WO2009066358A1 - 質量分析計 - Google Patents

質量分析計 Download PDF

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Publication number
WO2009066358A1
WO2009066358A1 PCT/JP2007/001291 JP2007001291W WO2009066358A1 WO 2009066358 A1 WO2009066358 A1 WO 2009066358A1 JP 2007001291 W JP2007001291 W JP 2007001291W WO 2009066358 A1 WO2009066358 A1 WO 2009066358A1
Authority
WO
WIPO (PCT)
Prior art keywords
pipe
connecting portion
screw
mass spectrometer
removed completely
Prior art date
Application number
PCT/JP2007/001291
Other languages
English (en)
French (fr)
Inventor
Tomohito Nakano
Original Assignee
Shimadzu Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corporation filed Critical Shimadzu Corporation
Priority to US12/742,317 priority Critical patent/US8173958B2/en
Priority to JP2009542417A priority patent/JP4919117B2/ja
Priority to PCT/JP2007/001291 priority patent/WO2009066358A1/ja
Publication of WO2009066358A1 publication Critical patent/WO2009066358A1/ja

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

 試料をイオン化するイオン化室と分析室とを区画するそれぞれの隔壁に対して、電熱式で加熱されるパイプを架設し該パイプを介してイオン化室のイオンを分析室に導入する質量分析計では従来より、パイプの着脱が、パイプに接続されている電極の接続部と前記隔壁に配設された支柱の接続部とをネジ止めすることによって行われている。しかしこれには、パイプの洗浄や交換の都度、ネジを完全に外れるまで緩める必要があり、作業性が悪かった。そこで、本発明では、電極接続部のネジ止め用ねじ穴をパイプの軸を中心とする回転方向を向いた切り欠きとする。これにより、パイプの着脱を、ネジを完全に取り外すことなく緩めた状態で行うことができるようになる。
PCT/JP2007/001291 2007-11-22 2007-11-22 質量分析計 WO2009066358A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
US12/742,317 US8173958B2 (en) 2007-11-22 2007-11-22 Mass spectrometer
JP2009542417A JP4919117B2 (ja) 2007-11-22 2007-11-22 質量分析計
PCT/JP2007/001291 WO2009066358A1 (ja) 2007-11-22 2007-11-22 質量分析計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/001291 WO2009066358A1 (ja) 2007-11-22 2007-11-22 質量分析計

Publications (1)

Publication Number Publication Date
WO2009066358A1 true WO2009066358A1 (ja) 2009-05-28

Family

ID=40667196

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/001291 WO2009066358A1 (ja) 2007-11-22 2007-11-22 質量分析計

Country Status (3)

Country Link
US (1) US8173958B2 (ja)
JP (1) JP4919117B2 (ja)
WO (1) WO2009066358A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021064561A (ja) * 2019-10-16 2021-04-22 株式会社島津製作所 質量分析装置

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6025406B2 (ja) * 2012-06-04 2016-11-16 株式会社日立ハイテクノロジーズ 質量分析装置
GB201810823D0 (en) * 2018-06-01 2018-08-15 Micromass Ltd An inner source assembly and associated components
CN110808204B (zh) * 2019-11-12 2022-02-08 湖南刘文龙生物医药有限责任公司 一种自清洗质谱装置

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01289029A (ja) * 1988-05-17 1989-11-21 Yamatake Honeywell Co Ltd スイツチの動作表示装置
JPH05109356A (ja) * 1991-10-18 1993-04-30 Mitsubishi Electric Corp 回路遮断器の操作装置
JPH0544849U (ja) * 1991-11-21 1993-06-15 株式会社東芝 カバー着脱装置
JPH11118764A (ja) * 1997-10-21 1999-04-30 Shimadzu Corp 液体クロマトグラフ質量分析装置
JP2001343361A (ja) * 2000-05-31 2001-12-14 Shimadzu Corp 液体クロマトグラフ質量分析装置
JP2003222612A (ja) * 2002-01-30 2003-08-08 Hitachi High-Technologies Corp 大気圧イオン化質量分析装置および分析方法
JP2005024340A (ja) * 2003-06-30 2005-01-27 Tdk Corp 外形寸法判定ゲージ

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000028579A (ja) * 1998-07-08 2000-01-28 Hitachi Ltd 試料ガス採取装置及び危険物探知装置
US6667474B1 (en) * 2000-10-27 2003-12-23 Thermo Finnigan Llc Capillary tube assembly with replaceable capillary tube
WO2002101788A1 (fr) * 2001-06-08 2002-12-19 Japan Science And Technology Corporation Dispositif de spectrometrie de masse de liquide refroidisseur
JP2003202325A (ja) 2002-01-09 2003-07-18 Shimadzu Corp 液体クロマトグラフ質量分析計
EP1593144B8 (en) * 2003-02-14 2010-02-03 MDS Inc. Atmospheric pressure charged particle discriminator for mass spectrometry
WO2004081555A1 (ja) * 2003-03-14 2004-09-23 Nec Corporation 質量分析システムおよび分析方法
EP1766651A2 (en) * 2004-05-21 2007-03-28 Craig M. Whitehouse Charged droplet sprayers
US7872225B2 (en) * 2006-08-25 2011-01-18 Perkinelmer Health Sciences, Inc. Sample component trapping, release, and separation with membrane assemblies interfaced to electrospray mass spectrometry

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01289029A (ja) * 1988-05-17 1989-11-21 Yamatake Honeywell Co Ltd スイツチの動作表示装置
JPH05109356A (ja) * 1991-10-18 1993-04-30 Mitsubishi Electric Corp 回路遮断器の操作装置
JPH0544849U (ja) * 1991-11-21 1993-06-15 株式会社東芝 カバー着脱装置
JPH11118764A (ja) * 1997-10-21 1999-04-30 Shimadzu Corp 液体クロマトグラフ質量分析装置
JP2001343361A (ja) * 2000-05-31 2001-12-14 Shimadzu Corp 液体クロマトグラフ質量分析装置
JP2003222612A (ja) * 2002-01-30 2003-08-08 Hitachi High-Technologies Corp 大気圧イオン化質量分析装置および分析方法
JP2005024340A (ja) * 2003-06-30 2005-01-27 Tdk Corp 外形寸法判定ゲージ

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021064561A (ja) * 2019-10-16 2021-04-22 株式会社島津製作所 質量分析装置
JP7238724B2 (ja) 2019-10-16 2023-03-14 株式会社島津製作所 質量分析装置

Also Published As

Publication number Publication date
US8173958B2 (en) 2012-05-08
US20100264307A1 (en) 2010-10-21
JP4919117B2 (ja) 2012-04-18
JPWO2009066358A1 (ja) 2011-03-31

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