WO2014012269A1 - 具有嵌入式光伏电池的阵列基板的制作方法 - Google Patents
具有嵌入式光伏电池的阵列基板的制作方法 Download PDFInfo
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- WO2014012269A1 WO2014012269A1 PCT/CN2012/079245 CN2012079245W WO2014012269A1 WO 2014012269 A1 WO2014012269 A1 WO 2014012269A1 CN 2012079245 W CN2012079245 W CN 2012079245W WO 2014012269 A1 WO2014012269 A1 WO 2014012269A1
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/01—Manufacture or treatment
- H10D86/021—Manufacture or treatment of multiple TFTs
- H10D86/0231—Manufacture or treatment of multiple TFTs using masks, e.g. half-tone masks
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F10/00—Individual photovoltaic cells, e.g. solar cells
- H10F10/10—Individual photovoltaic cells, e.g. solar cells having potential barriers
- H10F10/14—Photovoltaic cells having only PN homojunction potential barriers
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F19/00—Integrated devices, or assemblies of multiple devices, comprising at least one photovoltaic cell covered by group H10F10/00, e.g. photovoltaic modules
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/121—The active layers comprising only Group IV materials
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/131—Recrystallisation; Crystallization of amorphous or microcrystalline semiconductors
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/13306—Circuit arrangements or driving methods for the control of single liquid crystal cells
- G02F1/13324—Circuits comprising solar cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/546—Polycrystalline silicon PV cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the present invention relates to the field of liquid crystal display, and more particularly to a method for fabricating an array substrate having an embedded photovoltaic cell. Background technique
- Liquid crystal display has many advantages such as thin body, power saving, and no radiation, and has been widely used.
- Most of the liquid crystal display devices on the market are backlight type liquid crystal display devices, which include a liquid crystal display panel and a backlight module.
- the working principle of the liquid crystal display panel is to place liquid crystal molecules in two parallel glass substrates, control the liquid crystal molecules to change direction by energizing or not the glass substrate, and refract the light of the backlight module to produce a picture. Since the liquid crystal display panel itself does not emit light, the light source provided by the backlight module is required to display the image normally. Therefore, the backlight module becomes one of the key components of the liquid crystal display device.
- the backlight module is divided into a side-in type backlight module and a direct-type backlight module according to different incident positions of the light source.
- a light source such as a CCFL (Cold Cathode Fluorescent Lamp) or an LED (Light Emitting Diode) is disposed behind the liquid crystal display panel, and a surface light source is directly formed and supplied to the liquid crystal display panel.
- the side-lit backlight module has a backlight LED strip (Light bar) disposed on the edge of the back panel behind the liquid crystal display panel, and the light emitted by the LED strip is from the side of the light guide plate (LGP, Light Guide Plate).
- the smooth surface enters the light guide plate, is reflected and diffused, and is emitted from the light exit surface of the light guide plate, and then is supplied to the liquid crystal display panel through the optical film group to form a surface light source.
- the smooth surface enters the light guide plate, is reflected and diffused, and is emitted from the light exit surface of the light guide plate, and then is supplied to the liquid crystal display panel through the optical film group to form a surface light source.
- only about 6% of the light emitted by the backlight can pass through the liquid crystal display panel, which causes a lot of light energy to be wasted.
- the liquid crystal display panel comprises a color filter substrate (CF, Color Filter), a color film substrate (TFT, Thin Film Transistor), a liquid crystal (LC, liquid crystal) sandwiched between the color film substrate and the color film substrate, and a sealant frame ( Sealant),
- the molding process generally includes: front array (Array) process (film, yellow, etching and stripping), middle cell (cell) process (TFT substrate and CF substrate bonding) and rear module assembly Process (drive IC is pressed with printed circuit board).
- the front Array process mainly forms a TFT substrate to control the movement of liquid crystal molecules;
- the middle Cell process mainly adds liquid crystal between the TFT substrate and the CF substrate;
- the rear module assembly process is mainly to drive the IC to press and print the circuit.
- the integration of the plates drives the liquid crystal molecules to rotate, displaying images.
- Photovoltaic cells are devices that directly convert light energy into electrical energy through photoelectric or photochemical effects.
- those skilled in the art add a photovoltaic cell to the liquid crystal display panel, which absorbs excess light energy and converts the light energy into electrical energy for liquid crystal display.
- the components or accessories of the panel are powered, making full use of the light energy emitted by the backlight, saving the consumption of external power.
