WO2011152445A1 - Dispositif de contrôle à électroluminescence destiné à un panneau solaire et procédé de contrôle à électroluminescence - Google Patents

Dispositif de contrôle à électroluminescence destiné à un panneau solaire et procédé de contrôle à électroluminescence Download PDF

Info

Publication number
WO2011152445A1
WO2011152445A1 PCT/JP2011/062572 JP2011062572W WO2011152445A1 WO 2011152445 A1 WO2011152445 A1 WO 2011152445A1 JP 2011062572 W JP2011062572 W JP 2011062572W WO 2011152445 A1 WO2011152445 A1 WO 2011152445A1
Authority
WO
WIPO (PCT)
Prior art keywords
solar cell
cell panel
image
panel
inspection
Prior art date
Application number
PCT/JP2011/062572
Other languages
English (en)
Japanese (ja)
Inventor
杉原薫
Original Assignee
株式会社アイテス
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社アイテス filed Critical 株式会社アイテス
Priority to JP2012518422A priority Critical patent/JPWO2011152445A1/ja
Publication of WO2011152445A1 publication Critical patent/WO2011152445A1/fr

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Definitions

  • the present invention relates to an EL inspection apparatus and an EL inspection method for a solar battery panel including a plurality of photovoltaic power generation cells.
  • the inspection apparatus of Patent Document 1 includes a transparent plate on which a solar cell panel to be inspected is placed, and a reflection plate that is inclined with respect to the transparent plate. Taking a picture with a camera. Thus, the photographing distance is extended by photographing the solar cell panel through the reflector.
  • Patent Document 2 performs an enhancement process on a region where a defect exists in an EL image of a captured solar battery cell when determining the quality of a solar battery panel. As a result, the operator can easily recognize the portion of the EL image determined to have a problem.
  • an EL inspection apparatus and an EL inspection method that are easy to handle and can efficiently and reliably inspect for the presence or absence of defects when performing an EL inspection of a solar cell panel are still being developed. Absent.
  • the present invention has been made in view of the above problems, and in particular, an object of the present invention is to provide a solar cell panel EL inspection apparatus and an EL inspection method applicable to a large-sized solar cell panel. .
  • the characteristic configuration of the EL inspection apparatus for a solar cell panel is as follows. It is an EL inspection device for a solar battery panel including a plurality of photovoltaic power generation cells, A DC power source for applying EL to a solar cell panel to be inspected by applying a forward bias current; A photographing unit for photographing the solar cell panel in an EL emission state; A correction unit for correcting the captured image of the solar cell panel; A comparison unit that compares the corrected image with a reference template; A determination unit that determines the quality of the solar cell panel based on the comparison result; It is in having.
  • the solar cell panel EL inspection apparatus of the present configuration includes a correction unit that corrects an image (that is, an EL image) of the solar cell panel in the EL emission state, which is captured by the imaging unit.
  • the correction unit By correcting the distortion of the part and the dark part, it is possible to obtain an image equivalent to that obtained by photographing with a normal lens. As a result, the comparison by the subsequent comparison unit and the determination by the determination unit can be performed well. Moreover, since the comparison part which compares the image after correction
  • the similarity between the solar cell panel to be inspected and the good solar cell panel (that is, how well they match) can be confirmed.
  • the EL inspection of the solar cell panel can be performed quickly and reliably.
  • the correction unit preferably performs distortion correction and luminance correction of the image at the same time.
  • the correction unit simultaneously performs distortion correction and luminance correction of the captured image, so that the image processing time is shortened and the image processing accuracy is improved. As a result, the EL inspection of the solar cell panel can be performed more quickly and reliably.
  • the comparison unit preferably creates a specific template corresponding to the photovoltaic power generation cell to be inspected as the template, and masks the photovoltaic power generation cell having a similarity equal to or higher than a predetermined value compared to the specific template.
  • a specific template corresponding to the solar power generation cell to be inspected is created, and a predetermined template is compared with the specific template among the solar power generation cells constituting the solar battery panel.
  • the masked photovoltaic power generation cell is a reliable cell. Therefore, according to this structure, the test
  • the comparison unit preferably creates a specific template corresponding to the photovoltaic cell to be inspected as the template, and emphasizes a photovoltaic cell having a similarity less than a predetermined value compared to the specific template.
