WO2012101922A1 - Appareil d'alignement et système de mesure des caractéristiques de réflexion - Google Patents

Appareil d'alignement et système de mesure des caractéristiques de réflexion Download PDF

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Publication number
WO2012101922A1
WO2012101922A1 PCT/JP2011/078985 JP2011078985W WO2012101922A1 WO 2012101922 A1 WO2012101922 A1 WO 2012101922A1 JP 2011078985 W JP2011078985 W JP 2011078985W WO 2012101922 A1 WO2012101922 A1 WO 2012101922A1
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WIPO (PCT)
Prior art keywords
reflection characteristic
characteristic measuring
measurement
alignment
light receiving
Prior art date
Application number
PCT/JP2011/078985
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English (en)
Japanese (ja)
Inventor
義幸 長嶋
Ikushi NAKAMURA (中村 育志)
Original Assignee
コニカミノルタセンシング株式会社
中村 美智子
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Application filed by コニカミノルタセンシング株式会社, 中村 美智子 filed Critical コニカミノルタセンシング株式会社
Priority to JP2012554640A priority Critical patent/JP5534044B2/ja
Publication of WO2012101922A1 publication Critical patent/WO2012101922A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8483—Investigating reagent band

Definitions

  • the present invention relates to a technique of an alignment apparatus as a measurement object to which a reflection characteristic measurement apparatus can be attached.
  • a reflection characteristic measuring device that measures reflected light obtained by irradiating light onto a measurement object and measures the reflection characteristics of the measurement object is known.
  • the reflection characteristic measuring apparatus is stationary, and the measurement object is measured while moving the reflection characteristic measuring apparatus while performing the spot measurement for measuring the reflection characteristic of the measurement object in a minute region. It is possible to perform scan measurement that continuously measures the reflection characteristics of an object.
  • an apparatus that aligns with a measurement target is used to eliminate a positional shift of the reflection characteristic measurement apparatus with respect to a minute region to be measured.
  • the reflection characteristic measuring device described in Patent Document 1 has a shape in which the alignment device is integrally configured to be rotatable with respect to the measurement device main body, and a minute region is formed using the alignment device. Spot measurement can be performed as a measurement target.
  • a guide device that guides the movement of the reflection characteristic measurement device is used in order to prevent the displacement of the reflection characteristic measurement device with respect to the measurement object that occurs when the reflection characteristic measurement device is moved.
  • the reflection characteristic measuring device can be placed on the guide device and moved to prevent the reflection characteristic measuring device from being displaced due to the movement of the reflection characteristic measuring device.
  • the reflection characteristic measuring device described in Patent Document 1 is configured so as not to be separated from the alignment device, when the reflection characteristic measuring device is placed on a guide device for scanning measurement, the reflection characteristic measuring device An alignment device is interposed between the guide device and the guide device, and the alignment device can be an obstacle to scan measurement. Therefore, it is desirable that the alignment device used for spot measurement can be removed during scan measurement.
  • the reflection characteristic measuring device is configured to be removable from the alignment device.
  • Patent Document 3 it is attached to be rotatable around the lower rear surface of the measuring device main body. Possible measurement position indicator plates are described.
  • the reflection characteristic measuring device is positioned at a position away from the light receiving unit that receives the reflected light in the reflection characteristic measuring device, the micro area to be measured and the light receiving unit In the meantime, a positional deviation occurred during the measurement.
  • the present invention provides a technique that can be easily attached and can improve the alignment accuracy with respect to the measurement object when performing measurement using an alignment apparatus that can be attached to and detached from the reflection characteristic measurement apparatus. With the goal.
  • the invention of claim 1 is used in combination with a reflection characteristic measuring apparatus having a light receiving unit that receives reflected light obtained by irradiating light to a measurement object, and is a minute object to be measured.
  • An alignment device for aligning the position of the light receiving unit of the reflection characteristic measurement device with respect to a region, a first member that can attach and detach the reflection property measurement device, and a second member that supports the first member; A first state in which the first member and the second member overlap each other and a second state in which one end of the first member and the second member is connected and the other end is open can be taken.
  • the first member and the second member are connected to each other, and the first member has a positioning part for positioning the mounted reflection characteristic measuring device, and the positioning part includes:
  • the reflection characteristic measuring device is the first member. When worn, it is positioned on the first member so as to be located closer to the light receiving portion than the intermediate position between the connecting portion and the light receiving portion.
  • the first member in the alignment apparatus according to the first aspect of the invention, in the mounted state of the reflection characteristic measuring device, the first member is located on the other end side opposite to the one end.
  • An opening for arranging the light receiving portion of the reflection characteristic measuring device is provided, and the first member is formed along the opening with the fixing member for fixing the reflection characteristic measuring device to the first member as the positioning portion.
