WO2010101114A1 - 誘電体磁器組成物、誘電体、セラミックス基板及び電子部品、並びに誘電体の製造方法 - Google Patents
誘電体磁器組成物、誘電体、セラミックス基板及び電子部品、並びに誘電体の製造方法 Download PDFInfo
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/30—Stacked capacitors
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/01—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
- C04B35/10—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on aluminium oxide
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/01—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
- C04B35/10—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on aluminium oxide
- C04B35/111—Fine ceramics
- C04B35/117—Composites
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/01—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
- C04B35/44—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on aluminates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/10—Metal-oxide dielectrics
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/12—Ceramic dielectrics
- H01G4/1209—Ceramic dielectrics characterised by the ceramic dielectric material
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- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
- C04B2235/02—Composition of constituents of the starting material or of secondary phases of the final product
- C04B2235/30—Constituents and secondary phases not being of a fibrous nature
- C04B2235/32—Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
- C04B2235/3217—Aluminum oxide or oxide forming salts thereof, e.g. bauxite, alpha-alumina
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- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
- C04B2235/02—Composition of constituents of the starting material or of secondary phases of the final product
- C04B2235/30—Constituents and secondary phases not being of a fibrous nature
- C04B2235/34—Non-metal oxides, non-metal mixed oxides, or salts thereof that form the non-metal oxides upon heating, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
Definitions
- the present invention relates to a dielectric ceramic composition, a dielectric, a ceramic substrate, an electronic component, and a dielectric manufacturing method.
- LTCC low-temperature co-fired ceramics
- the quality factor (Q value) is lowered. There is a need for a body porcelain composition.
- the present invention has been made in view of the above circumstances, and an object thereof is to provide a dielectric ceramic composition and a dielectric having a high Q ⁇ f value, and a ceramic substrate and an electronic component including such a dielectric. And It is another object of the present invention to provide a dielectric manufacturing method capable of forming a dielectric having a high Q ⁇ f value even at a low sintering temperature.
- the present invention provides a dielectric ceramic composition containing Al 2 TeO 5 as a main component.
- This dielectric ceramic composition has a sufficiently high Q ⁇ f value because the glass component content is reduced.
- this dielectric ceramic composition also has a dielectric constant suitable for high frequency components such as filters, it is suitably used as a material for high frequency components.
- the dielectric ceramic composition of the present invention preferably contains TeO 2 as a subcomponent.
- TeO 2 is a low melting point oxide and has a function as a sintering aid. Therefore, by containing TeO 2 as an auxiliary component they may be a dielectric ceramic composition having excellent sinterability.
- the present invention provides a dielectric comprising the above dielectric ceramic composition. Since such a dielectric is composed of a dielectric ceramic composition having the above characteristics, the content of the glass component is sufficiently reduced, and it has a sufficiently high Q ⁇ f value. Moreover, since it also has a dielectric constant suitable for high-frequency components such as filters, this dielectric is suitably used for high-frequency components.
- the present invention provides a ceramic substrate and an electronic component including the above-described dielectric. Since the ceramic substrate and the electronic component each include a dielectric having the above characteristics, the ceramic substrate and the electronic component have a high Q ⁇ f value and are preferably used as a high-frequency component.
- the present invention also provides molded by adding a calcined to obtain a Al 2 TeO 5 by calcining a mixture containing Al 2 O 3 and TeO 2, and TeO 2 to Al 2 TeO 5, fired to burn
- a method for producing a dielectric comprising a dielectric ceramic composition containing Al 2 TeO 5 as a main component, and a firing step for obtaining a bonded body.
- the manufacturing method of the present invention it is possible to obtain a dielectric having a dielectric constant suitable for a high frequency component while having a high Q ⁇ f value at a sufficiently low firing temperature. Further, since the dielectric can be obtained by sintering at a sufficiently low firing temperature, it is possible to use inexpensive Ag or Cu as a material for the wiring pattern when manufacturing a ceramic substrate, an electronic component or the like. . For this reason, the manufacturing cost of a dielectric material can be reduced significantly.
- the production method of the present invention preferably includes a step of annealing the sintered body.
- a dielectric having a higher Q ⁇ f value can be obtained by annealing the sintered body.
