WO2009037769A1 - 半導体集積回路装置および半導体集積回路装置の試験方法 - Google Patents

半導体集積回路装置および半導体集積回路装置の試験方法 Download PDF

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Publication number
WO2009037769A1
WO2009037769A1 PCT/JP2007/068257 JP2007068257W WO2009037769A1 WO 2009037769 A1 WO2009037769 A1 WO 2009037769A1 JP 2007068257 W JP2007068257 W JP 2007068257W WO 2009037769 A1 WO2009037769 A1 WO 2009037769A1
Authority
WO
WIPO (PCT)
Prior art keywords
circuit
semiconductor integrated
integrated circuit
same
circuit device
Prior art date
Application number
PCT/JP2007/068257
Other languages
English (en)
French (fr)
Inventor
Kenji Ijitsu
Original Assignee
Fujitsu Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Limited filed Critical Fujitsu Limited
Priority to JP2009533001A priority Critical patent/JP5158087B2/ja
Priority to PCT/JP2007/068257 priority patent/WO2009037769A1/ja
Publication of WO2009037769A1 publication Critical patent/WO2009037769A1/ja
Priority to US12/656,696 priority patent/US7843210B2/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31707—Test strategies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

　論理回路と、メモリ回路と、メモリ回路にデータを書き込む際に当該データを保持するレジスタ回路と、レジスタ回路からの出力とメモリ回路からの出力とのうちのいずれかを選択して論理回路に出力するセレクタ回路とよりなり、セレクタ回路で前記レジスタ回路からの出力を選択して論理回路に出力することで論理回路の動作試験を行う構成である。
PCT/JP2007/068257 2007-09-20 2007-09-20 半導体集積回路装置および半導体集積回路装置の試験方法 WO2009037769A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009533001A JP5158087B2 (ja) 2007-09-20 2007-09-20 半導体集積回路装置および半導体集積回路装置の試験方法
PCT/JP2007/068257 WO2009037769A1 (ja) 2007-09-20 2007-09-20 半導体集積回路装置および半導体集積回路装置の試験方法
US12/656,696 US7843210B2 (en) 2007-09-20 2010-02-12 Semiconductor integrated circuit device and testing method of the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/068257 WO2009037769A1 (ja) 2007-09-20 2007-09-20 半導体集積回路装置および半導体集積回路装置の試験方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/656,696 Continuation US7843210B2 (en) 2007-09-20 2010-02-12 Semiconductor integrated circuit device and testing method of the same

Publications (1)

Publication Number Publication Date
WO2009037769A1 true WO2009037769A1 (ja) 2009-03-26

Family

ID=40467600

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/068257 WO2009037769A1 (ja) 2007-09-20 2007-09-20 半導体集積回路装置および半導体集積回路装置の試験方法

Country Status (3)

Country Link
US (1) US7843210B2 (ja)
JP (1) JP5158087B2 (ja)
WO (1) WO2009037769A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018137024A (ja) * 2017-02-21 2018-08-30 株式会社東芝 半導体集積回路
JP2020098182A (ja) * 2018-12-19 2020-06-25 ルネサスエレクトロニクス株式会社 半導体装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01267475A (ja) * 1988-04-19 1989-10-25 Fujitsu Ltd 論理集積回路
JPH1073641A (ja) * 1996-08-30 1998-03-17 Mitsubishi Electric Corp テスト回路
JPH11101858A (ja) * 1997-09-29 1999-04-13 Toshiba Microelectronics Corp 半導体集積回路

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3132424B2 (ja) 1997-06-13 2001-02-05 日本電気株式会社 データ処理装置
JP2003100100A (ja) * 2001-07-19 2003-04-04 Mitsubishi Electric Corp 半導体集積回路装置
JP4481588B2 (ja) * 2003-04-28 2010-06-16 株式会社東芝 半導体集積回路装置
JP2006155682A (ja) * 2004-11-25 2006-06-15 Matsushita Electric Ind Co Ltd Ｌｓｉテスト回路
JP4707053B2 (ja) * 2005-06-06 2011-06-22 ルネサスエレクトロニクス株式会社 半導体集積回路装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01267475A (ja) * 1988-04-19 1989-10-25 Fujitsu Ltd 論理集積回路
JPH1073641A (ja) * 1996-08-30 1998-03-17 Mitsubishi Electric Corp テスト回路
JPH11101858A (ja) * 1997-09-29 1999-04-13 Toshiba Microelectronics Corp 半導体集積回路

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018137024A (ja) * 2017-02-21 2018-08-30 株式会社東芝 半導体集積回路
JP2020098182A (ja) * 2018-12-19 2020-06-25 ルネサスエレクトロニクス株式会社 半導体装置

Also Published As

Publication number Publication date
JP5158087B2 (ja) 2013-03-06
US20100148816A1 (en) 2010-06-17
US7843210B2 (en) 2010-11-30
JPWO2009037769A1 (ja) 2011-01-06

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