  • the fixing member has a protrusion protruding toward the inside of the opening
  • the reflection characteristic measuring device includes The notch part provided around the light receiving part of the reflection characteristic measuring apparatus and the projection part are fitted to each other and attached to the first member.
  • the first member in the alignment apparatus according to the first aspect of the invention, in the mounted state of the reflection characteristic measuring device, the first member is located on the other end side opposite to the one end.
  • the light receiving portion of the reflection characteristic measuring apparatus is disposed, and the first member has two positioning members provided at a predetermined interval as the positioning portion, and at least one of the two positioning members. Is provided at a position closer to the light receiving portion than an intermediate position between the light receiving portion and the connecting portion when the reflection characteristic measuring device is attached to the first member.
  • the invention according to claim 5 is the alignment apparatus according to claim 4, wherein the positioning member is any one of a protrusion and a hole provided in the first member.
  • the second member slips on a surface opposite to the surface facing the first member.
  • the anti-slip member is provided on the one end side of the second member.
  • the invention of claim 7 is a reflection characteristic measurement system, which is equipped with a reflection characteristic measurement device having a light receiving part for receiving reflected light obtained by irradiating light to a measurement object, and the reflection characteristic identification device.
  • An alignment device that can be attached to the reflection characteristic measuring device, the second member that supports the first member, the first member, and the second member. And the first member and the second member so that one end of each of the first member and the second member is connected and the other end is open.
  • a connecting portion that connects the member, the first member has a positioning portion that positions the mounted reflection characteristic measuring device, and the positioning portion includes the first reflection characteristic measuring device.
  • the invention according to claim 8 is the reflection characteristic measurement system according to claim 7, further comprising a guide device that guides the reflection characteristic measurement device so as to be movable, and the alignment device is included in the reflection characteristic measurement device. It is possible to perform measurement performed by mounting and measurement performed by mounting the guide device on the reflection characteristic measuring device.
  • the invention according to claim 9 is the reflection characteristic measurement system according to the invention according to claim 8, wherein the guide device is in a state in which the reflection characteristic measurement device without the alignment device is attached to the guide device. And a measurement aperture facing the light receiving portion.
  • the present invention it is possible to accurately position the light receiving unit of the reflection characteristic measuring device with respect to the measurement object, and thus it is possible to accurately measure the desired measurement object.
  • 1 is a top external view of a reflection characteristic measuring apparatus according to a first embodiment of the present invention.
  • 1 is a bottom external view of a reflection characteristic measuring apparatus according to a first embodiment of the present invention.
  • It is a system diagram containing a reflection characteristic measuring apparatus. It is an external view of the alignment apparatus which can attach or detach the reflection characteristic measuring apparatus which concerns on 1st Embodiment of this invention. It is a figure which shows the state which mounted
  • FIG. 1 and 2 are external views of a reflection characteristic measuring apparatus 1A according to the first embodiment of the present invention.
  • FIG. 1 is a top external view of the reflection characteristic measuring apparatus 1A
  • FIG. 2 is a bottom external view of the reflection characteristic measuring apparatus 1A.
  • the reflection characteristic measuring apparatus 1A shown in FIGS. 1 and 2 is obtained by irradiating a measurement object (also referred to as “measurement object” or simply “sample”) from the inside of the reflection characteristic measurement apparatus 1A main body. It has a function of receiving reflected light and measuring the reflection characteristics of the measurement object based on the reflected light.
  • the reflection characteristic measuring apparatus 1A includes, for example, a spectrocolorimeter, a color meter, a gloss meter, a densitometer, and the like.
  • the light irradiation to the specific object and the reception of the reflected light are performed through the light receiving opening 3 provided on the lower surface side (see FIG. 2) of the reflection characteristic measuring apparatus 1A. That is, the reflected light reflected from the measurement object is guided from the light receiving opening 3 to the inside of the reflection characteristic measuring apparatus 1A, and is used for measuring the reflection characteristic in the reflection characteristic measuring apparatus 1A. Since the reflected light is guided from the light receiving opening 3 to the inside of the reflection characteristic measuring apparatus 1A, the light receiving opening 3 is also referred to as a “light receiving part” in the reflection characteristic measuring apparatus 1A.
  • FIG. 3 is a system diagram including the reflection characteristic measuring apparatus 1A.
  • the reflection characteristic measurement apparatus 1A includes an alignment apparatus 10A, a white calibration table 30, a scanning guide apparatus (also simply referred to as “guide apparatus”) 50, and an illuminance measurement apparatus.
  • An attachment (simply referred to as “illuminance attachment”) 70 can be attached to perform measurement in various modes. Then, the measurement information acquired by the reflection characteristic measuring apparatus 1A is transmitted to the personal computer (PC) 200 via the communication line.
  • the reflection characteristic measuring apparatus 1A equipped with the accessory parts is also referred to as a reflection characteristic measuring system.
  • FIG. 4 is an external view of an alignment apparatus 10A to which the reflection characteristic measuring apparatus 1A can be attached and detached.