- the present invention provides a method for fabricating an array substrate having an embedded photovoltaic cell, comprising the following steps:
- Step 1 Providing a substrate
- Step 2 forming a buffer layer on the substrate
- Step 3 forming an amorphous silicon layer on the buffer layer
- Step 4 laser annealing, converting the amorphous silicon layer into a polysilicon layer
- Step 5 forming a predetermined pattern on the polysilicon layer by a mask process
- Step 6 forming a first photoresist pattern on the polysilicon layer, and injecting N + ions into the first photoresist pattern;
- Step 7 forming a gate insulating layer on the polysilicon layer
- Step 8 forming a second photoresist pattern on the gate insulating layer, and implanting N- ions in the second photoresist pattern;
- Step 9 Form a third photoresist pattern on the gate insulating layer, and inject P+ ions into the third photoresist pattern and activate;
- Step 10 forming a first metal layer on the gate insulating layer, and forming a gate by a mask process
- Step 11 forming a first insulating layer on the first metal layer, and hydrogenating the first insulating layer to form a hydrogenated insulating layer;
- Step 12 forming a first channel on the first insulating layer by a mask process
- Step 13 Form a second metal layer on the first insulating layer, and form a metal electrode through a mask process to form a thin film transistor and a photovoltaic cell.
- Step 14 forming a second insulating layer on the second metal layer, and forming a second channel on the second insulating layer by a mask process;
- Step 15 forming a planarization layer on the second insulating layer, and forming a third channel by a mask process;
- Step 16 Form a transparent conductive layer on the planarization layer, and form a predetermined pattern on the transparent conductive layer by a mask process;
- Step 17 Annealing the transparent conductive layer.
- the substrate is a glass substrate.
- the buffer layer, the amorphous silicon layer, and the first and second insulating layers are each formed on the substrate by chemical vapor deposition.
- the first and second metal layers are formed by a sputtering process.
- the mask process includes an exposure process, a development process, and an etching process.
- N + ions, N-ions, and P + ions are all located in the polysilicon layer.
- the transparent conductive layer is an indium tin oxide layer.
- the planarization layer is an organic layer.
- the invention also provides a method for fabricating an array substrate with an embedded photovoltaic cell, comprising the following steps:
- Step 1 Providing a substrate
- Step 2 forming a buffer layer on the substrate
- Step 3 forming an amorphous silicon layer on the buffer layer
- Step 4 laser annealing, converting the amorphous silicon layer into a polysilicon layer
- Step 5 forming a predetermined pattern on the polysilicon layer by a mask process
- Step 6 forming a first photoresist pattern on the polysilicon layer, and injecting N + ions into the first photoresist pattern;
- Step 7 forming a gate insulating layer on the polysilicon layer
- Step 8 forming a second photoresist pattern on the gate insulating layer, and implanting N- ions in the second photoresist pattern;
- Step 9 Form a third photoresist pattern on the gate insulating layer, and inject P+ ions into the third photoresist pattern and activate;
- Step 10 forming a first metal layer on the gate insulating layer, and forming a gate by a mask process
- Step 11 forming a first insulating layer on the first metal layer, and hydrogenating the first insulating layer to form a hydrogenated insulating layer;
- Step 12 forming a first channel on the first insulating layer by a mask process
- Step 13 forming a second metal layer on the first insulating layer, and forming a metal electrode through a mask process, thereby forming a thin film transistor and a photovoltaic cell;
- Step 14 forming a second insulating layer on the second metal layer, and forming a second channel on the second insulating layer by a mask process;
- Step 15 Form a planarization layer on the second insulating layer, and form a third trench through a mask process
- Step 16 Form a transparent conductive layer on the planarization layer, and form a predetermined pattern on the transparent conductive layer by a mask process;
- Step 17 annealing the transparent conductive layer
- the substrate is a glass substrate
- the buffer layer, the amorphous silicon layer, the first and second insulating layers are all formed on the substrate by chemical vapor deposition;
- the first and second metal layers are formed by a sputtering process
- the mask process includes an exposure process, a development process, and an etching process
- N + ions, N ions, and P + ions are all located in the polysilicon layer
- the transparent conductive layer is an indium tin oxide layer
- the planarization layer is an organic layer.
- the present invention has a method for fabricating an array substrate of an embedded photovoltaic cell, and forms a photovoltaic cell while forming an array substrate, wherein the photovoltaic cell is embedded in the array substrate by a single process, and then the backlight is used.
- Light powers the LCD panel components or accessories, making full use of the light energy emitted by the backlight, saving external power consumption.
- FIG. 1 is a flow chart of a method for fabricating an array substrate with an embedded photovoltaic cell according to the present invention
- FIG. 2 to FIG. 18 are schematic structural views of each fabrication stage of a method for fabricating an array substrate with an embedded photovoltaic cell
- FIG. 19 is a schematic structural view of an array substrate fabricated by the method for fabricating an array substrate with an embedded photovoltaic cell of the present invention.
- the present invention provides a method for fabricating an array substrate having an embedded photovoltaic cell, comprising the following steps:
- a substrate 20 is provided.
- the substrate 20 is made of a light transmissive material, usually a glass substrate, a quartz substrate or a substrate of other suitable materials.