- the present invention it is possible to provide a dielectric ceramic composition and a dielectric having a high Q ⁇ f value, and a ceramic substrate and an electronic component including such a dielectric. Further, it is possible to provide a dielectric manufacturing method capable of forming a dielectric having a high Q ⁇ f value even at a low sintering temperature.
- the dielectric manufacturing method of the present invention it is possible to form the dielectric by sintering at a sufficiently low temperature, so Ag or Cu can be used as the material of the electrode pattern. For this reason, a ceramic substrate and an electronic component having a dielectric having a high Q ⁇ f value can be manufactured at low cost.
- the dielectric of the present embodiment is composed of a dielectric ceramic composition containing Al 2 TeO 5 as a main component and TeO 2 as a subcomponent.
- the “main component” is a component having a content of 50% by mass or more based on the entire dielectric ceramic composition.
- the “subcomponent” is a component having a content of less than 50% by mass with respect to the entire dielectric ceramic composition.
- the content of Al 2 TeO 5 in the dielectric ceramic composition is preferably 50 to 100% by mass, more preferably 60 to 100% by mass from the viewpoint of a dielectric ceramic composition having a higher Q ⁇ f value. %.
- the content of Al 2 TeO 5 is less than 50% by mass, a sufficiently high Q ⁇ f value tends to be hardly obtained.
- TeO 2 In a dielectric that is a sintered body, Al 2 TeO 5 mainly constitutes crystal grains of the sintered body. On the other hand, TeO 2 may exist mainly at the grain boundaries of the sintered body. TeO 2 has a function of accelerating the sintering of the dielectric ceramic composition because it easily becomes a liquid phase by heating. Therefore, by containing 10 to 25% by mass of TeO 2 , a dielectric ceramic composition having both sufficiently excellent sinterability and a sufficiently high Q ⁇ f value can be obtained. TeO 2 may be dissolved in Al 2 TeO 5 constituting the crystal grains, or may be present in the crystal grains as a crystal different from the Al 2 TeO 5 crystal.
- the dielectric of the present embodiment has a dielectric constant suitable for a high frequency component and a high Q ⁇ f value. For this reason, the dielectric of this embodiment can be used suitably for high frequency components, such as a ceramic substrate and an electronic component.
- the dielectric manufacturing method of the present embodiment includes a mixing step of preparing a mixture by mixing Al 2 O 3 and TeO 2 , a calcination step of calcining the prepared mixture to obtain Al 2 TeO 5 , Al 2 to TeO 5 and mixed by adding TeO 2, obtained with the addition steps of preparing a mixture of Al 2 TeO 5 and TeO 2, the sintered body was fired by molding a mixture of Al 2 TeO 5 and TeO 2 A firing step, and an annealing step in which the sintered body is annealed to obtain a dielectric. Details of each step will be described below.
- a commercially available Al 2 O 3 powder and a commercially available TeO 2 powder are mixed at a molar ratio of 1: 1 to prepare a mixture.
- the mixing is preferably performed by wet mixing in which ethanol is added to and mixed with the Al 2 O 3 powder and TeO 2 powder from the viewpoint of obtaining a more uniformly mixed mixture.
- wet mixing it is preferable to sufficiently dry the mixture using a normal dryer or the like before the calcining step.
- the mixture prepared in the mixing step is calcined using a commercially available electric furnace or the like, and Al 2 O 3 and TeO 2 are reacted to obtain Al 2 TeO 5 .
- the calcining temperature is 550 to 650 ° C. and the calcining time is 5 to 20 hours.
- the calcination can be performed in an air atmosphere. When the calcining temperature exceeds 650 ° C., TeO 2 tends to evaporate and a composition shift tends to occur.
- TeO 2 powder is added to and mixed with Al 2 TeO 5 obtained in the calcination step.
- the amount of TeO 2 powder added is preferably 10 to 50% by mass based on the entire Al 2 TeO 5 from the viewpoint of achieving both high sinterability and high Q ⁇ f value of the obtained dielectric at a high level. More preferably, it is 20 to 50% by mass, and further preferably 30 to 45% by mass.
- the mixing of Al 2 TeO 5 and TeO 2 powder is preferably wet mixing performed by a ball mill or the like by adding ethanol, as in the above mixing step.
- the TeO 2 powder added here also functions as a sintering aid in the sintering process described later.