  • 5 and 6 are views showing a state in which the reflection characteristic measuring apparatus 1A is mounted on the alignment apparatus 10A.
  • FIG. 6 uses the reflection characteristic measurement apparatus 1A mounted on the alignment apparatus 10A.
  • FIG. 5 shows a state diagram when spot measurement is performed.
  • an alignment apparatus 10A having a shape as shown in FIG. 4 is employed.
  • the reflection characteristic measurement device 1A is attached to the alignment device 10A in an open state (also referred to as “open state”), the state shown in FIG. 5 is obtained.
  • the reflection characteristic measuring apparatus 1A When actually measuring the reflection characteristics, the reflection characteristic measuring apparatus 1A is pressed down from above by the user, and is changed to the closed state (also referred to as “closed state”) shown in FIG. Then, in the closed state, the measurement button 2 provided on the side surface of the reflection characteristic measuring apparatus 1A is pressed, and spot measurement is executed.
  • the closed state also referred to as “closed state”.
  • FIG. 7 is a diagram illustrating a state where the reflection characteristic measuring apparatus 1 ⁇ / b> A is mounted on the guide apparatus 50.
  • a guide device 50 having a linear measurement opening 51 as shown in FIG. 7 is employed as the guide device 50.
  • the reflection characteristic measurement device 1 ⁇ / b> A is mounted on the guide device 50, the light receiving portion of the reflection characteristic measurement device 1 ⁇ / b> A faces the measurement opening 51 of the guide device 50.
  • a protrusion (not shown) provided on the reflection characteristic measuring device 1A is fitted into the guide groove 52 of the guide device 50, so that the reflection characteristic is measured.
  • the measuring apparatus 1A can be moved linearly along the guide groove 52.
  • the measurement button 2 is pressed while moving the reflection characteristic measuring apparatus 1A.
  • the guide device 50 that can move the reflection characteristic measuring apparatus 1A linearly is illustrated, but the movement path (movement locus) of the reflection characteristic measuring apparatus 1A may be curvilinear.
  • the measurement opening provided in the guide device has a curved shape along the movement path.
  • the guide device 50 by performing the scan measurement using the guide device 50, it is possible to prevent the positional deviation of the reflection characteristic measurement device 1A from the measurement object that occurs when the reflection characteristic measurement device 1A is moved.
  • the reflection characteristic measurement device 1A is mounted on the guide device 50 so that the moving direction of the reflection characteristic measurement device 1A at the time of scan measurement matches the longitudinal direction of the reflection characteristic measurement device 1A. It will be.
  • the moving direction of the reflection characteristic measuring apparatus 1A at the time of scan measurement is perpendicular to the longitudinal direction of the reflection characteristic measuring apparatus 1A.
  • the inclination generated in the reflection characteristic measuring apparatus 1A when the reflection characteristic measuring apparatus 1A is moved can be reduced, the movement operation of the reflection characteristic measuring apparatus 1A during the scan measurement can be stabilized.
  • FIG. 8 is a bottom external view of the alignment apparatus 10A.
  • the alignment apparatus 10A is used to prevent the light receiving unit of the reflection characteristic measuring apparatus 1A from being displaced with respect to the minute area to be measured. Used.
  • the alignment device 10 ⁇ / b> A includes an upper member (first member) 11 that can attach and detach the reflection characteristic measuring device 1 ⁇ / b> A, and a lower member (second member) 12 that supports the upper member 11. It consists of
  • the upper member 11 and the lower member 12 are rotatably connected by a connecting portion (also referred to as a “hinge portion”) 13 on one end side of each other.
  • a connecting portion also referred to as a “hinge portion”
  • the upper member 11 and the lower member 12 are in a closed state (first state) where they overlap each other, and an open state in which one end of each of the upper member 11 and the lower member 12 is connected and the other end is opened ( It is possible to transition between the second state).
  • a biasing member such as a spring is incorporated inside the connecting portion 13 and is always open in a normal state where no force is applied from the outside.
  • the upper member 11 of the alignment apparatus 10A has a shape in which the bottom surface convex portion 7 of the reflection characteristic specifying device 1A is substantially fitted on the one end side, and on the other end side, the reflection characteristic measuring apparatus 1A has a shape. It has a circular opening 15 in which the light receiving part is arranged. Further, the upper member 11 has a fixing member 16 for fixing the reflection characteristic measuring apparatus 1A to the alignment apparatus 10A along the opening 15.
  • the substantially annular fixing member 16 provided along the opening 15 has a plurality of protrusions 17 protruding toward the inside (inward) of the opening 15.
  • the light receiving part of the reflection characteristic measuring apparatus 1A is fitted into the opening 15 when the bottom surface convex portion 7 of the reflection characteristic measuring apparatus 1A is fitted to the one end side. In this state, the reflection characteristic measuring device 1A and the alignment device 10A are fixed by the fixing member 16.
