WO2011138967A1 - 導電性摺動膜、導電性摺動膜が形成された部材、及びその製造方法 - Google Patents
導電性摺動膜、導電性摺動膜が形成された部材、及びその製造方法 Download PDFInfo
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- WO2011138967A1 WO2011138967A1 PCT/JP2011/060609 JP2011060609W WO2011138967A1 WO 2011138967 A1 WO2011138967 A1 WO 2011138967A1 JP 2011060609 W JP2011060609 W JP 2011060609W WO 2011138967 A1 WO2011138967 A1 WO 2011138967A1
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- film
- conductive sliding
- sliding film
- metal
- mount
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0605—Carbon
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C17/00—Surface treatment of glass, not in the form of fibres or filaments, by coating
- C03C17/22—Surface treatment of glass, not in the form of fibres or filaments, by coating with other inorganic material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/32—Vacuum evaporation by explosion; by evaporation and subsequent ionisation of the vapours, e.g. ion-plating
- C23C14/325—Electric arc evaporation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/548—Controlling the composition
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B17/00—Details of cameras or camera bodies; Accessories therefor
- G03B17/02—Bodies
- G03B17/12—Bodies with means for supporting objectives, supplementary lenses, filters, masks, or turrets
- G03B17/14—Bodies with means for supporting objectives, supplementary lenses, filters, masks, or turrets interchangeably
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/20—Conductive material dispersed in non-conductive organic material
- H01B1/22—Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/20—Conductive material dispersed in non-conductive organic material
- H01B1/24—Conductive material dispersed in non-conductive organic material the conductive material comprising carbon-silicon compounds, carbon or silicon
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C2217/00—Coatings on glass
- C03C2217/20—Materials for coating a single layer on glass
- C03C2217/29—Mixtures
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24025—Superposed movable attached layers or components
Definitions
- the present invention relates to a conductive sliding film that can be formed on the surface of a relatively sliding member, a member such as a camera mount member on which the conductive sliding film is formed, and a method for manufacturing the conductive sliding film. .
- a connecting member there are many members that have a coating film formed on the surface of a member that slides relative to each other and a member that is connected by sliding relative to a contact surface of another member (referred to as a connecting member).
- An example of such a member is an exterior material such as an optical device, and a bayonet provided on the body side and the lens side in the camera system in which the lens unit is detachable and replaceable with respect to the camera body as the connecting member.
- a connection member referred to as a type mount hereinafter simply referred to as “mount”).
- the mount is configured such that the base material is made of brass, and a conductive protective coating film made of metal chromium is formed on the surface (see, for example, Patent Document 1).
- the reason metal chrome has been selected as the surface treatment material for mounts is a metal with high reflectivity and beautiful luster, is relatively hard, has conductivity, is not a rare metal, and is relatively inexpensive to produce. Because it is.
- the mount on which the body side mount and the lens side mount are engaged and connected relative to each other is required to have slidability (low coefficient of friction) and wear resistance (surface hardness).
- slidability low coefficient of friction
- wear resistance surface hardness
- the friction coefficient and the surface hardness are required to be able to withstand a predetermined number of times of attachment / detachment while maintaining good operability when attaching / detaching the lens unit to / from the camera body.
- the camera mount is operated by direct touching by the user, and because it is also a highly-preferred product, it has characteristics that are not found in sliding parts for automobiles and machines where only operability and functions are important. Required.
- the social mission is to avoid the wet plating process using hexavalent chromium, which is a harmful chemical substance for the human body, and a new coating that can satisfy the required requirements in the dry process.
- hexavalent chromium which is a harmful chemical substance for the human body
- Patent Document 2 discloses that methane gas is formed by plasma CVD, sputtering, or ion plating using Ti or Mo as an impurity element in order to provide a hard carbon film having both excellent wear resistance and high conductivity. Discloses a method for forming a hard carbon film. Although this document does not disclose the structure of the obtained hard carbon film, according to the results of experiments conducted by the inventor described later, the structure is close to the diamond-like carbon mainly composed of sp 2 bonds (hybrid orbitals). It is known that the carbon film is mainly composed of hydrogen-rich sp 3 bonds (hybrid orbitals).
- FCVA filtered cathodic saw Dick vacuum arc process
- the present invention has been made in view of such circumstances, and is particularly suitable for the surface treatment of a camera mount, has high wear resistance, good slidability, and can transmit an electrical signal.
- An object is to provide a conductive sliding film and a connection member for a connection member having conductivity, and an object is to provide a manufacturing method capable of manufacturing such a connection member by a dry process.
- an object of the present invention is to provide a member such as a camera mount member including such a conductive sliding film and a connection member, a camera body, and a lens unit.
- a conductive sliding film applied to the surface of a relatively sliding member, the conductive sliding film being formed from tetrahedral amorphous carbon doped with metal.
- a conductive sliding film having a resistivity of 10 2 to 10 ⁇ 4 [ ⁇ cm] is provided.
- the metal element to be doped is titanium, and the titanium content can be 1 to 33 [at%], particularly 1 to 20 [at%].
- a member having the conductive sliding film of the first aspect formed on the surface is provided.
- the conductive sliding film of the first aspect can be a member formed on a connection surface that is connected by sliding relative to the connection surface of another member.
- This member can be configured by forming the conductive sliding film as described above on the surface of a base material formed of a metal material.
- the member is at least one of a first connection member and a second connection member that are connected by sliding relative to each other, and the connection surface of the first connection member and the connection surface of the second connection member are relatively slid and engaged. When connected, the first connecting member and the second connecting member are mechanically connected and can be electrically connected.
- a body-side and / or lens-side mount member used in a camera system in which a lens unit is configured to be attachable / detachable with respect to a camera body, the base member,
- the conductive sliding film is formed of tetrahedral amorphous carbon doped with metal and has a resistivity of 10 ⁇ 2 to 10 ⁇ 4 [ ⁇ cm].
- a camera mount member having a surface hardness of 10 to 30 [GPa] and a dynamic friction coefficient of less than 0.15 is provided.
- a camera body provided with the camera mount member of the third aspect is provided.
- a lens unit provided with the camera mount member of the third aspect is provided.
- a method for producing a conductive sliding film wherein a member that slides relative to each other is placed in a vacuum chamber, a graphite target containing a metal or metal carbide is used as a raw material,
- the electrical conductivity is in the range of 10 2 to 10 ⁇ 4 [ ⁇ cm] and the surface hardness is in the range of 10 to 30 [GPa] by the dick vacuum arc (abbreviated as “FCVA” where appropriate).
- FCVA dick vacuum arc
- a method for producing a conductive sliding film for forming a film of metal-doped tetrahedral amorphous carbon (ta-C: M) is provided.
- the target is preferably a target that does not substantially contain hydrogen.