- Step 2 A buffer layer 30 is formed on the substrate 20.
- the buffer layer 30, also known as a barrier layer, is formed on the substrate 20 by chemical vapor deposition (CVD), and is mainly used to prevent impurities from diffusing to the active layer.
- CVD chemical vapor deposition
- Step 3 An amorphous silicon layer 40 is formed on the buffer layer 30, and the amorphous silicon layer 40 is formed on the buffer layer 30 by chemical vapor deposition.
- Step 4 Laser annealing, converting the amorphous silicon layer 40 into the polysilicon layer 40.
- Step 5 Form a predetermined pattern on the polysilicon layer 40 by a mask process.
- the specific embodiment may be that the polysilicon layer 40 is coated with a photo-sensitive material, the layer is a so-called photoresist layer, and then the light is irradiated through a gray-scale mask or a half-gray mask.
- the photoresist layer is exposed on the photoresist layer. Due to the pattern of the active area on the gray-scale mask or the half-gray mask, part of the light will be irradiated onto the photoresist layer through the gray-scale mask or the half-gray mask, so that the light is caused.
- the exposure of the resist layer is selective, while thereby completely patterning the pattern on the grayscale mask or the half grayscale mask onto the photoresist layer.
- a portion of the photoresist is then removed using a suitable developer such that the photoresist layer visualizes the desired pattern. Then, a portion of the polysilicon layer 40 is removed by an etching process, and the etching process may be performed by wet etching, dry etching, or both. Finally, all the remaining patterned photoresist layers are removed, thereby forming a first polysilicon portion 42 and a second polysilicon portion 44 of a predetermined pattern. In this embodiment, the first polysilicon The portion 42 is provided separately from the second polysilicon portion 44.
- Step 6 Form a first photoresist pattern on the polysilicon layer 40, and implant N + ions into the first photoresist pattern.
- the specific implementation manner may be that the polysilicon layer 40 is coated with a photosensitive material, and the photoresist layer is exposed by a gray scale mask or a half gray mask, and a part of the photoreceptor is removed by using a suitable developer.
- a resist to form a first photoresist pattern implanting N + ions on the first photoresist pattern, and removing the remaining patterned photoresist layer, and further in the buffer layer 30
- First, second, and third N + ion portions 52, 54, 56 are formed thereon.
- the first and second N + ion portions 52, 54 are respectively located in the first polysilicon portion 42.
- the third N + ion portion 56 is located on the side of the second polysilicon portion 44 close to the first polysilicon portion 42.
- a gate insulating layer 60 is formed on the polysilicon layer 40.
- Step 8 Form a second photoresist pattern on the gate insulating layer 60 and implant N- ions in the second photoresist pattern.
- the specific embodiment may be that a photoresist layer is coated on the gate insulating layer 60, and the photoresist layer is exposed by a gray scale mask or a half gray mask, and a part of the light is removed by using a suitable developer. Forming a resist to form a second photoresist pattern; implanting N- ions on the second photoresist pattern, and removing the remaining patterned photoresist layer, and then at first The first and second N-ion portions 53, 55 are formed adjacent to the first polysilicon portion 42 with the second N + ion portions 52, 54.
- Step 9 Form a third photoresist pattern on the gate insulating layer 60, and inject P + ions into the third photoresist pattern and activate.
- the specific embodiment may be that a photoresist layer is coated on the gate insulating layer 60, and the photoresist layer is exposed by a gray scale mask or a half gray mask, and a part of the light is removed by using a suitable developer.
- the N + ion portion 56 forms a P + ion portion 57 away from the first polysilicon portion 42 side, and activates the implanted ions.
- Step 10 Form a first metal layer 70 on the gate insulating layer 60, and form a gate electrode 72 by a mask process.
- the specific process is similar to the above process, and will not be described here.
- Step 11 Form a first insulating layer 80 on the first metal layer 70, and hydrogenate the first insulating layer 80 to form a hydrogenated insulating layer 80.
- Step 12 forming a first channel 82 on the first insulating layer 80 by a mask process to expose the first, second, and third N + ion portions 52, 54, 56 and the P + ion portion 57.
- Step 13 Form a second metal layer 90 on the first insulating layer 80, and form a metal electrode 92 by a mask process to form a thin film transistor (TFT) and a photovoltaic cell.
- TFT thin film transistor
- the first N + ion portion 52, the second N + ion portion 54, the first N-ion portion 53, the second N - ion portion 55, the first polysilicon portion 42, the gate 72, and the two metal electrodes 92 together form a thin film transistor; the third N + ion portion 56, the P + ion portion 57 and the two metal electrodes 92 together form a photovoltaic cell.
- Step 14 Form a second insulating layer 100 on the second metal layer 90, and form a second trench 102 on the second insulating layer 100 by a mask process.