  • the reflection characteristic measuring apparatus 1A (see FIG. 2) has an attachment member 5 for attaching the reflection characteristic measuring apparatus 1A to the alignment apparatus 10A around the light receiving opening 3.
  • the attachment member 5 is provided with a plurality of notches 6, and when the reflection characteristic measuring device 1 ⁇ / b> A is mounted on the alignment device 10 ⁇ / b> A, the plurality of notches 6 are provided on the alignment device 10 ⁇ / b> A.
  • the plurality of protrusions 17 provided on the fixing member 16 are respectively fitted.
  • the fixing member 16 of the alignment apparatus 10A functions as a positioning unit that positions the reflection characteristic measurement apparatus 1A attached to the alignment apparatus 10A.
  • the reflection characteristic measurement apparatus 1A is connected to the alignment apparatus 10A. On the other hand, it is fixed in the vicinity of the opening 15 into which the light receiving portion is fitted.
  • the fixing member 16 that functions as a positioning portion is provided on the other end side of the upper member 11 that is different from the one end side where the connecting portion 13 is present.
  • the fixing member 16 is positioned on the other end side. Will be done. According to this, it becomes possible to improve the positioning accuracy with respect to the measurement object as compared with the case where positioning is performed on one end side where the connecting portion 13 exists. Further, since the periphery of the light receiving opening 3 is positioned by the concentric fixing member 16, the alignment accuracy can be further increased.
  • the positioning mode of the present embodiment is such that, in the upper member 11, when the position of the light receiving unit when the reflection characteristic measuring device 1 ⁇ / b> A is mounted on the upper member 11 is used as the reference position, the reference position is more than the position of the connecting unit 13. It can also be expressed as being positioned by the fixing member 16 at a position close to. Further, the positioning mode of the present embodiment is a position on the light receiving unit side with respect to the intermediate point between the position of the light receiving unit when the reflection characteristic measuring apparatus 1A is mounted on the upper member 11 and the position of the connecting unit 13. It can also be expressed as being positioned by the fixing member 16.
  • the lower member 12 of the alignment apparatus 10A has a measurement opening 14 and a knob portion 19 on the other end side, and is disposed on a base such as a desk.
  • the measurement object is disposed on the base, and the lower member 12 is further disposed on the measurement object.
  • the measurement object is disposed between the base and the lower member 12.
  • the measurement opening 14 defines a minute region to be measured in spot measurement, and is provided at a position facing the position of the light receiving unit of the reflection characteristic measuring apparatus 1A attached to the upper member 11 in the closed state.
  • the position of the measurement object and the alignment device 10 ⁇ / b> A is set so that the measurement object is accommodated in the measurement opening 14 when performing spot measurement. Will be adjusted.
  • the knob portion 19 is used for position adjustment between the measurement object and the alignment device 10A.
  • the knob part 19 By providing the knob part 19 on the lower member 12, the knob part 19 can be operated with the hand opposite to the hand operating the reflection characteristic measuring apparatus 1A while operating the reflection characteristic measuring apparatus 1A.
  • the position adjustment can be easily performed. Further, in the position adjustment using the knob portion 19, the position of the measurement object and the alignment device 10A can be finely adjusted.
  • the lower member 12 is provided with a non-slip member 20 on the ground contact surface with the base.
  • a pressing force acts directly below the connecting portion 13, so that the anti-slip member 20 is located at one end of the lower member 12 where the connecting portion 13 exists, that is, directly below the connecting portion 13. It is preferable to be provided.
  • all of the lower member 12 is configured using a permeable member. According to the configuration using the transmissive member, the measurement object overlapped with the lower member 12 can be visually recognized, so that the position adjustment between the measurement object and the alignment device 10A is facilitated.
  • FIG. 9 is a flowchart showing a procedure when spot measurement is performed.
  • FIG. 10 is a diagram showing the white calibration table 30.
  • the reflection characteristic measuring device 1A when performing spot measurement, in step SP11, the reflection characteristic measuring device 1A is placed on the white calibration table 30 with no accessory attached. As shown in FIG. 10, the white calibration table 30 has a white calibration plate (white plate) 31. The reflection characteristic measuring apparatus 1A is disposed on the white calibration table 30 so that the light receiving part of the reflection characteristic measuring apparatus 1A is aligned with the white plate 31.
  • step SP12 the reflection characteristic of the white calibration plate 31 is measured, and the white calibration of the reflection characteristic measuring apparatus 1A is performed.
  • the reflection characteristic measuring device 1A is mounted on the alignment device 10A.
  • step SP14 the alignment device 10A is placed on the sample, and alignment is performed to align the measurement opening 14 of the alignment device 10A with a portion to be measured in the sample.
  • step SP15 the reflection characteristic measuring device 1A is pressed from above, and the light receiving opening 3 of the reflection characteristic measuring device 1A is brought into close contact with the measurement opening 14.