- the FCVA method is not limited to the FCVA method in a narrow sense, but also a cathodic vacuum arc method or a vacuum arc method having a function of separating specific elements such as ionized carbon (filter function) and a method similar thereto,
- a cathodic vacuum arc method or a vacuum arc method having a function of separating specific elements such as ionized carbon (filter function) and a method similar thereto For example, an arc ion plating (AIP) method is also included.
- AIP arc ion plating
- the conductive sliding film and member having high wear resistance, good slidability, and conductivity capable of transmitting an electrical signal particularly a member suitable for a camera mount.
- a member suitable for a camera mount can be provided.
- such a member is manufactured by the FCVA method without using a plating method, no environmental problem is caused.
- FIG. 5A is a plan view of the bayonet mount on the camera body side shown in FIG. 4, and FIG. 5B is a plan view of the bayonet mount on the interchangeable lens side shown in FIG. It is a schematic sectional drawing of the surface of the mount in which the sliding film was formed on the base material.
- FIG. 2 shows a carbon-hydrogen composition phase diagram consisting of a ternary system of carbon (sp 3 -C) composed of sp 3 bonds, carbon (sp 2 -C) composed of sp 2 bonds, and H.
- the numerical values attached to each side of the triangle are the composition ratio (concentration) of hydrogen H on the lower side, the composition ratio (concentration) of sp 3 -C on the right side, and the composition ratio (concentration) of sp 2 -C on the left side.
- PECVD in the figure means plasma CVD method using methane as a raw material
- IP means ion plating method using benzene as a raw material.
- the carbon-hydrogen composition produced by these methods is indicated by a square in the figure. ing.
- each vertex of the triangle is a substance of a pure single component (and binding), sp 2 carbon sp 3 -C of sp 3 bond located above the vertex located diamond, the lower left vertex
- the bond carbon sp 2 -C is graphite (graphite), and H located at the top right corner is hydrogen.
- the sp 3 -C diamond and the sp 2 -C graphite are both composed of carbon, but their crystal structures are clearly different due to the difference in the bonding state between the atoms.
- composition on each side of the triangle excluding the three vertices is a binary amorphous material, on the left side connecting the upper vertex (sp 3 -C) and the lower left vertex (sp 2 -C).
- a carbon composition in which sp 3 -C and sp 2 -C are randomly mixed at a composition ratio corresponding to the position on the axis is formed.
- This carbon composition not containing hydrogen is called “amorphous carbon” and is expressed as “a-C”.
- a carbon composition having a high sp 3 -C composition ratio is particularly referred to as “tetrahedral amorphous carbon”, and “ta-C ".
- Tetrahedral amorphous carbon does not substantially contain hydrogen and is composed of sp 3 -C and sp 2 -C.
- the term “substantially free of hydrogen” means that hydrogen is contained only in an amount (for example, 0.3 at% or less) lower than the detected amount of hydrogen derived from the measuring device.
- hydrogen derived from the measuring device eg, hydrogen adsorbed on the measuring device
- Such tetrahedral amorphous carbon can be produced by the FCVA method, but cannot be produced by the conventional CVD method.
- a ternary carbon-hydrogen composition in which sp 3 -C, sp 2 -C, and hydrogen are randomly mixed is formed in the inner region of the triangle surrounded by the three sides.
- Such a carbon-composition containing hydrogen is called “hydrogenated amorphous carbon” and is expressed as “aC: H”.
- the carbon-hydrogen composition having a high sp 3 -C composition ratio (the upper internal region of the triangle in the phase diagram) is called “hydrogenated tetrahedral amorphous carbon”. It is written as “ta-C: H”.
- ta-C contains hydrogen, it has been found that the slidability (coefficient of friction) used for the slidable material is inferior to ta-C which does not contain hydrogen. It has also been found that ta-C: H is inferior to ta-C in terms of hardness and heat resistance.
- diamond that is sp 3 -C has extremely high hardness, is transparent in the visible light region, and is electrically insulating.
- graphite which is sp 2 -C, is soft, opaque (black) in the visible light region, and has a characteristic of being self-lubricating (low coefficient of friction). That is, diamond (sp 3 -C) and graphite (sp 2 -C) are both carbon compositions but have contrasting characteristics.
- the amorphous carbon a-C located on the line connecting sp 3 -C (diamond) and sp 2 -C (graphite) has an intermediate characteristic having both characteristics, and the composition ratio Depending on, either feature becomes stronger. Therefore, it is presumed that the film of tetrahedral amorphous carbon ta-C containing a large amount of sp 3 -C has wear resistance based on high hardness and can acquire good slidability based on a low friction coefficient.
- FIG. 2 shows the range of the friction coefficient of amorphous carbon formed by the PECVD method, IP method, and FCVA method, respectively. It can be seen that even with tetrahedral amorphous carbon formed by the FCVA method, the friction coefficient decreases as the blending ratio of sp 3 -C increases.
- Amorphous carbon a-C provides conductivity that can exchange electrical signals like metallic chromium even if it has both characteristics and can acquire wear resistance and good slidability. It has been considered impossible. It has also been considered difficult to obtain a desired metallic appearance with an aC film. This is because the reason why the extremely high hardness of diamond is due to the covalent bond between carbon atoms having no free electrons, while the conductivity and metallic luster are realized by having a large number of free electrons.
- a tetrahedral amorphous carbon is doped with a metal to produce a sliding film having good wear resistance, slidability and conductivity. Succeeded.
- the metal doped into tetrahedral amorphous carbon is Ti, Ni, Cr, Al, Mg, Cu, Fe, Ag. , Au, Pt and the like. Of these, Ti, Cr, Ni, and Fe are preferable.
- the content (dope amount) of the metal sliding film is preferably 1 to 33 at%, particularly 1 to 20 at%, in order to maintain the wear resistance, sliding property and conductivity of the sliding film appropriately. . If the content is less than 1 at%, the conductivity is insufficient and the electric resistance of the sliding film is increased. When the content exceeds 20 at%, the hardness of the sliding film is lowered and the wear resistance tends to deteriorate.
- the sliding film according to the embodiment of the present invention has a resistance value in the range of 10 2 to 10 ⁇ 4 [ ⁇ cm], particularly 10 ⁇ 2 to 10 ⁇ 4 [ ⁇ cm], and more preferably in the range of 10 ⁇ 3 to 10 ⁇ 4 [ ⁇ cm].
- the value of has been achieved.
- this sliding film for a camera mount capable of automatically controlling a lens such as autofocus, electrical signals are communicated between the lens unit and the camera body via the sliding film. be able to.
- the lens unit, strobe, etc. may be frequently attached to and detached from the camera body.
- the applied sliding film may be peeled off.
