WO2009044609A1 - 磁気抵抗記憶素子、磁気抵抗記憶装置及び磁気抵抗記憶装置の動作方法 - Google Patents

磁気抵抗記憶素子、磁気抵抗記憶装置及び磁気抵抗記憶装置の動作方法 Download PDF

Info

Publication number
WO2009044609A1
WO2009044609A1 PCT/JP2008/066289 JP2008066289W WO2009044609A1 WO 2009044609 A1 WO2009044609 A1 WO 2009044609A1 JP 2008066289 W JP2008066289 W JP 2008066289W WO 2009044609 A1 WO2009044609 A1 WO 2009044609A1
Authority
WO
WIPO (PCT)
Prior art keywords
magnetoresistive
magnetic body
storage device
random access
access memory
Prior art date
Application number
PCT/JP2008/066289
Other languages
English (en)
French (fr)
Inventor
Yuukou Katou
Original Assignee
Nec Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nec Corporation filed Critical Nec Corporation
Priority to JP2009536003A priority Critical patent/JPWO2009044609A1/ja
Publication of WO2009044609A1 publication Critical patent/WO2009044609A1/ja

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/161Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1673Reading or sensing circuits or methods
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1675Writing or programming circuits or methods
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00Galvanomagnetic devices
    • H10N50/10Magnetoresistive devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Memories (AREA)
  • Magnetic Heads (AREA)
  • Mram Or Spin Memory Techniques (AREA)
  • Hall/Mr Elements (AREA)

Abstract

 磁気抵抗記憶素子は、第1の磁性体1と、第2の磁性体3と、第1のトンネル絶縁体2と、第3の磁性体5と、第2のトンネル絶縁体4とを備える。第1の磁性体1は、磁化方向を固定されている。第2の磁性体3は、データにより磁化状態が変化する。第1のトンネル絶縁体2は、第1の磁性体1と第2の磁性体3との間に設けられている。第3の磁性体5は、データの書込み時と読出し時とで磁化状態が異なりかつ磁気異方性が第2の磁性体3の磁気異方性より小さい。第2のトンネル絶縁体4は、第2の磁性体3と第3の磁性体5との間に設けられている。
PCT/JP2008/066289 2007-10-02 2008-09-10 磁気抵抗記憶素子、磁気抵抗記憶装置及び磁気抵抗記憶装置の動作方法 WO2009044609A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009536003A JPWO2009044609A1 (ja) 2007-10-02 2008-09-10 磁気抵抗記憶素子、磁気抵抗記憶装置及び磁気抵抗記憶装置の動作方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007258479 2007-10-02
JP2007-258479 2007-10-02

Publications (1)

Publication Number Publication Date
WO2009044609A1 true WO2009044609A1 (ja) 2009-04-09

Family

ID=40526038

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/066289 WO2009044609A1 (ja) 2007-10-02 2008-09-10 磁気抵抗記憶素子、磁気抵抗記憶装置及び磁気抵抗記憶装置の動作方法

Country Status (2)

Country Link
JP (1) JPWO2009044609A1 (ja)
WO (1) WO2009044609A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014120707A (ja) * 2012-12-19 2014-06-30 Samsung Electronics Co Ltd 改良型特性を有する磁気接合を提供する方法およびシステム
CN113508469A (zh) * 2019-03-06 2021-10-15 国际商业机器公司 基于磁畴壁的非易失性、线性和双向突触权重元件

