable logic controller drives the probe through the motor. Lifting.
- the programmable logic controller includes: a central processing unit, a storage unit electrically connected to the central processing unit, a communication interface electrically connected to the central processing unit, and a power module electrically connected to the central processing unit, the plurality of The motor and the plurality of probes are electrically connected to the central processing unit, and the human-machine interaction terminal is electrically connected to the programmable logic controller through the communication interface.
- the memory unit stores a motor driving method corresponding to TFT substrates of various sizes.
- the human-machine interaction terminal includes: a button module electrically connected to the central processing unit and a display module electrically connected to the central processing unit, wherein the button module is used for setting and selecting a motor driving method, and the display module is used for The setting and selection of the auxiliary motor drive method.
- the selection of the motor drive method is performed by means of a menu.
- a plurality of motors and a plurality of probes are numbered in order.
- a plurality of motors and a plurality of probes corresponding to TFT substrates of different sizes are numbered, and a plurality of motors and a plurality of probes corresponding to the TFT substrate of the same size are grouped into one mode, and a menu is used.
- the invention also provides a detecting device for a TFT-LCD substrate, comprising: a main body of the machine, a circuit board mounted on the main body of the machine, a plurality of motors mounted on the main body of the machine, and a plurality of probes respectively mounted on the motor a needle, the motor and the probe-correspondingly disposed,
- the circuit board includes: a programmable logic controller and a human-machine interaction terminal electrically connected to the programmable logic controller, the plurality of motors and the plurality of probes Each of the plurality of probes is electrically connected to a position of the panel detection signal input end of the TFT substrate of different sizes, and the programmable logic controller drives the probe to be lifted and lowered by the motor;
- the programmable logic controller includes: a central processing unit, a storage unit electrically connected to the central processing unit, a communication interface electrically connected to the central processing unit, and a power module electrically connected to the central processing unit, The plurality of motors and the plurality of probes are electrically connected to the central processing unit, and the human-machine interaction terminal is electrically connected to the programmable logic controller through the communication interface;
- the storage unit stores a motor driving method corresponding to various sizes of TFT substrates.
- the human-machine interaction terminal includes: a button module electrically connected to the central processing unit and a display module electrically connected to the central processing unit.
- the button module is used for setting and selecting a motor driving method
- the display module is used for assisting setting and selecting a motor driving method
- the selection of the motor driving method is performed by means of a menu
- a plurality of motors and a plurality of probes are sequentially numbered; wherein, the motor corresponding to the position of the same panel detecting signal input end on the TFT substrate and the probe number mounted on the motor the same;
- a plurality of motors and a plurality of probes corresponding to TFT substrates of different sizes are numbered, and a plurality of motors and a plurality of probes corresponding to the same size TFT substrate are combined into one mode, and
- the patterns are numbered in the form of a menu.
- the detecting device of the TFT-LCD substrate of the present invention drives the probe corresponding to the TFT substrate to be detected to be lifted by the motor control, and the control probe is lowered after the detection, and the detection of the TFT substrate is completed, so that the present invention It can meet the detection needs of TFT substrates of various sizes, improve the production efficiency of the production line, reduce the production cost, and avoid the risk of collision when the existing detectors are replaced, and further reduce the production cost to a certain extent.
- FIG. 1 is a schematic structural view of a detecting device of a TFT-LCD according to the present invention. detailed description
- the present invention provides a detecting device for a TFT-LCD substrate, comprising: a machine main body 2, a circuit board 7 mounted on the machine main body 2, and a plurality of motors 4 mounted on the machine main body 1.
- the plurality of probes 6 respectively mounted on the motor 4, the motor 4 and the probe 6 are correspondingly disposed, and the circuit board 7 includes: a programmable logic controller 8 and an electrical connection with the programmable logic controller 8
- the human-machine interaction terminal 9, the plurality of motors 4 and the plurality of probes 6 are electrically connected to the programmable logic controller 8, and the positions of the plurality of probes 4 correspond to panel detection signal inputs of TFT substrates of different sizes.
- the programmable logic controller 8 drives the lifting and lowering of the probe 6 by the motor 4.