  • step SP16 the measurement button 2 is pressed in a state where the light receiving opening 3 is in close contact with the measurement opening 14, and the reflection characteristic is measured.
  • step SP17 the measurement data is transmitted from the reflection characteristic measuring apparatus 1A to the PC.
  • step SP18 the measurement result is displayed on the PC.
  • the reflection characteristic measuring device 1A is mounted on the alignment device 10A (step SP13), and the reflection characteristic of the measurement object is determined. Measured (steps SP14 to SP18).
  • FIG. 11 is a flowchart illustrating a procedure for performing scan measurement.
  • step SP21 when performing scan measurement, in step SP21, the reflection characteristic measuring device 1A is mounted on the white calibration table 30 in a state in which no accessory is mounted, as in step SP11.
  • step SP22 as in step SP12, the reflection characteristic of the white calibration plate 31 is measured, and the white calibration of the reflection characteristic measuring apparatus 1A is performed.
  • the guide device 50 is positioned and arranged on the color patch to be measured.
  • step SP24 the reflection characteristic measuring device 1A is mounted on the guide device 50.
  • step SP25 the reflection characteristic is measured while moving the reflection characteristic measuring apparatus 1A.
  • step SP26 measurement data is transmitted from the reflection characteristic measuring apparatus 1A to the PC, as in step SP17.
  • step SP27 the measurement result is displayed on the PC as in step SP18.
  • the reflection characteristic measurement device 1A is mounted on the guide device 50 (step SP24), and the reflection characteristic of the measurement object is measured. (Steps SP25 to SP27).
  • the alignment device 10A irradiates the measurement object with light, and receives the reflected light obtained from the reflection characteristic measurement device 1A having the light receiving unit, and the detachable upper member 11;
  • the lower member 12 that supports the upper member 11, the closed state in which the upper member 11 and the lower member 12 overlap each other, one end of the upper member 11 and the lower member 12 are connected, and the other end is opened.
  • a connecting portion 13 that connects the upper member 11 and the lower member 12 is provided so as to be in an open state.
  • the upper member 11 includes a positioning unit that positions the mounted reflection characteristic measuring device 1A. The positioning unit receives light when the reflection characteristic measuring device is mounted on the upper member 11 in the upper member 11. Positioning is performed at a position closer to the light receiving part than an intermediate position between the part and the connecting part 13.
  • an alignment apparatus 10A it is possible to improve the alignment accuracy with respect to the measurement object as compared with the case where the positioning is performed on the one end side where the connecting portion 13 of the upper member 11 is present. It is possible to accurately measure the measurement object.
  • the alignment apparatus 10B according to the second embodiment is configured such that a reflection characteristic measurement apparatus 1B larger than the reflection characteristic measurement apparatus 1A of the first embodiment can be mounted on the upper member.
  • 12 and 13 are external views of a reflection characteristic measuring apparatus 1B according to the second embodiment of the present invention.
  • FIG. 12 is a top external view of the reflection characteristic measuring apparatus 1B
  • FIG. 13 is a bottom external view of the reflection characteristic measuring apparatus 1B.
  • FIG. 14 is an external view of an alignment apparatus 10B to which the reflection characteristic measuring apparatus 1B can be attached and detached.
  • 15 and 16 are views showing a state in which the reflection characteristic measuring apparatus 1B is mounted on the alignment apparatus 10B.
  • FIG. 16 uses the reflection characteristic measurement apparatus 1B mounted on the alignment apparatus 10B. It is a state diagram when performing spot measurement.
  • the reflection characteristic measuring apparatus 1B includes a display unit 101 that displays information such as a measurement mode on the upper surface of the housing and an operation button 102, and a power switch 103 and a measurement button on the side of the housing. 104.
  • the reflection characteristic measuring apparatus 1 ⁇ / b> B includes a light receiving opening 105 that functions as a light receiving portion, a positioning groove 106 formed in the vicinity of the light receiving opening 105, and a light receiving opening 106.
  • a positioning projection 107 formed at one end away from the positioning groove, and a substantially D-shaped engaging recess 108 formed between the positioning groove 106 and the positioning projection 107.
  • an engagement hole 109 (see FIG. 18) that is partially opened in the lateral direction is provided on a side surface of the engagement recess 108.
  • the reflection characteristic measuring apparatus 1B of the present embodiment Since the reflection characteristic measuring apparatus 1B of the present embodiment has the display unit 101, it is a large casing as compared with the reflection characteristic measuring apparatus 1A of the first embodiment. For this reason, when performing spot measurement using the reflection characteristic measuring apparatus 1B, the reflection characteristic measuring apparatus does not have the opening 15 provided in the alignment apparatus 10A of the first embodiment, that is, in the upper member 111. An alignment apparatus 10B having a shape as shown in FIG. 14 that does not have a portion surrounding the light receiving portion 1B is used.
