WO2011089931A1 - 分光装置 - Google Patents
分光装置 Download PDFInfo
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- WO2011089931A1 WO2011089931A1 PCT/JP2011/050122 JP2011050122W WO2011089931A1 WO 2011089931 A1 WO2011089931 A1 WO 2011089931A1 JP 2011050122 W JP2011050122 W JP 2011050122W WO 2011089931 A1 WO2011089931 A1 WO 2011089931A1
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- light
- filter
- main surface
- thin film
- dielectric thin
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- 230000003595 spectral effect Effects 0.000 title abstract description 4
- 239000010409 thin film Substances 0.000 claims description 41
- 230000003287 optical effect Effects 0.000 abstract description 20
- 230000010287 polarization Effects 0.000 description 65
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- 230000007246 mechanism Effects 0.000 description 15
- 230000000052 comparative effect Effects 0.000 description 13
- 238000006243 chemical reaction Methods 0.000 description 9
- 238000000926 separation method Methods 0.000 description 9
- 238000001514 detection method Methods 0.000 description 8
- 238000002834 transmittance Methods 0.000 description 8
- 230000004048 modification Effects 0.000 description 5
- 238000012986 modification Methods 0.000 description 5
- 230000002093 peripheral effect Effects 0.000 description 5
- 238000001917 fluorescence detection Methods 0.000 description 4
- 239000013307 optical fiber Substances 0.000 description 4
- 230000005284 excitation Effects 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
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Classifications
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/007—Optical devices or arrangements for the control of light using movable or deformable optical elements the movable or deformable optical element controlling the colour, i.e. a spectral characteristic, of the light
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0235—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using means for replacing an element by another, for replacing a filter or a grating
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
- G01J3/32—Investigating bands of a spectrum in sequence by a single detector
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J2003/1226—Interference filters
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J2003/1226—Interference filters
- G01J2003/1243—Pivoting IF or other position variation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N2021/6417—Spectrofluorimetric devices
- G01N2021/6419—Excitation at two or more wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N2021/6463—Optics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N2021/6463—Optics
- G01N2021/6471—Special filters, filter wheel
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/28—Interference filters
Definitions
- the present invention relates to a spectroscopic device for selecting light in a predetermined wavelength range, and more particularly to a spectroscopic device incorporating a dielectric thin film interference filter.
- a spectroscopic device using an interference filter in which dielectric thin films having different refractive indexes are alternately stacked and an intermediate cavity layer is formed of a dielectric thin film having an intermediate refractive index has been known (the following patents).
- Reference 1 This spectroscopic device has an interference filter provided so as to be rotatable, and the transmission wavelength is continuously changed by changing the incident angle with respect to the interference filter when collimated light is incident on the interference filter.
- a wavelength tunable filter to be realized is known (see Patent Document 2 below). This wavelength tunable filter realizes output of transmitted light having a wider wavelength range by adopting a configuration in which four filters are rotationally symmetrically arranged on a rotary table.
- the wavelength tunable filter including the plurality of filters described in Patent Document 2 described above tends to have a wide transmission wavelength variable range due to interference between the plurality of filters during rotation of the rotary table. This is because if the incident angle to a certain filter is set to be large, the incident light easily interferes with other filters, so that the range of the incident angle with respect to each filter is limited.
- an object of the present invention is to provide a spectroscopic device capable of easily expanding the variable range of the selected wavelength without increasing the size of the device.
- the spectroscopic device of the present invention provides n (n is an integer of 3 or more) dielectric thin film interference that selectively transmits light from a light source in a wavelength range corresponding to the incident angle of light.
- a spectroscopic device comprising a filter and a flat-plate-shaped rotation support member in which a dielectric thin-film interference filter is erected on a main surface and is rotatable around a predetermined point along the main surface.
- Each of the dielectric thin film interference filters has an end surface on the light incident side or light emission side with respect to a line connecting a predetermined point on the main surface of the rotation support member and the center point of the dielectric thin film interference filter on the main surface. It is arranged to be inclined.
- the “dielectric thin film interference filter” refers to a filter whose center wavelength representing the performance of the filter shifts according to the incident angle to the filter.
- a spectroscopic device light is incident along the main surface of the rotation support member from the light source, and the light is selectively thinned in a wavelength range corresponding to the incident angle to the dielectric thin film interference filter.
- the light is transmitted through the interference filter and output.
- the n dielectric thin film interference filters through which light is transmitted can be switched alternately, and each of the n dielectric thin film interference filters can be switched.
- the incident angle of light to the filter can also be changed. As a result, the transmission wavelength can be continuously changed.
- the dielectric thin film interference filter is arranged such that its end face is inclined with respect to a line connecting a predetermined point on the main surface and the center point of the dielectric thin film interference filter, thereby providing a plurality of dielectric thin film interference filters.
- variable range of the selected wavelength can be easily expanded without increasing the size of the apparatus.
- FIG. 1 is a plan view showing a schematic configuration of the light source device according to the first embodiment of the present invention.
- a light source device 1 shown in FIG. 1 is a device used as a light source having a specific light emission wavelength region (for example, a near infrared wavelength region) in various inspection devices such as a semiconductor inspection device.
- the light source device 1 is an aspect of a spectroscopic device that selects a specific wavelength region of light from a light source.
- the light source 3 is mounted on a heat sink 2 as a heat dissipation mechanism, and is irradiated from the light source 3.
- a light conversion optical system 5 that receives light, converts the light, and outputs the light externally via the optical fiber 4, and a control system 30 that controls the light source 3 and the light conversion optical system 5 are configured.
- the X axis is taken in the direction along the optical axis of the light source 3 on the plane of the paper
- the Y axis, the direction perpendicular to the X axis and the Y axis are taken along the direction perpendicular to the X axis on the plane of the paper.
- the Z axis the Z axis.
- the light source 3 is a light source device such as a halogen lamp or a white LED that widely includes a predetermined wavelength range from a visible light component to an infrared component as an emission wavelength range, and is not directed toward the light conversion optical system 5 positioned in the + X axis direction. Polarized diffused light is emitted.