- Step 15 A planarization layer 110 is formed on the second insulating layer 100, and the third trench 112 is formed by a mask process.
- the planarization layer 110 is an organic layer.
- Step 16 Form a transparent conductive layer 120 on the planarization layer 110, and form a predetermined pattern on the transparent conductive layer 120 by a mask process.
- the transparent electrode layer 120 is an indium tin oxide (ITO) layer for deriving the current of the drain of the thin film transistor.
- Step 17. Annealing the transparent conductive layer 120 to improve electrical performance.
- the buffer layer 30, the amorphous silicon layer 40, the first and second insulating layers 80, 100 are all formed on the substrate by chemical vapor deposition; the first and second metal layers 70, 90 are passed through a sputtering process. form.
- the method for fabricating an array substrate of an embedded photovoltaic cell comprises forming a photovoltaic cell while forming an array substrate, wherein the photovoltaic cell is embedded in the array substrate by a single process, and then the light emitted by the backlight is utilized. Powering the liquid crystal display panel components or accessories, making full use of the light energy emitted by the backlight, saving the consumption of external power.
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Description
具有嵌入式光伏电池的阵列基板的制作方法 技术领域
本发明涉及液晶显示领域, 尤其涉及一种具有嵌入式光伏电池的阵列 基板的制作方法。 背景技术
液晶显示装置(LCD, Liquid Crystal Display )具有机身薄、 省电、 无 辐射等众多优点, 得到了广泛的应用。 现有市场上的液晶显示装置大部分 为背光型液晶显示装置, 其包括液晶显示面板及背光模组 (backlight module ) 。 液晶显示面板的工作原理是在两片平行的玻璃基板当中放置液 晶分子, 通过玻璃基板通电与否来控制液晶分子改变方向, 将背光模组的 光线折射出来产生画面。 由于液晶显示面板本身不发光, 需要借由背光模 组提供的光源来正常显示影像, 因此, 背光模组成为液晶显示装置的关键 组件之一。 背光模组依照光源入射位置的不同分成侧入式背光模组与直下 式背光模组两种。 直下式背光模组是将发光光源例如 CCFL(Cold Cathode Fluorescent Lamp, 阴极萤光灯管)或 LED(Light Emitting Diode, 发光二极 管)设置在液晶显示面板后方, 直接形成面光源提供给液晶显示面板。 而侧 入式背光模组是将背光源 LED灯条(Light bar )设于液晶显示面板侧后方 的背板边缘, LED灯条发出的光线从导光板(LGP, Light Guide Plate )一 侧的入光面进入导光板, 经反射和扩散后从导光板出光面射出, 再经由光 学膜片组以形成面光源提供给液晶显示面板。 然而, 背光源发出的光只有 6%左右可以透过液晶显示面板, 这就造成大量光能被浪费。
