ATE450799T1 - Onchip-prüfschaltung für einen eingebetteten komparator - Google Patents

Onchip-prüfschaltung für einen eingebetteten komparator

Info

Publication number
ATE450799T1
ATE450799T1 AT06762659T AT06762659T ATE450799T1 AT E450799 T1 ATE450799 T1 AT E450799T1 AT 06762659 T AT06762659 T AT 06762659T AT 06762659 T AT06762659 T AT 06762659T AT E450799 T1 ATE450799 T1 AT E450799T1
Authority
AT
Austria
Prior art keywords
comparator
input
test circuit
during
test
Prior art date
Application number
AT06762659T
Other languages
English (en)
Inventor
Fan Ma
Original Assignee
Infineon Technologies Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Infineon Technologies Ag filed Critical Infineon Technologies Ag
Application granted granted Critical
Publication of ATE450799T1 publication Critical patent/ATE450799T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3187—Built-in tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31932—Comparators

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analogue/Digital Conversion (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Manipulation Of Pulses (AREA)
AT06762659T 2006-07-17 2006-07-17 Onchip-prüfschaltung für einen eingebetteten komparator ATE450799T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP2006/007022 WO2008009298A1 (en) 2006-07-17 2006-07-17 On-chip test circuit for an embedded comparator

Publications (1)

Publication Number Publication Date
ATE450799T1 true ATE450799T1 (de) 2009-12-15

Family

ID=38038939

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06762659T ATE450799T1 (de) 2006-07-17 2006-07-17 Onchip-prüfschaltung für einen eingebetteten komparator

Country Status (5)

Country Link
US (1) US7924044B2 (de)
EP (1) EP2041589B1 (de)
AT (1) ATE450799T1 (de)
DE (1) DE602006010915D1 (de)
WO (1) WO2008009298A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8860455B2 (en) 2010-12-24 2014-10-14 Intel Corporation Methods and systems to measure a signal on an integrated circuit die
US8624653B2 (en) 2011-06-15 2014-01-07 Freescale Semiconductor, Inc. Circuit and method for determining comparator offsets of electronic devices
US9134395B2 (en) * 2012-03-07 2015-09-15 Freescale Semiconductor, Inc. Method for testing comparator and device therefor
JP6258958B2 (ja) 2012-11-27 2018-01-10 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 電気的マルチチャネルシステム、特に神経刺激のための電気的マルチチャネルシステム
US9876501B2 (en) * 2013-05-21 2018-01-23 Mediatek Inc. Switching power amplifier and method for controlling the switching power amplifier
CN103983912B (zh) * 2014-05-05 2017-07-11 三星半导体(中国)研究开发有限公司 适用于片上系统的扫描测试控制电路
CN110708047B (zh) * 2019-08-29 2023-09-22 上海御渡半导体科技有限公司 一种基于tdc芯片测量高速比较器精度的结构及方法
CN116027179B (zh) * 2023-02-22 2023-06-27 上海安其威微电子科技有限公司 一种开关芯片的测试器件、方法、电子设备及存储介质

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2937811B2 (ja) * 1995-06-29 1999-08-23 日本電気アイシーマイコンシステム株式会社 半導体集積回路のテスト回路およびそのテスト方法
JP2000352575A (ja) * 1999-06-10 2000-12-19 Mitsubishi Electric Corp 組み込み型自己テスト回路およびテスト方法
DE10014386A1 (de) * 2000-03-23 2001-09-27 Infineon Technologies Ag Integrierte Schaltung mit Ansteuerschaltung zur Ansteuerung einer Treiberschaltung
DE10306620B4 (de) * 2003-02-18 2007-04-19 Infineon Technologies Ag Integrierte Testschaltung in einer integrierten Schaltung
US7225379B2 (en) * 2004-04-23 2007-05-29 Oki Electric Industry Co., Ltd. Circuit and method for testing semiconductor device

Also Published As

Publication number Publication date
DE602006010915D1 (de) 2010-01-14
US7924044B2 (en) 2011-04-12
EP2041589A1 (de) 2009-04-01
WO2008009298A1 (en) 2008-01-24
EP2041589B1 (de) 2009-12-02
US20090140248A1 (en) 2009-06-04

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Legal Events

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