  • FIG. 15 shows an open state when the reflection characteristic measuring device 1B is attached to the alignment device 10B. Since the alignment device 10B does not have the opening 15 and does not have a member constituting the alignment device 10B around the light receiving portion, the alignment device 10B can be used to surround the light receiving portion. Visibility can be improved.
  • the reflection characteristic measuring apparatus 1B When actually measuring the reflection characteristic, the reflection characteristic measuring apparatus 1B is pressed from the upper part by the user, and is changed to the closed state shown in FIG. In the closed state, the measurement button 104 provided on the side surface of the reflection characteristic measuring apparatus 1B is pressed, and spot measurement is performed.
  • FIG. 17 is a bottom external view of the alignment apparatus 10B.
  • FIG. 18 is a schematic diagram showing a state in which a part of the engaging member 115 enters the engaging hole 109 and the reflection characteristic measuring device 1B and the alignment device 10B are engaged.
  • the alignment device 10 ⁇ / b> B includes an upper member (first member) 111 to which the reflection characteristic measuring device 1 ⁇ / b> B can be attached and detached, and a lower member (second member) 112 that supports the upper member 111. It consists of
  • the upper member 111 and the lower member 112 are rotatably connected by a connecting portion (also referred to as a “hinge portion”) 113 on one end side of each other.
  • a connecting portion also referred to as a “hinge portion”
  • the upper member 111 and the lower member 112 are in a closed state (first state) where they overlap each other, and an open state in which one end of the upper member 111 and the lower member 112 is connected and the other end is opened ( It is possible to transition between the second state).
  • an urging member such as a spring is incorporated inside the connecting portion 113 and is always open in a normal state where no force is applied from the outside.
  • the upper member 111 of the alignment device 10B has a substantially D-shaped engagement member 115 that engages the reflection characteristic measurement device 1B near the center.
  • the engaging member 115 When the reflection characteristic measuring apparatus 1B is mounted on the alignment apparatus 10B, the engaging member 115 has a substantially D-shaped linear portion that coincides with the engaging recess 108 (see FIG. 13) of the reflection characteristic measuring apparatus 1B. Fit in the state. Then, when the lever 118 connected to the engagement member 115 is rotated clockwise in FIG. 17 with the engagement member 115 fitted in the engagement recess 108 of the reflection characteristic measuring apparatus 1B, the engagement member 115 rotates. By rotating around the shaft 110 and a part of the engagement member 115 enters the engagement hole 109 on the side surface of the engagement recess 108 (see FIG. 18), the reflection characteristic measuring device 1B and the alignment device 10B are connected. Engaged.
  • the upper member 111 has a positioning projection 116 and a positioning hole 117.
  • the positioning protrusion 116 and the positioning hole 117 function as a positioning unit that positions the reflection characteristic measuring apparatus 1B.
  • the positioning protrusion 116 is fitted into the positioning groove 106 of the reflection characteristic measuring apparatus 1B, and the positioning hole 117. Is fitted with the positioning projection 107 of the reflection characteristic measuring apparatus 1B.
  • the positioning protrusion 116 and the positioning hole 117 are provided at a predetermined distance (interval) from each other in the upper member 111. That is, the positioning hole 117 is provided in the vicinity of the position where the reflection characteristic measuring device 1B and the upper member 111 are engaged, and the positioning groove 106 into which the positioning protrusion 116 is fitted is received by the reflection characteristic measuring device 1B. It is provided in the vicinity of the part 105.
  • the reflection characteristic measuring apparatus 1B When the positioning protrusion 116 is fitted in the positioning groove 106 of the reflection characteristic measuring apparatus 1B and the positioning hole 117 is fitted in the positioning protrusion 107 of the reflection characteristic measuring apparatus 1B, the reflection characteristic measuring apparatus 1B is positioned. It will be positioned with respect to the alignment apparatus 10B.
  • the positioning protrusion 116 that functions as a positioning portion in the alignment device 10B is provided on the other end side of the upper member 111 that is different from the one end side where the coupling portion 113 exists.
  • the positioning is also performed on the other end side. According to this, it is possible to improve the alignment accuracy with respect to the measurement object as compared with the case where the positioning is performed only on one end side where the connecting portion 113 exists. That is, the positioning accuracy can be increased by positioning both the vicinity of the position where the upper member 111 and the reflection characteristic measuring apparatus 1B are fixed and the vicinity of the light receiving unit 105.
  • the positioning mode of the present embodiment is such that, in the upper member 111, when the position of the light receiving unit when the reflection characteristic measuring device 1B is mounted on the upper member 111 is used as the reference position, the reference position is more than the position of the connecting unit 113. It can also be expressed as being positioned by the positioning unit at a position close to. Further, the positioning mode of the present embodiment is a position on the light receiving unit side with respect to the intermediate point between the position of the light receiving unit when the reflection characteristic measuring apparatus 1B is mounted on the upper member 111 and the position of the connecting unit 113. It can also be expressed as being positioned by the positioning unit.