- TeO2 powder By adding TeO2 powder, Al 2 while suppressing the generation of TeO 5 and TeO 2 other phases, it is possible to lower a sintering temperature sufficiently dense sintered body.
- wet mixing it is preferable to dry the mixture of Al 2 TeO 5 and TeO 2 using a normal dryer or the like before the firing step described later.
- a mixture of Al 2 TeO 5 and TeO 2 is formed into a predetermined shape by a normal forming method such as uniaxial pressurization or cold isostatic pressurization (CIP), for example. obtain.
- the obtained molded body is fired in an air atmosphere to produce a sintered body (dielectric).
- the firing temperature is preferably 750 to 950 ° C., more preferably 800 to 950 ° C., and further preferably 850 to 950 ° C.
- the firing time can be, for example, 1 to 20 hours. Since TeO 2 is a low melting point oxide, a dense sintered body can be obtained at a low sintering temperature as described above.
- the sintered body obtained in the firing step is composed of the above-described dielectric ceramic composition, and can be used as a dielectric for ceramic substrates and electronic parts.
- This dielectric contains Al 2 TeO 5 as a main component and TeO 2 as a subcomponent. For this reason, this dielectric has a dielectric constant suitable for high-frequency components and a high Q ⁇ f value, and is suitably used for electronic components such as filters. Note that, from the viewpoint of further improving the high-frequency characteristics such as the Q ⁇ f value, it is preferable to subject the sintered body obtained in the sintering step to an annealing treatment described later.
- the sintered body is heated in an air atmosphere at a temperature (annealing temperature) lower than the firing temperature of the firing process for 1 to 100 hours.
- a temperature annealing temperature
- the annealing temperature is preferably 200 to 900 ° C., more preferably 300 to 800 ° C.
- the dielectric of the present embodiment preferably has a 4.7 g / cm 3 or more density, more preferably has a 4.75 g / cm 3 or more density.
- density of the dielectric is less than 4.7 g / cm 3 , sintering does not proceed sufficiently, and there is a tendency that sufficiently excellent high frequency characteristics are impaired.
- the ratio of Al 2 TeO 5 and TeO 2 in the dielectric and dielectric ceramic composition of the present embodiment can also be adjusted by changing the firing temperature and firing time in the firing step. For example, if the firing time is increased or the firing temperature is increased, the volatilization amount of TeO 2 increases, and the ratio of TeO 2 to Al 2 TeO 5 tends to decrease.
- FIG. 1 is an XRD (X-ray diffraction) chart showing the change with time of the firing time of the dielectric obtained by the manufacturing method of the present embodiment.
- the dielectrics in the charts 1 to 4 were fired at a firing temperature of 900 ° C., changing the firing time to 1 to 10 hours, respectively.
- Charts 1, 2, 3, and 4 are XRD charts of dielectrics obtained with firing times of 1, 3, 5, and 10 hours, respectively.
- Chart 4 shows that a dielectric ceramic composition containing only Al 2 TeO 5 can be obtained.
- the composition of the dielectric can be examined by XRD analysis.
- the dielectric manufacturing method described above a dielectric having excellent high frequency characteristics can be obtained at a sufficiently low temperature. Therefore, the dielectric obtained by the above manufacturing method is suitably used for a ceramic substrate (LTCC substrate), an electronic component, or the like.
- FIG. 2 is a perspective view showing a preferred embodiment of the electronic component of the present invention.
- the electronic component 100 shown in FIG. 2 has terminals 120 provided on a pair of opposing side surfaces of a dielectric (ceramic substrate) 110.
- the terminal 120 is provided so as to wrap around the end of the dielectric 110 from the side surface.
- Examples of such electronic components include a multilayer ceramic capacitor and a multilayer coil.
- FIG. 3 is a perspective view showing another embodiment according to the electronic component of the present invention.
- the electronic component 200 shown in FIG. 3 is provided with one terminal 220 on each of the four side surfaces of a dielectric (ceramic substrate) 210.
- the terminals 220 provided on the opposite side surfaces of the dielectric 210 are formed at positions facing each other.
- Examples of such an electronic component include a laminated low-pass filter, a laminated high-pass filter, a laminated band-pass filter, a laminated balun, and a laminated coupler.
- FIG. 4 is a perspective view showing still another embodiment of the electronic component of the present invention.