- the light conversion optical system 5 is provided with a collimating lens 6, a wavelength selection element 7, and a filter rotating body 8 in order from the vicinity of the light source 3 along the + X axis direction.
- the diffused light from the light source 3 is converted into parallel light L1 by the collimating lens 6 and enters the wavelength selection element 7.
- the wavelength selection element 7 is an element for selecting light in a predetermined wavelength range (for example, 350 nm to 750 nm) out of the parallel light L1 having the light emission wavelength range of the light source 3 as a wavelength range. It is a dichroic mirror that transmits light in the wavelength range and reflects light outside the wavelength range.
- the wavelength selection element 7 is disposed with its reflection surface inclined with respect to the X axis.
- the wavelength selection element 7 transmits the light L2 having a predetermined wavelength range toward the filter rotating body 8 in the + X-axis direction, and unnecessary light of other wavelength components is unnecessary.
- the light is reflected in the ⁇ Y-axis direction and is lost by the beam damper 9.
- the wavelength range selected by the wavelength selection element 7 includes at least a wavelength variable range of light finally output from the light source device 1 (for example, 400 nm to 700 nm, hereinafter referred to as “assumed wavelength range”). Is set to
- the filter rotating body 8 includes a rotary table (rotary support member) 10 that is a disk-like member rotatably supported by a rotary mechanism 14 having a rotary axis along the Z axis, and a main surface 10 a of the rotary table 10. It is composed of four band-pass filters 11a, 11b, 11c, and 11d that are erected so as to be rotationally symmetric along the periphery.
- band-pass filters 11a, 11b, 11c, and 11d are so-called dielectric thin film interference type having a flat plate shape including a known laminated structure of dielectric thin films between the light incident surface 12 and the light emitting surface 13. It is a filter. With such a structure, the band pass filters 11a, 11b, 11c, and 11d can selectively transmit light in a wavelength range corresponding to the incident angle of light with respect to the light incident surface 12. The material and film thickness of each dielectric thin film are set so that the characteristics of the transmission wavelength region with respect to the incident angle differ among the four band pass filters 11a to 11d.
- the band-pass filter 11a when the incident angle of light with respect to the light incident surface 12 is 0 degree, the band-pass filter 11a has characteristics of a transmission wavelength region having a center wavelength of about 700 nm and a half-value width of several nm, and increases the incident angle. Accordingly, the transmission wavelength region shifts to the short wavelength side, and when the incident angle is 50 degrees, the center wavelength is about 600 nm.
- the bandpass filters 11b, 11c, and 11d have transmission wavelength band characteristics different from those of the bandpass filter 11a having center wavelengths of about 610 nm, about 530 nm, and about 460 nm when the incident angle is 0 degree.
- the peak wavelength decreases as the absolute value of the incident angle increases with reference to the peak wavelength at an incident angle of 0 degree, and the rate of change increases as the absolute value of the incident angle increases.
- the bandpass filters 11 a to 11 d having the above-described configuration are fixed so that the light incident surface 12 and the light emitting surface 13 are substantially perpendicular to the main surface 10 a of the turntable 10.
- the rotational center C 1 of the band-pass filter 11a the central point 15a on the principal surface 10a of ⁇ 11d ⁇ 15d and the main surface 10a lines, respectively, the light incident surface of the band-pass filters 11a ⁇ 11d 12
- the light exit surface 13 is inclined so that the inclination angles are equal to each other.
- the band-pass filters 11a ⁇ 11d is the inclination angle of the light incident surface 12 and the light emitting surface 13 against the line connecting the center point thereof 15a ⁇ 15d in the vicinity and the rotational center C 1 of the center point 15a ⁇ 15d
- rotating shaft members 18a to 18d such as a shaft member and a screw member may be attached.
- the main surface 10a is parallel to the XY plane, it is arranged so that light L2 is incident between the peripheral portion of the rotation center C 1 and the main surface 10a on the principal surface 10a.
- any one of the bandpass filters 11a to 11d can be rotated so as to be positioned on the optical path of the light L2, and the light L2 can be selectively incident, and the incident angle with respect to the bandpass filters 11a to 11d can be made.
- the variable range of the incident angle of each bandpass filter is determined by the beam width of the light L2, the number of bandpass filters, and the shape and arrangement of the bandpass filters.
- the light conversion optical system 5 includes a beam sampler 21, a shutter 22, and a condenser lens 23 in order in the + X-axis direction along the optical axis of the light L ⁇ b> 3 transmitted by the filter rotator 8. It is arranged. A part of the light L3 is reflected by the beam sampler 21 and guided to the power monitor 24 to monitor its light intensity. On the other hand, the light L3 is irradiated to the outside by being guided to the optical fiber 4 through the beam sampler 21, the shutter 22, and the condenser lens 23.
- the control system 30 includes a light source power supply 31 that supplies power to the light source 3, a drive circuit 32 that rotationally drives the rotation mechanism 14, a light source power supply 31, a drive circuit 32, and The control circuit 33 is connected to the power monitor 24.
- a computer terminal 34 is connected to the control circuit 33 so that the light intensity value monitored by the power monitor 24 can be output to the computer terminal 34, and a light source power source is supplied in accordance with a control signal from the computer terminal 34. By adjusting the output of 31, the light amount of the light source 3 can be adjusted.
- the control circuit 33 also has a function of controlling the rotation angle of the rotation mechanism 14 in accordance with a control signal from the computer terminal 34. At this time, the control circuit 33 changes and controls the rotation angle of the rotation mechanism 14 so that the incident angles with respect to the bandpass filters 11a to 11d become a predetermined angle. This rotation angle is determined corresponding to the center wavelength of the light emission wavelength region that is finally output from the light source device 1.
- FIG. 4A shows a case where the incident angle of the band-pass filter 11a is 0 degree. At this time, no other band-pass filter is located on the optical path of the light L2. There is no interference between 11a to 11d.
- FIG. 4B shows a state in which the bandpass filters 11a to 11d are rotated counterclockwise to set the incident angle to the bandpass filter 11a to 25 degrees
- FIG. 4C shows the bandpass filters.
