WO2009139418A1 - 水晶振動子及びこれを使用した測定方法 - Google Patents
水晶振動子及びこれを使用した測定方法 Download PDFInfo
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- WO2009139418A1 WO2009139418A1 PCT/JP2009/058930 JP2009058930W WO2009139418A1 WO 2009139418 A1 WO2009139418 A1 WO 2009139418A1 JP 2009058930 W JP2009058930 W JP 2009058930W WO 2009139418 A1 WO2009139418 A1 WO 2009139418A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N11/00—Investigating flow properties of materials, e.g. viscosity, plasticity; Analysing materials by determining flow properties
- G01N11/10—Investigating flow properties of materials, e.g. viscosity, plasticity; Analysing materials by determining flow properties by moving a body within the material
- G01N11/16—Investigating flow properties of materials, e.g. viscosity, plasticity; Analysing materials by determining flow properties by moving a body within the material by measuring damping effect upon oscillatory body
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/02—Analysing fluids
- G01N29/022—Fluid sensors based on microsensors, e.g. quartz crystal-microbalance [QCM], surface acoustic wave [SAW] devices, tuning forks, cantilevers, flexural plate wave [FPW] devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/02—Analysing fluids
- G01N29/036—Analysing fluids by measuring frequency or resonance of acoustic waves
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2437—Piezoelectric probes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N9/00—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N9/00—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
- G01N9/002—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity using variation of the resonant frequency of an element vibrating in contact with the material submitted to analysis
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/028—Material parameters
- G01N2291/02818—Density, viscosity
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/042—Wave modes
- G01N2291/0426—Bulk waves, e.g. quartz crystal microbalance, torsional waves
Definitions
- the present invention relates to a quartz crystal resonator capable of measuring only the density of a solution alone or at the same time, and a measuring method using the same.
- the QCM (Quartz Crystal Microbalance) method which uses the resonance phenomenon of a crystal resonator, can measure not only in the gas phase but also in the liquid phase as a method that can detect extremely slight changes in mass with a simple device. It is widely used with film thickness sensors, chemical sensors, biosensors that measure the interaction of biological substances such as DNA and proteins, and the like.
- various measurements are performed by measuring the resonance frequency obtained by oscillation or the resonance frequency obtained by sweeping the frequency with an impedance analyzer, a network analyzer, or the like.
- the mass of the substance attached to the electrode surface is detected as the amount of change in frequency, so conversion to density is relatively easy.
- a method of measuring the density and viscosity of a solution by removing the resistance of the solution of the reference sensor from the measurement results of the remaining detectors has been proposed.
- providing a plurality of detection units on a single piezoelectric plate or using a plurality of sensors is time consuming or increases the manufacturing cost of the sensor.
- preparation of multiple standard samples is required, so there is a problem that it takes time until actual measurement, and information on both density and viscosity is also required. Since the density and the viscosity are obtained only from the resonance frequency including the noise, there is a problem that the measurement accuracy is considerably lowered.
- the present invention provides a quartz crystal resonator that can measure only the density of a solution alone or simultaneously the density and viscosity by a quartz crystal resonator provided with a single detection unit, and a measurement using the quartz crystal resonator. It aims to provide a method.
- the measurement method of the first solving means of the present invention includes an electrode provided on both sides of a piezoelectric plate and an electrode disposed on a side in contact with a substance to be measured, or detection on the electrode.
- a high frequency of the two frequencies indicating a half value of the maximum conductance of the crystal resonator by bringing the object to be measured into contact with the crystal resonator having a concavo-convex surface on the portion and vibrating the crystal resonator
- the density of the substance is measured by measuring the amount of change in the frequency (f 2 ) corresponding to the side.
- a second solving means is characterized in that, in the first solving means, the amount of change in at least two frequencies on the admittance circle diagram of the crystal resonator is measured, and the viscosity of the substance is also measured. And according to a third solving means, in the first solving means, at least two frequencies on the admittance circle diagram are two frequencies (f 1 , f) indicating half the maximum value of conductance of the crystal resonator. 2 ) and the resonance frequency (f s ) of the crystal resonator. According to a fourth solution, in the first solution, the frequency (f 2 ) directly measures a frequency corresponding to the minimum value (B min ) of the susceptance on the admittance circle diagram of the crystal resonator. It is characterized by.