  • a specific template corresponding to the solar power generation cell to be inspected is created, and a predetermined template is compared with the specific template among the solar power generation cells constituting the solar battery panel.
  • the emphasized photovoltaic power generation cell is a reliable cell that is a defective product. Therefore, also by this structure, the test
  • the comparison unit changes the specific template to another specific template.
  • the comparison unit can change the specific template to another specific template, so that one EL inspection device can cope with various solar cell panel inspections. It becomes possible. Further, when it is determined that the inspection accuracy is not so good during the inspection, the specific template currently in use can be changed to another more preferable specific template. In this case, the inspection accuracy can be improved even during the inspection.
  • the determination unit preferably color-codes the captured image according to a determination result.
  • the determination unit can display the inspection result in an easy-to-understand manner for the operator by color-coding the captured image according to the determination result.
  • the characteristic configuration of the method for inspecting a solar cell panel according to the present invention for solving the above problems is as follows. It is an EL inspection method for a solar battery panel including a plurality of photovoltaic power generation cells, A light emitting step of applying a forward bias current to the solar cell panel to be inspected to emit EL; A photographing step of photographing the solar cell panel in an EL emission state; A correction step for correcting the captured image of the solar cell panel; A comparison step for comparing the corrected image with a reference template; A determination step of determining pass / fail of the solar cell panel based on the comparison result; It is to include.
  • the same operational effects as the above-described EL inspection device for the solar cell panel of the present configuration are achieved. That is, it is possible to correct the image (that is, the EL image) of the EL panel in the EL emission state that is captured in the capturing step by the correcting step. For this reason, when shortening the shooting distance between the solar panel and the camera, even if the entire solar panel is shot using a short-focus wide-angle lens without using a reflector, the distortion in the periphery of the shot image By correcting the dark area, it is possible to obtain an image equivalent to that obtained by shooting with a normal lens.
  • the comparison in the subsequent comparison step and the determination in the determination step can be favorably performed.
  • a comparison step for comparing the corrected image with a reference template and a determination step for determining the quality of the solar cell panel based on the comparison result the presence or absence of defects in the solar cell panel is determined. Inspection can be performed efficiently and reliably. For example, by adopting a sample corresponding to a part of a good solar cell panel as a template, the similarity between the solar cell panel to be inspected and the good solar cell panel (that is, how well they match) Can be confirmed. As a result, the EL inspection of the solar cell panel can be performed quickly and reliably.
  • the correction step it is preferable to simultaneously perform distortion correction and luminance correction of the image.
  • the same operational effects as the above-described EL inspection device for the solar cell panel of the present configuration are achieved. That is, in the correction step, distortion correction and luminance correction of the captured image are executed simultaneously, so that the image processing time is shortened and the image processing accuracy is improved. As a result, the EL inspection of the solar cell panel can be performed more quickly and reliably.
  • the comparison step it is preferable that a specific template corresponding to the photovoltaic cell to be inspected is created as the template, and the photovoltaic cell having a similarity equal to or higher than a predetermined value compared to the specific template is masked. .
  • the same operational effects as the above-described EL inspection device for the solar cell panel of the present configuration are achieved. That is, a specific template corresponding to the photovoltaic cell to be inspected is created, and among the photovoltaic cells constituting the photovoltaic panel, a photovoltaic cell having a similarity equal to or higher than a predetermined value compared to the specific template Mask it.
  • the masked photovoltaic power generation cell is a reliable cell. Therefore, according to this structure, the test
  • the comparison step it is preferable that a specific template corresponding to the photovoltaic power generation cell to be inspected is created as the template, and the photovoltaic power generation cell having a similarity less than a predetermined value compared with the specific template is emphasized. .