- the state in which the filters 11a to 11d are further rotated counterclockwise to set the incident angle to the bandpass filter 11a to 50 degrees is shown, and in either case, there is no interference between the bandpass filters 11a to 11d.
- Further rotation from the state of FIG. 4C causes the bandpass filter 11b to enter the optical path of the light L2, so that the transmission characteristics of the two bandpass filters 11a and 11b interfere with each other and are stable.
- the emitted light wavelength cannot be obtained. Therefore, in this case, the variable range of the incident angle of each of the bandpass filters 11a to 11d is 0 degree to 50 degrees.
- FIG. 5 shows the wavelength characteristics of the light transmittance when the angle of incidence on the bandpass filters 11a to 11d is changed in the range of 0 to 50 degrees in the present embodiment.
- the characteristics G A , G B , G C , and G D correspond to the wavelength characteristics of the light transmittance corresponding to the change in the incident angle with respect to the band pass filters 11a, 11b, 11c, and 11d, respectively.
- a wide range from about 400 nm to 700 nm is realized as the variable range of the emission wavelength of the light source device 1 by controlling the incident angles relating to the bandpass filters 11a to 11d while switching them.
- the light L2 is incident from the light source 3 along the main surface 10a of the turntable 10, and the light L2 is in a wavelength range corresponding to the incident angles to the bandpass filters 11a to 11d.
- the light is selectively transmitted through the bandpass filters 11a to 11d and output.
- by rotating the rotary table 10 around the rotation center C 1 of the main surface 10a, with the four band-pass filters 11a ⁇ 11d of the light L2 is transmitted may be switched alternately, each of the bandpass
- the incident angle of the light L2 to the filters 11a to 11d can also be changed within a predetermined angle range, and as a result, the emission wavelength can be continuously changed.
- the four band pass filters 11a to 11d are mounted so that the intersecting lines 16a to 16d formed by the main surface 10a and the light incident surface 12 or the light emitting surface 13 are in contact with one inscribed circle 17. Therefore, the variable range of the incident angle of light of each of the bandpass filters 11a to 11d can be made uniform, and the variable range of the emission wavelength can be efficiently widened with respect to the limited area of the rotary table 10. I can do it.
- band pass filters 11a to 11d are respectively located outside the inscribed circle 17 on the main surface 10a, interference between the band pass filters 11a to 11d can be further reduced.
- the four band-pass filters 11a ⁇ 11d, the line connecting the center point 15a ⁇ 15d of the rotational center C 1 and the band-pass filters 11a ⁇ 11d are at an equal angle to each other, the rotation on the main surface 10a since then the center C 1 centered are disposed such that the 4-fold rotational symmetry, the variable range of the incident angle of light of the respective band-pass filters 11a ⁇ 11d can be made uniform, limited turntable The variable range of the emission wavelength can be more efficiently expanded with respect to the area of 10.
- 17 and 18 are plan views showing the structure of a filter rotator as a comparative example of the present invention.
- Filter rotating body 908A shown in FIG. 17 band-pass filters 11a ⁇ 11d width and thickness along the main surface 10a is 10mm, and a 2 mm, the band-pass filters 11a ⁇ 11d, the shortest from the center of rotation C 1 distance 1 mm, an example in which the inclination angle of the light incident surface 12 are arranged such that 0 ° with respect to the line connecting the rotational center C 1 and the center point 15a ⁇ 15d.
- the variable range of the incident angle of the light L2 having a beam diameter of 5 mm is 0 degrees (indicated by the solid line in FIG. 17). The state is limited to 21 degrees (the state indicated by the dotted line in FIG. 17).
- the filter rotating body 908B shown in FIG. 18 (a) shows an example of a case where spread the shortest distance from the rotation center C 1 of the filter rotating body 908A to 5 mm.
- the variable range of the incident angle of the light L2 having a beam diameter of 5 mm is slightly expanded from 0 degree to 27 degrees, but is considerably limited as compared with the filter rotating body 8 of the present embodiment.
- the filter rotating body 908C shown in FIG. 18 (b), the filter rotating body 908A, and change the width and thickness of the band pass filters 11a ⁇ 11d 18 mm, in 2 mm, the shortest distance from the center of rotation C 1 This is an example when the width is expanded to 32 mm.
- the variable range of the incident angle of the light L2 having a beam diameter of 5 mm is expanded to 0 to 39 degrees, but is narrower than the filter rotating body 8 of the present embodiment.
- the diameter of the rotary table 10 of the filter rotating body 908C needs to be considerably increased to about 102 mm as compared with the diameter of the rotary table 10 of the filter rotating body 8 being about 30 mm.
- the incident angle to be assigned per one filter by interference between adjacent filters Restrictions occur.
- the incident angles to the bandpass filters 11a to 11d are in the range of positive and negative angles over 0 degrees (for example, in the case of the filter rotating body 908A, a range of ⁇ 21 degrees)
- the substantial incident angle change amount Becomes half the angle variable range.
- the wavelength component guided from the wavelength selection element 7 to the beam damper 9 is also provided with a wavelength selection mechanism having a similar configuration including a filter rotator and a rotation mechanism, so that two wavelengths in different wavelength regions are provided. Can be output simultaneously.
- the wavelength selecting element 7 is a half mirror, light of two wavelengths can be output simultaneously in the same wavelength region. Furthermore, in this case, it is possible to obtain a multi-wavelength output by appropriately selecting the transmittance of the wavelength selection element 7 and arranging a plurality of stages and providing a wavelength selection mechanism corresponding thereto.
- FIG. 6 is a plan view showing a schematic configuration of the light source device according to the second embodiment of the present invention.
- the difference between the light source device 101 shown in the figure and the light source device 1 according to the first embodiment is that the two filter rotators 8A and 8B having the same configuration as the filter rotator 8 are separated from the light L2.
- the two linearly polarized light components L4 and L5 are transmitted through the filter rotators 8A and 8B as P-polarized light, respectively.
- the polarization separation element 25, the mirrors 26 and 27, the polarization combining element 28, the filter rotators 8A and 8B, and the two filter rotators 8A and 8B are rotated.
- Rotating mechanisms 14A and 14B are provided.