- An electronic component 300 shown in FIG. 4 includes a terminal 320 provided on each of a pair of opposing sides among the four side surfaces of a dielectric (ceramic substrate) 310, and another set of opposing sides. Two terminals 320 are provided on each side surface. And the terminal 320 of each side surface is formed in the position which respectively faces the terminal 320 of the side surface which opposes this.
- Examples of the electronic component having such a shape include a multilayer low-pass filter, a multilayer high-pass filter, a multilayer band-pass filter, a multilayer balun, and a multilayer coupler.
- These electronic components 100, 200, and 300 have internal electrodes formed inside dielectrics (ceramic substrates) 110, 210, and 310, and end portions thereof are provided on the side surfaces of the dielectrics 110, 210, and 310. You may have the structure connected with the terminal 120,220,320. Electronic parts having various characteristics can be obtained depending on the shape of the internal electrode, the connection method, and the like.
- the dielectrics 110, 210 and 310 are made of a dielectric ceramic composition having the above-described characteristics. Therefore, since the dielectrics 110, 210, and 310 are sintered by low-temperature firing, inexpensive Ag and Cu can be used for the internal electrodes and terminals.
- the electronic components 100, 200, and 300 can be manufactured by the following method. First, a mixture of Al 2 TeO 5 and TeO 2 is prepared in the same manner as the above-described dielectric manufacturing method. If necessary, an organic vehicle is added to the mixture to prepare a paste, and the paste is applied onto a base film such as polyethylene terephthalate. After coating, the organic vehicle is removed by drying to form a green sheet containing Al 2 TeO 5 and TeO 2 . The organic vehicle is obtained by dissolving a binder in an organic solvent.
- terpineol terpineol, butyl carbitol, acetone, toluene, isopropyl alcohol and the like
- binder ethyl cellulose, polyvinyl butyral and the like
- the organic vehicle may contain a plasticizer such as di-n-butyl phthalate.
- a conductive paste containing Ag or Cu is applied so that an internal electrode having a predetermined shape is formed.
- a plurality of green sheets coated with the conductive paste are produced as necessary and laminated to obtain a laminate.
- a conductive paste is applied to the laminate so that terminals 120, 220, and 320 having a predetermined shape are formed.
- the organic vehicle is removed from the conductive paste by drying, and the same steps as the firing step and the annealing step in the above-described dielectric manufacturing method are performed.
- the internal electrodes are formed in the dielectrics 110, 210, and 310, and the electronic components 100, 200, and 300 having the terminals 120, 220, and 320 on the side surfaces of the dielectrics 110, 210, and 310 can be obtained. it can.
- Example 1 ⁇ Production of dielectric> (Mixing process)
- Al 2 O 3 powder purity 99.99 mass%)
- TeO 2 powder purity 99.9 mass%
- the weighed Al 2 O 3 powder, TeO 2 powder and ethanol were wet mixed using a ball mill for 24 hours. Thereafter, ethanol was removed by drying to obtain a mixture containing Al 2 O 3 powder and TeO 2 powder.
- TeO 2 powder (purity 99.9 mass%) and ethanol were added to the obtained calcined product, and wet mixed using a ball mill.
- the amount of TeO 2 powder added was 35% by mass based on the total amount of Al 2 TeO 5 .
- composition analysis The composition of the dielectric was analyzed by XRD. The compounds detected by XRD were as shown in Table 1.
- the produced dielectric was subjected to high frequency characteristic analysis in accordance with JIS R 1627. Specifically, a network analyzer was used as a measuring apparatus, and the resonance frequency f0, the Q ⁇ f value, the relative dielectric constant ⁇ r , and the temperature coefficient ⁇ f of the resonance frequency were measured. The measurement results were as shown in Table 1.
- Examples 2 to 13 A dielectric was produced in the same manner as in Example 1 except that the addition amount of TeO 2 in the addition step and the firing time in the firing step were changed as shown in Table 1, respectively. These were used as the dielectrics of Examples 2 to 13. Then, each dielectric was evaluated in the same manner as in Example 1. The evaluation results are as shown in Table 1.
- Example 14 The dielectric of Example 5 was subjected to an annealing treatment in which air was heated at 750 ° C. for 24 hours in an air atmosphere. This was designated as the dielectric material of Example 14. The dielectric was evaluated in the same manner as in Example 1. The evaluation results are as shown in Table 1.