通常液晶显示面板由彩膜基板 ( CF , Color Filter ) 、 彩膜基板 ( TFT , Thin Film Transistor)、 夹于彩膜基板与彩膜基板之间的液晶 ( LC , Liquid Crystal ) 及密封胶框 (Sealant ) 组成, 其成型工艺一般包 括: 前段阵列 (Array ) 制程 (薄膜、 黄光、 蚀刻及剥膜) 、 中段成盒 ( Cell )制程(TFT基板与 CF基板贴合)及后段模组组装制程(驱动 IC 与印刷电路板压合) 。 其中, 前段 Array制程主要是形成 TFT基板, 以便 于控制液晶分子的运动; 中段 Cell制程主要是在 TFT基板与 CF基板之间 添加液晶; 后段模组组装制程主要是驱动 IC压合与印刷电路板的整合, 进而驱动液晶分子转动, 显示图像。
光伏电池是通过光电效应或者光化学效应直接把光能转化成电能的装
置, 为了提高液晶显示装置中的背光源的光的利用率, 本领域技术人员在 液晶显示面板中加入光伏电池, 该光伏电池吸收多余的光能, 并将光能转 化为电能, 为液晶显示面板的元件或配件供电, 充分利用背光源所发出的 光能, 节省了对外部电能的消耗。
然而, 现有技术中只是将制作好的光伏电池集成于液晶显示面板中, 制程较为复杂, 生产周期也较长, 进而增加了生产成本。 发明内容
本发明的目的在于提供一种具有嵌入式光伏电池的阵列基板的制作方 法, 其在形成阵列基板的同时形成光伏电池, 制程筒单, 成本低。
为实现上述目的, 本发明提供一种具有嵌入式光伏电池的阵列基板的 制作方法, 包括以下步骤:
步骤 1、 提供基板;
步骤 2、 在基板上形成緩沖层;
步骤 3、 在緩沖层上形成非晶硅层;
步骤 4、 激光退火, 将非晶硅层转变为多晶硅层;
步骤 5、 通过掩膜工艺在多晶硅层上形成预定图形;
步骤 6、 在多晶硅层上形成第一光致抗蚀剂图形, 并在该第一光致抗 蚀剂图形内注入 N+离子;
步骤 7、 在多晶硅层上形成栅极绝缘层;
步骤 8、 在栅极绝缘层上形成第二光致抗蚀剂图形, 并在第二该光致 抗蚀剂图形内注入 N—离子;
步骤 9、 在栅极绝缘层上形成第三光致抗蚀剂图形, 并在第三该光致 抗蚀剂图形内注入 P+离子, 并活化;
步骤 10、 在栅极绝缘层上形成第一金属层, 并通过掩膜工艺形成栅 极;
步骤 11、 在第一金属层上形成第一绝缘层, 并氢化该第一绝缘层, 以 形成氢化绝缘层;
步骤 12、 在第一绝缘层上通过掩膜工艺形成第一沟道;
步骤 13、 在第一绝缘层上形成第二金属层, 并通过掩膜工艺形成金属 电极, 进而形成薄膜晶体管与光伏电池。
还包括:
步骤 14、 在第二金属层上形成第二绝缘层, 并该第二绝缘层上通过掩 膜工艺形成第二沟道;
步骤 15、 在第二绝缘层上形成平坦化层, 并通过掩膜工艺形成第三沟 道;
步骤 16、 在该平坦化层上形成透明导电层, 并通过掩膜工艺在该透明 导电层上形成预定图案;
步骤 17、 对该透明导电层进行退火处理。
所述基板为玻璃基板。
所述緩沖层、 非晶硅层、 第一与第二绝缘层均通过化学气相沉积形成 于基板上。
所述第一、 第二金属层通过溅射工艺形成。
所述掩膜工艺包括曝光制程、 显影制程及蚀刻制程。
所述 N+离子、 N—离子及 P+离子均位于所述多晶硅层。
所述透明导电层为氧化铟锡层。
所述平坦化层为有机层。
本发明还提供一种具有嵌入式光伏电池的阵列基板的制作方法, 包括 以下步骤:
步骤 1、 提供基板;
步骤 2、 在基板上形成緩沖层;
步骤 3、 在緩沖层上形成非晶硅层;
步骤 4、 激光退火, 将非晶硅层转变为多晶硅层;
步骤 5、 通过掩膜工艺在多晶硅层上形成预定图形;
步骤 6、 在多晶硅层上形成第一光致抗蚀剂图形, 并在该第一光致抗 蚀剂图形内注入 N+离子;
步骤 7、 在多晶硅层上形成栅极绝缘层;
步骤 8、 在栅极绝缘层上形成第二光致抗蚀剂图形, 并在第二该光致 抗蚀剂图形内注入 N—离子;
步骤 9、 在栅极绝缘层上形成第三光致抗蚀剂图形, 并在第三该光致 抗蚀剂图形内注入 P+离子, 并活化;
步骤 10、 在栅极绝缘层上形成第一金属层, 并通过掩膜工艺形成栅 极;
步骤 11、 在第一金属层上形成第一绝缘层, 并氢化该第一绝缘层, 以 形成氢化绝缘层;
步骤 12、 在第一绝缘层上通过掩膜工艺形成第一沟道;
步骤 13、 在第一绝缘层上形成第二金属层, 并通过掩膜工艺形成金属 电极, 进而形成薄膜晶体管与光伏电池;
