WO2011085765A8 - Hochauflösendes mikroskop und bildteileranordnung - Google Patents

Hochauflösendes mikroskop und bildteileranordnung Download PDF

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Publication number
WO2011085765A8
WO2011085765A8 PCT/EP2010/007594 EP2010007594W WO2011085765A8 WO 2011085765 A8 WO2011085765 A8 WO 2011085765A8 EP 2010007594 W EP2010007594 W EP 2010007594W WO 2011085765 A8 WO2011085765 A8 WO 2011085765A8
Authority
WO
WIPO (PCT)
Prior art keywords
beam path
detection
detection beam
optical
deflection
Prior art date
Application number
PCT/EP2010/007594
Other languages
English (en)
French (fr)
Other versions
WO2011085765A1 (de
Inventor
Thomas Kalkbrenner
Michael Goelles
Original Assignee
Carl Zeiss Microimaging Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss Microimaging Gmbh filed Critical Carl Zeiss Microimaging Gmbh
Priority to US13/518,108 priority Critical patent/US9372333B2/en
Publication of WO2011085765A1 publication Critical patent/WO2011085765A1/de
Publication of WO2011085765A8 publication Critical patent/WO2011085765A8/de
Priority to US15/087,177 priority patent/US10078206B2/en

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00—Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02—Catoptric systems, e.g. image erecting and reversing system
    • G02B17/023—Catoptric systems, e.g. image erecting and reversing system for extending or folding an optical path, e.g. delay lines
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0072—Optical details of the image generation details concerning resolution or correction, including general design of CSOM objectives
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/106—Beam splitting or combining systems for splitting or combining a plurality of identical beams or images, e.g. image replication
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/1066—Beam splitting or combining systems for enhancing image performance, like resolution, pixel numbers, dual magnifications or dynamic range, by tiling, slicing or overlapping fields of view
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/14—Beam splitting or combining systems operating by reflection only
    • G02B27/141—Beam splitting or combining systems operating by reflection only using dichroic mirrors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/14—Beam splitting or combining systems operating by reflection only
    • G02B27/144—Beam splitting or combining systems operating by reflection only using partially transparent surfaces without spectral selectivity
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/14—Beam splitting or combining systems operating by reflection only
    • G02B27/145—Beam splitting or combining systems operating by reflection only having sequential partially reflecting surfaces
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0088—Inverse microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G02B21/245—Devices for focusing using auxiliary sources, detectors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28—Systems for automatic generation of focusing signals
    • G02B7/36—Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals
    • G02B7/38—Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals measured at different points on the optical axis, e.g. focussing on two or more planes and comparing image data

Abstract

Mikroskop mit einem Beleuchtungsstrahlengang mit einer Weitfeldbeleuchtung einer Probe und einem ersten Detektionsstrahlengang mit einem ortsaufgelösten Flächenempfänger, auf den ein erster Teil des von der Probe kommenden Detektionslichtes über den ersten Detektionsstrahlengang gelangt oder Bildteileranordnung für ein Mikroskop, wobei zur Verlängerung der optischen Weglänge mindestens ein zweiter Teil des von der Probe kommenden Detektionslichtes aus dem Detektionsstrahlengang ausgeblendet ist und über Umlenkmittel zum Detektionsstrahlengang mindestens in einem zweiten Detektionsstrahlengang geführt ist und vorzugsweise über weitere Umlenkmittel in Richtung der Detektion so zurückgelenkt wird, dass auf dem Flächenempfänger nebeneinander mindestens zwei Teilgebiete mit Detektionslicht beaufschlagt sind, wobei mindestens der zweite Teil des Detektionslichtes zumindest teilweise zur Verlängerung der optischen Weglänge in einem optischen Element mit gegenüber dem ersten Detektionsstrahlengang erhöhter optischer Dichte verläuft und das optische Element in einem Winkel, vorzugsweise senkrecht zur optischen Achse des ersten Detektionsstrahlengangs zur Verstellung der optischen Weglänge verschiebbar ausgebildet ist und zumindest an seiner Lichteintritts- und Lichtaustrittsseite ebene Flächen aufweist und vorzugsweise mindestens im zweiten Detektionsstrahlengang nach einer ersten Strahlumlenkung ein Prisma, bevorzugt ein Glasprisma zur Umlenkung in eine zum ersten Detektionsstrahlengang parallele Richtung zur Erhöhung der Weglänge und zur Rückumlenkung vorgesehen ist.
PCT/EP2010/007594 2009-12-22 2010-12-14 Hochauflösendes mikroskop und bildteileranordnung WO2011085765A1 (de)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US13/518,108 US9372333B2 (en) 2009-12-22 2010-12-14 High resolution microscope and image divider assembly
US15/087,177 US10078206B2 (en) 2009-12-22 2016-03-31 High-resolution microscope and image splitter arrangment