- the at least two frequencies are two frequencies (f 1 , f 2 ) indicating a half value of a maximum conductance of the crystal resonator and the crystal vibration. It is any two of the resonance frequencies (f s ) of the child.
- the frequency (f 2 ) is a frequency corresponding to a low frequency side of two frequencies indicating a half value of a maximum conductance of the crystal resonator. It is characterized by indirectly measuring from (f 1 ) and the resonance frequency (f s ).
- An eighth solving means is characterized in that, in the first solving means, measurement is performed at a fundamental frequency or a higher order wave of the crystal resonator.
- a ninth solving means is provided with electrodes on both sides of the piezoelectric plate, and the density is applied to the electrode disposed on the side in contact with the substance to be measured or the detection unit on the electrode. An uneven surface for measurement is formed.
- a tenth solution means according to the ninth solution means is characterized in that the uneven surface is a surface having an arithmetic average roughness (Ra) of 0.1 ⁇ m to 20 ⁇ m.
- the eleventh solving means is characterized in that, in the ninth solving means, the uneven surface is constituted by adjoining a plurality of grooves.
- the density of the solution alone or the density and the viscosity can be easily and easily measured with only a quartz resonator having a single detection unit, which was not possible with the conventional QCM method.
- the quartz crystal resonator used in the present invention has electrodes on both sides of the piezoelectric plate, and an unevenness is formed on the electrode disposed on the side in contact with the substance to be measured or on the detection unit formed by vapor deposition or sputtering on the electrode.
- a surface is formed.
- Examples of a method for forming a concavo-convex surface on the surface of the electrode or the detection unit include, for example, forming a concavo-convex surface in advance on the surface of the portion where the detection unit of the crystal plate is provided, or degree of surface polishing of the crystal plate And a metal film to be an electrode is formed thereon.
- the uneven surface may be partially provided on the electrode surface or the detection unit.
- the uneven surface is preferably a surface having an arithmetic average roughness (Ra) of 0.1 ⁇ m to 20 ⁇ m. If Ra is less than 0.1 ⁇ m, the density of the measurement object cannot be measured, and as a result, the viscosity cannot be obtained. This is because if it exceeds 20 ⁇ m, the crystal resonator cannot maintain a state suitable for measurement, and the measurement frequency may become unstable or each frequency itself may not be obtained.
- the uneven surface is preferably a groove, and a plurality of grooves are preferably provided. This is because a concave surface for receiving the measurement object can be formed.
- the width of the groove is preferably about 0.1 to 100 ⁇ m, and the depth is preferably about 0.1 to 40 ⁇ m.
- the extending direction of the groove is preferably a direction intersecting the vibrating direction of the quartz plate, preferably Is a direction perpendicular to the vibration direction.
- the crystal resonator is vibrated at a predetermined frequency, and the measurement object is brought into contact with the electrode or the detection unit formed on the electrode. At that time, the amount of change in the frequency (f 2 ) corresponding to the high frequency side of the two frequencies indicating half the maximum value of the conductance of the crystal resonator is measured, and the crystal resonator shown in FIG. The amount of change in at least two frequencies present on the admittance circle diagram representing the characteristics of
- the amount of frequency change that gives a point on this admittance circle diagram shows the same amount of change with respect to the mass load of the substance.
- the amount of frequency change due to the resistance of the solution becomes a different amount of change at each frequency.
- the amount of frequency change received by the resistance of the solution having the frequency f 1 corresponding to the low frequency side of the frequency showing the half value of the maximum value of the conductance of the crystal resonator is that the resonance frequency f s is the resistance of the solution.
- the frequency f 2 corresponding to the high frequency side of the frequency showing the half value of the maximum value of the conductance of the crystal resonator is hardly affected by the resistance of the solution. This can also be understood from the following approximate expression in a solution having frequencies f 1 , f s and f 2 .
- f 0 is the fundamental frequency
- ⁇ L is the viscosity
- ⁇ Q is the crystal oscillator Density
- ⁇ Q is the shear modulus of the quartz oscillator
- ⁇ m is the mass change amount
- A is the electrode area
- ⁇ L is the density of the solution
- ⁇ L is the viscosity of the solution.
- the frequency change amount due to the mass load all shows the same change, so f s is the frequency change amount due to the resistance of the solution, and the frequency change of the mass load. The amount is added. Similarly, f 1 is obtained by adding the frequency change amount of the mass load in addition to the frequency change amount due to the resistance of the solution.