- the lens portion and the camera body cannot be connected through the sliding film. Therefore, the wear resistance and hardness of the sliding film are also required. Moreover, since it is a user's manual operation to attach and detach the lens unit from the camera body, the lens unit and the camera body must be smoothly attached and detached via the sliding film. It is also necessary to reduce the dynamic friction of the film. Thus, i) a low electrical resistance value, ii) moderate hardness (wear resistance), and iii) a low dynamic friction coefficient are simultaneously required for the sliding portion used for the camera mount. However, when the amount of metal dope is increased in order to reduce the electric resistance value, the hardness is lowered and the film is easily peeled off. On the other hand, if the hardness is too high, the dynamic friction coefficient also increases and the slidability decreases. For this reason, the sliding film of the camera mount needs to satisfy the above three characteristics in a well-balanced manner.
- the resistance value is 10 ⁇ 2 to 10 ⁇ 4 [ ⁇ cm], and the surface hardness is It has been found that when it is 10 to 30 [GPa] and the coefficient of dynamic friction is less than 0.15, the lens unit has a durability exceeding 5000 times with respect to the camera body.
- the resistance value, surface hardness and dynamic friction coefficient suitable for the camera mount can be satisfied when the content is 1 to 25 at%, which will be described later. I know through examples.
- ⁇ Sliding membrane manufacturing method> As an example of a film forming method for forming a conductive sliding film on a substrate, a schematic structure of an FCVA (Filtered Cathodic Vacuum Arc) method and a film forming apparatus 1 for performing the method will be described with reference to FIG.
- FCVA Frtered Cathodic Vacuum Arc
- the FCVA film forming apparatus 1 mainly includes an arc plasma generating unit 10, a filter unit 20, and a film forming chamber unit 30.
- the arc plasma generation unit 10 and the film forming chamber unit 30 are connected by a duct-shaped filter unit 20, and the pressure of the film forming chamber unit 30 is set to a vacuum degree of about 10 ⁇ 5 [Torr] by a vacuum device (not shown).
- the vacuum device not shown.
- the arc plasma generation unit 10 is provided with an anode (striker) and a cathode with the target 11 interposed therebetween, and an arc discharge is generated by bringing the striker into contact with the target 11 and releasing immediately thereafter.
- anode sinode
- arc plasma carbon plasma
- Neutral particles and + ionized carbon generated by the arc plasma fly through the filter unit 20 toward the film forming chamber unit 30.
- a graphite target containing metal and not containing hydrogen is used.
- the metal species include Ti, Ni, Cr, Al, Mg, Cu, Fe, Ag, Au, and Pt as described above.
- the filter unit 20 is provided with a duct 23 around which a double bend electromagnet coil 21 is wound and an ion scanning coil 25.
- the duct 23 is bent twice in two orthogonal directions between the arc plasma generation unit 10 and the film forming chamber unit 30, and a double bend electromagnet coil 21 is wound around the outer periphery thereof. Since the duct 23 has such a bent structure (double vent structure), the particles flowing in the duct 23 collide with the inner wall surface or flow along the wall surface. By passing a current through the double bend electromagnet coil 21, Lorentz force is applied to the charged particles flying inside the duct 23, and the flight path is changed.
- the double-bend electromagnet coil 21 and the duct 23 constitute a narrow-band electromagnetic spatial filter that allows only target particles to pass through with high efficiency.
- the ion scanning coil 25 scans the ionized carbon beam that passes through the double bend electromagnet coil 21 and enters the film forming chamber 30 as described above, and is applied to the surfaces of the base materials 32 and 33 held by the holder 31.
- a uniform aC film (ta-C film, ta-C: M film) is formed.
- the base material may be an arbitrary material made of an organic material such as a resin or an inorganic material such as a metal or ceramic. When the sliding film is used for a sliding portion of a camera mount, plastic such as resin or metal such as brass is used.
- the film forming chamber section 30 is provided with a plate-shaped holder 31 that faces the outlet of the filter section 20, and base materials 32 and 33 are set on the surface of the holder 31.
- the holder 31 can be rotated around its rotation axis by a motor 35.
- An arbitrary bias can be set to the holder 31 by a power source 37.
- an appropriate negative voltage corresponding to the composition ratio of the target ta-C film ratio of sp 3 -C to sp 2 -C
- a ta-C film having an arbitrary composition ratio can be formed with high efficiency.
- the member which has the above sliding films is also provided.
- the sliding film of the present embodiment can be used for members or parts for various purposes from the viewpoint of high wear resistance, good slidability and electrical conductivity (low electrical resistance) of the sliding film.
- it is suitable for a member that slides relative to another member, or a member that connects or couples to another member while sliding relative to the other member.
- It is also suitable for a pair of members that slide relative to each other, or a member set or kit that connects or couples while sliding relative to each other.
- the lens unit is suitable for a mount member on the lens unit side and / or a mount member on the camera body side of the camera that can be detached from the camera body.
- the camera 40 includes a camera body 41 and an interchangeable lens 42 that are detachable from each other.
- Each of the camera body 41 and the interchangeable lens 42 includes a bayonet mount (hereinafter referred to as “mount” as appropriate).
- a claw portion 53 protrudes from the male mount 52 of the interchangeable lens 42.
- the female mount 51 of the camera body 41 is provided with an insertion portion 54 into which the claw portion 53 of the male mount 52 is inserted, and a locking portion 55 to which the claw portion 53 is locked.
- One or both of the claw portion 53 and the locking portion 55 is provided with a locking mechanism (not shown) using an elastic member or the like.
- the claw portion 53 of the male mount 52 is inserted into the insertion portion 54 of the female mount 41, and the contact surface 56 of the male mount 52 is placed on the receiving surface 57 of the female mount 41.
- the interchangeable lens 42 is rotated with respect to the camera body 41. At this time, the contact surface 56 and the receiving surface 57 slide in a state of contacting each other. Thereafter, the mounting is completed by further rotating and locking the claw portion 53 of the male mount 52 to the locking portion 55 of the female mount 51. At this time, the surface of the nail
- the sliding film 50 of the present embodiment is formed on the surface of the base member 60 having the shape of each mount 51, 52.
- the substrate 60 is made of metal, resin, ceramics, etc., and is typically made of brass.
- the sliding film 50 may be a multilayer film formed by depositing a plurality of coating layers on the surface of the substrate 60 with sufficient adhesive force by the FCVA method described above. In the case of a multilayer film, the uppermost layer is the sliding film of this embodiment.
- a camera body and / or a lens unit as shown in FIGS. 4 and 5 are also included in this embodiment.
- the lens unit side mounting member and / or the camera body side mounting member are not limited to the bayonet type but may be a screw type.
- Examples 1-8 An example in which a conductive sliding film is formed using the FCVA film forming apparatus 1 as shown in FIG. 3 will be described below.
- a sintered graphite target containing 2.15 [at%] Ti was used as the target 11 containing a metal element, and a ta-C: Ti film (titanium-doped tetrahedral amorphous carbon film) was formed on the substrate surface.