- the detecting device detects the TFT substrate of different sizes
- the corresponding probe 4 is driven to rise, and the panel detection signal input with the TFT substrate is input.
- the end contacts, which in turn pressurize the liquid crystal.
- the programmable logic controller 8 includes: a central processing unit 82, a storage unit 84 electrically connected to the central processing unit 82, a communication interface 86 electrically connected to the central processing unit 82, and an electrical connection with the central processing unit 82.
- the power module 88 , the plurality of motors 4 and the plurality of probes 6 are electrically connected to the central processing unit 82
- the human-machine interaction terminal 9 is electrically connected to the programmable logic controller 8 through the communication interface 86 .
- the storage unit 84 stores a motor driving method corresponding to various sizes of TFT substrates.
- the human-machine interactive terminal 9 can be used to set the motor driving method and select corresponding motor driving methods for different sizes of TFT substrates.
- the human-machine interaction terminal 9 includes: a button module 92 electrically connected to the central processing unit 82 and a display module 94 electrically connected to the central processing unit 82.
- the button module 92 is used for setting and selecting a motor driving method.
- the display module 94 is used to assist in setting and selecting a motor driving method.
- the selection of the motor driving method is performed by means of a menu. For example, the menu list and the currently selected menu are displayed in the display module 94, and the button module 92 is operated to complete the selection of the motor driving method.
- a plurality of motors 4 and a plurality of probes 6 are numbered sequentially, such as No. 1, 2, 3, 4, ..., the motor 4 corresponding to the position of the same panel detection signal input end on the TFT substrate is the same as the number of the probe 6 mounted on the motor 4, and according to A plurality of motors 4 and a plurality of probes 6 corresponding to TFT substrates of different sizes are numbered, and a plurality of motors 4 and a plurality of probes 6 corresponding to TFT substrates of the same size are grouped into one mode, and are in the form of menus.