  • the same operational effects as the above-described EL inspection device for the solar cell panel of the present configuration are achieved. That is, a specific template corresponding to the photovoltaic cell to be inspected is created, and among the photovoltaic cells constituting the photovoltaic panel, a photovoltaic cell having a similarity less than a predetermined value compared to the specific template Emphasize.
  • the emphasized photovoltaic power generation cell is a reliable cell that is a defective product. Therefore, also by this structure, the test
  • the specific template is preferably changed to another specific template.
  • the same operational effects as the above-described EL inspection device for the solar cell panel of the present configuration are achieved. That is, in the comparison step, by changing the specific template to another specific template, it is possible to cope with EL inspections of a wide variety of solar cell panels. Further, when it is determined that the inspection accuracy is not so good during the inspection, the specific template currently in use can be changed to another more preferable specific template. In this case, the inspection accuracy can be improved even during the inspection.
  • the photographed image is color-coded according to the determination result.
  • the same operational effects as the above-described EL inspection device for the solar cell panel of the present configuration are achieved. That is, in the determination step, the inspection result can be displayed in an easy-to-understand manner for the operator by color-coding the captured image according to the determination result.
  • FIG. 1 is a block diagram showing a schematic configuration of an EL inspection apparatus for a solar cell panel according to the present invention.
  • FIG. 2 is an explanatory diagram showing a correction result executed by the correction unit and a comparison result executed by the comparison unit according to the first embodiment of the present invention.
  • FIG. 3 is an explanatory diagram showing a correction result executed by the correction unit and a comparison result executed by the comparison unit according to the second embodiment of the present invention.
  • FIG. 4 is a flowchart illustrating a procedure of a solar cell panel EL inspection method according to the third embodiment of the present invention.
  • FIG. 5 is a flowchart showing a procedure of an EL inspection method for a solar cell panel according to the fourth embodiment of the present invention.
  • FIG. 1 is a block diagram showing a schematic configuration of a solar cell panel EL inspection apparatus 100 according to the present invention.
  • an EL inspection apparatus that continuously inspects the solar cell panel 50 in an in-line manner is illustrated.
  • the solar cell panel EL inspection apparatus 100 of the present invention can naturally be configured as a so-called batch-type EL inspection apparatus that individually inspects the solar cell panels 50 to be inspected one by one.
  • the EL inspection apparatus 100 mainly includes a DC power source 1 that applies a forward bias current to the solar cell panel 50 to be inspected to cause EL emission, and a camera (imaging unit) 10 that images the solar cell panel 50 in the EL emission state. And a computer 20 that processes and analyzes the photographed image of the solar cell panel 50.
  • the solar cell panel 50 to be inspected is provided with a plurality of solar power generation cells, and the EL inspection device 100 determines the quality of the solar power generation cells.
  • the DC power source 1 is in contact with the electrode contact 52 provided on the back side of the inspection surface 51 (the surface on which the photovoltaic cells are arranged) of the solar cell panel 50 and applies a forward bias current to the solar cell panel 50. .
  • the solar cell panel 50 emits EL.
  • the camera 10 is installed inside a dark room 30 in an environment where external light can be shielded. On the side wall of the dark room 30 facing the camera 10, a light-transmissive shooting window 31 for shooting the solar cell panel 50 is provided. An inspection surface 51 of the solar cell panel 50 to be inspected is brought into contact with the photographing window 31.
  • the imaging window 31 is completely covered by the solar cell panel 50, so that the inspection surface 51 of the solar cell panel 50 is in a state where external light is blocked.
  • the plurality of photovoltaic cells in the EL emission state on the inspection surface 51 of the solar battery panel 50 are photographed by the camera 10.
  • the short-focus wide-angle lens 11 is mounted on the camera 10 so as to be able to cope with a case where the solar battery panel 50 is large (for example, a size of 2 m ⁇ 1 m). Thereby, the whole test
  • the photographed solar cell panel 50 is transported to the next process (moves to the right side of the dark room 30 in FIG. 1), and the next solar cell panel to be inspected (dark room in FIG. 1).
  • the solar cell panel 50) waiting on the left side of 30 is brought into contact with the photographing window 31 of the dark room 30.
