WO2008133238A1 - 試験装置および試験方法 - Google Patents

試験装置および試験方法 Download PDF

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Publication number
WO2008133238A1
WO2008133238A1 PCT/JP2008/057710 JP2008057710W WO2008133238A1 WO 2008133238 A1 WO2008133238 A1 WO 2008133238A1 JP 2008057710 W JP2008057710 W JP 2008057710W WO 2008133238 A1 WO2008133238 A1 WO 2008133238A1
Authority
WO
WIPO (PCT)
Prior art keywords
jitter
signal
generating
test
testing
Prior art date
Application number
PCT/JP2008/057710
Other languages
English (en)
French (fr)
Inventor
Daisuke Watanabe
Toshiyuki Okayasu
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to KR1020097022072A priority Critical patent/KR101108132B1/ko
Priority to JP2009511873A priority patent/JPWO2008133238A1/ja
Priority to CN2008800123752A priority patent/CN101657731B/zh
Priority to DE112008001125T priority patent/DE112008001125T5/de
Publication of WO2008133238A1 publication Critical patent/WO2008133238A1/ja
Priority to US12/570,400 priority patent/US7932729B2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/84—Generating pulses having a predetermined statistical distribution of a parameter, e.g. random pulse generators
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/156—Arrangements in which a continuous pulse train is transformed into a train having a desired pattern

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

　被試験デバイスを試験する試験装置であって、被試験デバイスに供給すべき試験信号を定めた試験パターンを発生するパターン発生部と、被試験デバイスに試験信号を供給するタイミングを示すタイミング信号を発生するタイミング信号発生部と、試験パターンをフィルタリングして、試験パターンに応じたジッタを表すジッタ制御信号を出力するデジタルフィルタと、ジッタ制御信号に応じてタイミング信号を遅延することにより、タイミング信号にジッタを印加するジッタ印加部と、ジッタが印加されたタイミング信号を基準として、試験パターンを成形した試験信号を生成する波形成形部とを備える試験装置を提供する。
PCT/JP2008/057710 2007-04-24 2008-04-21 試験装置および試験方法 WO2008133238A1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
KR1020097022072A KR101108132B1 (ko) 2007-04-24 2008-04-21 시험 장치 및 시험 방법
JP2009511873A JPWO2008133238A1 (ja) 2007-04-24 2008-04-21 試験装置および試験方法
CN2008800123752A CN101657731B (zh) 2007-04-24 2008-04-21 测试装置及测试方法
DE112008001125T DE112008001125T5 (de) 2007-04-24 2008-04-21 Prüfgerät und Prüfverfahren
US12/570,400 US7932729B2 (en) 2007-04-24 2009-09-30 Test apparatus and test method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-114637 2007-04-24
JP2007114637 2007-04-24

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/570,400 Continuation US7932729B2 (en) 2007-04-24 2009-09-30 Test apparatus and test method

Publications (1)

Publication Number Publication Date
WO2008133238A1 true WO2008133238A1 (ja) 2008-11-06

Family

ID=39925688

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/057710 WO2008133238A1 (ja) 2007-04-24 2008-04-21 試験装置および試験方法

Country Status (7)

Country Link
US (1) US7932729B2 (ja)
JP (1) JPWO2008133238A1 (ja)
KR (1) KR101108132B1 (ja)
CN (1) CN101657731B (ja)
DE (1) DE112008001125T5 (ja)
TW (1) TWI373620B (ja)
WO (1) WO2008133238A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009182968A (ja) * 2008-01-31 2009-08-13 Tektronix Internatl Sales Gmbh 信号発生装置、シリアル・データ・パターンの符号間干渉効果生成方法及びシリアル・データ・パターンの符号間干渉効果の校正方法

