WO2012147593A1 - Système d'inspection de piles solaires à concentration, dispositif d'inspection, procédé de commande et programme - Google Patents
Système d'inspection de piles solaires à concentration, dispositif d'inspection, procédé de commande et programme Download PDFInfo
- Publication number
- WO2012147593A1 WO2012147593A1 PCT/JP2012/060501 JP2012060501W WO2012147593A1 WO 2012147593 A1 WO2012147593 A1 WO 2012147593A1 JP 2012060501 W JP2012060501 W JP 2012060501W WO 2012147593 A1 WO2012147593 A1 WO 2012147593A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- light
- solar cell
- power generation
- light source
- generation amount
- Prior art date
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- 238000007689 inspection Methods 0.000 title claims abstract description 103
- 238000000034 method Methods 0.000 title claims description 10
- 238000010248 power generation Methods 0.000 claims description 127
- 230000006866 deterioration Effects 0.000 claims description 49
- 238000005259 measurement Methods 0.000 claims description 35
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 29
- 230000031700 light absorption Effects 0.000 claims description 17
- 238000013500 data storage Methods 0.000 claims description 15
- 230000015556 catabolic process Effects 0.000 claims description 14
- 238000006731 degradation reaction Methods 0.000 claims description 14
- 230000001678 irradiating effect Effects 0.000 claims 1
- 230000005611 electricity Effects 0.000 abstract description 11
- 238000004519 manufacturing process Methods 0.000 abstract 5
- CIWBSHSKHKDKBQ-JLAZNSOCSA-N Ascorbic acid Chemical compound OC[C@H](O)[C@H]1OC(=O)C(O)=C1O CIWBSHSKHKDKBQ-JLAZNSOCSA-N 0.000 description 24
- 230000006870 function Effects 0.000 description 18
- 238000004891 communication Methods 0.000 description 12
- 230000003287 optical effect Effects 0.000 description 6
- 239000000853 adhesive Substances 0.000 description 5
- 230000001070 adhesive effect Effects 0.000 description 5
- 230000005856 abnormality Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 238000007639 printing Methods 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 238000001514 detection method Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 230000010365 information processing Effects 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007726 management method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/054—Optical elements directly associated or integrated with the PV cell, e.g. light-reflecting means or light-concentrating means
- H01L31/055—Optical elements directly associated or integrated with the PV cell, e.g. light-reflecting means or light-concentrating means where light is absorbed and re-emitted at a different wavelength by the optical element directly associated or integrated with the PV cell, e.g. by using luminescent material, fluorescent concentrators or up-conversion arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/054—Optical elements directly associated or integrated with the PV cell, e.g. light-reflecting means or light-concentrating means
- H01L31/0547—Optical elements directly associated or integrated with the PV cell, e.g. light-reflecting means or light-concentrating means comprising light concentrating means of the reflecting type, e.g. parabolic mirrors, concentrators using total internal reflection
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/52—PV systems with concentrators
Abstract
La présente invention concerne un système d'inspection de piles solaires à concentration (100) qui comprend : une unité de rayonnement (130) qui est fixée à une plaque de concentration pour des piles solaires à concentration (C1, C2) et qui émet une lumière ; un dispositif de mesure de la production d'électricité (150) qui mesure la production d'électricité par des éléments des piles solaires à concentration ; et un dispositif d'inspection (110) qui inspecte les piles solaires à concentration. Le dispositif d'inspection (110) possède une unité d'évaluation de la production d'électricité qui évalue si une valeur mesurée pour la production d'électricité mesurée par le dispositif de mesure de la production d'électricité (1510) est supérieure ou égale à un seuil prédéfini lorsqu'une lumière est émise par l'unité de rayonnement (130).
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011100158A JP2014135304A (ja) | 2011-04-27 | 2011-04-27 | 集光型太陽電池セル検査システム、検査装置、制御方法、及びプログラム |
JP2011-100158 | 2011-04-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2012147593A1 true WO2012147593A1 (fr) | 2012-11-01 |
Family
ID=47072114
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2012/060501 WO2012147593A1 (fr) | 2011-04-27 | 2012-04-18 | Système d'inspection de piles solaires à concentration, dispositif d'inspection, procédé de commande et programme |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP2014135304A (fr) |
WO (1) | WO2012147593A1 (fr) |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07131051A (ja) * | 1993-09-07 | 1995-05-19 | Mitsubishi Motors Corp | 太陽電池パネル |
JP2000068546A (ja) * | 1998-08-19 | 2000-03-03 | Honda Motor Co Ltd | 集光追尾式発電システムの試験方法及び装置 |
JP2000147262A (ja) * | 1998-11-11 | 2000-05-26 | Nobuyuki Higuchi | 集光装置及びこれを利用した太陽光発電システム |
JP2007218540A (ja) * | 2006-02-17 | 2007-08-30 | Nagaoka Univ Of Technology | 太陽光集光器とこれを用いた太陽電池および太陽集熱器 |
JP2009099607A (ja) * | 2007-10-12 | 2009-05-07 | Toyota Motor Corp | 太陽電池モジュールの故障診断装置 |
JP2011009358A (ja) * | 2009-06-24 | 2011-01-13 | Stanley Electric Co Ltd | 太陽電池評価装置 |
JP2011009536A (ja) * | 2009-06-26 | 2011-01-13 | Toppan Printing Co Ltd | 太陽電池集光シート及びモジュール付太陽電池集光シート |
JP2011071185A (ja) * | 2009-09-24 | 2011-04-07 | Tomoo Matsushita | 太陽電池の特性評価装置及び方法 |
JP2011075296A (ja) * | 2009-09-29 | 2011-04-14 | Canon Inc | 薄型表示装置及び前面ガラスの損傷検出方法 |
-
2011
- 2011-04-27 JP JP2011100158A patent/JP2014135304A/ja not_active Withdrawn
-
2012
- 2012-04-18 WO PCT/JP2012/060501 patent/WO2012147593A1/fr active Application Filing
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07131051A (ja) * | 1993-09-07 | 1995-05-19 | Mitsubishi Motors Corp | 太陽電池パネル |
JP2000068546A (ja) * | 1998-08-19 | 2000-03-03 | Honda Motor Co Ltd | 集光追尾式発電システムの試験方法及び装置 |
JP2000147262A (ja) * | 1998-11-11 | 2000-05-26 | Nobuyuki Higuchi | 集光装置及びこれを利用した太陽光発電システム |
JP2007218540A (ja) * | 2006-02-17 | 2007-08-30 | Nagaoka Univ Of Technology | 太陽光集光器とこれを用いた太陽電池および太陽集熱器 |
JP2009099607A (ja) * | 2007-10-12 | 2009-05-07 | Toyota Motor Corp | 太陽電池モジュールの故障診断装置 |
JP2011009358A (ja) * | 2009-06-24 | 2011-01-13 | Stanley Electric Co Ltd | 太陽電池評価装置 |
JP2011009536A (ja) * | 2009-06-26 | 2011-01-13 | Toppan Printing Co Ltd | 太陽電池集光シート及びモジュール付太陽電池集光シート |
JP2011071185A (ja) * | 2009-09-24 | 2011-04-07 | Tomoo Matsushita | 太陽電池の特性評価装置及び方法 |
JP2011075296A (ja) * | 2009-09-29 | 2011-04-14 | Canon Inc | 薄型表示装置及び前面ガラスの損傷検出方法 |
Also Published As
Publication number | Publication date |
---|---|
JP2014135304A (ja) | 2014-07-24 |
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