  • the positioning protrusion 116 and the positioning hole 117 are also referred to as positioning members, and any of the protrusion (convex portion) and the hole (concave portion) may be selected for the positioning member.
  • the reflection characteristic measuring apparatus 1B is provided with a groove (hole) corresponding to the projection.
  • the reflection characteristic measuring apparatus 1B A projection corresponding to the hole is provided.
  • the lower member 112 of the alignment apparatus 10B has a measurement opening 114 on the other end side, and is disposed on a base such as a desk.
  • the measurement opening 114 defines a minute region to be measured for spot measurement, and is provided at a position facing the position of the light receiving unit of the reflection characteristic measuring apparatus 1B attached to the upper member 111 in the closed state.
  • spot measurement is performed on an object that is contained in the measurement opening 114
  • the positions of the measurement object and the alignment device 10A are adjusted so that the measurement object is contained in the measurement opening 114. Will be adjusted.
  • an anti-slip member 119 is provided on the ground contact surface with the base.
  • a pressing force acts directly below the connecting portion 113, so that the anti-slip member 119 is located at one end of the lower member 112 where the connecting portion 113 exists, that is, directly below the connecting portion 113. It is preferable to be provided.
  • a lever 118 connected to the engaging member 115 is provided on the grounding surface side of the lower member 112. By rotating the lever 118, it is possible to select an engaged state in which the reflection characteristic measuring device 1B and the alignment device 10B are engaged and a released state of the engaged state.
  • the peripheral portion of the measurement opening 114 is preferably configured using a permeable member. According to the configuration using the permeable member, the measurement object overlapped with the lower member 112 can be visually recognized, so that the position adjustment between the measurement object and the alignment device 10B becomes easy.
  • the alignment device 10B includes the upper member 111 that can attach and detach the reflection characteristic measurement device 1B having the light receiving unit that receives the reflected light obtained by irradiating the measurement object, and the upper member. 111, a closed state in which the upper member 111 and the lower member 112 overlap each other, and an open state in which one end of each of the upper member 111 and the lower member 112 is connected and the other end is opened.
  • the connecting part 113 that connects the upper member 111 and the lower member 112 is provided.
  • the upper member 111 includes a positioning unit that positions the mounted reflection characteristic measuring apparatus 1B. The positioning unit receives light when the reflection characteristic measuring apparatus is mounted on the upper member 111 in the upper member 111. Positioning is performed at a position closer to the light receiving unit than an intermediate position between the coupling part and the coupling part 113.
  • an alignment apparatus 10B it is possible to improve the alignment accuracy with respect to the measurement object as compared with the case where positioning is performed on one end side of the upper member 111 where the connecting portion 113 exists. It becomes possible to accurately measure a desired measurement object.
  • FIG. 19 is a diagram showing a state in which the illuminance attachment 70 is attached to the reflection characteristic measuring apparatus 1A.
  • an illuminance attachment 70 can be attached to the reflection characteristic measuring apparatus 1A as an accessory.
  • the illuminance attachment 70 is an accessory used for measuring the characteristics of ambient light (environmental light), and includes a diffusion plate 71 and a holder 72.
  • a protrusion (not shown) similar to the protrusion 17 provided on the fixing member 16 of the alignment apparatus 10A is provided inside the holder 72, and the illuminance attachment 70 is attached to the reflection characteristic measuring apparatus 1A. At this time, the protrusion is fitted into a notch 6 provided in the attachment member 5. Then, the illuminance attachment 70 can be attached to the reflection characteristic measuring apparatus 1A by rotating the holder in a state where the protrusion and the notch 6 are fitted.
  • the attachment mechanism for the alignment device 10A in the reflection characteristic measuring apparatus 1A also functions as a bayonet-type attachment mechanism, it can be shared with the attachment mechanism of other accessory parts. As described above, by using a common attachment mechanism for each accessory part, the number of parts can be reduced as compared with the case where a plurality of attachment mechanisms are provided, and the external shape of the reflection characteristic measuring apparatus 1A is simplified. can do.
  • FIG. 20 is an operation flowchart when illuminance measurement is performed.
  • step SP31 the reflection characteristic measurement device 1A is mounted on the white calibration table 30 with no accessory attached.
  • step SP32 the reflection characteristic of the white calibration plate 31 is measured, and the white calibration of the reflection characteristic measuring apparatus 1A is performed.
  • the illuminance attachment 70 is attached to the reflection characteristic measuring apparatus 1A.
  • step SP34 the reflection characteristic measuring apparatus 1A is held upward by, for example, a measurer.
  • step SP35 the measurement button 2 is pressed and illuminance measurement is performed.