  • the electrode contact 52 of the solar cell panel 50 comes into contact with the DC power source 1 and a forward bias current is applied to emit EL. In this way, continuous photographing (in-line inspection) of the solar cell panel 50 is executed.
  • the computer 20 includes a correction unit 21 that corrects the image of the solar battery panel 50 taken by the camera 10, a comparison unit 22 that compares the corrected image with the template 24 serving as a reference, and based on the comparison result,
  • the determination part 23 which determines the quality of the battery panel 50 is provided.
  • the template 24 is sample data of a solar power generation cell in a good state, and this is stored in the comparison unit 22.
  • the comparison part 22 can respond
  • the correction unit 21, the comparison unit 22, and the determination unit 23 may be realized as hardware implemented in the computer 20, but may also be realized as software functions executed in the computer 20.
  • two typical arithmetic processes executed by the correction unit 21, the comparison unit 22, and the determination unit 23 will be described as a first embodiment and a second embodiment.
  • FIG. 2 is an explanatory diagram showing a correction result executed by the correction unit 21 and a comparison result executed by the comparison unit 22 according to the first embodiment of the present invention.
  • the correction unit 21 simultaneously performs distortion correction and luminance correction on the captured image.
  • the distortion correction includes trapezoidal correction in which an image deformed into a trapezoidal shape for photographing from the side is corrected to a square image.
  • (a) is an original image taken by the camera 10 with the short focus wide angle lens 11.
  • (B) is an image after correcting the distortion of the original image.
  • (C) is an image after further luminance correction.
  • a mask process is executed by the comparison unit 22 on the image for which the distortion correction and the luminance correction are completed.
  • (D) is an image after mask processing, and a region surrounded by a dotted line is a photovoltaic cell on which mask processing has been performed.
  • a defective part such as “chip” or “crack” is included in a part surrounded by a dotted circle. That is, a portion darker than the surroundings is recognized as a defective part.
  • the mask processing is performed using a “pattern matching method” shown in the following procedures ⁇ 1> to ⁇ 10>.
  • the average luminance of the reference image is obtained from the luminance value of each pixel of the reference image that is a template (a specific template corresponding to the photovoltaic cell to be inspected).
  • the reference image is an image for one good cell serving as a predetermined reference.
  • An image a obtained by subtracting the average luminance of the reference image from the reference image is acquired. This calculation is repeated for each of the pixels constituting the reference image.
  • the average luminance of the selected image is obtained from each pixel luminance value of the selected image at an arbitrary position of the captured image (this is an image having the same size as the reference image).
  • An image b obtained by subtracting the average luminance of the selected image from the selected image is acquired.
  • p1 and p2 correspond to the similarity when the template is 100% (that is, an index indicating how much the selected image matches the reference image).
  • p1 is a threshold value on the similar side
  • p2 is a threshold value on the dissimilar side. Based on the luminance of each pixel, the photovoltaic cells are ranked, and the similarity is determined for the photovoltaic cells after the ranking. Specifically, an image satisfying v ⁇ p2 is first obtained.
  • the obtained image is determined to be dissimilar, and it is determined that the image is not a photovoltaic cell.
  • an image (selected image) satisfying v ⁇ p1 is obtained. It is determined that the obtained selected image is similar to the reference image, and mask processing is performed on the selected image. At this time, the masked photovoltaic power generation cell is a reliable cell.
  • a non-defective cell may be excluded by first performing a comparison between v and p1, and then a non-cell may be excluded by performing a comparison between v and p2. Since the original image before the mask process is stored in the computer 20, in the present invention, it is also possible to compare the images before and after the mask process. For this reason, the operator can easily recognize the defective part.
  • ⁇ 10> The arbitrary position in the above ⁇ 3> is changed, and ⁇ 3> to ⁇ 9> are repeated.
  • the number of repetitions is preferably the number of pixels constituting the captured image.
  • the template in ⁇ 1> above can be set freely.
  • a 1 / n-fold image (n> 1) of one photovoltaic power generation cell that is a structural unit of a solar battery panel is used as a reference image.
  • the number of operations in the computer 20 can be reduced to 1 / n.
  • the image of a photovoltaic cell upper half is set as a template, the selection image in said ⁇ 3> will also become an image of a photovoltaic cell upper half.
  • the position of a photovoltaic cell is specified in advance, and the whole is compared at the stage where the cell position is specified.