- the viscosity ⁇ L can be obtained by substituting the density obtained from the frequency change amount of f 2 and the frequency change amount of only the resistance of the measurement object into the following equation (4).
- ⁇ f L represents the frequency change amount only for the resistance of the measurement object applied to the vibration surface of the crystal resonator.
- the frequency to be measured in order to obtain the frequency change amount of the resistance of the object to be measured on the vibration surface of the crystal resonator is not particularly limited as long as it is at least two frequencies on the admittance circle diagram. not limited to f 1 and f 2 that illustrated, f 1 and f s, or may measure the f s and f 2.
- the frequency used for the measurement is not limited to the fundamental wave, and if each higher-order wave is used, the pressure wave generated between the crystal resonator and the liquid surface can be reduced.
- the frequency measurement described above may be either a method of oscillating a crystal resonator and measuring with a frequency counter, or a method of sweeping the frequency using an impedance analyzer or a network analyzer.
- examples of the shape of the sensor peripheral portion including the sensor include a cup type, a drop placement type, and a flow cell type, but the density and viscosity of the solution can be measured regardless of the form.
- FIG. 2 a 27 MHz crystal resonator 3 having gold electrodes 2 and 2 on both sides of the piezoelectric plate 1 is prepared, and the gold electrode 2 on the side in contact with the solution of the crystal resonator 3 is prepared.
- FIG. 3 a plurality of grooves 4, 4, 4 having a rectangular cross section were provided adjacently on the surface, and a detection portion was formed on the electrode 3.
- the electrodes 2 and 2 were made of gold having a diameter of 2.7 mm, the groove width W and the groove interval I of the groove 4 were both 5 ⁇ m, and the groove depth D was 600 nm.
- This crystal unit 3 is provided in an aluminum block with an automatic stirring function and a temperature controller to form a sensor 5 and connected to a network analyzer 7 for measuring the frequency through a ⁇ circuit 6 as shown in FIG.
- the signal from the analyzer 7 is captured by the personal computer 8.
- the sensor 5 was made to maintain the liquid temperature of a measurement object at 25 degreeC during the following measurements.
- the frequency when 500 ⁇ l of a reference sample (pure water) and a 10 wt%, 30 wt%, and 50 wt% glycerol aqueous solution with known density and viscosity are placed on the electrode 4 of the crystal resonator 3 as a measurement sample.
- a reference sample pure water
- a 10 wt%, 30 wt%, and 50 wt% glycerol aqueous solution with known density and viscosity were placed on the electrode 4 of the crystal resonator 3 as a measurement sample.
- Table 2 shows the amount of change in the frequency of (f 1 -f 1 ) / 2 obtained from the resonance frequencies f s , f 1 , and f 2 for comparison with f 2 and the conventional QCM method. .
- the f s used in the conventional QCM method is obtained by measurement because the total value of the frequency taken into the irregularities of the detection unit and detected as mass and the frequency of resistance of the solution is detected. It was not possible to determine the amount of the solution that was taken into the unevenness and detected as mass from the amount of frequency change.
- the density was calculated from the amount of change in frequency of the 10 wt%, 30 wt%, and 50 wt% glycerol aqueous solution based on that. The results are shown in the following Table 2 and the graph of FIG.
- the density value obtained from the amount of frequency change was close to the density described in the Chemical Handbook (published in 1984, 3rd edition).
- the viscosity was obtained from the density obtained from the above-mentioned frequency change amount and the frequency change amount of (f 1 ⁇ f 2 ) / 2 that represents the frequency of the resistance of the solution applied to the vibration surface of the crystal unit 3.
- the density of the crystal unit 3 was 2.65 g / cm 3 and the shear modulus of the crystal unit 3 was 2.95 ⁇ 10 11 g / cm ⁇ S 2 . Since the viscosity ⁇ was calculated by substituting each numerical value into the equation (4), it is shown in the following Table 3 and the graph of FIG.
- the viscosity value obtained from the amount of frequency change showed a value close to the viscosity calculated with reference to the values in the chemical handbook.
- the viscosity calculated with reference to the values in the chemical handbook was a value obtained by approximation from the values described at around 25 ° C. because there was no numerical value at 25 ° C. From the above, it has been found that the density and viscosity of the solution can be simultaneously and accurately measured with only one crystal resonator 3 having one detection unit. In the above example, the density and the viscosity are measured simultaneously, but it is also possible to measure only the density alone. If only the viscosity is required, it is naturally possible to measure only the viscosity alone based on the obtained density.