步骤 14、 在第二金属层上形成第二绝缘层, 并该第二绝缘层上通过掩 膜工艺形成第二沟道;
步骤 15、 在第二绝缘层上形成平坦化层, 并通过掩膜工艺形成第三沟 道;
步骤 16、 在该平坦化层上形成透明导电层, 并通过掩膜工艺在该透明 导电层上形成预定图案;
步骤 17、 对该透明导电层进行退火处理;
所述基板为玻璃基板;
所述緩沖层、 非晶硅层、 第一与第二绝缘层均通过化学气相沉积形成 于基板上;
所述第一、 第二金属层通过溅射工艺形成;
所述掩膜工艺包括曝光制程、 显影制程及蚀刻制程;
所述 N+离子、 N—离子及 P+离子均位于所述多晶硅层;
所述透明导电层为氧化铟锡层;
所述平坦化层为有机层。
本发明的有益效果: 本发明具有嵌入式光伏电池的阵列基板的制作方 法, 在形成阵列基板的同时形成光伏电池, 其以筒单的制程将光伏电池嵌 入阵列基板中, 进而利用背光源发出的光线为液晶显示面板元件或配件供 电, 充分利用背光源所发出的光能, 节省了对外部电能的消耗。
为了能更进一步了解本发明的特征以及技术内容, 请参阅以下有关本 发明的详细说明与附图, 然而附图仅提供参考与说明用, 并非用来对本发 明加以限制。 附图说明
下面结合附图, 通过对本发明的具体实施方式详细描述, 将使本发明 的技术方案及其它有益效果显而易见。
附图中,
图 1为本发明具有嵌入式光伏电池的阵列基板的制作方法的流程图; 图 2 至图 18 为本发明具有嵌入式光伏电池的阵列基板的制作方法的 各制作阶段的结构示意图;
图 19 为本发明具有嵌入式光伏电池的阵列基板的制作方法制成的阵 列基板的结构示意图。 具体实施方式
为更进一步阐述本发明所采取的技术手段及其效果, 以下结合本发明 的优选实施例及其附图进行详细描述。
请参阅图 1至图 19, 本发明提供一种具有嵌入式光伏电池的阵列基板 的制作方法, 包括以下步骤:
步骤 1、 提供基板 20, 该基板 20 由可透光材质构成, 通常为玻璃基 板、 石英基板或其他合适的材料的基板。
步骤 2、 在基板 20上形成緩沖层 30。
该緩沖层 30 又名阻挡层, 其通过化学气相沉积(Chemical vapor deposition, CVD)形成于基板 20上, 主要用于以防止杂质扩散到有源层。
步骤 3、 在緩沖层 30上形成非晶硅层 40, 该非晶硅层 40通过化学气 相沉积形成于緩沖层 30上。
步骤 4、 激光退火, 将非晶硅层 40转变为多晶硅层 40,。
步骤 5、 通过掩膜工艺在多晶硅层 40,上形成预定图形。
其具体实施方式可为在多晶硅层 40,上覆一层感光(photo-sensitive ) 材料, 该层即所谓的光致抗蚀剂层, 然后使得光线通过灰阶掩膜或半灰阶 掩膜照射于光致抗蚀剂层上以将该光致抗蚀剂层曝光。 由于灰阶掩膜或半 灰阶掩膜上具有有源区域的图案, 将使部分光线得以穿过灰阶掩膜或半灰 阶掩膜而照射于光致抗蚀剂层上, 使得光致抗蚀剂层的曝光具有选择性, 同时借此将灰阶掩膜或半灰阶掩膜上的图案完整的复印至光致抗蚀剂层 上。 然后, 利用合适的显影液剂 (developer ) 除去部分光致抗蚀剂, 使得 光致抗蚀剂层显现所需要的图案。 接着, 通过蚀刻工艺将部分多晶硅层 40,去除, 在此的蚀刻工艺可选用湿式蚀刻、 干式蚀刻或两者配合使用。 最 后, 将剩余的图案化的光致抗蚀剂层全部去除, 进而形成预定图案的第一 多晶硅部 42与第二多晶硅部 44 , 在本实施例中, 该第一多晶硅部 42与第 二多晶硅部 44分离设置。
步骤 6、 在多晶硅层 40,上形成第一光致抗蚀剂图形, 并在该第一光致 抗蚀剂图形内注入 N+离子。
其具体实施方式可为在多晶硅层 40,上覆一层感光材料, 通过灰阶掩 膜或半灰阶掩膜照对该光致抗蚀剂层曝光, 利用合适的显影液剂除去部分 光致抗蚀剂, 以形成第一光致抗蚀剂图形; 在该第一光致抗蚀剂图形上注 入 N+离子, 并去除剩余的图案化的光致抗蚀剂层, 进而在緩沖层 30 上形 成第一、 第二及第三 N+离子部 52、 54、 56, 在本实施例中, 所述第一与第 二 N+离子部 52、 54分别位于第一多晶硅部 42的两侧, 所述第三 N+离子部 56位于第二多晶硅部 44靠近第一多晶硅部 42侧。
步骤 7、 在多晶硅层 40,上形成栅极绝缘层 60。
步骤 8、 在栅极绝缘层 60上形成第二光致抗蚀剂图形, 并在第二该光 致抗蚀剂图形内注入 N—离子。