- Example 15 The dielectric material of Example 5 was subjected to an annealing treatment in which it was heated at 750 ° C. for 36 hours in an air atmosphere. This was designated as the dielectric material of Example 15. The dielectric was evaluated in the same manner as in Example 1. The evaluation results are as shown in Table 1.
- Example 1 A dielectric was produced in the same manner as in Example 1 except that the calcination step was not performed. That is, a mixture containing Al 2 O 3 powder and TeO 2 powder was molded and fired to produce a dielectric. The dielectric was evaluated in the same manner as in Example 1. The evaluation results are as shown in Table 1.
- the dielectrics of Examples 1 to 15 were each composed of a dielectric ceramic composition containing Al 2 TeO 5 as a main component and TeO 2 as a subcomponent.
- the dielectrics of Examples 1 to 15 all had a dielectric constant suitable for high-frequency components and a high Q ⁇ f value.
- the dielectrics of Examples 14 and 15 subjected to the annealing treatment had particularly high Q ⁇ f values.
- the dielectric of Comparative Example 1 had a significantly lower Q ⁇ f value than the dielectrics of Examples 1 to 15.
- FIG. 5 is an XRD chart showing the XRD measurement results of the dielectric of Comparative Example 1. As shown in FIG. 5, when a dielectric is produced without performing the calcination step, a dielectric ceramic composition mainly composed of Al 2 TeO 5 cannot be obtained, and a large amount of Al 2 O 3 remains unreacted. It was confirmed that it remained.
- the present invention it is possible to provide a dielectric ceramic composition and a dielectric having a high Q ⁇ f value, and a ceramic substrate and an electronic component including such a dielectric. Further, it is possible to provide a dielectric manufacturing method capable of forming a dielectric having a high Q ⁇ f value even at a low sintering temperature.
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Abstract
Description
<誘電体の作製>
(混合工程)
市販のAl2O3粉末(純度99.99質量%)とTeO2粉末(純度99.9質量%)とを、モル比で1:1となるように秤量した。秤量したAl2O3粉末とTeO2粉末とエタノールとを、ボールミルを用いて24時間湿式混合した。その後、乾燥によりエタノールを除去して、Al2O3粉末とTeO2粉末とを含む混合物を得た。
次に、この混合物を、空気雰囲気中、620℃で10時間加熱する仮焼を行い、仮焼物(Al2TeO5)を得た。
得られた仮焼物にTeO2粉末(純度99.9質量%)とエタノールとを添加し、ボールミルを用いて湿式混合した。TeO2粉末の添加量は、Al2TeO5全量を基準として、35質量%とした。
湿式混合して得られた混合物を200MPaの圧力で一軸加圧し、円柱形状(直径:12mm)の成形体を作製した。
成形体を、電気炉を用いて、空気雰囲気中、900℃で2時間焼成して、誘電体磁器組成物からなる誘電体(焼結体)を得た。これを実施例1の誘電体とした。
(組成分析)
誘電体の組成を、XRDにより分析した。XRDによって検出された化合物は、表1に示すとおりであった。
作製した誘電体の高周波特性分析を、JIS R 1627に準拠して行った。具体的には、測定装置としてネットワークアナライザを用い、共振周波数f0、Q・f値、比誘電率εr、共振周波数の温度係数τfを測定した。測定結果は表1に示すとおりであった。
作製した誘電体の密度を、円柱の寸法と質量の測定値から計算によって求めた。結果は表1に示すとおりであった。
添加工程におけるTeO2の添加量及び焼成工程における焼成時間を、それぞれ表1に示すとおりに変更したこと以外は、実施例1と同様にして誘電体を作製した。これらを実施例2~13の誘電体とした。そして、実施例1と同様にしてそれぞれの誘電体の評価を行った。評価結果は表1に示すとおりであった。
実施例5の誘電体に、空気雰囲気中、750℃で24時間加熱するアニール処理を施した。これを実施例14の誘電体とした。そして、実施例1と同様にして誘電体の評価を行った。評価結果は表1に示すとおりであった。
実施例5の誘電体に、空気雰囲気中、750℃で36時間加熱するアニール処理を施した。これを実施例15の誘電体とした。そして、実施例1と同様にして誘電体の評価を行った。評価結果は表1に示すとおりであった。