- the present invention can be used to measure the density and / or viscosity of a solution in a small amount.
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Abstract
Description
従来のQCM法では発振によって得られた共振周波数、或いは、インピーダンスアナライザーやネットワークアナライザーなどにより周波数を掃引して得た共振周波数を測定することにより、種々の測定を行っている。
QCMでの気相における測定では、電極表面に付着した物質の質量のみを周波数変化量として検知するため、密度への変換は比較的容易である。
しかしながら、溶液の密度と粘度を測定する場合は、気相の場合とは異なり、水晶振動子の振動面にかかる溶液の抵抗分のを周波数変化は密度と粘性を乗算した値と相関関係があるため、従来のQCM法では溶液の密度と粘度の分離測定を行うことは困難であった。
よって、密度と粘度の両方が未知の場合、従来のQCM法では密度と粘度のそれぞれの値を求めることはできなかった。
これに対して、特許文献1や特許文献2に示されるように、センサーに検出部を2個以上設けて、少なくとも1個の検出部を溶液の抵抗分の周波数を測定するための参照用として用い、残りの検出部の測定結果から参照用のセンサーの溶液の抵抗分を除くことにより、溶液の密度や粘度を測定する方法が提案されている。
しかしながら、1枚の圧電板に複数の検出部を設けたり、或いは、センサーを複数個用いるようにしたりすると手間がかかったり、或いは、センサの製造コストの増加につながり、しかも、検出部毎に個体差が生じるという問題がある。
また、1個のセンサーで検量線を引く場合には、複数の標準の試料の準備が必要となるので、実際の測定までに時間を要するという問題があり、更に、密度と粘度の両方の情報を含んだ共振周波数からしか密度や粘度を求めることになるため、測定精度がかなり低くなるという問題があった。
第2の解決手段は、第1の解決手段において、前記水晶振動子のアドミタンス円線図上の周波数の少なくとも2つの周波数の変化量を測定し、前記物質の粘度を併せて測定することを特徴とする。
第3の解決手段は、第1の解決手段において、前記アドミタンス円線図上の少なくとも2つの周波数は、前記水晶振動子のコンダクタンスの最大値の半分の値を示す2つの周波数(f1,f2)及び前記水晶振動子の共振周波数(fs)のうちの何れか2つであることを特徴とする。
第4の解決手段は、第1の解決手段において、前記周波数(f2)は、前記水晶振動子のアドミタンス円線図上のサセプタンスの最小値(Bmin)に相当する周波数を直接測定することを特徴とする。
第5の解決手段は、第1の解決手段において、前記水晶振動子のコンダクタンスの最大値の半分の値を示す2つの周波数(f1,f2)間の周波数のうちの少なくとも2つの周波数の変化量を測定することにより、前記物質の粘度を併せて測定することを特徴とする。
第6の解決手段は、第5の解決手段において、前記少なくとも2つの周波数は、前記水晶振動子のコンダクタンスの最大値の半分の値を示す2つの周波数(f1,f2)及び前記水晶振動子の共振周波数(fs)のうちの何れか2つであることを特徴とする。
第7の解決手段は、第1の解決手段において、前記周波数(f2)は、前記水晶振動子のコンダクタンスの最大値の半分の値を示す2つの周波数のうちの低周波数側に相当する周波数(f1)と、共振周波数(fs)とから間接的に測定することを特徴とする。
第8の解決手段は、第1の解決手段において、前記水晶振動子の基本周波数又は高次波で測定を行うことを特徴とする。
また、本発明の水晶振動子として、第9の解決手段は、圧電板の両面に電極を備え、測定対象となる物質が接触する側に配置された電極又は該電極上の検出部に、密度測定用の凹凸面を形成したことを特徴とする。
第10の解決手段は、第9の解決手段において、前記凹凸面は、算術平均粗さ(Ra)が0.1μm~20μmの面であることを特徴とする。
第11の解決手段は、第9の解決手段において、前記凹凸面は、複数の溝を隣接して構成されることを特徴とする。
前記電極表面又は検出部の表面に凹凸面を形成する方法としては、例えば、水晶板の検出部を設ける部位の表面を予め凹凸面を形成しておいたり、或いは、水晶板の表面研磨の程度を抑え、この上に電極となる金属膜を成膜することにより行うことができる。尚、凹凸面は、前記電極表面又は検出部に対して部分的に設けるようにすることも可能である。
前記凹凸面は、算術平均粗さ(Ra)が0.1μm~20μmの面とすることが好ましい。Raが、0.1μm未満であると、測定対象物の密度の測定ができず、その結果粘度を求めることもできないためである。20μmを超えると、水晶振動子が測定に適した状態を維持できず、測定周波数が不安定になったり各周波数自体が得られない可能性があるためである。