  • a selected image determined to be similar to the reference image that is, a photovoltaic power generation cell that is surely a non-defective product
  • it can be color-coded in a dark color. Thereby, the operator can easily recognize only defective solar power generation cells in the solar battery panel.
  • FIG. 3 is an explanatory diagram showing a correction result executed by the correction unit 21 and a comparison result executed by the comparison unit 22 according to the second embodiment of the present invention.
  • the correction unit 21 simultaneously performs distortion correction and luminance correction on the captured image.
  • the process from (a) to (b) is distortion correction
  • the process from (b) to (c) is luminance correction.
  • the enhancement unit shown in (c) to (d) is executed by the comparison unit 22 on the image for which distortion correction and luminance correction have been completed.
  • the result of the emphasis process shown in (d) is an enlarged display of the process result of the area surrounded by the dotted line in (c).
  • the process up to the enhancement process is basically the same as the above-described “pattern matching method”, but a selected image that is determined not to be similar to the reference image is extracted. That is, in ⁇ 9> of the pattern matching method, a preset threshold value p2 is compared with v, and when v ⁇ p2, it is determined that the selected image is not similar to the reference image.
  • FIG. Perform emphasis processing by clarification as shown.
  • the pattern of the structure such as the surface electrode originally formed on the surface of the photovoltaic cell is excluded, and only the defective portion as seen in the area surrounded by the circle is particularly noticeable. Is to be emphasized. Thereby, the operator can easily recognize only defective solar power generation cells in the solar battery panel.
  • a template used in the second embodiment for example, it is also effective to set a pattern including a structure such as a surface electrode on the surface of the photovoltaic cell as a template.
  • a pattern including a structure such as a surface electrode on the surface of the photovoltaic cell as a template.
  • the structure since the pattern of the structure is subtracted when the cell image is binarized, the structure does not appear in the image even when it is highlighted after that. As a result, the structure is not mistaken as a defect such as “chip” or “crack”, and the inspection accuracy can be improved.
  • FIG. 4 is a flowchart illustrating a procedure of a solar cell panel EL inspection method according to the third embodiment of the present invention.
  • the solar cell panel EL inspection method of the third embodiment corresponds to the solar cell panel EL inspection device of the first embodiment described above, and is executed by steps 1 to 7 described below.
  • each step is indicated by a symbol “S”.
  • a forward bias current is applied to the solar cell panel 50 to be inspected. This causes the solar cell panel 50 to emit EL (S0).
  • an imaging step an image (that is, an EL image) of the solar cell panel 50 in the EL emission state is captured (S1). In this photographing, the short focus wide angle lens 11 is used. Thereby, even when the solar cell panel 50 is large (for example, a size of 2 m ⁇ 1 m), the entire panel can be photographed.
  • the image photographed using the short-focus wide-angle lens 11 is resized as necessary so as to fit the display size (S2).
  • the original image before resizing can be used for enlarged display.
  • distortion and luminance reduction at the periphery of the image due to the influence of the short focus wide-angle lens 11 are corrected (S3).
  • S3 distortion correction and luminance correction are executed simultaneously, the image processing time is shortened and the image processing accuracy is improved.
  • Image resizing (S2) and distortion / brightness correction (S3) are correction steps.
  • the pattern of the corrected image is executed on the corrected image to recognize the state of the photovoltaic cell and mask the non-defective cell in the solar battery panel 50 (S4 to S6).
  • Pattern matching creates a specific template according to the photovoltaic power generation cell to be inspected, compares the specific template with the photovoltaic power generation cell to be inspected, and the similarity to the specific template is greater than or equal to a predetermined value or less than a predetermined value. This is an operation for extracting a photovoltaic cell.
  • the “pattern matching method” according to the procedures ⁇ 1> to ⁇ 10> described in the above “solar cell panel inspection apparatus” is executed.
  • a threshold similarity criterion
  • the threshold value can be, for example, the threshold value p1 on the similar side described above and the threshold value p2 on the dissimilar side.