- the sintered graphite target used was dehydrated.
- the ta-C: Ti film the same conditions except that the type of base material is used properly.
- a ta-C: Ti film was formed in several steps. Specifically, a SiO 2 glass substrate was used as the base material to measure the thin film resistivity, a brass camera mount member was used when evaluating the wear resistance, and a Si substrate was used otherwise.
- the arc current of the vacuum arc power source (cathode side power source) in the arc plasma generation unit 10 is 50 A
- the filter The current (filter current) of the double bend electromagnet coil 21 in the unit 20 is 13A
- the current of the anode side power source (anode current) in the arc plasma generation unit 10 is 8A
- the voltage (duct voltage) of the ion scanning coil 25 is 0.2V. It was.
- the bias power supply voltage and the bias voltage (actual bias voltage) actually applied to the substrate at a frequency of 1500 Hz the values shown in FIG. 4 were used for Examples 1 to 8, respectively.
- the discharge was performed by repeating the discharge for 600 seconds 5 times.
- the film formed on the Si substrate in each example as described above was measured by Rutherford backscattering method, and carbon (C), titanium (Ti), oxygen (O), and hydrogen ( The content of H) was determined. The results are shown in the table of FIG. In the films of Examples 1 to 8, the hydrogen content was 0.1 to 0.4 [at%]. However, the target 11 does not contain hydrogen and the target is dehydrated. For example, this is considered to be hydrogen (background) derived from the measuring device.
- the ratio of sp 2 -C bonds (hybrid orbitals) and sp 3 -C bonds (hybrid orbitals) of carbon contained in the film was analyzed by X-ray photoelectron spectroscopy.
- the results are shown in the table of FIG.
- the sp 3 -C bond is 53 at% to 73 at% with respect to the total carbon bond (sp 2 -C + sp 3 -C), and the films obtained in Examples 1 to 8 are It can be seen that this is tetrahedral amorphous carbon.
- Example 9 A sintered graphite target containing 2.15 [at%] of Ti as a target 11 containing a metal element was used without dehydration, and the operating conditions of the FCVA film forming apparatus 1 were changed to the values shown in FIG. A film was formed in the same manner as in Example 1. A film having a film thickness of 365 [nm] was formed on the substrate at a film formation rate of 0.12 [nm / s].
- FIG. 9 shows the chemical composition in the depth direction of the film obtained in this example.
- the horizontal axis represents the depth from the film surface to the film thickness direction
- the vertical axis represents the atomic ratio (composition). From this measurement result, it can be seen that the composition ratio of each element is substantially constant in the depth direction of carbon C, titanium Ti, and oxygen O contained in the film. The reason why oxygen is contained in the film obtained in this example is considered that the target used was not dehydrated.
- Comparative Example 1 Example 1 except that a sintered graphite target not containing Ti was used as the target 11 containing a metal element, and the operating conditions (bias voltage) of the FCVA film forming apparatus 1 were changed to the conditions shown in FIG. Thus, a film having a thickness of 300 nm was formed.
- the film formed on the Si substrate as described above was analyzed by Rutherford backscattering method, and it was found that the carbon contained in the film was 99.9 at% (see the table in FIG. 7).
- the ratio of the sp 2 -C bond and the sp 3 -C bond of carbon contained in the film was analyzed with respect to the obtained film by X-ray photoelectron spectroscopy.
- the sp 3 —C bond was 84 at% with respect to the total carbon bond (sp 2 —C + sp 3 —C)
- the film obtained in Comparative Example 1 Hederal amorphous carbon (ta-C). Note that the composition of the film obtained in Comparative Example 1 appears on the line connecting sp 2 -C and sp 3 -C in the phase diagram of FIG.
- Comparative Example 2 An amorphous carbon film was formed to a thickness of 300 nm on a substrate heated to 400 ° C. by ion plating using benzene vapor (C 6 H 6 ) as a raw material. As will be described later, in order to evaluate hardness and elastic modulus, film composition, friction coefficient, etc., respectively, except for using different types of base materials in the same manner as in Example 1, the film was divided into multiple times under the same conditions. did.
- the film formed on the Si substrate as described above was measured by Rutherford backscattering method, and it was found that carbon contained in the film was 99.6 at% and hydrogen was 0.4 at% (see FIG. (See Table 7).
- the ratio of the sp 2 —C bond and the sp 3 —C bond of carbon contained in the film was analyzed by infrared spectroscopy for the obtained film.
- the sp 2 —C bond is 85.2 at% relative to the total carbon bond (sp 2 —C + sp 3 —C)
- the film obtained in Comparative Example 2 is amorphous. It can be seen that it is carbon (ta-C).
- the composition of the film obtained in Comparative Example 2 was expressed as IP a-C in the phase diagram of FIG.
- Comparative Example 3 A film was formed using an ion plating apparatus in the same manner as in Comparative Example 2 except that the temperature of the substrate was changed to 200 ° C.
- the film formed on the Si substrate was measured by Rutherford backscattering method, and the carbon contained in the film was 75.2 at% and hydrogen was 24.8 at%.
- Analysis for the percentage of sp 2 -C bond and sp 3 -C bonds of carbon by X-ray photoelectron spectroscopy is contained in the film, as shown in the table of FIG.
- Comparative Example 4 A carbon film was formed to a thickness of 300 nm on a substrate heated to 100 ° C. by plasma CVD using methane gas (CH 4 ) as a raw material. As will be described later, in order to evaluate hardness and elastic modulus, film composition, friction coefficient, etc., respectively, except for using different types of base materials in the same manner as in Example 1, the film was divided into multiple times under the same conditions. did.
- the film formed on the Si substrate as described above was measured by Rutherford backscattering method, and it was found that carbon contained in the film was 58.8 at% and hydrogen was 41.2 at% (see FIG. (See Table 7).
- the ratio of the sp 2 —C bond and the sp 3 —C bond of carbon contained in the film was analyzed by X-ray photoelectron spectroscopy for the obtained film.
- the sp 3 —C bond is 78 at% relative to the total carbon bond (sp 2 —C + sp 3 —C)
- the film obtained in Comparative Example 4 is a hydrogenated amorphous film. It turns out that it is carbon (aC: H).
- the composition of the film obtained in Comparative Example 2 is represented as PECVD aC: H in the phase diagram of FIG.
- the films obtained in Examples 1 to 9 and Comparative Examples 1 to 4 were measured for physical properties such as thin film resistivity, hardness and elastic modulus, and friction coefficient as follows.
- thin film resistivity thin film resistivity is, SiO 2 glass substrate to form the ta-C: was measured by a film of the Ti film such as a four-terminal method. The measured values are shown in the table of FIG.
- the thin film resistivities of the films obtained in Examples 1 to 9 are all 1 ⁇ 10 ⁇ 4 to 1 ⁇ 10 ⁇ 3. [ ⁇ cm].
- the ta-C film not doped with the metal element (Comparative Example 1) had a high thin film resistivity on the order of 1 ⁇ 10 8 [ ⁇ cm]. From this, it is understood that a ta-C: M film having good conductivity can be formed by using a graphite target containing a metal or metal carbide as a raw material and forming a film by the FCVA method.
- the hardness and elastic modulus were measured at a plurality of sampling positions by a nano-indentation method on a ta-C: Ti film formed on a Si substrate.
- the measured hardness and elastic modulus of the films of Examples 1 to 9 and Comparative Examples 1 to 4 are shown in the table of FIG. It can be seen that the hardnesses of the films of Examples 1 to 8 are in the range of 11 to 13 [GPa] and the elastic modulus is in the range of 120 to 153 [GPa].
- the hardness of a conventionally used metallic chromium film based on brass is about 8 [GPa]. Therefore, the ta-C: Ti film produced by the production method of the embodiment of the present invention is considerably higher than the conventional metal chromium film, and the films of Examples 1 to 8 have a hardness about 1.5 times higher. confirmed.
- membrane of Example 9 and the comparative example 1 is shown in the graph of FIG.
- the horizontal axis represents time
- the vertical axis represents the dynamic friction coefficient.
- the average value of the dynamic friction coefficient was obtained in the same manner as described above using SUS420J2 balls.
- SUS304 balls and SUS420J2 balls were used to determine the average value of the dynamic friction coefficient in the same manner as described above, which were 0.07 and 0.065, respectively.
- the dynamic friction coefficient obtained using SUS420J2 balls is smaller than the dynamic friction coefficient obtained using alumina balls).
- the phase diagram of FIG. 2 shows the dynamic friction coefficient ranges of the films obtained in Comparative Examples 1 to 4 and the tetrahedral amorphous carbon films having various compositions.
- Amorphous carbon that does not contain hydrogen (aC or ta-C) has a smaller dynamic friction coefficient than hydrogenated amorphous carbon (aC: H), and among amorphous carbons that do not contain hydrogen, the dynamic friction of tetrahedral amorphous carbon It can be seen that the coefficient of dynamic friction decreases as the coefficient decreases and the proportion of sp 3 —C bonds increases.
- Example and Comparative Example 1 Heat resistance About the film
- the heat resistance was as high as 850 ° C. due to the structure of tetrahedral amorphous carbon, whereas Comparative Examples 2 to 4 were less than 700 ° C., less than 400 ° C., and less than 300 ° C., respectively. Met.
- FIG. 9 An appearance photograph of the ta-C: Ti film obtained in Example 9 is shown in FIG. As evidenced by the high conductivity of 1 ⁇ 10 ⁇ 3 [ ⁇ cm], it was a highly reflective film having a metallic luster attributed to free electrons, equivalent to a metal thin film. The films of Examples 1 to 8 had the same metallic luster. On the other hand, the ta-C film obtained in Comparative Example 1 was transparent, and an interference color corresponding to the film thickness was observed.
- Examples 10-14 A ta-C: Ti film having a different Ti / C atomic ratio was formed in the same manner as in Example 1 except that the operating conditions of the FCVA apparatus were changed to the values shown in the table of FIG.
- the Ti / C atomic ratio of the obtained film is shown in the table of FIG.
- the atomic ratio (at%) in the Ti film is also shown.
- the volume resistivity, hardness and dynamic friction coefficient of the obtained ta-C: Ti film were measured in the same manner as in Examples 1 to 9, and the results are shown in the table of FIG.
- the physical properties of the films obtained in Examples 6 and 9 are also shown in the table of FIG.
- the doping amount of the metal element may be increased to increase the conductivity (decrease the resistivity).
- the volume resistivity decreases as the Ti doping amount increases, but the hardness decreases and the dynamic friction coefficient increases. For this reason, it turns out that it is necessary to balance electrical conductivity, hardness, and a dynamic friction coefficient moderately.
- the Ti content should be 25 at% or less to maintain a suitable conductivity. It turns out that it is excellent in abrasion resistance.
- the ta-C Ti film of the example has wear resistance based on high hardness equivalent to the ta-C film, and good slidability based on a low coefficient of friction.
- it has a good electrical conductivity capable of transmitting electrical signals and a metallic luster that suitably ensures the appearance quality. That is, the present inventors succeeded in realizing a novel conductive sliding film (conductive hard low friction coefficient thin film) that has been considered to be difficult to achieve at the same time because of contradictions.
- a member having such a conductive sliding film formed on the surface has high appearance quality due to metallic luster and can maintain long-term appearance quality due to high wear resistance.
- the connection member formed on the connection surface that is connected by sliding relative to the connection surface of other members is easy to engage and disengage due to good slidability, and repeatedly engages and disengages with relative sliding. However, wear can be suppressed due to high wear resistance.
- the conductive sliding film is formed on the surface of the base material made of a metal material, a high hardness that cannot be realized with a metal film while easily forming a complicated structure and a high-precision connection part.
- a connecting member having a connecting surface can be obtained.
- a connecting member having a high hardness and conductive connecting surface that cannot be realized with a resin part can be easily and It can be provided at low cost.
- the connecting member is composed of a first connecting member and a second connecting member that are slidably connected to each other so as to be freely disengaged.
- the structure that is mechanically connected and electrically connected is large by suitably utilizing the characteristics of high hardness, low friction coefficient, and conductivity realized by the conductive sliding film of the above embodiment. You can enjoy the effect.
- a body-side mount member, a lens-side mount member, an accessory shoe (bracket) etc. that engages and disengages a flash in a camera system configured such that the lens unit can be attached to and detached from the camera body has a good appearance quality. And representative of the most preferred applications.
- the conductive sliding film of the above embodiment can be implemented by the FCVA method, which is a dry process and does not use chemical substances harmful to the human body in the film forming process. Therefore, a conductive sliding film can be produced without giving a load to the environment.
- the resistivity is in the range of 10 2 to 10 ⁇ 4 [ ⁇ cm] and the surface hardness is 10 to 30 on various substrates such as metal materials, resin materials, and inorganic materials.
- a conductive sliding film having a required composition in the range of [GPa] can be formed with high efficiency.
- the resistivity is in the range of 10 ⁇ 2 to 10 ⁇ 4 [ ⁇ cm]
- the surface hardness is in the range of 10 to 30 [GPa]
- the dynamic friction coefficient is less than 0.15. It is possible to provide a conductive sliding film having the characteristics as described above.
- titanium is shown as an example of the metal doping element M of ta-C: M.
- the metal doping element is electrically conductive in a film based on ta-C.
- Other metal elements such as Ni, Cr, Al, Mg, Cu, Fe, Ag, Au, and Pt may be used.
- a mount of a system camera in which the lens unit is detachable from the camera body is illustrated.
- the present invention is not limited to such a form, and can be applied to a wide range of uses.
- electrical connectors, slip rings, connecting devices, exterior members of devices such as cameras and mobile phones, and the like can be obtained.
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Abstract
Description
本発明に用いられるテトラヘドラルアモルファスカーボンについて説明する。図2にsp3結合からなる炭素(sp3-C)、sp2結合からなる炭素(sp2-C)、Hの三成分(三元)系からなる炭素-水素組成状態図を示す。図において、三角形の各辺に付記した数値は、下辺が水素Hの組成比、右辺はsp3-Cの組成比(濃度)、左辺はsp2-Cの組成比(濃度)である。また、図中のPECVDはメタンを原料とするプラズマCVD法、IPはベンゼンを原料としたイオンプレーティング法を意味し、それらの方法で製造された炭素-水素組成が図中に四角で示されている。
テトラヘドラルアモルファスカーボンにドープする金属として、摺動膜の耐摩耗性、摺動性及び導電性、特に導電性という観点からすれば、Ti、Ni、Cr、Al、Mg、Cu、Fe、Ag、Au、Pt等が挙げられる。このうち、Ti、Cr、Ni、Feが好ましい。金属の摺動膜中の含有量(ドープ量)は、摺動膜の耐摩耗性、摺動性及び導電性を適度に維持するためには、1~33at%、特に1~20at%が望ましい。含有量が1at%未満であると導電性が不十分であり、摺動膜の電気抵抗が高くなる。含有量が20at%を超えると、摺動膜の硬度が低下して耐摩耗性が悪化する傾向にある。
本発明の実施形態に従う摺動膜は、抵抗値が102~10-4[Ωcm]、特に10-2~10-4[Ωcm]、さらには10-3~10-4[Ωcm]の範囲の値を達成している。このため、例えば、オートフォーカスなどのレンズの自動制御可能なカメラのマウントにこの摺動膜を用いることにより、レンズ部とカメラボディとの間での電気信号の通信を摺動膜を介して行うことができる。また、このようなカメラのマウントに用いる場合には、ユーザによってはレンズ部やストロボなどをカメラボディから頻繁に着脱することがあり、このような着脱を繰り返すことにより、マウントの摺動部に設けられた摺動膜が剥がれることがある。しかし、そのような剥がれが生じると、前述の摺動膜を通じたレンズ部とカメラボディとの導通ができなくなってしまう。それゆえ、摺動膜の耐摩耗性や硬度も必要である。また、レンズ部をカメラボディから着脱するのはユーザの手作業であるために、摺動膜を介したレンズ部とカメラボディとの間の着脱はスムーズに行われる必要があり、このため摺動膜の動摩擦を低下することも必要である。このように、カメラのマウントに使用される摺動部には、i)低い電気抵抗値、ii)適度な硬さ(耐摩耗性)及びiii)低い動摩擦係数が同時に要求されている。しかし、電気抵抗値を下げるためには金属ドープ量を増やすと、硬度が低下して膜が剥がれやすくなる。一方、硬度をあまり高くすると、動摩擦係数も高くなり、摺動性が低下する。このため、カメラのマウントの摺動膜には、上記3つの特性をバランスよく満たす必要がある。
基材上に導電性摺動膜を形成する成膜方法の一例として、FCVA(Filtered Cathodic Vacuum Arc)法及びその方法を実施する成膜装置1の概要構造を図3を参照しながら説明する。
本実施形態によれば、上記のような摺動膜を有する部材もまた提供される。本実施形態の摺動膜は、摺動膜の有する高い耐摩耗性、良好な摺動性及び導電性(低い電気抵抗)という観点から様々な用途の部材または部品に使用することができるが、特に、他の部材に相対して摺動する部材や、他の部材に相対して摺動しながら他の部材に接続または結合する部材に好適である。また、相対して摺動し合う一対の部材やまたは相対して摺動しながら互いに接続または結合する部材セットやキットにも好適である。特に、レンズユニットがカメラボディから着脱可能なカメラのレンズユニット側のマウント部材及び/またはカメラボディ側のマウント部材に好適である。それらのマウント部材について図4及び5(a)及び(b)を参照しながら簡単に説明する。カメラ40は、互いに着脱可能なカメラボディ41と交換レンズ42を有する。カメラボディ41と交換レンズ42とはそれぞれバヨネット式マウント(以下、適宜「マウント」という)を備える。交換レンズ42の雄マウント52には爪部53が突出して設けられる。カメラボディ41の雌マウント51には、雄マウント52の爪部53が挿入される挿入部54と、爪部53が係止される係止部55とが設けられている。爪部53及び係止部55の一方又は双方には、弾性部材等を利用した係止機構(不図示)が設けられている。
以下に、本発明の導電性摺動膜及びそれを用いた部材の製造方法を記載するが、本発明はそれらの実施例に限定されるものではない。
図3に示すようなFCVA成膜装置1を用いて導電性摺動膜を形成した実施例を以下に示す。本実施例では、金属元素を含むターゲット11としてTiを2.15[at%]含有した焼結グラファイトターゲットを用い、基材表面にta-C:Ti膜(チタンドープテトラヘドラルアモルファスカーボン膜)を作製した。なお、焼結グラファイトターゲットは脱水処理したものを用いた。後述するように、ta-C:Ti膜の薄膜抵抗率、硬度及び弾性率、膜の組成、摩擦係数及び耐摩耗性などを個別に評価するため、基材の種類を使い分けた以外は同じ条件で複数回に分けてta-C:Ti膜を形成した。具体的には、基材は、薄膜抵抗率を測定するためにSiO2ガラス基板を用い、耐摩耗性を評価するときに真鍮のカメラマウント部材を用い、それ以外はSi基板を用いた。
金属元素を含むターゲット11としてTiを2.15[at%]含有した焼結グラファイトターゲットを脱水処理せずに用い、FCVA成膜装置1の運転条件を図7に示した値に変更した以外は、実施例1と同様にして成膜した。基材上に成膜速度0.12[nm/s]で、膜厚365[nm]の膜が形成された。
金属元素を含むターゲット11としてTiを含有していない焼結グラファイトターゲットを用い、FCVA成膜装置1の運転条件(バイアス電圧)を図7に示した条件に変更した以外は、実施例1と同様にして膜厚300nmの膜を成膜した。
ベンゼン蒸気(C6H6)を原料としてイオンプレーティング法により、400度に加熱した基板上にアモルファスカーボン膜を膜厚300nmとなるように成膜した。後述するように、硬度及び弾性率、膜の組成、並びに摩擦係数などをそれぞれ評価するため、実施例1と同様に基材の種類を使い分けた以外は、同じ条件で複数回に分けて成膜した。