また、前記凹凸面は、溝とすることが好ましく、この溝は複数本設けることが好ましい。測定対象物を受け入れる凹面を形成できるからである。尚、この溝の幅は、0.1~100μm程度とし、その深さは0.1~40μm程度とすることが好ましい。尚、水晶板は、板面と平行に一定の方向に振動するので、溝内において測定対象物を確実に捕捉するために、溝の延出方向を、水晶板の振動方向と交わる方向、好ましくは、振動方向に対して垂直方向とする。
まず、水晶振動子を所定の周波数で振動させ、電極又は電極上に形成された検出部に測定対象物を接触させる。
その際、水晶振動子のコンダクタンスの最大値の半分の値を示す2つの周波数のうちの高周波数側に相当する周波数(f2)の変化量を測定するとともに、図1に示される水晶振動子の特性を表すアドミタンス円線図上に存在する少なくとも2つの周波数の変化量を測定する。
従って、例えば、水晶振動子のコンダクタンスの最大値の半分の値を示す周波数のうちの低周波数側に相当する周波数f1の溶液の抵抗によって受ける周波数変化量は、共振周波数fsが溶液の抵抗によって受ける周波数変化量の2倍となる。一方、水晶振動子のコンダクタンスの最大値の半分の値を示す周波数のうちの高周波数側に相当する周波数f2は、溶液の抵抗によって受ける周波数変化量はほぼない。
このことは、周波数f1,fs及びf2の溶液中における下記の近似式からも理解することができる。
そして、この凹凸面に取り込まれる液体の体積を予め測定等により取得しておき、(3)式より得られた質量をこの体積により除すれば、密度を求めることができる。
また、上述した周波数の測定には、水晶振動子を発振させて周波数カウンターで測定する方法でも、インピーダンスアナライザーやネットワークアナライザーを用いて周波数を掃引する方法のいずれであっても良い。
また、センサーを含むセンサー周辺部の形状は、カップ型や液滴の載置型、フローセル型などが挙げられるが、形態は特に問わずに溶液の密度や粘度の測定ができる。
図2に示されるように、圧電板1の両側に金電極2,2を備えて構成された27MHzの水晶振動子3を用意し、該水晶振動子3の溶液が接する側の金電極2の表面に、図3に示されるように、その断面が矩形状の複数の溝4,4,4を隣接して設け、電極3上に検出部を形成した。
電極2,2は、直径2.7mmの金から構成し、溝4の溝幅Wと溝間隔Iは、ともに5μmとし、溝の深さDは600nmとした。
この水晶振動子3を、自動攪拌機能及び温調機付きのアルミニウムのブロック内に設けてセンサー5とし、図4に示すように、π回路6を通して周波数を測定するネットワークアナライザ7に接続し、ネットワークアナライザ7からの信号をパソコン8で取り込むようにした。
尚、センサー5は、以下の測定中は、測定対象物の液温を25℃に維持するようにした。
尚、27MHzの水晶振動子3の感度は、30pg/Hz、25℃の純水の密度は0.997g/cm3で計算した。
その結果を、以下の表2及び図5のグラフに示す。
尚、水晶振動子3の密度は2.65g/cm3、水晶振動子3の剪断弾性係数は2.95×1011g/cm・S2で計算した。
(4)式に各数値を代入することで、粘度ηが算出されたので、以下の表3及び図6のグラフに示す。
以上から、1個の検出部を有する1個の水晶振動子3のみで溶液の密度や粘度を、同時に精度よく測定できることが解かった。
尚、上記例では、密度と粘度とを同時に測定したものであるが、密度のみを単独に測定することも可能である。また、粘度のみが必要な場合には、得られた密度に基づいて粘度だけを単独で測定することも当然可能である。
2 金電極
3 水晶振動子
4 溝
5 センサー
6 π回路
7 ネットワークアナライザー
Claims (11)
- 圧電板の両面に電極を備え、測定対象となる物質が接触する側に配置された電極又は該電極上の検出部に、凹凸面が形成された水晶振動子に測定対象物を接触させるとともに水晶振動子を振動させ、
前記水晶振動子のコンダクタンスの最大値の半分の値を示す2つの周波数のうちの高周波数側に相当する周波数(f2)の変化量を測定することにより、前記物質の密度を測定することを特徴とする水晶振動子を使用した測定方法。 - 前記水晶振動子のアドミタンス円線図上の周波数の少なくとも2つの周波数の変化量を測定し、前記物質の粘度を併せて測定することを特徴とする請求項1に記載の測定方法。
- 前記アドミタンス円線図上の少なくとも2つの周波数は、前記水晶振動子のコンダクタンスの最大値の半分の値を示す2つの周波数(f1,f2)及び前記水晶振動子の共振周波数(fs)のうちの何れか2つであることを特徴とする請求項2に記載の測定方法。