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002261352A (ja) * 2000-12-07 2002-09-13 Commiss Energ Atom 記憶機能を有する磁気スピン極性化および磁化回転装置および当該装置を用いた書き込み方法
JP2007123455A (ja) * 2005-10-27 2007-05-17 Renesas Technology Corp 半導体記憶装置
JP2007150265A (ja) * 2005-10-28 2007-06-14 Toshiba Corp 磁気抵抗効果素子および磁気記憶装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002261352A (ja) * 2000-12-07 2002-09-13 Commiss Energ Atom 記憶機能を有する磁気スピン極性化および磁化回転装置および当該装置を用いた書き込み方法
JP2007123455A (ja) * 2005-10-27 2007-05-17 Renesas Technology Corp 半導体記憶装置
JP2007150265A (ja) * 2005-10-28 2007-06-14 Toshiba Corp 磁気抵抗効果素子および磁気記憶装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014120707A (ja) * 2012-12-19 2014-06-30 Samsung Electronics Co Ltd 改良型特性を有する磁気接合を提供する方法およびシステム
CN113508469A (zh) * 2019-03-06 2021-10-15 国际商业机器公司 基于磁畴壁的非易失性、线性和双向突触权重元件
JP2022522128A (ja) * 2019-03-06 2022-04-14 インターナショナル・ビジネス・マシーンズ・コーポレーション 磁壁ベースの不揮発性、線形、かつ双方向性のシナプス重み素子
JP7488005B2 (ja) 2019-03-06 2024-05-21 インターナショナル・ビジネス・マシーンズ・コーポレーション 磁壁ベースの不揮発性、線形、かつ双方向性のシナプス重み素子

Also Published As

Publication number Publication date
JPWO2009044609A1 (ja) 2011-02-03

Similar Documents

Publication Publication Date Title
WO2009019947A1 (ja) 磁壁ランダムアクセスメモリ
EP2276034A3 (en) Self-referenced magnetic random access memory cell
CN106875969B (zh) 磁存储器
WO2008120482A1 (ja) 磁気ランダムアクセスメモリ
US8270197B2 (en) Method of operating information storage device using magnetic domain wall movement
ATE528764T1 (de) Magnetoresistive tcam-direktzugriffsspeicherzelle
BRPI0808640A8 (pt) controle de força de transistor de linha de palavra para leitura e escrita em memória de acesso aleatório magnetoresistiva de transferência de torque por meio do spin (stt-mram)
BRPI0809982A2 (pt) Métodos de projeto e memória de acesso aleatório magnetorresistiva de transferência de torque por meio de spin.
WO2007030681A3 (en) Method of manufacturing a limited use data storing device
WO2005020242A3 (en) Magnetic memory element utilizing spin transfer switching and storing multiple bits
IL200344A0 (en) Magnetic tunnel junction magnetic memory
WO2006017367A3 (en) Exchange-bias based multi-state magnetic memory and logic devices and magnetically stabilized magnetic storage
TW200625606A (en) MRAM cell with reduced write current
TW200737182A (en) High-bandwidth magnetoresistive random access memory devices and methods of operation thereof
EP1471543A3 (en) Magnetoresistive structures and magnetic recording disc drive
WO2006118677A3 (en) HIGHLY ORDERED L10 FePT NANOMAGNETS FOR DATA STORAGE AND MAGNETIC SENSING AND METHOD OF MAKING
US20100172169A1 (en) Magnetic structures, information storage devices including magnetic structures, methods of manufacturing and methods of operating the same
WO2003050817A3 (en) Segmented write line architecture
WO2006014395A3 (en) Memory systems and methods
CN101625890B (zh) 操作磁随机存取存储器装置的方法
WO2007143398A3 (en) Verify operation for non-volatile storage using different voltages
WO2008108109A1 (ja) 磁気メモリセル及び磁気ランダムアクセスメモリ
WO2009078244A1 (ja) 磁気ランダムアクセスメモリ、及び、磁気ランダムアクセスメモリの初期化方法
WO2003063169A3 (en) Magnetoresistive memory devices and assemblies; and methods of storing and retrieving information
WO2009037910A1 (ja) 磁気ランダムアクセスメモリ、その書き込み方法、及び磁気抵抗効果素子

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 08835924

Country of ref document: EP

Kind code of ref document: A1

WWE Wipo information: entry into national phase

Ref document number: 2009536003

Country of ref document: JP

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 08835924

Country of ref document: EP

Kind code of ref document: A1