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* Cited by examiner, † Cited by third party
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WO2006051508A1 (en) * 2004-11-15 2006-05-18 Koninklijke Philips Electronics, N.V. System and method for on-chip jitter injection
CN103308843A (zh) * 2012-03-09 2013-09-18 鸿富锦精密工业（深圳）有限公司 具有接收器测试功能的芯片及电路板
US9071407B2 (en) * 2012-05-02 2015-06-30 Ramnus Inc. Receiver clock test circuitry and related methods and apparatuses
US9832093B1 (en) * 2014-02-26 2017-11-28 Keysight Technologies, Inc. Method for injecting timing variations into continuous signals
US9897504B2 (en) 2015-04-20 2018-02-20 Infineon Technologies Ag System and method for a MEMS sensor
CN104965169A (zh) * 2015-07-29 2015-10-07 江苏杰进微电子科技有限公司 全自动ic电信号测试装置及测试方法
TWI559325B (zh) * 2015-10-22 2016-11-21 力成科技股份有限公司 高頻記憶體之測試裝置及測試方法
CN106849737B (zh) * 2016-11-29 2019-01-22 北京中电华大电子设计有限责任公司 一种产生电源随机干扰波形的方法及装置
CN106647928A (zh) * 2016-12-30 2017-05-10 杭州宏杉科技股份有限公司 一种异常时序定位方法、装置及主板
CN107561432A (zh) * 2017-07-27 2018-01-09 中国船舶重工集团公司第七二四研究所 一种基于奇偶校验的时序信号故障检测方法

Citations (6)

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JPH0560808A (ja) * 1991-09-03 1993-03-12 Rohm Co Ltd 周期計測器、周波数計測器、周期・周波数計測方法及びメータ駆動装置
JPH06265597A (ja) * 1993-03-11 1994-09-22 Hitachi Ltd 半導体集積回路の試験装置
JPH1138087A (ja) * 1997-07-22 1999-02-12 Advantest Corp 半導体試験装置
JP2000221254A (ja) * 1999-02-01 2000-08-11 Leader Electronics Corp ジッタ付加の方法および装置
JP2005091108A (ja) * 2003-09-16 2005-04-07 Advantest Corp ジッタ発生器及び試験装置
JP2006293756A (ja) * 2005-04-12 2006-10-26 Denso Corp 演算回路及び画像認識装置

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US7756197B1 (en) 2003-11-26 2010-07-13 Pmc-Sierra, Inc. Built in self test (BIST) for high-speed serial transceivers
US7095264B2 (en) * 2003-12-02 2006-08-22 International Business Machines Corporation Programmable jitter signal generator
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JP4536610B2 (ja) * 2005-07-07 2010-09-01 株式会社アドバンテスト 半導体試験装置
CN1741427B (zh) * 2005-09-13 2011-06-22 威盛电子股份有限公司 可注入时域抖动的测试电路及相关测试方法
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Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0560808A (ja) * 1991-09-03 1993-03-12 Rohm Co Ltd 周期計測器、周波数計測器、周期・周波数計測方法及びメータ駆動装置
JPH06265597A (ja) * 1993-03-11 1994-09-22 Hitachi Ltd 半導体集積回路の試験装置
JPH1138087A (ja) * 1997-07-22 1999-02-12 Advantest Corp 半導体試験装置
JP2000221254A (ja) * 1999-02-01 2000-08-11 Leader Electronics Corp ジッタ付加の方法および装置
JP2005091108A (ja) * 2003-09-16 2005-04-07 Advantest Corp ジッタ発生器及び試験装置
JP2006293756A (ja) * 2005-04-12 2006-10-26 Denso Corp 演算回路及び画像認識装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009182968A (ja) * 2008-01-31 2009-08-13 Tektronix Internatl Sales Gmbh 信号発生装置、シリアル・データ・パターンの符号間干渉効果生成方法及びシリアル・データ・パターンの符号間干渉効果の校正方法

Also Published As

Publication number Publication date
TWI373620B (en) 2012-10-01
TW200907363A (en) 2009-02-16
DE112008001125T5 (de) 2010-02-18
JPWO2008133238A1 (ja) 2010-07-29
US7932729B2 (en) 2011-04-26
US20100090709A1 (en) 2010-04-15
KR101108132B1 (ko) 2012-02-06
CN101657731A (zh) 2010-02-24
KR20090130077A (ko) 2009-12-17
CN101657731B (zh) 2012-10-10

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