ATE436029T1 - Analog-ic mit testanordnung und testverfahren für ein solches ic - Google Patents
Analog-ic mit testanordnung und testverfahren für ein solches icInfo
- Publication number
- ATE436029T1 ATE436029T1 AT06809664T AT06809664T ATE436029T1 AT E436029 T1 ATE436029 T1 AT E436029T1 AT 06809664 T AT06809664 T AT 06809664T AT 06809664 T AT06809664 T AT 06809664T AT E436029 T1 ATE436029 T1 AT E436029T1
- Authority
- AT
- Austria
- Prior art keywords
- analog
- stages
- test
- signal path
- analog stages
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/3167—Testing of combined analog and digital circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318575—Power distribution; Power saving
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP05110048 | 2005-10-26 | ||
PCT/IB2006/053878 WO2007049210A2 (en) | 2005-10-26 | 2006-10-20 | Analog ic having test arrangement and test method for such an ic |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE436029T1 true ATE436029T1 (de) | 2009-07-15 |
Family
ID=37905620
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT06809664T ATE436029T1 (de) | 2005-10-26 | 2006-10-20 | Analog-ic mit testanordnung und testverfahren für ein solches ic |
Country Status (8)
Country | Link |
---|---|
US (1) | US7671618B2 (de) |
EP (1) | EP1943534B1 (de) |
JP (1) | JP2009513968A (de) |
KR (1) | KR20080069647A (de) |
CN (1) | CN101297209B (de) |
AT (1) | ATE436029T1 (de) |
DE (1) | DE602006007726D1 (de) |
WO (1) | WO2007049210A2 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7812628B2 (en) * | 2006-12-13 | 2010-10-12 | Renesas Electronics Corporation | Method of on-chip current measurement and semiconductor IC |
US20090039897A1 (en) * | 2007-08-10 | 2009-02-12 | Via Technologies, Inc. | Systems and Methods for Scan Chain Testing Using Analog Signals |
US8217673B2 (en) * | 2009-09-02 | 2012-07-10 | Freescale Semiconductor, Inc. | Method and circuit for testing integrated circuit |
US8589750B2 (en) * | 2010-07-14 | 2013-11-19 | Qualcomm, Incorporated | Methods and apparatus for providing a built-in self test |
US9110142B2 (en) * | 2011-09-30 | 2015-08-18 | Freescale Semiconductor, Inc. | Methods and apparatus for testing multiple-IC devices |
US8887017B2 (en) * | 2012-10-12 | 2014-11-11 | Freescale Semiconductor, Inc. | Processor switchable between test and debug modes |
CN112272016A (zh) * | 2015-03-17 | 2021-01-26 | 华为技术有限公司 | 混合信号集成电路 |
US11067623B2 (en) * | 2019-05-19 | 2021-07-20 | Test Research, Inc. | Test system and method of operating the same |
US20200410153A1 (en) | 2019-05-30 | 2020-12-31 | Celera, Inc. | Automated circuit generation |
CN111372018B (zh) * | 2020-03-19 | 2021-06-15 | 成都微光集电科技有限公司 | 一种使用复位信号驱动电路的adc及图像传感器 |
WO2022219720A1 (ja) * | 2021-04-13 | 2022-10-20 | 三菱電機株式会社 | 半導体集積回路および半導体装置 |
US20230076736A1 (en) * | 2021-08-24 | 2023-03-09 | Cilag Gmbh International | Automatic remote center of motion adjustment for robotically controlled uterine manipulator |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5793778A (en) * | 1997-04-11 | 1998-08-11 | National Semiconductor Corporation | Method and apparatus for testing analog and digital circuitry within a larger circuit |
US5923097A (en) * | 1997-07-24 | 1999-07-13 | International Business Machines Corporation | Switching supply test mode for analog cores |
AU4061200A (en) * | 1999-03-31 | 2000-10-16 | Regents Of The University Of California, The | Multi-channel detector readout method and integrated circuit |
JP2002094368A (ja) * | 2000-09-18 | 2002-03-29 | Mitsubishi Electric Corp | 半導体集積回路装置 |
-
2006
- 2006-10-20 JP JP2008537272A patent/JP2009513968A/ja not_active Withdrawn
- 2006-10-20 WO PCT/IB2006/053878 patent/WO2007049210A2/en active Application Filing
- 2006-10-20 KR KR1020087012501A patent/KR20080069647A/ko not_active Application Discontinuation
- 2006-10-20 EP EP06809664A patent/EP1943534B1/de not_active Not-in-force
- 2006-10-20 DE DE602006007726T patent/DE602006007726D1/de active Active
- 2006-10-20 CN CN2006800396337A patent/CN101297209B/zh not_active Expired - Fee Related
- 2006-10-20 US US12/091,026 patent/US7671618B2/en not_active Expired - Fee Related
- 2006-10-20 AT AT06809664T patent/ATE436029T1/de not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US20090134904A1 (en) | 2009-05-28 |
CN101297209A (zh) | 2008-10-29 |
EP1943534B1 (de) | 2009-07-08 |
KR20080069647A (ko) | 2008-07-28 |
WO2007049210A2 (en) | 2007-05-03 |
EP1943534A2 (de) | 2008-07-16 |
WO2007049210A3 (en) | 2007-07-26 |
DE602006007726D1 (de) | 2009-08-20 |
CN101297209B (zh) | 2011-03-16 |
US7671618B2 (en) | 2010-03-02 |
JP2009513968A (ja) | 2009-04-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |