WO2014034848A1 - Procédé de diagnostic non destructeur pour matériau métallique revêtu - Google Patents
Procédé de diagnostic non destructeur pour matériau métallique revêtu Download PDFInfo
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- WO2014034848A1 WO2014034848A1 PCT/JP2013/073322 JP2013073322W WO2014034848A1 WO 2014034848 A1 WO2014034848 A1 WO 2014034848A1 JP 2013073322 W JP2013073322 W JP 2013073322W WO 2014034848 A1 WO2014034848 A1 WO 2014034848A1
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- metal material
- electromagnetic wave
- wave beam
- nondestructive
- diagnosis method
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Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
Definitions
- the present invention relates to a method for diagnosing a coated metal material, and more particularly to a non-destructive diagnostic method for a coated metal material by irradiation with an electromagnetic wave beam having a frequency in the sub-terahertz band.
- Metal wires and / or metal cables coated with polymer compositions are widely used for reinforcing purposes (reinforcing belt layers made up of multiple metal cords and metal cables, etc.) for insulated wires, diagonal materials for extradosed bridges, tires, etc.
- an oxide film such as rust is generated when water enters from cracks in the coating of the polymer composition, metal wire / cable connection, or the like.
- the oxide film generated on the metal wire / cable deteriorates the adhesion to the coating, and the oxide film may progress to the inside of the metal wire / cable, resulting in disconnection.
- an oscillating unit that radiates an electromagnetic wave having a millimeter wave or terahertz band disposed outside the tire, and a receiving unit that is disposed on the inner side of the tire and receives millimeter waves transmitted through the tire rubber layer, etc.
- a control device that judges the quality of tires based on the transmission intensity of received millimeter waves, etc.
- Patent Document 2 irradiates a reference wire and a diagnosis target wire with a far infrared ray for determining a frequency selected from a range of 1.3 to 2.3 THz and a far infrared ray for correcting with a certain frequency, respectively, and its reflection intensity.
- a technique for diagnosing the occurrence state of an oxide film of an insulated electric wire to be diagnosed by comparing the above is disclosed.
- Patent Document 1 determines the quality of a tire by detecting cavities and foreign matter in the tire based on the transmission intensity of the millimeter wave transmitted through the tire. Since the metal wire / cable cannot be transmitted, it is difficult to detect the oxide film generated on the metal wire / cable based on the transmission intensity of millimeter waves or the like. Further, since the influence of the oxide film generated on the metal wire / cable on the transmission intensity of millimeter waves or the like transmitted through the tire is minute, it is difficult to detect the generation of the oxide film based on the change in the transmission intensity. Due to these problems, there is a problem that it is difficult to accurately diagnose the generation of an oxide film even if the technique disclosed in Patent Document 1 is used.
- an electromagnetic wave having a specific frequency in the terahertz band is irradiated, and a laser light source is used as a light source for irradiating the electromagnetic wave in such a frequency band.
- a laser light source is used as a light source for irradiating the electromagnetic wave in such a frequency band.
- the generation efficiency of terahertz band electromagnetic waves from a laser light source is extremely low, and a strong excitation laser is required, so that strict curing is necessary from the viewpoint of safety, and power consumption is also increased.
- a solid-state laser since a solid-state laser is used, there is a problem that the apparatus becomes large.
- the present invention has been made to solve the above-described problems of the prior art, and an oxide film which causes a problem in a metal material coated with a polymer composition, particularly a metal wire and / or cable.
- An object of the present invention is to provide a non-destructive diagnostic method for simply and reliably diagnosing the presence or absence of occurrence.
- the present invention provides: A nondestructive diagnostic method for diagnosing generation of an oxide film in a metal material, particularly a metal wire and / or a metal cable, coated with a polymer composition having a predetermined thickness E, using a nondestructive diagnostic device,
- the non-destructive diagnostic apparatus includes an oscillating unit that oscillates an electromagnetic wave beam having a predetermined frequency in the sub-terahertz band and having a predetermined polarization direction, and an optical unit that detects an electromagnetic wave beam having a predetermined frequency in the sub-terahertz band.
- the oscillating unit has an electronic device as a light source for oscillating the electromagnetic wave beam, and the predetermined frequency of the sub-terahertz band is a frequency of 0.05 to 0.2 THz,
- the non-destructive diagnosis method is: Providing a coated metal material to be diagnosed; Disposing the metal material relative to the oscillation unit such that the predetermined polarization direction is the same as the direction in which the metal material extends; Irradiating the coated metal material with the electromagnetic wave beam from the oscillation unit; Detecting the reflection intensity of the electromagnetic wave beam reflected by the coated metal material by the detection unit; The reflection intensity of the electromagnetic wave beam from the diagnosis target metal material detected by the detection step is covered with a polymer composition having the same thickness E as the diagnosis target metal material, and the oxide film of the metal material is a problem. Comparing the reflected intensity of the electromagnetic wave beam from the coated metal material as a reference, which is less than the amount of It is characterized by that.
- the electromagnetic wave beam oscillated from the oscillating unit is irradiated to the coated metal material to be diagnosed, and the reflection intensity of the electromagnetic wave beam reflected by the coated metal material is detected by the detecting unit.
- the reflection intensity of the detected coated metal material is coated with a polymer composition having the same thickness E as the coated metal material to be diagnosed, and the oxide film of the metal material becomes a problem. Since the comparison is made with the reflection intensity of the coated metal material used as a reference, which is less than the amount, a metal material coated with a polymer composition having a predetermined thickness E to be diagnosed, particularly a metal It is possible to diagnose the state of occurrence of an oxide film in a wire and / or cable without destroying both the coating and the metal material.
- the reflection intensity of the electromagnetic wave beam is reduced in the metal material in which the oxide film is generated, the reflection intensity of the coated metal material to be diagnosed is less than the amount that causes the oxide film of the metal material to be a problem.
- the coated metal material used as a reference is coated with a polymer composition having the same thickness E as the coated metal material to be diagnosed, and the oxide film of the metal material is less than the amount in question. Therefore, it is possible to easily and reliably diagnose the presence or absence of an oxide film that causes a problem.
- the oxide film of the metal material is less than the amount causing the problem” means that the oxide film is not generated, or even if the oxide film is generated, the generated amount is so small that the polymer composition This means an amount in which there is no problem in the adhesion and no cracks are generated on the surface of the metal material.
- an electromagnetic wave beam having a predetermined frequency in the sub-terahertz band of 0.05 to 0.2 THz is used, so that an oxide film generated on a metal material coated with a polymer composition can be detected more accurately. I can do it. That is, when the predetermined frequency in the sub-terahertz band is less than 0.05 THz, the so-called skin effect that occurs in the metal material due to irradiation with electromagnetic waves is reduced, so that the state of the metal material surface becomes insensitive and the surface of the metal material is insensitive. It becomes difficult to detect the generated oxide film.
- the electromagnetic wave beam is easily attenuated by the polymer composition that coats the metal material, and the influence of light scattering due to the unevenness of the oxide film generated on the surface of the metal material. Therefore, it becomes difficult to detect the oxide film generated on the surface of the metal material.
- an electronic device is used as the light source of the electromagnetic wave beam, so that an electromagnetic wave beam with sufficient intensity can be generated with a small output.
- non-destructive diagnosis can be performed more safely, and non-destructive diagnosis with reduced power consumption can be performed because a small power source can be used.
- a solid-state electronic device such as a diode is used as the electronic device, the nondestructive diagnostic apparatus can be downsized.
- the electromagnetic wave beam has a predetermined polarization direction
- the nondestructive diagnostic method further includes the predetermined polarization direction and the direction in which the coated metal material to be diagnosed extends. Place the coated metal material to be diagnosed and / or set up a non-destructive diagnostic device to be the same.
- the predetermined polarization direction of the electromagnetic wave beam for example, the direction of linearly polarized light or the major axis direction of elliptically polarized light
- the direction in which the metal material coated with the polymer composition extends are the same.
- the oxide film generated on the surface of the metal material can be detected more accurately.
- the amount of the relative angle corresponds to the metal material.
- the reflection intensity of the electromagnetic wave beam from becomes small. Even in such a case, it is possible to detect the oxide film, but by making the polarization direction and the direction in which the metal material extends the same, a larger (more efficient) reflection intensity can be obtained and a more accurate diagnosis can be performed. It becomes possible.
- the reflection intensity detection step is preferably performed while relatively rotating the non-destructive diagnostic apparatus and the metal material about the longitudinal axis of the metal material.
- the present invention configured as described above, it becomes possible to irradiate the entire circumference of the metal material coated with the polymer composition to be measured with an electromagnetic wave beam, and the oxide film generated on the surface of the metal material can be further reduced. It can be detected reliably.
- the reflection intensity detecting step is performed while relatively moving the nondestructive diagnostic apparatus and the metal material on a plane.
- the present invention configured as described above, for example, an oxide film generated on the surface of each metal material (metal cord, metal cable, etc.) in a belt layer for reinforcing a tire provided with a plurality of cords and wires. The efficiency of diagnosis can be improved.
- the metal material is selected from the group consisting of iron, copper, aluminum, silver, platinum, gold, zinc, cadmium, tin, nickel, chromium, brass, bronze, cobalt, beryllium and alloys of these metals. To be elected.
- the metal material has a metal coating layer made of a material different from the metal material, and the metal forming the metal coating layer is platinum, gold, silver, copper, zinc, cadmium, tin, Selected from the group consisting of nickel, chromium, brass, bronze, zinc alloy steel, zinc-nickel alloy, tin-zinc alloy, tin-silver alloy and tin-cobalt alloy.
- the coating thickness E is preferably between 0.5 mm and 20 mm.
- an oxide film generated on the metal material coated with the polymer composition can be detected more reliably. That is, when the coating thickness E is smaller than 0.5 mm, the influence of light scattering is excessive due to the unevenness caused by the oxide film generated on the surface of the metal material, so that it becomes difficult to detect the oxide film generated on the surface of the metal material.
- the thickness E of the coating is larger than 20 mm, the influence of attenuation of the electromagnetic wave beam by the coating increases, and it becomes difficult to detect the oxide film generated on the metal material. Therefore, if the coating thickness E is between 0.5 mm and 20 mm, the oxide film generated on the metal material coated with the polymer composition can be detected more reliably. More preferably, the coating thickness E is between 0.5 mm and 15 mm.
- the polymer of the polymer composition is preferably a rubber material or a plastic material.
- the metal material is preferably a wire and / or cable embedded in a rubber material.
- the metal material is preferably a wire and / or cable embedded in a plastic material.
- the wire and / or cable embedded in the rubber material is preferably a tire reinforcing product or a tire semi-finished product.
- the wires and / or cables embedded in the plastic material are for electric wires.
- the wire and / or cable embedded in the plastic material is for reinforcing a bridge.
- the nondestructive diagnosis method of the present invention it is possible to easily and reliably diagnose the generation of an oxide film in a metal material coated with a polymer composition, particularly a metal wire and / or cable.
- FIG. 1 is a diagram schematically showing a configuration of an apparatus for carrying out a nondestructive diagnosis method according to a first embodiment of the present invention.
- An apparatus (non-destructive diagnostic apparatus) 1 includes an oscillating unit 2 that irradiates an electromagnetic wave beam having a predetermined frequency in a sub-terahertz band, and a metal wire that is irradiated from the oscillating unit 2 and is covered with a polymer composition 71 that is a measurement target 7. And a detection unit 3 that detects an electromagnetic wave beam reflected by an elongated metal material 72 such as a metal cable and measures the reflection intensity.
- the apparatus further collimates and condenses an electromagnetic beam having a predetermined frequency in the sub-terahertz band irradiated from the oscillating unit 2 and an electromagnetic beam having a predetermined frequency in the sub-terahertz band.
- the mirror 5a, 5b, 5c which reflects and condenses, and the rotation apparatus 6 which rotates the elongate metal material 72 coat
- the mirror 5a is a mirror assembly composed of a plurality of half mirrors
- 5b is a plane mirror
- 5c is a parabolic half mirror having a predetermined curvature.
- An electromagnetic wave beam with a predetermined frequency in the sub-terahertz band irradiated from the oscillating unit 2 passes through the lens 4 as shown in FIG. After being reflected by the mirror 5a and the mirror 5b, it passes through the half mirror 5c and is irradiated onto the measurement object 7.
- An electromagnetic wave beam having a predetermined frequency in the sub-terahertz band reflected by the metal material 72 covered with the polymer composition 71 as the measurement object 7 is collected by the half mirror 5c and then reflected by the mirrors 5b and 5a as parallel light.
- the measurement object 7 is covered with the polymer composition 71 by rotating the metal material 72 covered with the polymer composition as the measurement object 7 around the longitudinal axis by the rotating device 6 during the measurement. It is possible to diagnose the generation of an oxide film over the entire circumferential surface of the metal material 72.
- the light source of the electromagnetic wave beam emitted from the oscillation unit 2 is an electronic device, and in the nondestructive diagnostic apparatus 1, a tannet diode (TUNNETT) is used.
- TUNNETT tannet diode
- the difference between the intensity of the electromagnetic wave beam irradiated from the oscillation unit 2 and the reflection intensity detected by the detection unit 3 of the electromagnetic wave beam reflected by the metal material 72 by a determination device (not shown). ) Is detected / determined. Such a difference is detected / determined over the circumferential direction of the reflection intensity of the metal material 72 adapted to rotate as described above.
- the detection unit 3 is a pyroelectric detector (DTGS).
- the predetermined frequency of the sub-terahertz band electromagnetic wave beam emitted from the oscillation unit 2 is set to 0.05 to 0.2 THz.
- the so-called skin effect that occurs in a metal material by irradiation with an electromagnetic wave beam compared to the case of using an electromagnetic beam of another frequency band such as a terahertz band. Is reduced, and the reflection of the electromagnetic wave beam can be suppressed from becoming insensitive to the state of the surface of the metal material. Moreover, it can also suppress that an electromagnetic wave beam is attenuate
- the electromagnetic wave beam is linearly polarized by a resonator rectangular waveguide or a polarizer (not shown), and the polarization direction of the electromagnetic wave beam is elongated and covered with the polymer composition 71 that is the measurement object 7. It is set to be the same as the direction in which the metal material 72 extends (the axial direction of the metal material).
- elliptically polarized light may be created by a waveguide or the like.
- the major axis direction of the elliptically polarized light is the same as the direction in which the metal material 72 extends. Is set. In this way, the direction of linear polarization of the electromagnetic wave beam or the major axis direction of elliptically polarized light is the same as the direction in which the metal material 72 extends, so that the oxide film generated on the surface of the metal material can be detected more accurately. I can do it.
- the metal corresponding to the relative angle.
- the reflection intensity of the electromagnetic wave beam from the material 72 is reduced. Even in such a case, it is possible to detect the oxide film, but by making the polarization direction of the electromagnetic wave beam the same as the direction in which the metal material extends, the reflection is large enough to enable more efficient diagnosis of the oxide film. Gain strength and allow more accurate diagnosis.
- the polarization direction of the electromagnetic wave beam is important for obtaining a large reflection intensity for more accurate diagnosis of the oxide film.
- the induction high-frequency current is induced in the direction in which the metal material extends, and the electromagnetic wave beam is prevented from interfering between the metal materials.
- a larger reflection intensity is obtained, and a more accurate diagnosis is possible.
- a method according to an embodiment of the present invention for diagnosing the generation of an oxide film on the surface of the metal material 72 coated with the polymer composition 71 using the diagnostic apparatus 1 will be described.
- a metal material 72 covered with a polymer composition having a predetermined thickness E which is considered to be an oxide film, which is an object to be diagnosed, and an oxide film serving as a reference for comparison with the object to be diagnosed are
- a metal material 72 coated with a polymer composition having the same predetermined thickness E which is not generated or less than an amount in which generation of an oxide film is a problem.
- “less than the amount causing the generation of an oxide film” includes, of course, those in which no oxide film is generated, but even if an oxide film is generated, the generated amount is small. Therefore, it means a metal material that has no problem in adhesion to the polymer composition and has no cracks or the like on the surface of the metal material due to the influence of the generation of an oxide film.
- a reference metal material 72 coated with the polymer composition 71 is placed in the optical system 1 described above, and an electromagnetic wave beam having a frequency of 0.05 to 0.2 THz in the sub-terahertz band irradiated from the oscillation unit 2 is applied to the metal.
- the material 72 is irradiated, and the reflection intensity of the electromagnetic wave beam reflected by the metal material 72 is measured by the detection unit 3 to obtain the reflection intensity of the reference metal material coated with the polymer composition.
- the device 1 is used to irradiate the metal material 72 to be diagnosed coated with the polymer composition with an electromagnetic wave beam having a predetermined frequency in the sub-terahertz band, and the reflection intensity thereof is the same as that of the reference metal material. Measure according to the procedure.
- the electromagnetic wave beam is linearly polarized by a resonator rectangular waveguide or a polarizer (not shown), and the polarization direction of the electromagnetic wave beam extends from the elongated metal material 72 that is the measurement object 7. It is set to be the same as the direction (axial direction of the metal material).
- the elongated metal material 72 to be diagnosed is irradiated with an electromagnetic wave beam while being continuously or intermittently rotated about the longitudinal axis, and the reflection intensity of the electromagnetic wave beam reflected by the metal material 72 is measured.
- the reflection intensity of the metal material 72 to be diagnosed is compared with the reflection intensity of the metal material to be a reference, and the occurrence state of the oxide film in the metal material to be diagnosed is diagnosed.
- the reflection intensity is lower than the reflection intensity of the reference genus material, it is determined that an oxide film is generated.
- standard comparison reference
- an electromagnetic beam in the sub-terahertz band reflected from the metal material 72 at a wide range of angles on the measurement object 7 can be condensed with high efficiency by the parabolic mirror 5c. Since it is possible, it is particularly suitable for diagnosing a cylindrical measuring object.
- the type of electronic device that serves as the light source of the oscillation unit 2 is not particularly limited, as long as it can generate an electromagnetic wave beam with a predetermined frequency in the sub-terahertz band of 0.05 to 0.2 THz, for example, a tannet diode (TUNNETT), a gun Fixed electronic devices such as diodes (GUNN) and impatted diodes (IMPATT) and electronic devices such as traveling wave tubes can be used.
- these electronic devices do not have to be fundamental wave oscillation, and may obtain a predetermined frequency in the sub-terahertz band described above using a multiplier or the like.
- These electronic devices can be used with a small power source, and can generate a sub-terahertz band electromagnetic wave beam having a sufficient intensity with a power consumption of about 1 to 2 W, for example. Also, the polarization direction of the electromagnetic wave beam can be easily changed by rotating the electronic device itself that is the light source of the oscillation unit 2 or the entire oscillation unit 2 in which the electronic device is incorporated.
- the type of detector used in the detector 3 is not particularly limited, but a pyroelectric detector (eg, TGS, DTGS) or a semiconductor device detector (eg, SBD) that is a detector operating at room temperature may be used. I can do it.
- a pyroelectric detector eg, TGS, DTGS
- a semiconductor device detector eg, SBD
- FIG. 2 is a diagram schematically showing the configuration of an apparatus for carrying out the nondestructive diagnosis method according to the second embodiment of the present invention. Since the basic configuration and the effect of the second embodiment are the same as those of the first embodiment described above, the configuration and effect different from the first embodiment will be mainly described here and the first embodiment and the first embodiment will be described. Description of similar configurations and effects is omitted.
- the path of the electromagnetic wave beam is indicated by a one-dot chain line, and the spread, parallel light, convergence, condensing, etc. of the electromagnetic wave beam are indicated by broken lines.
- an electromagnetic wave beam having a predetermined frequency in the sub-terahertz band of 0.05 to 0.2 THz irradiated by the oscillating unit 2 is converted into parallel light by the lens 4 and then converged.
- the metal material 72 of the measuring object 7 covered with the composition 71 is irradiated with an angle.
- the electromagnetic wave beam having a predetermined frequency in the sub-terahertz band reflected by the metal material 72 is collected by the mirror 5, further converged by the lens 4, and projected onto the detection unit 3.
- the metal material 72 to be diagnosed is irradiated with an electromagnetic wave beam having the same polarization direction as the direction in which the elongated metal material 72 extends (the axial direction of the metal material). Then, the reflection intensity of the electromagnetic wave beam reflected by the metal material 72 to be diagnosed is measured and compared with the reflection intensity of the metal material 72 serving as a reference.
- an electromagnetic wave beam having a predetermined frequency in the sub-terahertz band of 0.05 to 0.2 THz is irradiated at an angle to the measurement object 7 arranged in a two-dimensional plane. It is possible to irradiate the electromagnetic wave beam over a wider range. That is, since the reflected light reflected from the measurement object 7 at a wide range of angles can be collected and detected by the mirror 5, the oxide film generated on the metal material 72 of the measurement object 7 can be diagnosed efficiently.
- the electromagnetic wave beam is irradiated at an angle of 45 ° with respect to the metal material 72 covered with the polymer composition 71 that is the measurement object 7.
- the electromagnetic wave beam is linearly polarized by a resonator rectangular waveguide or a polarizer (not shown), and the polarization direction of the electromagnetic wave beam is covered with the polymer composition 71 that is the measurement object 7. It is set to be the same as the direction in which 72 extends (the axial direction of the metal material).
- the loss is reduced by condensing the electromagnetic wave beam reflected by the metal material 72 of the measuring object 7 by the mirror without passing through the lens while enhancing the detection sensitivity by condensing in a wider range of angles. Since it does not occur, an optical system with higher sensitivity can be obtained.
- a rotation device for rotating the optical system (device 1) itself is added to the optical system of the present embodiment so that the irradiation angle of the electromagnetic wave beam with respect to the measurement target 7 can be changed, or the measurement target 7 can be set to a predetermined value. It is also possible to improve the efficiency of diagnosis by adding a plane moving device for moving in a plane to make the measuring object 7 movable. For example, for a relatively large size diagnostic object 7, a plane moving device for moving the optical system (device 1) itself within a predetermined plane is added, and the optical system is moved in a plane, The diagnosis object 7 may be measured. In addition, regarding such rotation and plane movement of the apparatus 1 and the measuring object 7, both the apparatus 1 and the measuring object 7 may be rotated and moved in accordance with the dimensions of the measuring object 7 as appropriate. .
- the lens 4 immediately after the oscillation unit 1 of the present embodiment for example, by replacing it with a single lens having both the functions of condensing and converging.
- FIG. 3 is a diagram schematically showing a configuration of an apparatus for performing the nondestructive diagnosis method according to the third embodiment of the present invention.
- the basic configuration and effects of the third embodiment are the same as those of the above-described first embodiment. Therefore, here, the configurations and effects different from those of the first embodiment will be mainly described. Description of similar configurations and effects is omitted.
- the path of the electromagnetic wave beam is indicated by a one-dot chain line, and the spread, parallel light, convergence, condensing, etc. of the electromagnetic wave beam are indicated by broken lines.
- the electromagnetic wave beam having a predetermined frequency in the sub-terahertz band of 0.05 to 0.2 THz irradiated from the oscillation unit 1 is converged by the lens 4 and passes through the chopper 8 and then the lens 4.
- the light is converted into parallel light, passes through the mirror 5 that is a half mirror, is further converged by the lens 4, and is irradiated onto the metal material 72 that is covered with the polymer composition 71 that is the measurement object 7.
- the electromagnetic wave beam having a predetermined frequency in the sub-terahertz band reflected by the metal material 72 is converted into parallel light by the lens 4, then reflected by the mirror 5, which is a half mirror, and the angle is changed. Is projected.
- a plane moving device 9 is provided, and this plane moving device 9 moves the measurement object 7 on a plane in a direction in which the plurality of metal materials 72 of the measurement object 7 extend and are aligned.
- the apparatus 1 is configured to change the position of the measurement object 7.
- the metal material 72 to be diagnosed is irradiated with an electromagnetic wave beam having the same polarization direction as the direction in which the elongated metal material 72 extends (the axial direction of the metal material). Then, the reflection intensity of the electromagnetic wave beam reflected by the metal material 72 to be diagnosed is measured and compared with the reflection intensity of the metal material 72 serving as a reference.
- the electromagnetic wave beam is linearly polarized by a resonator rectangular waveguide or a polarizer (not shown), and the polarization direction of the electromagnetic wave beam is covered with the polymer composition 71 that is the measurement object 7. It is set to be the same as the direction in which 72 extends (the axial direction of the metal material).
- the chopper 8 is added to the optical system, thereby providing an optical system that enables more accurate diagnosis.
- the sub-terahertz wave is always generated in a direct current and almost constant manner from a heat source of about room temperature, such as a human body or a surrounding wall at room temperature.
- the chopper 8 selectively detects an electromagnetic wave beam in a target frequency band for measurement as an alternating intermittent sub-terahertz wave, so that noisy sub-waves that exist in the outside world are detected.
- the terahertz wave is excluded, so that the sub-terahertz wave in the target frequency band can be measured with high sensitivity.
- the chopper 8 can be arbitrarily selected from a mechanically intermittent configuration, a configuration that electrically modulates a light source, and the like. Such a chopper can be added as necessary in other embodiments.
- the electromagnetic wave beam applied to the metal material is linearly polarized.
- the polarization state of the electromagnetic wave beam oscillated by the oscillation unit 2 is circularly polarized, elliptically polarized, It is not limited to specific polarization such as linearly polarized light.
- the detection unit 3 detects the electromagnetic wave beam that has been converted to the linearly polarized light.
- the reflection intensity is measured by irradiating an electromagnetic wave beam having a predetermined frequency in the sub-terahertz band using the diagnostic apparatus shown in FIG.
- the sample was subjected to a step of comparing the reflection intensity of the electromagnetic wave beam of each sample with reference to the reference sample.
- the measurement for each sample was performed by rotating the wire sample from 0 ° to 355 ° in increments of 5 ° using a rotating system to measure the reflection intensity, and comparing the reflection integral intensity, which is an integral value of the reflection intensity.
- TUNNETT 0.13THz tannet
- DTGS pyroelectric detector
- FIG. 4 shows the reflection integral intensity obtained by irradiating each sample with an electromagnetic wave beam and measuring the reflection intensity to obtain the reflection integral intensity. It is a graph which shows the relationship with the determination by visual inspection. The larger the value, the stronger the reflection intensity.
- the tread height is different from the reference sample cut from the new tire, so the reference sample tread height is aligned with the deteriorated sample.
- TUNNETT THz tannet
- DTGS pyroelectric detector
- Table 1 is a table showing an example of the difference in the reflection intensity between the reference sample and the deteriorated sample.
- the reflection intensity is measured by irradiating the tread part and the groove part with an electromagnetic wave beam on both samples. It is a table
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Abstract
La présente invention concerne un procédé de diagnostic non destructeur permettant de diagnostiquer, au moyen d'un dispositif de diagnostic non destructeur, l'apparition d'un film d'oxyde sur un matériau métallique, en particulier un fil métallique et/ou un câble métallique, revêtu d'une composition polymère, le revêtement présentant une épaisseur prédéterminée E. Ledit dispositif de diagnostic non destructeur comprend un système optique comportant une section d'oscillation entraînant l'oscillation d'un faisceau électromagnétique présentant une direction de polarisation prédéterminée et une fréquence prédéterminée dans le domaine sub-térahertz ; et une section de détection capable de détecter un faisceau électromagnétique présentant une fréquence prédéterminée dans le domaine sub-térahertz, la section d'oscillation comportant un dispositif électronique en tant que source de lumière servant à faire osciller un faisceau électromagnétique et la fréquence prédéterminée dans le domaine sub-térahertz variant de 0,05 à 0,2 THz. Ledit procédé de diagnostic non destructeur comprend les étapes consistant à utiliser un matériau métallique revêtu qui constitue l'objet du diagnostic ; à disposer ledit matériau métallique par rapport à la section d'oscillation de façon à ce que la direction de polarisation prédéterminée soit alignée sur la direction dans laquelle le matériau métallique se prolonge ; à projeter un faisceau électromagnétique en provenance de la section d'oscillation en direction du matériau métallique revêtu ; à détecter l'intensité de réflexion d'un faisceau électromagnétique réfléchi par le matériau métallique revêtu au moyen de la section de détection ; et à comparer l'intensité de réflexion du faisceau électromagnétique en provenance du matériau métallique constituant l'objet de diagnostic, détectée lors de l'étape de détection, avec l'intensité de réflexion du faisceau électromagnétique réfléchi par un matériau métallique revêtu d'une composition polymère servant de matériau de référence, le revêtement de celui-ci présentant la même épaisseur E que celle du matériau métallique constituant l'objet de diagnostic et la quantité de film d'oxyde du matériau métallique de référence se révélant inférieure à une quantité critique.
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2016041577A (ja) * | 2014-08-13 | 2016-03-31 | ステインビッヒラー オプトテヒニク ゲゼルシャフト ミット ベシュレンクテル ハフツング | タイヤの検査方法および装置 |
JP2019158820A (ja) * | 2018-03-16 | 2019-09-19 | Jfeエンジニアリング株式会社 | 下地処理検査装置および下地処理検査方法 |
WO2023026418A1 (fr) * | 2021-08-25 | 2023-03-02 | 日本電信電話株式会社 | Dispositif, système et procédé d'évaluation de détérioration |
US11874223B1 (en) | 2022-08-30 | 2024-01-16 | The Goodyear Tire & Rubber Company | Terahertz characterization of a multi-layered tire tread |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003055911A (ja) * | 2001-08-13 | 2003-02-26 | Sumitomo Electric Ind Ltd | 斜材ケーブルのサドル出口部における構造 |
JP2007084706A (ja) * | 2005-09-22 | 2007-04-05 | Bridgestone Corp | ゴム組成物 |
-
2013
- 2013-08-30 JP JP2014533108A patent/JPWO2014034848A1/ja active Pending
- 2013-08-30 WO PCT/JP2013/073322 patent/WO2014034848A1/fr active Application Filing
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003055911A (ja) * | 2001-08-13 | 2003-02-26 | Sumitomo Electric Ind Ltd | 斜材ケーブルのサドル出口部における構造 |
JP2007084706A (ja) * | 2005-09-22 | 2007-04-05 | Bridgestone Corp | ゴム組成物 |
Non-Patent Citations (4)
Title |
---|
KYOSUKE SAITO ET AL.: "Do Sankabutsu no Terahertz Spectrum Keisoku to sono Oyo", ABSTRACTS OF THE JAPAN INSTITUTE OF METALS, 15 March 2012 (2012-03-15) * |
TADAO TANABE ET AL.: "Polyethylene Hifuku sareta Dosen Hyomen Jotai no Terahertz Hihakai Shindan", ABSTRACTS OF THE JAPAN INSTITUTE OF METALS, 15 September 2009 (2009-09-15), pages 70 * |
TORU KURABAYASHI ET AL.: "Development of TUNNETT Diode and Its Application for Terahertz Imaging", MATERIA JAPAN, vol. 46, no. 2, 2007, pages 63 - 69 * |
YUTAKA OYAMA ET AL.: "Structural Defect Imaging in Timber and Concrete Building Blocks Implemented with Sub-terahertz TUNNETT Oscillator", IEICE TECHNICAL REPORT, 20 November 2007 (2007-11-20), pages 57 - 62 * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2016041577A (ja) * | 2014-08-13 | 2016-03-31 | ステインビッヒラー オプトテヒニク ゲゼルシャフト ミット ベシュレンクテル ハフツング | タイヤの検査方法および装置 |
JP2019158820A (ja) * | 2018-03-16 | 2019-09-19 | Jfeエンジニアリング株式会社 | 下地処理検査装置および下地処理検査方法 |
WO2023026418A1 (fr) * | 2021-08-25 | 2023-03-02 | 日本電信電話株式会社 | Dispositif, système et procédé d'évaluation de détérioration |
US11874223B1 (en) | 2022-08-30 | 2024-01-16 | The Goodyear Tire & Rubber Company | Terahertz characterization of a multi-layered tire tread |
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