其具体实施方式可为在栅极绝缘层 60 上覆一层感光材料, 通过灰阶 掩膜或半灰阶掩膜照对该光致抗蚀剂层曝光, 利用合适的显影液剂除去部 分光致抗蚀剂, 以形成第二光致抗蚀剂图形; 在该第二光致抗蚀剂图形上 注入 N-离子, 并去除剩余的图案化的光致抗蚀剂层, 进而在第一与第二 N+ 离子部 52、 54靠近第一多晶硅部 42形成第一与第二 N—离子部 53、 55。
步骤 9、 在栅极绝缘层 60上形成第三光致抗蚀剂图形, 并在第三该光 致抗蚀剂图形内注入 P+离子, 并活化。
其具体实施方式可为在栅极绝缘层 60 上覆一层感光材料, 通过灰阶 掩膜或半灰阶掩膜照对该光致抗蚀剂层曝光, 利用合适的显影液剂除去部 分光致抗蚀剂, 以形成第三光致抗蚀剂图形; 在该第三光致抗蚀剂图形上 注入 P+离子, 并去除剩余的图案化的光致抗蚀剂层, 进而在第三 N+离子部 56远离第一多晶硅部 42侧形成 P+离子部 57, 并将植入的离子进行活化。
步骤 10、 在栅极绝缘层 60上形成第一金属层 70, 并通过掩膜工艺形 成栅极 72。 其具体工艺与上述工艺相似, 在此不做赘述。
步骤 11、 在第一金属层 70上形成第一绝缘层 80, 并氢化该第一绝缘 层 80, 以形成氢化绝缘层 80,。
步骤 12、 在第一绝缘层 80上通过掩膜工艺形成第一沟道 82, 以露出 第一、 第二与第三 N+离子部 52、 54、 56及 P+离子部 57。
步骤 13、 在第一绝缘层 80上形成第二金属层 90, 并通过掩膜工艺形 成金属电极 92, 进而形成薄膜晶体管 (TFT ) 与光伏电池。
所述第一 N+离子部 52、 第二 N+离子部 54、 第一 N-离子部 53、 第二 N— 离子部 55、 第一多晶硅部 42、 栅极 72及两个金属电极 92共同形成一薄 膜晶体管; 所述第三 N+离子部 56、 P+离子部 57及两个金属电极 92共同形 成一光伏电池。
步骤 14、 在第二金属层 90上形成第二绝缘层 100, 并该第二绝缘层 100上通过掩膜工艺形成第二沟道 102。
步骤 15、 在第二绝缘层 100上形成平坦化层 110, 并通过掩膜工艺形 成第三沟道 112。 在本实施例中, 所述平坦化层 110为有机层。
步骤 16、 在该平坦化层 110上形成透明导电层 120, 并通过掩膜工艺 在该透明导电层 120 上形成预定图案。 所述透明电极层 120 为氧化铟锡 ( ITO )层, 其用于将薄膜晶体管的漏极的电流导出。
步骤 17、 对该透明导电层 120进行退火处理, 以提高电学性能。
其中, 所述緩沖层 30、 非晶硅层 40、 第一与第二绝缘层 80、 100 均 通过化学气相沉积形成于基板上; 所述第一、 第二金属层 70、 90 通过溅 射工艺形成。
综上所述, 本发明具有嵌入式光伏电池的阵列基板的制作方法, 在形 成阵列基板的同时形成光伏电池, 其以筒单的制程将光伏电池嵌入阵列基 板中, 进而利用背光源发出的光线为液晶显示面板元件或配件供电, 充分 利用背光源所发出的光能, 节省了对外部电能的消耗。
以上所述, 对于本领域的普通技术人员来说, 可以根据本发明的技术 方案和技术构思作出其他各种相应的改变和变形, 而所有这些改变和变形 都应属于本发明权利要求的保护范围。
Claims
1、 一种具有嵌入式光伏电池的阵列基板的制作方法, 包括以下步 骤:
步骤 1、 提供基板;
步骤 2、 在基板上形成緩沖层;
步骤 3、 在緩沖层上形成非晶硅层;
步骤 4、 激光退火, 将非晶硅层转变为多晶硅层;
步骤 5、 通过掩膜工艺在多晶硅层上形成预定图形;
步骤 6、 在多晶硅层上形成第一光致抗蚀剂图形, 并在该第一光致抗 蚀剂图形内注入 N+离子;
步骤 7、 在多晶硅层上形成栅极绝缘层;
步骤 8、 在栅极绝缘层上形成第二光致抗蚀剂图形, 并在第二该光致 抗蚀剂图形内注入 N—离子;
步骤 9、 在栅极绝缘层上形成第三光致抗蚀剂图形, 并在第三该光致 抗蚀剂图形内注入 P+离子, 并活化;
步骤 10、 在栅极绝缘层上形成第一金属层, 并通过掩膜工艺形成栅 极;
步骤 11、 在第一金属层上形成第一绝缘层, 并氢化该第一绝缘层, 以 形成氢化绝缘层;
步骤 12、 在第一绝缘层上通过掩膜工艺形成第一沟道;
步骤 13、 在第一绝缘层上形成第二金属层, 并通过掩膜工艺形成金属 电极, 进而形成薄膜晶体管与光伏电池。
2、 如权利要求 1 所述的具有嵌入式光伏电池的阵列基板的制作方 法, 还包括:
步骤 14、 在第二金属层上形成第二绝缘层, 并该第二绝缘层上通过掩 膜工艺形成第二沟道;
步骤 15、 在第二绝缘层上形成平坦化层, 并通过掩膜工艺形成第三沟 道;
步骤 16、 在该平坦化层上形成透明导电层, 并通过掩膜工艺在该透明 导电层上形成预定图案;
