ATE521902T1 - Integrierte halbleiterschaltung und verfahren zur speicherung und wiederherstellung des inneren zustandes derselben - Google Patents

Integrierte halbleiterschaltung und verfahren zur speicherung und wiederherstellung des inneren zustandes derselben

Info

Publication number
ATE521902T1
ATE521902T1 AT09015504T AT09015504T ATE521902T1 AT E521902 T1 ATE521902 T1 AT E521902T1 AT 09015504 T AT09015504 T AT 09015504T AT 09015504 T AT09015504 T AT 09015504T AT E521902 T1 ATE521902 T1 AT E521902T1
Authority
AT
Austria
Prior art keywords
flip
flops
internal state
circuit
restoring
Prior art date
Application number
AT09015504T
Other languages
English (en)
Inventor
Tatsuya Kawasaki
Tsuneki Sasaki
Shuichi Kunie
Original Assignee
Renesas Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Electronics Corp filed Critical Renesas Electronics Corp
Application granted granted Critical
Publication of ATE521902T1 publication Critical patent/ATE521902T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00—Accessing, addressing or allocating within memory systems or architectures
    • G06F12/16—Protection against loss of memory contents

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
AT09015504T 2008-12-16 2009-12-15 Integrierte halbleiterschaltung und verfahren zur speicherung und wiederherstellung des inneren zustandes derselben ATE521902T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008320082A JP2010145134A (ja) 2008-12-16 2008-12-16 半導体集積回路、半導体集積回路の内部状態退避回復方法

Publications (1)

Publication Number Publication Date
ATE521902T1 true ATE521902T1 (de) 2011-09-15

Family

ID=41718900

Family Applications (1)

Application Number Title Priority Date Filing Date
AT09015504T ATE521902T1 (de) 2008-12-16 2009-12-15 Integrierte halbleiterschaltung und verfahren zur speicherung und wiederherstellung des inneren zustandes derselben

Country Status (5)

Country Link
US (1) US8286041B2 (de)
EP (1) EP2199813B1 (de)
JP (1) JP2010145134A (de)
KR (1) KR101127786B1 (de)
AT (1) ATE521902T1 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010282411A (ja) * 2009-06-04 2010-12-16 Renesas Electronics Corp 半導体集積回路、半導体集積回路の内部状態退避回復方法
US8856601B2 (en) * 2009-08-25 2014-10-07 Texas Instruments Incorporated Scan compression architecture with bypassable scan chains for low test mode power
US8225154B2 (en) * 2009-10-01 2012-07-17 Toshiba America Electronic Components, Inc. Low power design using a scan bypass multiplexer as an isolation cell
US9116701B2 (en) 2010-06-11 2015-08-25 Freescale Semiconductor, Inc. Memory unit, information processing device, and method
WO2011154776A1 (en) * 2010-06-11 2011-12-15 Freescale Semiconductor, Inc. Information processing device and method
JP5581960B2 (ja) * 2010-10-14 2014-09-03 凸版印刷株式会社 半導体装置
JP2013024788A (ja) * 2011-07-25 2013-02-04 Renesas Electronics Corp 半導体集積回路、スキャンフリップフロップ及び半導体集積回路のテスト方法
KR102112367B1 (ko) * 2013-02-12 2020-05-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
JP6268461B2 (ja) 2013-03-28 2018-01-31 セイコーエプソン株式会社 半導体装置、物理量センサー、電子機器及び移動体
US9383802B1 (en) 2013-06-20 2016-07-05 Altera Corporation Integrated circuit with state and data retention
FR3023620B1 (fr) 2014-07-09 2016-07-29 Stmicroelectronics (Grenoble 2) Sas Procede de gestion du fonctionnement d'un mode test d'un composant logique avec restauration de l'etat precedant le test
CN106797213B (zh) * 2014-10-10 2021-02-02 株式会社半导体能源研究所 逻辑电路、处理单元、电子构件以及电子设备
US9350332B1 (en) 2015-02-11 2016-05-24 SK Hynix Inc. Semiconductor device including retention circuit
KR102325388B1 (ko) * 2015-06-04 2021-11-11 삼성전자주식회사 데이터 복원을 안정적으로 제어하는 파워 게이팅 제어 회로
US10177142B2 (en) * 2015-12-25 2019-01-08 Semiconductor Energy Laboratory Co., Ltd. Circuit, logic circuit, processor, electronic component, and electronic device
KR20180037422A (ko) * 2016-10-04 2018-04-12 삼성전자주식회사 집적 회로 및 애플리케이션 프로세서
JP7214602B2 (ja) * 2019-09-24 2023-01-30 株式会社東芝 半導体装置、及び半導体装置の制御方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7058834B2 (en) * 2001-04-26 2006-06-06 Paul Richard Woods Scan-based state save and restore method and system for inactive state power reduction
GB2395302B (en) * 2002-11-13 2005-12-28 Advanced Risc Mach Ltd Hardware driven state save/restore in a data processing system
US20050010832A1 (en) * 2003-07-10 2005-01-13 International Business Machines Corporation Method and apparatus of reducing scan power in the process of unloading and restoring processor content by scan chain partition and disable
US7461242B2 (en) * 2005-11-03 2008-12-02 Ati Technologies Ulc Method and apparatus for providing context switching of logic in an integrated circuit using test scan circuitry
JP4303719B2 (ja) 2005-12-08 2009-07-29 Ｎｅｃエレクトロニクス株式会社 半導体集積回路およびその制御方法
KR101282963B1 (ko) * 2006-05-12 2013-07-08 삼성전자주식회사 에뮬레이션 시스템 및 그 방법
US7957172B2 (en) * 2007-06-22 2011-06-07 Broadcom Corporation System for retaining state data of an integrated circuit
JP4711353B2 (ja) 2008-04-02 2011-06-29 ルネサスエレクトロニクス株式会社 半導体集積回路およびその制御方法

Also Published As

Publication number Publication date
EP2199813A1 (de) 2010-06-23
EP2199813B1 (de) 2011-08-24
US8286041B2 (en) 2012-10-09
KR20100069608A (ko) 2010-06-24
KR101127786B1 (ko) 2012-03-27
US20100174956A1 (en) 2010-07-08
JP2010145134A (ja) 2010-07-01

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