WO2008126892A1 - 樹脂中Ｂｒ検出方法、樹脂分別装置、および再生樹脂製品の製造方法 - Google Patents

樹脂中Ｂｒ検出方法、樹脂分別装置、および再生樹脂製品の製造方法 Download PDF

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Publication number
WO2008126892A1
WO2008126892A1 PCT/JP2008/057069 JP2008057069W WO2008126892A1 WO 2008126892 A1 WO2008126892 A1 WO 2008126892A1 JP 2008057069 W JP2008057069 W JP 2008057069W WO 2008126892 A1 WO2008126892 A1 WO 2008126892A1
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WIPO (PCT)
Prior art keywords
resin
detecting
ray
manufacturing
reproduced
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PCT/JP2008/057069
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English (en)
French (fr)
Inventor
Jiro Naka
Junji Tanimura
Noriko Hirano
Masaru Kinugawa
Tatsuya Shiramizu
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Mitsubishi Electric Corporation
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Application filed by Mitsubishi Electric Corporation filed Critical Mitsubishi Electric Corporation
Priority to JP2009509367A priority Critical patent/JP5463909B2/ja
Publication of WO2008126892A1 publication Critical patent/WO2008126892A1/ja

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Separation, Recovery Or Treatment Of Waste Materials Containing Plastics (AREA)

Abstract

　エネルギーを検出する機能のないＸ線検出器を用いても樹脂片中の特定元素を精度よく高速に検出する方法を実現することを目的とする。 　本発明のＢｒの樹脂中Ｂｒ検出方法はＢｒに強く吸収されるエネルギーであるＫ殻の吸収端以上、ＭｏのＫ殻の特性Ｘ線以下のエネルギー範囲に最大強度を有するＸ線を樹脂片に照射して、樹脂片を通過後のＸ線強度を検出するステップと、検出されたＸ線強度に基づいて樹脂片中のＢｒの含有を検出するステップと、を有する樹脂中Ｂｒ検出方法とした。
PCT/JP2008/057069 2007-04-11 2008-04-10 樹脂中Ｂｒ検出方法、樹脂分別装置、および再生樹脂製品の製造方法 WO2008126892A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009509367A JP5463909B2 (ja) 2007-04-11 2008-04-10 樹脂中Ｂｒ検出方法、樹脂分別装置、および再生樹脂製品の製造方法

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2007-103434 2007-04-11
JP2007103434 2007-04-11
JP2008016184 2008-01-28
JP2008-016184 2008-01-28

Publications (1)

Publication Number Publication Date
WO2008126892A1 true WO2008126892A1 (ja) 2008-10-23

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PCT/JP2008/057069 WO2008126892A1 (ja) 2007-04-11 2008-04-10 樹脂中Ｂｒ検出方法、樹脂分別装置、および再生樹脂製品の製造方法

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JP (1) JP5463909B2 (ja)
WO (1) WO2008126892A1 (ja)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009236633A (ja) * 2008-03-26 2009-10-15 Panasonic Electric Works Co Ltd Ｘ線異物検査装置
JP2009255049A (ja) * 2008-03-27 2009-11-05 Mitsubishi Electric Corp 選別装置、選別方法およびリサイクル樹脂材料の製造方法
JP2009279541A (ja) * 2008-05-23 2009-12-03 Mitsubishi Electric Corp 臭素系難燃剤含有樹脂の選別装置および選別方法
JP2010048663A (ja) * 2008-08-21 2010-03-04 Mitsubishi Electric Corp 樹脂の臭素濃度推定方法および臭素濃度推定システム
CN101923061A (zh) * 2009-06-12 2010-12-22 精工电子纳米科技有限公司 X射线透射检查装置及x射线透射检查方法
JP2011047741A (ja) * 2009-08-26 2011-03-10 Mitsubishi Electric Corp 臭素濃度測定装置及びその測定方法
US20130079918A1 (en) * 2011-09-01 2013-03-28 Spectramet, Llc Material sorting technology
JP2015152343A (ja) * 2014-02-12 2015-08-24 三菱電機株式会社 樹脂の判定方法および選別装置
JP2016038350A (ja) * 2014-08-11 2016-03-22 株式会社日立ハイテクノロジーズ Ｘ線透過検査装置及び異物検出方法
US9566615B2 (en) 2014-09-17 2017-02-14 Mitsubishi Electric Corporation Resin piece sorting method and resin piece sorting apparatus
JP2019520572A (ja) * 2016-06-21 2019-07-18 ソレク ニュークリア リサーチ センターＳｏｒｅｑ Ｎｕｃｌｅａｒ Ｒｅｓｅａｒｃｈ Ｃｅｎｔｅｒ 複数の固相物体を識別するｘｒｆアナライザ、その仕分けシステムおよび仕分け方法
WO2019230376A1 (ja) * 2018-05-31 2019-12-05 キヤノン株式会社 識別装置
CN115003485A (zh) * 2020-01-20 2022-09-02 优泊公司 成型体的制造方法和制造系统

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102307713B (zh) * 2009-02-13 2014-06-04 三菱电机株式会社 塑料的分选方法以及分选装置

Citations (8)