- the modes are numbered, and when the button module 92 is used to select the motor driving method, the mode is selected.
- the probe 6 and the motor 4 are numbered, and the motor 4 corresponding to the position of the detection signal input end of the same panel on the TFT substrate is the same as the number of the probe 6 mounted on the motor;
- the present invention provides a detecting device for a TFT-LCD substrate, which is driven by a motor to drive a probe corresponding to the TFT substrate to be detected, and after the detection is completed, the control probe is lowered to complete the detection of the TFT substrate.
- the invention can meet the detection requirements of various different sizes of TFT substrates, saves the time for replacing the detectors of the existing production lines, improves the production efficiency of the production lines, reduces the production cost, and avoids collisions when the existing detectors are replaced. The risk, to a certain extent, further reduces production costs.
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- Liquid Crystal (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
一种TFT-LCD基板的探测装置,包括:机台主体(2),安装于机台主体(2)上的电路板(7)、安装于机台主体(2)上的数个马达(4)及分别安装于马达(4)上的数个探针(6),马达(4)和探针(6)一一对应设置。电路板(7)包括:可编程逻辑控制器(8)及与可编程逻辑控制器(8)电性连接的人机交互终端(9),数个马达(4)及数个探针(6)均与可编程逻辑控制器(8)电性连接,数个探针(6)的位置对应不同尺寸TFT基板的面板检测信号输入端的位置设置,可编程逻辑控制器(8)通过马达(4)驱动探针(6)的升降。该探测装置可满足不同尺寸的TFT基板的检测需要,节省了更换探测器的时间,降低生产成本,并避免了更换探测器时产生碰撞的风险。
Description
TFT-LCD 的探测装置 技术领域
本发明涉及 TFT-LCD (薄膜晶体管液晶显示器) 阵列基板探测技术, 尤其涉及一种 TFT-LCD基板探测装置的探针结构。 背景技术
液晶显示装置(LCD, Liquid Crystal Display )具有机身薄、 省电、 无 辐射等众多优点, 得到了广泛的应用。 现有市场上的液晶显示装置大部分 为背光型液晶显示装置, 其包括液晶显示面板及背光模组 (backlight module ) 。 液晶显示面板的工作原理是在两片平行的玻璃基板当中放置液 晶分子, 通过玻璃基板通电与否来控制液晶分子改变方向, 将背光模组的 光线折射出来产生画面。
通常液晶显示面板由上基板 ( CF , Color Filter ) 、 下基板(TFT , Thin Film Transistor)、 夹于上基板与下基板之间的液晶 ( LC , Liquid Crystal )及密封胶框 ( Sealant ) 组成, 其成型工艺一般包括: 前段阵列 ( Array ) 制程 (薄膜、 黄光、 蚀刻及剥膜) 、 中段成盒 (Cell ) 制程 ( TFT基板与 CF基板贴合)及后段模组组装制程(驱动 IC与印刷电路板 压合) 。 其中, 前段 Array制程主要是形成 TFT基板, 以便于控制液晶分 子的运动; 中段 Cell制程主要是在 TFT基板与 CF基板之间添加液晶; 后 段模组组装制程主要是驱动 IC压合与印刷电路板的整合, 进而驱动液晶 分子转动, 显示图像。
灌入液晶的基板, 在 HVA (高电压激活 ( high- voltage-activated ) )制 程通过 UV1 (紫外线) 照射配向, 并通过 AOI ( 自动光学检验 ( Automated Optical Inspection ) )检查机检查配向的效果。 无论是 UV1 还是 AOI, 都需要通过探测器(Probe ) 上的探针 ( pin )与 TFT基板的面 板检测信号输入端 (pad ) ——接触, 从而对液晶进行加压。 探测器上设 有对应 TFT基板的区块(block ) , 区块上设有与 TFT基板的面板检测信 号输入端相对应的探针进而完成对液晶的加压。 目前使用的探测器有两 种:
1、 升降式探测器: 探测器首先前进到 TFT基板的面板检测信号输入 端下方位置, 然后探测器上升, 直到探针扎到 TFT基板的面板检测信号输 入端上, 然后加压, 从而完成 HVA制程及 AOI检测。
2、 夹持式探测器: 探测器首先上升到 TFT基板的高度, 然后探测器 前进到 TFT基板的面板检测信号输入端位置, 接着区块上下两部分同时夹 住 TFT基板, 探针扎在 TFT基板的面板检测信号输入端上, 然后加压, 从而完成 HVA制程及 AOI检测。
但无论升降式探测器还是夹持式探测器均具有以下缺陷: 一种探测器 只能对一种尺寸的 TFT基板进行加压。 由于不同尺寸的 TFT基板的 TFT 加压点位不同, 这就要求其对应的区块上探针位置不同, 所以针对不同尺 寸的 TFT基板, 阵列检测 (Array Checker ) 系列设备就需要更换探测器, 并重新确认探针与 TFT基板的接触状况及电压输出状况, 此举既浪费产线 时间, 增加产线负荷, 又容易换错探测器, 而且在换探测器的过程中会产 生碰撞风险。 发明内容
本发明的目的在于提供一种 TFT-LCD基板的探测装置, 可满足各种 不同尺寸的 TFT基板的检测需要, 提高了产线的生产效率, 并避免了现有 更换探测器时产生碰撞的风险。
为实现上述目的, 本发明提供一种 TFT-LCD基板的探测装置, 包 括: 机台主体、 安装于机台主体上的电路板、 安装于机台主体上的数个马 达及分别安装于马达上的数个探针, 所述马达和探针一一对应设置, 所述 电路板包括: 可编程逻辑控制器及与可编程逻辑控制器电性连接的人机交 互终端, 所述数个马达及数个探针均与可编程逻辑控制器电性连接, 所述 数个探针的位置对应不同尺寸 TFT基板的面板检测信号输入端的位置设 置, 所述可编程逻辑控制器通过马达驱动探针的升降。
所述可编程逻辑控制器包括: 中央处理单元、 与中央处理单元电性连 接的存储单元、 与中央处理单元电性连接的通信接口及与中央处理单元电 性连接的电源模块, 所述数个马达及数个探针与中央处理单元电性连接, 所述人机交互终端通过所述通信接口与可编程逻辑控制器电性连接。
所述存储单元储存有对应各种尺寸 TFT基板的马达驱动方法。
所述人机交互终端包括: 与中央处理单元电性连接的按钮模块及与中 央处理单元电性连接的显示模块, 所述按鈕模块用于马达驱动方法的设置 及选择, 所述显示模块用于辅助马达驱动方法的设置及选择。
通过菜单的方式进行马达驱动方法的选择。
所述马达驱动方法中对数个马达及数个探针按顺序进行编号。
所述对应 TFT基板上同一个面板检测信号输入端位置的马达及安装于
该马达上的探针编号相同。
所述马达驱动方法中根据对应不同尺寸的 TFT基板的数个马达及数个 探针进行模式编号, 将对应同一尺寸的 TFT基板的数个马达及数个探针编 为一个模式, 并以菜单的形式对所述模式进行编号。
本发明还提供一种 TFT-LCD基板的探测装置, 包括: 机台主体、 安 装于机台主体上的电路板、 安装于机台主体上的数个马达及分别安装于马 达上的数个探针, 所述马达和探针——对应设置, 所述电路板包括: 可编 程逻辑控制器及与可编程逻辑控制器电性连接的人机交互终端, 所述数个 马达及数个探针均与可编程逻辑控制器电性连接, 所述数个探针的位置对 应不同尺寸 TFT基板的面板检测信号输入端的位置设置, 所述可编程逻辑 控制器通过马达驱动探针的升降;