  • the threshold is preferably in the range of 60 to 90% when the template is 100%. If the threshold value is less than 60%, there is a problem in identifying the photovoltaic power generation cell, and the inspection accuracy is lowered. On the other hand, if the threshold value exceeds 90%, the number of photovoltaic power generation cells that are determined to be non-defective products due to excessive standards is extremely reduced, and the inspection efficiency deteriorates. Based on the pattern matching results, the photovoltaic power generation cells are ranked as necessary (rank value setting), and the photovoltaic power generation cells are recognized (S5).
  • a mask of non-defective cells in the solar battery panel 50 is performed (S6). This is an operation of clearly excluding non-defective cells from the cells recognized in S5.
  • the pattern matching (S4), cell recognition (S5), and non-defective cell mask (S6) are comparison steps.
  • the quality of the solar cell panel 50 is determined (S7).
  • This pass / fail judgment can be automatically made by the computer 20 from the rank value of each cell.
  • the pass / fail judgment (S7) is a judgment step.
  • FIG. 5 is a flowchart showing a procedure of an EL inspection method for a solar cell panel according to the fourth embodiment of the present invention.
  • the solar cell panel EL inspection method of the fourth embodiment corresponds to the solar cell panel EL inspection device of the second embodiment described above, and is executed by steps 10 to 20 described below.
  • each step is indicated by a symbol “S”.
  • a forward bias current is applied to the solar cell panel 50 to be inspected.
  • the solar cell panel 50 emits EL (S10).
  • an imaging step an image (that is, an EL image) of the solar cell panel 50 in the EL emission state is captured (S11).
  • the short focus wide angle lens 11 is used. Thereby, even when the solar cell panel 50 is large (for example, a size of 2 m ⁇ 1 m), the entire panel can be photographed.
  • the image photographed using the short-focus wide-angle lens 11 is resized as necessary to fit the display size (S12).
  • the original image before resizing can be used for enlarged display.
  • distortion and luminance reduction at the periphery of the image due to the influence of the short focus wide-angle lens 11 are corrected (S13).
  • Image resizing (S12) and distortion / brightness correction (S13) are correction steps.
  • the pattern of the corrected image is executed on the corrected image to recognize the state of the photovoltaic power generation cell, and the defective part in the solar battery panel 50 is extracted (S14 to S18).
  • Pattern matching creates a specific template according to the photovoltaic power generation cell to be inspected, compares the specific template with the photovoltaic power generation cell to be inspected, and the similarity to the specific template is greater than or equal to a predetermined value or less than a predetermined value. This is an operation for extracting a photovoltaic cell.
  • the “pattern matching method” according to the procedures ⁇ 1> to ⁇ 10> described in the above “solar cell panel inspection apparatus” is executed.
  • a threshold similarity criterion
  • the threshold value can be, for example, the threshold value p1 on the similar side described above and the threshold value p2 on the dissimilar side.
  • the threshold is preferably in the range of 60 to 90% when the template is 100%. If the threshold value is less than 60%, there is a problem in identifying the photovoltaic power generation cell, and the inspection accuracy is lowered. On the other hand, if the threshold value exceeds 90%, the number of photovoltaic power generation cells that are determined to be non-defective products due to excessive standards is extremely reduced, and the inspection efficiency deteriorates. Based on the pattern matching result, the photovoltaic power generation cells are ranked as necessary (rank value setting), and the photovoltaic power generation cells are recognized (S15).
  • cell brightness correction S16
  • cell image binarization S17
  • the defective part of the cell in the solar cell panel 50 is extracted (S18). This is an operation for extracting defective cells from the cells recognized in S15 (or from the cells corrected by the sub correction step).
  • the pattern matching (S14), cell recognition (S15), and extraction of defective parts (S18) are comparison steps. This comparison step may include cell brightness correction (S16) and cell image binarization (S17).
  • Highlighting is performed on the defective portion of the extracted cell (S19). This highlighting includes coloring. For example, the image is binarized by blackening defective portions and whitening other portions. Finally, the quality determination with respect to the solar cell panel 50 is performed (S20). This quality determination can be automatically performed by the computer 20 based on the area of blackening.
  • the highlighting display (S19) and pass / fail judgment (S20) of the cell defect portion are the judgment steps.
  • the presence or absence of defects in the solar cell panel can be inspected quickly, efficiently and reliably.
  • the solar cell panel EL inspection apparatus and solar cell panel EL inspection method of the present invention can be used for inspection of various types of solar cell panels, and in particular can be applied to inspection of large-sized solar cell panels. .