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JPH07294458A (ja) * 1994-04-25 1995-11-10 Ishikawajima Harima Heavy Ind Co Ltd ゴムシートの含有硫黄測定装置
JPH1144662A (ja) * 1997-07-29 1999-02-16 Rigaku Corp 微小部ｘ線分析装置
JPH1183830A (ja) * 1997-09-02 1999-03-26 Natl Food Res Inst ミネラルの検出方法
JP2003057195A (ja) * 2001-08-09 2003-02-26 X-Ray Precision Inc ３次元構造分析方法、及び３次元構造分析装置
JP2003166955A (ja) * 2001-11-30 2003-06-13 Mitsubishi Electric Corp めっき膜形成装置およびその制御方法
JP2004093511A (ja) * 2002-09-03 2004-03-25 Horiba Ltd Ｘ線分析装置及びコンピュータプログラム
JP2004219366A (ja) * 2003-01-17 2004-08-05 Canon Inc 難燃剤含有プラスチックの分別装置、及び分別方法
JP2007218683A (ja) * 2006-02-15 2007-08-30 Renesas Technology Corp 臭素化合物の分析方法および分析装置

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* Cited by examiner, † Cited by third party
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JPH0329248A (ja) * 1989-06-26 1991-02-07 Nippon Steel Corp Ｘ線光電子分光用複合ｘ線管球
JPH07140093A (ja) * 1993-11-17 1995-06-02 Ricoh Co Ltd Ｘ線評価装置
JP2843529B2 (ja) * 1994-07-06 1999-01-06 理学電機工業株式会社 蛍光ｘ線分析装置
JP3712531B2 (ja) * 1998-06-10 2005-11-02 株式会社リガク Ｘａｆｓ測定方法及びｘａｆｓ測定装置
JP2002318208A (ja) * 2001-04-20 2002-10-31 Rigaku Corp Ｘａｆｓ測定装置
JP2006038822A (ja) * 2004-07-26 2006-02-09 Tadashi Uko 蛍光ｘ線分析装置

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07294458A (ja) * 1994-04-25 1995-11-10 Ishikawajima Harima Heavy Ind Co Ltd ゴムシートの含有硫黄測定装置
JPH1144662A (ja) * 1997-07-29 1999-02-16 Rigaku Corp 微小部ｘ線分析装置
JPH1183830A (ja) * 1997-09-02 1999-03-26 Natl Food Res Inst ミネラルの検出方法
JP2003057195A (ja) * 2001-08-09 2003-02-26 X-Ray Precision Inc ３次元構造分析方法、及び３次元構造分析装置
JP2003166955A (ja) * 2001-11-30 2003-06-13 Mitsubishi Electric Corp めっき膜形成装置およびその制御方法
JP2004093511A (ja) * 2002-09-03 2004-03-25 Horiba Ltd Ｘ線分析装置及びコンピュータプログラム
JP2004219366A (ja) * 2003-01-17 2004-08-05 Canon Inc 難燃剤含有プラスチックの分別装置、及び分別方法
JP2007218683A (ja) * 2006-02-15 2007-08-30 Renesas Technology Corp 臭素化合物の分析方法および分析装置

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009236633A (ja) * 2008-03-26 2009-10-15 Panasonic Electric Works Co Ltd Ｘ線異物検査装置
JP2009255049A (ja) * 2008-03-27 2009-11-05 Mitsubishi Electric Corp 選別装置、選別方法およびリサイクル樹脂材料の製造方法
JP2009279541A (ja) * 2008-05-23 2009-12-03 Mitsubishi Electric Corp 臭素系難燃剤含有樹脂の選別装置および選別方法
JP2010048663A (ja) * 2008-08-21 2010-03-04 Mitsubishi Electric Corp 樹脂の臭素濃度推定方法および臭素濃度推定システム
CN101923061A (zh) * 2009-06-12 2010-12-22 精工电子纳米科技有限公司 X射线透射检查装置及x射线透射检查方法
JP2011017690A (ja) * 2009-06-12 2011-01-27 Sii Nanotechnology Inc Ｘ線透過検査装置及びｘ線透過検査方法
KR101562680B1 (ko) * 2009-06-12 2015-10-22 가부시키가이샤 히타치 하이테크 사이언스 Ｘ선 투과 검사 장치 및 ｘ선 투과 검사 방법
JP2011047741A (ja) * 2009-08-26 2011-03-10 Mitsubishi Electric Corp 臭素濃度測定装置及びその測定方法
WO2013033572A3 (en) * 2011-09-01 2013-06-27 Spectramet, Llc Material sorting technology
US8855809B2 (en) 2011-09-01 2014-10-07 Spectramet, Llc Material sorting technology
US20130079918A1 (en) * 2011-09-01 2013-03-28 Spectramet, Llc Material sorting technology
JP2015152343A (ja) * 2014-02-12 2015-08-24 三菱電機株式会社 樹脂の判定方法および選別装置
JP2016038350A (ja) * 2014-08-11 2016-03-22 株式会社日立ハイテクノロジーズ Ｘ線透過検査装置及び異物検出方法
US9566615B2 (en) 2014-09-17 2017-02-14 Mitsubishi Electric Corporation Resin piece sorting method and resin piece sorting apparatus
JP2019520572A (ja) * 2016-06-21 2019-07-18 ソレク ニュークリア リサーチ センターＳｏｒｅｑ Ｎｕｃｌｅａｒ Ｒｅｓｅａｒｃｈ Ｃｅｎｔｅｒ 複数の固相物体を識別するｘｒｆアナライザ、その仕分けシステムおよび仕分け方法
JP7054093B2 (ja) 2016-06-21 2022-04-13 ソレク ニュークリア リサーチ センター 複数の固相物体を識別するｘｒｆアナライザ、その仕分けシステムおよび仕分け方法
WO2019230376A1 (ja) * 2018-05-31 2019-12-05 キヤノン株式会社 識別装置
CN115003485A (zh) * 2020-01-20 2022-09-02 优泊公司 成型体的制造方法和制造系统
CN115003485B (zh) * 2020-01-20 2024-04-16 优泊公司 成型体的制造方法和制造系统

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JPWO2008126892A1 (ja) 2010-07-22

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