- 前記周波数(f2)は、前記水晶振動子のアドミタンス円線図上のサセプタンスの最小値(Bmin)に相当する周波数を直接測定することを特徴とする請求項1に記載の測定方法。
- 前記水晶振動子のコンダクタンスの最大値の半分の値を示す2つの周波数(f1,f2)間の周波数のうちの少なくとも2つの周波数の変化量を測定することにより、前記物質の粘度を併せて測定することを特徴とする請求項1に記載の水晶振動子を使用した測定方法。
- 前記少なくとも2つの周波数は、前記水晶振動子のコンダクタンスの最大値の半分の値を示す2つの周波数(f1,f2)及び前記水晶振動子の共振周波数(fs)のうちの何れか2つであることを特徴とする請求項5に記載の水晶振動子を使用した測定方法。
- 前記周波数(f2)は、前記水晶振動子のコンダクタンスの最大値の半分の値を示す2つの周波数のうちの低周波数側に相当する周波数(f1)と、共振周波数(fs)とから間接的に測定することを特徴とする請求項1に記載の測定方法。
- 前記水晶振動子の基本周波数又は高次波で測定を行うことを特徴とする請求項1に記載の測定方法。
- 圧電板の両面に電極を備え、測定対象となる物質が接触する側に配置された電極又は該電極上の検出部に、密度測定用の凹凸面を形成したことを特徴とする水晶振動子。
- 前記凹凸面は、算術平均粗さ(Ra)が0.1μm~20μmの面であることを特徴とする請求項9に記載の水晶振動子。
- 前記凹凸面は、複数の溝を隣接して構成されることを特徴とする請求項9に記載の水晶振動子。
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JP2010512003A JP5140724B2 (ja) | 2008-05-14 | 2009-05-13 | 水晶振動子及びこれを使用した測定方法 |
EP09746624.7A EP2278298A4 (en) | 2008-05-14 | 2009-05-13 | Quartz oscillator and measurement method using same |
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JP2011203246A (ja) * | 2010-03-03 | 2011-10-13 | Noboru Wakatsuki | 粘弾性評価装置 |
CN106153718A (zh) * | 2016-08-18 | 2016-11-23 | 中国工程物理研究院总体工程研究所 | 一种具有双工作模式的压电晶体气体传感器 |
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EP2805158B8 (en) | 2012-01-16 | 2020-10-07 | Abram Scientific, Inc. | Methods and devices for measuring physical properties of fluid |
WO2013142244A1 (en) | 2012-03-19 | 2013-09-26 | Oyj, Kemira | Methods of measuring a characteristic of a creping adhesive film and methods of modifying the creping adhesive film |
WO2014024309A1 (ja) * | 2012-08-10 | 2014-02-13 | 富士通株式会社 | Qcmセンサとその製造方法 |
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CN104833610B (zh) * | 2015-04-23 | 2017-07-28 | 电子科技大学 | 一种基于压电体声波谐振式传感器的液体属性测量方法 |
EP3258239A1 (en) | 2016-06-13 | 2017-12-20 | INL - International Iberian Nanotechnology Laboratory | Method for validating a resonator |
CN110346239B (zh) * | 2019-07-10 | 2022-02-11 | 国家纳米科学中心 | 一种纳米材料密度的检测方法 |
EP4045188A4 (en) * | 2019-10-18 | 2023-11-22 | Qatch Technologies | APPARATUS AND METHOD FOR REAL-TIME MEASUREMENT OF RHEOLOGICAL PROPERTIES OF A FLUID |
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