- the polarization separation element 25 is an optical element that receives the light L2 transmitted through the wavelength selection element 7 and separates the light L2 into two linearly polarized light components orthogonal to each other.
- a cube-shaped polarization beam splitter (PBS) It is.
- the polarization separation element 25 separates a polarization component L4 having a polarization direction along the Y axis from the light L2 (hereinafter also referred to as “horizontal polarization component”) and transmits it in the + X axis direction.
- a polarization component L5 having a polarization direction along the Z axis (hereinafter also referred to as “vertical polarization component”) is separated from the light L2 and reflected in the + Y axis direction.
- the filter rotators 8A and 8B are provided on the optical axes of the polarization components L4 and L5 transmitted or reflected by the polarization separation element 25, respectively.
- the bandpass filters 11a to 11d respectively mounted on the filter rotators 8A and 8B have the same transmission wavelength band characteristics with respect to the incident angles of P-polarized light and S-polarized light between the two filter rotators 8A and 8B. Yes. More specifically, the characteristics of the transmission wavelength region are the same between the bandpass filters 11a, the bandpass filters 11b, the bandpass filters 11c, and the bandpass filters 11d mounted on the two filter rotating bodies 8A and 8B. Has been.
- Filter rotating body 8A is mounted so as to extend along the main surface 10a of the turntable 10 in the rotating mechanism 14A having an axis of rotation along the Z-axis in the XY plane, the rotation center C 1 and the main surface on the main surface 10a It is positioned so that the horizontally polarized light component L4 is incident between the peripheral edge portion 10a (see FIG. 2). Thereby, the filter rotating body 8A can change the incident angle of the horizontal polarization component L4 with respect to the bandpass filters 11a to 11d by rotating the rotary table 10, and the horizontal polarization component L4 is changed to the bandpass filters 11a to 11a. It is always incident on 11d in the state of P-polarized light.
- Filter rotating body 8B is mounted to the major surface 10a of the turntable 10 in the rotating mechanism 14B having a rotational axis along the Y-axis so as to extend along the ZX plane, the rotation of the main surface 10a center C 1 and the main surface 10a It is located so that the vertical polarization component L5 may be incident between the peripheral edge portions (see FIG. 2).
- a mirror 26 that totally reflects S-polarized light in the assumed wavelength range is disposed between the polarization separation element 25 and the filter rotator 8B, and reflects the vertical polarization component L5 emitted in the + Y-axis direction in the + X-axis direction. In this way, the light is incident on the filter rotating body 8B.
- the filter rotator 8B can change the incident angle of the vertical polarization component L5 with respect to the bandpass filters 11a to 11d by rotating the rotary table 10, and the vertical polarization component L5 is changed to the bandpass filters 11a to 11a. It is always incident on 11d in the state of P-polarized light.
- the rotation axis of the rotary table 10 is orthogonal between the filter rotator 8A and the filter rotator 8B so as to be incident on the bandpass filters 11a to 11d as P-polarized light.
- the rotation axis may be the same direction, and the polarization plane may be rotated using a ⁇ / 2 plate or the like so as to be incident on the bandpass filters 11a to 11d as P-polarized light.
- the ⁇ / 2 plate is inserted before and after the band pass filter.
- the polarization combining element 28 is disposed in the + X-axis direction along the optical axis of the horizontal polarization component L4 that has passed through the filter rotating body 8A, and the mirror 27 is disposed between the polarization combining element 28 and the filter rotating body 8B.
- the mirror 27 has a role of totally reflecting S-polarized light in the assumed wavelength range and reflecting the vertically polarized component L5 transmitted through the filter rotating body 8B so as to enter the polarization combining element 28 along the ⁇ Y-axis direction.
- the polarization beam combining element 28 is an optical element for combining two polarization components L4 and L5 that are orthogonal to each other.
- a cube-shaped polarization beam splitter PBS
- the polarization beam combiner 28 combines the horizontal polarization component L4 incident along the X axis and the vertical polarization component L5 incident along the Y axis to generate the unpolarized combined light L3. , And emitted in the + X-axis direction.
- a part of the synthesized light L3 synthesized by the polarization synthesizing element 28 is guided to the power monitor 24, and at the same time, guided to the optical fiber 4 through the beam sampler 21, shutter 22, and condenser lens 23. , Irradiated outside.
- the control circuit 33 of the control system 30 is connected to any one of the bandpass filter 11a, the bandpass filter 11b, the bandpass filter 11c, and the bandpass filter 11d that are mounted on the filter rotators 8A and 8B and have the same light transmission characteristics.
- the rotation angles of the rotation mechanisms 14A and 14B are changed and controlled so that the polarization components L4 and L5 are incident and the incidence angles of the polarization components L4 and L5 with respect to the bandpass filters 11a to 11d are the same.
- the filter rotators 8A and 8B are arranged so that the transmission wavelength regions of the polarization components L4 and L5 corresponding to the respective incident angles coincide. Will be. That is, the light components L4 and L5 after passing through the filter rotators 8A and 8B have the same spectral profile.
- the horizontal polarization component L4 separated by the polarization separation element 25 is incident on the filter rotator 8A as P-polarized light
- the vertical polarization component L5 separated by the polarization separation element 25 is the filter rotator.
- the light transmitted through the two filter rotating bodies 8A and 8B is combined and emitted to the outside.
- the incident angle can be set appropriately.
- the polarization directions of the two wavelength outputs are vertical polarization and horizontal polarization, which are orthogonal to each other, but can be made non-polarized using a depolarizer or the like.
- FIG. 7 shows the wavelength characteristics of the light transmittance when the incident angles of the two filter rotators 8A and 8B to the bandpass filters 11a to 11d in the present embodiment are changed in the range of 0 degrees to 50 degrees. Yes.
- the emission intensity characteristics are stabilized in a wide variable wavelength range. It turns out that it becomes possible.
- FIG. 8 is a plan view showing a schematic configuration of a light source device according to the third embodiment of the present invention.
- the difference between the light source device 201 shown in the figure and the light source device 101 according to the second embodiment is that the polarization components L4 and L5 are transmitted through the two filter rotators 8C and 8D as S-polarized light, respectively. is there.