Landscapes

  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Photovoltaic Devices (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Electroluminescent Light Sources (AREA)

Abstract

La présente invention a trait à un dispositif de détection à électroluminescence destiné à un panneau solaire qui peut être appliqué à des panneaux solaires de grande taille en particulier. Plus particulièrement, la présente invention a trait à un dispositif de détection à électroluminescence (100) destiné à un panneau solaire (50) qui est doté de multiples cellules photoélectriques, lequel dispositif est équipé d'un bloc d'alimentation en courant continu (1) qui applique un courant polarisé direct sur le panneau solaire (50) devant être contrôlé et qui permet l'émission de l'électroluminescence, d'une unité d'imagerie (10) qui forme une image du panneau solaire (50) lorsqu'il est électroluminescent, d'une unité de correction (21) qui corrige l'image du panneau solaire visualisé (50), d'une unité de comparaison (22) qui compare l'image corrigée et un modèle standard, et d'une unité de détermination (23) qui détermine si le panneau solaire est acceptable en fonction des résultats de la comparaison. L'unité de comparaison (22) génère un modèle spécifique en fonction des cellules solaires devant être contrôlées et masque les cellules solaires qui sont dotées d'un degré de similarité par rapport au modèle qui est supérieur ou égal à une valeur désignée.
PCT/JP2011/062572 2010-06-04 2011-06-01 Dispositif de contrôle à électroluminescence destiné à un panneau solaire et procédé de contrôle à électroluminescence WO2011152445A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012518422A JPWO2011152445A1 (ja) 2010-06-04 2011-06-01 太陽電池パネルのｅｌ検査装置、及びｅｌ検査方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010-128561 2010-06-04
JP2010128561 2010-06-04

Publications (1)

Publication Number Publication Date
WO2011152445A1 true WO2011152445A1 (fr) 2011-12-08

Family

ID=45066803

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2011/062572 WO2011152445A1 (fr) 2010-06-04 2011-06-01 Dispositif de contrôle à électroluminescence destiné à un panneau solaire et procédé de contrôle à électroluminescence

Country Status (3)

Country Link
JP (1) JPWO2011152445A1 (fr)
TW (1) TW201144831A (fr)
WO (1) WO2011152445A1 (fr)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014232040A (ja) * 2013-05-29 2014-12-11 株式会社島津製作所 太陽電池セルの検査装置
EP2796860A4 (fr) * 2011-12-21 2015-07-01 Abengoa Solar New Tech Sa Méthode d'inspection automatisée de capteurs solaires photovoltaïques installés dans des centrales
JP2015162970A (ja) * 2014-02-27 2015-09-07 東北電力株式会社 太陽電池アレイの異常通知装置
CN105490643A (zh) * 2015-12-23 2016-04-13 普德光伏技术（苏州）有限公司 光伏组件el检测用暗房装置
JP2018128309A (ja) * 2017-02-07 2018-08-16 大成建設株式会社 ひび割れ検出方法
CN108831851A (zh) * 2018-06-26 2018-11-16 通威太阳能（成都）有限公司 一种提高太阳能电池el不良分类效率的分选方法
CN109668895A (zh) * 2017-10-16 2019-04-23 日商登肯股份有限公司 太阳能电池检查装置以及带照相机的太阳光模拟器
WO2019115843A1 (fr) * 2017-12-14 2019-06-20 Acciona Energía, S. A. Système et procédé automatisés d'inspection d'une installation photovoltaïque
CN110071691A (zh) * 2019-05-21 2019-07-30 尚德太阳能电力有限公司 用于分析可靠性失效的太阳能组件的方法及相应装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009084702A1 (fr) * 2007-12-28 2009-07-09 Nisshinbo Industries, Inc. Appareil d'inspection de batterie solaire et procédé de détermination de défaut de batterie solaire

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009084702A1 (fr) * 2007-12-28 2009-07-09 Nisshinbo Industries, Inc. Appareil d'inspection de batterie solaire et procédé de détermination de défaut de batterie solaire