其中, 所述可编程逻辑控制器包括: 中央处理单元、 与中央处理单元 电性连接的存储单元、 与中央处理单元电性连接的通信接口及与中央处理 单元电性连接的电源模块, 所述数个马达及数个探针与中央处理单元电性 连接, 所述人机交互终端通过所述通信接口与可编程逻辑控制器电性连 接;
其中, 所述存储单元储存有对应各种尺寸 TFT基板的马达驱动方法; 其中, 所述人机交互终端包括: 与中央处理单元电性连接的按钮模块 及与中央处理单元电性连接的显示模块, 所述按鈕模块用于马达驱动方法 的设置及选择, 所述显示模块用于辅助马达驱动方法的设置及选择;
其中, 通过菜单的方式进行马达驱动方法的选择;
其中, 所述马达驱动方法中对数个马达及数个探针按顺序进行编号; 其中, 所述对应 TFT基板上同一个面板检测信号输入端位置的马达及 安装于该马达上的探针编号相同;
其中, 所述马达驱动方法中根据对应不同尺寸的 TFT基板的数个马达 及数个探针进行模式编号, 将对应同一尺寸的 TFT基板的数个马达及数个 探针编为一个模式, 并以菜单的形式对所述模式进行编号。
本发明的有益效果: 本发明 TFT-LCD基板的探测装置通过马达控制 驱动与待检测的 TFT基板对应的探针升起, 检测完毕后控制探针降下来, 完成 TFT基板的检测, 如此本发明能满足各种不同尺寸的 TFT基板的检 测需要, 提高了产线的生产效率, 降低生产成本, 并避免了现有更换探测 器时产生碰撞的风险, 在一定程度上进一步降低了生产成本。
为了能更进一步了解本发明的特征以及技术内容, 请参阅以下有关本 发明的详细说明与附图, 然而附图仅提供参考与说明用, 并非用来对本发
明加以限制。 附图说明
下面结合附图, 通过对本发明的具体实施方式详细描述, 将使本发明 的技术方案及其它有益效果显而易见。
附图中,
图 1为本发明 TFT-LCD的探测装置的结构示意图。 具体实施方式
为更进一步阐述本发明所釆取的技术手段及其效果, 以下结合本发明 的优选实施例及其附图进行详细描述。
请参阅图 1, 本发明提供一种 TFT-LCD基板的探测装置, 包括: 机台 主体 2、 安装于机台主体 2上的电路板 7、 安装于机台主体 1上的数个马 达 4及分别安装于马达 4上的数个探针 6, 所述马达 4和探针 6——对应 设置, 所述电路板 7 包括: 可编程逻辑控制器 8及与可编程逻辑控制器 8 电性连接的人机交互终端 9, 所述数个马达 4及数个探针 6均与可编程逻 辑控制器 8电性连接, 所述数个探针 4的位置对应不同尺寸 TFT基板的面 板检测信号输入端的位置设置, 所述可编程逻辑控制器 8通过马达 4驱动 探针 6的升降, 当该探测装置检测不同尺寸的 TFT基板时, 驱动对应的探 针 4上升, 与 TFT基板的面板检测信号输入端接触, 进而对液晶加压。
所述可编程逻辑控制器 8 包括: 中央处理单元 82、 与中央处理单元 82 电性连接的存储单元 84、 与中央处理单元 82 电性连接的通信接口 86 及与中央处理单元 82电性连接的电源模块 88 , 所述数个马达 4及数个探 针 6与中央处理单元 82电性连接, 所述人机交互终端 9通过所述通信接 口 86与可编程逻辑控制器 8电性连接。 所述存储单元 84储存有对应各种 尺寸 TFT基板的马达驱动方法, 通过人机交互终端 9可对马达驱动方法进 行设置及针对不同尺寸的 TFT基板选择对应的马达驱动方法进行检测。
所述人机交互终端 9 包括: 与中央处理单元 82 电性连接的按扭模块 92及与中央处理单元 82电性连接的显示模块 94, 所述按钮模块 92用于 马达驱动方法的设置及选择, 所述显示模块 94 用于辅助马达驱动方法的 设置及选择。 通过菜单的方式进行马达驱动方法的选择, 如在显示模块 94 中显示出来菜单列表及当前选定的菜单, 并通过按钮模块 92 进行操作, 完成马达驱动方法的选定。
所述马达驱动方法中将数个马达 4及数个探针 6按顺序进行编号, 如
编号为 1、 2、 3、 4... ... , 所述对应 TFT基板上同一个面板检测信号输入 端位置的马达 4及与安装于该马达 4上的探针 6编号相同, 并根据对应不 同尺寸的 TFT基板的数个马达 4及数个探针 6进行模式编号, 将对应同一 尺寸的 TFT基板的数个马达 4及数个探针 6编为一个模式, 并以菜单的形 式对所述模式进行编号, 采用按钮模块 92 进行马达驱动方法选择时, 即 是对模式进行选择。
具体实施步骤如下:
1、 将探针 6及马达 4进行编号, 对应 TFT基板上同一面板检测信号 输入端位置的马达 4及与安装于该马达上的探针 6编号相同;
2、 根据不同尺寸的 TFT基板的面板检测信号输入端位置确认对应探 针 6的位置, 并将同一尺寸的 TFT基板所用到的探针 6及马达 4编为一个 模式;
3、 在菜单中设置要用的模式, 进行模式编号, 即形成马达驱动方 法;