基板の温度を200℃に変更した以外は、比較例2と同様にしてイオンプレーティング装置を用いて成膜した。Si基板上に形成した膜について、ラザフォード後方散乱法により測定し、膜中に含まれている炭素が75.2at%、水素が24.8at%であった。X線光電子分光により膜中に含まれている炭素のsp2-C結合とsp3-C結合の割合について分析したところ、図7の表中に示すように、sp2-C結合は炭素の結合全体(sp2-C+sp3-C)に対して83at%であり、さらに水素を24.8%含有するので、比較例3で得られた膜は、水素化アモルファスカーボン(a-C:H)であることが分かる。
メタンガス(CH4)を原料とするプラズマCVD法により、100℃に加熱した基板上に炭素膜を膜厚300nmとなるように成膜した。後述するように、硬度及び弾性率、膜の組成、並びに摩擦係数などをそれぞれ評価するため、実施例1と同様に基材の種類を使い分けた以外は、同じ条件で複数回に分けて成膜した。
薄膜抵抗率(体積抵抗率)は、SiO2ガラス基板上に形成したta-C:Ti膜等の膜を四端子法により測定した。測定値を図8の表に示す。実施例1~9で得られた膜の薄膜抵抗率は、いずれも1×10-4 ~1×10-3
[Ωcm]であった。金属元素がドープされていないta-C膜(比較例1)は、薄膜抵抗率が1×108[Ωcm]オーダーの高い値であった。このことから、金属あるいは金属炭化物を含有させたグラファイトターゲットを原料とし、FCVA法により成膜することによって、良好な導電性を有するta-C:M膜が形成されることが理解される。
硬度及び弾性率は、Si基板上に形成したta-C:Ti膜をナノインデンテーション(nanoindentation)法により複数のサンプリング位置で測定した。測定された実施例1~9及び比較例1~4の膜の硬度及び弾性率を図8の表に示した。実施例1~8の膜の硬度が11~13[GPa]の範囲にあり、弾性率が120~153[GPa]の範囲にあることが分かる。なお、参考のため、従来用いられてきた真鍮を基材とする金属クロム膜の硬度はおよそ8[GPa]程度である。従って、本発明の態様の製造方法により作製されたta-C:Ti膜は、従来の金属クロム膜よりかなり高く、実施例1~8の膜では1.5倍程度の高い硬度を有することが確認された。
次に、Si基板上に形成された実施例1~9及び比較例1~4の膜について摩耗特性を、ボールオンディスク法により測定した。測定にはアルミナボールを使用し、荷重200[gf]、回転半径2[mm]、回転数100[rpm]とした。実施例1~9及び比較例1~4の膜について、動摩擦係数の時間に対す得る平均値を求め、図8の表中に示した。この測定結果から、実施例1~9の膜はいずれも動摩擦係数が0.08(0.1未満)であり、実施例のta-C:Ti膜が、ta-C膜より更に低い摩擦係数であること、すなわち良好な摺動性を有していることがわかる。なお、図10のグラフに、実施例9及び比較例1の膜について動摩擦係数の測定結果を示す。図10のグラフにおいて、横軸は時間、縦軸は動摩擦係数である。比較例2から4で得られた膜については、SUS420J2ボールを用いて上記と同様にして動摩擦係数の平均値を求めた。比較のために実施例6の膜について、アルミナボールに加え、SUS304ボール及びSUS420J2ボールを用いて上記と同様にして動摩擦係数の平均値を求めたところ、それぞれ0.07及び0.065であった(SUS420J2ボールを用いて得られる動摩擦係数はアルミナボールを用いて得られる動摩擦係数よりも小さい)。図2の状態図には、比較例1~4で得られた膜及び種々の組成のテトラヘドラルアモルファスカーボン膜の動摩擦係数の範囲について表されている。水素を含まないアモルファスカーボン(a-Cまたはta-C)は水素化アモルファスカーボン(a-C:H)よりも動摩擦係数が小さく、水素を含まないアモルファスカーボンの中でも、テトラヘドラルアモルファスカーボンの動摩擦係数が小さく、sp3-C結合の割合が増えると動摩擦係数が小さくなることが分かる。
Si基板上に形成された実施例1~9及び比較例1~4の膜について、ボールオンディスク法により摺動耐久性を測定した。SUS420J2ボールを使用し、荷重1000[gf]、回転半径2[mm]、回転数100[rpm]の条件下、膜剥離に至る時間を計測した。結果を図8の表に示す。FCVA法を用いて製造した実施例1~8及び比較例1の摺動膜については20000秒以上であったが、別の方法を用いて製造した比較例2~4の膜は、1300秒未満であり、特に、比較例3及び4の水素化アモルファスカーボン膜の摺動耐久性は劣っていた。
実施例及び比較例で得られた膜について内部応力を測定した。内部応力は、触針式表面形状測定器を用いて成膜前後の基板の曲率半径をそれぞれ計測し、基板のヤング率等から算出した。結果を図8の表に示す。表中、内部応力の符号が負になっているのは、応力が圧縮応力であることを示す。実施例1~8で得られたta-C:Ti膜は比較例1で得られたta-C膜と比較して圧縮応力が小さいので、機械的な耐久性が要求される用途により適している。
実施例及び比較例で得られた膜について、耐熱性を昇温脱離法により評価した。実施例および比較例1ではテトラヘドラルアモルファスカーボンの構造に起因して耐熱性が850℃と高かったのに対して、比較例2~4はそれぞれ、700℃未満、400℃未満、300℃未満であった。
FCVA装置の運転条件を図11の表に示したような値にした以外は、実施例1と同様にして異なるTi/C原子比率のta-C:Ti膜を形成した。得られた膜のTi/C原子比率を図11の表に示す。なお、Tiの膜中の原子比(at%)も併せて表記した。また、得られたta-C:Ti膜の体積抵抗率、硬度及び動摩擦係数について実施例1~9と同様にして測定し、結果を図11の表に示す。なお、参考のため、実施例6及び9で得られた膜の各物性についても図11の表に示した。
次にカメラのバヨネットの摺動膜としての性能を以下のようにして評価した。実施例6、9及び10~14におけるFCVA装置の運転条件で、ta-C::Ti膜を真鍮製のレンズ側のマウント及びカメラボディ側のマウント上に、それぞれ膜厚2ミクロンで摺動膜を成膜した。また、比較例として、真鍮製のレンズ側のマウント及びカメラボディ側のマウント上に六価クロムメッキ法により金属Cr膜を膜厚4ミクロンで成膜したものを用意した(比較例5)。これらをカメラボディ及びレンズユニット(交換レンズ)に取り付けて着脱を繰り返す実機テストを行い、皮膜が完全に剥離して基材が露出するまでの着脱回数を計数した。結果を図11の表中に示す。この結果から、比較例5の従来の金属Cr膜と比較して、実施例のta-C:Ti膜は、遥かに高い耐摩耗性を有していることが確認できる。特に、硬度が10~30GPaであり且つ動摩擦係数が0.15未満であると、レンズユニットのカメラボディに対する着脱が5000回を超える耐久性を有することが分かる(実施例6、10~12)。カメラのレンズユニットとボディユニットとは電導性が必要であるので、導電率を上げる(抵抗率を下げる)には金属元素のドープ量を増やせばよい。しかし、図11の表から分かるように、Tiのドープ量が増すと体積抵抗率は低下するが、硬度が低下して動摩擦係数が増加する。このため、導電率、硬度及び動摩擦係数を適度にバランスする必要があることが分かる。このような特性が要求されているカメラのマウント用の摺動膜としては、ドープする金属がTiの場合には、Tiの含有量が25at%以下にすることで、好適な導電率を維持しつつ耐摩耗性に優れることが分かる。
10 アークプラズマ生成部
11 ターゲット
20 フィルタ部
21 ダブルベンド電磁石コイル
23 ダクト