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102009060490.1 2009-12-22
DE102009060490A DE102009060490A1 (de) 2009-12-22 2009-12-22 Hochauflösendes Mikroskop und Bildteileranordnung

Related Child Applications (2)

Application Number Title Priority Date Filing Date
US13/518,108 A-371-Of-International US9372333B2 (en) 2009-12-22 2010-12-14 High resolution microscope and image divider assembly
US15/087,177 Continuation US10078206B2 (en) 2009-12-22 2016-03-31 High-resolution microscope and image splitter arrangment

Publications (2)

Publication Number Publication Date
WO2011085765A1 WO2011085765A1 (de) 2011-07-21
WO2011085765A8 true WO2011085765A8 (de) 2011-09-29

Family

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PCT/EP2010/007594 WO2011085765A1 (de) 2009-12-22 2010-12-14 Hochauflösendes mikroskop und bildteileranordnung

Country Status (3)

Country Link
US (2) US9372333B2 (de)
DE (1) DE102009060490A1 (de)
WO (1) WO2011085765A1 (de)

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DE102009060490A1 (de) * 2009-12-22 2011-06-30 Carl Zeiss Microlmaging GmbH, 07745 Hochauflösendes Mikroskop und Bildteileranordnung
DE102010041794A1 (de) 2010-09-30 2012-04-05 Carl Zeiss Microlmaging Gmbh Mikroskopsystem, Mikroskopieverfahren und Computerprogrammprodukt
DE102011007751B4 (de) * 2011-04-20 2023-10-19 Carl Zeiss Microscopy Gmbh Weitfeldmikroskop und Verfahren zur Weitfeldmikroskopie
EP2742382B2 (de) 2011-07-24 2023-08-02 Leica Microsystems CMS GmbH Mikroskopieinstrumente mit detektorarrays und einem strahlteilungssystem
DE102011055294B4 (de) 2011-11-11 2013-11-07 Leica Microsystems Cms Gmbh Mikroskopische Einrichtung und Verfahren zur dreidimensionalen Lokalisierung von punktförmigen Objekten in einer Probe
DE102012200344A1 (de) 2012-01-11 2013-07-11 Carl Zeiss Microscopy Gmbh Mikroskopsystem und Verfahren für die 3-D hochauflösende Mikroskopie
EP2802861A4 (de) * 2012-01-11 2015-08-19 Hughes Howard Med Inst Mehrdimensionale bildgebung mit multifokaler mikroskopie
DE102012201003A1 (de) 2012-01-24 2013-07-25 Carl Zeiss Microscopy Gmbh Mikroskop und Verfahren für die hochauflösende 3-D Fluoreszenzmikroskopie
DE102012202730A1 (de) 2012-02-22 2013-08-22 Carl Zeiss Microscopy Gmbh Wellenlängenselektive und örtlich hochauflösende Fluoreszenzmikroskopie
GB201220422D0 (en) 2012-11-13 2012-12-26 Cairn Res Ltd Optical imaging device
DE102012221310B4 (de) * 2012-11-22 2019-09-19 Sypro Optics Gmbh Anzeigeanordnung für ein Kraftfahrzeug, mit einem Bildgeber und einem Bildtrenner
DE102012224306A1 (de) 2012-12-21 2014-06-26 Carl Zeiss Microscopy Gmbh Verfahren zur hochauflösenden 3D-Lokalisierungsmikroskopie
DE102013208415B4 (de) 2013-05-07 2023-12-28 Carl Zeiss Microscopy Gmbh Mikroskop und Verfahren für die 3D-hochauflösende Lokalisierungsmikroskopie
DE102013208927A1 (de) 2013-05-14 2014-11-20 Carl Zeiss Microscopy Gmbh Verfahren zur 3D-hochauflösenden Lokalisierungsmikroskopie
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DE102015121920A1 (de) 2015-12-16 2017-06-22 Carl Zeiss Microscopy Gmbh Hochauflösendes Kurzzeit-Mikroskopieverfahren und hochauflösendes Kurzzeit-Mikroskop
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Also Published As

Publication number Publication date
US20160216502A1 (en) 2016-07-28
US10078206B2 (en) 2018-09-18
WO2011085765A1 (de) 2011-07-21
DE102009060490A1 (de) 2011-06-30
US20130155218A1 (en) 2013-06-20
US9372333B2 (en) 2016-06-21

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