4、 通过按鈕模块根据 TFT基板的尺寸选择相应的菜单(即选择马达 驱动方法) , 通过可编程逻辑控制器控制马达 4驱动对应的探针 6上升, 使得对应的探针 4与 TFT基板的面板检测信号输入端接触, 并导通上升的 探针 6, 对液晶加压, 完成检测。
综上所述, 本发明提供一种 TFT-LCD基板的探测装置, 通过马达控 制驱动待检测的 TFT基板对应的探针升起, 检测完毕后控制探针降下来, 完成 TFT基板的检测, 如此本发明可满足各种不同尺寸的 TFT基板的检 测需要, 节省了现有产线更换探测器的时间, 提高了产线的生产效率, 降 低生产成本, 并避免了现有更换探测器时产生碰撞的风险, 在一定程度上 进一步降低了生产成本。
以上所述, 对于本领域的普通技术人员来说, 可以根据本发明的技术 方案和技术构思作出其他各种相应的改变和变形, 而所有这些改变和变形 都应属于本发明权利要求的保护范围。
Claims
1、 一种 TFT-LCD基板的探测装置, 包括: 机台主体、 安装于机台主 体上的电路板、 安装于机台主体上的数个马达及分别安装于马达上的数个 探针, 所述马达和探针——对应设置, 所述电路板包括: 可编程逻辑控制 器及与可编程逻辑控制器电性连接的人机交互终端, 所述数个马达及数个 探针均与可编程逻辑控制器电性连接, 所述数个探针的位置对应不同尺寸 TFT基板的面板检测信号输入端的位置设置, 所述可编程逻辑控制器通过 马达驱动探针的升降。
2、 如权利要求 1所述的 TFT-LCD基板的探测装置, 其中, 所述可编 程逻辑控制器包括: 中央处理单元、 与中央处理单元电性连接的存储单 元、 与中央处理单元电性连接的通信接口及与中央处理单元电性连接的电 源模块, 所述数个马达及数个探针与中央处理单元电性连接, 所述人机交 互终端通过所述通信接口与可编程逻辑控制器电性连接。
3、 如权利要求 2所述的 TFT-LCD基板的探测装置, 其中, 所述存储 单元储存有对应各种尺寸 TFT基板的马达驱动方法。
4、 如权利要求 2所述的 TFT-LCD基板的探测装置, 其中, 所述人机 交互终端包括: 与中央处理单元电性连接的按钮模块及与中央处理单元电 性连接的显示模块, 所述按钮模块用于马达驱动方法的设置及选择, 所述 显示模块用于辅助马达驱动方法的设置及选择。
5、 如权利要求 4所述的 TFT-LCD基板的探测装置, 其中, 通过菜单 的方式进行马达驱动方法的选择。
6、 如权利要求 3所述的 TFT-LCD基板的探测装置, 其中, 所述马达 驱动方法中对数个马达及数个探针按顺序进行编号。
7、 如权利要求 6所述的 TFT-LCD基板的探测装置, 其中, 所述对应
TFT基板上同一个面板检测信号输入端位置的马达及安装于该马达上的探 针编号相同。
8、 如权利要求 7所述的 TFT-LCD基板的探测装置, 其中, 所述马达 驱动方法中根据对应不同尺寸的 TFT基板的数个马达及数个探针进行模式 编号, 将对应同一尺寸的 TFT基板的数个马达及数个探针编为一个模式, 并以菜单的形式对所述模式进行编号。
9、 一种 TFT-LCD基板的探测装置, 包括: 机台主体、 安装于机台主 体上的电路板、 安装于机台主体上的数个马达及分别安装于马达上的数个
探针, 所述马达和探针——对应设置, 所述电路板包括: 可编程逻辑控制 器及与可编程逻辑控制器电性连接的人机交互终端, 所述数个马达及数个 探针均与可编程逻辑控制器电性连接, 所述数个探针的位置对应不同尺寸
TFT基板的面板检测信号输入端的位置设置, 所述可编程逻辑控制器通过 马达驱动探针的升降;
其中, 所述可编程逻辑控制器包括: 中央处理单元、 与中央处理单元 电性连接的存储单元、 与中央处理单元电性连接的通信接口及与中央处理 单元电性连接的电源模块, 所述数个马达及数个探针与中央处理单元电性 连接, 所述人机交互终端通过所述通信接口与可编程逻辑控制器电性连 接;
其中, 所述存储单元储存有对应各种尺寸 TFT基板的马达驱动方法; 其中, 所述人机交互终端包括: 与中央处理单元电性连接的按钮模块 及与中央处理单元电性连接的显示模块, 所述按钮模块用于马达驱动方法 的设置及选择, 所述显示模块用于辅助马达驱动方法的设置及选择;
其中, 通过菜单的方式进行马达驱动方法的选择;
其中, 所述马达驱动方法中对数个马达及数个探针按顺序进行编号; 其中, 所述对应 TFT基板上同一个面板检测信号输入端位置的马达及 安装于该马达上的探针编号相同;
其中, 所述马达驱动方法中根据对应不同尺寸的 TFT基板的数个马达 及数个探针进行模式编号, 将对应同一尺寸的 TFT基板的数个马达及数个 探针编为一个模式, 并以菜单的形式对所述模式进行编号。
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