仮焼工程を行わなかったこと以外は、実施例1と同様にして誘電体を作製した。すなわち、Al2O3粉末とTeO2粉末とを含む混合物を成形して焼成し、誘電体を作製した。そして、実施例1と同様にして誘電体の評価を行った。評価結果は表1に示すとおりであった。
Claims (7)
- Al2TeO5を主成分として含有する誘電体磁器組成物。
- TeO2を副成分として含有する請求項1記載の誘電体磁器組成物。
- 請求項1又は2記載の誘電体磁器組成物からなる誘電体。
- 請求項3記載の誘電体を備えるセラミックス基板。
- 請求項3記載の誘電体を備える電子部品。
- Al2O3とTeO2とを含む混合物を仮焼してAl2TeO5を得る仮焼工程と、
前記Al2TeO5にTeO2を添加して成形し、焼成して焼結体を得る焼成工程と、を有する、Al2TeO5を主成分として含有する誘電体磁器組成物からなる誘電体の製造方法。 - 前記焼結体をアニール処理する工程を有する請求項6記載の製造方法。
Priority Applications (3)
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US13/203,922 US8481440B2 (en) | 2009-03-03 | 2010-03-01 | Dielectric ceramic composition, dielectric body, ceramic substrate, electronic component, and method for producing dielectric body |
JP2011502743A JP5574343B2 (ja) | 2009-03-03 | 2010-03-01 | 誘電体磁器組成物、誘電体、セラミックス基板及び電子部品、並びに誘電体の製造方法 |
DE112010000971.6T DE112010000971B4 (de) | 2009-03-03 | 2010-03-01 | Dielektrische keramische Zusammensetzung, dielektrischer Körper, keramisches Substrat,elektronisches Bauelement und Verfahren zur Herstellung eines dielektrischen Körpers |
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US (1) | US8481440B2 (ja) |
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EP3232551B1 (en) * | 2016-04-15 | 2020-08-19 | Nxp B.V. | Switch-mode power supply with noise filter |
KR102494324B1 (ko) * | 2016-07-27 | 2023-02-01 | 삼성전기주식회사 | 적층형 커패시터 및 그 실장 기판 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS59203706A (ja) * | 1983-05-02 | 1984-11-17 | Res Dev Corp Of Japan | テルル−アルミニウム系非晶質化合物材料及びその製造法 |
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US3070421A (en) * | 1960-12-07 | 1962-12-25 | Owens Illinois Glass Co | Aluminum, chromium, and gallium tellurates |
JP2641521B2 (ja) | 1987-08-31 | 1997-08-13 | ティーディーケイ株式会社 | 配線基板 |
US4939106A (en) | 1987-08-31 | 1990-07-03 | Tdk Corporation | Sintered ceramic body |
JPH05105432A (ja) * | 1991-10-18 | 1993-04-27 | Ube Ind Ltd | アモルフアス強誘電体酸化物材料及びその製造方法 |
JP2005281023A (ja) * | 2004-03-29 | 2005-10-13 | Nippon Electric Glass Co Ltd | 高誘電率テルライトガラス |
JP5397668B2 (ja) * | 2008-09-02 | 2014-01-22 | ソニー株式会社 | 記憶素子および記憶装置 |
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2010
- 2010-03-01 WO PCT/JP2010/053246 patent/WO2010101114A1/ja active Application Filing
- 2010-03-01 US US13/203,922 patent/US8481440B2/en not_active Expired - Fee Related
- 2010-03-01 DE DE112010000971.6T patent/DE112010000971B4/de not_active Expired - Fee Related
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Publication number | Priority date | Publication date | Assignee | Title |
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JPS59203706A (ja) * | 1983-05-02 | 1984-11-17 | Res Dev Corp Of Japan | テルル−アルミニウム系非晶質化合物材料及びその製造法 |
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JPWO2010101114A1 (ja) | 2012-09-10 |
DE112010000971T5 (de) | 2012-10-11 |
US8481440B2 (en) | 2013-07-09 |
JP5574343B2 (ja) | 2014-08-20 |
DE112010000971B4 (de) | 2015-06-25 |
US20120028787A1 (en) | 2012-02-02 |
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