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2796860A4 (fr) * 2011-12-21 2015-07-01 Abengoa Solar New Tech Sa Méthode d'inspection automatisée de capteurs solaires photovoltaïques installés dans des centrales
JP2014232040A (ja) * 2013-05-29 2014-12-11 株式会社島津製作所 太陽電池セルの検査装置
JP2015162970A (ja) * 2014-02-27 2015-09-07 東北電力株式会社 太陽電池アレイの異常通知装置
CN105490643A (zh) * 2015-12-23 2016-04-13 普德光伏技术（苏州）有限公司 光伏组件el检测用暗房装置
JP2018128309A (ja) * 2017-02-07 2018-08-16 大成建設株式会社 ひび割れ検出方法
CN109668895A (zh) * 2017-10-16 2019-04-23 日商登肯股份有限公司 太阳能电池检查装置以及带照相机的太阳光模拟器
WO2019115843A1 (fr) * 2017-12-14 2019-06-20 Acciona Energía, S. A. Système et procédé automatisés d'inspection d'une installation photovoltaïque
US11451192B2 (en) 2017-12-14 2022-09-20 Acciona Energia S.A. Automated photovoltaic plant inspection system and method
CN108831851A (zh) * 2018-06-26 2018-11-16 通威太阳能（成都）有限公司 一种提高太阳能电池el不良分类效率的分选方法
CN108831851B (zh) * 2018-06-26 2021-03-09 通威太阳能（成都）有限公司 一种提高太阳能电池el不良分类效率的分选方法
CN110071691A (zh) * 2019-05-21 2019-07-30 尚德太阳能电力有限公司 用于分析可靠性失效的太阳能组件的方法及相应装置
CN110071691B (zh) * 2019-05-21 2020-05-08 尚德太阳能电力有限公司 用于分析可靠性失效的太阳能组件的方法及相应装置

Also Published As

Publication number Publication date
JPWO2011152445A1 (ja) 2013-08-01
TW201144831A (en) 2011-12-16

Similar Documents

Publication Publication Date Title
WO2011152445A1 (fr) Dispositif de contrôle à électroluminescence destiné à un panneau solaire et procédé de contrôle à électroluminescence
TWI787296B (zh) 光學檢測方法、光學檢測裝置及光學檢測系統
US10805552B2 (en) Visual inspection device and illumination condition setting method of visual inspection device
JP2006139237A (ja) 表示パネル用検査装置及びその検査方法
TWI758609B (zh) 影像生成裝置及影像生成方法
KR20190073247A (ko) 향상된 전처리를 갖는 화이트 스팟 무라 검출 시스템 및 방법
US20140198202A1 (en) Inspection method for display panel
CN108090890B (zh) 检查装置以及检查方法
KR101828536B1 (ko) 패널 검사 방법 및 장치
JP2008068284A (ja) 欠陥修正装置、欠陥修正方法、及びパターン基板の製造方法
JP2007093330A (ja) 欠陥抽出装置及び欠陥抽出方法
JP4842034B2 (ja) 液晶パネルの検査方法および画像処理装置
JP6184746B2 (ja) 欠陥検出装置、欠陥修正装置および欠陥検出方法
JP3695120B2 (ja) 欠陥検査方法
JP6168834B2 (ja) 光学フィルムの欠陥判別方法
CN112987356B (zh) 液晶面板底部异物滤除装置
JP2010019646A (ja) 画像処理検査方法及び画像処理検査システム
JP2005140655A (ja) シミ欠陥の検出方法及びその検出装置
JP2014077685A (ja) パターン欠陥検出装置およびパターン欠陥検出方法
JP2006234554A (ja) パターン検査方法およびパターン検査装置
JP2006145228A (ja) ムラ欠陥検出方法及び装置
KR20160101436A (ko) 표면의 이물검사 방법
KR101053779B1 (ko) 디스플레이 수단의 메탈 마스크 검사 방법
TWI728708B (zh) 自動光學檢測系統及其檢測隱形眼鏡邊緣瑕疵的方法
JP7021886B2 (ja) 基板検査装置、基板処理装置、基板検査方法および基板処理方法

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 11789847

Country of ref document: EP

Kind code of ref document: A1

DPE1 Request for preliminary examination filed after expiration of 19th month from priority date (pct application filed from 20040101)
WWE Wipo information: entry into national phase

Ref document number: 2012518422

Country of ref document: JP

NENP Non-entry into the national phase

Ref country code: DE

32PN Ep: public notification in the ep bulletin as address of the adressee cannot be established

Free format text: NOTING OF LOSS OF RIGHTS PURSUANT TO RULE 112(1) EPC (EPO FORM 1205 DATED 12.02.2013)

122 Ep: pct application non-entry in european phase

Ref document number: 11789847

Country of ref document: EP

Kind code of ref document: A1