- Filter rotating body 8C is mounted so as to extend along the main surface 10a of the rotary table 10 to the ZX plane rotating mechanism 14C having a rotational axis along the Y-axis, the rotational center C 1 and the main surface on the main surface 10a It is positioned so that the horizontally polarized light component L4 is incident between the peripheral edge portion 10a (see FIG. 2). Thereby, the filter rotating body 8C can change the incident angle of the horizontal polarization component L4 with respect to the bandpass filters 11a to 11d by rotating the rotary table 10, and the horizontal polarization component L4 is changed to the bandpass filters 11a to 11a. It is always incident on 11d in the state of S polarization.
- Filter rotating body 8D is mounted so as to extend along the main surface 10a of the turntable 10 in the rotation mechanism 14D having an axis of rotation along the Z-axis in the XY plane, the rotation of the main surface 10a center C 1 and the main surface 10a It is located so that the vertical polarization component L5 may be incident between the peripheral edge portions (see FIG. 2). Thereby, the filter rotator 8D can change the incident angle of the vertical polarization component L5 with respect to the bandpass filters 11a to 11d by rotating the rotary table 10, and the vertical polarization component L5 is changed to the bandpass filters 11a to 11a. It is always incident on 11d in the state of S polarization.
- the rotation axis of the rotary table 10 is orthogonal between the filter rotator 8C and the filter rotator 8D so as to enter the bandpass filters 11a to 11d as S-polarized light.
- the rotation axis may be the same direction, and the polarization plane may be rotated using a ⁇ / 2 plate or the like so as to be incident on the bandpass filters 11a to 11d as S-polarized light.
- the ⁇ / 2 plate is inserted before and after the band pass filter.
- the control circuit 33 of the control system 30 is connected to any of the bandpass filter 11a, the bandpass filter 11b, the bandpass filter 11c, and the bandpass filter 11d that are mounted on the filter rotators 8C and 8D and have the same light transmission characteristics.
- the rotation angles of the rotation mechanisms 14C and 14D are changed and controlled so that the polarization components L4 and L5 are incident and the incidence angles of the polarization components L4 and L5 with respect to the bandpass filters 11a to 11d are the same.
- the horizontal polarization component L4 separated by the polarization separation element 25 is incident on the filter rotator 8C as S-polarized light
- the vertical polarization component L5 separated by the polarization separation element 25 is the filter rotator.
- the light transmitted through the two filter rotators 8C and 8D is combined and emitted to the outside.
- the incident angle can be set appropriately.
- the polarization directions of the two wavelength outputs are vertical polarization and horizontal polarization, which are orthogonal to each other, but can be made non-polarized using a depolarizer or the like.
- FIG. 9 shows the wavelength characteristics of light transmittance when the incident angles of the two filter rotators 8C and 8D to the bandpass filters 11a to 11d in the present embodiment are changed in the range of 0 degrees to 50 degrees. Yes. Also in this case, the light intensity characteristics are stabilized in a wide variable wavelength range by dividing the light from the light source 3 into two linearly polarized light components and controlling the incident angles of the respective components to the bandpass filters 11a to 11d. It turns out that it becomes possible.
- the present invention is not limited to the embodiment described above.
- the number of band-pass filters mounted on the filter rotator 8 is not limited to a specific number, and an arbitrary number of three or more can be selected according to the assumed wavelength range and the area of the filter rotator 8. Good.
- FIG. 10 shows the structure of the filter rotating body 108 having five band-pass filters 11a to 11e.
- the beam diameter of the light L2 is 5 mm
- the width and thickness along the main surface 10a of the band pass filters 11a to 11e are 10 mm and 2 mm
- the shortest distance R 1 from the rotation center C 1 to the band pass filters 11a to 11e Is 15.3 mm
- the variable ranges of the incident angles of the bandpass filters 11a to 11e are set to 0 degrees to 45 degrees.
- FIG. 11 shows the structure of a filter rotating body 208 having six band-pass filters 11a to 11f.
- the beam diameter of the light L2 is 5 mm
- the width and thickness along the main surface 10a of the band pass filters 11a to 11f are 12 mm and 2 mm
- the shortest distance R 1 from the rotation center C 1 to the band pass filters 11a to 11f is set to 0 degree to 45 degrees.
- FIG. 12 shows the structure of a filter rotating body 308 having three bandpass filters 11a to 11c.
- the beam diameter of the light L2 is 10 mm
- the width and thickness along the main surface 10a of the band pass filters 11a to 11c are 18 mm and 2 mm
- the shortest distance R 1 from the rotation center C 1 to the band pass filters 11a to 11c is set to 0 degree to 50 degrees.
- a filter rotator 908D which is a comparative example of the present invention shown in FIG. 19 (a)
- bandpass filters 11a ⁇ 11e is the shortest distance from the rotation center C 1 is 1.38 mm
- the inclination angle of the light incident surface is 0 degrees relative to a line connecting the center point of the rotation center C 1 and the band-pass filters 11a ⁇ 11e This is an example of the arrangement.
- variable range of the incident angle of the light L2 having a beam diameter of 5 mm is limited to 0 degrees to 9 degrees in order to prevent interference between the bandpass filters 11a to 11e.
- a filter rotating body 908E which is a comparative example of the present invention shown in FIG.
- the bandpass filter 11a ⁇ 11e are arranged such the shortest distance from the center of rotation C 1 is 16.38Mm, the inclination angle of the light incident surface for a line connecting the center point of the rotation center C 1 and the band-pass filters 11a ⁇ 11e is 0 degrees
- the variable range of the incident angle of the light L2 having a beam diameter of 5 mm is limited to 0 degree to 24 degrees.
- a filter rotating body 908F which is a comparative example of the present invention shown in FIG.
- a filter rotator 908G which is a comparative example of the present invention shown in FIG. 20, has a width and thickness of 12 mm and 2 mm along the main surface 10a of the bandpass filters 11a to 11f, and the bandpass filters 11a to 11f. but the shortest distance from the center of rotation C 1 is 32 mm, in the example the tilt angle of the light incident surface is disposed such that 0 ° with respect to a line connecting the center point of the rotation center C 1 and the band-pass filters 11a ⁇ 11f is there.