25 イオンスキャン用コイル
30 成膜チャンバ部
31 ホルダ
32,33 基材
40 カメラ
41 カメラボディ
42 交換レンズ
50 導電性摺動膜
51 雌マウント
52 雄マウント
Claims (16)
- 相対摺動する部材の表面に施される導電性摺動膜であって、
前記導電性摺動膜は、金属がドープされたテトラヘドラルアモルファスカーボンから形成されており、該導電性摺動膜の抵抗率が102~10-4[Ωcm]の範囲にある導電性摺動膜。 - 前記導電性摺動膜の表面硬度が10~30[GPa]の範囲にある請求項1に記載の導電性摺動膜。
- 前記金属がチタンであり、当該チタンの含有率が1~25[at%]である請求項2に記載の導電性摺動膜。
- 前記チタンの含有率が1~20[at%]である請求項3に記載の導電性摺動膜。
- 抵抗率が10-2~10-4[Ωcm]の範囲にあり、表面硬度が10~30[GPa]の範囲にあり、且つ動摩擦係数が0.15未満である請求項1に記載の導電性摺動膜。
- フィルタードカソーディックバキュームアーク法により形成された請求項1に記載の導電性摺動膜。
- 請求項1~6のいずれか一項に記載の導電性摺動膜が表面に施された部材。
- 請求項1~6のいずれか一項に記載の導電性摺動膜が、他の部材の接続面と相対摺動して接続される接続面に形成された部材。
- 前記部材は、金属材料により形成された基材の表面に前記導電性摺動膜が形成されてなる請求項7に記載の部材。
- 前記部材は、相対摺動して接続する第1接続部材及び第2接続部材の少なくとも一方であり、
前記第1接続部材の接続面と前記第2接続部材の接続面とが相対摺動して係合接続されたときに、前記第1接続部材と前記第2接続部材とが機械的に接続されるとともに、電気的に接続される請求項7に記載の部材。 - カメラボディに対してレンズユニットが着脱交換可能に構成されたカメラシステムに用いられるボディ側及び/またはレンズ側のマウント部材であって、
基材と、
前記基材上に形成された導電性摺動膜とを有し、
該導電性摺動膜は、金属がドープされたテトラヘドラルアモルファスカーボンから形成され且つ、10-2~10-4[Ωcm]の抵抗率、10~30[GPa]の表面硬度、及び0.15未満の動摩擦係数を有するカメラ用マウント部材。 - 前記金属がチタンであり、当該チタンの含有率が1~33[at%]である請求項11に記載のマウント部材。
- 請求項11または12に記載のマウント部材が設けられたカメラボディ。
- 請求項11または12に記載のマウント部材が設けられたレンズユニット。
- 相対摺動する部材を真空チャンバ内に設置し、
金属または金属炭化物を含有させたグラファイトターゲットを原料とし、
フィルタードカソーディックバキュームアーク法により、前記部材の表面に、導電率が102~10-4[Ωcm]の範囲にあり、表面硬度が10~30[GPa]の範囲にある金属ドープテトラヘドラルドープアモルファスカーボンの導電性摺動膜を形成する導電性摺動膜の製造方法。 - 前記グラファイトターゲットが水素を実質的に含まない請求項15に記載の導電性摺動膜の製造方法。
Priority Applications (6)
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EP11777486.9A EP2568059B1 (en) | 2010-05-07 | 2011-05-06 | Member formed from conductive sliding film |
KR1020127029092A KR20130069621A (ko) | 2010-05-07 | 2011-05-06 | 도전성 슬라이딩막, 도전성 슬라이딩막이 형성된 부재 및 그 제조 방법 |
BR112012028564A BR112012028564A2 (pt) | 2010-05-07 | 2011-05-06 | película condutora deslizante, membro formado de película condutora deslizante e método para produzir a mesma |
CN201180023017.3A CN102884221B (zh) | 2010-05-07 | 2011-05-06 | 导电性滑动膜、形成有导电性滑动膜的部件及其制造方法 |
JP2012513835A JP5842814B2 (ja) | 2010-05-07 | 2011-05-06 | カメラ用マウント部材 |
US13/666,523 US20130058640A1 (en) | 2010-05-07 | 2012-11-01 | Conductive sliding film, member formed from conductive sliding film, and method for producing same |
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EP (1) | EP2568059B1 (ja) |
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US9481846B2 (en) | 2013-02-28 | 2016-11-01 | Nikon Corporation | Sliding film, member on which sliding film is formed, and manufacturing method therefor |
WO2014136861A1 (ja) * | 2013-03-06 | 2014-09-12 | 株式会社ニコン | 金属光沢を有する装飾膜を備えた複合部材 |
JP2021123571A (ja) * | 2020-02-07 | 2021-08-30 | 株式会社ニコン | アモルファスカーボン膜を有する部材、及びその製造方法 |
JP2022088909A (ja) * | 2020-12-03 | 2022-06-15 | 日本コーティングセンター株式会社 | 摺接部材、導電性高硬度保護被膜及び摺接部材の製造方法 |
JP7457638B2 (ja) | 2020-12-03 | 2024-03-28 | 日本コーティングセンター株式会社 | 摺接部材、導電性高硬度保護被膜及び摺接部材の製造方法 |
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EP2568059A4 (en) | 2014-01-22 |
EP2568059B1 (en) | 2016-07-06 |
CN102884221B (zh) | 2015-07-22 |
BR112012028564A2 (pt) | 2016-08-02 |
KR20130069621A (ko) | 2013-06-26 |
CN102884221A (zh) | 2013-01-16 |
US20130058640A1 (en) | 2013-03-07 |
EP2568059A1 (en) | 2013-03-13 |
JPWO2011138967A1 (ja) | 2013-07-22 |
JP5842814B2 (ja) | 2016-01-13 |
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