  • step SP36 measurement data is transmitted from the reflection characteristic measuring apparatus 1A to the PC.
  • step SP37 the measurement result is displayed on the PC.
  • the illuminance attachment 70 is attached to the reflection characteristic measuring apparatus 1A (step SP33), and illuminance measurement is performed (step SP34). To SP37).

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  • Molecular Biology (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
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  • General Health & Medical Sciences (AREA)
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  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

L'appareil d'alignement selon l'invention peut être complété par un appareil de mesure des caractéristiques de réflexion qui se monte et se démonte de celui-ci, ledit appareil de mesure des caractéristiques de réflexion comprenant une partie réceptrice de lumière qui reçoit la lumière réfléchie obtenue par exposition d'une cible à mesurer. L'appareil d'alignement comprend : un élément supérieur (11) sur lequel l'appareil de mesure des caractéristiques de réflexion peut se monter et se démonter ; un élément inférieur (12) qui supporte l'élément supérieur (11) ; et une partie raccordement (13) pour raccorder l'élément supérieur (11) à l'élément inférieur (12) et obtenir un état fermé où l'élément supérieur (11) et l'élément inférieur (12) se superposent l'un à l'autre, et un état ouvert où une extrémité de l'élément supérieur (11) et une extrémité de l'élément inférieur (12) sont raccordées l'une à l'autre et les deux autres extrémités sont ouvertes. L'élément supérieur (11) comprend une partie positionnement pour positionner l'appareil de mesure des caractéristiques de réflexion une fois qu'il est monté, ladite partie positionnement amenant l'appareil de mesure des caractéristiques de réflexion en une position plus proche de la partie réceptrice de lumière qu'une position intermédiaire entre la partie réceptrice de lumière et la partie raccordement (13) de l'appareil de mesure des caractéristiques de réflexion (1A) quand ledit appareil de mesure des caractéristiques de réflexion (1A) est monté sur l'élément supérieur (11).
PCT/JP2011/078985 2011-01-27 2011-12-15 Appareil d'alignement et système de mesure des caractéristiques de réflexion WO2012101922A1 (fr)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014083798A1 (fr) * 2012-11-30 2014-06-05 コニカミノルタ株式会社 Dispositif de mesure de propriétés de réflexion et procédé de fabrication de plaques de polarisation utilisées dans celui-ci
US10054482B2 (en) 2014-09-22 2018-08-21 Antonio Maccari Tool for positioning a scanning device

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JPH04213033A (ja) * 1990-12-10 1992-08-04 Toyota Motor Corp メタリック系塗色用測色装置
JPH10512042A (ja) * 1994-10-12 1998-11-17 ルシド・テクノロジーズ・インコーポレイテッド 分光光度計、及び前記分光光度計に用いるのに特に好適な電気−光学モジュール
JP2001311665A (ja) * 2000-04-28 2001-11-09 Toppan Forms Co Ltd 測定器用治具
US20050243318A1 (en) * 2004-04-30 2005-11-03 Baker Douglas V Color measurement system
JP2007071548A (ja) * 2005-09-02 2007-03-22 Nippon Telegr & Teleph Corp <Ntt> 表面プラズモン共鳴スペクトル測定用のプリズム・液溜め一体型チップ、その製造方法、およびそれを用いた表面プラズモン共鳴測定装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04213033A (ja) * 1990-12-10 1992-08-04 Toyota Motor Corp メタリック系塗色用測色装置
JPH10512042A (ja) * 1994-10-12 1998-11-17 ルシド・テクノロジーズ・インコーポレイテッド 分光光度計、及び前記分光光度計に用いるのに特に好適な電気−光学モジュール
JP2001311665A (ja) * 2000-04-28 2001-11-09 Toppan Forms Co Ltd 測定器用治具
US20050243318A1 (en) * 2004-04-30 2005-11-03 Baker Douglas V Color measurement system
JP2007071548A (ja) * 2005-09-02 2007-03-22 Nippon Telegr & Teleph Corp <Ntt> 表面プラズモン共鳴スペクトル測定用のプリズム・液溜め一体型チップ、その製造方法、およびそれを用いた表面プラズモン共鳴測定装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014083798A1 (fr) * 2012-11-30 2014-06-05 コニカミノルタ株式会社 Dispositif de mesure de propriétés de réflexion et procédé de fabrication de plaques de polarisation utilisées dans celui-ci
JP6011638B2 (ja) * 2012-11-30 2016-10-19 コニカミノルタ株式会社 反射特性測定装置およびこれに用いられる偏光板の製造方法
US10012583B2 (en) 2012-11-30 2018-07-03 Konica Minolta, Inc. Reflection properties measuring device and manufacturing method for polarizing plates used in same
US10054482B2 (en) 2014-09-22 2018-08-21 Antonio Maccari Tool for positioning a scanning device

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JPWO2012101922A1 (ja) 2014-06-30

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