- this filter rotator 908G is rotated, the variable range of the incident angle of the light L2 having a beam diameter of 5 mm is limited to 0 degrees to 23 degrees. As described above, the variable range of the incident angle is greatly limited as compared with the filter rotating body 108 of FIG. 11 using the same number of band-pass filters.
- a filter rotating body 908H which is a comparative example of the present invention shown in FIG. 21 (a), has a width and thickness along the main surface 10a of the bandpass filters 11a to 11c of 18 mm and 2 mm.
- 11a ⁇ 11c are arranged so that the shortest distance from the center of rotation C 1 is 0.577Mm, the inclination angle of the light incident surface for a line connecting the center point of the rotation center C 1 and the band-pass filters 11a ⁇ 11c is 0 ° This is an example.
- variable range of the incident angle of the light L2 having a beam diameter of 10 mm is limited to 0 to 38 degrees, and the incident angle is smaller than that of the filter rotator 308 in FIG.
- the variable range is greatly limited.
- the 21B has a width and thickness along the main surface 10a of the bandpass filters 11a to 11c of 26 mm and 2 mm, and the bandpass filter 11a ⁇ 11c are arranged so that the shortest distance from the center of rotation C 1 is 14.577Mm, the inclination angle of the light incident surface for a line connecting the center point of the rotation center C 1 and the band-pass filters 11a ⁇ 11c is 0 °
- This is an example.
- the variable range of the incident angle of the light L2 having a beam diameter of 10 mm is 0 ° to 50 °, but the rotation table 10 is compared with the filter rotator 308 of FIG. The diameter becomes twice or more.
- variable range of the incident angle with respect to the bandpass filters 11a to 11d of the filter rotating body 8 can be set to various ranges by changing the inclination angles of the bandpass filters 11a to 11d.
- the minimum angle included in the variable range of the incident angle is not limited to 0 degrees.
- a band-pass filter 11a ⁇ 11f, the inclination angle of the light incident surface for a line connecting the center point of the rotation center C 1 and the band-pass filters 11a ⁇ 11f on the main surface 10a May be set so that the variable range of the incident angle with respect to the bandpass filters 11a to 11f is, for example, 20 degrees to 50 degrees.
- the band-pass filters 11a ⁇ 11f width and thickness along the main surface 10a is 11mm, and a 2 mm, the band-pass filters 11a ⁇ 11f, the shortest distance from the center of rotation C 1 is 16.6mm
- the beam diameter of the light L2 is set to 5 mm.
- the change width of the peak wavelength is It is 5.43% with respect to the maximum peak wavelength.
- the change width of the peak wavelength is 11.18%, and the change in the transmission wavelength region can be greatly increased by the same change in the incident angle. I understand that I can do it.
- the bandpass filters 11a to 11d built in the light source devices 1, 101, and 201 of the present embodiment have different center wavelengths in the transmission wavelength region with respect to the same incident angle, but have the same center wavelength and a half-value width. It may be configured differently.
- FIGS. 14A to 14D show examples of the characteristics of the transmission wavelength region when the incident angles are changed in the range of 0 to 50 degrees at intervals of 5 degrees in the band-pass filters 11a to 11d, respectively. ing. In this way, when the bandpass filters 11a to 11d having the same center wavelength are used, the variable range of the selected wavelength can be easily widened while switching the bandwidth.
- a light detection device 301 as shown in FIG.
- This light detection device 301 is a device for spectrally detecting a predetermined wavelength component of light input from the outside, and includes a light conversion optical system 105 having the same configuration as the light source device 101 and light from the outside.
- An optical fiber 303 that guides light to the collimating lens 6 and a light detector 304 that detects light dispersed by the light conversion optical system 105 are provided.
- the variable range of the detection wavelength can be easily expanded without increasing the size of the device.
- a fluorescence detection system 401 in which a light source device 101 and a light detection device 301 are combined as shown in FIG.
- the light output from the light source device 101 can be irradiated as excitation light to the sample A via the lens unit 402A, and the fluorescence emitted from the sample A accompanying this is transmitted via the lens unit 402B.
- the light detection device 301 it is possible to detect fluorescence in a predetermined wavelength region.
- the wavelength range of excitation light to be emitted and the wavelength range of fluorescence to be detected can be freely adjusted in a wide range.
- the light source device 101 may be replaced with a general light source such as a laser light source.
- a high pass filter, a low pass filter, a notch filter, or the like may be applied in addition to the band pass filter.
- the n dielectric thin film interference filters are mounted such that each intersection formed by the main surface and the end surface is in contact with one inscribed circle.
- the range of the incident angle of light of each dielectric thin film interference filter can be made uniform, and the variable range of the selected wavelength can be efficiently expanded with respect to the area of the main surface of the limited rotation support member. I can do it.
- the n dielectric thin film interference filters are arranged so as to be positioned outside the inscribed circle on the main surface.
- the n dielectric thin film interference filters are arranged such that lines connecting a predetermined point on the main surface and a center point of the dielectric thin film interference filter on the main surface are at an equal angle to each other. Is also suitable.
- the range of the incident angle of light of each dielectric thin film interference filter can be made uniform, and the variable range of the selection wavelength can be efficiently performed with respect to the area of the limited rotation support member. Can spread well.
- the n dielectric thin film interference filters are arranged so as to be n times rotationally symmetric about a predetermined point on the main surface.
- each of the n dielectric thin film interference filters includes a rotation axis for adjusting an inclination angle with respect to a line connecting a predetermined point on the main surface and a center point of the dielectric thin film interference filter on the main surface. It is also suitable that the member is attached. By providing such a rotating shaft member, the range of the incident angle of light with respect to the dielectric thin film interference filter can be adjusted, so that the convenience of the spectroscopic device when realizing a desired selection wavelength is improved.
- the present invention uses a spectroscopic device that selects light in a predetermined wavelength range, and can easily expand the variable range of the selected wavelength without increasing the size of the device.
