WO2009028484A1 - 半導体装置製造用の接着シート、及びそれを用いた半導体装置の製造方法 - Google Patents

半導体装置製造用の接着シート、及びそれを用いた半導体装置の製造方法 Download PDF

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Publication number
WO2009028484A1
WO2009028484A1 PCT/JP2008/065164 JP2008065164W WO2009028484A1 WO 2009028484 A1 WO2009028484 A1 WO 2009028484A1 JP 2008065164 W JP2008065164 W JP 2008065164W WO 2009028484 A1 WO2009028484 A1 WO 2009028484A1
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Prior art keywords
semiconductor device
manufacturing
adhesive sheet
sheet
adhesive
Prior art date
Application number
PCT/JP2008/065164
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English (en)
French (fr)
Inventor
Yasuhiro Amano
Sadahito Misumi
Takeshi Matsumura
Naohide Takamoto
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Nitto Denko Corporation
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Application filed by Nitto Denko Corporation filed Critical Nitto Denko Corporation
Priority to CN200880101005A priority Critical patent/CN101765909A/zh
Priority to US12/675,433 priority patent/US20100236689A1/en
Publication of WO2009028484A1 publication Critical patent/WO2009028484A1/ja

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    • C09J133/00Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
    • C09J133/04Homopolymers or copolymers of esters
    • C09J133/06Homopolymers or copolymers of esters of esters containing only carbon, hydrogen and oxygen, the oxygen atom being present only as part of the carboxyl radical
    • C09J133/08Homopolymers or copolymers of acrylic acid esters
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  • Engineering & Computer Science (AREA)
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Abstract

 接着シートが薄層化した場合にも、当該接着シートの有無を容易に識別することを可能にし、これにより製造装置のダウンタイムを短縮して、歩留まりの向上を可能にする半導体装置製造用の接着シート、及びそれを用いた半導体装置の製造方法を提供する。本発明の半導体装置製造用の接着シートは、半導体素子を被着体に接着させる半導体装置製造用の接着シートであって、波長域が290~450nmの範囲内にある光を吸収又は反射させる顔料を含有することを特徴とする。
PCT/JP2008/065164 2007-08-31 2008-08-26 半導体装置製造用の接着シート、及びそれを用いた半導体装置の製造方法 WO2009028484A1 (ja)

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CN200880101005A CN101765909A (zh) 2007-08-31 2008-08-26 半导体装置制造用的胶粘片及使用其的半导体装置的制造方法
US12/675,433 US20100236689A1 (en) 2007-08-31 2008-08-26 Adhesive sheet for manufacturing semiconductor device, and semiconductor device manufacturing method using the sheet

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JP2007-226282 2007-08-31
JP2007226282A JP4975564B2 (ja) 2007-08-31 2007-08-31 半導体装置製造用の接着シート、及びそれを用いた半導体装置の製造方法

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015013946A (ja) * 2013-07-05 2015-01-22 日東電工株式会社 接着剤組成物及び接着シート
JP2018016705A (ja) * 2016-07-27 2018-02-01 古河電気工業株式会社 電子デバイス用テープ

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8004078B1 (en) * 2009-03-17 2011-08-23 Amkor Technology, Inc. Adhesive composition for semiconductor device
JP5632695B2 (ja) * 2009-11-26 2014-11-26 日東電工株式会社 ダイシングフィルム付き接着フィルム、及び、該ダイシングフィルム付き接着フィルムを用いた半導体装置の製造方法
JP6045773B2 (ja) * 2009-11-26 2016-12-14 日立化成株式会社 接着シート及びその製造方法、並びに、半導体装置の製造方法及び半導体装置
JP4845063B2 (ja) * 2009-12-18 2011-12-28 古河電気工業株式会社 ウエハ加工用テープ及びその製造方法
JP5996836B2 (ja) 2010-02-25 2016-09-21 タレックス光学工業株式会社 眼鏡用合わせガラスレンズ
JP2011253911A (ja) * 2010-06-01 2011-12-15 Shinko Electric Ind Co Ltd 配線基板
JP5408571B2 (ja) * 2010-10-06 2014-02-05 古河電気工業株式会社 ウエハ加工用テープ及びその製造方法
JP5023225B1 (ja) * 2011-03-10 2012-09-12 日東電工株式会社 半導体装置用フィルムの製造方法
JP5036887B1 (ja) * 2011-03-11 2012-09-26 日東電工株式会社 保護フィルム付きダイシングフィルム
DE102011077684A1 (de) * 2011-06-17 2012-12-20 Robert Bosch Gmbh Abdeckmaterial für einen Mikrochip, Mikrochip mit Abdeckmaterial sowie Verfahren zur Bereitstellung eines solchen Mikrochips
CN102842512A (zh) * 2011-06-22 2012-12-26 日东电工株式会社 半导体装置的制造方法
RU2476471C1 (ru) * 2011-10-20 2013-02-27 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Волгоградский государственный технический университет" (ВолгГТУ) Способ крепления резин друг к другу
JP6379389B2 (ja) * 2014-12-15 2018-08-29 リンテック株式会社 ダイシングダイボンディングシート
JP6983200B2 (ja) * 2019-07-11 2021-12-17 日東電工株式会社 ダイボンドフィルム及びダイシングダイボンドフィルム
JP2021075620A (ja) 2019-11-08 2021-05-20 リンテック株式会社 接着フィルム及び接着複合シート
WO2021193942A1 (ja) 2020-03-27 2021-09-30 リンテック株式会社 半導体装置製造用シート
CN111477621B (zh) * 2020-06-28 2020-09-15 甬矽电子(宁波)股份有限公司 芯片封装结构、其制作方法和电子设备

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000154250A (ja) * 1998-11-20 2000-06-06 Ube Ind Ltd アンダーフィル用ポリイミド樹脂
JP2001168113A (ja) * 1999-12-10 2001-06-22 Hitachi Chem Co Ltd 半導体素子用接着材組成物及びこれを用いた半導体装置
JP2005252114A (ja) * 2004-03-05 2005-09-15 Towa Corp ダイボンド用粘着テープの貼付方法
JP2007220913A (ja) * 2006-02-16 2007-08-30 Nitto Denko Corp 半導体装置の製造方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10228186A1 (de) * 2002-06-24 2004-01-22 Merck Patent Gmbh UV-stabilisierte Partikel

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000154250A (ja) * 1998-11-20 2000-06-06 Ube Ind Ltd アンダーフィル用ポリイミド樹脂
JP2001168113A (ja) * 1999-12-10 2001-06-22 Hitachi Chem Co Ltd 半導体素子用接着材組成物及びこれを用いた半導体装置
JP2005252114A (ja) * 2004-03-05 2005-09-15 Towa Corp ダイボンド用粘着テープの貼付方法
JP2007220913A (ja) * 2006-02-16 2007-08-30 Nitto Denko Corp 半導体装置の製造方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015013946A (ja) * 2013-07-05 2015-01-22 日東電工株式会社 接着剤組成物及び接着シート
JP2018016705A (ja) * 2016-07-27 2018-02-01 古河電気工業株式会社 電子デバイス用テープ

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