步骤 17、 对该透明导电层进行退火处理。
3、 如权利要求 1 所述的具有嵌入式光伏电池的阵列基板的制作方 法, 其中, 所述基板为玻璃基板。
4、 如权利要求 2 所述的具有嵌入式光伏电池的阵列基板的制作方 法, 其中, 所述緩沖层、 非晶硅层、 第一与第二绝缘层均通过化学气相沉 积形成于基板上。
5、 如权利要求 2 所述的具有嵌入式光伏电池的阵列基板的制作方 法, 其中, 所述第一、 第二金属层通过溅射工艺形成。
6、 如权利要求 1 所述的具有嵌入式光伏电池的阵列基板的制作方 法, 其中, 所述掩膜工艺包括曝光制程、 显影制程及蚀刻制程。
7、 如权利要求 1 所述的具有嵌入式光伏电池的阵列基板的制作方 法, 其中, 所述 N+离子、 N-离子及 P+离子均位于所述多晶硅层。
8、 如权利要求 2 所述的具有嵌入式光伏电池的阵列基板的制作方 法, 其中, 所述透明导电层为氧化铟锡层。
9、 如权利要求 2 所述的具有嵌入式光伏电池的阵列基板的制作方 法, 其中, 所述平坦化层为有机层。
10、 一种具有嵌入式光伏电池的阵列基板的制作方法, 包括以下步 骤:
步骤 1、 提供基板;
步骤 2、 在基板上形成緩沖层;
步骤 3、 在緩沖层上形成非晶硅层;
步骤 4、 激光退火, 将非晶硅层转变为多晶硅层;
步骤 5、 通过掩膜工艺在多晶硅层上形成预定图形;
步骤 6、 在多晶硅层上形成第一光致抗蚀剂图形, 并在该第一光致抗 蚀剂图形内注入 N+离子;
步骤 7、 在多晶硅层上形成栅极绝缘层;
步骤 8、 在栅极绝缘层上形成第二光致抗蚀剂图形, 并在第二该光致 抗蚀剂图形内注入 N—离子;
步骤 9、 在栅极绝缘层上形成第三光致抗蚀剂图形, 并在第三该光致 抗蚀剂图形内注入 P+离子, 并活化;
步骤 10、 在栅极绝缘层上形成第一金属层, 并通过掩膜工艺形成栅 极;
步骤 11、 在第一金属层上形成第一绝缘层, 并氢化该第一绝缘层, 以 形成氢化绝缘层;
步骤 12、 在第一绝缘层上通过掩膜工艺形成第一沟道;
步骤 13、 在第一绝缘层上形成第二金属层, 并通过掩膜工艺形成金属 电极, 进而形成薄膜晶体管与光伏电池;
步骤 14、 在第二金属层上形成第二绝缘层, 并该第二绝缘层上通过掩 膜工艺形成第二沟道;
步骤 15、 在第二绝缘层上形成平坦化层, 并通过掩膜工艺形成第三沟 道;
步骤 16、 在该平坦化层上形成透明导电层, 并通过掩膜工艺在该透明 导电层上形成预定图案;
步骤 17、 对该透明导电层进行退火处理;
其中, 所述基板为玻璃基板;
其中, 所述緩沖层、 非晶硅层、 第一与第二绝缘层均通过化学气相沉 积形成于基板上;
其中, 所述第一、 第二金属层通过溅射工艺形成;
其中, 所述掩膜工艺包括曝光制程、 显影制程及蚀刻制程;
其中, 所述 N+离子、 N-离子及 P+离子均位于所述多晶硅层;
其中, 所述透明导电层为氧化铟锡层;
其中, 所述平坦化层为有机层。
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| CN201210253264.9A CN102738080B (zh) | 2012-07-20 | 2012-07-20 | 具有嵌入式光伏电池的阵列基板的制作方法 |
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| CN104157656A (zh) * | 2014-07-29 | 2014-11-19 | 京东方科技集团股份有限公司 | 阵列基板及其制备方法、显示装置 |
| CN105489186B (zh) | 2016-01-25 | 2018-03-30 | 京东方科技集团股份有限公司 | 一种像素电路及其驱动方法、显示装置 |
| TWI588790B (zh) | 2016-07-29 | 2017-06-21 | 元太科技工業股份有限公司 | 顯示裝置及其製作方法 |
| CN107664894A (zh) * | 2016-07-29 | 2018-02-06 | 元太科技工业股份有限公司 | 显示装置及其制作方法 |
| CN107895713B (zh) * | 2017-11-30 | 2020-05-05 | 深圳市华星光电半导体显示技术有限公司 | Tft基板制作方法 |
| CN115548478A (zh) * | 2022-10-17 | 2022-12-30 | 上海天马微电子有限公司 | 一种电池阵列及电池装置 |
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