- 11a to 11f ... band pass filter 15a to 15d ... center point, 1, 101, 201 ... light source device, 301 ... light detection device, 3 ... light source, 8, 8A, 8B, 8C, 8D, 108, 208, 308 ... Filter rotator, 10... Rotary table (rotation support member), 10a... Main surface, 12 .. light incident surface (end surface), 13 .. light exit surface (end surface), 17 .. inscribed circle, C 1 . , L4, L5... Incident light.
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Abstract
Description
図1は、本発明の第1実施形態に係る光源装置の概略構成を示す平面図である。同図に示す光源装置1は、半導体検査装置等の各種検査装置において、特定の発光波長域(例えば、近赤外波長域)を有する光源として用いられる装置である。この光源装置1は、光源からの光のうちの特定の波長域を選択する分光装置の一態様であり、放熱機構としてのヒートシンク2上に取り付けられた光源3と、その光源3から照射された光が入射されて、その光を変換して光ファイバ4を経由して外部出力する光変換光学系5と、光源3及び光変換光学系5を制御する制御系30とから構成されている。ここで、図1においては、紙面上において光源3の光軸に沿った方向にX軸をとり、紙面上においてX軸に垂直な方向に沿ってY軸、X軸及びY軸に垂直な方向に沿ってZ軸をとるものとする。
次に、本発明の第2実施形態について説明する。図6は、本発明の第2実施形態に係る光源装置の概略構成を示す平面図である。同図に示す光源装置101と第1実施形態にかかる光源装置1との相違点は、フィルタ回転体8と同一構成を有する2つのフィルタ回転体8A,8Bを用いて、光L2から分離された2つの直線偏光成分L4,L5を、それぞれP偏光としてフィルタ回転体8A,8Bを透過させる構成を有する点である。
図8は、本発明の第3実施形態に係る光源装置の概略構成を示す平面図である。同図に示す光源装置201と第2実施形態にかかる光源装置101との相違点は、偏光成分L4,L5を、それぞれS偏光として2つのフィルタ回転体8C,8Dを透過させる構成を有する点である。
Claims (6)
- 光源からの光を、前記光の入射角に応じた波長範囲で選択的に透過させるn個(nは3以上の整数)の誘電体薄膜干渉フィルタと、
前記誘電体薄膜干渉フィルタが主面上に立設され、前記主面に沿って所定点の周りを回転可能にされた平板状の回転支持部材とを備える分光装置であって、
前記n個の誘電体薄膜干渉フィルタは、それぞれ、光入射側或いは光出射側の端面が、前記回転支持部材の前記表面上の前記所定点と前記主面上の該誘電体薄膜干渉フィルタの中心点とを結ぶ線に対して傾斜するように配置されている、
ことを特徴とする分光装置。 - 前記n個の誘電体薄膜干渉フィルタは、前記主面と前記端面とで形成されるそれぞれの交線が1つの内接円に接するように搭載されている、
ことを特徴とする請求項1記載の分光装置。 - 前記n個の誘電体薄膜干渉フィルタは、それぞれ、前記主面上において前記内接円の外側に位置するように配置されている、
ことを特徴とする請求項2記載の分光装置。 - 前記n個の誘電体薄膜干渉フィルタは、前記主面上の前記所定点と前記主面上の該誘電体薄膜干渉フィルタの中心点とを結ぶ線が互いに等角度を成すように配置されている、
ことを特徴とする請求項1~3のいずれか1項に記載の分光装置。 - 前記n個の誘電体薄膜干渉フィルタは、前記主面上において前記所定点を中心にしてn回回転対称となるように配置されている、
ことを特徴とする請求項4記載の分光装置。 - 前記n個の誘電体薄膜干渉フィルタには、それぞれ、前記主面上の前記所定点と前記主面上の該誘電体薄膜干渉フィルタの中心点とを結ぶ線に対する傾斜角を調整するための回転軸部材が取り付けられている、
ことを特徴とする請求項1~5のいずれか1項に記載の分光装置。
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DE112011100321.8T DE112011100321B4 (de) | 2010-01-21 | 2011-01-06 | Spektralvorrichtung |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2730901A3 (en) * | 2012-11-08 | 2014-06-11 | Yokogawa Electric Corporation | Spectroscopic apparatus and spectroscopic light source |
CN108459368A (zh) * | 2012-07-16 | 2018-08-28 | Viavi科技有限公司 | 滤光器和传感器系统 |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5759117B2 (ja) * | 2010-07-07 | 2015-08-05 | 浜松ホトニクス株式会社 | 分光装置 |
JP5502623B2 (ja) * | 2010-07-07 | 2014-05-28 | 浜松ホトニクス株式会社 | 分光装置 |
CN203719767U (zh) * | 2012-06-11 | 2014-07-16 | 保生国际生医股份有限公司 | 生化检测系统及其光源模块 |
JP5987573B2 (ja) * | 2012-09-12 | 2016-09-07 | セイコーエプソン株式会社 | 光学モジュール、電子機器、及び駆動方法 |
US9523850B2 (en) * | 2014-02-16 | 2016-12-20 | Apple Inc. | Beam scanning using an interference filter as a turning mirror |
EP3165904B1 (en) * | 2014-07-03 | 2019-11-13 | Murata Manufacturing Co., Ltd. | Gas concentration measurement device |
EP3165906B1 (en) * | 2014-07-03 | 2019-10-09 | Murata Manufacturing Co., Ltd. | Gas concentration measurement device |
CN104266756B (zh) * | 2014-10-10 | 2016-05-25 | 中国电子科技集团公司第四十一研究所 | 一种宽波段红外扫描分光装置及校准方法 |
CN104898268B (zh) * | 2015-06-02 | 2017-06-23 | 深圳市华星光电技术有限公司 | 一种滤波组件及机台 |
CN108139270B (zh) | 2015-10-02 | 2021-06-08 | 浜松光子学株式会社 | 光检测装置 |
CN105891804A (zh) * | 2016-06-27 | 2016-08-24 | 北方民族大学 | 一种多波长拉曼偏振激光分光系统及雷达系统 |
CN106770146B (zh) * | 2017-03-13 | 2020-01-14 | 西安理工大学 | 一种生物气溶胶本征荧光峰值波长检测系统及其检测方法 |
US11885680B2 (en) * | 2019-03-04 | 2024-01-30 | Konica Minolta, Inc. | Spectral device |
CN110068540B (zh) * | 2019-05-17 | 2022-04-22 | 重庆科技学院 | 基于气体成份浓度检测系统的检测方法 |
US11606147B1 (en) * | 2022-06-06 | 2023-03-14 | Bae Systems Information And Electronic Systems Integration Inc. | Frequency and bandwidth agile optical bench |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55149023A (en) * | 1979-05-09 | 1980-11-20 | Asahi Chem Ind Co Ltd | Infrared ray spectroscopic method |
JPH04326026A (ja) * | 1991-04-26 | 1992-11-16 | Fuji Photo Film Co Ltd | 分光測光装置 |
JPH0968660A (ja) * | 1995-09-04 | 1997-03-11 | Nec Corp | 波長可変光フィルタ |
JP2003106899A (ja) * | 2001-09-28 | 2003-04-09 | Ando Electric Co Ltd | 光学式分光器 |
JP2003315690A (ja) * | 2002-04-26 | 2003-11-06 | Seiko Instruments Inc | 波長選択フィルタおよびそれを有する波長選択装置と波長選択方法 |
JP2004184674A (ja) * | 2002-12-03 | 2004-07-02 | Sun Tec Kk | 波長可変光フィルタ |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4084909A (en) | 1976-07-19 | 1978-04-18 | International Business Machines Corporation | Drum monochromator |
US4176916A (en) | 1977-03-14 | 1979-12-04 | Neotec Corporation | Cam filter wheel |
US4737034A (en) | 1981-02-20 | 1988-04-12 | Pacific Scientific Company | Rectangular impinging beam |
JPH0690085B2 (ja) | 1985-07-22 | 1994-11-14 | 有限会社光伸光学 | 干渉フィルタ分光装置 |
JPH04113235A (ja) | 1990-09-04 | 1992-04-14 | Minolta Camera Co Ltd | 光センサー |
JPH0545993A (ja) * | 1991-08-09 | 1993-02-26 | Sharp Corp | フイルタ交換装置 |
JPH0659200A (ja) * | 1992-08-13 | 1994-03-04 | Sumitomo Cement Co Ltd | 電動チューナブルフィルタモジュール |
JPH06281813A (ja) | 1993-01-29 | 1994-10-07 | Nec Corp | 透過波長可変装置 |
WO2003016842A1 (fr) * | 2001-08-13 | 2003-02-27 | Hamamatsu Photonics K.K. | Spectrometre et procede de separation spectrale |
KR100442616B1 (ko) * | 2002-01-18 | 2004-08-02 | 삼성전자주식회사 | 더블유디엠 시스템의 광 파장 고정장치 |
JP2003241113A (ja) | 2002-02-15 | 2003-08-27 | Sun Tec Kk | 波長可変光フィルタ装置 |
US6996312B2 (en) * | 2003-04-29 | 2006-02-07 | Rosemount, Inc. | Tunable fabry-perot filter |
TWI240794B (en) | 2004-03-02 | 2005-10-01 | Ind Tech Res Inst | Wavelength meter |
JP3909363B2 (ja) | 2005-03-28 | 2007-04-25 | オムロン株式会社 | 分光偏光計測方法 |
US8398263B2 (en) * | 2010-01-20 | 2013-03-19 | Ikonisys, Inc. | Filter wheel |
US8059327B1 (en) * | 2010-04-29 | 2011-11-15 | Semrock, Inc. | Variable spectral filter apparatus |
-
2010
- 2010-01-21 JP JP2010011012A patent/JP5048795B2/ja active Active
-
2011
- 2011-01-06 WO PCT/JP2011/050122 patent/WO2011089931A1/ja active Application Filing
- 2011-01-06 US US13/574,103 patent/US9488827B2/en active Active
- 2011-01-06 CN CN201180006885.0A patent/CN102713543B/zh active Active
- 2011-01-06 DE DE112011100321.8T patent/DE112011100321B4/de active Active
- 2011-01-19 TW TW100101961A patent/TWI495855B/zh active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55149023A (en) * | 1979-05-09 | 1980-11-20 | Asahi Chem Ind Co Ltd | Infrared ray spectroscopic method |
JPH04326026A (ja) * | 1991-04-26 | 1992-11-16 | Fuji Photo Film Co Ltd | 分光測光装置 |
JPH0968660A (ja) * | 1995-09-04 | 1997-03-11 | Nec Corp | 波長可変光フィルタ |
JP2003106899A (ja) * | 2001-09-28 | 2003-04-09 | Ando Electric Co Ltd | 光学式分光器 |
JP2003315690A (ja) * | 2002-04-26 | 2003-11-06 | Seiko Instruments Inc | 波長選択フィルタおよびそれを有する波長選択装置と波長選択方法 |
JP2004184674A (ja) * | 2002-12-03 | 2004-07-02 | Sun Tec Kk | 波長可変光フィルタ |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108459368A (zh) * | 2012-07-16 | 2018-08-28 | Viavi科技有限公司 | 滤光器和传感器系统 |
US11131794B2 (en) | 2012-07-16 | 2021-09-28 | Viavi Solutions Inc. | Optical filter and sensor system |
EP2730901A3 (en) * | 2012-11-08 | 2014-06-11 | Yokogawa Electric Corporation | Spectroscopic apparatus and spectroscopic light source |
Also Published As
Publication number | Publication date |
---|---|
JP2011149799A (ja) | 2011-08-04 |
CN102713543A (zh) | 2012-10-03 |
DE112011100321T5 (de) | 2012-10-31 |
DE112011100321B4 (de) | 2023-05-11 |
TWI495855B (zh) | 2015-08-11 |
US20120314295A1 (en) | 2012-12-13 |
JP5048795B2 (ja) | 2012-10-17 |
US9488827B2 (en) | 2016-11-08 |
TW201142254A (en) | 2011-12-01 |
CN102713543B (zh) | 2015-03-25 |
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